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Manas Bajaj1, Russell Peak1, Dirk Zwemer2, Thomas Thurman3, Michael Dickerson4, Kevin Brady5, John Messina5
1. Georgia Institute of Technology2. AkroMetrix, LLC3. Rockwell Collins, Inc.4. InterCAX, LLC5. National Institute of Standards and Technology
Next Generation Simulation-based Design Technologies for Electronics Product Realization
AkroMetrix
PDE 2005The 7th NASA-ESA Workshop on Product Data Exchange (PDE)
April 19-22, 2005 Manufacturing Research Center, Georgia Tech, Atlanta
2© Copyright 2005
AbstractNext Generation Simulation-based Design Technologies for Electronics Product Realization
The realm of electronics product realization is marked by an extremely fast-paced market, stringent demands for product reliability and high importance to innovative design. Further, the time-to-market and the cost-to-realize play a critical role for product success. However, these attributes pose conflicting constraints on the realization process. While engineers need to converge quickly on a set of design alternatives, the high demand for reliability increases the breadth of behavioral simulations across the design space. Further, the multi-disciplinary nature poses integration challenges due to a disparate set of engineering tools, model representations, and simulation techniques.
In this presentation, we shall focus on the following three technical areas to alleviate these hurdles in knowledge management during electronics product realization:
(1) Design-Analysis Integration: In order to quickly converge on a set of feasible design alternatives while covering a wide range of behavioral simulations across the design space, it is essential for engineers to synthesize analysis and solution-specific product models for a given design alternative. This process is guided by ascertaining the context of analysis, identifying possible idealizations and mapping information from design specifications to the analysis specifications. Further, the modularity of this process is essential to explore all possible alternatives.
We leverage from over a decade’s worth of experience spanning methodologies and tools (www.eislab.gatech.edu/research/dai/) and some recent advances in this area to demonstrate current and envisioned technologies for seamless design-analysis integration.
(2) Standards-based Knowledge Representation: In order to create high-fidelity design, analysis and manufacturable product models, it is essential to use a detailed and standard ontology for electronics product data specification. In this light, we employ STEP AP 210 (www.ap210.org) for electronic assembly packaging and design as the underlying representational structure for creating and archiving product models. Further, we use a harmonized set of STEP-based schemas for product model specifications across the design-analysis integration bridge. In this presentation, we shall focus on the ability of a standards-based knowledge representation scheme to support product and process related knowledge for electronics PLM.
(3) Experimental Validation of Simulation Techniques: In general, a simulation-based methodology needs to be validated against experimental results to justify reuse and instill confidence in decisions based on simulation results. In this presentation, we shall also demonstrate on algorithmic techniques for validating simulation results with experimental data and discuss some critical issues concerning the same.
Further, in this presentation, we will exemplify recent developments in the three technical areas using thermo-mechanical warpage analysis problem for printed circuit boards and assemblies, as part of the current collaborative effort between co-author organizations.
http://eislab.gatech.edu/pubs/seminars-etc/2005-cpda-dsfw-peak/
This document may identify commercial product names and materials to describe certain procedures or to provide concrete examples (i.e., to help clarify abstract concepts via specific instances). In no case does product or material identification imply recommendation or endorsement by the authors or their organizations, nor does it imply that such items are necessarily the best available for the purpose. Company, product, or service names may be included that are trademarks or service marks of others.
3© Copyright 2005
Contents Role of Simulation-based Design in
Electronics Product RealizationTheme -- Warpage Worthiness
Enabling Technologies– Design-Analysis Integration– Standards-based Product and Process Models– Computer-based engineering framework for
analysis, validation and design enrichment
Future Research
4© Copyright 2005
Electronics Product Realization
Environmental
Placement
Fabricate Test/Inspect
Part Symbol& Footprint
Assemble
Doc/Proc/RegGuidelines
Corrections
Release
Learn todayUtilize tomorrow
Functional
Layout
Req
uir
emen
ts
Routing Review
Des
ign
Build
5© Copyright 2005
Simulation-based DesignElectronic Packaging Examples: PWA-B
Analysis Modules (CBAMs) of Diverse Mode & Fidelity
Design Tools
Laminates DB
FEA Ansys
General MathMathematica
Analyzable Product Model
XaiToolsPWA-B
XaiToolsPWA-B
Solder JointDeformation*
PTHDeformation & Fatigue**
1D,2D
1D,2D,3D
Modular, Reusable Template Libraries
ECAD Tools Mentor Graphics,
Accel*
temperature change,T
material model
temperature, T
reference temperature, To
cte,
youngs modulus, E
force, F
area, A stress,
undeformed length, Lo
strain,
total elongation,L
length, L
start, x1
end, x2
mv6
mv5
smv1
mv1mv4
E
One D LinearElastic Model(no shear)
T
e
t
thermal strain, t
elastic strain, e
mv3
mv2
x
FF
E, A,
LLo
T, ,
yL
r1
12 xxL
r2
oLLL
r4
A
F
sr1
oTTT
r3L
L
m a t e r i a l
e f f e c t i v e l e n g t h , L e f f
d e f o r m a t i o n m o d e l
l i n e a r e l a s t i c m o d e l
L o
T o r s i o n a l R o d
G
J
r
2
1
s h e a r m o d u l u s , G
c r o s s s e c t i o n :e f f e c t i v e r i n g p o l a r m o m e n t o f i n e r t i a , J
a l 1
a l 3
a l 2 a
l i n k a g e
m o d e : s h a f t t o r s i o n
c o n d i t i o n r e a c t i o n
t s 1
A
S l e e v e 1
A t s 2
d s 2
d s 1
S l e e v e 2
L
S h a f t
L e f f
s
T
o u t e r r a d i u s , r o a l 2 b
s t r e s s m o s m o d e l
a l l o w a b l e s t r e s s
t w i s t m o s m o d e l
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
a l l o w a b l et w i s t Analysis Tools
PWBWarpage
1D,2D
Materials DB
PWB Layup ToolXaiTools PWA-B
STEP AP210, GenCAM**,
PDIF*
* = Item not yet available in toolkit (all others have working examples) ** = Item available via U-Engineer.com
DFX
6© Copyright 2005
ThemeAssessing Thermo-Mechanical Warpage of PWBs
Definition: WARPAGE is out of plane deformation of the artifact, caused by differential (non-homogenous) shrinkage or expansion of elements composing the artifact.
Out of plane deformation of a linear element
= (b L2 T) / t where
L: Undeformed Length; t: Undeformed Thickness; T: Temperature Change; b: Specific Co-efficient of Thermal Bending
Saddle Deformation
Bowl Deformation
Warpage of 2D artifacts ( basic modes)
7© Copyright 2005
Warpage – Impact and RequirementsRef: Thinking Globally, Measuring Locally
Editorial by Patrick Hassell, AkroMetrix
Impact Low manufacturing yield and high rework of
interconnects– Lack of co-planarity of component footprints– Fine pitch technology– Low solder paste volume
Requirements Managing warpage requirements
– Enforce local warpage requirements– Relax global warpage requirements
8© Copyright 2005
Multi-Representation Architecture (MRA) forDesign Analysis Integration
Tree View
Bare PWB
Electrical Mechanical Manufacturability
Warpage PTH Fatigue
Layered ShellEffective Materials Properties
Finite Element
Manufacturing Product Model
AnalysisProduct Model
Context-BasedAnalysis Model
AnalysisBuilding Blocks
SolutionMethod Model
9© Copyright 2005
Multi-Representation Architecture (MRA) forDesign Analysis Integration
Stepping-Stone Model View
Solution Method Model
ABB SMM
Analysis Building Block
Context-Based Analysis Model
SMMABB
APM ABB
CBAM
APM
Manufacturing Product Model(STEP AP210-based)
Solution Tools(ANSYS, …)
Printed Wiring Assembly (PWA)
Solder Joint
Component
PWB
body3body2
body1
body4
T0
Printed Wiring Board (PWB)
SolderJoint
Component
AnalyzableProduct Model
10© Copyright 2005
Complex Features Affecting Thermo-Mechanical Behavior
PCB outline
Comprised of straight lines and arcs (primitive level)
Mechanical (Tooling / Drilling) Hole
Circuit Traces
land
plated through hole
via
Footprint occurrence
This comprises of four lands, in this case. The component sits atop the lands.
Complete trace curve not shown
M150P2P11184
M150P1P21184
11© Copyright 2005
Example PCA design: Hexapod (from EAGLE displayed in STEP-Book AP210)
12© Copyright 2005
Product Enclosure
External Interfaces
Printed Circuit Assemblies(PCAs/PWAs)
Die/Chip Package
Packaged Part
InterconnectAssembly
Printed Circuit Substrate (PCBs/PWBs)
Die/Chip
STEP AP210 (ISO 10303-210) Domain: Electronics DesignR
~950 standardized concepts (many applicable to other domains)Development investment: O(100 man-years) over ~10 years
2003-04 - Adapted from 2002-04 version by Tom Thurman, Rockwell-Collins
Configuration Controlled Design of Electronic Assemblies,their Interconnection and Packaging
13© Copyright 2005
Use of STEP AP210 (ontology) for MPM / APM description
Standard for Electronic Assembly Interconnect and Packaging Design
Assembly Models
• User View• Design View• Component Placement• Material product• Complex Assemblies with Multiple Interconnect
Component / Part Models• Analysis Support • Package• Material Product• Properties• “White Box”/ “Black Box”• Test Bench
Requirements Models
• Design• Constraints• Interface• Allocation
Functional Models
• Functional Unit• Interface Declaration• Network Listing• Simulation Models• Signals• Test Bench
Interconnect Models• User View• Design View• Bare Board Design• Layout templates• Layers
Configuration Mgmt• Identification• Authority • Effectivity • Control• Net Change
• Geometric Dimensioning and Tolerancing
Design Control
Rules Models• Design• Manufacturing• …
Geometric Models• 2D• 3D• CSG, Brep…• EDIF, IPC, GDSII compatible “trace” model
http://www.ap210.org
14© Copyright 2005
Manufacturing Product Model (MPM) in anAP210 Standards-Based Engineering Framework
XaiToolsPWA-B
Eagle
LKSoft, …Gap-FillingTools
XaiToolsPWA-B LKSoft, …
Traditional Tools Mentor
Graphics
Manufacturing Product Model Components• STEP AP210
STEP-Book AP210,SDAI-Edit,
STI AP210 Viewer, ...
Instance Browser/EditorPWB Stackup Tool,…
ElectricalCAD Tools
pgpdm
Core PDM Tool
AP210interface
Doors
Slate
Systems EngineeringTools
- Eurostep AP233 Demonstrator- XaiTools AP233
15© Copyright 2005
Overall Process -- Circuit Board Stackup Design &Warpage Analysis Using AP210 (WIP)
GIT and NIST EEEL in collaboration with AkroMetrix, InterCAX/LKSoft, and Rockwell Collins
STEP AP210-basedProduct Model
Identification of warpage “hotspots” on a PCB
thickness…
wid
th
length
1 Solution Method Model
ABB SMM
2 Analysis Building Block
4 Context-Based Analysis Model3
SMMABB
APM ABB
CBAM
APM
Design Tools Solution Tools
Printed Wiring Assembly (PWA)
Solder Joint
Component
PWB
body3
body2
body1
body4
T0
Printed Wiring Board (PWB)
SolderJoint
Component
AnalyzableProduct Model
Multi-Representation Architecture
Design-Analysis Integration Methodology
Analysis Building Block Model (idealized bodies with effective material properties)
PCB Warpage Profile(given: thermal profile + boundary conditions)
Validation Measurements in AkroMetrix
TherMoiré oven chamber
Feedback
http://eislab.gatech.edu/projects/
16© Copyright 2005
Setting up context for warpage analysisAPM and ABB Creation
Grid (Sieve) Size
Single Layer View
…
Top view of “effective” grid elements in top layer of the PCB
…
Side view of the PCB with “effective” grid elements across
the stratums
thickness
wid
th
length
Given:
• Thermal loading profile
• Boundary Conditions (mostly displacement)
• Idealize PWB stackup as a layered shell
ABB ModelMPM / APM CBAM
Effective Material Property
Computation
CBAM attributes
• Thermal loading profile
• Boundary Conditions (mostly displacement)
• Idealize PWB stackup as a layered shell
17© Copyright 2005
View of Solution Method ModelLayered shell mesh Geometric constraints
all 6 degrees of freedom locked at midpoint – boundary condition
Currently this model is tool-specific (ANSYS).
Future possibility of AP209-based implementation exists.
18© Copyright 2005
-100
-50
0
50
100
150
200
Tem
per
atu
re (
C)
0
5
10
15
20
25
Model Exp't
Sca
le (
mil
s)
-50 C
19© Copyright 2005
XaiTools PWAB A computer-based framework for multi-fidelity SBD for PWA-B
20© Copyright 2005
ValidationRepresenting Validation Strategies
Metallization Grid
Feature BOM
JUnit-based Test Framework
STEP AP210-based x-ARM instance
Simulation and Experimental
Results
21© Copyright 2005
Enablers for Design Enrichment
22© Copyright 2005
Future ResearchAnalysis Level of Idealization – Grid Dimensions, Vias,… Controlled Meshing (non-tool specific) Printed Circuit Assembly Components
Experimental Validation Initial Conditions and Panelization Boundary Conditions and Reference Plane
Computer-based Engineering Framework
23© Copyright 2005
Acknowledgements
Georgia Tech– Injoong Kim– Miyako Wilson
LKSoftWare Gmbh– Lothar Klein*– Giedrius Liutkus*– Kasparus Rudokas– Tomas Baltramaitas
Rockwell Collins, Inc.–Michael J. Benda*–David D. Sullivan–William W. Bauer–Mark H. Carlson
–Floyd D. Fischer
PDES Inc.Electromechanical Pilot Team*
–Greg Smith (Boeing)–Craig Lanning (Northrop Grumman)–Steve Waterbury (NASA)