Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20101
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
Real Time Process Control and Quality Control of Long-length Second-generation HTS Wires
A. Rar, Y. Xie, and J. Dackow, SuperPower Inc., Schenectady, NY, USA
V. SelvamanickamUniversity of Houston, Houston, TX, USA
1
Partially supported by U.S. DOE Office of Electricity & Energy Reliability and CRADAs with Los Alamos and Argonne National Laboratories
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20102
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20102
Piece lengths & critical current of 2G wire have been steadily improved over last five years
600+ m lengths with Ic > 300 A/cm1000+ m lengths with Ic > 250 A/cm
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20103
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
MOCVD-based coated conductors are routinely produced in kilometer lengths
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0
50
100
150
200
250
300
350
400
450
500
0 100 200 300 400 500 600 700 800 900 1000
Crit
ical
Cur
rent
(A/
cm)
Position (m)
• Minimum current (Ic) = 282 A/cm over 1065 m • Ic × Length = 300,330 A-m
77 K, Ic measured every 5 m using continuous dc currents over entire tape width of 12 mm (not slit)
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20104
QC tools to qualify long wire requirements
Uniformity of critical current of long-length 2G HTS wires determines their yield which is the main factor that affects the economics
• On-line monitoring of superconductor film quality during MOCVD• Reel-to-reel in-field measurement system for 100+m wires• Qualify Ic uniformity across width for ROEBEL conductors
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20105
Critical current is strongly impacted by a-axis growth in MOCVD films
0
50
100
150
200
250
300
0 0.5 1 1.5
YBCO (200)/(006) ratio
Cri
tical
Cur
rent
(A/c
m)
a-axis grain
CuO
TEM by D. Miller, ANL
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20106
Long-length critical current uniformity is impacted by a-axis growth
0
50
100
150
200
250
300
1 31 61 91 121
151
181
211
241
271
301
331
361
391
Position (m)
Crit
ical
cur
rent
(A/c
m)
020406080
100120140160180
45.5 46 46.5 47 47.52 theta (degrees)
Inte
nsity
(arb
. uni
ts) tape center
tape front edgetape back edge
(006)
(200)0
10
20
30
40
50
60
45.5 46 46.5 47 47.52 theta (degrees)
Inte
nsity
(arb
. uni
ts)
tape centertape front edgetape back edge
(006)
(200)
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20107
Critical current limited by non/weak superconducting phases
y = 1.0007x - 0.0235R² = 0.8411
0
100
200
300
400
0 100 200 300 400Pr
edic
ted
criti
cal c
urre
nt (A
)
Measured critical current (A)
Ic=4.95*counts (006)-125
Critical current predicted based on (006) XRD peak intensity
Good correlation between measured Ic and XRD peak intensity
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20108
On-line XRD in new pilot-MOCVD system for real-time quality control
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Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 20109
Real-time XRD data during long-length MOCVD HTS wire manufacturing
0102030405060708090
100
100 2100 4100
Ic o
r R
eBC
O (0
06)p
eak/
100
position (for XRD estimated)
Non contact Ic
XRD peak/100
(006)
(200)
Good correlation between real-time XRD data & critical current of long 2G HTS wires
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 201010
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
In-field performance of long wires with Zr doping for improved pinning
40
50
60
70
80
90
100
110
120
-30 30 90 150 210 270 330
Crti
ical
cur
rent
(A/1
2 m
m)
Angle between field & tape normal (°)
5% 7.5% 10%
1.0 T, 77 K
Zr-doped MOCVD precursor recipe successfully transferred to manufacturing system.Is the enhanced pinning uniform over long lengths ?
Research MOCVD system at Houston Pilot MOCVD system at Schenectady, NY
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
10
20
30
40
50
60
70
80
-30 30 90 150 210 270 330J c
(MA
/cm
2 )
Crti
ical
cur
rent
(A/1
2 m
m)
Angle between field & tape normal (°)
0% 2.5% 5%
7.50% 10% 12.50%
1.0 T, 77 K
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 201011
Reel-to-reel in-field measurement system set up based on technique developed at
LANL• LANL provided a magnet stage
(0.52 Tesla over 7.5 cm) for in-field measurement on long tapes at all field orientations (360°) & associated testing know-how.
• SP constructed a reel-to-reel system with sensors, controllers and software using this magnet stage.
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Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 201012
Reel-to-reel system enables comparison of in-field performance of long wires
Even with 16% lower self-field Ic, Zr-doped wire exhibits 80% higher Ic at B || c, and 71% higher Ic at min Ic angle compared with standard wire
Improved pinning is uniform over 100+m lengths
0
10
20
30
40
50
60
0
20
40
60
80
100
120
0 10 20 30 40 50 60 70 80 90 100 110 120 130 140
I cat
0.5
2 T
(A/ 4
mm
wid
th)
Position (m)
Standard undoped wire, self-field IcZr-doped wire self-field IcStandard undoped wire, B || c-axisStandard undoped wire, min Ic angleZr-doped wire, B || c axisZr-doped wire min Ic angle
Self-
field
I c(A
/ 4 m
m
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
Meeting requirements for ROEBEL cables• ROEBEL cable is used for
low ac loss, high current applications
• Since current has to flow across the width, 2D Icuniformity is important.
• Previously, we patterned 12 mm wide 2G wire in multiple segments for measurements of Ic at different angles of current flow and found no discernible reduction in intermediate angles
0
50
100
150
200
250
300
-10 0 10 20 30 40 50 60 70 80 90 100Angle between curent and tape length (deg)
Ic (A
/cm
)
Tape 1Tape 2Tape 3
Buffer
Need a non destructive QC technique to evaluate 2D Ic non uniformity
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010 14
Non-destructive QC technique for 2-dimensional Ic uniformity analysis
A variety of techniques have been studied to measure the 2D uniformity of superconductors:
• Magneto-optical imagining: D. M. Feldmann, et al., Appl. Phys. Lett. 77, 2906 (2000); • Magneto scan: M. Zehetmayer, et al., Appl. Phys. Lett. 90, 032506 (2007); • Laser scanning: T. Kiss, et al., Applied Superconductivity, IEEE Transactions on, June
2005; • Magnetic imaging: G.W. Brown, et al., Mat. Res. Soc. Symp. Vol. 659 (2001); • Scanning Hall Probe: A. Oota, et al., Physica C 291, 188 (1997); • Magnetic Knife: J H¨anisch, et al., Supercond. Sci. Technol. 21 (2008) 115021
• Scalability over a practical conductor length has not been demonstrated yet.
• While some techniques are used to measure Ic uniformity along the transverse direction, the current flow is still along the tape length.
Fine resolution and measurement over long length are both needed to obtain data to determine the suitability of materials for certain applications
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010 15
2D Uniformity Analysis using Tapestar Data• Non-magnetic nature of SuperPower 2G wire substrate allow evaluation of Ic with
magnetic technique such as Tapestar that provides 2D field profile every 1 mm tape using seven Hall sensor readings.
• Field penetration profile at every location along the tape reflects the uniformity across width.
• When non-uniformity across width exists, readings from Sensor 1 differs from that of Sensor 7– similarly Sensor 2 vs. Sensor 6 and Sensor 3 vs. Sensor 5
Tape width
Uniform Ic across width : Symmetrical field penetration profile
Non uniform Ic across width : Asymmetrical field penetration profile
1 2 3 4 5 6 7
Tape width
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010 16
2D Uniformity Analysis using Tapestar Data• “Correlation Coefficient” calculated to determine
the degree of difference between a local field penetration and an ideal Bean profile.
• Relative gradient (RG) based on the readings from the two sensors at the opposite sides w.r.t. the center sensor shows how and how much a local profile differs from an ideal Bean profile.
1 2 3 4 5 6 7
Since Sensors 1 and 7 are located at the two edges, RG17 values typically indicates how well the Sensor array is aligned with the tape during the measurement.
(1)
100)47()41(
17(%)17 ×−+−
−=
SensorSensorSensorSensorSensorSensorRG
100)47()41(
26(%)26 ×−+−
−=
SensorSensorSensorSensorSensorSensorRG
100)47()41(
35(%)35 ×−+−
−=
SensorSensorSensorSensorSensorSensorRG
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010 17
Field Penetration Profiles – Possible Scenarios
CaseRG35 (%)
RG26 (%)
RG17 (%) Note
Perfectly uniform 0 0 0 No difference between two sensor readings.
Extremely nonuniform - ∞ - ∞ - ∞
Left-hand side is ∞ times worse than the right-hand side
Typical - uniform 1.90 -2.28 -1.14 Quite uniform. Variation ~2%
Typical –nonuniform 16.46 4.12 -1.23
Very nonuniform between Sensors 3 and 5. There must be defects around Sensor 5 (positive value indicate better at left side - “polarity”)
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20
25
30
35
40
-6 -4 -2 0 2 4 6
Sensor Position (mm)
Sens
or R
eadi
ng (m
T)
Perfectly uniform Extremely nonuniformTypical - uniform Typical - nonuniform
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
Minor variations in 2D Ic clear from RG analysis65 m long, 12 mm wide wire, min Ic = 314 A, av Ic = 316 A , 0.3% uniformity
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0 10 20 30 40 50 60202224262830
Position (m)
Cent
er S
enso
r (m
T) -15-10-505
1015
Diff3
5 (%
)
-15-10-505
1015
Diff2
6(%
)
-15-10-505
1015
Wire1a
Diff1
7(%
)R
G35
(%)
RG
26 (%
)R
G17
(%)
62.5 63.0 63.5 64.0 64.5202224262830
Position (m)
Cent
er S
enso
r (m
T)
-15-10-505
1015
Diff3
5 (%
)
-10
-5
0
5
10
Diff2
6(%
)
-15-10-505
1015
Wire1a (62.5-64.5 m)
Diff1
7(%
) Left-hand side
Right-hand side
RG
17 (%
)R
G17
(%)
RG
26 (%
)R
G35
(%)
2D Ic analysis is an effective QC tool for wire selection for ROEBEL cables
Readings from all 7 sensorsMinor local variations not very visible
Relative gradient calculatedMinor local variations clear
Materials Research Society Spring Meeting, San Francisco, April 5 – 9, 2010
Summary
Quality control tools have been established to assess uniformity in critical current along tape length, uniformity in-field performance over tape length and uniformity critical current across tape width
in long 2G HTS wires.
Uniformity of critical current of long-length 2G HTS wires determines their yield which is the main factor that improve the economics
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