Transmission Electron Microscopy

Shaped by the past, creating the future

Further Analytical Services are available at: www.durham.ac.uk/research/analytical.servicesEmail: analytical.services@durham.ac.uk Tel: + 44 (0) 191 334 4646

Analytical Services

Shaped by the past, creating the future

Further Analytical Services are available at: www.durham.ac.uk/research/analytical.servicesEmail: analytical.services@durham.ac.uk Tel: + 44 (0) 191 334 4646

Services/analyses on offer• Conventional diffraction contrast imaging

(bright field/dark field) and selectedarea/convergent beam diffraction forcrystallographic analysis

• High resolution phase contrast imaging.Used for studying the atomic structure of defects, interfaces as well as imagingindividual grains a few nanometres in diameter

• 80 kV alignment and liquid nitrogen cryo-cooling for beam sensitive materials

• Chemical analysis using energy dispersiveX-ray (EDX) and electron energy lossspectroscopy (EELS). EELS can also beused to probe the bonding environment ofatoms (e.g. sp2/sp3 bonding in carbon etc.)

• Energy filtered TEM (EFTEM) for rapidmapping of chemical elements over a large region

• Scanning transmission electron microscopy(STEM) option with high angle annulardark field (HAADF) imaging

• Cryo-tomography at liquid nitrogentemperatures.

Equipment detailsThe TEM is a JEOL 2100F with FEG source.Images with wide field of view and diffractionpatterns can be acquired using a Gatan Oriuscamera. A 50 mm2 area Oxford INCAx-sightSi(Li) detector is used for energy dispersive X-ray (EDX) analysis.

EELS and energy filtering is carried out on a GIF Tridiem equipped with a 4 MegapixelUltrascanTM CCD camera. Spectrum imaging,where an EELS spectrum is acquired for eachpixel in the scan, is also possible. A Gatan914 single tilt, liquid nitrogen cooled holder is available for cryo-tomography experiments.

Specimen preparation facilitiesThere are facilities for preparing TEMspecimens using precision ion-beampolishing (PIPS) and tripod polishingmethods. Samples can be prepared from bulkusing Buehler abrasimet/isomet sectioningsaws as well as a Gatan ultrasonic disc cutter.A Gatan dimpler is also available along with a Gatan solarus plasma cleaner for cleaningthe specimen before viewing in the TEM.

Accessibility of equipment/further detailsFor prices and related information, pleasecontact the service manager.

Contact details of Service Manager for Transmission Electron Microscopy Dr Budhika Mendis T: + 44 (0)191 334 3554E: b.g.mendis@durham.ac.uk

Service websiteFurther details of transmission electronmicroscopy are available at:www.durham.ac.uk/electron.microscopy

Transmission electron microscopy (TEM) uses high energy electronsto penetrate through a thin (≤100 nm) sample. This offers increasedspatial resolution in imaging (down to individual atoms) as well as the possibility of carrying out diffraction from nano-sized volumes.

Analytical Services