VG 1 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Synchrotron studies of carrier physics in a CZT ring detector
R. den Hartog, A. Owens,European Space Agency, ESTEC / SCI-PAT, Noordwijk, The Netherlands
A.G. Kozorezov, J.K. WigmoreDepartment of Physics, Lancaster University, United Kingdom
V. Gostilo, V. KondratjevBruker Baltic, Riga, Latvia
A. Webb, E. WelterHASYLAB at DESY, Hamburg, Germany
LANCASTERU N I V E R S I T YDepartment of Physics
VG 2 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Ring detectorby Apotovsky et al. for Digirad, 1997
5 mm
1 mm
Vcathode
small anode: low capacitive noise
max. ΔV tested: ~150 VVGR « Vcat : drift modeVcat « VGR : hemispherical mode
X-rays
VG 3 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
PerformanceInteresting features:• Low noise, no hole collection
• Wide dynamic range from at least6 to 662 keV
• Excellent energy resolutionup to 0.73% FWHM at 662 keV
• Charge collection adaptable to detector shape and material
VG 4 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Synchrotron characterization
HASYLAB X-1 synchrotron beamline at DESY, Hamburg:
• 10.5 − 100 keV monochromatic light
• MOSTAT intensity stabilizer
• ΔE < 1 eV at 10 keV
• ΔE < 20 eV at 100 keV
• Beamsize < 50 x 50 μm2
Spatial response strongly non-uniform
VG 5 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Model for charge transporta. Solve electrostatic problem:
Dirichlet problem for electrostatic potential Φ(r,L) in cylindrical coordinates- renormalize to Vcat = 0, so that potential differences are limited to top surface- potential only specified on surface electrodes, not in between
b. Integrate electron and hole trajectories in potential, until top or bottom surface is reached
c. Electrons are detected once they traverse near field of anode
[ ]∫∫ −+=Φ⇒
⎪⎪⎩
⎪⎪⎨
⎧
≥
≤≤≤≤
≤
===Φ
==Φ
=∂Φ∂
+∂
Φ∂+
∂Φ∂
∞ GRr
GRGR
GRGR
R
R
aanode
VxVtxxJdxtrJtzttdtzVzr
rrVrrrVrrrV
rrV
rVLzr
zrrrrz
00
00
22212
12111
2
2
2
2
)()()(sinhsinh),(
::::
)(),(
0)0,(
01
Owens et al., JAP 102 (2007)
Kozorezov et al., IEEE NSS/MIC 2007
VG 6 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Model for charge transporthemispherical mode
drift mode
dead zone
detected
undetected
undetected
electrons
holes
detection only in near field
VG 7 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Model vs synchrotron scans
Vcat=−46.2 V Vcat=−89 V Vcat=−100 V Vcat=−119 V
Model provides at least a qualitative explanation for complex patterns in drift mode
nice !
E = 20 keV
VG 8 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Model correctly predicts:• widening of central spot with E• widening of ring with E• shrinking of ring at highest E• absense of central response at lowest E(near field of anode not shown)
Model vs synchrotron scans
Vcat=−100 V
Extent and width of ring structure not fully explained
10 keVλ = 14 μm
20 keVλ = 84 μm
50 keVλ = 164 μm
100 keVλ = 1.05 mm
VG 9 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Collection of e- seems to take place across R1: • ring sizes are confirmed by bondwire shadows• anode near field extends out to first ring• extension into first ring conflicts with data for
Vcat= −119 V
Bond wires
0.5 mm Ø
ring structure to scale
50 μm Ø beam0.1 mm step size
ra = 0.24 μmra = 0.14 μm
V cat
= −1
00 V
V cat
= −1
19 V
Model vs synchrotron scans
VG 10 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Advantage of monochromatic light
E = 10 keV E = 20 keV E = 50 keV E = 100 keV
low detection threshold
high detection threshold
Secondary ring + sausage feature show up above low rejection threshold:• ring forbidden by topology of field lines in cylindrical model• sausage breaks cylindrical symmetry → causes ring feature?
VG 11 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Differential spectrometry
Te inclusions identified in CZT sample using IR microscopy by Bolotnikov et al. IEEE NSS/MIC 2007
Dislocation
Dislocation
Sub-grain boundary
Bolotnikov et al. (2007):• Te inclusions found along grain boundary and dislocations• no effect on charge transport for Te inclusions ≤ 3 μm and
densities ≤ 3x105 cm−3, i.e. fractional enhancement of 3.4x10−5
Hypothesis:• features due to Te inclusions along grain boundary• Te density enhancement affects charge transport
Is Te excess density at level where it can be detected by cross-edge differential spectrometry?
VG 12 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Differential spectrometryMethod:• 8 scans, at two E on either side of Cd and Te edge
(resp. 26710 and 31814 eV)• Use ratios rmeas(E) = ( ∑A-∑B) / ∑C to avoid normalization
and systematic effects• Make a simultaneous fit with a model with 4 parm.:
x1 : depth under surface of featurex2 : bottom of featureδ : enhancement of Te fraction over 45%η : differential detection efficiency for photons landing
in A or B, compared to photons landing in C
AC
B
x1
x2
Cd0.45Zn0.1Te0.45 → λ0(E)
Cd0.45-δ Zn0.1Te0.45+δ → λ1(E,δ)
⎥⎦
⎤⎢⎣
⎡⎟⎟⎠
⎞⎜⎜⎝
⎛ −−−⎟⎟
⎠
⎞⎜⎜⎝
⎛−=
),(exp1
)(exp)(
1
12
0
1
δλλη
Exx
ExErfit
VG 13 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Differential spectrometry
# free parms.: x1 [μm] x2 [μm] η δ χ2
3 43.1 86.4 0.743 = 0.0 10754 45.1 83.2 0.779 0.0011 262
• Fit with Te enhancement better than without, while other parms are consistent• Fitted enhancement level ~30x higher than levels found by Bolotnikov et al.• Method appears at least sensitive to Te enhancements at 0.1% level
VG 14 - 5th NDIP conference - Aix-les-Bains - 15 − 20 June 2008 - Roland den Hartog
Conclusions• Application of synchrotron radiation to detector characterisation
extends well beyond FWHM measurements
• High-resolution surface scans appear a powerful tool for charge transport diagnostics, in particular in combination with model
• Cross-edge differential spectrometry is capable of in-situ characterization of defects in detector: 3-D shape, composition 0.1% enhancement of Te demonstrated
• Next steps:Application to TlBr, optimization for effective volumeSimulation of line shapes, optimization of resolution