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INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
TC65: Industrial-process measurement, control and automation
Liaison Report from
IEC TC 65 to IEC SC 3D
(IEC 61360 DB)
Udo Doebrich
Prague on 6th of October 2008
3(Prague/TC65)2
2
TC65: Important Technical Areas
Electrical and Functional Safety
Security in Automation
Digital Product Data in Automation
Manufacturing Execution System
Communications
Device Integration Standardized Applications
Process oriented harmonization of standards
3
IEC TC65 in Figures
IEC TC 65 work is supported by 40 member countries with active participation of 25 countries in 30 working groups organized in 4 subcommittees with more than 300 Experts on 400 seats
4
Organization of IEC TC65
177
103 196
82
40
Total: 400 seats
/D. FANTONI(IT)
WG 7: Function Block + EDDLConvenor : C . DIEDRICH ( DE )
JWG 10 : Industrial CablingConvenor : F . RUSSO ( IT )
WG 11: Real Time EthernetConvenor : L . WINKEL ( DE )
WG 12 : FS for FieldbusConvenor : V . DEMASSIEUX (FR )
WG 13 : Cyber SecurityConvenor : T . PHINNEY ( US )
MT 9: Fieldbus MaintenanceConvenor : L WINKEL (DE )
SC 65 C
INDUSTRIAL NETWORKS
Chairman : T . CAPEL (CA )
Secretary : B . DUMORTIER ( FR )
SC 65 B
DEVICES & PROCESS ANALYSIS
Chairman : W . HARTMANN (DE )
Secretary : E . BEATTIE ( US )
Assist . Sec :J . HARMAN (US )
WG 1: Classification & Doc .Convenor : JP . HERZOG ( DE )
WG 2: Prod . Prop . & Class .Convenor : P . ZGORZELSKI ( DE )
SC 65 A
SYSTEM ASPECTS
Chairman : J . DUFFY (US )
Secretary : N . BRADFIELD (GB )
SC 65 EDEVICE AND
INTEGRATION IN ENTERPRISE SYSTEMS
Chairman : C . VERNEY (FR )
Secretary : L. NEITZEL (US )
TC 65INDUSTRIAL PROCESS MEASUREMENT , CONTROL AND
AUTOMATION
Chairman : R . HEIDEL (DE ) Secretary : B . DUMORTIER (FR )
WG 1: Terms & DefinitionsConvenor : W . CRAEMER ( DE )
WG 15 : Function BlockConvenor : J . CHRISTENSEN ( US )
WG 10 : Net . & Syst . SecurityConvenor : T . PHINNEY ( US )
WG 3: CommissioningConvenor : R . W . PETERS ( DE )
JWG 6 : Device Profile .Convenor : HP . OTTO ( DE )
WG 14 : Analyzing EquipmentConvenor : J . TATERA ( US )
JWG 5 : Enterprise Control SIConvenor : D . BRANDL ( US )
ADVISORY GROUP CHAIRMEN , SECRETARIES
IEC Officer : M . COCIMAROVTech ; Advisor : T . PHINNEY
WG 15 : High AvailabilityConvenor : G . HÖRCHER ( DE )
WG 4: E .M .C RequirementsConvenor : B . JAEKEL ( DE )
WG 14 : Funtional Safety GuideConvenor : R . BELL (GB )
MT 61511 FS for Process Ind .Convenor : V . MAGGIOLI (US )
MT 61512 Batch ControlConvenor : L . CRAIG (US )
MT 61508 -1 / 2 (except part 3 )Convenor : R . BELL (GB )
MT 61508 -TG CommunicationConvenor : S . BROWN (GB )
MT 61508 -3 (software )Convenor : E . FERGUS (GB )
WG 5 : Temperature Sensor .Convenor : E . TEGELER ( DE )
WG 6 : Testing & EvaluationConvenor : D . HIORNS (GB )
WG 7 : P. L . C .Convenor : J . KRETSCHMANN ( US )
WG 9 : Final Control ElementsConvenor : T . GEORGE (US )
WG 12 : P& I P & ID PCE -CAEConvenor : G . MAYR (DE )
WG 4: Field Device ToolsConvenor : C . DIEDRICH ( DE )
WG 8 : OPC - UAConvenor : HP . OTTO (DE )
2008 -
04
-30 – B . Dumortier72 seats
87 seats89 seats
112 seats
40 seats
5
Status of Work regarding Product Data after the Tokyo Meeting 2008
Model and Workflow for Engineering Process in IEC SC 65E WG2 - document IEC 61987-10 is approved CDV
First part of Automation Sensors in IEC 65E WG2 - document IEC 61987-11 CD
Work in preparation for Automation Actuators - common work between IEC SC65B and IEC 65E WG2
Work in preparation for Low Voltage Switches in IEC SC 17B
6
IEC TC 65 Resolution Summary –Tokyo, 12/23 of May 2008 (part 1)
7
IEC TC 65 Resolution Summary –Tokyo, 12/23 of May 2008 (part 2)
8
IEC TC 65 Resolution Summary –Tokyo, 12/23 of May 2008 (part 3)
9
Meeting between ISO TC 184 and IEC TC 65
Paris, 7th to 8th of July 2008
List of Discussion topics agreed Persons for the discussions decided
Discussions are in progress
10
Status: Requirements from IEC 65E WG2 to IEC SC 3D (1)
1) Group of properties
2) Cardinality
3) Polymorphism (Multiplication and Selection)
4) More than one unit per name
5) Unit list
6) Mass input
7) Quality check
8) Mass output
9) Language variants
Specification IEC 61360-1/2
IT-Databaseimplementation
issue of
V
In work in ISO
under test
V
V
V
??
?
?
?partly
Partly, Compiler
partly
V
11
Status: Requirements from IEC 65E WG2 to IEC SC 3D (2)
10) Procedural Questions
11) ISO DB Content vs. IEC DB Content
12) IPR/ License issues
13) Consortia's input
14) Information Back Flow
15) Business Model
open
In work - Draft
open
not
Under discussion
IEC IT and
Central Office
?
12
1. CO-Meeting in Geneva (16th and 17th of April 2008) IT-Infrastructure IEC 61360 Data Base
Attendances IEC TC 65 Heidel
IEC SC 65 E WG2 Ondratcek
IEC TC 65/ SC 3D liaison Döbrich
IEC SC 3D Nerke (Sec)
IEC SC 3D Murayama (Chair)
IEC CO Maislisch (IT)
IEC CO Sheldon
13
Results
Milestone 1: June 2008 / 1.Specification
Milestone 2: Deliverable of the first Result
First detail Specification Conceptual data model
User interface
Specification of pdf output for SC65E content
Basic maintenance facilities
Basic quality control information
and roadmap for further milestones
14
Attendances
IEC SC 65 E WG2 Zgorzelski
IEC SC 3D Nerke (Sec)
IEC SC 3D Murayama (Chair)
IEC CO Maislisch (IT)
2. CO-Meeting in Frankfurt (11/12th of June 2008) IT-Infrastructure IEC 61360 Data Base
15
Attendances
IEC TC 65/ SC 3D liaison Döbrich
IEC SC 3D Nerke (Sec)
IEC SC 3D Murayama (Chair)
IEC CO Maislisch (IT)
IEC CO IT Bobb
3. CO-Meeting in Geneva (16th and 17th of September 2008) IT-Infrastructure IEC 61360 Data Base
16
Agreement for Standardization of Product Properties – IEC TC 65 Ottawa Decision 2003)
IEC 61360/ ISO 13584IEC 61360/ ISO 13584
Draft IEC/ISO Guideline Draft IEC/ISO Guideline
IEC TC 3/ ISO 184
IEC/ISO JWG 1
IEC TC65
Co
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Sta
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Bra
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Technical Domain 1„Industrial Automation Devices and
Systems“IE
C S
C65
A
IEC
SC
65 B
IEC
SC
65 C
IEC
SC
17B
IEC
SC
22G
IEC
/ IS
O
Tec
hn
ical
Do
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Po
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P
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Sensors, Actuators, PLC, etc
Low Voltage Switch
Drives
IEC TC ?
IEC
SC
65 E
17
Global Product Data Standardization(Example)
Bauclass
PROLIST
ETIM
IEC 61360 (IEC 3D)
IEC 65E WG2
eCl@ss
DIN
ISO 184 SC4
ISAJEMIMA
USPIUS China Franc
e Austria
BMEcat
Europe
Product Data Global
Standardization
DINStandards
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
THANK YOU!