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son321 pulse2 handout · Getting even better signal quality and image ... background noise in the...

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THE CHALLENGE Getting even better signal quality and image resolution to detect the smallest defects in semiconductor packages and bonded wafers. THE SOLUTION Exclusive pulse2 pulser/receiver from Sonix with proprietary technology for all ECHO and AutoWafer systems. PULSER/RECEIVER
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Page 1: son321 pulse2 handout · Getting even better signal quality and image ... background noise in the signal path Generates clean, clear images even with ultra-high-frequency ... Signal-to-Noise

I N T R O D U C I N GI N T R O D U C I N G

T H E C H A L L E N G E

Getting even better signal quality and image resolution to detect the smallest defects in semiconductor packages and bonded wafers.

T H E S O L U T I O N

Exclusive pulse2™ pulser/receiver from Sonix™ with proprietary technology for all ECHO™ and AutoWafer™ systems.

PULSER/RECEIVER

Page 2: son321 pulse2 handout · Getting even better signal quality and image ... background noise in the signal path Generates clean, clear images even with ultra-high-frequency ... Signal-to-Noise

Y O U R PA R T N E R I N P R O D U C T I V I T YEvery day, you’re challenged to execute the most accurate inspection of bonded wafers and packaged semiconductors. Your success – and your customers’ success – depends on it.

Sonix has pioneered breakthrough solutions in image quality and process productivity, helping wafer and chip manufacturers literally transform the world. Our acoustic scanning microscopes perform nondestructive inspection of bonded wafers and packaged semiconductors, from the development lab to the production fl oor.

The proof is in new products like the pulse2™ pulser/receiver. And in our full line of products that promise and deliver proven uptime, speed and image quality. And in our collaborative problem-solving, proactive R&D and world-class service and support. Sonix, the ultrasonics leader.

THE pulse2™ PROOF +12 dB gain compared to standard pulser/receivers

4x improvement in signal-to-noise ratio (SNR)

Separates signals from low-level background noise in the signal path

Generates clean, clear images even with ultra-high-frequency transducers

Supports higher-frequency pulse echo and through-transmission (TT) images for improved resolution of features/defects

Optimizes scanning acoustic microscope (SAM) performance

Provides optimum image quality for all wafer and packaged semiconductor inspection applications

Sig

nal-t

o-N

ois

e R

atio

Im

pro

vem

ent

(nX

)

Gain (dB)

4.5

4

3.5

3

2.5

2

1.5

1

0.5

0 36 42 48 54

pulse2™ Delivers Improved Signal-to-Noise Ratio (SNR)

Excessive noise with standard pulser/receiver results in unusable substrate image of fl ip chip.

pulse2™ Resolves Features and Defects at a Substrate Level

Hidden features and defects of substrate revealed using pulse2™ pulser/receiver.

8700 Morrissette Drive | Springfi eld, VA 22152 | T. 703.440.0222 | F. 703.440.9512

L E A R N M O R E A T S O N I X . C O M O R C A L L 7 0 3 . 4 4 0 . 0 2 2 2 T O T A L K T O A N E X P E R T T O D A Y.


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