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[email protected] Marketing Director A new ATE company lowering product test cost through DFT solutions
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Page 1: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

[email protected]

Marketing Director

A new ATE company lowering product test cost through DFT solutions

Page 2: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Inovys Now Introducing Stylus, Ocelot, and Personal Ocelot

Stylus: a Windows tester operating system

Ocelot: high volume DFT production tester

Personal Ocelot: desktop DFT tester

Page 3: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Inovys STIL application overview

Integration and support planDirect read into Stylus tester operating system

Flow/methodology

Page 4: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Inovys STIL application overview

Integration and support planDirect read into tester operating system

Lexical/syntax files for EMACS and VIM

Flow/methodology

Page 5: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Inovys STIL application overview

Integration and support planDirect read into tester operating system

Lexical/syntax files for EMACS and VIM

Flow/methodology

Page 6: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

IC Design (EDA)

Solving The Test Development Problem

Translator

Tester “Z”

Translator

Tester “Y”

Translator

Tester “X”

Proprietary ATE Test Languages

Design to test translation tools(Fluence/IMS, Simutest, in-house)

functional test data(e.g. VCD files)

structural test data(IEEE1450 - STIL)

Test bench

IC Design DFTDFT ATPGATPG

Page 7: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Test bench

IC Design

IC Design (EDA)

StylusStylus SoftwareSoftware

STILSTIL

Manufacturing

PersonalOcelot Ocelot

DFTDFT ATPGATPG

Development / AnalysisDevelopment / Analysis

Page 8: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Direct Links to EDA

Synopsys’ TetraMAX*

Mentor Graphic’s FastScan*

Cadence TestBench*

*using IEEE1450 Standard Test Interface Language (STIL)

Page 9: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Current Status

Progress reportReleased Stylus: 1 minor, 2 major [June 2002]

Offering text editor syntax files [open source]• http://www.inovys.com/login/STIL-mode.el• http://www.inovys.com/login/STIL.vim

SuccessesVerified STIL customer patterns from FastScan

Verified STIL customer patterns from TetraMAX

Page 10: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Current Status (continued)

Technical issuesNo showstoppers

Limitations Specific to STIL Practical considerations in actual use, e.g.

• Name reuse/conflicts combining runs• Common to see forward referencing error• and more…

Page 11: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Future plans

Contribute real usage experience

Sandbox dot committee extensions

Conform to final balloted specification

Page 12: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Conclusions:

Inovys supports STIL natively today

STIL flow working at major customer(s)

Accelerates fail data feedback to EDA

Page 13: Peter_GH_Hwang@inovys.com Marketing Director A new ATE company lowering product test cost through DFT solutions.

Fully Committed to STIL


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