Date post: | 18-Dec-2014 |
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Technology |
Upload: | alexzio |
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COMPANY CONFIDENTIAL 1
Validation Test for IC Digital Design
Alex Lollio, Global Rotation Engineer
Automotive Products Business UnitProvence Design Centre, France
Sept, 2013 - Oct, 2013
Project Leader : Denis ParmentierProject Manager : Andre MourrierProgram Mentor : Massimo Grasso
COMPANY CONFIDENTIAL
Digital Design Flow: Validation Test is missing
Digital Pattern Testing Signal
SIMULATED DUT Expected Output
1. CADENCE DIGITAL SIMULATION TEST
3. FAILURE ANALISYS
REAL DUT
CADENCE “.stil” file generation
VALIDATION TEST ON DIGITAL DESIGN IS MISSING
Digital Pattern Testing Signal
Real DUT Output
2. VALIDATION TEST
COMPANY CONFIDENTIAL
Digital Design Flow: Proposed Validation Test
Digital Pattern Testing Signal
SIMULATED DUT Expected Output
Digital Pattern Testing Signal
Test Passed if Real DUT Output = Expected Output
Real DUT Output
REAL DUT
PXI System located in Provence
1. CADENCE DIGITAL SIMULATION TEST
2. PROPOSED VALIDATION TEST
COMPANY CONFIDENTIAL
Project Goal: Testing Application
Digital Pattern Testing Signal
DUTExpected Output
CADENCE “.stil” file generation
TSSI Converter“.stil” to “.xml”2k$
CADENCE SIMULATION
PROPOSED VALIDATION TEST
LabVIEW application for Generating and Acquiring the digital data and make the comparison test
7k$
DUT
Project Goal: Write LabVIEW application for making the
test
?0$
0$
COMPANY CONFIDENTIAL
PXI System Overview
PXI CHASSIS
PXI CONTROLLER
HSDIO (NI PXI-6552)• -2 to 5.5V DIO Channels• Clock 100MHz• Internal Memory 8MB
BANANA TERMINALS
COMPANY CONFIDENTIAL
Real Test Bench located at IR Provence
PROBER
CONNECTOR
PXI SYSTEM
COMPANY CONFIDENTIAL
LabVIEW Interface: Signal Gen&Acq
COMPANY CONFIDENTIAL
Conclusions
• LabVIEW Application for .STIL Digital Testing has been presented
• The LabVIEW Application Source Code has been uploaded to Provence Server and can be easily modified by everyone
• LabVIEW Classes of 5 working days has been done in Provence Design Center
• PXI system can be easily upgraded with an analog card in order to synchronize digital generation with analog acquisition
• Next step is to add to the system the IDDQ testing capability