+ All Categories
Home > Documents > Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Date post: 28-Jan-2016
Category:
Upload: lilia
View: 28 times
Download: 0 times
Share this document with a friend
Description:
Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems. José Vicente [email protected]. Motivation. Perform physics studies with help from reflectometry systems, namely the density profile systems, from AUG and JET. Outline. Waves in plasmas - PowerPoint PPT Presentation
28
07.10.2009 IPP - Garching Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems José Vicente [email protected]
Transcript
Page 1: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

07.10.2009 IPP - Garching

Reflectometry Diagnosticsand Rational Surface Localization with

Fast Swept Systems

José Vicente

[email protected]

Page 2: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Motivation

Perform physics studies with help from reflectometry systems, namely the density profile systems, from AUG and JET.

Page 3: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Outline

Waves in plasmas Reflectometry: principles of operation

Density profile systems

AUG and JET systems Rational Surface Localization

Other applications/systems

Page 4: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Remember waves in plasmas...

Consider high-frequency electron oscillations (ions remain at rest)!

The plasma neutrality is broken and an electric field arises pushing electrons back to equilibrium while leading to a density perturbation…

Ee

E

x

electron displacement

electric field

force

Momentum eq.

Poisson eq.

Fluid continuity eq. xe

xee

vx

nnt

ne

Ex

vt

mEe

,

0

,

Page 5: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Remember waves in plasmas...

0

2

e

epe m

en

00

2

2

2

nm

enn

t e

e

Taking the time derivative yields the linear wave equation:

Cold Plasma!

Simple temporal oscillation with angular frequency:

Page 6: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Remember waves in plasmas...

t

E

cJB

t

BE

B

E

20

0

1

0.

/.

The well known solutions in vacuum, far from the source, are the plane waves, for E and B:

).cos(),( 0 wtrkEtrE ).(

0wtrkieEE

Page 7: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Remember waves in plasmas...The formal study of an uniform magnetized plasma finds that a solution to the Maxwell equations in the form of a e-plane wave is only possible if the wave vector and the frequency satisfy a dispersion relationship, which in the cold plasma approximation (all electrons have the same speed) is given by:

... where it is used the vectorial refractive index,

N = k c/

with N2 = N2 + N2

0

0

0

32

||

12

2

||212||

NNN

Ni

NNiN

Det

2

2

3

22

2

2

22

2

1

1

1

pe

ge

pege

ge

pe

ωω

ω

Page 8: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

wikipedia !

2 electromagnetic modes for electron waves, and kB0 , but other modes are possible for instance for electrostatic conditions and/or ion species…

Page 9: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

The solution gives two characteristic modes of propagation, the ordinary and extraordinary modes with different dispersion relations.

And we get that N2 = 0 condition (phase velocity becomes infinity) is satisfied for some cutoffs – the wave is reflected!

Remember waves in plasmas...

2

122 4

2

1pccR

2

122 4

2

1pccL

Page 10: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Reflectometry

103104105106107108109101010111012

10-2

102

100

10-310-410-510-610-710-810-9

10-10

101

103104105106107

f[Hz]

[m]

E[eV]

ion cyclotron emission

reflectometry electron cyclotron emission

coherent thomson scatteringinterferometry/polarimetry synchrotron radiation

visible light spectroscopy/ incoherent thomson scatteringvuv spectroscopy/xuv spectroscopy

soft x-ray spectroscopy/ neutral particle analysis

magnetics

fusion product diagnosticshard x-ray spectroscopy

atomic beam diagnostics

Microwave

Diagnostics

Page 11: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Reflectometry

ee

e

epe n

e

fm

m

en

2

20

0

2 )2(

Probing frequency

Take for instance the O-mode…

Cutoff density

(Cutoff density)

Page 12: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Reflectometry

Phase

Time of flight

)(),(2)( 0

)(

0

wdxxwNc

ww

wx

x

c

After propagation into the plasma and back, the reflected wave presents a phase shift.

This phase shift gives in fact an equivalent time delay, or group delay:

df

df

2

1)(

So, we “throw” waves at the plasma, wait for their reflection and measure:

Page 13: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density ProfilesBoth phase measurement and time-of-flight measurement techniques may be applied to plasma profiles.

For O-mode operation, in which the cutoff frequency is solely a function of electron density, the group delay data (in the case of time-of-flight techniques) or a derivative of the phase delay data (in the case of phase measurement techniques) may be Abel-inverted to reconstruct the electron density profile of the target plasma.

The most common approach is a phase measurement technique called swept frequency modulation (FM) reflectometry, while two different time-of-flight techniques have been applied to this problem: amplitude modulation (AM) reflectometry and ultrashort pulse reflectometry (USPR).

from Textor-94

Page 14: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - FM

Main components

• Microwave Source (Sweep frequency)

• Transmission Line + Front-ends

• Detection System (e.g. Quadrature- phase scheme below)

Page 15: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - FM

Heterodyne detection allows the basic measurement to be of the fringe frequency resulting from the beating between the reference and plasma signals! This (with a sliding FFT e.g.) gives the group delay needed for profile reconstruction. 1

)( )(2

1

dt

dfff

df

dbf

Page 16: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - FM

From the group delay measurements inside the range of interest (frequency range) the cutoff layer positions are determined by an Abel inversion

cf

c

cc dfff

fc

fr0

22

1)()(

)(rnn ee

Probing frequency

Density Profile

Page 17: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles – JET and AUG

Both systems measure up to ~ 12x1019m-3

JETBands Freq.Range LFS LFS HFS

K 16-25 - O OKa 25-36 - O OQ 33-50 X X/O OV 50-75 X/O X/O OW 75-110 X/O O -D 110-150 X - -

AUGReflectometry Access

•Just commissioned, profile reconstruction algorithms still being optimized.

•10 μs sweep time

•Edge to magnetic axis and beyond

•~ 15 years old (Q band detectors damaged, HFS mixer lost sensit/!)

•20 μs sweep time

Page 18: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

Plasma current

NBI and ICRH power

Core and edge line integrated density

Plasma stored energy

D-alpha

Page 19: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

Different diagnostics, Shifted profiles!

Page 20: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

Poor S/N in Q-band

Page 21: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

Page 22: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

Whole pedestal is probed!

Page 23: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - AUG

• ELM resolved profiles• Pedestal studies• Transport…

Page 24: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Density Profiles - JETW-band

- back wall, resonances and not pure X-mode are issues...

- shift in profiles compared with HRTS also present…

- equilibrium reconstruction?

Page 25: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Rational surface localization

L. Vermare, et al PPCF 2005

When MHD modes develop in the vicinity of rational surface, they can be used to give one or two points of the current profile.

Magnetic islands modify density profiles by involving a local flatness due to the reconnection of flux surfaces.

But an analysis based on jumps on the time of flight during fast sweeps is possible and more straightforward then through the “flatness” of the profiles!

Page 26: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Rational surface localization

F. Clairet, et al 2005

In addition to the jumps associated with magnetic islands, incoherent turbulence may produce random jumps, detected at random radial positions.

Radial positions retrieved by profile reconstruction.

Magnetic islands dynamics also possible to be studied (crossing of X and O points)

Rational surfaces calculated by equilibrium code.

Magnetic islands have to be present! (t=9, t=11)

Page 27: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Summary

Reviewed waves in plasmas (O-mode, X-mode) Reflectometry principles and measurements (phase or time of

flight) Density profile systems (FM-CW at AUG and JET) A different application – Localization of rational surfaces

Some characteristics: + local measurement, + high time resolution, - cannot look over local maxima, +- sensitivity to turbulence

Page 28: Reflectometry Diagnostics and Rational Surface Localization with Fast Swept Systems

Thanks!

Questions?

[email protected]


Recommended