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NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R. v. Gastel, M. Seynen* University Leiden, The Netherlands *Institute for Atomic and Molecular Physics (AMOLF-FOM), Amsterdam
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Page 1: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

NOBUGS conference11-05-2002

Camera“Scanning Probe Microscope” software for

instrument control and data analysis.

E.H. v. Tol – Homan, G. v. Velzen, R. v. Gastel, M. Seynen*

University Leiden, The Netherlands

*Institute for Atomic and Molecular Physics (AMOLF-FOM), Amsterdam

http://www.physics.leidenuniv.nl/sections/cm/ip/ 11-05-2002

Page 2: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Overview

Overview

Introduction to Scanning Probe Microscopes (SPM) SPM – software specifications (video rate) Instrument control Data analysis SPM – software architecture Conclusion

Page 3: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

Scanning Probe Microscopes:

•Scanning Tunneling Microscope (STM)•Atomic Force Microscopes (AFM)•…

Page 4: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

Scanning Probe Microscopes:

•Scanning Tunneling Microscope (STM)•Atomic Force Microscopes (AFM)•…

The Scanning Tunneling Microscope works like a record player…

Page 5: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

X,YScan circuit

PiezoFeedbackElectronics PC

specimenU sample

Z

Ittip

Page 6: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

Line scan image of graphite surface. Each bump corresponds to a single carbon atom. The size of the image is only 3 nm 3 nm.

15 yearsAgo:

Now:

Perspective color view of Graphite surface

“PhotoCamera”

Page 7: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

New “Video camera”

High speed scanning probe microscope:

•25 pictures (256 x 256) per second

•Maximum scan speed: 3,3*106 pixels/sec

Page 8: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

Au (110)

Usample =-0.7V~ 22000 pixels/sec300 nm x 300 nm

Page 9: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Scanning Probe Microscopes (SPM)

Au (110)

Usample =-0.7V~ 134000 pixels/sec300 nm x 300 nm

Page 10: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

Computer specification for a high speed SPM:

Dual processor:first processor: data display / analysis / scalingsecond processor: instrument control

Dual monitor:first monitor data displaysecond monitor instrument control - window

Page 11: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

General specifications for a high speed SPM:

1. Two “user modes of operation”:

online and offline mode.

Online Mode-measurement

-analysis

Offline Mode-Post measurement analysis

GUI

Page 12: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

Online Mode Offline Mode

GUI

General specifications:

2. The program uses a DLL to configure and drive the hardware of the SPM. (Different DLL’s for each SPM)

STM- DLL …AFM- DLL

Page 13: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

Boundary requirements:

Very stable and reliable Fast data handling and graphics Extendable, Users can add own filters Windows look and feel

RECOVERY PROCEDURE !

Page 14: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

Why winNT (decided three years ago) ?

Multi tasking operating system Drivers for microEnable / hotlink only available under winNT. Commonly know environment Offline mode can run under windows 98,2002, XP

RT/Time-sharing

Real-time part: dedicated hardware

Time sharing – part: winNT (GUI).

Page 15: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

A collection of C++ classes and an application framework for creating Microsoft windows-based applications.

Document / View structure

Page 16: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software specifications

Document / View structure:

SPM – DATA

Page 17: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Instrument control

GUI

Online Mode-measurement

-analysis

Offline Mode-Post measurement analysis

Page 18: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Instrument control

MAIN SPMDLL

Data display

Instrument control

Page 19: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.
Page 20: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Instrument control

Measurement mode:

1. Approach (bringing the tip to the surface)

2. Setting scanning parameters

3. Scan (with video rate)

4. Save

During measurement analysis and display through main program.

Page 21: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

GUI

Online Mode-measurement

-analysis

Offline Mode-Post measurement analysis

Page 22: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.
Page 23: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Page 24: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Height line:

Page 25: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

3D:

Page 26: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Filter functions:

Clipping: image size adjustFilters:

Differentiate,Background subtraction…

FILTERDLL

MAIN

USER DEFINED DLL

Page 27: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Original data:

Page 28: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Backgroundsubtraction:

Page 29: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Data analysis

Differentiate(line by line)data:

Page 30: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software architecture

Architecture

Online Module Offline Module

GUI

STM- DLL AFM- DLL

Page 31: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software architecture

The interface (for Instrument Control) DLL:

MFC DLL, dynamically linked to theMFC-libraries.

Init Instance / Exit instance are called when the DLL is loaded / freed from memory.

Page 32: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

MAIN DLL

SendSPMCommand

This function is defined in the DLL, and called by the MAIN.

SendNotifyThis function is defined in the MAIN, and called by the DLL.

Page 33: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

MAIN DLL

SendSPMCommand

This function is defined in the DLL, and called by the MAIN.

Set / GetDeviceConfig

GetDeviceStatus / GetLastError

CommandWindowCreate / Close

Page 34: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

MAIN DLLSendNotify

This function is defined in the MAIN, and called by the DLL.

StartScanMeasurement

UpdateFrameData

StopScanMeasurement

Page 35: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

Threads overview

MEASUREMENTGUI

DISPLAY

Thread Safe

Page 36: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

DLL

Hardware

Message Loop

Disk

Page 37: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

SPM – software internally

Message Loop

MAIN

Process Filters

Page 38: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Conclusion

A graphical user interface for a high speed SPM (with video rate) has been developed using MFC and winNT.

NO BUGS

Page 39: NOBUGS conference 11-05-2002 Camera “Scanning Probe Microscope” software for instrument control and data analysis. E.H. v. Tol – Homan, G. v. Velzen, R.

Interface physics group

The Team:

Prof. Dr. J.W.M. Frenken (Group leader)Dr. ir. T.H. Oosterkamp (Group leader)Dr. M.J. Rost (Post-Doc)Ir. K. Schoots (Ph.D. Student)R. v. Gastel (Ph.D. Student)

Ing. B. Crama (Electronics) *B. Okhuysen (Group leader)Ing. P. Schakel (Electronics) *Ing. M. Seynen (Software)Ing. E.H. v. Tol-Homan (Software) *Ing. H. Dekker (Electronics)Ing. G. v. Velzen (Software) *Ing. A. Vijftigschild (Electronics)

*AMOLF/FOM

Email: [email protected] page: http://www.physics.leidenuniv.nl/sections/cm/ip/


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