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Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique Advantages of Integrated Microscopy & Unique Sensor Technology The Hallmark of All Nanonics SPM Systems
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Page 1: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

The Nanonics SPM Advantage

Standard Atomic Force Imaging at the Highest of Resolutions and Quality

Coupled with the Unique Advantages of Integrated Microscopy & Unique Sensor Technology

The Hallmark of All Nanonics SPM Systems

Page 2: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

DNA Imaging With The Nanonics NSOM/SPM-100 System & AFM Glass Probes

Page 3: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Green Monkey Kidney Cells Imaged with Silicon Cantilevers

67.6 micron scan

Page 4: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Green Monkey Kidney Cells Imaged with Silicon Cantilevers

35 micron scan

Page 5: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

12 micron scan

4.69 micron scan

Imaging Fibronectin Effusing from Green Monkey Kidney Cells

Page 6: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Gold Beads on Anti-Fibronectin Antibodies on Slide Coated with Fibronectin

Page 7: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Green Monkey Kidney Cells Imaging with Glass NSOM Cantilevers

40 micron scans

Page 8: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Green Monkey Kidney Cells Imaging with Glass NSOM Cantilevers

Page 9: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Imaging Budding Yeast Cells in Physiological Media

Page 10: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Topography & Phase with Silicon Cantilevers

Page 11: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003Polymer PMMA Microspheres

Atomic force image of the microspheres. The large 70 micron z scanning range of the Nanonics 3D Flat Scanning System and the 100 micron or more tip length of the cantilevered optical fiber allows even large topographic alteration to be readily monitored. The image was obtained with a normal force intermittant contact mode technique.

Page 12: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Polymer PMMA MicrospheresAFM Crossection

As can be seen the large Z range of the Nanonics 3D Flat Scanner allows us to readily measure

the height of these microspheres.

Page 13: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

<0.1 MICRON IMAGING IN A 400 MICRON TRENCH

Page 14: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Investigating Deep Trenches & Side Walls

The image at the right of a 2 deep and 1 wide silicon trench was obtained with a silicon cantilever . This conventional silicon probe cannot reach the bottom of the trench and the profile obtained reflects a convolution of the tip shape and the feature shape

The image at the right of a 10 deep and 2 wide silicon trench was obtained with a tapered glass cantilevered AFM probe. These probes with their long probe tips profile such trenches as effectively as carbon nanotube based probes. However, these glass probes are much more robust and easier and cheaper to obtain. \

Page 15: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003Side Wall Imaging

Glass probes have their probe tip exposed, unlike silicon cantilever probes in which the probe tip is recessed under a silicon cantilever. As a result glass probes can be placed against a side wall and a Z, X image can be performed. Thus, side wall imaging is readily accomplished with on line viewing in transparently integrated optical microscope or scanning electron microscope.

Page 16: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Multidimensional Functional Imaging

AFM Thermal Resistance Conductivity

0 V 70 V

Page 17: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Kelvin Probe Characterization of Optoelectronic Semiconductor Materials

In the Dark

In the Light

AFM Cantilevered Fiber Probe Light Induced Kelvin Probe Alterations in

Observed Normal Force

Page 18: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

Nanoeteching of chrome by dispensing liquid through a cantilevered force sensing nanopipette, a NanopenTM Middle & right frames recorded through the fully integrated optical microscope during the chemical etching process

[Appl. Phys. Lett. 75, 2689 (1999)]

Cantilevered nanopipette

Nanopens for Liquid and Gas Delivery Including BioMolecule Delivery

Page 19: Nanonics General SPM 12.01.2003 The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.

Nanonics General SPM

12.01.2003

G Protein and GFP Deposited with a Nanopen & Imaged with a Glass AFM Cantilever

50 nm

AFM of Printed G

Protein

AFM of Printed

GFP

NSOM of Printed

GFP


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