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Electronics Workshop Geneva, 04February2003
Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Status and Plans
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003
Beetle: Block Schematics (I)
notCompOut
Vfs
Isha Ibuf
Vd
Write
Read
1of187cells
Reset
D Q
FETestOut PipeampTestOut
Dummychannel
1of128channels
Polarity
buffer
pipeline
pipelinereadout-amplifier
currentbuffer
InAnalog
Vfp
shaperpreamplifier
comparator
1of16channels
Or LVDS@80MHzMux
CompOut
I2CInterfaceControl
Pipeline
Bias-GeneratorBackend
Ipre
Isf
Itp
GeneratorTestpulse
multiplexer4x(32to1)
Reset
Vdcl notOut[3:0]
Out[3:0]
Icurrbuf
IvoltbufIpipe
CompClk
InputTest
FrontendBias-Generator
Testchannel
Vrc
128 input channelsCSA/Shaper with25ns peaking time40 MHz sampling(LHC clock)128 discriminators withswitchable polarityanalogue memory for160 sampling stepsbuffer for 16 triggered events4 s max. latency900ns/event readout speed
internal DACs for bias settingstest pulse injector withadjustable amplitudesetup/slow control viaI C interface
µ
2
Features:ll
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Electronics Workshop
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003
Beetle: Block Schematics (II)
Pipeline/Readout
ControlLogicI2C
BackendBias
Generator
Interface
Bias GeneratorFrontend
AnaloguePipeline
ProbePads
PadsMonitor
LVDSComparatorOutputPads
LVDSComparatorOutputPads PadsProbe
analogue signalsanalogueencodedbinarysignalsdigital signals (CMOS / LVDS)
Electronics Workshop
0
500
1000
1500
2000
2500
0 5 10 15 20 25 30 35 40
Beetle 1.2
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003Electronics Workshop
Beetle: Pulse Shape & Noise
-25 0 25 50 75 100 125 150[ns]
-10
-5
0
5
10
15
20
25
30
35
40
3 p F13pF26pF36pF51pF
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003
Statemachines
Static registers
Beetle: Radiation Hardness
Dsel
CK
Q
CKsel
F
D
Electronics Workshop
TID Effects SEU Protection
-50%
-40%
-30%
-20%
-10%
0%0 100 200 300 400 500
IDC [nA]
0Mrad
10Mrad
30Mrad
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003
Beetle: Readout Modes
CO[0]
CO[1]
C1 C0
C3 C2
C1 C0
C3 C2
C1 C0 C1 C0
C3 C2 C3 C2 C3 C2 C3 C2
C1 C0 C0C1
VeLo/ST
RICH
Lab
Bit Description
I0 Start Bit: Always 1I1 (even) parity of pipeline column number (PCN)I2 ActiveEDC: indicates active error correction logic
(EDC)I3 parity of CompChTh registerI4 parity of CompMask register
I5 parity of TPSelect registerI6-I7 2 LSB of SEUcounter registerP0-P7 Pipeline column number (PCN)
I0 I1 I2 I3 I4 I5 I6 I7 P2P7 P6 P5 P4 P3 P1 P0 0 1 126 127125
0 1 29 30 31I4I0 P0P1
I6
I1
I2
I3 I7
I5
P5
P7 P6
P4
P2P3 32 33
64
96 97 127126
65
125
61 62 63
959493
AO[0]
AO[1]
AO[2]
AO[3]
AO[0]
AO[2]
AO[0]
I0 I1
I2 I3
I4 I5
I6 I7
P1 P3 P0 P2
P5 P7 P4 P6 64 96 65 97
31 63
126 95 127
6230
94
0 32 331
Comparator(Veto counters, prompt binary readout)
Electronics Workshop
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003Electronics Workshop
Beetle: Readoout Timing
0
100
200
300
400
500
1,5 2 2,5 3
Vdd [V]
0
100
200
300
400
500
I [mA]
Vout [mV]
Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Geneva, 04February2003Electronics Workshop
Overvoltage Problem
Irreversible gain reduction by 20% going from 2.6V to 2.7VOutput driver with probable reasons:excessive current density (1 node in output driver)external short (Receiver stage, hint from Zurich group)
IBM recommends Burn-In @ 3.3V:
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Sticky Charge EffectGeneva, 04February2003Electronics Workshop
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Ulrich TrunkASIC-Labor Heidelberg, PhysikalischesInstitut der Universität Heidelberg
Modifications for Beetle 1.3
Different connectivity for FE power pads5V compliant IFix of “sticky charge” problem
Improved comparator=> ~100 m length increaseµ
lll
l
2C interface
Fix of overvoltage problem
Beetle 1.3 submission: Q2/2003Beetle 1.3 production start: Q4/2003
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Geneva, 04February2003Electronics Workshop
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Pad Beetle12 Beetle13--------------------------------------------Testpulse 2 5Vdd 1,3,4,5 2,3Gnd - 0,1,4
Vdd - 134,135Gnd 134-137 136,137
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