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Threshold ionization mass spectroscopy ofradicals in RF silane discharge
Progress report 11/19/2003
Contributors:Alan GallagherPeter HorvathKaroly Rozsa : Design of apparatusDamir Kujundzic : Forevacuum assembly and RF Power SupplyWengang Zheng : Design of QMS for threshold ionization
Schematics of TIMS apparatus
D ischarge cham ber Ionization cham ber
M ass Spectrom etercham ber
TP1
TP2
TP3
R ough Pum ps
Pyolizer
Turbo Pum ps
Diagram of the vacuum system
Current status:• The system is built• Vacuum in the chambercan reach 3x10-7 Torr• Argon and silane lines are built• Pyrolizer is tested at900 OC with silane flow• Gauges and leak valvesare calibrated for 0-10 sccmair, argon and silane flow
• Hydrogen line is to bebuilt
Schematics of the vacuum chamber assembly
Current status:• All parts are manufactured• Discharge chamber is assembled (windows are needed)• Discharge was operated in argon flow
• Ionizer and mass spectrometer are to be assembled
0 100 200 300 400
0
1x10-5
2x10-5
3x10-5
4x10-5
5x10-5
6x10-5
7x10-5
8x10-5 Flow test with argondischarge chamber assembled
Pre
ssu
re in
oth
er
cha
mb
ers
[To
rr]
Pressure in the discharge chamber [mTorr]
Buffer chamber Ionizer chamber Mass spec. chamber
1.7 sccm
3.0 sccm
4.3 sccm
5.8 sccm
Flow test for the differential pumping
Flows are obtainedby previous calibrationof foreline pressures
The ionizer & massspec. chambers are notseparated yet.
Electronics
Current status:• New RF Power Supply for the discharge is under constructionFully computer controllable (power supply works, minor components are needed)• Data acquisition computer boards are acquired (installation is needed)
QMS electronics will be identical to Wengang Zheng’s TIMS apparatusfor Hot Wire Silicon Deposition experiment
• The commercial Ametek QMS needed to be modified (will be discussed later)• The modified apparatus works satisfactory in the HWSD experiment• An other unit need to be modified for the discharge experiment
• Software is written for HWSD experiment (Labview)• Software need to be adapted for discharge experiment
Rectifier(unknown)
Comp
Reference
RFAmplifier
ProgrammableOscillator
Commercial Ametek QMS
Internalmicrocomputer
Problems:• No coupling capacitor for rods• Programmable frequency(internally controlled)• RF amplitude is controlled byinternal microcomputer• Unable to lock on given massRF amplitude is tested against 4 values to get the mass peak int.• Cannot be controlled from our own computer (& unit is broken )
± ½ AMU
Rectifier(our)
Comp
Reference from our own computer
RFAmplifier
CrystalOscillator
Modified QMS
Modifications:• tuning capacitor• fixed frequency oscillator• our own rectifier• our own feedback loop• external DC voltages
TIMS-related modifications:• Own ionizer, variable energy• Our own ion optics• Electron Multiplier
Advantages:• Full control over RF andDC voltages• Full control of ionizer energy• High stability quartz oscillator• Amplitude stability by feedback
Tunablecapacitor
5 10 15 20 25 30 35 40 450.0
0.5
1.0
1.5
2.0
Am
plitu
de
Mass
5 10 15 20 25 30 35 40 450
1
2
3
4
5
6
Am
plitu
de
Mass
Results of modificationMass scan in HWSD experiment
Original unitWith broken frequency control 1
and without feedback for RF amplitude 2
Modified unitWith stable frequency andown feedback for RF amplitude
1 by accident, IC cannot be replaced2 removed to gain control over RF amplitude
Neutral Parents Si+ SiH+ SiH2+ SiH3
+
Si 8.2
SiH 11.2 9.5
SiH2 10.4 13.1 9.7
SiH3 13.1 11.3 12.5 8.4
SiH4 12.5 15.3 11.9 12.3
Priciples of Threshold Ionization Mass SpectrometryThreshold energies (eV) for SiHn ions from neutrals
8 9 10 11 12 13 14 15 16
0.0
2.0x10-4
4.0x10-4
6.0x10-4
8.0x10-4
1.0x10-3
1.2x10-3A
mp
litu
de
Voltage applied on the cathode(-volts)
Operation of TIMSSample threshold (energy) scan in HWSD experiment
In silane w/o radicals
(cold filament)
W/ radicals(hot filament)
To do in the near future…
• Assemble and wire the ionizer and mass spectrometer• Finish computer controlled RF Power Supply• Modify commercial QMS unit• Build our own step-up transformer and rectifier for QMS• Build computer control of MS, ionizer and ion optics• Optimize ion optics• Calibrate MS• Measurements…