Date post: | 02-Apr-2015 |
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WAFERMAPWAFERMAP
• Award winning software package
• Collect, edit, visualize and analyze measured physical parameters on semiconductor wafers
• Import data from various metrology tools
- Ellipsometers
- 4 point probes
- Thickness gauges Supported File Formats
We add customer imports
upon request
• 9 different visualization plots from 1D to 3D
• Data operations and filtering
• File comparison
• Statistical Process Control SPC
- Browser
- Trend chart
• Inter-application Communication (Active X)
•
WAFERMAPWAFERMAP
New features:
• New easy to use XML-based Boin file format
• Multiple wafers and multi-measurements in one file
• Import of multi-measurement wafers at once
• Free rotation of 3D plots
•
WAFERMAPWAFERMAP
New Release: Version 3.0
WAFERMAPWAFERMAP
New features:
• Export of *.jpg and *.bmp
• Export of *.html
• … and many more
New Release: Version 3.0
WAFERMAPWAFERMAP
• Compare your measurements
• Work off-line
• Work outside the clean room
WAFERMAP is your choice
• Advanced Micro Devices• ASM • Atmel• Canon• Hitachi• Hypernex • Infineon• Intel• Jordan Valley SC• LSI Logic• Mattson Technology• Motorola/ Freescale
• Nicolet• Osram • Philips, Philips Analytical• Mitsubishi• Seagate• Sematech • ST Microelectronics• Sumitomo Eaton Nova• Silicon Valley Group• Thermawave• Tokyo Electron• Tru-Si• Varian
WAFERMAPWAFERMAP
References – Partial List of WAFERMAP Customers
References – OEM Customers
WAFERMAPWAFERMAP
• Cyrium
• Foothill Instruments
• Jenawave
• Jordan Valley
• KLA - Tencor
• LayTec
• Napson
• Sigmatech
• SOPRA
• Technos
• Tepla AG
• Thermawave
• Thermo Electron
• Carl Zeiss
Sell WAFERMAP as analysis and visualization tool together with your equipment
Thank you very muchThank you very much for your interest infor your interest in
WAFERMAPWAFERMAP