Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
2
Detector Design Principles
• Ionization chambers (gas and solid-state)
• Proportional counters• Avalanche counters• Geiger-Müller counters• Cloud/bubble chambers• Track detectors
Ionization Detectors
• Phosphorescence counters• Fluorescence counters
(inorganic solid scintillators, organic solid and scintillators)
• Čherenkov counters
Scintillation Detectors
Associated Techniques
• Photo sensors and multipliers• Charged-coupled devices• Electronic pulse shape analysis• Processing/acquisition electronics
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
3
Primary Ionization Track (Gases)
incoming particle ionization track ion/e- pairs
Argon DME
<n> (ion pairs/cm) 25 55
dE/dx (keV /cm )
GAS (STP)
2.4 3.9
Xenon
6.7
44
CH4
1.5
16
Helium
0.32
6
Minimum-ionizing particles (Sauli. IEEE+NSS 2002)Different counting gases
Statistical ionization process: Poisson statisticsDetection efficiency ε depends on average number <n> of ion pairs
1 neε −≤ −thickness ε (%)
Argon
GAS (STP)
1 mm 91.82 mm 99.3
Helium 1 mm 452 mm 70
Higher ε for slower particles
e- I+
ΔE } <n>≈Linearfor ΔE«E
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
4
Effective Ionization Energies
Mean energy per ion pair larger than IP because of excitations
Large organic molecules have low-lying excited rotational states excitation without ionization through collisions =“quenching” additives
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
5
Driven Charge Transport in Gases
τ
τ λ
μ μ
=
⎧ ⎫− ⋅⎪ ⎪= ⋅ −⎨ ⎬⋅⎪ ⎪
⋅
=
=
⎭
=
⎩
⋅
20 ( )
exp44
2
:
ew E drift velocity
mv meantime be
NdN
twe
Charge D
en colli
iffusion
sions
kT wD
x w tdx D tDt
in Electric F
mob
ield
ilitye E
x
P(x)
x
P(x)
t0
t1 >t0
t2 >t1
Electric field E = Δ U/Δ x separates +/- charges (q=ne+, e-)
x
P(x)E
x
( ); ( )w w E p D D E p= =
Cycle: acceleration – scattering/ionizationDrift (w) and diffusion (D) depend on field strength E and gas pressure p (or ρ).
λ
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
6
Ion Mobility
GAS ION µ+ (cm2 V-1 s+1) @STPAr Ar+ 1.51CH4 CH4
+ 2.26Ar+CH4 80+20 CH4
+ 1.61
Ion mobility μ+ = w+/E
Independent of field,for given gas at p,T=const.
Typical ion drift velocities(Ar+CH4 counters):
w+ ~ (10-2 – 10-5) cm/μs
slow!
E. McDaniel and E. MasonThe mobility and diffusion of ions in gases (Wiley 1973)
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
7
Signal Generation in Ionization Counters
Primary ionization: Gases I ≈ 20-30 eV/IP, Si: I ≈ 3.6 eV/IP Ge: I ≈ 3.0 eV/IP
Energy loss Δε: n= nI =ne= Δε /I number of primary ion pairs n at x0, t0
Force: Fe = -eU0/d = -FI
Energy content of capacitor C:
Cap
aci
tan
ce C
+
-
U0
ΔU(t)
0
x0
x
d
R CsSignal
( ) ( ) ( )
( ) ( ) ( )
( ) ( )
( ) ( ) ( ) ( ) ( )
e e e I I I
I e
CU U t
W t n F x t x n F x t x
neUx t x t
d
neU t w t w t t
W t CU U t
W t
Ct
CdU+ −
⎡ ⎤= − ≈⎣ ⎦
⎡ ⎤ ⎡ ⎤= − + −⎣ ⎦ ⎣ ⎦
⎡ ⎤= + −⎣ ⎦
+
⎡ ⎤Δ = = −
Δ
−⎣ ⎦
0
0
2 20
0 0
0
0
1)2
2)
1) 2)( ) ( )w t t t+ −
0
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
8
Time-Dependent Signal Shape
( ) ( ) ( ) ( )
( ) ( )0
3
U t w t w t t tCd
w t 10 w t
ε + −
+ − −
⎡ ⎤Δ = − −⎣ ⎦Δ
∼
t0 te~μs tI~ms t
ΔU(t)
0xC dεΔ
CεΔ
Drift velocities (w+>0, w-<0)
Total signal: e & I components
Both components measure Δε and depend on position of primary ion pairs
x0 = w-(te-t0)
For fast counting use only electron component.
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
9
Amplification Counters
Single-wire gas counter
U0
C
-
- +
+
counter gas
gassignal
R
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
10
Proportional Counter
Anode wire: small radius RA ¡ 50 μm or less
Voltage U0 ¡ (300-500) V
counter gas
0 1( )ln( )
= ⋅C A
Field at r from wire
UE rR R r
e- q+
RA RI
UI RI
Ano
de W
ire
Avalanche RI RA, several mean free paths needed
Pulse height mainly due to positive ions (q+)
U0
C-
- +
+
gas
signal
R
Rc
E(RI)=
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
11
Pulse Shape
0
0 0
: ,
( ) ln(1 )4
/ , /πε
πε μ μ
ε
−Δ ∝ ⋅ +
= =
=drift
Pulse shape time t wirelength Lq tU tL t
t CU mobility w E
dielectric constant
t
t
ΔU
ΔU
long decay time of pulse pulse pile up, summary information
differentiate electronically, RC-circuitry in shaping amplifier, individual information for each event (= incoming particle)
R
C
event 1
event 2
event 4
even
t 1
even
t 2
even
t 4
ΔU
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
12
isobutane 50T
Bragg-Curve Sampling Counters
Sampling Ion Chamber with divided anode
Sample Bragg energy-loss curve at different points along the particle trajectory improves particle identification.
ΔE1 ΔE2 Eresidual Anodes
ΔE
x
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
13
IC Performance
Eresidual (channels)
ΔE
(ch
an
nels
)
ICs have excellent resolution in E, Z, A of charged particles but are “slow” detectors.Gas IC need very stable HV and gas handling systems.
Energy resolution
2ipF n F
Iεεσ Δ
= =
F<1 Fano factor
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
14
Solid-State IC
Solids have larger density higher stopping power dE/dx more ion pairs, better resolution, smaller detectors (also more damage and little regeneration max accumulated dose ~ 1023 particles
iSemiconductor n-, p-, i- types
Si, Ge, GaAs,.. (for e-, lcp, γ , HI)
Band structure of solids:
Valence
ConductionE
EF
+-
e-
h+
Ionization lifts e- up to conduction band
free charge carriers, produce Δ U(t).
Bias voltage U0 creates charge-depleted zone
20
20
:
2.2
3.7
n
p
Capacitance Si
U pF mmC
U pF mm
ρ
ρ
⎧⎪= ⎨⎪⎩
U0
+
+
+-n
p
ΔU(t)
c
R
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
15
Particles and Holes in Semi-Conductors
Fermion statistics:
( ) ( ) ( )
( ) ( ) ( )
( )
( )
e e
h h e h
F C G G C
Fe
GkT meV G
Ge e h
m Vn f V volume
m Vn f n n
for
fkT
kT
m Vn n
n
nkT
ε
ε ε επ
ε ε επ
ε ε ε ε ε
ε εε
ε ε
εε
π
−
≈
⎡ ⎤⎢ ⎥= ⋅ =⎢ ⎥⎣ ⎦⎡ ⎤⎢ ⎥= ⋅ =⎢ ⎥⎣ ⎦
= − = − =
⎡ ⎤−⎛ ⎞= +⎢ ⎥⎜ ⎟⎝ ⎠⎣ ⎦
+⎛ ⎞⎯⎯⎯⎯⎯⎯⎯→ −⎜ ⎟
⎝ ⎠
⎛ ⎞ ⎛ ⎞⎜ ⎟= = −⎜ ⎟⎜ ⎟ ⎝ ⎠⎝ ⎠
2 3
2 3
2 3
2 3
1
25
22 32
2 3
2
2
2!!
2
2 2 : 0
1 exp
2exp
2exp
2
Ge rms
conductivitykT
at Tε⎛ ⎞
∝ −⎜ ⎟⎝ ⎠
∝exp2
0
ε
εF
Valence Band
Conduction Band
e-
h+
εG
εV
εC
( )
( )
e
Gh
G
h fkT
Occupation
e fkT
numbers f
ε ε
ε εε
ε−
−−
+
⎡ ⎤+⎛ ⎞= +⎢ ⎥⎜ ⎟
⎡ ⎤− +⎛ ⎞= +⎢
⎝ ⎠⎣ ⎦
⎥⎜ ⎟⎝ ⎠⎣ ⎦
1
12
: 1 exp
2: 1 exp
Small gaps εG (Ge) large thermal currents.Reduce by cooling.
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
16
Semiconductor Junctions and Barriers
Need detector with no free carriers.Si: i-type (intrinsic), n-type, p-type by diffusing Li, e- donor (P, Sb, As), or acceptor ions into Si.
Trick: Increase effective gap Junctions diffuse donors and acceptors into Si bloc from different ends.Diffusion at interface e-/h+
annihilation space chargeContact Potential and zone depleted
of free charge carriersDepletion zone can be increased by
applying “reverse bias” potentialSimilar: Homogeneous n(p)-type Si with reverse bias U0 also creates carrier-free space dn,p:up to 1mm possible.
+ + + + + + + +
+ + + + + + + +
+ + + + + + + +
- - - - - - - -
- - - - - - - -
- - - - - - - -
o o o o o o
o o o o o o
o o o o o o
o o o o o o
o o o o o o
o o o o o o
n p
o o o o o o o o o o o o
e- h+
Donor Acceptorions
space charge
Si B
loc
e-P
ote
nti
al
d
5, , 0
, 0
3.3 10
20 , 500 70
n p n p
n p
d U m
k cm U V d m
ρ μ
ρ μ
−≈ ⋅
Ω = → ≈∼
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
17
Surface Barrier Detectors
Metal film
Silicon wafer
Metal case
Insulation
Connector
EF
JunctionM
etal
CB Semi conductor
VB
Different Fermi energies adjust to on contact. Thin metal film on Si surface produces space charge, an effective barrier (contact potential) and depleted zone free of carriers. Apply reverse bias to increase depletion depth.
Ground +BiasFront: Au Back: Alevaporated electrodes
Insulating Mount
depleted
dead layer
Possible: depletion depth ~ 300μdead layer dd é 1μV ~ 0.5V/μOver-bias reduces dd
ORTEC HI detector
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
18
Charge Collection Efficiency
( )
PhD deposit app
b Z A a Z APhD deposit deposit
Pulse height defectE E E
Fit
E E E
= −
= ⋅( , ) ( , )
:
:
10
High ionization density at low electric fields: Edeposit > EappLower apparent energy due to charge recombination, trapping. Low ionization density (or high electric fields): Edeposit ≈ Eapp
Typical charge collection times: t ~ (10-30)ns
Moulton et al.
5 2( ) 2.230 10 0.5682
( ) 14.25 / 0.0825
6 2( ) 3.486 10 0.5728
( ) 28.40 / 0.0381
a Z Z
b Z Z
a A A
b A A
−= ⋅ +
= − +
−= ⋅ +
= − +
Affects charge collection time signal rise time.Exploit for A, Z identification
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
19
Si-Strip Detectors
Typically (300-500)μ thick. Fully depleted, thin dead layer.Annular: 16 bins (“strips”) in polar (θ) , 4 in azimuth (φ) (Micron Ltd.)
Rectangular with 7 strips
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
20
Ge γ−ray Detectors
Ge detectors for γ-rays use p-i-n Ge junctions. Because of small gap EG, cool to -77oC (LN2)
Ge Cryostate (Canberra)
Ge cryostate geometries (Canberra)
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
21
Properties of Ge Detectors: Energy Resolution
Size=dependent mall detection efficiencies of Ge detectors é10% solution: bundle in 4π-arrays GammaSphere,Greta EuroGam, Tessa,…
Superior energy resolution, compared to NaI
ΔEγ ~ 0.5keV @ Eγ =100keV
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
22
Townsend Gas Avalanche Amplification
U0
M
IC Region
Non-linear
Region
( )
1( ) ;
: 1.
ip ipipn primary I
nM i t dt
n n
nM d Townsend coef
P
ficientα
= ∝
=
=∫Amplification M
Radiation
U0
I
d
+U0~kV/cm
_
Avalanche Formation
Townsend CoefficientElectron-ion pairs through gas ionization
{ }0
0 0
( )
( ) exp ( )
x
x
dn n dxn x n e for const
n x n x dx
α
α
α
α
⋅
= ⋅ ⋅
= ⋅ =
′ ′= ⋅ ∫Electrons in outer shells are more readily removed, ionization energies are smaller for heavier elements.
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
24
Parallel Plate Counters: t-Resolution
sensitive layerd~1/α
e-
cathode -
anode +
R
+
PP
AC
PP
AC
U
p
ffffPPACs for good time resolution, U(p,f)f
Charges produced at different positions along the particle track are differently amplified.
non-linearity nip(ΔE)
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
25
Sparking and Spark Counters
α/pγ
Impact ionization Probability γ
Prevent spark by reducing λ for ions: collisions with large organic molecules quenching additives, self-quenching gases
d
0
1 3
1 1
: 1(10 10 )
α
α
α
γ
γ
⋅
⋅
⋅
− −
= =⎡ ⎤− ⋅ −⎣ ⎦
⋅ ≈
−∼
d
d
d
Amplification byimpact ionization
n eMn e
Sparking ep Torr
Different cathode materials
-
+
Rad
iatio
n D
etec
tors
W. Udo Schröder, 2007
26