Results of the SPS Beam Test @ CERNC. Irmler (HEPHY Vienna)
Micron Sensor
Beam Test Setup
Results
04/07/2008 C. Irmler 2
Type: DDD5used for D0 @
Fermilab
Size: 120 mm x 21 mm300 µm thickVdepl = max. 50 V Rpoly = 2.5 MΩ
p-side: 384 strips 50 µm pitchw/o intermediate
strip
n-side: 768 strips153.5 µm pitch
double metal layer 384 readout strips40.5 µm readout
pitch
Results of the SPS Beam Test @ CERN
Micron Sensor - Overview
n-side
p-side
small poly silicon resistors
04/07/2008 C. Irmler 3
Results of the SPS Beam Test @ CERN
Micron Sensor – CV CurveCV Curve - Micron DDD5
Vdepl = 24 V
0.0E+00
2.0E+17
4.0E+17
6.0E+17
8.0E+17
1.0E+18
1.2E+18
1.4E+18
1.6E+18
1.8E+18
2.0E+18
0 20 40 60 80 100V [V]
1/C
² [F
- ²]
Vdepl = 24 V (step before depletion, linear fit does not work)
04/07/2008 C. Irmler 4
Results of the SPS Beam Test @ CERN
Micron Sensor – IV Curve
IV Curve - Micron DDD5
0.0
1.0
2.0
3.0
4.0
5.0
6.0
0 20 40 60 80 100
V [V]
I [µ
A]
I [µA]
High Ibias
1.38 µA @ Vdepl
Slope increases above 60 V
04/07/2008 C. Irmler 5
Micron DDD5
Each side read out by three APV25 chips(384 channels)
Flex hybrids with integrated pitch adaptor
On n-side the hybrid is glued onto the sensor.
Results of the SPS Beam Test @ CERN
Micron Sensor Module
04/07/2008 C. Irmler 6
Beam setup: 120 GeV/c π+ / p / K+
(55.67% / 38.95% / 5.38%)
Readout: SVD3 readout system
see previous talk by M. Friedl
Installed Modules: JP module (2007)
2 x SVD3 DSSD (partially ganged) Micron module (new) UV module
UV striplet sensor (2005) Flex module (2006)
SVD3 DSSD (chip on sensor) EUDET telescope
Results of the SPS Beam Test @ CERN
Beam Test Setup
beam
Beam test was performed @ CERN together with the SiLC beam test of our semiconducter group see yesterday´s talk by T. Bergauer.
04/07/2008 C. Irmler 7
Results of the SPS Beam Test @ CERN
Analysis Chain
Pedestal subtraction Common mode correction 2D-clustering (space and time) Calculate cluster signal for each sample
Perform hit time reconstruction see previous talk by M. Friedl
Obtain timing, signal and noise
04/07/2008 C. Irmler 8
Upgrade Studies for the Belle Silicon Vertex Detector
Hit Time Reconstruction
0 50 100 150 200 250 300
0
5000
10000
15000
20000
25000
30000
S peak
tpeakMethod: Multiple samples arround the peak are recorded (6 samples at this beam test) . Cluster signal for each sample is calculated. Fit function is applied to each waveform to optain amplitude and timing. Reference waveform is taken from internal calibration of the APV25 chip. Already explained by M. Friedl
04/07/2008 C. Irmler 9
Results of the SPS Beam Test @ CERN
Beam Test Results (Preliminary)Micron JP single JP ganged UV Flex
p-side
n-side
p-side n-side p-side n-side p-side n-side p-side n-side
Average cluster width
1.67 1.13 2.31 1.92 2.10 1.76 2.21 1.88 2.28 1.91
Cluster SNR 12.6 15.1 12.7 13.9 8.5 10.5 23.6 24.0 13.8 18.4
Single SNR 16.3 16.0 19.3 19.2 12.3 13.9 35.1 32.8 20.9 25.4
Time resolution [ns]
3.89 3.04 3.49 2.74 5.24 4.30 2.55 1.16 3.50 1.90Definitions:
Cluster SNR := Cluster Signal / ( Strip Noise * sqrt (Cluster width) ) Single SNR := Cluster Signal / Strip Noise
Results: SNR of the Micron module is good and within the range of the other modules. Micron has lower cluster width (no intermediate strips). Effect of the 2nd metal layer on n-side is less than that of the long strips on p-side.
Poor SNR for JP module with ganged sensors chip on sensor (M. Friedl).
04/07/2008 C. Irmler 10
Results of the SPS Beam Test @ CERN
Micron Module - Signal Distribution
signal [e]0 10000 20000 30000 40000 50000 60000 70000 80000 90000
en
trie
s [
]
0
2000
4000
6000
8000
10000
12000
Micron_p_side (Micron) - Signal siC8Entr ies 118903Mean 2.07e+04RMS 1.068e+04
/ ndf c 809.7 / 5 7Width 10.3± 1350 MP 13± 1.547e+04 Area 349989± 1.183e+08
GSigma 19.7± 2175
Peak = 16345.7FWHM = 50.0%
Micron_p_side (Micron) - Signal
SNR [ ]0 10 20 30 40 50 60
en
trie
s [
]
0
2000
4000
6000
8000
10000
Micron_p_side (Micron) - SNR snr8Entries 118903Mean 17.47RMS 6.288
clw = 1 2 3+
Peak = 16.67FWHM = 50.5%
Micron_p_side (Micron) - SNR
signal [e]0 10000 20000 30000 40000 50000 60000 70000 80000 90000
en
trie
s [
]
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
Micron_n_side (Micron) - Signal siC32Entries 103393Mean 2.363e+04RMS 1.038e+04
/ ndf c 807 / 62
Width 12.4± 1415
MP 17± 1.838e+04 Area 328392± 1.041e+08 GSigma 23.5± 2796
Peak = 19504.1FWHM = 49.4%
Micron_n_side (Micron) - Signal
SNR []0 10 20 30 40 50 60
en
trie
s [
]
0
2000
4000
6000
8000
10000
Micron_n_side (Micron) - SNR snr32Entries 103393Mean 18.72RMS 7.664
clw = 1 2 3+
Peak = 16.29FWHM = 50.8%
Micron_n_side (Micron) - SNR
Signal has pretty Landau distribution; SNR depends on cluster width
04/07/2008 C. Irmler 11
Results of the SPS Beam Test @ CERN
Micron Module - Noise
strip []0 50 100 150 200 250 300 350
sigm
a [e
]
0
500
1000
1500
2000
2500
Micron_p_side (Micron) - Noise noC8Entries 384Mean 183RMS 112.1
Micron_p_side (Micron) - Noise
sigma [e]0 500 1000 1500 2000
ent
ries
[]
0
20
40
60
80
100
120
Micron_p_side (Micron) - Noise ndC8Entries 384Mean 1089RMS 201.9
/ ndf 2c 29.15 / 7Constant 8.5± 124.2 Mean 6.1± 1042 Sigma 4.4± 105.4
Noise = 1042.3
Micron_p_side (Micron) - Noise
strip []0 50 100 150 200 250 300 350
sigm
a [e
]
0
500
1000
1500
2000
2500
3000
Micron_n_side (Micron) - Noise noC32Entries 384Mean 164.1RMS 112
Micron_n_side (Micron) - Noise
sigma [e]0 500 1000 1500 2000 2500
ent
ries
[]
0
20
40
60
80
100
Micron_n_side (Micron) - Noise ndC32Entries 384Mean 1216RMS 204.3
/ ndf 2c 13.64 / 6Constant 7.8± 114.9 Mean 6.9± 1218 Sigma 5.0± 117.4
Noise = 1217.6
Micron_n_side (Micron) - Noise
Few noisy strips on both sides of the sensor.
04/07/2008 C. Irmler 12
Results of the SPS Beam Test @ CERN
Micron Module – Time Resolution (Preliminary)
p-side: 3.89 ns n-side: 3.04 ns
strongly depends on SNR
h_tdc_cal_diff_1_2_pyEntries 103393
Mean 0.1214
RMS 4.672
Underflow 722
Overflow 0
/ ndf 2c 1975 / 246
Constant 9.6± 2294
Mean 1.11e-02± 3.49e-09
Sigma 0.010± 3.488
tpeak_cal-tpeak_TDC [ns]-20 -10 0 10 20
0
500
1000
1500
2000
2500
h_tdc_cal_diff_1_2_pyEntries 103393
Mean 0.1214
RMS 4.672
Underflow 722
Overflow 0
/ ndf 2c 1975 / 246
Constant 9.6± 2294
Mean 1.11e-02± 3.49e-09
Sigma 0.010± 3.488
(cal. fit (spline) - TDC) vs. TDC
TDC error ~ 1.71 ns
Peak time precision vs. SNR
0
1
2
3
4
5
6
0 5 10 15 20 25 30
Cluster SNR
Trm
s[n
s]
Hamamatsu
Micron
04/07/2008 C. Irmler 13
Results of the SPS Beam Test @ CERN
Micron Module – Time Resolution vs. SNR
n-side
SNR10 20 30 40 50 60
RM
S r
es
idu
al [
ns]
0
1
2
3
4
5
6
7
8
9
10
Cal fit (spline) RMS residuals vs. SNR
04/07/2008 C. Irmler 14
Results of the SPS Beam Test @ CERN
Summary
Testbeam performed to evaluate Micron DDD5 sensor.
Minor deviations of CV and IV curve observed. Ibias above 1 µA
Few noisy strips detected.
SNR within the expected range. Time resolution corresponds to SNR. Noise contribution of the second metal layer is less than expected.
04/07/2008 C. Irmler 15
Results of the SPS Beam Test @ CERN
Thank you for your attention
04/07/2008 C. Irmler 16
Results of the SPS Beam Test @ CERN
BACKUP SLIDES
04/07/2008 C. Irmler 17
Results of the SPS Beam Test @ CERN
2D-Clustering
Search for neighbouring strips above threshold and mark them in a hit map.
Search continuous areas (clumps) and calculate outline.
2 Steps:
04/07/2008 C. Irmler 18
Results of the SPS Beam Test @ CERN
Occupancy-Reduktion – Principle
Schwellw ert
Schwellw ert
Schwellw ert
Schwellw ert
Zeit
Zeit
Zeit
Zeit
04/07/2008 C. Irmler 19
Results of the SPS Beam Test @ CERN
Multipeak Mode
Particle signal
04/07/2008 C. Irmler 20
Results of the SPS Beam Test @ CERN
Occupancy-Reduktion – Hit Time Reconstruction
Threshold
Threshold
Tim e over threshold ~ 2000ns (m easured)
Tim e over threshold ~ 160ns (measured)
Sensitive tim e window ~ 20ns
VA1TATp~800ns
APV25Tp~50ns
Pulse shapeprocessingRM S(tm ax)~3ns
Gain ~12.5
Gain ~8
Total gain ~100
04/07/2008 C. Irmler 21
Results of the SPS Beam Test @ CERN
APV25
preamp shaperAPSP
S/H
inverter
pipeline
MUX gain
128:1MUX
Differentialcurrent
output amp