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NCN
Lecture 17: Hall Effect, Diffusion
Muhammad Ashraful [email protected]
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Outline
1) Measurement of mobility
3) Physics of diffusion
u
REF: ADF,
Chapter
5,
pp.
190
‐202
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Problem of mobility measurement …
V
ρ = J E
( )μ μ = +n pq n p J E
( )n p
q n p ρ
μ μ =
+
1
-n D
q N μ …
1= -
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p A
q N μ …
?
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Outline
1) Measurement of
mobility
3) Physics of diffusion
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Set up for Hall Measurement
z
VH
B
w
-+
LI
UIC system: 4‐300K, 0‐1.5 T
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Mobility Measurement
Magnetic FieldI z
VHxy
Magneto‐electric effect
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v z ….
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Drude Model
*
−− −m υ *
υ
Weak B field …
τ 0τ
− − ≈qE υ
'τ −q E
*
τ τ = − − ×υ B
m q qE
*
τ τ τ
⎛ ⎞≈ − − − ×⎜ ⎟
⎝ ⎠B
mq
E E
*m
2 2
* *1c
q B q Bτ τ τω = ≡ <<
….*
τ τ = − + ×Bqqm
E E
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m q mτ
* *2
τ τ υ = − + ×B
q q
m m
E
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Drude Model & Hall Effect …
−n
B Fieldz2 2τ τ τ
= −q n q n q
I VH
y
−
* * *m m m
0 0
0 0
0 0
σ σ μ
σ μ σ −=⎢ ⎥ ⎢ ⎥⎢ ⎥
⎣ ⎦⎣ ⎦ ⎣ ⎦
x
y z
x z
y B J E
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Hall Resistance
0 0 x x J E Bσ σ μ −⎡ ⎤ ⎡ ⎤⎡ ⎤B Fieldz
0 0 y y z J E Bσ μ σ
=
⎣ ⎦⎣ ⎦ ⎣ ⎦ VH
0
0 0
0 x x
y y z
J E
J E B
σ
σ μ σ
⎡ ⎤≈⎢ ⎥ ⎢ ⎥⎢ ⎥
⎣ ⎦⎣ ⎦ ⎣ ⎦
0 0 x xE J σ ⎡ ⎤⎡ ⎤⎡ ⎤
= ⎢ ⎥
E B
0 0 y zσ μ σ
between 0.5 and
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y z
H
x
R
J qn
= = −
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Temperature‐dependent Concentration
Freezeout
Extrinsic
Intrinsic
D
n
N
1
in
Temperature
D
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Outline
1) Measurement of
mobility
3) Physics of diffusion
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Now the Diffusion term…
1 N N N n r gt q
∂ = ∇ • − +∂J
I
1∂
J μ = + ∇ N N N qn E qD n
= − • − +∂
P P Pr gt q
P P Pqp E qD pμ = − ∇J
( )+ −∇ • = − + − D A D q p n N N
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Diffusion Flux …
x
(0) (0)(0 ( )) 0+⎡ ⎤⎛ ⎞ ⎛ ⎞⎢ ⎥⎜ ⎟ ⎜ ⎟
= − × + ×⎢ ⎥⎜ ⎟ ⎜ ⎟
+ − +dp
p ldx
p pdp
q q x l
p
J l
l
ld
υ ⎜ ⎟ ⎜ ⎟⎢ ⎥⎝ ⎠ ⎝ ⎠⎣ ⎦th
υ d d l
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= ≡q q
dx dx
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Flat Fermi‐level defines Equilibrium …
0 μ = = +n n n
dn J qn qDE
n2
n1
n
1 μ ⇒ = − n
n
x
dn
n dx D
E
F E C E 1C E
2C
0
μ μ −
∫ = =
L
n n
n n
V
D D
E
V E
2
2 1
( ) / ( ) / / 2
− −− −
C F
C C
E E kT E E kT qV kT C
N en
L
1
1( ) / − −C F E E kT
C N n e
V V
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n n
n nkT D kT D= ⇒ =
cn and en discussed in Chapter 5
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Conclusion
1) Measurement
of
mobility
and
carrier
concentration
is
particularly important for analysis of semiconductor
devices.
‐, ,
the elemental processes in semiconductor device physics.
e w
pu
e p eces
oge er
n
e nex
c ass.
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