ROUGH SURFACE REFLECTIONS

Gregory HartSteve Turley

BYU XUV

BYU XUV

Why do we care?• Astronomy

• He• Computers

• Photolithography• Microscopy

• imaging

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XUV 1-100 nm Low reflectance

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The Equations

=0=0

0

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Numerically

[𝐸0 ]=[ (12+𝑁

1) 𝑀 1

(− 12+𝑁 2) 𝑀 2][𝐾𝐽 ]

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Test

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Test

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Correlation

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Discussion The program works for simple cases Found single processor limits Random roughnesses have same overall

effect 2D surface Parallel processing

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Acknowledgement Steve Turley Jed Johnson Fulton Supercomputing Lab BYU Physics and Astronomy