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WP4 Organic crystal deposition
Mojca Jazbinsek
Rainbow Photonics AG
SOFI meeting Karlsruhe 2013-04-22
SOFI meeting 2013-04-22 Rainbow Photonics AG
Summary RB activities Jan-April 2013
Melt deposition of BNA on SOFI2 chips with
CMOS electrodes: 6 samples sent to KIT on April 15, 2013 for evaluation
Melt deposition of OH1 on SOFI2 chips with
electrodes First tests
SOFI meeting 2013-04-22 Rainbow Photonics AG
Melt deposition technique used Chips are covered with a glass substrate
Material molten at the edge and flows between by a capillary force
Slow cooling -> Crystallization
Deposition process needs to be optimized for a particular chip type (surface properties)
Removal of the cover glass
SOFI meeting 2013-04-22 Rainbow Photonics AG
SOFI2-CMOS metalized chips
Different geometry and conditions for
melt flow & crystal growth compared to
chips previously tested
SOFI meeting 2013-04-22 Rainbow Photonics AG
Deposition of BNA on SOFI2-CMOS chips
Most of the chip: very flat surface, weak wettability
of the melt
Cover (flat) glass forms a close contact with the surface
Melt flow is very slow (compared to the same conditions
@previous chips)
Trenches with waveguides present a barrier for the flow,
but once it is crossed, the melt can flow faster within the
trenches (not always…)
SOFI meeting 2013-04-22 Rainbow Photonics AG
Deposition of BNA on SOFI2-CMOS chips
Using vacuum and melt deposition at higher
temperatures, a good covering of the chip with
melt has been achieved.
Reproducible conditions for the crystal growth
could not be achieved yet each chip was
processed individually
SOFI meeting 2013-04-22 Rainbow Photonics AG
Example 1:
Only a part crystalline, the rest amorphous (which
later at room temperature slowly grows further, but dendritic)
Previous chips: no amorphous BNA/dendrites
SOFI meeting 2013-04-22 Rainbow Photonics AG
Example 2:
Very thin BNA film; thickness 0 on top, but there
is still material and crystallization in channels
SOFI meeting 2013-04-22 Rainbow Photonics AG
Example 3:
In most cases the BNA crystal stayed on chip after
removing the cover. In this example, it remained
mostly on the cover, but the channels still
contain crystalline
material
Previous chips: easier cover removal
SOFI meeting 2013-04-22 Rainbow Photonics AG
Example 4:
Bad crystal on top (polycrystalline, holes), but
seems single crystalline within the channels
SOFI meeting 2013-04-22 Rainbow Photonics AG
Example 5:
Low damage after removal, good single
crystallinity
SOFI meeting 2013-04-22 Rainbow Photonics AG
Melt deposition of OH1
Material Pointgroup
n (|| polar axis)
r(highest tensorcomponent)
Melting Tm (°C)
Stableat Tm
DASTDSTMS m 2.1 50 pm/V
(χ(2)=580 pm/V @1.5 µm) 256 N
OH1 mm2 2.1 50 pm/V 212 Y
OH2 m n.m. n.m. (>60 pm/V expected) 242 Y
DAT2 2 1.5 8 pm/V 235 Y
BNA mm2 1.8n.m. 30 pm/V (Dalton 2011)our estimation: ~15 pm/V
102 Y
DAN 2 1.6 13 pm/V (@633 nm) 166 Y
Compared to BNA: + higher EO coefficient+ higher melting temperature– higher refractive index (lower contrast, PVA cover less effective)– growth much more challenging
SOFI meeting 2013-04-22 Rainbow Photonics AG
Melt deposition of OH1 Growth challenges (Dec. 2012):
Parts may stay amorphous – crystal growth easily inhibited Dendritic growth
Slow growth: good single crystals, but many parts amorphous Fast growth: instabilities lead to dendritic growth The conditions change on different substrates Growth results less reproducible as with BNA
2013: With SOFI2-CMOS chips very similar observed also for BNA
SOFI meeting 2013-04-22 Rainbow Photonics AG
OH1 on bare SOFI1 (Q4 2011)
Best example
SOFI meeting 2013-04-22 Rainbow Photonics AG
First tests with OH1
Deposition is challenging, no general
conclusions yet
SOFI meeting 2013-04-22 Rainbow Photonics AG
Conclusions
New geometry for the
crystal growth brings new
challenges
Once the growth is
successful, this geometry is
expected to be beneficial
also for crystals
SOFI meeting 2013-04-22 Rainbow Photonics AG
Planned / needed
Feedback from KIT (SOFI2-CMOS-BNA)
Deposition experiments with OH1
SOFI 3 (June?)
Samples:
4 SOFI2 chips left (edge of the wafer)
SOFI meeting 2013-04-22 Rainbow Photonics AG
WP4 Deliverables, Milestones
M4.1 [M21] Optimized processes for EO polymers and crystals with sufficient yield (RB, GO)
M4.2 [M21] Processes for chalcogenides (CUDOS).
M4.3 [M21] Identification of optimal electro-optic materials with respect to optical and electro-optical
properties and to thermal stability (RB).
M4.4 [M30] Identification of optimal electro-optic materials with respect to integration into silicon (RB).
D4.1 [M24] Silicon-organic chips with EO waveguides (first device run) handed over to WP5 (RB, GO,
UKA).
D4.2 [M30] Report on full potential and limitations of the electro-optic materials for hybrid integration with
silicon for all approaches & comparison of different solutions (GO, RB, CUDOS).
D4.3 [M30] Silicon-organic QAM modulator chips (second device run) handed over to WP5 (RB, GO, UKA)
D4.4 [M36] Report on electro-optic polymers and organic single crystals suitable for reproducible optical
functionalization of SOI in large quantities (GO, RB).
D4.5 [M40 = April] Third device run, coated and poled, handed over to WP5 (RB, GO,KIT).
D4.6 [M40 = April] Chips functionalized with chalcogenides handed over to WP5 (CUDOS, KIT)