282A Volume 61, Number 12, 2007 Lee Craven, Editor WHAT’S NEW is provided as a ser- vice for our readers. It contains the latest news on the products, cata- logs, tips, and supplies that manu- facturers elect to highlight. Publica- tion in WHAT’S NEW does not imply recommendation or endorsement by the Society for Applied Spectroscopy or the column editor. Contributions to WHAT’S NEW should be sent to Ap- plied Spectroscopy, What’s New Ed- itor, 201B Broadway Street, Freder- ick, MD 21701-6501 (Fax 301-694- 6860). Please note that only black- and-white photos will be considered for publication. Although there is no charge to submit materials, prefer- ence is given to Applied Spectros- copy advertisers. Call 800-627-0932 for questions regarding advertising. Visible, Mid-Wave and Long-Wave Infrared Spectral Calibration and Test Station McPherson’s new Spectral Test Station provides a 100 mm diameter collimated and wavelength variable monochromatic light beam to illuminate, spectrally calibrate, and document radiometric sensitivity and re- sponse characteristics of spectral and hyper- spectral sensors. The Spectral Test Station (STS) delivers discrete bands of selected monochromatic light and/or scans selected spectral regions in the 200 nm UV to 14 m LWIR wavelength range. Up to four turret- mounted gratings assure efficient coverage of wide spectral ranges. The grating’s ‘‘snap-in’’ feature permits easy replacement of the grat- ings or addition of broad or narrow band re- flecting mirrors. This provides means for test- ing sensors and detectors with integrated as well as spectrally dispersed light. The system is especially useful for QC testing of multiple detector chips, CCDs, or focal plane arrays in a given wavelength range and for given pixel responsiveness. Chips on substrates in the up to four inch size range can be reliably tested. Output beam collimation is interferometrically tested. Direct and peripheral sensitivities of sensors with integrated optics or ‘‘light gath- erers’’ with limited horizon and trajectory-de- termining ‘‘nose cones’’ can be tested, as well as UV, visible, and infrared seekers and other sensors as well as imaging devices and spec- trometers. McPherson is proud to introduce this unique product, the STS, to the industrial and scientific QC and R&D community. Mc- Pherson, Inc., 7A Stuart Road, Chelmsford, MA 01824-4107, Ph: 978-256-4512, www. McPhersonInc.com. New Silicon Drift Detectors with Low Energy Detection Capabilities Down to Beryllium Thermo Fisher Scientific Inc. unveils its new and improved large-area UltraDry silicon drift de- tector for electron microscopes. The UltraDry de- tector has enhanced capabilities allowing for detection of very low energy X-rays down to beryllium. The new detector was showcased at the Thermo Scientific booth at Microscopy and Microanalysis 2007, Broward County Conven- tion Center, Florida, August 5–9. Enhancements to the silicon drift sensor in the new UltraDry detector make excellent low energy detection performance possible. The resulting clear peak separations in the low energy region allow for easier interpretation of spectra and exceptional confidence in the analysis. As a silicon drift de- tector, the UltraDry has X-ray detection perfor- mance that is able to collect data at extremely high count rates without sacrificing energy res- olution or light element sensitivity. The UltraDry detector, coupled with the NORAN System SIX and Direct-to-Phase (DTP) software, enables the quick and accurate determination of com- pounds and identification of where they are lo- cated within the sample. The NORAN System SIX microanalysis system, featuring the silicon drift detectors, addresses the needs of the elec- tron microscopist in the area of microelectronics and semiconductor manufacture, alloys and metals analysis, geology, forensic science, fail- ure analysis, and academic research. Thermo Fisher Scientific, 81 Wyman Street, Waltham, MA 02454, Ph: 800-532-4752, www.thermo. com/microanalysis. The XGT-7000 XRF Imaging Microscope with 10 m Resolution HORIBA Jobin Yvon is pleased to offer the XGT-7000, the latest system in the XGT se- ries of energy dispersive X-ray fluorescence (EDXRF) microscopes. This ground-breaking instrument offers fast, high sensitivity qualita- tive and quantitative elemental analysis and imaging, transmission X-ray imaging, unique dual vacuum modes, and dedicated imaging acquisition/analysis software. A wide range of research benefits from nondestructive analy- sis of discrete microscopic particles and high spatial resolution element imaging. The XGT- 7000 provides the answer for applications as varied as forensic science, pharmaceutics, materials, engine wear analysis, geology, mu- seums, archaeology, electronics, and the life sciences. A choice of two X-ray beam diam- eters is available on the system, ranging from 1.2 mm through a world leading 10 m, and beams can be switched in a matter of sec- onds, ensuring complete flexibility on a single bench-top instrument. The instrument’s unique dual vacuum modes offer the re- searcher complete control for varied analyses.
Transcript
282A Volume 61, Number 12, 2007
Lee Craven, Editor
WHAT’S NEW is provided as a ser-vice for our readers. It contains thelatest news on the products, cata-logs, tips, and supplies that manu-facturers elect to highlight. Publica-tion in WHAT’S NEW does not implyrecommendation or endorsement bythe Society for Applied Spectroscopyor the column editor. Contributions toWHAT’S NEW should be sent to Ap-plied Spectroscopy, What’s New Ed-itor, 201B Broadway Street, Freder-ick, MD 21701-6501 (Fax 301-694-6860). Please note that only black-and-white photos will be consideredfor publication. Although there is nocharge to submit materials, prefer-ence is given to Applied Spectros-copy advertisers. Call 800-627-0932for questions regarding advertising.
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Visible, Mid-Wave and Long-WaveInfrared Spectral Calibration andTest Station
McPherson’s new Spectral Test Stationprovides a 100 mm diameter collimated andwavelength variable monochromatic lightbeam to illuminate, spectrally calibrate, anddocument radiometric sensitivity and re-sponse characteristics of spectral and hyper-spectral sensors. The Spectral Test Station(STS) delivers discrete bands of selectedmonochromatic light and/or scans selectedspectral regions in the �200 nm UV to �14�m LWIR wavelength range. Up to four turret-mounted gratings assure efficient coverage ofwide spectral ranges. The grating’s ‘‘snap-in’’feature permits easy replacement of the grat-ings or addition of broad or narrow band re-
flecting mirrors. This provides means for test-ing sensors and detectors with integrated aswell as spectrally dispersed light. The systemis especially useful for QC testing of multipledetector chips, CCDs, or focal plane arrays ina given wavelength range and for given pixelresponsiveness. Chips on substrates in the upto four inch size range can be reliably tested.Output beam collimation is interferometricallytested. Direct and peripheral sensitivities ofsensors with integrated optics or ‘‘light gath-erers’’ with limited horizon and trajectory-de-termining ‘‘nose cones’’ can be tested, as wellas UV, visible, and infrared seekers and othersensors as well as imaging devices and spec-trometers. McPherson is proud to introducethis unique product, the STS, to the industrialand scientific QC and R&D community. Mc-Pherson, Inc., 7A Stuart Road, Chelmsford,MA 01824-4107, Ph: 978-256-4512, www.McPhersonInc.com.
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New Silicon Drift Detectors withLow Energy DetectionCapabilities Down to Beryllium
Thermo Fisher Scientific Inc. unveils its newand improved large-area UltraDry silicon drift de-tector for electron microscopes. The UltraDry de-tector has enhanced capabilities allowing fordetection of very low energy X-rays down toberyllium. The new detector was showcased atthe Thermo Scientific booth at Microscopy andMicroanalysis 2007, Broward County Conven-tion Center, Florida, August 5–9. Enhancementsto the silicon drift sensor in the new UltraDrydetector make excellent low energy detectionperformance possible. The resulting clear peakseparations in the low energy region allow foreasier interpretation of spectra and exceptionalconfidence in the analysis. As a silicon drift de-tector, the UltraDry has X-ray detection perfor-mance that is able to collect data at extremelyhigh count rates without sacrificing energy res-olution or light element sensitivity. The UltraDry
detector, coupled with the NORAN System SIXand Direct-to-Phase (DTP) software, enablesthe quick and accurate determination of com-pounds and identification of where they are lo-cated within the sample. The NORAN SystemSIX microanalysis system, featuring the silicondrift detectors, addresses the needs of the elec-tron microscopist in the area of microelectronicsand semiconductor manufacture, alloys andmetals analysis, geology, forensic science, fail-ure analysis, and academic research. ThermoFisher Scientific, 81 Wyman Street, Waltham,MA 02454, Ph: 800-532-4752, www.thermo.com/microanalysis.
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The XGT-7000 XRF ImagingMicroscope with 10 �mResolution
HORIBA Jobin Yvon is pleased to offer theXGT-7000, the latest system in the XGT se-ries of energy dispersive X-ray fluorescence(EDXRF) microscopes. This ground-breakinginstrument offers fast, high sensitivity qualita-tive and quantitative elemental analysis andimaging, transmission X-ray imaging, uniquedual vacuum modes, and dedicated imagingacquisition/analysis software. A wide range ofresearch benefits from nondestructive analy-sis of discrete microscopic particles and highspatial resolution element imaging. The XGT-7000 provides the answer for applications asvaried as forensic science, pharmaceutics,materials, engine wear analysis, geology, mu-seums, archaeology, electronics, and the lifesciences. A choice of two X-ray beam diam-eters is available on the system, ranging from1.2 mm through a world leading 10 �m, andbeams can be switched in a matter of sec-onds, ensuring complete flexibility on a singlebench-top instrument. The instrument’sunique dual vacuum modes offer the re-searcher complete control for varied analyses.
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The Full Vacuum mode provides the highestsensitivity for light elements such as sodium,magnesium, and aluminum. However, for wa-ter-containing samples such as biological cellsand fragile archaeological objects that can bedamaged by vacuum conditions, the LocalizedVacuum mode allows the full elemental rangefrom sodium to uranium to be analyzed withthe sample chamber maintained at normal at-mospheric pressure. The XGT-7000 Smart-Map software leads the user through projectset up, experiment configuration, acquisitionand data analysis, and modules such as autopeak labeling, spectral searching, and FPM,and calibrated quantification and report gen-eration are easily accessed. Elemental imag-es can be generated post-acquisition and ad-justed at will, ensuring that the potential of theinformation-rich element image data can befully utilized. The performance of the XGT-7000 is unrivaled, and yet is complemented bythe most accessible software available. Hori-ba Jobin Yvon, Inc., 3880 Park Avenue, Ed-ison, NJ 08820, Ph: 732-494-8660, www.jobinyvon.com.
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Improved Optical SystemModeling and Optimization
The newest release of CODE V optical de-sign software from Optical Research Asso-ciates delivers features to improve both themodeling and optimization of optical systems.In particular, CODE V 9.8 builds on the suc-cess of the recently introduced diffraction-based image simulation feature by allowingmacro access to the simulated image pixeldata. A broad range of built-in macro functions
for manipulating this data enables users toperform actions such as combining multipleimages (for example, separate red, green, andblue channels), adjusting gamma, or compen-sating for known detector characteristics. Us-ers can also extract various parameters of thesimulated image, including color and lumi-nance values. The optimization capabilities ofCODE V have also been extended to accountfor the effects of manufacturing tolerances,thus allowing the designer to create more tol-erance-insensitive design forms. Specifically,a new macro function enables the designer tooptimize for best fabricated performance, rath-er than simply best nominal performance. Op-tical Research Associates, 3280 East Foot-hill Blvd, Suite 300, Pasadena, CA 91107-3103, Ph: 626-795-9101, www.opticalres.com.
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Multi-Pixel Photon Counter(MPPC)
The MPPC from Hamamatsu is a type ofso-called Si-PM (Silicon Photomultiplier) de-vice. It is a photon counting device consistingof multiple APD pixels operating in Geigermode. Each APD pixel of the MPPC outputsa pulse signal when it detects one photon. Thesignal output from the MPPC is the total sumof the outputs from all APD pixels. The MPPCoffers the high performance needed in photoncounting and is used in diverse applicationsfor detecting extremely weak light at the pho-ton counting level. Some features include ex-
cellent photon counting capability, room-tem-perature operation, low bias operation, excel-lent time resolution, insensitive to magneticfields, and simple readout circuit operation.The MPPC is applicable to a wide range offields, including fluorescence analysis, fluo-rescence lifetime measurement, biologicalflow cytometry, confocal microscopes, bio-chemical sensors, bioluminescence analysis,and single molecule detection. Hamamatsu,360 Foothill Road, Bridgewater, NJ 08807,Ph: 908-231-0960, www.hamamatsu.com.
Coherent, Inc has introduced the XantosXS, a self-contained excimer laser that fea-tures dramatically simplified installation. Spe-cifically, this new excimer laser contains aninternal gas compartment, consisting of a pre-mixed laser gas bottle and all necessary gassupply equipment for laser operation. This de-sign enables automated gas re-filling withoutexternal gas and vacuum lines, and meets all
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international gas handling and safety stan-dards. In addition, the Xantos XS operatesfrom a single-phase power source and re-quires no water cooling, making it a ‘‘plug andplay’’ laser that can be easily installed and/orsimply moved to a new location without theneed for a specialized support infrastructure.The laser is available at all fluoride wave-lengths—157 nm, 193 nm, 248 nm, and 351nm—and delivers moderate pulse energies atrepetition rates up to 500 Hz. These charac-teristics make the Xantos XS ideal for bothscientific and precision industrial applications.Based on the field-proven ExciStar XS laser,this unique, self-contained laser also featureslong tube lifetime, high reliability, and long gaslifetimes, which result from its Almeta all met-al-ceramic tube technology. These featureslead directly into a very low cost of ownership,in addition to greater flexibility and improvedease of use. With a beam cross-section of 6� 3 mm and excellent beam uniformity, thelaser output can be easily utilized in a widerange of scientific and industrial applications.The concept of an integrated gas compart-ment is a unique feature in the excimer lasermarket and makes laser operation as flexibleas possible. Coherent, Inc, 5100 PatrickHenry Drive, Santa Clara, CA 95054, Ph:408-764-4000, www.Coherent.com.
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New Low Power Detector
Gentec-EO introduces the new thermopile-based eXtreme Low Power detector, theXLP12 for low power measurements in boththe �W and mW regimes with very low ther-mal drift. Featuring a broadband flat responseand a noise-equivalent power as low as 1 �W,
the XLP12 is suited for any pulsed or CW lowpower laser. It features �W to W range, min-imal thermal drift, flat spectral response, andhigh sensitivity. Gentec-Electro-Optics, Inc.,445 St-Jean-Baptiste, Suite 160, Quebec,QC, Canada, G2E 5N7, Ph: 418-651-8003,www.Gentec-EO.com.
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New, Innovative Instrument forFluorescence Dynamics WinsR&D 100 Award
The MFF (Multi Frequency Fluorometer),the latest instrument from the FluorescenceGroup at Horiba Jobin Yvon, has beennamed the winner of the R&D 100 Award. Thisaward is sponsored by R&D Magazine. Withthis award, MFF joins such prestigious prod-ucts as anti-lock brakes, the fax machine,ATMs, and liquid crystal displays. The MFF isan instrument using patented technology to in-stantaneously acquire data on the molecularbehavior of substances such as cells, nano-devices, and research materials. As such, it isorders of magnitude faster than the nearestcompeting device and opens up new frontiersin research science. Horiba Jobin Yvon, Inc.,3880 Park Avenue, Edison, NJ 08820, Ph:732-494-8660, www.jobinyvon.com.
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New Gas Chromatograph MeetsAnalytical and Budgetary Needs
PerkinElmer Life and Analytical Scienc-es announces the introduction of the Clarus�
400 gas chromatograph (GC), designed to
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meet the needs of industrial/analytical labo-ratories in price-sensitive environments andacademic laboratories globally. The Clarus400 GC was developed in response to thestrong demand for reliable, world-class GCtechnology in budget-conscious laboratorieswithout sacrificing performance. The Clarus400 GC’s single-channel and dual-channel ca-pability with choice of injectors and detectorsoffers the flexibility and performance to meetdiverse applications needs. The Clarus 400GC offers an optional autosampler for in-creased productivity and has a number of fea-tures to support laboratories in global markets,including a choice of keypad-user interfacesin five languages. It is designed for an easyinstallation supported by localized documen-tation. Also, as with all other GCs in the Clarusfamily, the Clarus 400 GC can be coupled withPerkinElmer’s TurboMatrix� HeadspaceSamplers and Thermal Desorbers for addedapplication capabilities. The Clarus 400 GC isan integral part of PerkinElmer’s Clarus familyof GC instrumentation for customers in the en-vironmental, food and beverage, forensics,petrochemical, materials testing, and academ-ic markets. PerkinElmer, Inc., 940 WinterStreet, Waltham, MA 02451, Ph: 781-663-6900, www.perkinelmer.com.
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360 �m High Pressure Fittings
VICI Valco’s new 360 �m High PressureFitting design permits direct connection of 360�m outer diameter fused silica, PEEK�, stain-less steel, or electroformed nickel tubing with-out having to use troublesome liners. Becauseof the fitting’s compact size and fine 2–56threads, a leak-free connection that seals atpressures well in excess of 20 000 psi can beeasily formed with the available manual tool.The 360 �m fittings are available with a PEEKor stainless nut; the PEEK nut is supplied witha glass-filled PEEK ferrule, while the stainless
nut uses a 316 SS ferrule. The ferrule snapsinto the nut so that the fitting is ‘‘one-piece’’,but the ferrule is free to rotate and does nottwist the tube as the nut is tightened. A widerange of micron bore sizes are available. Val-co Instruments Co., Inc., Houston, TX77055, Ph: 800-367-8424, www.vici.com.
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Pulsed Discharge HeliumIonization Gas ChromatographyDetector
Valco’s D3-1-HP Detector is specific forthe HP 6890 GC. It uses the standard 6890detector hardware and includes the HP elec-
trometer. It is literally plug-and-play. It cantake the place of an existing detector or it canbe placed in an unused position. It even in-cludes the acclaimed Valco Helium Purifier toprovide the best possible sensitivity. It is suit-able for use with columns from 50 �m capil-laries to 1/8-in. packed. Valco InstrumentsCo., Inc. P.O. Box 55603, Houston, TX77255; Ph: 800-367-8424; www.vici.com.
