Scanning tunneling microscopy (STM)Atomic force microscopy (AFM)Scanning electrochemical microscopy (SECM)
UV & visible spectroscopyTransmission experimentsSpecular reflectance & ellipsometryInternal reflection spectroelectrochemistrySecond harmonic spectroscopy
Vibrational spectroscopy: IR spectroscopy, Raman spectroscopyElectron & ion spectroscopyXPS, AES, LEED, HREELS, mass spectroscopyMagnetic resonance methods: ESR, NMRQuartz crystal microbalanceX-ray methods: XAS, XRD
AScanning probe techniques. Spectroelectrochemistry (ch. 16/17)
Microscopy: optical → scanning electron or force → STM, AFMin situ vs. ex situ techniques
Scanning tunneling microsocpy (STM)
Scanning probe techniques (ch. 16)
Au(111) at 0.7 V vs. NHE in HCl
Electrochemical STM
STM images of HOPG
STM images of Pt(111) with I-adlattice in HClO4
STM images of Cu(111): effect of etching
Scanning tunneling spectroscopy (STS)
Atomic force microscopy (AFM)
Cantilever displacement vs. z-deflection for (left) attractive interaction and(right) repulsive interaction
AFM of Cu underpotential deposition (UPD) on Au(111)
Electrochemical AFM
Scanning electrochemical microscopy (SECM)
Principles of SECM
SECM appoach curves for steady-state currents
Imaging surface topography & reactivity
Ta oxide formation on Ta
Commercialized SECM
SECM applications
Ag line formation Electrochemical Cu etching
Spectroelectrochemistry (Ch. 17)
UV & visible spectroscopy1. Transmission experiments
Cell for transmission spectroelectrochemistry
Responses for transmission spectroelectrochemistry
Spectra of cobalt complex at different potentials
Detector
Power meterPotentiostat
Electrochemical cellor EC devices
He-Ne laser (633nm)
In-situ transmittance test
2. Specular reflectance and ellipsometry
Elliptic polarization arising from a phase shift between parallel & perpendicular components
Specular reflection spectroscopy
Electroreflectance spectra of Ag in NaClO4
Reflectance changes caused by halide adsorption on Au
Ellipsometer
Ellipsometry
Ellipsometric results for anodization of Al in tartaric acid
Growth of passive film on Fe at 0.8 V vs. SCE
Growth of polyaniline film: experiemental (dotted) vs. fiited resluts (solid)
3. Internal reflection spectroelectrochemistry
Transient absorbance
Surface plasmon resonance (SPR)
SPR curves for Au and monolayers
4. Photoacoustic and Photothermal Spectroscopy
5. Second harmonic spectroscopySecond harmonic generation (SHG)
