X-Ray for X-Ray for Agricultural Agricultural ApplicationsApplications
Dave UtrataDave UtrataIowa State UniversityCenter for NDEIPRT Company Assistance – NDE Group
Alexandra Black, Brett BarnesAlexandra Black, Brett BarnesIowa State UniversityThree Rivers Technical ConferenceThree Rivers Technical Conference
Elk River, MNElk River, MNAugust 3-4, 2010August 3-4, 2010
Presentation OutlinePresentation OutlineBackground of Company
Assistance program◦Current efforts, interests
Review of progress in three areas◦Detection of frost damage in maize
seeds◦Distinguishing between haploid/hybrid
condition in corn seeds◦Imaging of root development
Summary◦Applications, potential, challenges
Three Rivers Tech Conf - 3-4 Aug 2010
IPRT Company Assistance
Technology Commercialization - accelerate commercialization of ISU and company-developed technology through research and development assistance.
Technical Assistance - provide short-term, no-cost technical assistance to Iowa companies in materials and nondestructive evaluationnondestructive evaluation.
Iowa State University – Institute for Physical Research and Testing
Three Rivers Tech Conf - 3-4 Aug 2010
Operational Guide – NDE Operational Guide – NDE GroupGroup Explain & demonstrate the principles of
various inspection methods
Perform feasibility studies to determine which NDE method will work best for your application
Develop inspection protocol for new designs or evaluate current inspection procedures
Provide information on sources of equipment, testing laboratories
Help manufacturers become educated consumers of NDE
Three Rivers Tech Conf - 3-4 Aug 2010
Beyond the usual suspects of fabricated metal, joining operations, current NDT practitioners…
“Round up the usual suspects”
Three Rivers Tech Conf - 3-4 Aug 2010
Nontraditional applications of Nontraditional applications of NDENDEDetection of frost damage in maize
(corn) seed – Seed Science Institute, ISU
Distinguishing between haploid v. hybrid conditions in corn – Agronomy Dept. ISU
Visualizing root growth – North Central Regional Plant Introduction Station
Three Rivers Tech Conf - 3-4 Aug 2010
Detection of frost damage in seed
Three Rivers Tech Conf - 3-4 Aug 2010
Brief background of some work Brief background of some work in fieldin fieldX-ray used to look into potential for
characterizing seeds◦ Often adapted from medical systems, very
often restricted to film◦ “Soft” x-rays
Feasibility of digital high speed evaluation demonstrated using industrial system with pattern recognition for sorting
Three Rivers Tech Conf - 3-4 Aug 2010
Detection of frost damage in Detection of frost damage in corn seedcorn seedCan x-ray methodologies provide
useful assessment of seed structure, viability?◦ Use modern industrial equipment:
microfocus X-ray tube, all digital imaging◦ Differentiate between control group (no
frost damage) and damaged maize seeds (artificial frost cycle)
B37 inbred line, male parent IRF311, hybrid 3 Moisture content at harvest 50%
◦ Provide more rapid alternative to current sectioning & staining (tetrazolium) test
Three Rivers Tech Conf - 3-4 Aug 2010
ResultsResults
Using Flat Panel◦Seven samples from both
control and frost damaged groups were examined
Three Rivers Tech Conf - 3-4 Aug 2010
Control seedsControl seeds
Three Rivers Tech Conf - 3-4 Aug 2010
Frost damaged seedsFrost damaged seeds
Three Rivers Tech Conf - 3-4 Aug 2010
Qualitative difference Qualitative difference apparent between groups – apparent between groups – loss of internal structureloss of internal structure
Next: quantitative analysis of Next: quantitative analysis of images to remove subjective images to remove subjective evaluationevaluation Three Rivers Tech Conf - 3-4 Aug
2010
X-ray Luminance Profiles of X-ray Luminance Profiles of Maize Seeds MethodMaize Seeds Method
Line profile used to see if there is a numerical difference in the luminance profiles between a control corn seed and a frost damaged seed
Three Rivers Tech Conf - 3-4 Aug 2010
TrendsTrends
In general, the luminance profile of a good seed with no frost damage is more erratic then the smoother bad seed’s profile
This trend presumably reveals frost damage to internal seed structure
FrostDamage
Control
Three Rivers Tech Conf - 3-4 Aug 2010
Further analyses ofFurther analyses ofmaize seed X-raysmaize seed X-raysThe luminance profiles were
exported to spreadsheetsTwo methods were used to
numerically separate the control from the frost damaged seeds
◦Large Difference◦Large Slope
Three Rivers Tech Conf - 3-4 Aug 2010
Analysis : Large Analysis : Large DifferenceDifference
In the profile shown here, there are 4 differences in the “valid” region (internal seed features) that are larger then the threshold.
Total Range
Large Difference Threshold = (Scale Factor)*(Total Range)
Large Difference Threshold
1 2
3
4
Valid Region
Three Rivers Tech Conf - 3-4 Aug 2010
Analysis : Large SlopeAnalysis : Large Slope For example,
the profile of this seed has 5 Large Slopes in the valid region.
Valid Region
1
2
5
34 6
Three Rivers Tech Conf - 3-4 Aug 2010
Results : Large DifferenceResults : Large Difference
There are typically more “large differences” within radiographs of control seeds than for frost damaged seeds.
Large Difference Data
Sample ControlFrost
Damage1 10 12 12 33 12 04 7 05 4 16 0 47 11 2
Avg 8 1.5Scale Factor = 0.055
FrostDamage
Control
Three Rivers Tech Conf - 3-4 Aug 2010
Results : Large SlopeResults : Large Slope
There are more “large slopes” on average within radiographs of control seeds than for frost damaged seeds
Large Slope Data
Sample ControlFrost
Damage
1 40 20
2 27 18
3 43 10
4 21 18
5 13 9
6 19 40
7 42 27
Avg 29.2 20.3
Slope Threshold = 10
FrostDamage
Control
Three Rivers Tech Conf - 3-4 Aug 2010
ConclusionsConclusionsThe internal structure of maize
seeds may be revealed using standard industrial radiographic equipment
The adverse effects of frost damage were observable in this small study, independent of seed knowledge or significant manipulation of test conditions
Three Rivers Tech Conf - 3-4 Aug 2010
Problems with analysisProblems with analysisThe threshold multiplier has to be
adjusted to maximize the divergence in counts/core counts between averaged results for good and bad learning sets◦ .055 used initially, .038 probably better
Similarly, the large derivative threshold is chosen to maximize this difference◦ 10 used initially, 12 probably better
The “valid” region of interest was subjectively chosen
Three Rivers Tech Conf - 3-4 Aug 2010
Positive modification Positive modification (attempts)(attempts)Change source to detector distance
◦Magnified image Structural variation seen in more detail over
greater pixel count◦Work at lower voltage (40 kV 25 kV)
Strive for contrast variation afforded by lower energies
More automated line profile placement◦Remove subjective analysis
Three Rivers Tech Conf - 3-4 Aug 2010
New Seed RadiographsNew Seed Radiographs
Control Frost
Three Rivers Tech Conf - 3-4 Aug 2010
Frost – SaturdayFrost – Saturday
Radiograph with Equator, Automatic & Manual Profiles Highlighted Line Profiles
Auto 1 Auto 2 Auto 3 Man.
Large Difference Counts
11 226 241 261
Large Slope Counts
1 5 1 1
Auto 1
Equator
ManualAuto 3
Auto 2
Three Rivers Tech Conf - 3-4 Aug 2010
Large Difference Results SummaryLarge Difference Results SummaryLarge Difference Count Table
Auto 1 Auto 2 Auto 3 ManualCtrl-Sun 216 228 250 233Ctrl-Mon 12 14 9 214Ctrl-Tues 7 15 28 25 Frost-Thur - 13.5 16 15 176 129Frost-Thur - 11 36 41 48 35Frost-Fri 80 240 276 99Frost-Sat 11 226 241 261
Difference is not as clear as Difference is not as clear as was earlier believed; was earlier believed;
faulty logic due to magnified faulty logic due to magnified image?image?
Three Rivers Tech Conf - 3-4 Aug 2010
Large Slope Results SummaryLarge Slope Results SummaryLarge Slope Count Table
Auto 1 Auto 2 Auto 3 ManualCtrl-Sun 1 1 1 1Ctrl-Mon 4 1 1 1Ctrl-Tues 1 1 1 2 Frost-Thur - 13.5 1 1 1 1Frost-Thur - 11 1 1 1 2Frost-Fri 1 1 1 1Frost-Sat 1 5 1 1
Difference is not as clear as Difference is not as clear as was earlier believed; was earlier believed;
faulty logic due to magnified faulty logic due to magnified image?image?
Three Rivers Tech Conf - 3-4 Aug 2010
Radiographic detection of frost Radiographic detection of frost damagedamage
Differentiation is certainly possible◦To what degree?
50% moisture at frost is no big challenge
Algorithm/logic needs to be refined◦Slope/difference thresholds need
account for morphology changes over higher pixel countThree Rivers Tech Conf - 3-4 Aug
2010
Haploid & hybrid seedsHaploid & hybrid seeds The inducing of haploid corn from which to generate
more vigorous hybrid lines is desired◦ Currently takes six to eight generations of corn, or 3-4
years, to produce the inbred lines to cross for hybridization
Effective method for inducing haploids would reduce this time to one or two generations◦ Allow for the faster production of hybrid lines◦ Greater freedom to experiment with other seed attributes
Distinguishing between stained and unstained seeds (current method) takes a trained eye and much time
CT scans on seeds were performed◦ Embryos of the haploid seeds were ~7% smaller by
volume than the hybrid seeds
Three Rivers Tech Conf - 3-4 Aug 2010
Comparison of Hybrid & Haploid Comparison of Hybrid & Haploid CollectionsCollections
Haploid Hybrid
Three Rivers Tech Conf - 3-4 Aug 2010
Data Analysis ProcedureData Analysis Procedure
A section of the radiograph was selected and a histogram of that luminance data was generated
Two sections were analyzed for each sample:◦600 pixel diameter circle (not
adequate)◦Oval with 900 & 600 pixel major and
minor radiiThree Rivers Tech Conf - 3-4 Aug 2010
Haploid – Saturday – Haploid – Saturday – 600 x 900 600 x 900 pixel ovalpixel oval
Three Rivers Tech Conf - 3-4 Aug 2010
Luminance profiles of Luminance profiles of Haploid and Hybrid SeedsHaploid and Hybrid Seeds
Three Rivers Tech Conf - 3-4 Aug 2010
Do lower luminance values reflect smaller
embryos?
Results not definitiveResults not definitiveScatter in data may prove
analysis to be hopelessly clumsy
Is data showing density/volumetric info of interest?
Placement/size of measurement area still problematic
Three Rivers Tech Conf - 3-4 Aug 2010
Interest in observing root Interest in observing root structurestructureCommercial system prohibitively
expensive
What can be done?
Three Rivers Tech Conf - 3-4 Aug 2010
Styrofoam HolderStyrofoam HolderConfigured for two plantsConfigured for two plants
Three Rivers Tech Conf - 3-4 Aug 2010
30 kV30 kVEnergy: 30 kVCurrent: 250 µASpot Size: SmallFPS: 1Window Average:
10Source to Detector
Distance: 26”Source to Sample
Distance: ~24”
Three Rivers Tech Conf - 3-4 Aug 2010
40 kV40 kVEnergy: 40 kVCurrent: 250 µASpot Size: SmallFPS: 1Window Average:
10Source to Detector
Distance: 26”Source to Sample
Distance: 20”
Three Rivers Tech Conf - 3-4 Aug 2010
50 kV50 kVEnergy: 50 kVCurrent: 200 µASpot Size: SmallFPS: 1Window Average:
10Source to Detector
Distance: 26”Source to Sample
Distance: 20”
Three Rivers Tech Conf - 3-4 Aug 2010
Images of “Sprout & Grow”Images of “Sprout & Grow”with Bean & Pea plantswith Bean & Pea plants
Energy: 25 kVCurrent: 250 µASpot Size: SmallWindow Average: 10Source to Detector Distance: 24”
Three Rivers Tech Conf - 3-4 Aug 2010
Sprout & Grow Holder – Front Sprout & Grow Holder – Front ViewView
A pea and bean seed grown in water and Styrofoam beads in half of the container.
Three Rivers Tech Conf - 3-4 Aug 2010
Sprout & Grow Holder – Rear Sprout & Grow Holder – Rear ViewView
Three Rivers Tech Conf - 3-4 Aug 2010
Sprout & Grow Holder – Front ViewSprout & Grow Holder – Front View
X-Ray Image
Optical Image
Three Rivers Tech Conf - 3-4 Aug 2010
Sprout & Grow Holder – Rear ViewSprout & Grow Holder – Rear View
X-Ray Image
Optical Image
Three Rivers Tech Conf - 3-4 Aug 2010
ConclusionsConclusionsX-ray imaging of roots quite
possible◦Use Styrofoam beads, not standard
growing media
Scale of imaging important◦Subtle initial growth or large
developed network
Three Rivers Tech Conf - 3-4 Aug 2010
Overall conclusionsOverall conclusionsDigital
radiography is powerful tool for nontraditional applications
Communication of needs, tradeoffs necessary◦ Content revealed
v. inspection rate
Three Rivers Tech Conf - 3-4 Aug 2010
Thank youThank you
Three Rivers Tech Conf - 3-4 Aug 2010