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www.nanosurf.com Microscopy Made Easy Nanosurf NaioAFM Your All-in-One AFM for Nanoeducation & Small Samples • Compact, Easy to use, Affordable • All you need in a single device
www.nanosurf.com
Microscopy Made Easy
Nanosurf NaioAFMYour All-in-One AFM for Nanoeducation & Small Samples
• Compact,Easytouse,Affordable
• Allyouneedinasingledevice
Your All-in-One AFM for Nanoeducation & Small Samples
TheNaioAFMistheidealatomicforcemicroscopefornanoeducationandsmallsamplemeasurements.Thisall-in-oneAFMsystemprovidessolidperformanceandeasyhandling,withapricetagandfootprintthatfitanyoneandanyplace.
Key Features & Benefits• Integratedcontroller,XY-table,airflowshielding,andvibrationisolation• Highresolutiontopviewcameraandsideviewsampleobservationbuiltin• Feature-complete:Allstandardoperatingmodesavailable• Simplecantileverexchange:nolaserordetectoradjustmentrequired• Nosystemsetupneeded:justplugintoyourPCandstartthesoftware• User-friendlysoftwarewizardsquicklypreparemeasurementparameters
NanosurfandtheNanosurfLogoaretrademarksofNanosurfAG,registeredand/orotherwiseprotectedinvariouscountries. Copyright©2012NanosurfAG,Switzerland—BT05117-00
Nanosurf AGGräubernstrasse12–144410LiestalSwitzerland+41619274747(phone)+41619274700(fax)[email protected]
Nanosurf Inc.999Broadway,Suite205Saugus,MA01906UnitedStatesofAmerica7815497361(phone)7815497366(fax)[email protected]
Nanosurf GmbHRheinstrasse563225LangenGermany+4961032027163(phone)+4961032027182(fax)[email protected]
苏州海兹思纳米科技有限公司 HZS-Nanosurf Co., Ltd.苏州工业园区星湖街218号纳米园A4-105,中国China+8651269369060(电话)+8651269369055(传真)[email protected]
Easyscan 2 AFM Scan Head Specifications
MaximumXY-range(resolution)(1) 70µm(1.0nm)
MaximumZ-range(resolution)(1) 14µm(0.2nm)
Static/DynamicRMSZ-noise typ.0.4nm(max.0.8nm)/typ.0.3nm(max.0.8nm)
Maximumsamplesize/height 12mm/3.5mm
Topviewcamera 3×3mmFOV,4×digitalzoom,2µmopticalresolution,2048×1536pixels,in-axisLEDillumination
Sideviewobservation 5×5mmFOV,variableLEDillumination(optionalcamera:2×2mmFOV,1280×1024pixels)
Approach 4mmlinearmotor,continuousorstep-by-stepapproach
Imagingmodes StaticForce,DynamicForce,PhaseContrast,MFM,EFM
Advancedimagingmodes(2) SpreadingResistance,ForceModulation
Spectroscopymodes Force–Distance,Amplitude–Distance,Voltage–Distance
Advancedspectroscopymodes(2) Current–Voltage,Stopbyendvalue,Fwd&Bwdpause
Lithographymodes StaticForce,DynamicForce,Oxidation
Advancedlithographymodes(2) DrawandloadCADvectorgraphics,Bitmapimages
Remotecontrol/add-ons(2) Windowsscriptinginterface:compatiblewithLabView,C#,VisualBasic,MatLab,andothersoftware...
Operatingsystem/PCrequirements WindowsXP/Vista/7(32/64-bit),1280x1024pxscreenresolution,Core2CPU,4GBRAM,1freeUSB2.0port
Size(LWH)/Weight/Power 204×204×160mm/6.5kg/100–240VAC(30W)
(1)Manufacturingtolerancesare±10%(2)NaioAdvancedModesOptionrequired
Compatible Options and Accessories
NaioAFMSideViewCamera,NaioAdvancedModesOption,IsostageAdaptersforNaio,AFMExtendedSampleKit
Particle size. Left: Staphylococcus aureusbacterial sample. Scan size 5.0 µm. Right:Goldcolloids.Scansize1.5µm.
Setup. ANaioAFMandaPCareallyouneed!
Cantilever exchange. Quick and simplecantilever exchange with the NaioAFM’sflip-over scanheaddesign and cantileverexchangetools.
TopviewcamerawithzoomSideviewobservationOptionalsideviewcamera
Atomic steps.HOPG.Singlelayerheightis0.34nm.ImageZ-rangeis3.5nm.Scansize3.2µm.
Data storage.Digitalvideotapewithmagneticallystoreddata,asrevealedbyMFM.Scansize50µm.
