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Passivation at the interface between liquid- phase crystallized silicon and silicon oxynitride in thin film solar cells Helmholtz-Zentrum Berlin für Materialien und Energie Dr. Jan Amaru Palomino Töfflinger, Sección Física, Pontificia Universidad Católica del Perú Natalie Preissler, Dr. Onno Gabriel, Dr. Daniel Amkreutz, Dr. Bernd Stannowski, Dr. Rutger Schlatmann, Dr. Bernd Rech.
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Passivation at the interface between liquid-phase crystallized silicon and silicon

oxynitride in thin film solar cells

• Helmholtz-Zentrum Berlin für Materialien und Energie

Dr. Jan Amaru Palomino Töfflinger,

• Sección Física, Pontificia Universidad Católica del Perú

Natalie Preissler, Dr. Onno Gabriel, Dr. Daniel Amkreutz, Dr. Bernd Stannowski, Dr. Rutger Schlatmann, Dr. Bernd Rech.

200 400 600 800 1000

Wavelength [nm]

Yb3+2F5/2 2F7/2

Sm3+4G5/2 6H7/2

4G5/2 6H9/2

CL

In

tensitie

s [

a.u

.]

Eu3+5D0 7F1,2

Tb3+5D4 7F5

Tm3+1G4 3H61D2 3H4

Dy3+

4F9/2 6H13/2

Grupo de Materiales (Sección Física, PUCP)

Publicaciones 2016 en revistas indexadas

N. Preissler, J. A. Töfflinger, et al., Progress in Photovoltaics, accepted (2016)

J. A. Guerra, et al., J. Phys. D: Appl. Phys. 49, 375104. (2016)

N. Preissler, J. A. Töfflinger, et al., Phys. Status Solidi A 213 (7), 1697 (2016)

J. A. Guerra, et al., J. Phys. D: Appl. Phys. 49, 195102. (2016)

Proyectos en ejecución

J. A. Guerra (PUCP-HZB), Proyecto de movilidad DAAD-Concytec

R. Weingärtner (PUCP-Ilmenau), Proyecto de movilidad DAAD-Concytec

J. A. Töfflinger (PUCP), Innóvate Perú, Repatriación, 274-PNICP-BRI-2015

Líneas de investigación

Semiconductores con tierras raras para celdas solares y dispositivos luminiscentes

Materiales de pasivación en celdas solares de silicio

Caracterización de a-SiC:H para la producción foto-electroquímica de hidrogeno

Roland Weingärtner Amaru Töfflinger Andrés Guerra

TEM SiC:H

a-Si

(10 – 20 µm)

IL

(≈ 200 nm)

glass

(1 – 3 mm)

LPC-Si

line-shaped laser or e-beam

liquid Si

Thin-film solar cell

Total: 18 3 Científicos/ PhD

3 Doctorandos

10 Maestrandos

1 Tesista Lic.

1 Assistente

Producción Caracterización Aplicación

Rare earth luminescence Magnetron sputtering

SiC:Tb3+

Other: AlN:H, SiN:H, ITO...

Optical properties

Structural properties

Electrical properties

In cooperation with

2

State of the art - commertial solar modules

3 ©Fraunhofer ISE: Photovoltaics Report, updated: 6 June 2016

4

Standard Crystalline Silicon solar panel

Source: McGehee, Energy Seminar 2014

?

ARC + Front passivation (standard SiNx)

+ (n+)

mc-Si (p)

(p++) Al-BSF

> 2

00

µm

1. Absorption of light and generation of charge carriers

3. Extract photo-voltage and -current -> electric power

2. Separation of charge carriers (p/n-junction: E-field)

1.

+ -

2. 3.

Solar cell efficiency η:

η

Standard mc-Si (p) Solar cell efficiency η ≈ 16%

The Photovoltaic effect

5

Trend in the silicon wafer based solar cells

RS contact

ARC

FS contact

> 2

00

µm

“Standard” solar cell

+ (n+)

c-Si (CZ, mc) (p)

(p++)Al

Emitter

Absorber

Key technology:

high level passivation!!!

η ≈ 16%

+ (n + )

c - Si (CZ, mc ) (p)

< 1

50

µm

Passivated Emitter and Rear Cell (PERC)

Passivation

stack

η > 18%

c-Si (CZ, mc) (p)

+

(

n+)

+

(

n+)

TCO

Si-Absorber

a-Si:H (i) a-Si:H (n)

TCO

a-Si:H (i) a-Si:H (p)

Heterojunction solar cell (HIT) η > 20%

6

+ (n + )

c - Si (CZ, mc ) (p)

c-Si

e.g.

a-SiN

Dit

Trend in the silicon wafer based solar cells

Passivated Emitter and Rear Cell (PERC)

η > 18%

Surface passivation =

Reduction of the recombination of photogenerated

charge carriers at surfaces

Main recombination parameters:

Interface defect state density Dit

Fixed charge density Qf

< 1

50

µm

+ -

+ -

+ -

+ Qf

Chemical passivation

Field-effect passivation 7

Trends in solar cell technology and research

8

40%

50%

20%

Efficiency

III/V Conc.

c-Si wafer

Thin film

Cost per area

Dye organics

https://educast.pucp.edu.pe/speaker/2864

1. Reduce c-Si cost: LPC-Si thin film

9

+ (n+)

mc-Si (p)

(p++) Al-BSF

~ 1

80

µm

Commercial solar cell Efficiency η = 15-16 %

2016: 90% market share for crystalline Si Silicon material: 30-40% of solar module cost

10

O. Gabriel et al., Prog. Photovolt: Res. Appl., doi: 10.1002/pip.2707 (2015) T. Frijnts, et. al., Solar Energy Materials & Solar Cells 143 457-466 (2015) S. Kühnapfel, et. al., Solar Energy Materials & Solar Cells 140 86-91 (2015)

Thin-film, liquid-phase-crystallized (LPC)-Si solar cells, Efficiency η = 13.2%

Reduce c-Si cost: LPC-Si thin film

Reduce c-Si cost: LPC-Si thin film

11

laser-crystallization

Thin-film, liquid-phase-crystallized (LPC)-Si solar cells, Efficiency η = 13.2%

O. Gabriel et al., Prog. Photovolt: Res. Appl., doi: 10.1002/pip.2707 (2015) T. Frijnts, et. al., Solar Energy Materials & Solar Cells 143 457-466 (2015) S. Kühnapfel, et. al., Solar Energy Materials & Solar Cells 140 86-91 (2015)

Thin-film, liquid-phase-crystallized (LPC)-Si solar cells, Efficiency η = 13.2%

Reduce c-Si cost: LPC-Si thin film

12

laser-crystallization

LPC-Si a-Si

Voc = 640 mV

Jsc = 28 mA/cm2

FF = 74 % η = 13.2 %

O. Gabriel et al., Prog. Photovolt: Res. Appl., doi: 10.1002/pip.2707 (2015) T. Frijnts, et. al., Solar Energy Materials & Solar Cells 143 457-466 (2015) S. Kühnapfel, et. al., Solar Energy Materials & Solar Cells 140 86-91 (2015)

PUCP: Characterize electrical properties of LPC-Si/interlayer interface

LPC-Si thin film: Interface Passivation

13

S

I

M

Publications in colaboration HZB – PUCP: N. Preissler, J. A. Töfflinger, et al. (2016) Phys. Status Solidi A 213 (7), 1697 N. Preissler, J. A. Töfflinger, et al. (2016) Progress in Photovoltaics, accepted for publication

Thin-film, liquid-phase-crystallized (LPC)-Si solar cells, Efficiency η = 13.2%

LPC-Si thin film: Interface Passivation

C-V samples

→ QIL,eff & Dit

solar cells

→ Voc & Jsc,EQE

0.0

0.5

1.0

1.5

2.0

2.5

3.0

Dit,M

G [1

012 e

V-1cm

-2]

n pp-doped LPC-Si n-doped LPC-Si

500

550

600

650

0.0 0.5 1.0 1.5 2.0 2.5

14

16

18V

oc [m

V]

Jsc,E

QE [m

A/c

m2]

Dit,MG

[eV-1cm

-2]

n-doped LPC-Si

p-doped LPC-Si

Simulations: Interface is well passivated by field-effect, bulk passivation dominates

Thermal treatments

Hatm30: H2 atmosphere, 30 min, 400°C

Hpla15: H2 plasma, 15 min, 400°C

Hpla30: H2 plasma, 30 min, 400°C

N. Preissler, J. A. Töfflinger, et al. (2016) Progress in Photovoltaics, accepted for publication

QIL,eff > 1012 cm-2 barely affected

LPC-Si thin film: Interface Passivation

C-V samples

→ QIL,eff & Dit

solar cells

→ Voc & Jsc,EQE

0.0

0.5

1.0

1.5

2.0

2.5

3.0

Dit,M

G [1

012 e

V-1cm

-2]

n p

500

550

600

650

0.0 0.5 1.0 1.5 2.0 2.5

14

16

18V

oc [m

V]

Jsc,E

QE [m

A/c

m2]

Dit,MG

[eV-1cm

-2]

Simulations: Interface is well passivated by field-effect, bulk passivation dominates

Thermal treatments

Hatm30: H2 atmosphere, 30 min, 400°C

Hpla15: H2 plasma, 15 min, 400°C

Hpla30: H2 plasma, 30 min, 400°C

QIL,eff > 1012 cm-2 barely affected

N. Preissler, J. A. Töfflinger, et al. (2016) Progress in Photovoltaics, accepted for publication

p-doped LPC-Si n-doped LPC-Si

n-doped LPC-Si

p-doped LPC-Si

Best research-cell efficiencies

16 http://www.nrel.gov/pv/

Best research-cell efficiencies

17

Emerging PV $ Unstable, mostly low efficiency KRICT (Perovskite) 20.1 %

Crystalline Si cells $$ Commercial use Panasonic (HIT) 25.6 % SunPower 25.0 %

Multijunction and GaAs cells $$$$ Space & concentrator applications Fraunhofer ISE / Soitec 46.0 %

Thin-Film cells $$ Commercial use ZSW (CIGS) 21.7 %

http://www.nrel.gov/pv/

Materials Science group, Sección Física Roland Weingärtner, Andrés Guerra

PNICP contract No 274-PNICP-BRI-2015

Norbert Nickel, Walter Füssel, Bernd Stannowski, Ivo Rudolph

Acknowledgements

Passivation at the interface between liquid-phase crystallized silicon and silicon

oxynitride in thin film solar cells

• Helmholtz-Zentrum Berlin für Materialien und Energie

Dr. Jan Amaru Palomino Töfflinger,

• Sección Física, Pontificia Universidad Católica del Perú

Natalie Preissler, Dr. Onno Gabriel, Dr. Daniel Amkreutz, Dr. Bernd Stannowski, Dr. Rutger Schlatmann, Dr. Bernd Rech.


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