Reception test measurements. Behavior for reference IC during the one day , 16 batches. one batch of the IC are from 15 IC for reason of reasonable uniform of flux 1 central IC is as reference chamber set up HV max 1500V 50 measured points each 1 sec - PowerPoint PPT Presentation
• one batch of the IC are from 15 IC for reason of reasonable uniform of flux • 1 central IC is as reference chamber • set up HV max 1500V • 50 measured points each 1 sec • leakage current measurements done with picometer (noice +/-0.3 pA) • switch on rad source: Cs-137, activity 98 GBq, distance from IC- source-1.4 m, dose rate – 4.7 mSv/h • 50 measured points for rad source signal • next batch… IC 1330:R ad Source M easurem ents 72.0 73.0 74.0 75.0 76.0 77.0 78.0 79.0 80.0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Reception test measurements Behavior for reference IC during the one day , 16 batches IC1330:LC 0.0 0.5 1.0 1.5 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 pA pA N of the batch N of the batch 1 8 15 . . . . 1.4 m Source
Transcript
• one batch of the IC are from 15 IC for reason of reasonable uniform of flux
• 1 central IC is as reference chamber• set up HV max 1500V• 50 measured points each 1 sec
• leakage current measurements done with picometer (noice +/-0.3 pA)
• switch on rad source: Cs-137, activity 98 GBq, distance from IC-source-1.4 m, dose
rate – 4.7 mSv/h • 50 measured points for rad source signal
• next batch… IC1330:Rad Source Measurements
72.0
73.074.0
75.076.0
77.0
78.079.0
80.0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Reception test measurementsBehavior for reference IC during the one day , 16 batches
IC1330:LC
0.0
0.5
1.0
1.5
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
pA
pA
N of the batch
N of the batch
1
8
15
.
.
.
.1.4 m Source
Leakage Current Measurements
0.00
0.20
0.40
0.60
0.80
1.00
1.20
1.40
1 2 3 4 5 6 7 8 9 10
IC
LC
,pA
Central IC
0.000.200.400.600.80
1.001.201.401.60
1 11 21 31 41 51 61 71
N of measurements
LC
,pA
March,2007, GIF1080 IC : Dec06,Jan07,Feb07 production
The same 10 IC measured twiceThe change of LC for reference IC during of the all 79 sets
0
10
20
30
40
50
60
70
80
90
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
LC,pA
N o
f IC
The 4 IC from 1080 measured at GIF has a LC problems.
1080 IC : Dec06,Jan07,Feb07 production
N of the measurements
-5.0-3.0-1.01.03.05.07.09.0
11.013.015.017.019.0
0 1000 2000 3000 4000
Leakage Current Measurementssummary
4250 IC :IHEP production
The IC with LC <2 pA accepted. The ~20 IC from 4250 measured at GIF has a big LC or some problemsIt checked in the Lab.
pA
N of the IC
Rad. Source Measurements
62.00
64.00
66.00
68.00
70.00
72.00
74.00
76.00
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Batch14:Rad
66.0
68.0
70.0
72.0
74.0
76.0
78.0
1 2 3 4 5 6 7 8 9 1 11 1 1 1 15
Batch15:Rad
66.0
68.0
70.0
72.0
74.0
76.0
78.0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
The signal from RS for two batches
The summary of signal for all batches during of the one day measurements
pA
Order N of the IC place in one batch
pA pA
N of the IC place in one batchN of the IC place in one batch
Rad Source signal at GIF
50.0
55.0
60.0
65.0
70.0
75.0
80.0
1 501 1001 1501 2001 2501 3001 3501 4001
53.00
54.00
55.00
0 5 10 15 20 25 30 35 40 45
4250 IC :IHEP production
40 first measured ICat RP source facility
pA
N of the IC
The RS signal +/- 5 %. The further analysis: flux uniform, reference IC signal, all chambers will be done.
