STAR Pixel DetectorLatch-up in Phase-1, SUZE and

Mimosa22

Tests and analysis by Michal Szelezniak

LBNL-IPHC 06/2009 - LG 2

Talk Outline

• LU & SEU testing goals.• SEU facility at BNL and test setup.• LU cross-section for sensors measured.• SEU.• Observations and comments

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Testing goals

LBNL-IPHC 06/2009 - LG

• Measure Latch-up cross-section in Phase-1 and SUZE.

• Measure Single Event Upsets in Phase-1• (Optional) Measure Latch-up and possible

Single Event Upsets in Mimosa-22

We scheduled testing time at the BNL Tandem SEU test facility to do latch-up testing on May 14-15, 2009

44

Facility at BNL and Test setup

LBNL-IPHC 06/2009 - LG

http://tvdg10.phy.bnl.gov/seutest.html

55

Facility at BNL and Test setup

LBNL-IPHC 06/2009 - LG

•LU test program is a VI in Labview running on the PC

•The VI uses the NI digital IO interface to count latch-up events and reset the power to the DUT.

•The RDO board provides a firmware based JTAG refresh looking for SEU errors.

Power SupplyLU detection

Power SupplyLU detection

DeviceUnderTest

NationalInstrumentsdigital I/O

RDO Board

PC

USB

USB

JTAG

DigitalPower

AnalogPower

LU detect / reset

LU detect / reset

66

Facility at BNL and Test setup

LBNL-IPHC 06/2009 - LG

Hardware used for the latch-up and SEU testing is the existing current RDO system

Mass termination board with 4 LU protected power supply daughter-cards. These cards will detect latch-up and remove supply power both in this latch-up test run and in the real Pixel detector system.

77

Latch-up measurements

Initial raw data sent to IPHC

LBNL-IPHC 06/2009 - LG

0-16 F-19Si-28

Cl-35

Ni-58Br-81

I-127Au-197

88

Latch-up measurements

Final (corrected)

LBNL-IPHC 06/2009 - LG

1.00E-10

1.00E-09

1.00E-08

1.00E-07

1.00E-06

1.00E-05

1.00E-04

1.00E-03

1.00E-02

1 10 100

LET (Si) (M eV cm2/mg)

Cro

ss

-se

cti

on

(c

m2

)

SUZE

Mimosa22

Phase1

MimoSTAR2(2006)

99

Latch-up measurements

Mimosa-22

LBNL-IPHC 06/2009 - LG

Mimosa22:

1.00E-10

1.00E-09

1.00E-08

1.00E-07

1.00E-06

1.00E-05

0 5 10 15 20

LET (Si) (MeV cm2/mg)

Lat

ch u

p c

ross

-sec

tio

n (

cm2)

upsets VDD

upsets VDA

total

1010

Latch-up measurements

Phase-1

LBNL-IPHC 06/2009 - LG

1E-10

1E-09

1E-08

1E-07

1E-06

1E-05

0.0001

0.001

0.01

0 5 10 15 20 25 30 35 40

LET (Si) (MeV cm2/mg)

latc

h u

p c

ross

-sec

tio

n (

cm2)

(corrected) VDD(corrected) VDAtotal

1111

Latch-up comments

• All latch-up detected in SUZE occurred on the VDD-FIFO supply line.

• The lowest cross-section values for Phase-1, SUZE, and M22 are calculated with a single registered latch up occurrence.

• The corrected LU cross-section plots have removed data that had latch-ups occurring at the reset frequency of the testing system.

LBNL-IPHC 06/2009 - LG

1212LBNL-IPHC 06/2009 - LG

SEU analysis (first look)Mimosa22

1.00E-10

1.00E-09

1.00E-08

1.00E-07

1.00E-06

1.00E-05

1.00E-04

0 2 4 6 8 10 12 14 16 18

LET (Si) (MeV cm2/mg)cr

oss

-sec

tio

n (

cm2)

soft errors

latch up

PRELIMINARY

First look at Phase-1 data shows similar results (single corrupted bits may be possible at LET values slightly lower than for the first latch up events)

Goals of SEU analysis

• Measure onset of errors (first look at the collected data shows that it is in the LET range for latch up events)

• Check for the likelihood of corruptions 01 and 10

• Check if bit corruptions are equally likely in different registers and at different positions in registers

No errors and no latch up

More result to come…

1313

Observations and comments

All 3 prototypes are more susceptible to latch up than Mimostar-2. SUZE is more susceptible to latch up by a factor of ~5. In general, we are not expecting to see these levels of LET during normal running conditions at STAR. Possible exceptions would be unusual events such as beam dumps and during beam injection.

We will complete the SEU analysis and report.

LBNL-IPHC 06/2009 - LG

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end

LBNL-IPHC 06/2009 - LG