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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 1 EE247 Lecture 20 ADC Converters (continued) Comparator design (continued) Latched comparators Comparator architecture examples Techniques to reduce flash ADC complexity • Interpolating • Folding Interpolating & folding Interleaved ADCs Multi-Step ADCs Two-Step flash Pipelined ADCs Effect of sub-ADC, sub-DAC, gain stage non-idealities on overall ADC performance EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 2 Project Design & simulate an ADC ENOB=6bit for fsignal<10MHz Signal bandwidth 0 to 100MHz Architecture of your choice targeted for minimum power dissipation Description posted in the homework section Teams of two preferred Report due Dec. 3 rd Powerpoint presentation ~5min/person in class on Dec. 8 th
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Page 1: Project - University of California, Berkeleyee247/fa09/files07/... · 2009. 11. 10. · – Latch offset 50 to 100mV – Preamp DC gain 10X – Preamp input-referred latch offset

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 1

EE247Lecture 20

ADC Converters (continued)– Comparator design (continued)

• Latched comparators• Comparator architecture examples

– Techniques to reduce flash ADC complexity• Interpolating• Folding• Interpolating & folding

– Interleaved ADCs– Multi-Step ADCs

• Two-Step flash• Pipelined ADCs

– Effect of sub-ADC, sub-DAC, gain stage non-idealities on overall ADC performance

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 2

Project

• Design & simulate an ADC– ENOB=6bit for fsignal<10MHz– Signal bandwidth 0 to 100MHz– Architecture of your choice targeted for minimum

power dissipation– Description posted in the homework section – Teams of two preferred– Report due Dec. 3rd

– Powerpoint presentation ~5min/person in class on Dec. 8th

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 3

CMOS Latched Comparators

Comparator amplification need not be linearcan use a latch regeneration

Latch Amplification + positive feedback

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 4

CMOS Latched ComparatorsSmall Signal Model

Latch can be modeled as a:Single-pole amp + positive feedback

Small signal ac half circuit

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 5

CMOS Latched ComparatorLatch Delay

2 2

1 1

2D 2 1

1

1 11 1

1 1 1Integrating both sides: 1 ln ln ln ln

Latch Delay:1 ln11

mL

m m

m L m L

t V a amb

t V bm L

m

m L

V dVg V CR dt

g dV g dVV dtC g R dt C g R V

g adt dV dx x a bC g R V x b

C Vt t tg V

g R

= +

⎛ ⎞ ⎛ ⎞− = − =⎜ ⎟ ⎜ ⎟⎝ ⎠ ⎝ ⎠

⎛ ⎞ ⎛ ⎞− = = = − =⎜ ⎟⎜ ⎟ ⎝ ⎠⎝ ⎠

⎛ ⎞ ⎛ ⎞= − = ⎜ ⎟ ⎜⎝−⎜ ⎟⎜ ⎟

⎝ ⎠

∫ ∫ ∫

2D

1

For 1

ln

m L

m

g R

C Vtg V

⎟⎠

>>

⎛ ⎞≈ ⎜ ⎟⎝ ⎠

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 6

Latch-Only Comparator• Much faster compared to cascade of open-

loop amplifiers

• Main problem associated with latch-only comparator topology:

– High input-referred offset voltage (as high as 100mV!)• Solution:

– Use preamplifier to amplify the signal and reduce overall input-referred offset

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 7

Pre-Amplifier + LatchOverall Input-Referred Offset

LatchVi+

Vi-

Do+

Do-

fs

Preamp

Av

VosLatchVosPreamp

2 2Re _ _ Pr _2

Pr

_ Pr _ Pr

2 2Re _ 2

1

: 4 & 50 & 10

14 50 6.410

Input ferred Offset Vos eamp Vos Latcheamp

Vos eamp Vos Latch eamp

Input ferred Offset

A

Example mV mV A

mV

σ σ σ

σ σ

σ

= +

= = =

= + =

Latch offset attenuated by preamp gain when referred to preamp input.Assuming the two offset sources are uncorrelated:

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 8

Pre-Amplifier Tradeoffs

• Example:– Latch offset 50 to 100mV– Preamp DC gain 10X– Preamp input-referred latch offset 5 to 10mV– Input-referred preamplifier offset 2 to 10mV– Overall input-referred offset 5.5 to 14mV

Addition of preamp reduces the latch input-referred offset reduced by ~7 to 9X ~allows extra 3-bit resolution for ADC!

LatchVi+

Vi-

Do+

Do-

fs

Preamp

Av

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 9

Comparator Preamplifier Gain-Speed Tradeoffs• Amplifier maximum Gain-Bandwidth product (fu) or a given technology, typically a

function of maximum device ft

- Tradeoff:• To reduce the effect of latch offset high preamp gain desirable• Fast comparator low preamp gain

Choice of preamp gain: compromise speed v.s. input-referred latch offset

fu=0.1-10GHz

f0 fu freq.

Magnitude

Av

0 0

0

preamp

0

preamp

preamp 0

0

=unity gain frequency, 3 frequency & settling time

For example assuming preamp has a gain of 10:1 100

10

1 1.6 sec2 2

u

u

u

u

f f dBff

A

f GHzf MHzA

An

f f

τ

τπ π

= − =

=

= = =

= = =

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 10

Latched Comparator

Av LatchVi+

Vi-

Do+

Do-

fs

Preamp

Important features:– Maximum clock rate fs settling time, slew rate, small signal bandwidth– Resolution gain, offset– Overdrive recovery– Input capacitance (and linearity of input capacitance!)– Power dissipation– Input common-mode range and CMR – Kickback noise– …

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 11

CMOS Preamplifier + Latch Type Comparator Delay in Response

2D

1

1

0D

Latch delay previously found:

ln

Assuming gain of for the preamplifier then :

ln

m

v v in

m v in

VCg V

A V A V

VCg A V

τ

τ

⎛ ⎞⎜ ⎟⎝ ⎠

= ×

⎛ ⎞⎜ ⎟⎝ ⎠

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 12

Latched Comparator Including PreamplifierExample

oV

inV

-+

+

-

M1 M2CLK

M3 M4

VDD

M7 M8bias

M5 M6

M9

Preamp Latch

( )( )

3 31

3 1 1

0D

Preamplifier gain:

Comparator delay: (for simplicity, preamp delay ignored)

ln

M MMGS thm

v M M Mm GS th

m v

V VgAg V V

C Vg A Vin

τ

−= =

⎛ ⎞≈ ⎜ ⎟⎝ ⎠

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 13

Comparator Dynamic Behavior

vOUT

CLK

TCLK

τdelay

Comparator Reset Comparator Decision

vO+

vO-

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 14

Comparator Resolution

VIN =10mV 1mV

0.1mV10μVvOUT

CLK

Δt = (gm/C).ln(Vin1/Vin2)

Note: For small Vin the comparator may not be able to make a decision within the allotted time output ambiguous

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 15

Comparator Voltage Transfer FunctionNon-Idealities

Vout

Vin

VOffset

ε

-0.5LSB 0.5LSB

VOffset Comparator offset voltage

ε Meta-Stable region (output ambiguous)

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 16

CMOS Comparator ExampleFlash ADC

Ref: A. Yukawa, “A CMOS 8-Bit High-Speed A/D Converter IC,” JSSC June 1985, pp. 775-9

• Flash ADC: 8bits, +-1/2LSB INL @ fs=15MHz (Vref=3.8V, LSB~15mV)• No offset cancellation

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 17

Comparator with Auto-Zero

Ref: I. Mehr and L. Singer, “A 500-Msample/s, 6-Bit Nyquist-Rate ADC for Disk-Drive Read-Channel Applications,” JSSC July 1999, pp. 912-20.

Note: Reference & input both differential

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 18

Ref: I. Mehr and D. Dalton, “A 500-Msample/s, 6-Bit Nyquist-Rate ADC for Disk-Drive Read-Channel Applications,” JSSC July 1999, pp. 912-20.

Voffset

( )C C

Re f Re f Offset

V VV V V

+ −

+ −

− =− −

Flash ADCComparator with Auto-Zero

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 19

Ref: I. Mehr and D. Dalton, “A 500-Msample/s, 6-Bit Nyquist-Rate ADC for Disk-Drive Read-Channel Applications,” JSSC July 1999, pp. 912-20.

Voffset

Vo

( ) ( )[ ]( )

( ) ( )

Offseto P1 P2 In In C C

C C

Re f Re fo P1 P2 In In

VV A A V V V V

Subst i tut ing for from previous cycle:V V

V VV A A V V

Note: Of fset i s cancel led & di f ference betweeninput & reference es tabl ished

+ − + −

+ −

+ −+ −

− −= ∗ − −

−= ∗ −⎡ ⎤−⎣ ⎦

Flash ADCComparator with Auto-Zero

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 20

Ref: I. Mehr and D. Dalton, “A 500-Msample/s, 6-Bit Nyquist-Rate ADC for Disk-Drive Read-Channel Applications,” JSSC July 1999, pp. 912-20.

Flash ADCUsing Comparator with Auto-Zero

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 21

Auto-Zero Implementation

Ref:I. Mehr and L. Singer, “A 55-mW, 10-bit, 40-Msample/s Nyquist-Rate CMOS ADC,” JSSC March 2000, pp. 318-25

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 22

Comparator Example

Ref: T. B. Cho and P. R. Gray, "A 10 b, 20 Msample/s, 35 mW pipeline A/D converter," IEEE Journal of Solid-State Circuits, vol. 30, pp. 166 - 172, March 1995

• Variation on Yukawa latch used w/o preamp

• Good for low resolution ADCs (in this case 1.5bit/stage for a pipeline we will see later are tolerant of high offset)

• Note: M1, M2, M11, M12 operate in triode mode

• M11 & M12 added to vary comparator threshold

• Conductance at node X is sum of GM1 & GM11

x

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 23

Comparator Example (continued)

Ref: T. B. Cho and P. R. Gray, "A 10 b, 20 Msample/s, 35 mW pipeline A/D converter," IEEE Journal of Solid-State Circuits, vol. 30, pp. 166 - 172, March 1995

Vo1

G1 G2

( ) ( )

( ) ( )

( ) ( )

Cox V V V VG W WI1 th R th1 1 11L

Cox V V V VG W WI2 th R th2 1 11L

WC W 11ox 1 V V V VG I1 I2 R RWL 1

μ

μ

μ

− −= × +⎡ ⎤−⎣ ⎦

− −= × +⎡ ⎤+⎣ ⎦

⎡ ⎤− −−→ Δ = × + −⎢ ⎥⎣ ⎦

Vo1 Vo2

• M1, M2, M11, M12 operate in triode mode with all having equal L

• Conductance of input devices:

• To 1st order, for W1= W2 & W11=W12Vth

latch = W11/W1 x VR

where VR = VR+ - VR-

VR fixed W11, 12 varied from comparator to comparator Eliminates need for resistive divider

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 24

Comparator Example• Used in a pipelined ADC with digital

correctionNo offset cancellation required

Differential reference & input

• M7, M8 operate in triode region

• Preamp gain ~10

• Input buffers suppress kick-back

• φ1 high Cs charged to VR & φ2B is also high current diverted to latchcomparator output in hold mode

• φ2 high Cs connected to S/Hout & comparator input (VR-S/Hout), current sent to preamp comparator in amplify mode

Ref: S. Lewis, et al., “A Pipelined 5-Msample/s 9-bit Analog-to-Digital Converter”IEEE JSSC , NO. 6, Dec. 1987

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 25

Bipolar Comparator Example

• Used in 8bit 400Ms/s & 6bit 2Gb/s flash ADC

• Signal amplification during φ1 high, latch operates when φ1 low

• Input buffers suppress kick-back & input current

• Separate ground and supply buses for front-end preamp kick-back noise reduction

Ref: Y. Akazawa, et al., "A 400MSPS 8b flash AD conversion LSI," IEEE International Solid-State Circuits Conference, vol. XXX, pp. 98 - 99, February 1987

Ref: T. Wakimoto, et al, "Si bipolar 2GS/s 6b flash A/D conversion LSI," IEEE International Solid-State Circuits Conference, vol. XXXI, pp. 232 - 233, February 1988

Preamp Latched Comparator

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 26

Reducing Flash ADC ComplexityE.g. 10-bit “straight” flash

– Input range: 0 … 1V– LSB = Δ: ~ 1mV – Comparators: 1023 with offset < 1/2 LSB– Assuming Cin for each comparator is 0.1pF & power 3mW

• Total input capacitance: 1023 * 100fF = 102pF• Power: 1023 * 3mW = 3W

High power dissipation & large area & high input cap.

Techniques to reduce complexity & power dissipation :– Interpolation– Folding– Folding & Interpolation– Two-step, pipelining

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 27

Interpolation• Idea

– Reduce number of preamps & instead interpolate between preamp outputs

• Reduced number of preamps– Reduced input capacitance– Reduced area, power dissipation

• Same number of latches (2B-1)

• Important “side-benefit”– Decreased sensitivity to preamp offset

Improved DNL

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 28

Flash ADCPreamp Output

Zero crossings (to be detected by latches) at Vin =

Vref1 = 1 ΔVref2 = 2 Δ

0 0.5 1 1.5 2 2.5 3

-0.5

0

0.5

Vin /Δ

Pre

amp

Out

put [

V]

A2A1

VinA2

Vref1 Vref2

Vref1

Vref2

A1

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 29

Simulink Model

2Y

1Vin

2*DeltaVref2

1*DeltaVref1

Vi

Preamp2

Preamp1

Vin

A2

A1

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 30

Differential Preamp OutputDifferential output crossings @ Vin =

Vref1 = 1 ΔVref2 = 2 Δ

Note: Additional crossing ofA1&-A2 (A2&-A1)

A1-(-A2 )=A1+A2cross zero at:

Vref12 = 0.5*(1+2) Δ=1.5Δ

0 0.5 1 1.5 2 2.5 3-0.5

0

0.5

Pre

amp

Out

put

0 0.5 1 1.5 2 2.5 3

A 1+A

2

A2-A2A1-A1

A1-(-A2)

Vin / Δ

-0.5

0

0.5

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 31

Interpolation in Flash ADCHalf as many reference voltages and preamps Interpolation factor:x2

Example: For 10bit straight FlashADC need 2B=1024 preamps compared 2B-1=512 for x2 interpolation

Possible to accomplish higher interpolation factor

Interpolation at the output of preamps

Vin

A1

A2

Compare A2& -A1Comparator output is sign of A1+A2

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 32

Interpolation in Flash ADCPreamp Output Interpolation

Interpolate between two consecutive output via impedance Z

Choices of Z:1. Resistors (Kimura)2. Capacitors (Kusumoto)3. Current mode (Roovers)

Vin

A1

A2

Z

Z

Z

Vo1

Vo2

Vo1.5 = (Vo

1+Vo2)/2

Ref: H. Kimura et al, “A 10-b 300-MHz Interpolated-Parallel A/D Converter,” JSSC, pp. 438-446, April 1993K. Kusumoto et al, "A 10-b 20-MHz 30-mW pipelined interpolating CMOS ADC," JSSC, pp.1200 -1206, December 1993. R. Roovers et al, "A 175 Ms/s, 6 b, 160 mW, 3.3 V CMOS A/D converter," JSSC, pp. 938 - 944, July 1996.

Z

...

...

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 33

Interpolation in Flash ADCPreamp Output Interpolation

Vin

A1

A2

......

...

0 0.5 1 1.5 2 2.5 3-0.5

0

A2-A2A1-A1

With 2 sets of interpolation resistors at each preamp outputs three extra intermediate points 2extra bits

0.5

Pre

amp

Out

put

...

...

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 34

Higher Order Resistive Interpolation

Ref: H. Kimura et al, “A 10-b 300-MHz Interpolated-Parallel A/D Converter,”JSSC April 1993, pp. 438-446

• Resistors produce additional levels

• With 4 resistors per side, the “interpolation factor”M=8

extra 3bits

• (M ratio of latches/preamps)

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 35

Preamp Output InterpolationDNL Improvement

• Preamp offset distributed over M resistively interpolated voltages:

Impact on DNL divided by M

• Latch offset divided by gain of preamp

Use “large” preamp gainNext: Investigate how large preamp gain can be

Ref: H. Kimura et al, “A 10-b 300-MHz Interpolated-Parallel A/D Converter,”JSSC April 1993, pp. 438-446

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 36

Preamp Input RangeIf linear region of preamp transfer curve do not overlap

Dead-zone in the interpolated transfer curve! Results in error

Linear consecutive preamp input ranges must overlapi.e. input range w/o output saturation> Δ

Sets upper bound on preamp gain: Preampgain <VDD / Δ

0 0.5 1 1.5 2 2.5 3

A2-A2A1-A1

0 0.5 1 1.5 2 2.5 3-0.5

0

0.5

Pre

amp

Out

put

A 1+A

2

Vin / Δ

Linear region of transfer curve not overlapping

-0.5

0

0.5

A1+A2

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 37

Interpolated-Parallel ADC

Ref: H. Kimura et al, “A 10-b 300-MHz Interpolated-Parallel A/D Converter,” JSSC April 1993, pp. 438-446

• 10-bit overall resolution:• 7-bit flash (127 preamps and Vref 128 resistors) & x8 interpolation

• Use of Gray Encoder minimizes effect of sparkle code & meta-stability

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 38

Measured Performance

Ref: H. Kimura et al, “A 10-b 300-MHz Interpolated-Parallel A/D Converter,” JSSC April 1993, pp. 438-446

(7+3)

Low inputcapacitance

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 39

Interpolation Summary• Consecutive preamp transfer curve linear region need to have

overlap Limits gain of preamp to ~VDD/Δ

• The added impedance at the output of the preamp typically reduces the bandwidth and affects the maximum achievable frequencies

• DNL due to preamp offset reduces by interpolation factor M

• Interpolation reduces # of preamps and thus reduces input C-however, the # of required latches the same as “straight” Flash

Use folding to reduce the # of latches

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 40

Folding Converter

• Two ADCs operating in parallel– MSB ADC– Folder + LSB ADC

• Significantly fewer comparators compared to flash • Fast• Typically, nonidealities in folder limit resolution

LOGICLSB

ADC

MSBADC

Folding Circuit

VIN

DigitalOutput

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 41

Example: Folding Factor of 4

Vin

VFSVFS/2

Vout

00

01

10

11

ToLSB

Quantizer

MSBbits

• Folding factornumber of folds

• Folder maps input to smaller range

• MSB ADC determines which fold input is in

• LSB ADC determines position within fold

• Logic circuit combines LSB and MSB results

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 42

Example: Folding Factor of 4

Vin

VFSVFS/2

Vout

00

01

10

11• How are folds generated?

• Note: Sign change every other fold + reference shift

Fold 1 Vout=+ VinFold 2 Vout= - Vin + VFS/2Fold 3 Vout=+ Vin - VFS/2Fold 4 Vout= - Vin + VFS

1 32 4

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 43

Generating Foldsvia Source-Coupled Pairs

M1 M2

IS

Vref1M3 M4

IS

Vref2 M5 M6

IS

Vref3M7 M8

IS

Vref4

R1 R2

VDD

-Vo+

Vin

Vref1 < Vref2 < Vref3 < Vref4As Vin changes, only one of M1, M3, M5, M7 is on depending on the input level

IS

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 44

CMOS Folder Output

CMOS folder transfer curve max. min. portions:

RoundedAccurate only

at zero-crossings

In fact, most folding ADCs do not use the folds, but only the zero-crossings!

0 0.5 1 1.5 2 2.5 3 3.5 4

0

Fold

er O

utpu

t

0 0.5 1 1.5 2 2.5 3 3.5 4-20%

0

20%

Erro

r (Id

eal-R

eal)

Vin /Δ

Ideal Folder

CMOS Folder

-ISxR

ISxR

Vref1 Vref2 Vref3 Vref4

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 45

Parallel Folders Using Only Zero-Crossings

Vref + 3/4 * Δ

Comparator

Folder 3

Folder 2

Folder 1

Folder 4

LogicVref + 2/4 * Δ

Vref + 1/4 * Δ

Vref + 0/4 * Δ

Vin

LSB bits

(to be combined with MSB bits)

Comparator

Comparator

Comparator

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 46

Parallel Folder Outputs

• 4 folders with 4 folds each

• 16 zero crossings• 4 LSB bits

• Higher resolution• More folders

Large complexity• Interpolation

0 1 2 3 4 5

-0.4

-0.2

0

0.2

0.4

Vin /Δ

Fold

er O

utpu

t

F1F2F3F4

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 47

Folding & Interpolation

FineFlashADC

ENCODER

Vref + 3/4 * Δ

Folder 3

Folder 2

Folder 1

Folder 4

Vref + 2/4 * Δ

Vref + 1/4 * Δ

Vref + 0/4 * Δ

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 48

Folder / Interpolator OutputExample:4 Folders + 4 Resistive Interpolator per Stage

0 1 2 3 5-0.5

-0.4

-0.3

-0.2

-0.1

0

0.1

0.2

0.3

0.4

0.5

Vin / Δ

Fold

er /

Inte

rpol

ator

Out

put F1

F2I1I2I3

1.5 1.6 1.7 1.8

-0.02

0

0.02

0.04

4

Note: Output of two folders only + corresponding interpolator only shown

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 49

Folder / Interpolator OutputExample:2 Folders + 8 Resistive Interpolator per Stage

Non-linear distortionInterpolate only between closely spaced folds to avoid nonlinear distortion

1.5 1.6 1.7 1.8 1.9 2 2.1-0.06

-0.04

-0.02

0

0.02

0.04

0.06

0 1 2 3 4 5-0.5

-0.4

-0.3

-0.2

-0.1

0

0.1

0.2

0.3

0.4

0.5

Fold

er /

Inte

rpol

ator

Out

put F1

F2I1I2I3

Vin / Δ

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 50

A 70-MS/s 110-mW 8-b CMOS Folding and Interpolating A/D Converter

Ref: B. Nauta and G. Venes, JSSC Dec 1985, pp. 1302-8

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 51

A 70-MS/s 110-mW 8-b CMOS Folding and Interpolating A/D Converter

Note: Total of 40 (MSB=8, LSB=32) comparators compared to 28-1= 255 for straight flash

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 52

A 70-MS/s 110-mW 8-b CMOS Folding and Interpolating A/D Converter

Ref: B. Nauta and G. Venes, JSSC Dec 1985, pp. 1302-8

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 53

Two-Step Example: (2+2)Bits

• Using only one ADC: output contains large quantization error

• "Missing voltage" or "residue" ( -εq1)

• Idea: Use second ADC to quantize and add -εq1

0 1 2 300

01

10

11

0 1 2 3-1

-0.5

0

0.5

1

[LS

B]

ADC Input [LSB]

Vin

+Dout = Vin + εq1

2-bit ADC 2-bit ADC

???

ε q1

D out

Vin

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 54

Two Stage Example

• Use DAC to compute missing voltage• Add quantized representation of missing voltage• Why does this help? How about εq2 ? • Since maximum voltage at input of the 2nd ADC is Vref1/4 then for 2nd ADC

Vref2=Vref1/4 and thus εq2= εq1/4 =Vref1/16 4bit overall resolution

Vin “Coarse“

+

Dout= Vin + εq1

2-bit ADC 2-bit ADC

“Fine“+-2-bit DAC

-εq1

-εq1+εq2

-εq1+εq2

Vref2Vref1

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 55

Two Step (2+2) Flash ADC

Vin Vin Vin

4-bit Straight Flash ADC Ideal 2-step Flash ADC

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 56

Two Stage Example

• Fine ADC is re-used 22 times• Fine ADC's full scale range needs to span only 1 LSB of coarse

quantizer

221

22

2 222 ⋅== refref

q

VVε

00 01 10 11

Vref1/22

−εq1

00

01

10

11

First ADC“Coarse“

Second ADC“Fine“VinVref1

Vref2

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 57

Two-Stage (2+2) ADC Transfer Function

0000000100100011010001010110011110001001101010111100110111101111

CoarseBits(MSB)

FineBits(LSB)

Dout

VinVref1

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 58

Residue or Multi-Step Type ADCIssues

• Operation:– Coarse ADC determines MSBs– DAC converts the coarse ADC output to analog- Residue is found by

subtracting (Vin-VDAC)– Fine ADC converts the residue and determines the LSBs– Bits are combined in digital domain

• Issue: 1. Fine ADC has to have precision in the order of overall ADC 1/2LSB 2. Speed penalty Need at least 1 clock cycle per extra series stage to resolve

one sample

(optional)Coarse ADC

(B1-Bit)Vin

Residue

DAC(B1-Bit)

Fine ADC(B2-Bit)

Bit

Com

bine

r

(B1+

B2)

-Bit

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 59

Solution to Issue (1)Reducing Precision Required for Fine ADC

• Accuracy needed for fine ADC relaxed by introducing inter-stage gain

– Example: By adding gain of x(G=2B1=4) prior to fine ADC in (2+2)bit case, precision required for fine ADC is reduced to 2-bit only!

– Additional advantage- coarse and fine ADC can be identical stages

Vin “Coarse“

+

Dout= Vin + εq1

2-bit ADC 2-bit ADC

“Fine“+-

2-bit DAC-εq1

-εq1+εq2

-εq1+εq2

G=2B1

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 60

Solution to Issue (2)Increasing ADC Throughput

• Conversion time significantly decreased by employing T/H betweenstages– All stages busy at all times operation concurrent– During one clock cycle coarse & fine ADCs operate concurrently:

• First stage samples/converts/generates residue of input signal sample # n• While 2nd samples/converts residue associated with sample # n-1

Vin “Coarse“

+Dout= Vin + εq1

2-bit ADC

2-bit ADC

“Fine“+-

2-bit DAC-εq1

- εq1+εq2

T/H+(G=2B1)

T/H

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 61

Pipelined A/D Converters

• Ideal operation• Errors and correction

– Redundancy– Digital calibration

• Implementation – Practical circuits– Stage scaling

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 62

Pipeline ADCBlock Diagram

• Idea: Cascade several low resolution stages to obtain high overall resolution (e.g. 10bit ADC can be built with series of 10 ADCs each 1-bit only!)

• Each stage performs coarse A/D conversion and computes its quantization error, or "residue“

• All stages operate concurrently

Align and Combine Data

Stage 1B1 Bits

Stage 2B2 Bits

Digital output(B1 + B2 + ... + Bk) Bits

Vin

MSB... ...LSB

Stage k Bk Bits

Vres1 Vres2

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 63

Pipeline ADCCharacteristics

• Number of components (stages) grows linearly with resolution

• Pipelining– Trading latency for conversion speed– Latency may be an issue in e.g. control systems– Throughput limited by speed of one stage → Fast

• Versatile: 8...16bits, 1...200MS/s

• One important feature of pipeline ADC: many analog circuit non-idealities can be corrected digitally

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 64

Pipeline ADC Concurrent Stage Operation

• Stages operate on the input signal like a shift register• New output data every clock cycle, but each stage

introduces at least ½ clock cycle latency

Align and Combine Data

Stage 1B1 Bits

Stage 2B2 Bits

Digital output(B1 + B2 + ... + Bk) Bits

VinStage kBk Bits

φ1φ2

acquireconvert

convertacquire

...

...

CLKφ1

φ2

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 65

Pipeline ADCLatency

[Analog Devices, AD 9226 Data Sheet]

Note: One conversion per clock cycle & 8 clock cycle latency

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 66

Pipeline ADCDigital Data Alignment

• Digital shift register aligns sub-conversion results in time

Stage 2B2 Bits

VinStage kBk Bits

φ1φ2

acquireconvert

convertacquire

...

...

+ +Dout

CLK CLK CLK

Stage 1B1 Bits

CLKφ1

φ2

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 67

Cascading More Stages

• LSB of last stage becomes very small • All stages need to have full precision• Impractical to generate several Vref

VinADC

+-DACADC

B3 bitsB2 bitsB1 bits

Vref Vref /2B1 Vref /2(B1+B2) Vref /2(B1+B2+B3)

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 68

Pipeline ADC Inter-Stage Gain Elements

• Practical pipelines by adding inter-stage gain use single Vref• Precision requirements decrease down the pipe

– Advantageous for noise, matching (later), power dissipation

Vin ADCB3 bitsB2 bitsB1 bits

Vref

2B1

+-DACADC

Vref Vref Vref

2B22B3

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 69

Complete Pipeline StageVin +

-B-bitDAC

B-bitADC

D

-GVres

Vin00

Vref

−εq1

“ResiduePlot“

E.g.:B=2

G=22 =4

Vres

VrefNote: Non of the blocks have ideal performanceQuestion: What is the effect of the non-idealities?

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 70

Pipeline ADCErrors

• Non-idealities associated with sub-ADCs, sub-DACs and gain stages error in overall pipeline ADC performance

• Need to find means to tolerate/correct errors

• Important sources of error– Sub-ADC errors- comparator offset– Gain stage offset– Gain stage gain error– Sub-DAC error

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 71

Pipeline ADC Single StageModel

Vin

Dout

-G V res

−εq

Σ

εq

Σ

Vres = Gxεq

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 72

Pipeline ADC Multi-Stage Model

1 q2 2out in,ADC q1

d1 d1 d 2

q( n 1) ( n 1) qnn 2 n 1

d( n 1)dj djj 1 j 1

G GD V 1 1

G G GG

.. . 1GG G

εε

ε ε− −− −

= =

⎛ ⎞ ⎛ ⎞= + − + − +⎜ ⎟ ⎜ ⎟⎜ ⎟ ⎜ ⎟

⎝ ⎠ ⎝ ⎠⎛ ⎞⎜ ⎟+ − +⎜ ⎟⎝ ⎠∏ ∏

ΣΣ

εq1

- G1

Σ

ΣΣ

εq2

- G2

Σ

ΣΣ

εq(n-1)

- Gn-1

Σ

Vin,ADC

Dout 1/Gd1 1/Gd2

Vres1 Vres2 Vres(n-1)

Σ

1/Gd(n-1)

εqnD1 D2 D(n-1)Dn

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EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 73

Pipeline ADC Model• If the "Analog" and "Digital" gain/loss is precisely matched:

=≈

=≈

=−

=

+

⎟⎟⎠

⎞⎜⎜⎝

⎛×

⎟⎟⎠

⎞⎜⎜⎝

⎛××=

×

==

1

12

1

12

1

11

1

log

2log

223log20

212

22log20.

log20..

n

jjnADC

n

jj

BADC

n

jj

B

n

jj

B

ref

ref

GBB

GB

G

G

V

V

NoiseQuantrmsSignalFSrmsRD

n

n

n

∏−

=

+= 1

1

, n

jj

qnADCinout

GVD

ε

EECS 247 Lecture 20: Data Converters: Nyquist Rate ADCs © 2009 Page 74

Pipeline ADCObservations

• The aggregate ADC resolution is independent of sub-ADC resolution!

• Effective stage resolution Bj=log2(Gj)

• Overall conversion error does not (directly)depend on sub-ADC errors!

• Only error term in Dout contains quantization error associated with the last stage

• So why do we care about sub-ADC errors?Go back to two stage example


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