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Statistical Analysis of an Infrared Thermography Inspection of Reinforced Carbon-Carbon Each piece of flight hardware being used on the shuttle must be analyzed and pass NASA requirements before the shuttle is ready for launch. One tool used to detect cracks that lie within flight hardware is Infrared Flash Thermography. This is a non-destructive testing technique which uses an intense flash of light to heat up the surface of a material after which an Infrared camera is used to record the cooling of the material. Since cracks within the material obstruct the natural heat flow through the material, they are visible when viewing the data from the Infrared camera. We used Ecotherm, a software program, to collect data pertaining to the delaminations and analyzed the data using Ecotherm and University of Dayton Log Logistic Probability of Detection (POD) Software. The goal was to reproduce the statistical analysis produced by the University of Dayton software, by using scatter plots, log transforms, and residuals to test the assumption of normality for the residuals. https://ntrs.nasa.gov/search.jsp?R=20110014356 2018-07-01T17:19:19+00:00Z
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Statistical Analysis of an Infrared Thermography Inspection of Reinforced Carbon-Carbon Each piece of flight hardware being used on the shuttle must be analyzed and pass NASA requirements before the shuttle is ready for launch. One tool used to detect cracks that lie within flight hardware is Infrared Flash Thermography. This is a non-destructive testing technique which uses an intense flash of light to heat up the surface of a material after which an Infrared camera is used to record the cooling of the material. Since cracks within the material obstruct the natural heat flow through the material, they are visible when viewing the data from the Infrared camera. We used Ecotherm, a software program, to collect data pertaining to the delaminations and analyzed the data using Ecotherm and University of Dayton Log Logistic Probability of Detection (POD) Software. The goal was to reproduce the statistical analysis produced by the University of Dayton software, by using scatter plots, log transforms, and residuals to test the assumption of normality for the residuals.

https://ntrs.nasa.gov/search.jsp?R=20110014356 2018-07-01T17:19:19+00:00Z

Statistical Analysis of an Infrared Thermography Inspection on

Reinforced Carbon Carbon (RCC)

K. Comeaux, 2011 1 MathFest

By Kayla Comeaux

• Background• Project

– Objectives– Â vs. A analysis– Residuals– Test of Normality of Residuals

• Summary– Strengths/Weaknesses– Future work– Acknowledgments

Agenda

K. Comeaux, 2011 2 MathFest

Background: Infrared Thermography Scan

• Reinforced Carbon Carbon (RCC) is the composite material that makes up the nose cone of the shuttle

• Infrared (IR) Thermography is a non-destructive test used to detect cracks beneath the surface of materials– Two flash bulbs produce a 26 KJ Flash of

energy heats up top surface– The heat flow through material is

disrupted by defects – Infrared Camera is used to measure the

cooling of the material. In the Infrared images, defects appear as hot spots on the composite

K. Comeaux, 2011 3 MathFest

0

0.1

0.2

0.3

0.4

0.5

00.

55 1.1

1.65 2.

22.

75 3.3

3.85 4.

44.

95 5.5

Nor

mal

ized

Con

tras

t

Time (s)

Normalized Contrast: Defect A1

• Run IR Scan• Use Ecotherm to analyze

data

• Normalized contrast:

(Ti-Ti0) – (Tr-Tr0

)(Ti-Ti0

) + (Tr-Tr0)

• Find peak normalized contrast (Â) for each crack of size A.

Background: Normalized Contrast of IR Thermography Scan

Peak Contrast

K. Comeaux, 2011 4 MathFest

• Recreate the University of Dayton software output– Â vs. A Analysis

– Residuals of  vs. A Analysis

• Test the assumption of normality of residuals– Histogram

– Normal Probability Plot

Project Objectives

K. Comeaux, 2011 5 MathFest

• Scatter Plot

 vs. A Analysis

K. Comeaux, 2011 6 MathFest

• Log-Log Transform

Software Output:

• Ln(Â) = 1.5432 Ln(A) +2.3195

• e Ln(Â) = e 1.5432 Ln(A) +2.3195

• Â = 10.170588 A1.5432

• Residual of A = ln(Â) – (1.5432ln(A)+2.3195)

Residuals

K. Comeaux, 2011 7 MathFest

Software output:Created Residual Plot:

-1.2-1

-0.8-0.6-0.4-0.2

00.20.40.60.8

0 2 4 6 8 10 12 14

Res

idua

l in

coun

ts

Flaw size (A) in mils

Residual

• Histogram– Skewed Left

– Mean: - 0.00008569

– Standard Deviation:

0. 3086

Test of Normality of  vs. A Residuals

K. Comeaux, 2011 8 MathFest

• Normal Probability Plot

Test of Normality of  vs. A Residuals

K. Comeaux, 2011 9 MathFest

• The graphical output of the software is accurate.

• The assumption of normality of residuals is correct. – However more data will make the residuals either

more normal or less normal.

Conclusions

K. Comeaux, 2011 10 MathFest

• Statistically analyze the assumptions of the University of Dayton Software as the thresholds of the IR thermography scan are changed.

Future Work

K. Comeaux, 2011 11 MathFest

Acknowledgements

• Mentors: Ajay Koshti & David Stanley

• Dr. Shelton

• Pi Mu Epsilon

• NASA MUST Program

K. Comeaux, 2011 12 MathFest

Exit Presentation: Infrared Thermography on Graphite/Epoxy

Thank You

K. Comeaux, 2011 13 MathFest


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