Phys. Rev. Lett. 49, 57 (1982)Phys. Rev. Lett. 50, 120 (1983)

First STM images

IT(z)

J. K. Gimzewski and R. Möller, Phys. Rev. Lett. 36, 1284 (1987)

mechanical contact

eff 3.5 eV

eff 1.5 eVlg

-

Structural information from STM

J. Tersoff. D. R. Hamann, Phys. Rev. Lett. 31, 805 (1985)

calculated LDOS at EF

T. Gritsch, D. Coulman, R.J.Behm, and G. Ertl, Surf. Sci. 257, 297 (1991)

(1x2) missing row reconstruction on Au(110)

STM at semiconductors

R.J. Hamers, R.M. Tromp, and J.E.Demuth, Phys. Rev. Lett. 56, 1972 (1986)

Si(111) 7x7

STM at close-packed metal surfaces

J. Wintterlin et al., Phys. Rev. Lett. 62, 59 (1989)

D. Wang et al., Phys. Rev. Lett. 23, 1685 (1981)

C. J. Chen, Phys. Rev. Lett. 65, 448 (1990)

J. V. Barth et al., Phys. Rev. B 42, 9307 (1990)

STM imaging of adsorbates

N. D. Lang, Phys. Rev. Lett. 56, 1164 (1986)

D. M. Eigler and E. K. Schweizer, Nature 344, 524 (1990)

Xe on Ni(110)

apparent height: 1 Åvan-der-Waals radius: 3.6 Å

Scanning Tunneling Spectroscopy

Banin et al., Nature 400, 542 (1999)

InAs

B. C. Stipe, M. A. Rezaei, and W. Ho, Phys. Rev. Lett. 82, 1724 (1999)

Atomic force microscopy

G. Meyer and N. M. Amer, Appl. Phys. Lett. 56, 2101 (1990)

T. R. Albrecht et al., J. Vac. Soc. A8, 3386 (1990)

Scanning Near Field Optical Microscopy

from:Kurt W. Kolasinski, Surface Science (Wiley 2002)