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Midwave-Infrared Laser Unequal Path Interferometer · Midwave-Infrared Laser Unequal Path...

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Midwave-Infrared Laser Unequal Path Interferometer The IR LUPI (Laser Unequal Path Interferometer) operates at a wavelength of 3.39 micrometers and features an internal He-Ne IR laser as well as an integral collinear visible alignment laser. The IR LUPI is the ideal instrument for testing mid-wave infrared imaging systems of any size or complexity. Visit us at www.optikos.com 107 Audubon Road Building 3 Wakefield, MA 01880 Phone: 617-354-7557 Fax: 617-354-5946 Email: [email protected] TESTING Testing of optics and electro-optical imaging systems PRODUCTS Precision optical metrology equipment ENGINEERING System engineering for optical and metrology products MANUFACTURING Prototyping and production of electro-optical systems State-of-the-Art Resolution and Accuracy Includes a 640x512 pixel high-resolution cooled InSb camera Features Diffraction International’s Durango™ fringe analysis software System accuracy specified as 0.008 λ RMS @ 3.39μm, with repeatability of 0.001 λ RMS (Static Fringe Analysis) Designed to Maximize Your Productivity Integrated aperture zoom, focus, and panning provide optimized viewing of the fringe pattern Optional objective lenses convert the output to a diverging beam for testing cameras, lenses, and other imaging systems An optional Translation Base provides extended 3-axis positioning travel offering unprecedented positioning flexibility Internal reference mirror features selectable effective reflectivity values of 90%, 40%, and 4% to match the optics under test, available at the turn of a knob
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Midwave-Infrared Laser Unequal Path Interferometer

The IR LUPI (Laser Unequal Path Interferometer) operates at awavelength of 3.39 micrometers and features an internal He-Ne IR laser as well as an integral collinear visible alignment laser. The IR LUPI is the ideal instrument for testing mid-wave infrared imaging systems of any size or complexity.

Visit us at www.optikos.com

107 Audubon RoadBuilding 3Wakefield, MA 01880Phone: 617-354-7557Fax: 617-354-5946Email: [email protected]

TESTINGTesting of optics and electro-optical imaging systems

PRODUCTSPrecision optical metrology equipment

ENGINEERINGSystem engineering for optical and metrology products

MANUFACTURINGPrototyping and production of electro-optical systems

State-of-the-Art Resolution and Accuracy� Includes a 640x512 pixel high-resolution cooled InSb camera

� Features Diffraction International’s Durango™ fringe analysis software

� System accuracy specified as 0.008 λRMS @ 3.39µm, with repeatability of0.001 λ RMS (Static Fringe Analysis)

Designed to MaximizeYour Productivity� Integrated aperture zoom, focus, and panning provide optimized viewing of the fringe pattern

� Optional objective lenses convert the output to a diverging beam for testing cameras, lenses, and other imaging systems

� An optional Translation Base provides extended 3-axis positioningtravel offering unprecedented positioning flexibility

� Internal reference mirror features selectable effective reflectivity values of 90%, 40%, and 4% to match the optics under test, available at the turn of a knob

Accessories

Objectives

Objective extension tubes

90˚extension tube elbow mirror

System Specifications

Specification Description Design ValueAccuracy 0.008 λ RMS Wavefront Error (WFE) @ 3.39µm

for System Mainframe

Repeatability with Static Fringe Analysis 0.001 λ RMS [email protected]µm

Repeatability with Phase-Shifting Fringe Analysis 0.0003 λ RMS [email protected]µm

Output Aperture Size with Extension Tubes 25mm diameterand ± 3mm Panning Range

Output Aperture Size, maximum 32mm diameter

Spatial Sampling 640 x 512 pixels

Acquisition Mode Static Fringe Analysis standard; Phase Shifting optional

Interferometer Laser SpecificationsLaser Type HeNe

Wavelength 3.39µm

Output Power ≥ 4mW

Beam Polarization Linear

Alignment Laser SpecificationsLaser Type HeNe

Wavelength 0.6328µm

Output Power ≥ 5mW

Beam Polarization Linear

MainframeEnvelope Dimensions (LWH) 1500mm x 470mm x 645mm

System Optical Axis Height 318mm @ lowest position

641mm @ highest position

Translation (with optional Translation Base)Along Optical Axis, coarse Infinite coarse positioning

Along Optical Axis, fine ± 38mm via leadscrew

Perpendicular to Optical Axis, coarse Infinite coarse positioning

Perpendicular to Optical Axis, fine ± 25mm via leadscrew

Vertical, fine 323mm total, via leadscrew

Electrical Requirements 120 VAC, 60Hz

Laser Safety CDRH Class IIIb Laser ProductIEC Class 3B

Weight 175lbs (Mainframe alone) 350lbs (with optional Translation Base)

SoftwareInterferometry Software Diffraction International Durango

Contact Optikos today to discuss your lens measurement [email protected]

The Optikos IR LUPI is available for immediate order placement as a standard system, or can be customized for your uniquemetrology requirements. Examplesof available customization would include optional positioning means,larger output aperture, and 10.6µm laser wavelength.

Controls� Remote-control Reference Beam Tip/Tilt

� Variable Attenuator for Camera

� Selectable Attenuator for Reference Beam

� Retroreflector In/Out

� Zoom Selector Turret

� Focus Adjustment

� Aperture Panning XY

� Reference Path Length Adjust

Sample Durango™ softwaredata acquisition screen


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