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Thermal Analysis of anIcy IC
Shiree BurtCryogenic Electronics Group
San Francisco State UniversityPresented October 2, 2006Revised October 18, 2010
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Two processes for releasing the silicon nitride membrane:
Thin PolySiRemoved by XeF2
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Without Etch Stop With Etch Stop
Confinement of XeF2 etch by SiO2 etch stop “tub”
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Membrane Undercutting
Test Structure
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