Volume 33, No. 4 July/August 2017 THRESHOLDTM Inside this Issue: IEW 2017, page 1 From the President, page 2 EOS/ESD Symposium Keynote, page 3 Summer Virtual Meeting Series, page 4 September EOS/ESD Association Meeting Series, page 5 EOS/ESD Symposium Schedule, pages 6-7 Select Papers from Past Symposiums, pages 8-25 Program Development and Assessment- S20.20 Seminar, page 25 Q & A, page 26 Volunteer Spotlight, page 27 EOS/ESD Symposium Exhibits, page 28 IEW Call for Presentations, page 29 Calendar, page 30 Photo Corner, page 31 2017 IEW ESD Technology Mixed with Fun! The 2017 IEW workshop was once again held at the ever popular Granlibakken Conference Center & Lodge in Tahoe City, California. Although the weather was cold for May and attendees arrived to snow covered grounds, the conference facilities provided an opportunity to meet in a relaxed, invigorating atmosphere. The conference included poster sessions and presentations about several ESD related issues. Discussion Groups were quite popular and attendees actively participated. For this workshop there were several invited talks from industry professionals: ESD and Startups, ESD Waveform Capture, Cognitive Applications Platforms, and Heterogeneous Integrated Edge Devices for Internet of Things. On Sunday evening, attendees were entertained by McAvoy Layne, The Ghost of Twain, preserving the wit & wisdom of “The Wild Humorist of the Pacific Slope,” Mark Twain. On Tuesday, there was time for everyone to enjoy some of the local scenery. The IEW workshop is proving to be a popular event containing valuable tech- nical presentations, posters, tutorials, and discussions, while maintaining a relaxed and informal environment. If you would like to be a part of this rewarding event we invite you to join us next year at the 12th annual IEW workshop from May 14-18, 2018 at the Priorij Corsendonk in Belgium.
Transcript
Volume 33, No. 4 July/August 2017
THRESHOLDTM
Inside this Issue:IEW 2017, page 1From the President, page 2EOS/ESD Symposium Keynote, page 3Summer Virtual Meeting Series, page 4 September EOS/ESD Association Meeting Series, page 5EOS/ESD Symposium Schedule, pages 6-7 Select Papers from Past Symposiums, pages 8-25 Program Development and Assessment-S20.20 Seminar, page 25Q & A, page 26Volunteer Spotlight, page 27EOS/ESD Symposium Exhibits, page 28 IEW Call for Presentations, page 29Calendar, page 30Photo Corner, page 31
2017 IEW ESD Technology Mixed with Fun!
The 2017 IEW workshop was once again held at the ever popular Granlibakken Conference Center & Lodge in Tahoe City, California. Although the weather was cold for May and attendees arrived to snow covered grounds, the conference facilities provided an opportunity to meet in a relaxed, invigorating atmosphere. The conference included poster sessions and presentations about several ESD related issues. Discussion Groups were quite popular and attendees actively participated. For this workshop there were several invited talks from industry professionals: ESD and Startups, ESD Waveform Capture, Cognitive Applications Platforms, and Heterogeneous Integrated Edge Devices for Internet of Things. On Sunday evening, attendees were entertained by McAvoy Layne, The Ghost of Twain, preserving the wit & wisdom of “The Wild Humorist of the Pacific Slope,” Mark Twain. On Tuesday, there was time for everyone to enjoy some of the local scenery. The IEW workshop is proving to be a popular event containing valuable tech-nical presentations, posters, tutorials, and discussions, while maintaining a relaxed and informal environment.If you would like to be a part of this rewarding event we invite you to join us next year at the 12th annual IEW workshop from May 14-18, 2018 at the Priorij Corsendonk in Belgium.
2
THRESHOLDTM
July/August 2017
TREK, INC.190 Walnut Street, Lockport, NY USA 14094
Manufacturer of anti-static topicals, dissipative coatings for plastic and floors, ESD workstation products including meters. ISO 9001:2008 certified QS
ESD Association President;Gianluca Boselli
Dear ESDA Volunteers & Friends of ESDA,In my previous President Letter I explained why EOS/ESD Association, Inc. is “diversifying its portfolio”, by keeping faith to its strategic mission to “being the recognized global leader in serving industry in the control and mitigation of Electrical Overstress and Electrostatics”.In today’s letter, I would like to expand on what the challenges are that “being the recognized global leader” encompasses.When venturing into a new market, EOS/ESD Association, Inc. needs to understand not only the business needs, but, more importantly, the local culture.The first step is to learn where the main manufacturing sites are located in the area of interest. Infrastructures tend to be clustered (i.e. it is unlikely to have a great airport and a poor train system in the same area), so this exercise would significantly limit the area of interests, even in large countries. On the other
hand, it is likely that most manufacturing companies are not known in US, so having a local liaison (i.e. a volunteer) is especially critical in this exercise. Even more critical is the liaison’s role in understanding what the current processes of the manufacturing companies scrutinized are, in order to determine how their needs could match what EOS/ESD Association, Inc. can offer. This is largely a cultural barrier, in that in several countries, companies are not willing to share much information. Also, the preferred ways to receive any content (i.e., tutorial vs hands-on, in person vs remote, English vs local language) are peculiar of each country.Often it is needed to partner with a local organization to deliver a certain content. This is very desirable from a EOS/ESD Association, Inc. perspective, in that the partner has an intimate knowledge of the local market, can bridge language and other cultural barriers, and can provide access to communication channels. However, a solid relationship with the partner must be built beforehand. This is not trivial and it does sometimes require a trial-and-error approach.In terms of the overall country “ESD ecosystem”, other players need to be considered. Academia is one aspect, in that it is critical to know which Universities do have ESD-related contents, and on which venues they do publish their results.
From the President
Challenges of “being the recognized global leader”.
Another critical aspect is building a relationship with the local standardization body. This is easier said than done, in that there may be different standardization bodies, with their own priorities, may conflict with EOS/ESD Association, Inc. goals.In summary, from the short summary above, it is pretty obvious that building an EOS/ESD Association, Inc. presence in another country is a long-term endeavor: it literally takes years of planning and relation-building to truly assess ourselves as a credible global leader. Finally, but not lastly, I want to reiterate that our most critical resource is YOU, the ESDA volunteer, without whom none of the above could be supported.Rest assured that you can send me a message with a suggestion, an opportunity for improvement, or a criticism any time and I will regard it with respect.
Gianluca
3
THRESHOLDTM
July/August 2017
EOS/ESD SYMPOSIUM KEYNOTETUESDAY, SEPTEMBER 12, 20179:00 a.m. - 9:45 a.m.
Mars Science Laboratory spacecraft launched in November of 2011 reaching Mars only 9 months later to achieve a spectacular Entry, Descent and Landing (EDL) on August 5th 2012. Since then, the Curiosity rover has driven over 16 kilometers, sampled a few sand dunes and over a dozen rocks by drilling into them. This talk will present an overview of the mission, its objectives, and dis-coveries as well as a few of its challenges along the way.
Alicia Allbaugh was born and raised in Newark, Ohio and was valedictorian at Licking Valley High School (yes that is its real name) in 1984. She attended the Ohio State Uni-versity first at a branch campus in her home town and then on main campus in Columbus with 58,000 classmates. Af-ter earning a BS degree in Engineering Physics in 1988, she accepted a position in Annapolis, Maryland analyz-ing electromagnetic interference in communications for military aircraft and even between the space shuttle and ground control during landing. Simultaneously, she took graduate courses in physics at the Johns Hopkins Uni-versity. An act of congress precipitated her layoff from that position in 1991 at which point she landed a position at NASA’s Jet Propulsion Laboratory (JPL) in Pasadena, California. She supported the Galileo mission for 8 years as it cruised towards and then orbited Jupiter including the first ever asteroid encounter with a spacecraft, first spacecraft software upgrade in flight (which is now com-
The Mission and some ChallengesDr. Alicia R. AllbaughMSL IPE Team Chief, NASA’s Jet Propulsion Laboratory (JPL)
monplace), the first observation of an impact of a comet impact into a planet (by Shoemaker-Levy 9) and sending the first probe into another planet’s atmosphere. She left JPL in 1999 to return to graduate work and earned a Ph. D in physics from the Kansas State University in 2003. She became a visiting assistant professor at the Roches-ter Institute of Technology and taught many engineers in training during her two years there. She was drawn back to California by a proposal of marriage from an fellow en-gineer on Galileo. She accepted and returned to JPL in 2006 in support of the Mars Science Laboratory project. She has been supporting the Curiosity rover in some ca-pacity ever since. Currently, she is the Team Chief of the Integrated Planning and Execution Team which is respon-sible for the coordination of all the activities commanded on the rover every martian day and sometimes supports that commanding as a Mission Lead ensuring the health and safety of the vehicle.
EOS/ESD Symposium
4
THRESHOLDTM
July/August 2017
MONROE ELECTRONICS100 Housel Avenue, Lyndonville, NY 14098
Summer Virtual Meeting SeriesPlease join my meeting from your computer, tablet, or smartphone. https://global.gotomeeting.com/join/856590389
All of our Standards working groups are open to the public. To become a member of a working group you must attend at least two consecutive meetings as a guest; membership to a committee is by individual not by company. After attending two consecutive meetings you may request membership to the working group through Christina Earl ([email protected]). Once you are approved for membership to a committee you must attend at least two out of three consecutive meetings to retain your membership.
Friday, July 14 Standards Process Introduction and Overview 11:30 - 1:00
Monday, July 17 WG 5.5, Device Testing TLP 10:00 - 11:30 WG 23, EOS Best Practices 12:00 - 1:30 WG 27, Automotive EOS (w/USCAR) 2:00 - 3:30
Tuesday, July 18 WG 22, ESD Foundry and IP Parameter 10:00 - 11:30 WG 5.0, Device Testing 12:00 - 1:30 JWG, Device Testing HBM 1:30 - 3:00
Wednesday, July 19 WG 14, System Level ESD 11:30 - 1:00 WG 13, Hand tools 1:30 - 3:00 WG 15, Gloves 3:30 - 5:00
Thursday, July 20 WG 18, EDA 10:00 - 11:30
Friday, July 21 WG 5.4, Device Testing TLU 11:30 - 1:00 WG 7, Flooring 1:30 - 3:00
Monday, July 24 WG 17, Process Assessment 1:30 - 3:00 WG 1, Wrist Straps 3:30 - 5:00
Tuesday, July 25 JWG, Device Testing CDM 11:30 - 1:00 WG 53, Compliance Verification 3:30 - 5:00
Wednesday, July 26 WG 25, Device Testing CBE 10:00 - 11:30 WG 3, Ionization 3:30 - 5:00
Thursday, July 27 WG 26, System ESD Models 10:00 - 11:30 WG 19, High Reliability 1:00 - 2:30 WG 4, Worksurfaces 3:00 - 4:30
Friday, July 28 WG 5.6, Device Testing HMM 11:30 - 1:00 Task Team S20.20 and 625B Harmonization 1:30 - 3:00 WG 11, Packaging 3:30 - 5:00
You are invited to participate with us without the travel!
5
THRESHOLDTM
July/August 2017
STATICO541 Taylor Way, #1, San Carlos, CA 94070 USA
www.transforming-technologies.comTransforming Technologies provides unique and outstanding products to
detect, protect, eliminate, and monitor electrostatic charges.
Standards
September EOS/ESD Association Meeting SeriesTHE WESTIN LA PALOMA RESORT AND SPA3800 E. Sunrise DriveTucson, AZ 85718
Tuesday, September 5TAS 8:00-5:00
Wednesday, September 6TAS 8:00-5:00WG-23, EOS Best Practices 8:00-10:00S20.20/625B Harmonization Task Team 10:00-12:00Education 1:00-5:00WG-19, High Reliability 1:00-5:00WG-5.0, Device Testing 3:00-5:00
Saturday, September 9TAS 8:00-5:00WG-21, Flat Panel Display 8:00-10:00WG-14, System Level ESD 8:00-10:00WG-17, Process Assessment 9:00-12:00WG-26, System ESD Modeling 10:00-12:00MAR/STDCOM 1:00-4:00Social Reception with Entertainment 5:30-7:00
Sunday, September 10WG-27, EOS Automotive 1:00-4:00Board of Directors 5:00-7:00
To Reserve Your Room: Book by: August 16, 2017Room Rate: $139.00+Tax (Resort Fee Waived) *Guests must identify themselves with the group name 2017 EOS/ESD Symposium and Exhibits- to receive the above-mentioned, discounted room rate.Call In: +1 800-937-8461 refer to 2017 EOS/ESD Symposium and Exhibits Reservations Link: www.starwoodmeeting.com/Book/2017EOSESD
6
THRESHOLDTM
July/August 2017
EOS/ESD Symposium
SUNDAY, SEPTEMBER 10, 2017Registration 7:30 a.m. - 5:00 p.m.S20.20 Seminar 8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 1)Tutorials 8:00 a.m. - 12:00 p.m. DD110: ESD Basics to Advanced Protection Design (DD) 8:30 a.m. - 4:30 p.m. FC100: ESD Basics for the Program Manager (PrM) 8:30 a.m. - 12:00 p.m. DD200: Charged Device Model Phenomena, Design, and Modeling (DD) 8:30 a.m. - 12:00 p.m. DD/FC130: System Level ESD/EMI: Testing to IEC & Other Standards (PrM), (DD) 8:30 a.m. - 12:00 p.m. DD/FC155: ESD Control Workstations: Set-up, Practical Considerations, and Measurements 8:30 a.m. - 10:00 a.m. DD/FC161: Perfect ESD Storm 10:30 a.m. - 12:00 p.m. DD/FC330: Control of Charged Board Event (CBE) NEW 1:00 p.m. - 4:30 p.m. DD201: ESD Protection and I/O Design 1:00 p.m. - 4:30 p.m. DD204: ESD Design in HV Technologies 1:00 p.m. - 4:30 p.m. FC164: Costly Controversial ESD Myths 1:00 p.m. - 4:30 p.m. FC370: Basics of EMI and EOS in Manufacturing Environment and Their Mitigation NEW
MONDAY, SEPTEMBER 11, 2017Registration 7:30 a.m. - 5:00 p.m.S20.20 Seminar 8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 2)Tutorials 8:30 a.m. - 4:30 p.m. FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements (PrM) 8:30 a.m. - 12:00 p.m. DD231: ESD System Level: Physics, Testing, Debugging of Soft and Hard Failures NEW/REVISED 8:30 a.m. - 12:00 p.m. DD103: An Overview of Integrated Circuit ESD: The ESD Threat, Testing, Design Concepts, and Debugging 8:30 a.m. - 12:00 p.m. FC360: Electrical Overstress (EOS) in Manufacturing and Test 8:30 a.m. - 12:00 p.m. FC200: Packaging Principles for the Program Manager (PrM) 8:30 a.m. - 10:00 a.m. DD213: ESD, EOS, and Latch-up Failure Analysis for Designers 10:30 a.m. - 12:00 p.m. DD300: Circuit-Level Modeling and Simulation of On-Chip Protection (DD) 1:00 p.m. - 4:30 p.m. DD340: Integrated ESD Device and Board Level Design NEW 1:00 p.m. - 4:30 p.m. DD319: Physical Process, Device, and Circuit Simulation (TCAD) Methodologies in Application to Industrial ESD Research and Design 1:00 p.m. - 4:30 p.m. FC215: Device Technology and Failure Analysis Overview (PrM) 1:00 p.m. - 4:30 p.m. DD/FC380: Electrostatic Calculations for the Program Manager and the ESD Engineer (PrM) 1:00 p.m. - 2:30 p.m. DD203: Designing ESD Protection for RF and mmWave CMOS Circuits 3:00 p.m. - 4:30 p.m. DD317: ESD Challenges in Advanced FinFET and Gate-All-Around Nanowire CMOS Technologies NEWReception 5:00 p.m. - 6:00 p.m. Professional and Technical Women’s Reception Welcome Reception 6:00 p.m. - 9:00 p.m. Exhibits Open
TUESDAY, SEPTEMBER 12, 2017Registration 7:30 a.m. - 5:00 p.m.Awards Breakfast 7:30 a.m. - 9:45 a.m. Annual Meeting and Awards BreakfastKeynote 9:00 a.m. - 9:45 a.m. The Mission and some Challenges Dr. Alicia R. AllbaughExhibits Open 9:30 a.m. - 5:30 p.m.Technical Sessions 10:10 a.m.-10:20 a.m. Exhibitor Showcase in Session 1A and 1B 10:20 a.m.-12:00 p.m. 1A: Advanced CMOS I 10:20 a.m.-12:00 p.m. 1B: Manufacturing I 1:10 p.m. - 2:40 p.m. Hands On Session I 1:10 p.m. - 2:40 p.m. Measurement in ESD Control Standards 1:10 p.m. - 1:20 p.m. Exhibitor Showcase in Sessions 2A and 2B 1:20 p.m. - 2:35 p.m. 2A: RF / High Voltage I 1:20 p.m. - 2:35 p.m. 2B: ESD Failure Case Studies I 3:20 p.m. - 3:30 p.m. Exhibitor Showcase in Sessions 3A and 3B 3:30 p.m. - 5:10 p.m. 3A: System Level ESD I 3:30 p.m. - 5:10 p.m. 3B: EOS/ESD EDA Tools 3:30 p.m. - 3:40 p.m. Exhibitor Showcase in Invited Speaker Session 3:40 p.m. - 5:00 p.m. Invited Speaker Session 3:40 p.m. - 4:25 p.m. I: Beyond S20.20: Explosives 4:25 p.m. - 5:00 p.m. II: IoT Challenges for ManufacturingStudy Session 5:00 p.m. - 6:00 p.m. Calculations and ESD Scenarios Review for ESD Program Manager Exam Preparation (STUDY SESSION) Workshops A 5:30 p.m. - 7:00 p.m. A.1 EDA for Latch-up: Which are the Most Suitable Approaches? A.2 ESD and EMI Codesign – a Topic Both for IC and PCB Designers “World- Café Style” Format A.3 Machine Model and the Impact on Manufacturing A.4 A Best Practice Procedure for EOS Analysis in the Automotive Industry - How Can We Improve Our Knowledge Sharing?
NEW!
NEW!
EOS/ESD Association Symposium THE WESTIN LA PALOMA RESORT AND SPA 3800 E. Sunrise Drive Tucson, AZ 85718
7
THRESHOLDTM
July/August 2017
EOS/ESD Symposium
Register Today! www.cvent.com/d/x5q0sx
WEDNESDAY, SEPTEMBER 13, 2017Registration 7:30 a.m. - 5:00 p.m.Exhibits Open 8:30 a.m. - 1:30 p.m.Technical Sessions 8:00 a.m. - 8:40 a.m. Year in Review: The Birth and the Life of an EOS/ESD Association, Inc. Standard 9:10 a.m. - 9:20 a.m. Exhibitor Showcase in Session 4B 9:20 a.m. - 11:10 a.m. 4B: Manufacturing II 9:30 a.m. - 9:40 a.m. Exhibitor Showcase in Session 4A 9:40 a.m. - 11:20 a.m. 4A: On-Chip Physics 1:05 p.m. - 3:05 p.m. Hands On Session II 1:05 p.m. - 1:35 p.m. II.A How to Detect ESD Events by EMI (ESD Event Detectors, Antenna, and Scope)? 1:35 p.m. - 2:05 p.m. II.B Detecting and Solving EMI Problems in Manufacturing 2:05 p.m. - 2:35 p.m. II.C Measuring Grounds in a Facility 2:35 p.m. - 3:05 p.m. II.D ESD Field Measurement Pitfalls and ESD Voltage Suppression Demonstration (ANSI/ESD S20.20 and IEC61340-5-1 Differences) 1:35 p.m. - 2:50 p.m. 5A: Testing I 1:35 p.m. - 2:50 p.m. 5B: RF / High Voltage II 3:20 p.m. - 5:00 p.m. 6A: System Level ESD II 3:20 p.m. - 4:35 p.m. 6B: Advanced CMOS II 3:25 p.m. - 5:10 p.m. Short Tutorial Session I: 3:25 p.m. - 4:00 p.m. I.A Cable Discharge Events in Assembly and Testing 4:00 p.m. - 4:35 p.m. I.B Packages, Tape & Reel, Trays, and Others: How to Assess ESD Compliance? 4:35 p.m. - 5:10 p.m. I.C New Methods of Air Ionizer Performance TestingWorkshops B 5:30 p.m. - 7:00 p.m. B.1 Friendly ESD Integration of 3rd Party IP in SoCs? B.2 One Year after The Industry Council White Paper 4 Release B.3 Beyond ANSI/ESD S20.20: High Reliability ESD Control Processes and Lower ESD Sensitivities B.4 HBM and CDM Standards – Recent Advances and Application to Devices 7:00 p.m. - 9:00 p.m. General Chair’s Reception Open to all Symposium Attendees! THURSDAY, SEPTEMBER 14, 2017Registration 7:30 a.m. - 5:00 p.m.Technical Sessions 8:00 a.m. - 8:40 a.m. Year in Review: Transmission Line Pulse Testing for ESD 8:50 a.m. - 10:20 a.m. Discussion Group Session DG.A CDM Manufacturing Controls for Class 0 (0B & 0A) DG.B Electrical Overstress in Manufacturing – Mitigation Strategies and Standards DG.C ESD Control Program Management for Contract Manufacturing 8:50 a.m. - 10:05 a.m. 7A: ESD Failure Case Studies II 10:25 a.m. - 11:40 a.m. 8A: Testing II 10:40 a.m. - 12:25 p.m. Short Tutorial Session II 10:40 a.m. - 11:15 a.m. II.A ANSI/ESD STM11.31: Describe the Test Method and the Differences Between Good and Bad Bags 11:15 a.m. - 11:50 a.m. II.B Charged Board Event and the Correlation to Charged Device Model 11:50 a.m. - 12:25 p.m. II.C “Meet the Standard” with History, Background, and Contents 11:40 a.m. - 11:45 a.m. On-Chip ESD Design Technical Session Closing 12:25 p.m. - 12:30 p.m. EOS/ESD in Manufacturing Technical Session ClosingTutorials 8:00 a.m. - 4:30 p.m. FC390: Basics of ESD Process Assessment 8:30 a.m. - 12:00 p.m. DD260: Design for EOS Reliability NEW 8:30 a.m. - 12:00 p.m. FC210: ESD Standards Overview for the Program Manager (PrM) 8:30 a.m. - 12:00 p.m. FC120: Air Ionization Issues and Answers for the Program Manager (PrM) 1:00 p.m. - 4:30 p.m. DD220: Transmission Line Pulse (TLP) Basics and Applications (DD) 1:00 p.m. - 4:30 p.m. FC262: Electrical Fields and Particles - Practical Considerations for the Factory NEW 1:00 p.m. - 4:30 p.m. FC110: Cleanroom Considerations for the Program Manager (PrM) 1:00 p.m. - 2:30 p.m. DD381: Electronic Design Automation (EDA) Solutions for ESD 3:00 p.m. - 4:30 p.m. DD382: Electronic Design Automation (EDA) Solutions for Latch-up
FRIDAY, SEPTEMBER 15, 2017 8:00a.m.-5:00p.m. DeviceDesignCertificationExam 8:00a.m.-5:00p.m. ProgramManagerCertificationExam
NEW!
NEW!
NEW!
NEW!
EOS/ESD Association Symposium THE WESTIN LA PALOMA RESORT AND SPA 3800 E. Sunrise Drive Tucson, AZ 85718
8
THRESHOLDTM
July/August 2017
EOS/ESD Symposium
The common theme for the third set of papers in our historical review relates to establishing an ESD control program. From early on in our Symposiums, the costs associated with ESD controls have been related to how much money a properly set-up and managed ESD control program can save. Most consider an ESD control program a necessity today but in the early days there was a need to convince upper management that the time and talent needed to set up the program was worth the investment.
Continued on page 9
9
THRESHOLDTM
July/August 2017
DANGELMAYER ASSOCIATES, L.L.C.14 Butternut Lane, Gloucester, MA 01930
Cleanroom World / Western States Sales provides knowledge and solutions for your static controlled and cleanroom environments. Our company has an ISO 9001:2015
QMS. Onsite training center offers courses on ESD and cleanroom topics
RTP COMPANY580 East Front Street, Winona, MN 55987 USA
Engineers from RTP Company develop customized thermoplastic compounds in over 60 different resin systems for applications requiring color conductive, elastomeric,
flame retardant, high temperature, structural, and wear resistant properties.
The Economic Benefits of an Effective ESD Awareness and Control Program: An Empirical Analysis, 1981 EOS/ESD Proceedings continued
ELECTRICAL
OVERSTRESS/
ELECTROSTATIC
DISCHARGE
SYMPOSIUM
PROCEEDINGS
2009Sponsored by
ESD Association in cooperation with IEEE.
Technically co-sponsored by the Electron Devices Society.
Access more than 1,680 Symposium papers, published yearly from 1979 to 2016 in the EOS/ESD Symposium Proceedings. The largest collection of electrostatic research and development papers from around the world.
www.esda.org/training-and-education/proceedings/Proceeding are availble by year, in a complete “Proset” 1979-2016, or purchase an Enterprise-Wide license for company wide reference.
Want to locate a specific paper or author? The Search and Retrieval Index (pdf) can help.This index is a complete listing of Papers, Authors, and Awards presented at the EOS/ESD Symposium from 1979 to 2016.
Lubrizol is a global leader in supplying innovative polymer solutions for applications in the electronics, industrial, and sports and recreation markets.
TECH WEAR, INC.6154 Innovation Way, Carlsbad, CA 92009
Tel: 760-438-7788 Email: [email protected] www.techwear.comIndustry leader in static control garments, including groundable cleanroom
garment systems.
Preparing a Microelectronics Assembly and Test Area for more Sensitive Product, 2001 EOS/ESD Proceedings
Continued on page 19
19
THRESHOLDTM
July/August 2017
JULIE INDUSTRIES/STATICSMART FLOORING2 Dundee Park Drive, Suite 302A, Andover, MA 01810 USA
Preparing a Microelectronics Assembly and Test Area for more Sensitive Product, 2001 EOS/ESD Proceedings continued
Continued on page 24
24
THRESHOLDTM
July/August 2017
Continued on page 25
Preparing a Microelectronics Assembly and Test Area for more Sensitive Product, 2001 EOS/ESD Proceedings continued
25
THRESHOLDTM
July/August 2017Preparing a Microelectronics Assembly and Test Area for more Sensitive Product, 2001 EOS/ESD Proceedings continued
10 attendees gathered at EOS/ESD Association headquarters June 13-14 for the two day FC340: Program Development and Assessment-S20.20 Seminar. All ea-ger to learn practical ESD handling and control practices to ensure that they have ESD practices and processes in place to protect their companies’ products. The attendees represented several professional titles which intend to use the knowledge to improve ESD control in their company. their titles include:
Training coordinator/operations support, Quality control prefessionals, Equipment Technologist, and Process Engineers. The instructor, Dave Swenson, engaged the attendees with numerous demonstra-tions involving ESD testing practices and instrument use. “In depth review of Program develop-ment/audit is very beneficial and does not appear to be covered elsewhere”
Program Development and Assessment-S20.20 Seminar draws a variety of interested professionals.
“Presenters knowledge and experi-ence are tremendously beneficial to the success of this problem. Dave kept it interesting-no naps.”
Full Automatic Wafer Level ESD Tester / HBM, MM, HMM, and SCM ESD Tester, TLP Tester/ CDM Tester/ Electrostatic Imaging System
Q) Which one is more helpful in reference to auditing the EPAs, the ESD field meter or the ESD voltmeter?
A) The ESD field meter is probably overall more useful for general measure-ments around the EPA. The area of view is what is different between the two types of instruments. Small areas (<150 mm x 150 mm) cannot be measured with good accuracy with the Field Meter. The ESD Voltmeter can measure very small areas with good accuracy.
Q) How to realistically determine “allowed by the user specifications” (surely user is not free to choose his own values, by his will as he has to be within certain limits)?
A) Setting user specifications requires that the “user” have a good idea about the risk levels for any static charge (elec-tric fields) and voltage that are present in close proximity to any unprotected ESD susceptible items. This knowledge of course comes from training and ex-perience. It is hard to set specifications without knowing something about the process and risk to parts. In order for a facility to become certified to ANSI/ESD S20.20, any user set specifications have to be justified according to the risks. For instance, if you have 100 volt HBM devices, you would not set an ionizer imbalance at +/-150 volts.
Q&A
Q) Within the document where one can see text: “an integrated checker or a me-ter” Is there a specific integrated checker that is best? Does the meter mean the lab digital AVO meter?
A) Integrated checkers are often used for wrist strap and footwear measurements. These are testers that are specifically de-signed for some special purpose. A meter could be the digital AVO meter as long as the output voltage and current meet the requirements of the test method. For almost all of the measurements in the ESDA test methods, the meter has to have 10 volts and 100 volts for the resis-tance measurements. (Granted there are a few exceptions)
The response given is a service to industry; EOS/ESD Association, Inc. is not respon-sible for content. The users of this information need to determine the suitability of the response
ESD TR53-01-15 EOS/ESD Association Technical Report for the Protection of Electrostatic Discharge Susceptible Items – Compliance Verification of ESD Protective Equipment and MaterialsThe purpose of this technical report is to provide compliance verification test procedures and troubleshooting guidance for ESD protective equipment and materials. Test results may be used for the Compliance Verification Plan Requirements of ANSI/ESD S20.20 or those of the user if more restrictive.
Q) Could I rely on the high resistance RLC meter (I possess like DMR 3600 which is an RLC meter with 4 G Ohm maximum measurement capability) to perform audit measurements like foot ware or wrist strap testing (where 35 M ohm is maximum requirement) along with the metal electrodes (for example figure 4: Wrist strap test using meter)...?
A) Measurements greater than 1 meg-ohm require a meter with voltage output of 100 volts. Under 1 megohm, 10 volts is required. If your meter has those val-ues then it should be OK. For wrist strap measurements, the output voltage is one of the special situations where you would not apply 100 volts to a person unless the voltage is current limited – that is why 10 volts is used, even though the measure-ment may exceed 1 megohm.
EOS/ESD Association, Inc. is pleased to provide a complimentary pdf version of ESD TR53-01-15
To access complimentary downloads visit: www.esda.org/standards/complimentary-downloads/1.Click on the document title.2.Click on Download the complimentary version.
ESD TR53-01-15 Revision of ESD TR53-01-06
for the Protection of Electrostatic Discharge Susceptible Items
Compliance Verification of ESD Protective Equipment and Materials
Electrostatic Discharge Association
7900 Turin Road, Bldg. 3 Rome, NY 13440
27
THRESHOLDTM
July/August 2017
Advanced Test Equipment Rentals10401 Roselle Street San Diego, CA 92121
ESD control failure analyis, TLP testers, simulators, test and measurement equipment.
NQA 289 Great Rd., Suite 105, Acton, MA 01720
(800) 649-5289 • [email protected] • www.nqa.comLeading global ANSI/ESD S20.20 certification body audit firm - providing
accredited ESD facility certifications and a full suite of ISO services
Volunteer Spotlight
Tom Ricciardelli received a BS and MS in Chemical Engineering from MIT in 1985 and an MBA from the Sloan School of Management in 1991. In 1993, he founded SelecTech with the mission of creating valuable products from recycled materials. He has over 20 years experience with developing unique polymer blends to meet demanding technical requirements and holds several patents for products and processes using recycled materials. He was the first to conceive of and develop an adhesive-free, interlocking static-control flooring
Tom Ricciardelli; Spotlight Volunteer
system which paved the way for the StaticStop line of industry-leading ESD flooring products.With this product, he was flung headlong into the ESD industry and joined the EOS/ESD Association in 2013 to become more involved in the industry and better understand the full needs of his customers. He is now the chair of WG 7 and a member of WG19, WG97, and the Marketing Communications committees. “While I have a strong engineering background with degrees in chemical engineering, my knowledge of electronics and ESD was certainly limited. Being involved in the EOS/ESD Association, through the committees, the available training information, and generous support from other members, I’ve learned a vast amount about ESD and its control. I particularly enjoy networking with the other members, working with them on the committees, and having
a little fun during the free time.” Tom is married to Linda and has three sons, Andrew (22), Clark (20), and James (18). Tom enjoys playing hockey in his Friday morning hockey group, and most anything outdoors, particularly, hiking, biking, skiing, running, and kayaking. Living in the Boston area with its strong sports culture, he also loves watching the Red Sox, Patriots, Celtics, and Bruins.
28
THRESHOLDTM
July/August 2017
Exhibit at the 2017 EOS/ESD Symposium in Tucson, AZThe EOS/ESD Symposium covers a broad base of interests including in-dustrial, computer, communications, and military electronics; web process-ing; cleanrooms; semiconductors; MR heads; and electronic systems, compo-nents, and equipment.
Five days of tutorials, technical papers, exhibits, workshops, peer networking, and special events provide the informa-tion to understand and control EOS and ESD, improve yields and productivity, increase quality and reliability, and con-trol costs.
The symposium is a targeted, con-centrated audience of ESD and EOS professionals looking for solutions. This event draws attendees from countries all around the world. They come for tutorials, for technical papers, for work-shops, for networking...and they come for the exhibits.
Exhibitors have a number of marketing and promotion opportunities available that support the symposium and create company awareness. These opportuni-ties include advertising in the exhibits directory, and sponsoring various sym-posium events such as lunches, coffee breaks, and receptions.
Fifty-two exhibitors have already registered for the 2017 EOS/ESD Symposium. Space is still available and can be reserved by contacting the EOS/ESD Association, Inc., 7900 Turin Rd, Building 3, Rome, NY 13440, phone 315-339-6937 or by email at [email protected].
EOS/ESD Symposium
Connect Face-to-Face with your customers!
39 Annual EOS/ESD Symposium and Exhibits
Arizona Ballroom57-10x10 booths10-10x20 boothsCeiling height 16'-18'Aisle widths as noted
September 9-14, 2017The Westin La Paloma Resort Tucson, AZ
th
.
AS OFDRAWINGS 5/19/2016 CM
TC
EN
NO
CSI
DV0
84/
O3/
A002
&A0
01
TCENNOCSIDV084/O3/A002&A001
Phone
RE
G. 1
REG. 2
LOADING
204 20 704 20504 20
202 300 302 400 502 600 602 700 801
106 205 206 605 606 705 706 805806
108 207 208 607 608 707 708 807808
110 209 610 709 710 809810
8'
EXIT
EXIT
EXIT
EXIT EXIT EXIT EXIT EXIT
EXIT
EXIT
EXIT EXITEXIT
10' 10'10'
114 213 214 313 314 413 414 514 613 713 714 813
8'
104 203
305
20
10'
210 20 510 20
506
20
10'
Ais
le 2
00
Ais
le 1
00
Ais
le 6
00
Ais
le 7
00
Ais
le 8
00
604 703
EXIT
ENTRANCE0 5 10 20 30
109
107
105
113
100
310 20
304 20
306
308
405
20
10'
26'
Ais
le 3
00
ACL504
Adv. Test Equip
308
ANSYS704
Barth 703Botron 204
Core Insight
607
Dangel-mayer 214
Desco 302
Dou Yee 514
Electro- Tech 502
ESDEMC Tech 306
ESTION Tech713
Euclid Vidaro
414
Gibo Kodama
314
ESDMAN 209
Grund Tech510
Hanwa313
HPPI610
In Com-pliance
205iT2
Tech 203
Julie /Stat-icSmart
606
Lubrizol 413
Magwel708, 710
Monroe 604
NRD 202
RTP 600
Shenzhen Btree 709
Silicon Front-line 105, 107 Simco-Ion
304
STATI-CO 605
Static Solutions 305
StaticStop/ SelecTech
210
Stephen Halperin/
Prostat 506
Tech Wear 801
Thermo Fisher Scientific 405
Transforming Tech 310
Trek 602
Integrated Packaging307
Mentor Graphics
608
Premix Oy
208
Polyonics803
7 June 2017 11:21 AM
Conductive Containers
500
ESTATEC705
SJM Eurostat
714
Ergo Advantage
104
TDI International700
Toyota Tsusho
America 206
OnFilter 300
Megalin Source
706
3DX-TECH100
Phasix ESD707
Flambeau 806
September 10-15, 2017
iNARTE 207
Exhibits are open
to the public!
Exhibit Hours:
September 11, 6:00 PM - 9:00 PM
September 12, 9:30 AM - 5:30 PM
September 13, 8:30 AM - 1:30 PM
29
THRESHOLDTM
July/August 2017
May 14-18, 2018 at Priory Corsendonk, Oud Turnhout, Belgiumhttps://www.esda.org/index.php/events/iew/
2018 International Electrostatic Discharge WorkshopLocated among century-old forests, the historic Priory Corsendonk provides a picturesque setting with a relaxed and invigorating atmosphere to engage in discussions about the latest issues confronting the ESD and EOS communities. The workshop will include invited seminar speakers, discussion groups, invited talk speakers, technical presentation
IEW12th Annual International Electrostatic Discharge Workshop
Call For Presentations
sessions, and special interest groups. The IEW is the perfect opportunity to submit late-breaking and exciting new research to stimulate discussion and interaction around new ideas, encouraging new research topics. To maintain the unique IEW experience and provide ample opportunity for discussion, there will be an increased focus on discussion groups and invited speakers in 2018. The IEW
workshop presentation format for technical sessions will begin with each author presenting a brief summary to highlight key findings, followed by an interactive poster-based discussion session among authors and attendees. The IEW is closely aligned with the EOS/ESD Symposium for collaborative conference activities.
WearablesWith wearables a new class of mobile devices, such as smart watches, health tracking bracelets, and virtual reality glasses, has emerged recently and will expand strongly in coming years. These battery-operated devices can be characterized by having a high content of advanced electronics in a very small form factor. The combination of sensitive low-power electronics, tiny module sizes and frequent exposure to ESD events in the daily use environment bears challenges for the ESD protection of such devices. Submit your abstract covering the ESD challenges of wearables and discuss your and your peer’s experiences during the IEW workshop.
Automotive Applications ESD/EMCThe electronic content of automobiles is increasing, leading to more complex electronic modules and system design. Integration of ICs and discrete devices is demanding, considering the module level EMC testing and reliability requirements. The IEW invites contributions that address ESD and EMC challenges in automotive systems design, including complying with standards such as bulk current injection (BCI), direct power injection (DPI), IEC-61000-4-2, ISO-10605, and ISO-7637.
Abstract Submission Deadline October 2, 2017
Electrical Overstress (EOS)EOS continues to be one of the single EOS continues to be one of the largest causes of customer returns in the semiconductor industry. Have you recently completed root-cause analysis on a failure with an electrical induced physical damage (EIPD) signature? There is not a defined procedure to determine absolute maximum ratings (AMR) for a product. Do you have a methodology for defining AMR for a product, and verifying it for different timescales? Are you an FA engineer with experience on case studies identifying EOS damage mechanisms and the ensuing physical evidence? Finding sources of EOS can be a challenge. Do you have experience auditing a manufacturing site for sources of EOS? Bring your work to the IEW and share it with your colleagues.
EDA for Latch-up ToolsEDA tools for ESD and latch-up verification have significantly matured in the past few years. The ESD Association’s EDA working group continues working on the subject. While initially the focus was primarily on ESD it now includes latch-up. A technical report is planned for release prior to IEW 2018 to begin discussions. We invite you to submit posters presenting your ideas and experiences for Latch-up tools.
Other topics and areas to consider for abstract submissions include:
Anomalous/Unresolved ESD IssuesRandom and unrepeatable ESD failures, case histories, ESD tester correlation issues, or unique window failures.
System-Level ESD/EOS IssuesOn- and off- chip IEC protection clamps, component/system ESD co-design case studies, cable discharge clamps, transient latch-up, design of system-level clamp circuits, system level ESD test issues and scan techniques, and ESD-induced soft errors.
Failure Analysis TechniquesLocating failure sites, in particular for CDM, imaging techniques, correlating FA identified damage site with ESD stress, distinguishing EOS-like failures from ESD failures, and unusual failure modes.Technology Integration IssuesESD sensitivity with technology transfers, 3D IC ESD design issues, qualification challenges for different fabs, unusual problems of process interaction with ESD, process monitor methods, and technology scaling issues.
cont. on page 2
®
FOCUS TOPICS FOR IEW 2018
May 14-18, 2018 at Priory Corsendonk, Oud Turnhout, Belgiumhttps://www.esda.org/index.php/events/iew/
2018 International Electrostatic Discharge WorkshopLocated among century-old forests, the historic Priory Corsendonk provides a picturesque setting with a relaxed and invigorating atmosphere to engage in discussions about the latest issues confronting the ESD and EOS communities. The workshop will include invited seminar speakers, discussion groups, invited talk speakers, technical presentation
IEW12th Annual International Electrostatic Discharge Workshop
Call For Presentations
sessions, and special interest groups. The IEW is the perfect opportunity to submit late-breaking and exciting new research to stimulate discussion and interaction around new ideas, encouraging new research topics. To maintain the unique IEW experience and provide ample opportunity for discussion, there will be an increased focus on discussion groups and invited speakers in 2018. The IEW
workshop presentation format for technical sessions will begin with each author presenting a brief summary to highlight key findings, followed by an interactive poster-based discussion session among authors and attendees. The IEW is closely aligned with the EOS/ESD Symposium for collaborative conference activities.
WearablesWith wearables a new class of mobile devices, such as smart watches, health tracking bracelets, and virtual reality glasses, has emerged recently and will expand strongly in coming years. These battery-operated devices can be characterized by having a high content of advanced electronics in a very small form factor. The combination of sensitive low-power electronics, tiny module sizes and frequent exposure to ESD events in the daily use environment bears challenges for the ESD protection of such devices. Submit your abstract covering the ESD challenges of wearables and discuss your and your peer’s experiences during the IEW workshop.
Automotive Applications ESD/EMCThe electronic content of automobiles is increasing, leading to more complex electronic modules and system design. Integration of ICs and discrete devices is demanding, considering the module level EMC testing and reliability requirements. The IEW invites contributions that address ESD and EMC challenges in automotive systems design, including complying with standards such as bulk current injection (BCI), direct power injection (DPI), IEC-61000-4-2, ISO-10605, and ISO-7637.
Abstract Submission Deadline October 2, 2017
Electrical Overstress (EOS)EOS continues to be one of the single EOS continues to be one of the largest causes of customer returns in the semiconductor industry. Have you recently completed root-cause analysis on a failure with an electrical induced physical damage (EIPD) signature? There is not a defined procedure to determine absolute maximum ratings (AMR) for a product. Do you have a methodology for defining AMR for a product, and verifying it for different timescales? Are you an FA engineer with experience on case studies identifying EOS damage mechanisms and the ensuing physical evidence? Finding sources of EOS can be a challenge. Do you have experience auditing a manufacturing site for sources of EOS? Bring your work to the IEW and share it with your colleagues.
EDA for Latch-up ToolsEDA tools for ESD and latch-up verification have significantly matured in the past few years. The ESD Association’s EDA working group continues working on the subject. While initially the focus was primarily on ESD it now includes latch-up. A technical report is planned for release prior to IEW 2018 to begin discussions. We invite you to submit posters presenting your ideas and experiences for Latch-up tools.
Other topics and areas to consider for abstract submissions include:
Anomalous/Unresolved ESD IssuesRandom and unrepeatable ESD failures, case histories, ESD tester correlation issues, or unique window failures.
System-Level ESD/EOS IssuesOn- and off- chip IEC protection clamps, component/system ESD co-design case studies, cable discharge clamps, transient latch-up, design of system-level clamp circuits, system level ESD test issues and scan techniques, and ESD-induced soft errors.
Failure Analysis TechniquesLocating failure sites, in particular for CDM, imaging techniques, correlating FA identified damage site with ESD stress, distinguishing EOS-like failures from ESD failures, and unusual failure modes.Technology Integration IssuesESD sensitivity with technology transfers, 3D IC ESD design issues, qualification challenges for different fabs, unusual problems of process interaction with ESD, process monitor methods, and technology scaling issues.
cont. on page 2
®
FOCUS TOPICS FOR IEW 2018
Submission Instructions - Deadline October 2, 2017Please prepare your abstract in the form of a short powerpoint presen-tation.After the title slide, the second slide of the presentation should describe the objective and significance in a 200 word summary. The presentation should not exceed 5 additional slides; with representa-tive data and figures that will be the foundation for the poster you plan to present at the workshop. A template is available to download from www.esda.org/index.php/events/iew/. Please email your presenta-tion abstract (maximum file size 2 MB) in MS PowerPoint® format including title, author affiliation, and e-mail address to [email protected] no later than October 2, 2017.Notification of acceptance will occur by October 23, 2017. Final, full presentations for the workshop in MS PowerPoint® format must be received by April 16, 2018. There will be no published proceedings of the workshop. Registered attendees will receive a copy of all IEW presentations. For any questions please contact the Technical Program Chair, Mototsugu Okishima, (mototsugu.okushima.vx@ renesas.com).The IEW encourages student submissions by providing a 50% dis-count in registration fees for a limited number of student presenters. Proof of student status must be submitted along with the abstract for the workshop presentation. Please check our web page at www.esda.org/index.php/events/iew/ for regular updates on the workshop. As it becomes available, we will post information on the full technical program including the seminar topics, the keynote speaker, the technical sessions, as well as the discussion group and special interest group topics. In addition to peer-reviewed presentations, attendees will also have the option to present non-peer-reviewed posters at the workshop. Please also go to the web page for information on workshop registration, the Priory of Corsendonk, and the Oud-Turnhout area.
TOPICS of interest FOR IEW 2018• Wearables• Automotive Applications
ESD/EMC• Electrical Overstress (EOS)• EDA for Latch-up Tools• Anomalous/Unresolved
July 11-13, 2017 ESD Technician Training provided by the German ESD Forum (in English language)(ESDA Certified TR53 Technician program)NH Collection Dresden Altmarkt, Dresden City Centre, D-01067 Dresden, Germany
July 18, 20, and 21 at 11 Eastern TimeOnline Academy CourseDD130/FC130: System Level ESD/EMI: Testing to IEC and other Standards
July 18-20, 2017 SH&A Level 1: ANSI/ESDA S20.20 Plant Auditor class (ESDA Certified TR53 Technician program) Penang, Malaysia
July 24-26, 2017 SH&A Level 1: ANSI/ESDA S20.20 Plant Auditor class (ESDA Certified TR53 Technician program) Hsinchu, Taiwan
Aug. 1, 2, 3 at 11 Eastern TimeOnline Academy CourseFC361: Ultra-sensitive (Class 0) Devices: ESD Controls and Auditing Measurements
Aug. 15, 16, 17 at 11 Eastern TimeOnline Academy CourseFC360: Electrical Overstress (EOS) in Manufacturing and Test
September 5-15, 2017 EOS/ESD Association, Inc. Fall Meeting Series (September 5-9)EOS/ESD Symposium and Tutorials (September 10-15)Westin La PalomaTucson, AZ, USA
October 23-25, 201715th German ESD-Forum (Call for Papers)Novotel Munich City, D-81669 Munich, Germany
Nov 8-10, 2017 China EOS/ESD Association, Inc. TutorialsNov 8, 2017 FC100: ESD Basics for the Program ManagerNov 9, 2017 FC101: How To’s of In-Plant ESD Auditing and Evaluation MeasurementsNov 10, 2017 Essentials for ESD Programs Factory: Technologies • Controls • ProceduresCanmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, China
November 14-16, 2017Vietnam EOS/ESD Association, Inc. TutorialsNovember 14 ESD Basics FC155: ESD Control Workstations: Set-up, Practical Considerations & MeasurementsNovember 15 FC101: How To’s of In-Plant ESD Auditing and Evaluation MeasurementsNovember 16 FC150: Hands-on ESD Measurements & Instruments-Uses and Pitfalls FC361: Ultra-sensitive (Class 0) Devices: ESD Controls and Auditing Measurements Saigon Prince Hotel, Ho Chi Minh City, Vietnam
December 4-5, 2017EOS/ESD Association, Inc. TutorialsDec 4 FC170: ESD Training for Internal Auditors and Supplier Quality Dec 5 FC164: Costly Controversial ESD Myths FC161: Perfect ESD StormEOS/ESD Association, Inc.7900 Turin Rd. Bldg 3 Rome, NY 13440
Your Company Name 6175 US Highway 6, Linesville, PA 16424 USA
Looking for ESD Services?Search the Buyers Guide to locate suppliers of ESD control products or services. You can search by product, company,
or geographic location.www.esda.org/buyers-guide/
31
THRESHOLDTM
July/August 2017
ThresholdTM is published six times a year by the ESD Association, a not-for-profit corporation. It strives for the advancement of theory and practice of electrical overstress avoidance and of allied arts and sciences and the maintenance of a high professional standing among its members and others.
Threshold Institutional ListingsSpace in the Threshold Institutional Listings, which appear at the bottom of newsletter pages, can be purchased for $600.00 for six consecutive issues. Larger contributions are welcome. No agency fee is granted for soliciting such contributions. Inquiries, or contributions made payable to the EOS/ESD Association, Inc. should be sent to:EOS/ESD Association, Inc., 7900 Turin Rd., Bldg. 3, Rome, NY 13440-2069 Tel: (315) 339-6937, e-mail: [email protected].
