भारत सरकार अंत�रक �वभाग अंत�रक उपयोग क� �(इसरो) आंबावाड� �वसतार पप.ओ. अहमदाबाद – 380 015 (भारत) दूरभाषः +91-79-2691 3051/98 फै कस नं. : +91-79-2691 5835/02/48 Government of India Department of Space SPACE APPLICATIONS CENTRE (ISRO) Ambawadi Vistar P.O. Ahmedabad – 380 015 (INDIA) Telephone : +91-79 – 2691 3051/98 Fax No. : +91-79 – 2691 5835 / 02 /48 Email: [email protected]ईओआई सूचना सं. : सैक / ईओआई / 05 / 2015-16 EOI Notice No.: SAC / EOI / 05 / 2015-16 भारत के रा�पित के िलए और उनक� ओर से, व�र. �धान, �य एवं भंडार,अंत�रक उपयोग क� �, अहमदाबाद , िनमनिलल�त के िलए इचछक �व�ेता से अिभभिच क� अिभिय� (ईओआई) आमं��त करते ह �। For and on behalf of the President of India, Sr. Head, Purchase & Stores, Space Applications Centre, Ahmedabad invites Expression of Interest (EOI) from interested vendors for the following. संलक �ववरण Brief Description िनयत ितिथ (अपरा� 3 बजे तक) Due Date (Up to 3:00 pm) Establishment of Device Modeling Setup at SAC, Ahmedabad 29-02-2016 कृ पया अपने �वसतृत ��यछतर मोहरबंद िलफाफे म� िनयत ितिथ 29-02-2016 (15.00 Hrs. IST) तक या इससे पूवर अधोहसताकर� को भेज�। Please submit detailed response to the undersigned on or before due date 29-02-2016 (15.00 Hrs. IST) in sealed cover. व�र.�धान, �य एवं भंडार Sr. Head, Purchase & Stores
Transcript
भारत सरकार
अतं�रक �वभाग
अतं�रक उपयोग क� �(इसरो) आंबावाड� �वसतार पप.ओ.
अहमदाबाद – 380 015 (भारत)
दरूभाषः +91-79-2691 3051/98
फैकस नं. : +91-79-2691 5835/02/48
Government of India
Department of Space
SPACE APPLICATIONS CENTRE (ISRO) Ambawadi Vistar P.O.
ईओआई सूचना सं.: सैक / ईओआई / 05 / 2015-16 EOI Notice No.: SAC / EOI / 05 / 2015-16 भारत के रा�पित के िलए और उनक� ओर से, व�र. �धान, �य एवं भंडार,अतं�रक उपयोग क� �, अहमदाबाद , िनमनिलल�त के िलए इच छ् क �व�ेता से अिभभिच क� अिभिय�्
(ईओआई) आमं��त करते ह�। For and on behalf of the President of India, Sr. Head, Purchase & Stores, Space Applications Centre, Ahmedabad invites Expression of Interest (EOI) from interested
vendors for the following.
सलंक् �ववरण Brief Description
िनयत ितिथ (अपरा� 3 बजे तक) Due Date (Up to 3:00 pm)
Establishment of Device Modeling Setup at SAC, Ahmedabad 29-02-2016
IST) तक या इससे पूवर अधोहसताकर� को भेज�। Please submit detailed response to the undersigned on or before due date 29-02-2016 (15.00 Hrs. IST) in sealed cover.
व�र.�धान, �य एवं भंडार Sr. Head, Purchase & Stores
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Request for
EXPRESSION OF INTEREST For
Establishment of device modeling setup at SAC,Ahmedabad
SPACE APPLICATIONS CENTRE
INDIAN SPACE RESEARCH ORGANISATION
GOVERNMENT OF INDIA
AHMEDABAD - 380 015
INDIA
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CONTENTS
Sr. No.
Description Page No.
1. Introduction, Scope 3
2. Specifications: Overall requirement 4-5
3. Device modeling software specifications 5-7
4. Parametric analyzer specifications 7-9
5. Vector Network analyzer specifications 10-13
6. Device Modeling Setup Installation and Training 14-15
7. General guidelines to the vendor 15-16
8. Annexure-1 (Summit 9000 probe station details) 17-18
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Device characterization and modeling setup
Introduction: Space Applications Centre (SAC) is setting up Device characterization and modeling setup for developing models for in-house developed devices as well as devices made at outside foundries. Types of devices for which modeling is planned are GaAs HEMT, GaN HEMT and Graphene FET etc. Cascade Microtech’s Summit 9K Probe station is already available at SAC. Expression Of Interest (EOI) is invited from interested parties for establishing device modeling setup at SAC. The proposed tools shall be compatible for future upgrades of standard probe stations also. The setup shall be a turn key solution consisting of device modelling software, Parametric Analyzer, Vector Network Analyzer, integration hardware etc. to make the complete integrated setup. SAC reserves the right to create a list of competent vendors based on vendors’ response to this EOI and only these identified vendors shall be eligible to participate in the final RFP. Scope: The offered solution shall have capability of characterization and extraction of measurement based model parameters using proposed device model set-up. Vendor shall provide complete flow of device model parameter extraction. Both linear and non-linear models are to be covered under the scope. It should be possible to export the extracted models to the microwave design softwares like ADS or Microwave office (MWO) and should able to simulate the circuit using these models in order to complete the purpose. The vendor may be required to demonstrate complete system as a part of technical evaluation of offer within India (preferably on site i.e. at SAC,Ahmedabad).
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Specifications:
(1) Overall requirement
Sr. No. Specifications Compliance
Y /N
Exact
specification with
values
1.1
The entire setup for Device Modeling and Characterization should consist of
Device Modeling software and Instrumentation as given below.
Minimum setup configuration
(1) Device modelling software
(2) Parametric analyzer
(3) Vector network analyzer (10 MHz to 67GHz)
(4) Hardware and accessories for integration
1.2
During technical evaluation of the responses received against EOI, if required,
SAC may ask the vendor to give demonstration at SAC,Ahmedabad, of the
proposed models with all the options and accessories required to meet the tender
specifications, with the prior intimation of nominally thirty days. Demonstration
of instrument shall not be considered as final acceptance of the bid. Vendor to
bring all above instrument, software along with controller as per the compliance
to demonstrate the device Modelling flow, SAC will provide the devices, its
details and Probe station (Annexure-1).
1.3 It will be responsibility of the vendor to integrate the complete system setup at
SAC, Ahmedabad with existing Cascade Probe station (Annexure-1).
1.4 It will be responsibility of the vendor to demonstrate the complete modeling
flow using the software and instruments independently at SAC, Ahmedabad.
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(2) Device modeling software Specifications
1.5 The integrated setup should provide the capability for complete DC and RF
characterization, extraction and modeling of a semiconductor device like GaAs
or GaN HEMT.
1.6 Using extracted models it should be possible to do linear and non-linear
simulation for circuits like mixer, power amplifier etc. in microwave design
softwares like ADS or MWO.
1.7
Vendor needs to demonstrate the complete measurement and modeling flow
with this setup for the GaAs HEMT devices available with SAC. For which
SAC will provide device layout and actual devices only. Details of the device
and range over which models are to be developed is given below.
Device Type 130nm mHEMT
Frequency range DC to 65 GHz
Device gate bias range (Vg) -1 V to 0 V
Device drain bias range (Vd) 0 V to 3.5 V
Type of model Linear, non-linear, transient
Input RF Power range -60 dBm to +5 dBm
1.7
All accessories and components required to integrate parametric analyzer,
Vector network analyzer, Device modelling software with existing probe station
(Annexure-1) should be part of the proposal.
Sr. No. Specifications Compliance
Y /N
Exact
specification
with values
2.1 Device modeling software should be capable of extracting the device model
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parameters using measured DC and RF data through Parametric Analyzer and
Vector Network Analyzer respectively. It is preferable that all these
measurements should be made in single connection.
2.2
Modeling packages
Software should extract High frequency FET model parameters from a
combination of DC and S-parameter measurements. Software should able to
extract both linear and non-linear models.
Software should include high frequency FET and HEMT modeling packages.
Extraction for standard models like EEHEMT1, Angelov (or equivalent
suitable for GaAs and GaN HEMT) is required.
It should be possible to export the extracted models to commercial microwave
design softwares like ADS or Microwave office for simulation of circuits.
2.3
Design Environment
It should be possible to create and manage measurement and modeling related
projects using the software.
It should be possible to read and display data using window displays.
2.4
Scripting Language
Software should allow use of scripting language to develop new extraction
modules and modify existing extraction modules.
2.5
Data management
Device modeling software should allow import/export of data in formats like
.S2P, ASCII, .CSV etc.
2.6
Optimizers
For model fitting powerful optimization algorithms should be part of the
software.
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(3) Parametric analyzer (for DC characterization) specifications
Sr. No. Specifications Compliance
Y /N
Exact
specification
with values
3.1 Parametric Analyzer having capability of measuring/providing Gate current &
voltage and Drain current & voltage together. It is also preferred if in addition to
above it can measure/provide current & voltage for Source and Substrate
simultaneously for complete characterization of device. For above requirement
Optimizers should able to fit large numbers of model parameters using large
number of data sets.
2.7
Instrument connectivity
It should support DC and AC instrument drivers. It is preferable that software
supports CV, Time domain and Noise instrument drivers also. Using these
drivers software should able to control and automate the measurement
instruments required to characterize device or circuit.
2.8
Operating System
Device modeling software should support Windows 7 or higher version.
2.9
License Support
Vendor should provide perpetual license. Vendor to provide 3 year upgrade and
support for the software. Vendor should show his willingness for 2 year
extended support as optional.
2.10
Localized support
The EDA vendor shall offer strong regional support.
Technical support should be provided both remotely and locally.
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Medium Power Source Measurement Units, High Power Source Measurement Units
are to be provided with their specifications as mentioned below. Detailed
requirement for Pulse I/V unit and multi frequency capacitance measurement unit is
also mentioned below.
3.2 Medium Power Source
Measurement Units(2 Numbers)
Range
Resolution
Range up to 100 mA/100V(up to 2W Power)
Resolution of 10fA / 1uV or better
3.3 High Power Source Measurement
Units (2 Numbers)
Range
Resolution
Range up to 1A/200V (up to 20W Power)
Resolution of 10fA / 2uV or better
3.4 Ground Unit
Sink current
Output Voltage
> 4 A
0V ±100µV
3.5 Sweep Measurements User should able to sweep current/voltage
through software.
Source measurement units should support range
management feature that can prevent damage of
sensitive devices when making sweep
measurements.
3.6 Capacitance Measurement
It should be possible to perform measurements
like
Capacitance versus Voltage (up to ±100V),
Capacitance versus Frequency (range 1kHz to
5MHz or more),
Capacitance versus Time.
3.7 Pulse IV system
Source & Measure unit
Pulse IV system should able to generate and
measure pulse with following specifications.
Pulse Amplitude: up to ±40 V.
Pulse width: ≤ 5µs
3.8 Current versus Voltage (IV) and
Capacitance versus Voltage (CV)
Switching unit should able to switch between
Source Measurement Unit & Capacitance
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measurement switching
Measurement Unit, to do IV & CV
measurement without physically changing the
connection with the required accessories to
perform the measurements.
3.9 Application Libraries Application libraries for testing FET, HEMT
etc. are to be provided.
3.10 Operating System Should support Windows 7 or higher version
3.11 User Interface Options USB, LAN, GPIB interfaces.
USB keyboard & mouse.
12 inch or more display preferred.
3.12 Device Modeling software
support and integration with
Vector Network Analyzer
Hardware should support device modeling
software. It should be possible to integrate the
parametric analyzer with Vector Network
Analyzer which is used for the RF
measurement.
3.13 Adaptors & Accessories All standard cables, adaptors and other
necessary accessories which are required to
perform device modeling are to be provided.
3.14 Future upgradability It should be possible to upgrade for high
voltage (1KV or more), high current (30A or
more), options for existing set up.
3.15 Power supply 240V ± 10%, 50 Hz operation
3.16 Operating temperature range 20° C to 28° C
3.17 Warranty 3 years min. (5 years optional)
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(4) Vector Network Analyzer Specifications
Sr No Parameter Specification Compliance
Y /N
Exact
specification
with values
4.1 Frequency Range 10 MHz to 67GHz
4.2 Number of independent internal sources 1 min.
4.3 Number of test ports with internal bias tees 2 min.
4.4 Instrument test port connector type 1.85 mm coaxial
4.5 Test port impedance 50 ohms
4.6
Maximum Source Output Power (for all ports)
50 MHz to 20 GHz > +4 dBm
20 GHz to 50 GHz > 0 dBm
50 GHz to 67 GHz > 0 dBm
4.7 Frequency Reference Aging Rate ± 0.5 ppm/year or better
4.8 IF Bandwidth 1 Hz to 1 MHz (min.)
4.9 Directivity (over full band) ≥ 30 dB
4.10 Source and load match (over full band) ≥ 28 dB
4.11 Reflection and transmission tracking
(over full band) ≤ ± 0.2 dB
4.12
Transmission measurement accuracy
for +5 dB to -30 dB over,
50 MHz to 30 GHz Magnitude < 0.3 dB
Phase < 2 degrees
30 GHz to 67 GHz Magnitude < 0.3 dB
Phase < 2 degrees
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4.13 Dynamic Range beyond 100MHz ≥ 90 dB
4.14 Damage input power level ≥ +20 dBm
4.15 Sweep type Frequency: linear, segmented, CW; Power
4.16 No. of measurement points per trace ≥ 32,000
4.17 No. of channels ≥ 16
4.18 No. of traces in each channel ≥ 10
4.19
Calibration kits:
(1) E-cal kit with suitable interface cable One, for full band
(2) Mechanical Cal Kit w/o sliding load One set, for full band
4.26 Built in colour display 8” or larger (desirable)
4.27 Supply Voltage 230 V, 50 Hz (nom. op.)
4.28 Operating Temperature range 20° C to 28° C
4.29 Other required accessories
1. Spanner for fixing cables to VNA port,
one set
2. Compatible torque wrench sets for both
1.85 mm and 2.92 mm connectors
3. Compatible keyboard and mouse
4.30 Compatibility to Device modeling &
characterization applications
The above mentioned 67GHz VNA
configuration should be compatible to
semiconductor device measurement and
device modeling applications.
It should have seamless connectivity with
equipments like parametric analyzer and
industry standard device modeling software.
4.31 Upgradability of VNA to 110GHz Measurement
setup
The above mentioned 67GHz VNA
configuration should be upgradable to
millimeter wave frequency band (upto 110
GHz) in single sweep mode at user end.
Vendor to provide a list of accessories
and/or software options required for this
upgradation.
4.32 Warranty 3 years min. (5 years optional)
4.33 Optional Requirements
(1) Noise Figure Measurements
Fully corrected noise figure measurement
upto 50GHz.
(2) Gain compression test capability
Gain Compression measurements with
support of associated compression
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parameters like Input Power, Output Power
and Gain at Compression Point.
(3) Intermodulation distortion test capability
Inter-modulation spectrum (IMD)
measurements on amplifiers for entire
frequency range. Instrument should have
capability to generate & combine internally,
two calibrated and leveled tones for IMD
measurements.
(4) Internal source/generator attenuators for
each of the ports
Vendor should optionally give details for
step attenuators for each of the ports.
All necessary hardware options, test
accessories & application software required
for above measurements should be provided.
VNA configuration should be able to do all
measurements: S-parameters, noise figure,
IMD, gain compression in a single session
without disconnecting the DUT.
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(5) DEVICE MODELING SETUP INSTALLATION AND ON-SITE TRAINING 5 DEVICE MODELLING TRAINING Compliance
Y /N
Exact
specification with
values
5.1 Vendor should be able to provide specific training & extraction of device
modeling on the following device which will be provided by SAC.
Device : 130nm mHEMT (Ft= 150 GHz)
Model parameters for 130nm mHEMT are to be extracted over following range.
Frequency range: DC to 65 GHz
Device gate bias range (Vg): -1 V to 0 V
Device drain bias range (Vd): 0 V to 3.5 V
Type of model: Linear, non-linear, transient
Input RF Power range: -60 dBm to +5 dBm
5.2 SAC will provide above device layout and actual devices only. Vendor
should take measurements data as required by the modeling software using the established device modeling setup at SAC.
5.3 Extract EEHEMT model parameters for SAC’s device. The Model extracted should be directly usable in microwave design softwares like ADS or MWO.
5.4 Deliver the training using parameter extraction results and modeling
software for minimum 2 days at SAC which include;
Modeling training for measurement part
Modeling training for extraction part
Complete training material is to be provided to SAC by the vendor.
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5.5 Following should be the final deliverables to SAC: i. Extraction Report(should be available to SAC within 6 weeks after taking measurements) ii. EEHEMT (or equivalent suitable for GaAs HEMT) Model parameters (should be directly usable in ADS or MWO software) iii. EEHEMT Modeling Package. iv. 2-days of Onsite training should be provided to SAC covering: - EEHEMT model training for measurement part - EEHEMT model training for extraction part
GENERAL GUIDELINES TO THE VENDOR
The vendor is requested to acknowledge the receipt of this EOI and his willingness/ability to respond against this EOI.
The vendor is requested to examine the EOI thoroughly and offer compliance/non-compliance point by point. In case of
non-compliance, the deviation from the specified parameter shall be furnished and for complied parameters the vendor
specification (better or same) shall be provided. Vendors are also advised to give their comments with proper
justification if some parameter details are to be highlighted by the vendor.
Vendor should provide point by point compliance to the requirements along with reference to the corresponding page
number of the data sheet/product literature. Specifications for which no data is available in data sheet, vendor has to
provide certificate of compliance along with measurement results to satisfy the technical requirement.
Response to EOI should be supplied either directly by the manufacturer or their authorized Indian representatives
(authorization certificate to be enclosed).
Operation, programming, calibration and service manual must be provided with the instruments.
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Warranty and post warranty service should preferably be available in India.
Service and spares support should be available for minimum 10 years after satisfactory installation.
It will be the responsibility of supplier to provide all the essential accessories to make system fully functional.
Installation and training/demonstration at site for minimum three days should be provided for the setup including
software at free of cost.
Technical support for one year for complete system including device modeling flow.
The requirement is for only new equipment.
Vendor must submit block diagrams for the measurement test setup. The block diagram should clearly show all the
accessories/ options etc. needed for these measurements
