R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

The Latchup Monitor System

Raffaello Secondo

1. The Latchup and Single Event Latchup (SEL)

2. The SEL test and Latchup Monitor system: State of the Art

3. Description of the project

Contents

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

1– The Single Event Latchup (SEL) and Latchup

A Single Event Latchup is a type of short circuit , more specifically it is the inadvertent creation of a low-impedance path between the power supply rails of a CMOS structure caused by the impact of ionized particles

A power cycle is required to correct this situation.

Other Latchup reasons on CMOS chips and/or devices:

A spike of positive or negative voltage on an input or output pin of a digital chip

Short circuit on

the power supply

Anti-latchup protection

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

2–The SEL test and Latchup Monitor system: State of The Art

Multiple devices under test usually 20-30 chips to test

simultaneously

230 MeV Proton beam facility PIF at PSI used for SEL radiation tests

Multiple devices are irradiated at the same time to increase the number of occurrences

Each devices must be supplied with an efficient anti-latchup power supply

The current waveform study after the anti-latchup intervention can help to understand the phenomenon

I(Load)

Time

LATCHUP

DETECTED

DEVICE IS

SHUT DOWN

BEHAVIOR WITHOUT

ANTI-LATCHUP

Keen Anti-Latchup Protection

Latchup Current fast acquisition

The SEL radiation tests aim at evaluating the Latchup cross section of a component off the shelf (COTS)

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

2–The SEL test and Latchup Monitor system: State of The Art

Power Supply for the Latchup protection chassis

Power Supply for the DUTs

Latchup protection chassis

BNC harness for current acquisition (DAQ sampling period is about 10s)

PXI for driving DAQ, power supplies and temperature acquisition

Temperature patch panel

Data acquisition system

Not compact and modular Problems of noise, space and transportability

A LatchUp Monitor based on commercial instrumentation:

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

3. Description of the project: The LatMon PXI card

Requirements: 0 to 15V & -15 to 0 – 3A Isolated power

outputs

16-bit voltage and current programming

16-bit 2MS/s current reading

Temperature monitoring of the DUT

Current protection trigger based on current threshold and current profile

Output disabling upon current protection triggering

Real time current consumption recording upon current protection triggering

PXI format

Hardware architecture

FPGA architecture

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

3. Description of the project

The Babele`s tower

Our LatMon system:

• Compact

• Modular (up to 34 output channels)

The state of the art

The future

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

3. Description of the project: The LabView Software developed

Management Software In LabView

An example of latchup acquisition

Latchup profiles programming

R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014

4– Follow up on the LatMON Project

- LATCHUP MONITORING:- COMPACT AND MODULAR

- ENABLES SETTING OF A CURRENT PROFILE

- RADIATION TESTS AT CHARM IN 2015.

Schedule:

- Production of a pre-series of 5 cards to test the driver on a full system

- Test of a complete system based on 17 PXI cards.