+ All Categories
Home > Documents > Paradigm Shift in Functional Test - EP-TeQ

Paradigm Shift in Functional Test - EP-TeQ

Date post: 25-Mar-2022
Category:
Upload: others
View: 0 times
Download: 0 times
Share this document with a friend
15
Paradigm Shift in Functional Test
Transcript
Page 1: Paradigm Shift in Functional Test - EP-TeQ

Paradigm Shift in Functional Test

Page 2: Paradigm Shift in Functional Test - EP-TeQ

For public distribution, v12.2017

2

Source: Gartner

CAGR: 7%

Page 3: Paradigm Shift in Functional Test - EP-TeQ

ATE/ATS

For public distribution, v12.2017

3

UUT

Drive Signals

Get Responses

FPGA

Who provides the FPGA configuration here on the UUT?!

Page 4: Paradigm Shift in Functional Test - EP-TeQ

Automated Test Synthesis

For public distribution, v12.2017

4

FPGAQSPI

DDRAM

XADCEthernet Oscillator

HDMI

PCIe

USB

I2C Switches

SATA

LCDPush

buttons

FMC connectors

Page 5: Paradigm Shift in Functional Test - EP-TeQ

For public distribution, v12.2017

5

CorePiler

Board Designer Factory Floor ATE

Page 6: Paradigm Shift in Functional Test - EP-TeQ

Application Examples

For public distribution, v12.2017

6

At Volume Production Line

QI would screen out defective partsbefore applying time-consumingfunctional and application tests.

At Troubleshooting Station

QI help to narrow down defectscaused functional test to fail,thereby shortening the repair andretest cycle.

Page 7: Paradigm Shift in Functional Test - EP-TeQ

More Than Functional Test

7

Determine how much of signal distortion can still be tolerated• Error rates are color-coded

• The more red area observed – the less distortion can be tolerated

Quick BER eye measurement (1-5 seconds)

For public distribution, v12.2017

7

Error rate if data is

sampled under

normal conditions

Phase and voltage

threshold shifted

All errors

No errors

Some errors

Phase shift

Vo

lta

ge

th

resh

old

sh

ift

BER eye examples

Goodlink

Proble-matic

link

Page 8: Paradigm Shift in Functional Test - EP-TeQ

More Than Functional Test

For public distribution, v12.2017

8

Two GND lines for DQ40-47 byte

group missing

Page 9: Paradigm Shift in Functional Test - EP-TeQ

In-field Experience is Sorrowful

For public distribution, v12.2017

9

“A DIMM that sees a correctable error is 13–228 times more likely to see another correctable error in the same month, compared to a DIMM that has not seen errors.” [2]

“Failures in DRAM are a dominant source of errors in modern systems”

“Non-DRAM memory failures, such as those in the memory controller and the memory channel, are the source of the majority of errors that occur” [1]

Page 10: Paradigm Shift in Functional Test - EP-TeQ

ATE Integration

For public distribution, v12.2017

10

System

Under

Test

PCBA BOARD

HEADER

UUT2UUT1

UU

T3

FPGA

General purpose

IO instrument card

FPGA on the

customer board

holds diagnostic

instrumentation

JTAG standard bus

can be used to com-

municate between

the two couterparts

Typical general

purpose func-

tional tester (FT)

Page 11: Paradigm Shift in Functional Test - EP-TeQ

Demo Application at NTF

11For public distribution, v12.2017

Page 12: Paradigm Shift in Functional Test - EP-TeQ

12For public distribution, v12.2017

Automatically synthesized and placed

Eliminate the need for FPGA designer

Controlled from ATE/ATS or standalone

Provide better than functional test coverage

Cover Marginal Faults/Defects

Cloud-based service

Page 13: Paradigm Shift in Functional Test - EP-TeQ

Instruments

For public distribution, v12.2017

13

External/ATE Embedded

Traditional Synthetic

Virtual

Traditional Synthetic

Virtual

• BIT• SST• POST• BIST• BA-BIST• HSIO-BIST• IBIST• MBIST• LBIST• sensors

• FCT by ASSET• CoreCommander

by JTAG Tech

FPGA Card

Page 14: Paradigm Shift in Functional Test - EP-TeQ

Technology Benefits

14For public distribution, v12.2017

Improves Test Quality

Lowers Test Development Costs

Reduces Test Escape Rate

Easy Integration

Faster prototype bring-up

Page 15: Paradigm Shift in Functional Test - EP-TeQ

THANK YOU!

For public distribution, v12.2017

15


Recommended