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National Institute of Information and Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

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Revisions to the Spectral Test and the Lempel-Ziv Compression Test in the NIST Statistical Test Suite. National Institute of Information and Communications Technology, JAPAN Song-Ju Kim and Ken Umeno ( ChaosWare Inc. ). - PowerPoint PPT Presentation
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Revisions to the Spectral Test and the Lempel-Ziv Compression Test in the NIST Statistical Test Suite National Institute of Informat ion and Communications Technology, JAP AN Song-Ju Kim and Ken Umeno ChaosWare Inc.
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Page 1: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Revisions to the Spectral Test and the Lempel-Ziv Compression Test in the NIST Statistical Test Suite

National Institute of Information and Communications Technology, JAPAN

Song-Ju Kim and Ken Umeno ( ChaosWare In

c. )

Page 2: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

It is well known that the NIST Statistical Test Suite was used in the evaluation of the AES candidate algorithms.

It is also world-widely used by external audiences in the evaluation of their Pseudo Random Number Generators.

Page 3: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The NIST Statistical Test Suite

Random Excursions Variant16Random Excursions15Cumulative Sums14

Approximate Entropy13Serial12

Linear Complexity11Lempel Ziv Compression10

Universal9Overlapping Template Matching8

Non-overlapping Template Matching7Discrete Fourier Transform6

Binary Matrix Rank5Longest Run4

Runs3Block Frequency2

Frequency1Test NameNumber

Random Excursions Variant16Random Excursions15Cumulative Sums14

Approximate Entropy13Serial12

Linear Complexity11Lempel Ziv Compression10

Universal9Overlapping Template Matching8

Non-overlapping Template Matching7Discrete Fourier Transform6

Binary Matrix Rank5Longest Run4

Runs3Block Frequency2

Frequency1Test NameNumber

“A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications”

National Institute of Standards and Technology(2001)

http://csrc.nist.gov/rng/

Page 4: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

OUTLINE On the NIST Statistical Test Suite Test Results (AES, SHA-1, and MUGI) Checking of the Uniformity of P-values Corrections to the Spectral (DFT) Test Corrections to the LZC Test Summary

Page 5: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The test procedure A set of sequences, each of length n, is produ

ced from the selected generator. Each statistical test evaluates the sequence a

nd returns one or more P-values. If the P-value ≥ α(=0.01), then we call the se

quence “success”. 1. Checking of the success rate. 2. Checking of the uniformity of the distributio

n of P-values.

Page 6: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

What is p-value? P-value: the probability that a perfectrandom number generator would have produced a sequence less random than the sequence that are tested.

Page 7: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

1. The checking of the success rate

The range of acceptable proportions:                       

※   (μ±3σ)/m : 99.73% range of binomial

distribution, where μ= m (1 – α) and σ= m α(1- α). α=0.01: significance level

m)1(31

Page 8: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Success Rate (Example)

Key 1

Key 4

Page 9: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

2. The checking of the uniformity of the P-values distribution

The interval [0,1] is divided into 10 sub intervals, and the p-values that lie within each sub-intervals are counted (F i).

p-value of p-values: IGMC( 9   /   2, χ2   /   2 )

where IGMC(n, x) = and

The test passes if p-value of p-values ≥ 0.0001

10

1

2

2

10

)10

(

i m

mFi

dtn x

nt te

1

)(1

Page 10: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Uniformity of p-values (Example)

Key 1 (fail)

Key 4 (pass)

Page 11: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The parameters we used

n=10,

α=0.01,

6

1000 samples

20000Block Frequency

10Approximate Entropy10Serial

500 (5000)Linear Complexity

7(1280)

Universal(Initialization Steps)

9Template Matching

BLOCK LENGTHTEST NAME20000Block Frequency

10Approximate Entropy10Serial

500 (5000)Linear Complexity

7(1280)

Universal(Initialization Steps)

9Template Matching

BLOCK LENGTHTEST NAME

10 keysх1000 samplesх10^6 (sequence length) total 10^10 bit

Page 12: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Test Results AES (OFB)

Lempel-Zivpass10Lempel-Zivpass9

passpass8passNOTM, OTM7

Lempel-ZivCUSUM6Lempel-ZivNOTM(2)5

passpass4passREX3passpass2passpass1

UniformitySuccess RateKey

Lempel-Zivpass10Lempel-Zivpass9

passpass8passNOTM, OTM7

Lempel-ZivCUSUM6Lempel-ZivNOTM(2)5

passpass4passREX3passpass2passpass1

UniformitySuccess RateKey

Page 13: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Test Results SHA-1

Lempel-Zivpass10passpass9passNOTM8passNOTM(2)7passNOTM, REX, REXV6

Lempel-Zivpass5FFTNOTM(2)4passNOTM(2)3

Lempel-Zivpass2passpass1

UniformitySuccess RateKey

Lempel-Zivpass10passpass9passNOTM8passNOTM(2)7passNOTM, REX, REXV6

Lempel-Zivpass5FFTNOTM(2)4passNOTM(2)3

Lempel-Zivpass2passpass1

UniformitySuccess RateKey

Page 14: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Test Results MUGI

FFTpass10passNOTM9passpass8passpass7passpass6passNOTM5passpass4

Lempel-ZivLempel-Ziv3Lempel-Zivpass2

passNOTM1UniformitySuccess RateKey

FFTpass10passNOTM9passpass8passpass7passpass6passNOTM5passpass4

Lempel-ZivLempel-Ziv3Lempel-Zivpass2

passNOTM1UniformitySuccess RateKey

Page 15: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

If we focus on the uniformity of P-values, only the DFT test and LZC test are failed frequently.

If we choose the sample size m greater than 10000, we cannot find any PRNG that pass these two test.

Page 16: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

P-value of P-values (SHA-1)

Page 17: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

These distributions of P-values indicates a apparent deviation from randomness although we use a well-known good PRBG (SHA-1)

This observation suggests that the test settings in these two tests are not accurate.

Page 18: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The DFT testtest description (NIST document) The zeros and ones of the input sequence are conv

erted to values of -1 and +1. Apply a DFT on X to produce: S=DFT(X). Calculate M=modulus(S’), where S’ is the substring

consisting of the first n/2 elements in S. Compute T= : the 95% peak height threshold v

alue. Compute N0 = 0.95n/2. Compute N1 = the actual observed number of peak

s in M that are less than T. Compute P-value =

n3

2/)05.0)(95.0(01

nNNd

2|| derfc

Page 19: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The probability distribution (SHA-1)

n3

300,000samples

n995732274.2

Page 20: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

2npq

4npq

Page 21: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The LZC test test description (NIST document)

Parse the sequence into consecutive, disjoint and distinct words that will form a “dictionary” of words in the sequence.

ex. 0|1|00|01|000|11|011|

Compute P-value =

2221 W obserfc

Page 22: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The probability distribution (SHA-1)

09.69588

574336518.752 L

42178447.722 R

Page 23: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Despite the best fitting of the distribution, the uniformity of P-values cannot be improved.

This is because the distribution of the number of words is too narrow.

In other words, a variety of the appeared P-values is limited.

Page 24: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

The effect of discreteness

Page 25: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Because the variety of appeared P-values is too scarce in centered bins, we never get the uniformity of P-values in this situation.

The histogram of P-values always has some biases even if we use good PRNG.

However, these biases are always the same if we use good PRNG.

Page 26: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Checking of Uniformity (LZ)

10

1

2

2

10

)10

(

i m

mFi

10

1

22 )(

i iSmSimFi

.0924485.0,1028565.0

,1098615.0,0858035.0

,0911150.0,1369235.0

,0844650.0,1076910.0

,0791270.0,1097085.0

109

87

65

43

21

SSSSSSSSSS

Page 27: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

P-value of P-values (before)

Page 28: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

P-value of P-values (after)

Page 29: National Institute of Information and  Communications Technology, JAPAN Song-Ju Kim and Ken Umeno

Summary We corrected two points for DFT test. (1) the threshold T (2) the variance of the theoretical distribution

We corrected two points for LZ test. (1) setting of standard distribution (asymmetric) which

has no algorithm dependence. (2) re-definition of the uniformity of P-values.

42 npq2

2 npq

n3 n995732274.2


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