MILAGRO
March 13, 2006
RSP onboard J-31
March 13, 2006, 15:53:43 – 16:01:11 UTC
March 13, 2006
-99 -98 -97 -96 -95 -9417
18
19
20
21
22
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
2
4
6
8
CLO
UD
TO
P H
EIG
HT
, km
March 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0.90
0.92
0.94
0.96
0.98
1.00
CLO
UD
SIN
GLE
SC
AT
T. A
LBE
DO
1590 nm
2260 nm
March 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
5
10
15
20
25
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0.0
0.1
0.2
0.3
0.4
EF
FE
CT
IVE
VA
RIA
NC
E
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
10
20
30
40
DR
OP
LET
RA
DIU
S, µ
m
March 13, 2006, 863 nm, RFT AREA SIZE DISTRIBUTIONS NORMALIZED BY THEIR MAXIMA
0.0 0.2 0.4 0.6 0.8 1.0
March 13, 2006, 863 nm, RFT MODES
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
20 40 60 80 100MODE FRACTION, %
5
March 13, 2006, 863 nm, RFT MODES
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
0.00 0.02 0.04 0.06 0.08 0.10 0.12EFFECTIVE VARIANCE
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
5
10
15
20
25
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006FROM TOTAL REFLECTANCES at 865 nm and POL. Reff
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nm
15.90 15.92 15.94 15.96 15.98 16.00TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nmFROM POLARIZED REFLECTANCE at 865 nm
March 13, 2006
15.90 15.92 15.94 15.96 15.98 16.00TIME, UTC
0
2
4
6
8
10
CO
LUM
N W
AT
ER
VA
PO
R, c
m
FROM TOTAL REFLECTANCEFROM POLARIZED REFLECTANCE
March 13, 2006
March 13, 2006, 16:03:37 – 16:06:11 UTC
March 13, 2006
-99 -98 -97 -96 -95 -94
18
19
20
21
22
23
16.07 16.08 16.09 16.10TIME, h UTC
16.07 16.08 16.09 16.10TIME, h UTC
0.0
0.5
1.0
1.5
CLO
UD
TO
P H
EIG
HT
, km
March 13, 2006
16.07 16.08 16.09 16.10TIME, h UTC
0.90
0.92
0.94
0.96
0.98
1.00
CLO
UD
SIN
GLE
SC
AT
T. A
LBE
DO
1590 nm
2260 nm
March 13, 2006
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
50
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
16.07 16.08 16.09 16.10TIME, h UTC
0.00
0.05
0.10
0.15
EF
FE
CT
IVE
VA
RIA
NC
E
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
RA
DIU
S, µ
m
March 13, 2006, 863 nm, RFT AREA SIZE DISTRIBUTIONS NORMALIZED BY THEIR MAXIMA
0.0 0.2 0.4 0.6 0.8 1.0
March 13, 2006, 863 nm, RFT MODES
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
20 40 60 80 100MODE FRACTION, %
5
March 13, 2006, 863 nm, RFT MODES
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
0.00 0.02 0.04 0.06 0.08 0.10 0.12EFFECTIVE VARIANCE
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
50
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006FROM TOTAL REFLECTANCES at 865 nm and POL. Reff
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nm
16.07 16.08 16.09 16.10TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nmFROM POLARIZED REFLECTANCE at 865 nm
March 13, 2006
16.07 16.08 16.09 16.10TIME, UTC
0
2
4
6
8
10
CO
LUM
N W
AT
ER
VA
PO
R, c
m
FROM TOTAL REFLECTANCEFROM POLARIZED REFLECTANCE
March 13, 2006
March 13, 2006, 18:09:31 – 18:14:57 UTC
March 13, 2006
-99 -98 -97 -96 -95
19
20
21
22
23
18.16 18.18 18.20 18.22 18.24TIME, h UTC
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
2
4
6
8
10
CLO
UD
TO
P H
EIG
HT
, km
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0.90
0.92
0.94
0.96
0.98
1.00
CLO
UD
SIN
GLE
SC
AT
T. A
LBE
DO
1590 nm
2260 nm
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
2
4
6
8
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
m
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0.0
0.1
0.2
0.3
0.4
EF
FE
CT
IVE
VA
RIA
NC
E
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
10
20
30
40
DR
OP
LET
RA
DIU
S, µ
m
March 13, 2006, 863 nm, RFT AREA SIZE DISTRIBUTIONS NORMALIZED BY THEIR MAXIMA
0.0 0.2 0.4 0.6 0.8 1.0
March 13, 2006, 863 nm, RFT MODES
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
20 40 60 80 100MODE FRACTION, %
5
March 13, 2006, 863 nm, RFT MODES
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
0.00 0.02 0.04 0.06 0.08 0.10 0.12EFFECTIVE VARIANCE
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
2
4
6
8
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
m
March 13, 2006FROM TOTAL REFLECTANCES at 865 nm and POL. Reff
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nm
18.16 18.18 18.20 18.22 18.24TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nmFROM POLARIZED REFLECTANCE at 865 nm
March 13, 2006
18.16 18.18 18.20 18.22 18.24TIME, UTC
0
2
4
6
8
10
CO
LUM
N W
AT
ER
VA
PO
R, c
m
FROM TOTAL REFLECTANCEFROM POLARIZED REFLECTANCE
March 13, 2006
March 13, 2006, 18:26:58 – 18:37:21 UTC
March 13, 2006
-99 -98 -97 -96 -9518
19
20
21
22
23
18.45 18.50 18.55 18.60TIME, h UTC
18.45 18.50 18.55 18.60TIME, h UTC
0
2
4
6
8
10
CLO
UD
TO
P H
EIG
HT
, km
March 13, 2006
18.45 18.50 18.55 18.60TIME, h UTC
0.90
0.92
0.94
0.96
0.98
1.00
CLO
UD
SIN
GLE
SC
AT
T. A
LBE
DO
1590 nm
2260 nm
March 13, 2006
18.45 18.50 18.55 18.60TIME, h UTC
0
5
10
15
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006
18.45 18.50 18.55 18.60TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.45 18.50 18.55 18.60TIME, h UTC
0.0
0.1
0.2
0.3
0.4
EF
FE
CT
IVE
VA
RIA
NC
E
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.45 18.50 18.55 18.60TIME, h UTC
0
10
20
30
40
DR
OP
LET
RA
DIU
S, µ
m
March 13, 2006, 863 nm, RFT AREA SIZE DISTRIBUTIONS NORMALIZED BY THEIR MAXIMA
0.0 0.2 0.4 0.6 0.8 1.0
March 13, 2006, 863 nm, RFT MODES
18.45 18.50 18.55 18.60TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
20 40 60 80 100MODE FRACTION, %
5
March 13, 2006, 863 nm, RFT MODES
18.45 18.50 18.55 18.60TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
0.00 0.02 0.04 0.06 0.08 0.10 0.12EFFECTIVE VARIANCE
18.45 18.50 18.55 18.60TIME, h UTC
0
5
10
15
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006FROM TOTAL REFLECTANCES at 865 nm and POL. Reff
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nm
18.45 18.50 18.55 18.60TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nmFROM POLARIZED REFLECTANCE at 865 nm
March 13, 2006
18.45 18.50 18.55 18.60TIME, UTC
0
2
4
6
8
10
CO
LUM
N W
AT
ER
VA
PO
R, c
m
FROM TOTAL REFLECTANCEFROM POLARIZED REFLECTANCE
March 13, 2006
March 13, 2006, 18:50:01 – 19:07:31 UTC
March 13, 2006
-99 -98 -97 -96 -95 -9417
18
19
20
21
22
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
2
4
6
8
10
CLO
UD
TO
P H
EIG
HT
, km
March 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0.90
0.92
0.94
0.96
0.98
1.00
CLO
UD
SIN
GLE
SC
AT
T. A
LBE
DO
1590 nm
2260 nm
March 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
5
10
15
20
25
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0.0
0.1
0.2
0.3
0.4
EF
FE
CT
IVE
VA
RIA
NC
E
410 nm469 nm554 nm670 nm863 nm
March 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
RA
DIU
S, µ
m
March 13, 2006, 863 nm, RFT AREA SIZE DISTRIBUTIONS NORMALIZED BY THEIR MAXIMA
0.0 0.2 0.4 0.6 0.8 1.0
March 13, 2006, 863 nm, RFT MODES
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
20 40 60 80 100MODE FRACTION, %
5
March 13, 2006, 863 nm, RFT MODES
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
10
20
30
40
DR
OP
LET
EF
FE
CT
IVE
RA
DIU
S, µ
m
0.00 0.02 0.04 0.06 0.08 0.10 0.12EFFECTIVE VARIANCE
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
5
10
15
20
25
CLO
UD
OP
TIC
AL
TH
ICK
NE
SS
at 8
63 n
mMarch 13, 2006FROM TOTAL REFLECTANCES at 865 nm and POL. Reff
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nm
18.85 18.90 18.95 19.00 19.05 19.10TIME, h UTC
0
10
20
30
40
EF
FE
CT
IVE
RA
DIU
S, µ
m
FROM TOTAL REFLECTANCES at 865 and 1590 nmFROM TOTAL REFLECTANCES at 865 and 2260 nmFROM POLARIZED REFLECTANCE at 865 nm
March 13, 2006
18.85 18.90 18.95 19.00 19.05 19.10TIME, UTC
0
2
4
6
8
10
CO
LUM
N W
AT
ER
VA
PO
R, c
m
FROM TOTAL REFLECTANCEFROM POLARIZED REFLECTANCE
March 13, 2006