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Nanonics General SPM
12.01.2003
The Nanonics SPM Advantage
Standard Atomic Force Imaging at the Highest of Resolutions and Quality
Coupled with the Unique Advantages of Integrated Microscopy & Unique Sensor Technology
The Hallmark of All Nanonics SPM Systems
Nanonics General SPM
12.01.2003
DNA Imaging With The Nanonics NSOM/SPM-100 System & AFM Glass Probes
Nanonics General SPM
12.01.2003
Green Monkey Kidney Cells Imaged with Silicon Cantilevers
67.6 micron scan
Nanonics General SPM
12.01.2003
Green Monkey Kidney Cells Imaged with Silicon Cantilevers
35 micron scan
Nanonics General SPM
12.01.2003
12 micron scan
4.69 micron scan
Imaging Fibronectin Effusing from Green Monkey Kidney Cells
Nanonics General SPM
12.01.2003
Gold Beads on Anti-Fibronectin Antibodies on Slide Coated with Fibronectin
Nanonics General SPM
12.01.2003
Green Monkey Kidney Cells Imaging with Glass NSOM Cantilevers
40 micron scans
Nanonics General SPM
12.01.2003
Green Monkey Kidney Cells Imaging with Glass NSOM Cantilevers
Nanonics General SPM
12.01.2003
Imaging Budding Yeast Cells in Physiological Media
Nanonics General SPM
12.01.2003
Topography & Phase with Silicon Cantilevers
Nanonics General SPM
12.01.2003Polymer PMMA Microspheres
Atomic force image of the microspheres. The large 70 micron z scanning range of the Nanonics 3D Flat Scanning System and the 100 micron or more tip length of the cantilevered optical fiber allows even large topographic alteration to be readily monitored. The image was obtained with a normal force intermittant contact mode technique.
Nanonics General SPM
12.01.2003
Polymer PMMA MicrospheresAFM Crossection
As can be seen the large Z range of the Nanonics 3D Flat Scanner allows us to readily measure
the height of these microspheres.
Nanonics General SPM
12.01.2003
<0.1 MICRON IMAGING IN A 400 MICRON TRENCH
Nanonics General SPM
12.01.2003
Investigating Deep Trenches & Side Walls
The image at the right of a 2 deep and 1 wide silicon trench was obtained with a silicon cantilever . This conventional silicon probe cannot reach the bottom of the trench and the profile obtained reflects a convolution of the tip shape and the feature shape
The image at the right of a 10 deep and 2 wide silicon trench was obtained with a tapered glass cantilevered AFM probe. These probes with their long probe tips profile such trenches as effectively as carbon nanotube based probes. However, these glass probes are much more robust and easier and cheaper to obtain. \
Nanonics General SPM
12.01.2003Side Wall Imaging
Glass probes have their probe tip exposed, unlike silicon cantilever probes in which the probe tip is recessed under a silicon cantilever. As a result glass probes can be placed against a side wall and a Z, X image can be performed. Thus, side wall imaging is readily accomplished with on line viewing in transparently integrated optical microscope or scanning electron microscope.
Nanonics General SPM
12.01.2003
Multidimensional Functional Imaging
AFM Thermal Resistance Conductivity
0 V 70 V
Nanonics General SPM
12.01.2003
Kelvin Probe Characterization of Optoelectronic Semiconductor Materials
In the Dark
In the Light
AFM Cantilevered Fiber Probe Light Induced Kelvin Probe Alterations in
Observed Normal Force
Nanonics General SPM
12.01.2003
Nanoeteching of chrome by dispensing liquid through a cantilevered force sensing nanopipette, a NanopenTM Middle & right frames recorded through the fully integrated optical microscope during the chemical etching process
[Appl. Phys. Lett. 75, 2689 (1999)]
Cantilevered nanopipette
Nanopens for Liquid and Gas Delivery Including BioMolecule Delivery
Nanonics General SPM
12.01.2003
G Protein and GFP Deposited with a Nanopen & Imaged with a Glass AFM Cantilever
50 nm
AFM of Printed G
Protein
AFM of Printed
GFP
NSOM of Printed
GFP