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Reliability Report – 2SC3356 - Silicon Supplies

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Reliability Report 2SC3356 Silicon NPN Planar RF Transistor CONTENTS: Certificate of Conformance Process Flow Chart + Mechanical Test Results DC Static Test Results: Post Stabilization Bake at -55°C, 25°C, 125°C Post Acceleration at -55°C, 25°C, 125°C Post HTRB at -55°C, 25°C, 125°C Post Burn-In at -55°C, 25°C, 125°C Interim 250 hours & 500 hours Steady-State Life Test at 25°C Post Steady-State Life Test at -55°C, 25°C, 125°C Scanning Electron Microscopy (SEM) analysis including WLAT Dynamic Test Results: Preliminary at 25°C Post Stabilization Bake at 25°C Post Burn-In at 25°C Post Steady-State Life Test at 25°C MIL-PRF-38534 CLASS K QUALIFICATION DATAPACK Performed by Tandex Test Labs 15849 Business Center Drive, Irwindale, CA 91706, U.S.A. Phone (626) 962-7166, Fax (626) 960-6896 www.tandexlabs.com www.siliconsupplies.com
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Page 1: Reliability Report – 2SC3356 - Silicon Supplies

Reliability Report – 2SC3356

Silicon NPN Planar RF Transistor

CONTENTS:

Certificate of Conformance Process Flow Chart + Mechanical Test Results DC Static Test Results: Post Stabilization Bake at -55°C, 25°C, 125°C Post Acceleration at -55°C, 25°C, 125°C Post HTRB at -55°C, 25°C, 125°C Post Burn-In at -55°C, 25°C, 125°C Interim 250 hours & 500 hours Steady-State Life Test at 25°C Post Steady-State Life Test at -55°C, 25°C, 125°C Scanning Electron Microscopy (SEM) analysis including WLAT Dynamic Test Results: Preliminary at 25°C Post Stabilization Bake at 25°C Post Burn-In at 25°C Post Steady-State Life Test at 25°C

MIL-PRF-38534 CLASS K QUALIFICATION DATAPACK

Performed by Tandex Test Labs

15849 Business Center Drive, Irwindale, CA 91706, U.S.A. Phone (626) 962-7166, Fax (626) 960-6896

www.tandexlabs.com

www.siliconsupplies.com

Page 2: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

 

Certificate of Conformance

www.siliconsupplies.com

Page 3: Reliability Report – 2SC3356 - Silicon Supplies
Page 4: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

 

Process Flow Chart + Mechanical Test Results

www.siliconsupplies.com

Page 5: Reliability Report – 2SC3356 - Silicon Supplies
Page 6: Reliability Report – 2SC3356 - Silicon Supplies
Page 7: Reliability Report – 2SC3356 - Silicon Supplies
Page 8: Reliability Report – 2SC3356 - Silicon Supplies
Page 9: Reliability Report – 2SC3356 - Silicon Supplies
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Page 14: Reliability Report – 2SC3356 - Silicon Supplies
Page 15: Reliability Report – 2SC3356 - Silicon Supplies
Page 16: Reliability Report – 2SC3356 - Silicon Supplies
Page 17: Reliability Report – 2SC3356 - Silicon Supplies
Page 18: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Stabilization Bake Test Results at -55°C

www.siliconsupplies.com

Page 19: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST STA BAKE,-55C,SEQ 12

4/29/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: HFE SAME

MAX LIMIT: 300

MIN LIMIT: 50

BIAS 1: 10.0 V 2

BIAS 2: 20.0mA 0

S/NO BIN T2 T3

7 1 129.7 129.7

8 1 123.0 123.0

9 1 123.2 123.2

10 1 113.6 113.6

11 1 128.2 128.2

12 1 124.7 124.7

13 1 125.0 125.0

14 1 123.6 123.6

15 1 118.3 118.3

16 1 125.7 125.7

17 1 126.9 126.9

18 1 126.5 126.5

19 1 125.2 125.2

21 1 127.3 127.3

22 1 125.3 125.3

23 1 120.5 120.5

24 1 123.9 123.9

25 1 119.6 119.6

26 1 123.1 123.1

27 1 122.6 122.6

28 1 122.1 122.1

29 1 123.5 123.5

Page 20: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Stabilization Bake Test Results at 25°C

www.siliconsupplies.com

Page 21: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST STA BAKE,+25C,SEQ 12

4/29/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5

TEST ITEM: ICBO IEBO HFE SAME

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4

BIAS 2: 0 0 20.0mA 0

S/NO BIN T2 T3 T4 T5

7 1 64.00 pA 1.100 pA 190.8 190.8

8 1 31.90 pA 2.200 pA 186.3 186.3

9 1 15.90 pA 200.0 fA 189.5 189.5

10 1 63.90 pA 300.0 fA 191.9 191.9

11 1 23.90 pA 129.9 pA 193.7 193.7

12 1 32.00 pA 700.0 fA 191.0 191.0

13 1 64.00 pA 258.9 pA 191.5 191.5

14 1 15.90 pA 218.0 pA 195.3 195.3

15 1 48.00 pA 1.900 pA 183.6 183.6

16 1 73.00 pA 2.200 pA 194.9 194.9

17 1 15.90 pA 500.0 fA 193.2 193.2

18 1 32.00 pA 600.0 fA 193.6 193.6

19 1 48.00 pA 600.0 fA 194.9 194.9

21 1 13.90 pA 300.0 fA 191.9 191.9

22 1 64.00 pA 238.3 pA 192.3 192.3

23 1 47.90 pA 500.0 fA 186.9 186.9

24 1 64.00 pA 1.700 pA 193.6 193.6

25 1 47.90 pA 176.9 pA 191.3 191.3

26 1 13.90 pA 279.6 pA 192.3 192.3

27 1 12.90 pA 1.700 pA 191.3 191.3

28 1 48.00 pA 2.200 pA 191.3 191.3

29 1 55.90 pA 200.0 pA 190.2 190.2

Page 22: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Stabilization Bake Test Results at 125°C

www.siliconsupplies.com

Page 23: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST STA BAKE,+125C,SEQ 12

4/29/2020

DDS-107-01-A3.xls

TEST NUMBER: T2

TEST ITEM: ICBO

MAX LIMIT: 1.000uA

MIN LIMIT:

BIAS 1: 15.0 V

BIAS 2: 0

S/NO BIN T2

7 1 25.90 pA

8 1 16.20 pA

9 1 71.50 pA

10 1 31.90 pA

11 1 16.00 pA

12 1 47.90 pA

13 1 74.00 pA

14 1 64.00 pA

15 1 33.90 pA

16 1 47.90 pA

17 1 48.00 pA

18 1 74.00 pA

19 1 56.90 pA

21 1 47.90 pA

22 1 48.00 pA

23 1 54.90 pA

24 1 48.00 pA

25 1 33.90 pA

26 1 15.90 pA

27 1 27.90 pA

28 1 63.90 pA

29 1 16.20 pA

Page 24: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Acceleration Test Results at -55°C

www.siliconsupplies.com

Page 25: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST TC, ACCEL,-55C,SEQ 15

5/5/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: HFE SAME

MAX LIMIT: 300

MIN LIMIT: 50

BIAS 1: 10.0 V 2

BIAS 2: 20.0mA 0

S/NO BIN T2 T3

7 1 117.1 117.1

8 1 117.5 117.5

9 1 120.5 120.5

10 1 123.0 123.0

11 1 129.1 129.1

12 1 123.0 123.0

13 1 122.0 122.0

14 1 121.6 121.6

15 1 114.8 114.8

16 1 124.1 124.1

17 1 121.8 121.8

18 1 122.6 122.6

19 1 123.0 123.0

21 1 118.8 118.8

22 1 116.7 116.7

23 1 114.1 114.1

24 1 121.1 121.1

25 1 120.0 120.0

26 1 120.9 120.9

27 1 120.7 120.7

28 1 120.5 120.5

29 1 121.6 121.6

Page 26: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Acceleration Test Results at 25°C

www.siliconsupplies.com

Page 27: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST TC, ACCEL,+25C,SEQ 15

5/5/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5

TEST ITEM: ICBO IEBO HFE SAME

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4

BIAS 2: 0 0 20.0mA 0

S/NO BIN T2 T3 T4 T5

7 1 700.0 fA 123.5 pA 190.6 190.6

8 1 600.0 fA 108.3 pA 185.8 185.8

9 1 700.0 fA 111.0 pA 189.3 189.3

10 1 600.0 fA 600.0 fA 191.9 191.9

11 1 500.0 fA 92.80 pA 193.4 193.4

12 1 500.0 fA 1.100 pA 190.6 190.6

13 1 700.0 fA 120.5 pA 191.3 191.3

14 1 500.0 fA 93.40 pA 194.3 194.3

15 1 600.0 fA 131.0 pA 182.8 182.8

16 1 600.0 fA 146.2 pA 193.6 193.6

17 1 800.0 fA 71.10 pA 192.3 192.3

18 1 500.0 fA 134.0 pA 193.0 193.0

19 1 500.0 fA 67.60 pA 194.5 194.5

21 1 700.0 fA 60.90 pA 191.2 191.2

22 1 600.0 fA 64.00 pA 191.7 191.7

23 1 500.0 fA 47.00 pA 185.8 185.8

24 1 500.0 fA 147.7 pA 192.8 192.8

25 1 400.0 fA 109.9 pA 191.2 191.2

26 1 700.0 fA 157.3 pA 192.3 192.3

27 1 600.0 fA 1.100 pA 178.5 178.5

28 1 600.0 fA 156.4 pA 191.0 191.0

29 1 600.0 fA 700.0 fA 190.4 190.4

Page 28: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Acceleration Test Results at 125°C

www.siliconsupplies.com

Page 29: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST TC, ACCEL,+125C,SEQ 15

5/5/2020

DDS-107-01-A3.xls

TEST NUMBER: T2

TEST ITEM: ICBO

MAX LIMIT: 1.000uA

MIN LIMIT:

BIAS 1: 15.0 V

BIAS 2: 0

S/NO BIN T2

7 1 700.0 fA

8 1 600.0 fA

9 1 500.0 fA

10 1 700.0 fA

11 1 500.0 fA

12 1 700.0 fA

13 1 500.0 fA

14 1 400.0 fA

15 1 700.0 fA

16 1 400.0 fA

17 1 600.0 fA

18 1 600.0 fA

19 1 500.0 fA

21 1 700.0 fA

22 1 500.0 fA

23 1 600.0 fA

24 1 500.0 fA

25 1 700.0 fA

26 1 700.0 fA

27 1 500.0 fA

28 1 600.0 fA

29 1 500.0 fA

Page 30: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post HTRB Test Results at -55°C

www.siliconsupplies.com

Page 31: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST HTRB,-55C,SEQ 17

5/11/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: HFE SAME

MAX LIMIT: 300

MIN LIMIT: 50

BIAS 1: 10.0 V 2

BIAS 2: 20.0mA 0

S/NO BIN T2 T3

7 1 119.6 119.6

8 1 116.9 116.9

9 1 118.2 118.2

10 1 120.0 120.0

11 1 121.0 121.0

12 1 121.2 121.2

13 1 121.9 121.9

14 1 123.4 123.4

15 1 115.1 115.1

16 1 123.6 123.6

17 1 123.3 123.3

18 1 123.6 123.6

19 1 122.3 122.3

21 1 122.0 122.0

22 1 120.6 120.6

23 1 115.6 115.6

24 1 122.3 122.3

25 1 119.5 119.5

26 1 120.5 120.5

27 1 119.2 119.2

28 1 119.7 119.7

29 1 120.4 120.4

Page 32: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post HTRB Test Results at 25°C

www.siliconsupplies.com

Page 33: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST HTRB,+25C,SEQ 17

5/11/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5 T6

TEST ITEM: ICBO IEBO HFE SAME VBEON

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V

BIAS 2: 0 0 20.0mA 0 5.00mA

S/NO BIN T2 T3 T4 T5 T6 mV/degC

7 1 47.90 pA 1.700 pA 191.7 191.7 752.3 mV 588.0 mV -164.3 -1.643

8 1 31.90 pA 1.800 pA 187.0 187.0 750.6 mV 588.7 mV -161.9 -1.619

9 1 68.00 pA 1.200 pA 190.4 190.4 752.1 mV 588.0 mV -164.1 -1.641

10 1 15.90 pA 1.500 pA 192.8 192.8 752.5 mV 586.0 mV -166.5 -1.665

11 1 32.00 pA 154.2 pA 194.5 194.5 750.3 mV 579.5 mV -170.8 -1.708

12 1 16.00 pA 400.0 fA 191.9 191.9 751.9 mV 584.6 mV -167.3 -1.673

13 1 12.90 pA 700.0 fA 192.3 192.3 752.2 mV 586.8 mV -165.4 -1.654

14 1 12.90 pA 800.0 fA 195.8 195.8 752.3 mV 580.6 mV -171.7 -1.717

15 1 13.90 pA 500.0 fA 184.1 184.1 752.5 mV 583.7 mV -168.8 -1.688

16 1 47.90 pA 500.0 fA 194.9 194.9 748.2 mV 583.3 mV -164.9 -1.649

17 1 64.00 pA 900.0 fA 193.6 193.6 747.1 mV 572.4 mV -174.7 -1.747

18 1 63.90 pA 3.000 pA 194.3 194.3 749.5 mV 593.5 mV -156.0 -1.560

19 1 32.00 pA 56.00 pA 196.0 196.0 751.8 mV 586.5 mV -165.3 -1.653

21 1 15.90 pA 800.0 fA 193.0 193.0 751.3 mV 587.7 mV -163.6 -1.636

22 1 63.90 pA 900.0 fA 193.9 193.9 750.8 mV 589.3 mV -161.5 -1.615

23 1 63.90 pA 700.0 fA 188.1 188.1 750.0 mV 587.8 mV -162.2 -1.622

24 1 15.90 pA 800.0 fA 194.7 194.7 750.0 mV 586.6 mV -163.4 -1.634

25 1 31.90 pA 68.40 pA 192.6 192.6 752.1 mV 587.4 mV -164.7 -1.647

26 1 47.90 pA 1.200 pA 193.4 193.4 752.4 mV 594.8 mV -157.6 -1.576

27 1 64.00 pA 600.0 fA 185.0 185.0 751.3 mV 584.7 mV -166.6 -1.666

28 1 63.90 pA 100.0 fA 192.3 192.3 752.8 mV 592.6 mV -160.2 -1.602

29 1 16.00 pA 600.0 fA 191.3 191.3 751.8 mV 591.6 mV -160.2 -1.602

Page 34: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post HTRB Test Results at 125°C

www.siliconsupplies.com

Page 35: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST HTRB,+125C,SEQ 17

5/11/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: ICBO VBEON

MAX LIMIT: 1.000uA

MIN LIMIT:

BIAS 1: 15.0 V 10.0 V

BIAS 2: 0 5.00mA

S/NO BIN T2 T3

7 1 68.00 pA 588.0 mV

8 1 13.90 pA 588.7 mV

9 1 64.00 pA 588.0 mV

10 1 16.00 pA 586.0 mV

11 1 32.00 pA 579.5 mV

12 1 72.00 pA 584.6 mV

13 1 32.00 pA 586.8 mV

14 1 47.90 pA 580.6 mV

15 1 31.90 pA 583.7 mV

16 1 27.90 pA 583.3 mV

17 1 68.00 pA 572.4 mV

18 1 48.00 pA 593.5 mV

19 1 16.10 pA 586.5 mV

21 1 47.90 pA 587.7 mV

22 1 64.00 pA 589.3 mV

23 1 16.10 pA 587.8 mV

24 1 16.00 pA 586.6 mV

25 1 63.90 pA 587.4 mV

26 1 72.00 pA 594.8 mV

27 1 23.90 pA 584.7 mV

28 1 23.90 pA 592.6 mV

29 1 31.90 pA 591.6 mV

Page 36: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

 

Post Burn-In Test Results at -55°C

www.siliconsupplies.com

Page 37: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST BURN-IN,-55C,SEQ 19

5/26/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: HFE SAME

MAX LIMIT: 300

MIN LIMIT: 50

BIAS 1: 10.0 V 2

BIAS 2: 20.0mA 0

S/NO BIN T2 T3

7 1 127.4 127.4

8 1 118.3 118.3

9 1 120.4 120.4

10 1 121.7 121.7

11 1 124.9 124.9

12 1 122.7 122.7

13 1 122.1 122.1

14 1 125.4 125.4

15 1 114.3 114.3

16 1 124.3 124.3

17 1 119.9 119.9

18 1 123.9 123.9

19 1 125.0 125.0

21 1 119.4 119.4

22 1 119.9 119.9

23 1 113.8 113.8

24 1 122.1 122.1

25 1 120.0 120.0

26 1 120.3 120.3

27 1 119.0 119.0

28 1 117.4 117.4

29 1 116.9 116.9

Page 38: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

 

Post Burn-In Test Results at 25°C

www.siliconsupplies.com

Page 39: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST BURN-IN,+25C,SEQ 19

5/26/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5 T6

TEST ITEM: ICBO IEBO HFE SAME VBEON

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V

BIAS 2: 0 0 20.0mA 0 5.00mA

S/NO BIN T2 T3 T4 T5 T6

7 1 32.00 pA 100.0 fA 189.9 189.9 755.6 mV

8 1 72.00 pA 600.0 fA 185.3 185.3 753.9 mV

9 1 68.00 pA 1.000 pA 188.6 188.6 755.6 mV

10 1 16.00 pA 700.0 fA 191.2 191.2 755.8 mV

11 1 68.00 pA 900.0 fA 192.8 192.8 753.7 mV

12 1 68.00 pA 500.0 fA 190.4 190.4 755.4 mV

13 1 64.00 pA 600.0 fA 190.8 190.8 755.4 mV

14 1 32.00 pA 1.000 pA 194.1 194.1 755.5 mV

15 1 48.00 pA 500.0 fA 182.6 182.6 755.6 mV

16 1 15.90 pA 900.0 fA 193.2 193.2 750.9 mV

17 1 47.90 pA 12.70 pA 191.5 191.5 749.9 mV

18 1 68.00 pA 800.0 fA 193.0 193.0 751.8 mV

19 1 72.00 pA 600.0 fA 194.3 194.3 754.8 mV

21 1 16.10 pA 900.0 fA 191.2 191.2 754.5 mV

22 1 63.90 pA 700.0 fA 191.9 191.9 754.4 mV

23 1 32.00 pA 900.0 fA 186.0 186.0 753.5 mV

24 1 64.00 pA 500.0 fA 192.6 192.6 753.5 mV

25 1 31.90 pA 600.0 fA 191.0 191.0 755.2 mV

26 1 16.10 pA 800.0 fA 191.5 191.5 756.6 mV

27 1 64.00 pA 1.200 pA 188.6 188.6 754.7 mV

28 1 68.00 pA 600.0 fA 190.8 190.8 756.3 mV

29 1 32.00 pA 600.0 fA 189.9 189.9 755.0 mV

Page 40: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

 

Post Burn-In Test Results at +125°C

www.siliconsupplies.com

Page 41: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST BURN-IN,+125C,SEQ 19

5/26/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: ICBO VBEON

MAX LIMIT: 1.000uA

MIN LIMIT:

BIAS 1: 15.0 V 10.0 V

BIAS 2: 0 5.00mA

S/NO BIN T2 T3

7 1 47.90 pA 589.7 mV

8 1 64.00 pA 581.0 mV

9 1 23.90 pA 591.0 mV

10 1 31.90 pA 584.2 mV

11 1 23.90 pA 585.6 mV

12 1 47.90 pA 589.2 mV

13 1 31.90 pA 585.6 mV

14 1 124.0 pA 584.2 mV

15 1 31.90 pA 584.0 mV

16 1 15.90 pA 582.5 mV

17 1 31.90 pA 581.3 mV

18 1 16.10 pA 585.2 mV

19 1 117.0 pA 582.3 mV

21 1 32.00 pA 588.0 mV

22 1 48.00 pA 585.9 mV

23 1 63.90 pA 581.4 mV

24 1 71.50 pA 586.0 mV

25 1 31.90 pA 588.3 mV

26 1 63.90 pA 591.8 mV

27 1 31.90 pA 591.0 mV

28 1 68.00 pA 593.9 mV

29 1 32.00 pA 584.4 mV

Page 42: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Interim Steady-State Life Test Results

250 hours 25°C

www.siliconsupplies.com

Page 43: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

250HR CHECK,+25C,SEQ 20

6/8/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5 T6

TEST ITEM: ICBO IEBO HFE SAME VBEON

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V

BIAS 2: 0 0 20.0mA 0 5.00mA

S/NO BIN T2 T3 T4 T5 T6

7 1 48.00 pA 600.0 fA 189.5 189.5 748.8 mV

8 1 47.90 pA 400.0 fA 185.1 185.1 751.2 mV

9 1 32.00 pA 1.000 pA 188.5 188.5 742.4 mV

10 1 32.00 pA 800.0 fA 190.8 190.8 749.3 mV

11 1 31.90 pA 600.0 fA 192.6 192.6 747.9 mV

12 1 55.90 pA 600.0 fA 190.4 190.4 732.6 mV

13 1 64.00 pA 500.0 fA 191.0 191.0 747.6 mV

14 1 63.90 pA 1.300 pA 193.0 193.0 745.3 mV

15 1 63.90 pA 1.000 pA 182.9 182.9 750.9 mV

16 1 63.90 pA 1.100 pA 191.5 191.5 733.1 mV

17 1 24.00 pA 500.0 fA 191.5 191.5 743.0 mV

18 1 63.90 pA 400.0 fA 192.4 192.4 751.6 mV

19 1 31.90 pA 700.0 fA 194.1 194.1 748.8 mV

21 1 32.00 pA 500.0 fA 190.8 190.8 746.8 mV

22 1 64.00 pA 700.0 fA 191.3 191.3 746.9 mV

23 1 47.90 pA 400.0 fA 185.8 185.8 753.7 mV

24 1 64.00 pA 700.0 fA 192.4 192.4 746.0 mV

25 1 64.00 pA 600.0 fA 190.8 190.8 755.3 mV

26 1 31.90 pA 800.0 fA 191.2 191.2 744.1 mV

27 1 16.20 pA 900.0 fA 190.1 190.1 751.6 mV

28 1 47.90 pA 500.0 fA 190.4 190.4 752.5 mV

29 1 32.00 pA 500.0 fA 189.5 189.5 754.1 mV

Page 44: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Interim Steady-State Life Test Results

500 hours 25°C

www.siliconsupplies.com

Page 45: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

500HR CHECK,+25C,SEQ 20

6/18/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5 T6

TEST ITEM: ICBO IEBO HFE SAME VBEON

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V

BIAS 2: 0 0 20.0mA 0 5.00mA

S/NO BIN T2 T3 T4 T5 T6

7 1 31.90 pA 800.0 fA 189.9 189.9 748.2 mV

8 1 32.00 pA 700.0 fA 185.0 185.0 750.2 mV

9 1 63.90 pA 400.0 fA 188.3 188.3 747.6 mV

10 1 64.00 pA 5.500 pA 190.6 190.6 753.1 mV

11 1 31.90 pA 300.0 fA 189.9 189.9 754.6 mV

12 1 16.00 pA 41.70 pA 190.2 190.2 753.6 mV

13 1 15.90 pA 800.0 fA 193.2 193.2 754.7 mV

14 1 23.90 pA 400.0 fA 192.1 192.1 750.9 mV

15 1 63.90 pA 600.0 fA 182.1 182.1 756.5 mV

16 1 16.50 pA 1.200 pA 192.4 192.4 744.9 mV

17 1 64.00 pA 123.0 pA 190.2 190.2 749.0 mV

18 1 47.90 pA 500.0 fA 191.3 191.3 752.2 mV

19 1 16.00 pA 100.0 fA 193.0 193.0 754.7 mV

21 1 74.00 pA 50.10 pA 190.1 190.1 750.6 mV

22 1 24.00 pA 1.100 pA 190.6 190.6 753.0 mV

23 1 63.90 pA 800.0 fA 185.1 185.1 754.5 mV

24 1 63.90 pA 800.0 fA 191.5 191.5 748.1 mV

25 1 15.90 pA 500.0 fA 189.9 189.9 751.9 mV

26 1 15.90 pA 33.80 pA 190.2 190.2 754.9 mV

27 1 47.90 pA 200.0 fA 189.5 189.5 752.3 mV

28 1 31.90 pA 700.0 fA 189.5 189.5 759.5 mV

29 1 40.00 pA 700.0 fA 189.0 189.0 752.8 mV

Page 46: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Steady-State Life Test Results at -55°C

www.siliconsupplies.com

Page 47: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST SSL,-55C,SEQ 21

7/13/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: HFE SAME

MAX LIMIT: 300

MIN LIMIT: 50

BIAS 1: 10.0 V 2

BIAS 2: 20.0mA 0

S/NO BIN T2 T3

7 1 118.6 118.6

8 1 115.2 115.2

9 1 117.9 117.9

10 1 119.4 119.4

11 1 121.4 121.4

12 1 118.3 118.3

13 1 120.1 120.1

14 1 122.0 122.0

15 1 112.1 112.1

16 1 121.5 121.5

17 1 122.9 122.9

18 1 124.6 124.6

19 1 120.7 120.7

21 1 118.4 118.4

22 1 120.5 120.5

23 1 116.8 116.8

24 1 123.8 123.8

25 1 122.3 122.3

26 1 122.4 122.4

27 1 121.5 121.5

28 1 120.7 120.7

29 1 121.2 121.2

Page 48: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Steady-State Life Test Results at 25°C

www.siliconsupplies.com

Page 49: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST SSL,+25C,SEQ 21

7/13/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3 T4 T5 T6

TEST ITEM: ICBO IEBO HFE SAME VBEON

MAX LIMIT: 1.000uA 1.000uA 300

MIN LIMIT: 50

BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V

BIAS 2: 0 0 20.0mA 0 5.00mA

S/NO BIN T2 T3 T4 T5 T6

7 1 51.70 pA 59.00 pA 193.4 193.4 751.9 mV

8 1 8.00 pA 135.00 pA 188.6 188.6 750.1 mV

9 1 40.00 pA 76.00 pA 191.9 191.9 751.7 mV

10 1 32.00 pA 48.00 pA 194.5 194.5 749.9 mV

11 1 31.90 pA 91.00 pA 196.2 196.2 749.9 mV

12 1 24.00 pA 166.00 pA 193.6 193.6 751.8 mV

13 1 110.50 pA 78.00 pA 194.3 194.3 751.3 mV

14 1 16.00 pA 529.00 pA 197.4 197.4 752.2 mV

15 1 16.00 pA 122.00 pA 186.0 186.0 756.1 mV

16 1 50.50 pA 57.00 pA 196.2 196.2 747.6 mV

17 1 48.00 pA 57.00 pA 194.3 194.3 746.0 mV

18 1 15.90 pA 241.00 pA 195.6 195.6 739.9 mV

19 1 64.00 pA 43.00 pA 197.4 197.4 751.7 mV

21 1 52.00 pA 220.00 pA 194.5 194.5 750.8 mV

22 1 47.90 pA 111.00 pA 194.9 194.9 751.0 mV

23 1 11.90 pA 495.00 pA 189.3 189.3 750.0 mV

24 1 52.00 pA 156.00 pA 194.1 194.1 750.5 mV

25 1 7.90 pA 552.00 pA 194.3 194.3 751.9 mV

26 1 32.00 pA 118.00 pA 194.9 194.9 754.5 mV

27 1 32.00 pA 19.00 pA 193.7 193.7 751.1 mV

28 1 23.90 pA 151.00 pA 194.1 194.1 757.6 mV

29 1 11.90 pA 36.00 pA 193.4 193.4 746.9 mV

Page 50: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Steady-State Life Test Results at 125°C

www.siliconsupplies.com

Page 51: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST SSL,+125C,SEQ 21

7/13/2020

DDS-107-01-A3.xls

TEST NUMBER: T2 T3

TEST ITEM: ICBO VBEON

MAX LIMIT: 1.000uA

MIN LIMIT:

BIAS 1: 15.0 V 10.0 V

BIAS 2: 0 5.00mA

S/NO BIN T2 T3

7 1 32.00 pA 580.3 mV

8 1 39.90 pA 579.1 mV

9 1 43.50 pA 580.9 mV

10 1 53.50 pA 580.7 mV

11 1 15.90 pA 579.5 mV

12 1 8.00 pA 581.1 mV

13 1 7.90 pA 582.9 mV

14 1 4.70 pA 583.5 mV

15 1 8.00 pA 587.8 mV

16 1 40.00 pA 578.8 mV

17 1 5.90 pA 577.6 mV

18 1 15.90 pA 580.1 mV

19 1 15.90 pA 581.7 mV

21 1 43.90 pA 580.5 mV

22 1 4.90 pA 582.1 mV

23 1 40.00 pA 581.3 mV

24 1 5.90 pA 580.6 mV

25 1 39.90 pA 581.7 mV

26 1 32.00 pA 587.8 mV

27 1 5.50 pA 579.2 mV

28 1 7.90 pA 591.5 mV

29 1 23.90 pA 582.5 mV

Page 52: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Preliminary Dynamic Test Results at 25°C

www.siliconsupplies.com

Page 53: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

PRELIMINARY,+25C,SEQ 9

3/17/2020

DDS-107-01-A4

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x

S21E (dB) From VNA 7 9 -- 7.9 8.0 8.0 8.0 8.0 8.0 8.0 8.0 8.0 7.9 7.9 7.8 7.8 7.9 8.0

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.6 6.6 6.7 6.6 6.7 6.8 6.7 6.7 6.7 6.7 6.7 6.6 6.6 6.6 6.7

S11 (dB) From VNA -- -- -- -3.9 -3.8 -4.0 -3.8 -3.9 -4.0 -4.0 -4.0 -3.9 -4.0 -3.8 -3.8 -3.9 -3.8 -4.0

S12 (dB) From VNA -- -- -- -18.7 -18.6 -18.7 -18.8 -18.8 -18.7 -18.6 -18.8 -18.7 -18.6 -18.8 -18.8 -18.7 -18.9 -18.9

S22 (dB) From VNA -- -- -- -6.0 -6.2 -6.1 -6.0 -6.1 -6.1 -6.1 -6.0 -6.0 -6.0 -6.0 -6.2 -6.1 -5.9 -6.1

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.1 10.1 10.1 10.2 10.2 10.2 10.1 10.2 10.2 10.2 10.3 10.1 10.1 10.2 10.1

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.4 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.2 13.1 13.1 13.3 13.4

2 S21 from VNA, 2 GHz (dB) -- -- -- 7.9 8.0 8.0 8.0 8.0 8.0 8.0 8.0 8.0 7.9 7.9 7.8 7.8 7.9 8.0

3 S21 from VNA, 3 GHz (dB) -- -- -- 5.0 4.8 4.8 4.7 4.8 4.9 4.8 4.8 4.8 4.8 4.7 4.6 4.6 4.7 4.9

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.9 4.5 4.6 4.6 4.6 4.7 4.5 4.6 4.6 4.7 4.5 4.2 4.4 4.5 4.6

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.2 2.0 2.2 2.1 2.1 2.3 2.0 2.2 2.1 2.0 2.1 1.7 1.8 2.1 2.2

6 S21 from VNA, 6 GHz (dB) -- -- -- 1.0 0.7 0.9 0.9 0.9 1.0 0.2 0.9 0.9 0.5 0.5 0.3 0.4 0.5 1.5

fT (GHz) Extrapolated -- 7 -- 6.8 6.7 6.8 6.8 6.8 7.0 6.5 6.8 6.8 6.6 6.6 6.4 6.4 6.6 7.1

NF Setup VCE=10V, IC=7mA -- -- --

NF (dB) f=1GHz, from NF meter -- 1.1 --

NF (dB) f=2GHz, from NF meter -- 2.1 --

16 17 18 1910 11 12 13 14 15

17-Mar-2020

UUT Serial No.

28 29 7 8 9

Page 54: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

PRELIMINARY,+25C,SEQ 9

3/17/2020

DDS-107-01-A4

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- --

S21E (dB) From VNA 7 9 --

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- --

S21 (dB) From VNA -- -- --

S11 (dB) From VNA -- -- --

S12 (dB) From VNA -- -- --

S22 (dB) From VNA -- -- --

GA (dB)Calculated assuming ideal

input match-- 10 --

fT Setup VCE=10V, IC=20mA -- -- --

1 S21 from VNA, 1 GHz (dB) -- -- --

2 S21 from VNA, 2 GHz (dB) -- -- --

3 S21 from VNA, 3 GHz (dB) -- -- --

4 S21 from VNA, 4 GHz (dB) -- -- --

5 S21 from VNA, 5 GHz (dB) -- -- --

6 S21 from VNA, 6 GHz (dB) -- -- --

fT (GHz) Extrapolated -- 7 --

NF Setup VCE=10V, IC=7mA -- -- --

NF (dB) f=1GHz, from NF meter -- 1.1 --

NF (dB) f=2GHz, from NF meter -- 2.1 --

17-Mar-2020

x x x x x x x

7.9 8.0 8.0 8.0 8.0 8.0 8.0

x x x x x x x

6.7 6.7 6.7 6.7 6.7 6.7 6.7

-3.9 -4.1 -3.7 -4.0 -3.9 -3.9 -3.9

-18.8 -18.8 -18.9 -11.8 -18.9 -18.7 -18.7

-6.2 -6.1 -6.0 -6.1 -5.9 -6.0 -6.0

10.2 10.1 10.4 10.1 10.3 10.2 10.2

x x x x x x x

13.3 13.3 13.0 13.3 13.4 13.3 13.3

7.9 8.0 8.0 8.0 8.0 8.0 8.0

4.7 4.8 4.8 4.8 4.8 4.8 4.8

4.4 4.6 4.6 4.6 4.7 4.7 4.6

2.2 2.2 2.2 2.3 2.5 2.3 2.2

1.0 1.2 0.8 1.0 1.5 1.0 1.0

6.8 7.0 6.9 6.9 7.2 6.9 6.9

2723 24 25 2621 22

UUT Serial No.

Page 55: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Stabilization Bake

Dynamic Test Results at 25°C

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Page 56: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST STA BAKE,+25C,SEQ 12

5/1/2020

DDS-107-01-A4

(All data taken 4/30-5/1/2020)

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x

S21E (dB) From VNA 7 9 -- 8.3 8.0 8.1 8.0 8.0 8.1 8.0 8.1 8.1 8.0 8.1 8.2 8.3 8.0 8.1

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.9 6.7 6.8 6.8 6.7 6.8 6.8 6.8 6.8 6.8 6.7 6.9 7.0 6.7 6.8

S11 (dB) From VNA -- -- -- -4.3 -4.4 -4.3 -4.0 -4.4 -4.1 -4.5 -4.1 -4.5 -4.4 -4.3 -4.4 -4.1 -4.2 -4.3

S12 (dB) From VNA -- -- -- -19.1 -19.0 -19.2 -19.0 -19.0 -19.1 -19.0 -19.0 -19.2 -19.0 -19.3 -19.0 -19.2 -18.8 -19.0

S22 (dB) From VNA -- -- -- -6.1 -6.2 -6.1 -6.1 -6.1 -6.1 -6.2 -6.2 -6.1 -6.0 -6.0 -6.0 -6.1 -6.1 -6.2

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.1 9.9 10.0 10.2 9.9 10.2 9.9 10.1 9.9 10.0 10.0 10.1 10.4 10.0 10.0

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.6 13.3 13.4 13.3 13.4 13.5 13.3 13.4 13.4 13.4 13.4 13.5 13.6 13.3 13.4

2 S21 from VNA, 2 GHz (dB) -- -- -- 8.3 8.0 8.1 8.0 8.0 8.1 8.0 8.1 8.1 8.0 8.1 8.2 8.3 8.0 8.1

3 S21 from VNA, 3 GHz (dB) -- -- -- 5.2 5.0 5.0 4.9 5.0 5.1 5.0 5.0 5.0 5.0 5.0 5.3 5.4 4.9 5.0

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.8 3.7 3.7 3.6 3.6 3.7 3.7 3.6 3.7 3.7 3.7 3.8 3.8 3.5 3.7

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.1 1.9 2.0 1.6 1.9 1.8 2.0 1.8 2.0 2.0 2.0 1.9 2.1 1.8 2.0

6 S21 from VNA, 6 GHz (dB) -- -- -- 0.5 0.3 0.7 0.3 0.4 0.3 0.5 0.5 0.3 0.4 0.5 1.0 0.8 0.1 0.5

fT (GHz) Extrapolated -- 7 -- 6.5 6.4 6.5 6.2 6.4 6.3 6.5 6.4 6.4 6.4 6.5 6.7 6.7 6.2 6.5

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.43 2.47 2.43 2.45 2.45 2.42 2.43 2.43 2.38 2.42 2.45 2.46 2.56 2.44 2.41

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.46 3.52 3.45 3.49 3.48 3.44 3.44 3.46 3.65 3.45 3.50 3.48 3.58 3.45 3.44

17 18 1911 12 13 14 15 16

1-May-2020

UUT Serial No.

28 29 7 8 9 10

Page 57: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST STA BAKE,+25C,SEQ 12

5/1/2020

DDS-107-01-A4

(All data taken 4/30-5/1/2020)

Symbol Conditions Min. Typ. Max. 27

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x

S21E (dB) From VNA 7 9 -- 8.1 8.1 7.8 8.1 8.1 8.1 8.1

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x

S21 (dB) From VNA -- -- -- 6.8 6.8 6.6 6.7 6.8 6.8 6.8

S11 (dB) From VNA -- -- -- -4.2 -4.3 -4.1 -4.1 -4.3 -4.3 -4.0

S12 (dB) From VNA -- -- -- -19.2 -19.1 -19.2 -18.9 -19.1 -19.2 -19.1

S22 (dB) From VNA -- -- -- -6.1 -6.1 -6.3 -6.2 -6.1 -6.1 -6.1

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.1 10.0 9.9 10.0 10.0 10.0 10.2

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.4 13.4 13.1 13.3 13.4 13.4 13.4

2 S21 from VNA, 2 GHz (dB) -- -- -- 8.1 8.1 7.8 8.1 8.1 8.1 8.1

3 S21 from VNA, 3 GHz (dB) -- -- -- 5.0 5.0 4.6 5.0 5.0 5.0 5.0

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.7 3.3 3.7 3.8 3.7 3.6

5 S21 from VNA, 5 GHz (dB) -- -- -- 1.8 2.1 1.5 2.0 2.0 2.1 1.9

6 S21 from VNA, 6 GHz (dB) -- -- -- 0.0 0.5 0.1 0.2 0.1 0.2 0.2

fT (GHz) Extrapolated -- 7 -- 6.2 6.5 6.1 6.4 6.3 6.4 6.3

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.43 2.43 2.35 2.43 2.41 2.43 2.43

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.48 3.47 4.00 3.46 3.45 3.47 3.45

1-May-2020

UUT Serial No.

21 2622 23 24 25

Page 58: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Burn-In Dynamic Test Results at 25°C

www.siliconsupplies.com

Page 59: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST BURN-IN,+25C,SEQ 19

5/28/2020

DDS-107-01-A4

(All data taken 5/27-5/28/2020)

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x

S21E (dB) From VNA 7 9 -- 7.9 7.7 8.4 7.9 7.8 8.0 8.1 7.9 8.4 7.8 7.9 7.8 7.8

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.5 6.4 7.0 6.6 6.5 6.7 6.8 6.6 7.1 6.6 6.6 6.5 6.5

S11 (dB) From VNA -- -- -- -4.0 -4.3 -4.1 -4.0 -4.1 -3.9 -4.0 -4.0 -4.0 -4.0 -3.8 -3.9 -3.9

S12 (dB) From VNA -- -- -- -18.7 -18.8 -18.8 -19.1 -19.1 -19.1 -18.9 -18.9 -18.9 -18.9 -19.0 -19.0 -19.0

S22 (dB) From VNA -- -- -- -5.9 -5.9 -5.9 -5.9 -5.9 -6.0 -6.0 -5.9 -6.0 -5.9 -6.0 -6.4 -6.2

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.0 9.7 10.4 10.1 9.9 10.2 10.3 10.1 10.6 10.1 10.2 9.9 10.0

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.3 13.2 13.8 13.4 13.4 13.5 13.6 13.4 13.8 13.2 13.4 13.2 13.2

2 S21 from VNA, 2 GHz (dB) -- -- -- 7.9 7.7 8.4 7.9 7.8 8.0 8.1 7.9 8.4 7.8 7.9 7.8 7.8

3 S21 from VNA, 3 GHz (dB) -- -- -- 4.8 4.7 5.3 4.8 4.9 5.0 5.0 4.9 5.3 4.8 4.9 4.8 4.7

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.6 3.4 3.7 3.5 3.5 3.6 3.6 3.5 3.6 3.3 3.5 3.3 3.3

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.0 1.8 2.4 2.0 2.0 2.1 2.2 2.0 2.2 1.5 2.0 1.7 1.8

6 S21 from VNA, 6 GHz (dB) -- -- -- 0.7 0.5 1.1 0.7 0.8 0.9 1.0 0.7 0.9 -0.2 0.6 0.1 0.3

fT (GHz) Extrapolated -- 7 -- 6.5 6.3 6.8 6.4 6.5 6.6 6.6 6.5 6.6 6.0 6.4 6.1 6.2

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.54 2.45 2.46 2.45 2.43 2.44 2.45 2.36 2.43 2.46 2.47 2.39

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.47 3.60 3.47 3.49 3.48 3.46 3.44 3.47 3.71 3.46 3.50 3.51 3.83

16 1710 11 12 13 14 15

28-May-2020

UUT Serial No.

28 29 7 8 9

Page 60: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST BURN-IN,+25C,SEQ 19

5/28/2020

DDS-107-01-A4

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x

S21E (dB) From VNA 7 9 -- 7.8 7.9 7.9 8.2 7.9 8.0 7.9 8.0 8.8

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.5 6.6 6.6 6.8 6.6 6.7 6.6 6.7 7.4

S11 (dB) From VNA -- -- -- -3.9 -4.0 -4.0 -4.0 -4.0 -3.9 -4.0 -3.9 -4.0

S12 (dB) From VNA -- -- -- -19.0 -19.0 -19.1 -19.4 -19.2 -19.0 -19.1 -18.9 -19.1

S22 (dB) From VNA -- -- -- -5.9 -6.0 -5.9 -5.8 -5.8 -6.3 -5.9 -5.9 -5.9

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.1 10.1 10.1 10.3 10.1 10.1 10.1 10.3 10.9

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.3 13.4 13.4 13.7 13.4 13.5 13.4 13.5 13.9

2 S21 from VNA, 2 GHz (dB) -- -- -- 7.8 7.9 7.9 8.2 7.9 8.0 7.9 8.0 8.8

3 S21 from VNA, 3 GHz (dB) -- -- -- 4.8 4.9 4.9 5.0 4.8 4.9 4.9 4.9 5.6

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.4 3.5 3.5 3.6 3.5 3.5 3.6 3.5 3.8

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.0 2.1 2.0 2.2 2.0 2.0 2.2 2.1 2.5

6 S21 from VNA, 6 GHz (dB) -- -- -- 0.6 0.8 0.6 0.8 0.6 0.6 0.8 0.8 1.1

fT (GHz) Extrapolated -- 7 -- 6.4 6.5 6.4 6.5 6.4 6.4 6.6 6.5 0.0

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.43 2.45 2.44 2.60 2.47 2.44 2.48 2.43

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.48 3.46 3.50 3.47 3.64 3.48 3.47 3.51 3.46

2723 24 25 26

28-May-2020

UUT Serial No.

18 19 21 22

Page 61: Reliability Report – 2SC3356 - Silicon Supplies

MIL-PRF-38534 CLASS K DATAPACK

Post Steady-State Life

Dynamic Test Results at 25°C

www.siliconsupplies.com

Page 62: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST SSL,+25C,SEQ 21

7/15/2020

DDS-107-01-A4

(All data taken 7/14-7/15/2020)

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x

S21E (dB) From VNA 7 9 -- 8.3 7.9 8.0 7.9 7.9 8.0 7.9 8.0 7.4 7.9 7.2 7.8 7.9

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.9 6.6 6.7 6.6 6.6 6.7 6.6 6.7 6.3 6.7 6.0 6.5 6.7

S11 (dB) From VNA -- -- -- -4.1 -4.1 -3.9 -4.0 -4.0 -4.1 -4.1 -3.9 -5.4 -4.0 -5.5 -4.1 -3.9

S12 (dB) From VNA -- -- -- -19.2 -19.0 -19.0 -18.9 -19.2 -19.0 -18.8 -19.0 -16.6 -19.2 -16.4 -18.9 -18.8

S22 (dB) From VNA -- -- -- -5.7 -6.0 -6.0 -6.0 -5.9 -6.0 -6.1 -6.1 -5.7 -5.7 -5.5 -5.9 -6.3

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.4 10.0 10.2 10.1 10.1 10.1 10.0 10.2 9.1 10.3 8.9 9.9 10.1

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.8 13.4 13.5 13.4 13.5 13.5 13.4 13.5 12.8 13.5 12.6 13.3 13.4

2 S21 from VNA, 2 GHz (dB) -- -- -- 8.3 7.9 8.0 7.9 7.9 8.0 7.9 8.0 7.4 7.9 7.2 7.8 7.9

3 S21 from VNA, 3 GHz (dB) -- -- -- 5.2 4.9 5.0 4.9 5.0 5.0 4.9 5.0 4.6 4.9 4.5 4.9 4.9

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.5 3.7 3.6 3.7 3.7 3.6 3.6 3.5 3.6 3.4 3.5 3.4

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.2 2.0 2.1 1.9 2.1 2.1 2.1 2.1 2.2 2.0 2.1 2.0 1.8

6 S21 from VNA, 6 GHz (dB) -- -- -- 1.1 0.8 1.0 0.9 0.9 0.9 1.0 0.9 1.2 0.8 1.0 0.7 0.6

fT (GHz) Extrapolated -- 7 -- 6.7 6.5 6.7 6.5 6.6 6.6 6.6 6.6 6.8 6.5 6.7 6.5 6.3

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.49 2.41 2.45 2.40 2.45 2.45 2.38 2.44 2.43 2.44 2.54 2.49 2.50

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.52 3.82 3.46 3.65 3.50 3.47 3.69 3.46 3.40 3.46 3.51 3.51 3.52

16 1710 11 12 13 14 15

15-Jul-2020

UUT Serial No.

28 29 7 8 9

Page 63: Reliability Report – 2SC3356 - Silicon Supplies

DDS-107-01-A

PN 2SC3356

TANDEX TEST LABS

POST SSL,+25C,SEQ 21

7/15/2020

DDS-107-01-A4

(All data taken 7/14-7/15/2020)

Symbol Conditions Min. Typ. Max.

S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x

S21E (dB) From VNA 7 9 -- 8.1 7.9 7.9 7.9 9.0 7.9 8.1 7.8 8.0

GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x

S21 (dB) From VNA -- -- -- 6.7 6.6 6.6 6.6 7.6 6.6 6.7 6.5 6.7

S11 (dB) From VNA -- -- -- -4.0 -4.1 -4.0 -4.0 -3.9 -4.0 -4.0 -4.0 -3.9

S12 (dB) From VNA -- -- -- -18.9 -19.4 -19.0 -18.9 -19.2 -18.8 -19.1 -18.9 -19.0

S22 (dB) From VNA -- -- -- -5.9 -5.7 -6.0 -6.0 -5.9 -6.0 -5.9 -5.7 -6.0

GA (dB)Calculated assuming ideal

input match-- 10 -- 10.2 10.1 10.1 10.1 11.2 10.1 10.2 10.1 10.2

fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x

1 S21 from VNA, 1 GHz (dB) -- -- -- 13.6 13.4 13.4 13.5 14.3 13.4 13.6 13.3 13.5

2 S21 from VNA, 2 GHz (dB) -- -- -- 8.1 7.9 7.9 7.9 9.0 7.9 8.1 7.8 8.0

3 S21 from VNA, 3 GHz (dB) -- -- -- 5.1 4.9 4.9 4.9 6.7 4.9 5.1 4.8 5.0

4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.6 3.5 3.6 4.1 3.6 3.7 3.5 3.6

5 S21 from VNA, 5 GHz (dB) -- -- -- 2.3 2.1 2.0 2.0 2.3 2.1 2.2 1.9 2.0

6 S21 from VNA, 6 GHz (dB) -- -- -- 1.5 1.0 0.7 0.9 1.5 1.0 1.0 0.8 0.8

fT (GHz) Extrapolated -- 7 -- 6.9 6.6 6.5 6.5 7.1 6.6 6.7 6.5 6.5

NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x

NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.44 2.46 2.45 2.46 2.45 2.45 2.54 2.44

NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.47 3.47 3.48 3.47 3.51 3.46 3.47 3.56 3.48

2723 24 25 26

15-Jul-2020

UUT Serial No.

18 19 21 22


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