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RAIN RFID V2 Crypto Conformance and...

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Competitive Innovations PLUS Embedded Systems Competence Competitive Innovations PLUS Embedded Systems Competence RAIN RFID V2+Crypto Conformance and Performance Testing Josef Preishuber-Pflügl CTO, BU Manager RFID+RFComm [email protected] October 2015
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Page 1: RAIN RFID V2 Crypto Conformance and …rainrfid.org/wp-content/uploads/2015/11/RAIN-RFID-V2...2015/10/26  · RAIN RFID V2+Crypto Conformance and Performance Testing Josef Preishuber-Pflügl

Competitive Innovations PLUSEmbedded Systems Competence

Competitive Innovations PLUSEmbedded Systems Competence

RAIN RFID V2+Crypto Conformance and Performance Testing

Josef Preishuber-PflüglCTO, BU Manager RFID+RFComm

[email protected] October 2015

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CISC Semiconductor

2

CISC Semiconductor Corp.West El Camino Real

Mountain View, CA, USA

CISC Semiconductor Corp.West El Camino Real

Mountain View, CA, USA

CISC Semiconductor GmbHLakeside B07

9020 Klagenfurt, Austria

CISC Semiconductor GmbHLakeside B07

9020 Klagenfurt, Austria

• Sales• Sales

• Corp. Headquarters• R&D• Sales

• Corp. Headquarters• R&D• Sales

Burgring 188010 Graz, Austria

Burgring 188010 Graz, Austria

• R&D• R&D

© CISC Semiconductor GmbH | www.cisc.at

Independent - CISC was founded in 1999 and is a 100% private owned company

Experienced - CISC is managed by an international team of highest skilledexperts & working with RFID for more than 18 years

Global - we serve the whole industry worldwide

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About CISC RF� Team of RFID professionals with

long-term, international reputation

� Performance improver of RFID products and systems through our solutions

� Measurement tool provider for RFID and NFC conformance, performance and interoperability tests

� Standardization leader in RFID

3 © CISC Semiconductor GmbH | www.cisc.at

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CISC Role in RFID Standardization (Excerpt)

� Convener ISO/IEC SC31 WG4/SG6RFID Performance and Conformance test methods

� ISO/IEC 18046 RFID performance

� ISO/IEC 18047 RFID conformance

� Co-chair GS1 EPCglobal TLRPPTag Label Reader and Printer Performance

� Static performance test

� Co-chair GS1 EPCglobal UHF AI Group

� EPCglobal UHF Gen2V2 air interface

� EPCglobal UHF Gen2V2 conformance tests

� Project editor ISO/IEC 18000-63 Type C

� Project editor ISO/IEC 29167-1 Crypto4 © CISC Semiconductor GmbH | www.cisc.at

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IOT – Internet of Things

5 © CISC Semiconductor GmbH | www.cisc.at

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RFID and NFC providing the� Last mile / kilometer

� Last yard / meter

� First meter

6 © CISC Semiconductor GmbH | www.cisc.at

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UHF RFID

18000-63

7 © CISC Semiconductor GmbH | www.cisc.at

Gen2

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UHF RFID Air interface standards

� EPC Gen 2 = ISO/IEC 18000-63 Type C

� EPC Gen 2V2 = ISO/IEC 18000-63REV1

� Crypto extensions = ISO/IEC 29167

� Brazil derivatives

� SINIAV G0

� ARTESP PA

� Brasil-ID P63

8 © CISC Semiconductor GmbH | www.cisc.at

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What´s NEW - EPC Gen2V2?

� Crypto solution for even more applications(e.g. road tolling)

� European privacy concerns addressed(Untracebility command)

� File management available for more data with different owners(Different ownership)

9 © CISC Semiconductor GmbH | www.cisc.at

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NEW, but not Gen2V2 specific

� Mature products in high volume

� Better tag sensitivity

� Read range continuously increased (> 20 m)

� Area surveillance (> 1000 m2)

� Movement direction detection

� …

10 © CISC Semiconductor GmbH | www.cisc.at

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18000-63:2015Gen 2 V2

Gen 2 V1.2.0 ISO/IEC 18000-63:2013

Difference Gen2 V1.2.0 – V2

11 © CISC Semiconductor GmbH | www.cisc.at

MandatoryGen2 V1.2.0

ISO/IEC 18000-63

MandatoryGen2 V2

ISO/IEC 18000-63REV1

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ISO/IEC 29167 Crypto Suites� ISO/IEC 29167-10 AES128 �

� ISO/IEC 29167-11 PRESENT80 �

� ISO/IEC 29167-12 ECC-DH �

� ISO/IEC 29167-13 GRAIN128 �

� ISO/IEC 29167-14 AES128-OFB like �

� ISO/IEC 29167-15 XOR

� ISO/IEC 29167-16 ECDSA-ECDH �

� ISO/IEC 29167-17 Crypto GPS �

� ISO/IEC 29167-19 RAMON �

� ISO/IEC 29167-20 Algebraic Eraser

� NP 29167-21 Simon

� NP 29167-22 Speck12 © CISC Semiconductor GmbH | www.cisc.at

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Test standards

� ISO/IEC 18046-1 System performance

� ISO/IEC 18046-2 Interrogator performance

� ISO/IEC 18046-3 Tag performance

� ISO/IEC 18047-6 Tag and interrogatorconformance

� GS1 EPCglobal Tag Performance Parameters and Test Methods v 1.1.2

� GS1 EPCglobal US TIPP

13 © CISC Semiconductor GmbH | www.cisc.at

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Testing

� Tag

� Conformance

� Performance

� Reader

� Conformance

� Performance

� System

� Efficiency

� Interoperability

14 © CISC Semiconductor GmbH | www.cisc.at

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UHF RFID Tag Test Procedure

� Reader independent test

� Use tag identification & read commands

� Use reference reader (close to ideal = no tag response missed)

� Write commands

� Attach tag to a product or reference material

� Test tag performance over the whole range of UHF frequencies allocated for RFID

� Test tag performance over the whole range of power levels

� Performance of tags attached to various spots of the products

15 © CISC Semiconductor GmbH | www.cisc.at

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Frequency Dependent Sensitivity� Tag turn on power over the frequency band

� Frequency-dependency of the tag design

� Impact of the tagged object on the tag performance

16 © CISC Semiconductor GmbH | www.cisc.at

Free air

On metal

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Orientation degradation of tag sensitivity

How can you read the tag from the various sides?

17 © CISC Semiconductor GmbH | www.cisc.at

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Fully automated conformance test

18 © CISC Semiconductor GmbH | www.cisc.at

18000-63REV1

Gen2V2

29167-nn

Does the tag meet the standard requirements?

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Conformance Test Results

New Crypto commands of ISO/IEC 29167

New EPC Gen2V2 and ISO/IEC 18000-

63REV1

19 © CISC Semiconductor GmbH | www.cisc.at

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Reader testing (Tag Emulation)

20 © CISC Semiconductor GmbH | www.cisc.at

Wireless

Conducted

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Reader signals

21 © CISC Semiconductor GmbH | www.cisc.at

Check the waveforms:

Well filtered, smooth, no spikes, …

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Communication details

* Command: [Select] - Start timestamp (us): 284008012 - Stop timestamp (us): 284009599 Target: Inventoried (S0) Action: Matching: assert SL or inventoried -> A; Non-Matching: deassert SL or inventoried -> B MemBank: EPC Pointer: 32 Length: 0 Mask: - Truncate: Disable truncation CRC-16: OK

* Response: none --------------------

* Command: [Query] - Start timestamp (us): 284010226 - Stop timestamp (us): 284011272 DR: DR=64/3 M: M=2 TRext: Use pilot tone Sel: All Session: S0 Target: A Q: 2 CRC-5: OK

* Response: none --------------------

* Command: [QueryRep] - Start timestamp (us): 284011689 - Stop timestamp (us): 284011902 Session: S0

* Response: none --------------------

* Command: [QueryRep] - Start timestamp (us): 284012293 - Stop timestamp (us): 284012506 Session: S0

* Response: none --------------------

* Command: [QueryRep] - Start timestamp (us): 284012916 - Stop timestamp (us): 284013130 Session: S0

* Response: RN16 = BD9D --------------------

* Command: [ACK] - Start timestamp (us): 284013729 - Stop timestamp (us): 284014593 RN: BD9D

* Response: Data = 3000300833B2DDD9014000000000 CRC-16 = 39BB CRC OK --------------------

* Command: [Req_RN] - Start timestamp (us): 284016565 - Stop timestamp (us): 284018179 RN: BD9D CRC-16: OK

* Response: RN = 51CB CRC-16 = B759 CRC OK --------------------

* Command: [Query] - Start timestamp (us): 284019564 - Stop timestamp (us): 284020610 DR: DR=64/3 M: M=2 TRext: Use pilot tone Sel: All Session: S0 Target: A Q: 2 CRC-5: OK

22 © CISC Semiconductor GmbH | www.cisc.at

Understand and analyze the command stream

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System TestUnderstand the environment

Quick check:

Is there any other (disturbing) application around?

23 © CISC Semiconductor GmbH | www.cisc.at

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Query with high Q

24 © CISC Semiconductor GmbH | www.cisc.at

Quick check:

Is the reader working efficient – Lots of empty slots?

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Get EPC with FM0

25 © CISC Semiconductor GmbH | www.cisc.at

2.5ms

FM0 backscatter

� Only 2.5 ms for one EPC/UII

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Get EPC with M=4

26 © CISC Semiconductor GmbH | www.cisc.at

5.0ms

Miller M= 4 backscatter

� Increased to 5 ms for one EPC/UII

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Xplorer- The versatile RFID test equipment

27

Performance tests Conformance tests

Reader tests

© CISC Semiconductor Corp. | www.cisc-semiconductor.com

Tag Emulation

In-lay testing

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IoT’s FIRST meter as key success factor

Finding the lost bits in seconds instead of days

Know how to place, track and manage your tags and readers

Pass all tests for full certification

Save time and money for the user

28 © CISC Semiconductor GmbH | www.cisc.at

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Visit us at www.CISC.at


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