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[1] FE-SEM Training Manual, Hitachi Scientific Instruments [2] http://www.microscopy.ethz.ch/lens.htm[3] JEOL: A Guide to Scanning Microscope Observation
and X-Ray Microanalysis”.
[4] Joseph Goldstein et al. “Scanning Electron Microscopy[5] JEOL 6700 SEM User Manual [6] http://www.cas.muohio.edu/~emfweb/EMTheory/OH_Index.html[7] http://www.gel.usherbrooke.ca/casino/What.html [8] http://emalwww.engin.umich.edu/courses/semlectures/semlec.html#anchor659909[9] 9 [10
David C. Joy. “Low Voltage Scanning Electron Microscopy”, Hitachi Instrument News, July 198] JEOL training documents
Characterization Facility, University of Minnesota-Twin Cities 10/01/2015