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Live View energy-filtered real & momentum space imaging Precise sample spot definition for small area ARPES One-shot 180° ARPES overview without sample movement LHe cooled microscope sample stage and

dedicated light-sources Excellent 2D imaging energy-

resolution (< 25 meV)

Live View energy-filtered real & momentum space imagingPrecise sample spot definition for small area ARPES One-shot 180° ARPES overview without sample movement LHe cooled microscope sample stage and

Live View energy-filtered real & momentum space imagingPrecise sample spot definition for small area ARPES One-shot 180° ARPES overview without sample movement LHe cooled microscope sample stage and

NanoESCA Next-generation photoemission toolfor real- and momentum-space microscopy

F ig u re 2 : M omentu m M icros cop y on a cl ean A u ( 1 1 1 ) s u rf ace. T h e ov erv iew momentu m map of th e F ermi energ y ( a) s h ows more th an a f u l l B ril l ou in z one, wh il e th e z oomed in map res ol v es eatures i e the ashba sur ace sp i ng.

A cq u iring th es e momentu m map f or al l energ ies in th e v al ence b and l ead s to a 3 D d ata s tack ( c) , wh ich can b e cu t in an high s etr direction d to stud th e b and s tru ctu re of a material . T h e s h own meas u rements were p erf ormed in a l ab oratory s etu p with a H I S 1 4 V U V l ig h t s ou rce ( p h oton energ y 2 1 , 1 8 eV ( H e I ) ) and a l iq u id H e cool ed manip u l ator ( T = 3 0 K ) . T h e energ y anal y z er was s et to 5 0 meV energ y reso ution.

From microscopy to band-structure mapping

F ig u re 1 : Sk etch of th e N anoE SC A concep t. T h e P E E M imag e is projected onto the entrance o the i aging energ fi ter. he first he isphere separates di erent inetic e ectron energies whi e th e s econd h emis p h ere is u s ed to comp ens ate th e ( s p h erical ) aberrations induced b the first one.

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Photoemission has a history as one of the leading techniques in material and surface science. In the last decade, 2D k-space imaging or "Momentum Microscopy" has become one of the latest and most promising developments in this field. It allows insight into the electron band-structure of novel material systems, unveiling useful effects that can have a strong impact in future information technology. In combination with real-space imaging it is the ideal tool to make new materials applicable to next-generation devices.

B and s tru ctu re is th e k ey to u nd ers tand ing th e work ing p rincip al s of nearl y al l s ol id - s tate d ev ices ( trans is tors , microp ro-ces s ors , L E D s , s ol ar cel l s , etc.) . N ew material cl as s es incl u d ing g rap h ene, top ol og ical ins u l ators , and transition eta dicha co-g enid es ( T M D s ) are ex amined f or th eir u s e in f u tu re el ectronic d ev ices . T M D s , es p ecial l y , are che ica ersati e and thus pre-destined to tune their e ectronic structure or arious app ications. M omentu m M icrocop y p rov id es a f as t b and s tru ctu re map p ing , which beco es essentia or d ev ice eng ineering in th e f u tu re.

M omentu m M icros cop y d es crib es the co bination o a photoe is -s ion el ectron micros cop e ( P E E M ) with an imag ing b and - p as s energ y fi ter see igure . or inetic el ectron energ ies u p to 4 0 eV th e micros cop e col l ects al l p h otoel ec-trons e i ed into the co p ete s ol id ang l e ab ov e th e s amp l e s u rf ace. F or a d is crete energ y se ected b the band pass fi ter

it f orms an imag e of th e p h oto-e ectron distribution as a unction of th e l ateral momentu m ( k x , k y ) .

F or ex amp l e, it is p os s ib l e to s ee a f u l l B ril l ou in z one f or certain energ ies , ( e.g . th e F ermi s u rf ace) in one s h ot. I n l iv e- v iew mod e, it is p os s ib l e to nav ig ate th rou g h th e b and s tru ctu re, z oom into d etail s or ad j u s t ap ertu res .B y s canning a rang e of energ y fi tered o entu aps one d irectl y g ets a 3 D d ata cu b e ( l ateral el ectron momentu m v s . el ectron b ind ing energ y ) wh ich rep res ents th e acces s ib l e el ectronic b and s tru ctu re of th e material u nd er in estigation see igure c .

F ig u re 3 : T h e P E E M col u mn can b e eas il y ch ang ed b etween real - space i aging a and o entu space i aging b b adjusting the projection enses. he e ectron trajectories o both se ngs are e ua up to the first i aging p ane to a ow a re iab e positioning o the apertures. he iris aperture in the first i age p ane can or e a p e

be used to define a s a spot on the sa p e sur ace c ro which the o entu space data can be ac uired d . shown i ages were ac uired in a s e posure ti e the signa being a so intense enough or i e i aging s e posure ti e . he shown imag es were acq u ired on a monol ay er of g rap h ene on SiC .

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F ig u re 3 : T h e P E E M col u mn can b e eas il y ch ang ed b etween real - be used to define a s a spot on the sa p e sur ace c ro which the o entu space

T h is ex tend ed P E E M l ens is d es ig ned to eas il y s witch b etween real - s p ace imag ing and momen-tu space i aging b switching the projection ens se ngs see igure .

t the sa e ti e the e ectron trajectories in both odes are e ua up to the first i age p ane. his

i p ies that one can use the two di erent apertures integrated into the co u n. he first one at the bac oca p ane o the objecti e ens contrast ap ertu re) res tricts th e ang u l ar accep tance of th e

micros cop e. I n real - s p ace imag ing th is red u ces th e s p h erical ab erra-tion and thus enhances the reso ution o the . or o entu s p ace imag ing it is ty p ical l y f u l l y op en.

T h e s econd ap ertu re is an iris - ap ertu re. A s s h own in F ig u re 3 c, it can be used to define a s a e i ng area on the sa p e ro wh ich p h otoel ectrons are meas u red in momentu m mod e.

µ-ARPES workflow: Set energ fi ter to an energ with

h ig h ch emical contras t b etween f eatu res ( c)

L ocal iz e a f eatu re in real - s p ace imag ing mod e ( a)

C l os e iris ap ertu re to is ol ate s ig nal f rom th e f eatu re ( b )

A cq u ire momentu m imag es f or a rang e of energ ies ( d )

C omb ine imag e s tack to a 3 D b and s tru ctu re map ( E b in v s k x , k y ) ( e)

M omentu m micros cop y imag e of th e V Se2 F ermi l ev el ( I ns ert) . T h e f u l l energ y res ol v ed d ata cu b e was acq u ired to s tu d y th e b and - s tru ctu re al ong v ariou s h ig h s y mmetry ax is ( b , c) . C ou rtes y of J . L av erock , U niv . of B ris tol , G B

ano S s ste e uipped with ibration d amp ing s y s tem, L H e cool ed manip u l ator,

S ight source and preparation cha ber with pre ana sis capabi ities.

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Technical Data

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Property Specification nerg reso ution ana er e e achie ednerg range e up to e optionao entu reso ution ana er . - 1

o entu reso ed range . - 1

eq u iv al ent ang u l ar rang e ± 9 0 ° ( f u l l s ol id ang l e)atera reso ution nrea space fie d o iew ...

agnetic shie ded ana sis cha ber es ase pressure ana sis cha ber - 1 0 mB ar

photon u densit up to 1 3 p h / s / mm² bea spot si e photon ine width e e

L as er/ s y nch rotron p ort av ail ab l e M anip u l ator ax is , motoriz ed x , y , z , az imu th al

precision anipu ator te perature range ..

M I ST R A L Sy s tem C ontrol Y esro ano S easure ent So ware esent ounting es

Light sources:S ono onochro ati ed sourceonochro ati ed ra sources ocus or che ica i aging

M anip u l ators I S- s tag e: p iez o d riv en x / y s tag e

ano S e tensions channe tron detector behind first h emis p h ere dri tube e tension or e it

tended energ range ... e or ra e citationS- C M OS camera: 7 5 f rames / sH A X P E E M energ y rang e: > 1 0 k eVN ormal incid ence mirror: f or l as er ex p eriments

Sy s tem ex tens ions preparation cha ber a ai ab eD amp ing l eg s : av ail ab l e

NanoESCA System - The solution for future device engineering

NanoESCA SystemStainless steel chamber with mu-metal liner, NanoESCA analyzer, HIS 14 VUV source, mercury UV-source, LHe 4-ax microscope manipulator **

OptionsA wide range of options allow for tailoring the system to the specific needs of individual reasearch. For example:

o ponent specification tota per or ance depends on s ste configuration. P l eas e contact u s f or d etail s .

his set up is an e a p e configuration. ease contact us or our indi idua configuration.

he co bination o a co u n with an e ectrostatic doub e he ispherica i aging ener-g y - anal y s er mak es th e N anoE SC A one of th e mos t p romis ing concep ts f or s u rf ace and material s cience of th e nex t d ecad e. T h e 2 D map p ing of th e com-p l ete el ectron momentu m distribution at the er i e e is e tre e interesting or no e material s ( g rap h ene, top ol og ical ins u l ators , T M D s ) , and wil l p l ay an i portant ro e in the ne t generation o de ices. ngineering unctiona d ev ices f rom th es e new material s y s -tems req u ires eas y s witch ing b etween real - and momentu m s p ace, wh il e th e l iv e- imag ing ab il ity is th e k ey f or an eas and contro ed wor ow.

p romis ing concep ts f or s u rf ace and material

ins u l ators , T M D s ) , and wil l p l ay an i portant ro e in the ne t generation

d ev ices f rom th es e new material s y s -

p romis ing concep ts f or s u rf ace and material p romis ing concep ts f or s u rf ace and material

i portant ro e in the ne t generation

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