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Scanning tunneling microscopy (STM)Atomic force microscopy (AFM)Scanning electrochemical microscopy (SECM)
UV & visible spectroscopyTransmission experimentsSpecular reflectance & ellipsometryInternal reflection spectroelectrochemistrySecond harmonic spectroscopy
Vibrational spectroscopy: IR spectroscopy, Raman spectroscopyElectron & ion spectroscopyXPS, AES, LEED, HREELS, mass spectroscopyMagnetic resonance methods: ESR, NMRQuartz crystal microbalanceX-ray methods: XAS, XRD
BSpectroelectrochemistry (ch. 17)
EMIRS (electrochemically modulated infrared reflectance spectrosocpy)
Potential is modulated between one where the species of interest is absent & one where it is electrochemically generated
SNIFTIRS (subtractively normalized interfacial Fourier transform IRS)or PDIRS (potential difference IRS) or SPAIRS (single potential alteration)
Spectra obtained separately at two potentials → subtraction
SEIRA (surface enhanced IR absorption)
IR to study adsorbed species (reactants, intermediates, products)→ orientation & potential dependence of the adsorbed species
SNIFTIRS
Attenuated Total Reflectance Spectroscopy (ATR)
Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFT)
IR incidencesample
ZnSe or KRS-5 crystal
*Transmission measurement
*Reflection-Aborption infrared Spectroscopy (RAS)
*Photoacoustic Spectroscopy (PAS)
*Surface Electromagnetic Wave spectroscopy (SEW)
In-situ FT-IR spectroscopy
Raman spectroscopy: molecular vibrational information complementing IR spec.Raman in electrochemical system: signal enhancement- Resonance Raman spectroscopy (RRS)- Surface enhanced Raman spec. (SERS): molecules adsorbed on certain surfaces (Ag or Au)
In-situ Raman microscopy ( 탄소재 음극과 LiCoO2 양극재 분석 )
LiCoO2
graphite
acetylene black
Fresh anode
Brodd (2003)
25oC
60oC
Electron and ion spectrometryUltra high vacuum (UHV)
Excitation Detection
X-ray photoelectron spectroscopy (XPS) Photons(X-ray) ElectronsUV photoelectron spectroscopy (UPS) Photons (UV) ElectronsAuger electron spectroscopy (AES) Electrons ElectronsLow-energy electron diffraction (LEED) Electrons ElectronsHigh resolution e- E loss spec. (HREELS) Electrons ElectronsRutherford backscattering (RBS) H+ or He+ H+ or He+Secondary ion mass spec. (SIMS) Ions IonsLaser desorption mass spec. (LDMS) Photons Ions
X-ray methodsSynchrotron
X-ray absorption spectroscopy
Absorption edge (energy that is just needed to eject a particular core electron, e.g., 1s e-
(K edge), 2p3/2 e- (L3 edge)
Fe & Fe oxides K-edge: 7.112 keV
Within 10-40 eV: X-ray absorptionnear-edge structure (XANES) (or near-edgeabsorption fine structure (NEXAFS))→ oxidation state & ligand envirionment
About 50 keV: extended X-ray absorptionFine structure (EXAFS) → distance & arrangement of atoms