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PUBLIC VERSION UNITED STATES INT ERNATIONAL TRADE COMMISSION Washington, D.C. In the Matter of CERTAIN SEMICONDUCTOR CHIPS WITH MINIMIZED CHIP PACKAGE SIZE AND PRODUCTS CONTAINING SAME .. "I 4 4 Investigation No. 337-TA-432 c3 C: C3 Cd h ". c.; INITIAL DETERMINATION Administrative Law Judge Sidney Harris Pursuant to the Notice of Investigation, 65 Fed. Reg. 25758 (2000), this is the Administrative Law Judge's Initial Determination in the Matter of Cerfain Semicondi~ctor Chips wilh Minirnized Package Size and Products Containing S am, United States International Trade Commission Investigation No. 337-TA-429. 19 C.F.R 9 210.42(a). The Administrative Law Judge hereby determines that a violation of section 337 of the Tariff Act of 1930, as amended, has been found in the importation into the United States, the sale for importation, or the sale within the United States after importation of certain semiconductor chips with minimized package size and products containing same by reason of infringement of claims 6 or 22 of U. S. Letters Patent 5,679,977 and claims 1, 3, or 11 of U.S. Letters Patent 5,852,326.
Transcript

PUBLIC VERSION

UNITED STATES INT ERNATIONAL TRADE COMMISSION Washington, D.C.

In the Matter of

CERTAIN SEMICONDUCTOR CHIPS WITH MINIMIZED CHIP PACKAGE SIZE AND PRODUCTS CONTAINING SAME

. . "I

4 4 Investigation No. 337-TA-432

c3 C: C3 Cd h ". c.;

INITIAL DETERMINATION Administrative Law Judge Sidney Harris

Pursuant to the Notice of Investigation, 65 Fed. Reg. 25758 (2000), this is the

Administrative Law Judge's Initial Determination in the Matter of Cerfain Semicondi~ctor Chips

wilh Minirnized Package Size and Products Containing S a m , United States International Trade

Commission Investigation No. 337-TA-429. 19 C.F.R 9 210.42(a).

The Administrative Law Judge hereby determines that a violation of section 337 of the

Tariff Act of 1930, as amended, has been found in the importation into the United States, the sale

for importation, or the sale within the United States after importation of certain semiconductor

chips with minimized package size and products containing same by reason of infringement of

claims 6 or 22 of U. S . Letters Patent 5,679,977 and claims 1, 3, or 11 of U.S. Letters Patent

5,852,326.

TABLE OF CONTENTS

Page

Opinion

I. Background.. .......................................................................................................... 1

11. Importation and Sale.. ....................................................................................

111. Infringement ........................................ .............................................. 5

A. Claim Construction .........................................................

B. Infringement Determination. ........................................................... 59

. . IV. Validity ...........................................................................................................

. . V. Enforceability ......................................................................................................... 1 11

VI. Domestic Industry.. ................................................................... ............ 113

I.

11.

111.

IV I

V.

VI.

Findings of Fact

Background.. ......................................................................................................... .1 15

Importation and Sale.. ............................................................................................ .13 5

Infringement. .................................... ............................................................. 142

............................................................................ ... ,274

Enforceability. ......... ................................................... ,349

Domestic Industry.. ...................................................................

Conclusions of Law.. ....................................................................................................... .3 56

Initial Determination and Order .................................................................................... .357

I. BACKGROUND

A. Institution and Procedural History of This Investigation

On April 27, 2000, the Commission ordered that this investigation be instituted, based on

a complaint filed by Tessera, Inc., of San Jose, California (“Tessera” or “complainant”).

Consequently, on May 3, 2000, by publication of a Notice of Investigation in the Fbderal

Register, this investigation was instituted, pursuant to section 337 of the Tariff Act of 1930, as

amended, to determine:

(a) whether there is a violation of subsection (a)(l)(B) of section 337 in the importation into the United States, the sale for importation, or the sale within the United States after importation of certain semiconductor chips with minimized chip package size or products containing same by reason of infringement of claims 6 or 22 of U. S . Letters Patent 5,679,977 or claims 1, 3, or 11 of U.S. Letters Patent 5,852,326; and

(b) whether an industry in the United States exists as required by subsection (a)(2) of section 337.

65 Fed. Reg. 25758 (2000).

The Commission named as respondents: Texas Instruments of Dallas, Texas (“Tl”);

Sharp Corporation of Osaka, Japan; and Sharp Electronics Corporation of Mahwah, New Jersey

(collectively, “Sharp” or “respondents.”). Id.

Benjamin D. M. Wood, Esq. of the Ofice of Unfair Import Investigations (OUII) was

designated as the Commission Investigative Attorney. Id.

On June 2, 2000, the Administrative Law Judge issued Order No. 4, setting a target date

and procedural schedule for this investigation. The hearing was scheduled to commence on

October 30, 2000, and May 14, 2001, which was approximately 12 months from the date of

I

institution, was set as the target date for completion of the investigation. On August 23, 2000,

upon the request of complainant and respondents, the Administrative Law Judge issued Order

No. 6, which rescheduled the hearing to commence on January 23, 2001. On November 22,

2000, through Order No. 10, the Administrative Law Judge issued a limited stay of this

investigation to commence on November 30, 2000, for a period of 45 days. The stay issued

because the Administrative Law Judge granted TI’S motion to seek interlocutory review of Order

No. 5, which denied TI’S motion for termination as a respondent. The Administrative Law

Judge’s determination to grant TI leave to apply for interlocutory review of Order No. 5 was

based on an a subsequent opinion by the Court of Appeals for the Federal Circuit concerning

related litigation in Federal District Court and a license agreement which was at issue in this

investigation. On January 22, 2001, the Commission issued an Order continuing the limited stay

during the pendency of the Commission’s interlocutory review of Order No. 5 .

On February 14, 2001, the Administrative Law Judge issued Order No. 16, granting

complainant’s motion to withdraw the complaint allegations as to TI, and to terminate the

investigation as to TI. On February 14, 200 1, the Administrative Law Judge issued Order No.

18, setting a new procedural schedule. In accordance with that Order, the hearing in this

investigation commenced on April 5, 2001.2 However, the hearing did not conclude on April 13,

On March 2, 200 1, the Commission issued its Notice of Commission Determination Not to Review an Initial Determination Granting a Motion to Withdraw All Allegations Against Respondent Texas Instruments Incorporated, and to Terminate the Investigation As to That Respondent; and of Commission Determination to Terminate As Moot Commission Review of ALJ Order No. 5 and to Terminate Limited Stay.

No jurisdictional challenge was made in this investigation. The Administrative Law Judge finds that the Commission has personal jurisdiction over the parties, and subject matter

(continued., .)

2

2001, as scheduled. The hearing concluded on April 19, 2001, with a pending request by

respondents to reopen the record at some later date to receive additional, allegedly

newly-discovered evidence, proffered on the question of patent validity. On June 1, 2001 , the

Administrative Law Judge issued Order No. 33, which denied respondents’ Motion No. 432-80

to reopen the hearing record in this investigation.

On April 23, 2001, the Administrative Law Judge issued Order No. 30, an initial

determination extending the target date for completion of this investigation to January 25, 2002.

On May 23, 200 1, the Commission issued its Notice of a Commission Determination Not to

Review an Initial Determination Extending the Target Date for Completion of the Investigation.

The following abbreviations may be used in this Initial Determination:

ALJ - Administrative Law Judge

cx - Complainant’s Exhibit

CPX - Complainant’s Physical Exhibit

Dep. - Deposition

EDIS - Electronic Document Imaging System

FF - Finding(s) of Fact

PCL - Proposed Conclusion of Law

PFF - Proposed FF (CPFF, RPFF or SPFF)

R x - Respondents’ Exhibit

(. ..continued) jurisdiction over this investigation. See, e.g., Op., Section 11; FF, Sections I1 and IV G.

3

RPX - Respondents’ Physical Exhibit

sx - Commission Investigative Staff (OUII) Exhibit

Tr. - Transcript.

B. The Products at Issue

The Sharp products at issue involve semiconductor technology, and in particular, chip

scale packages (“CSPs”) in which the semiconductor package is nearly the same size as the

silicon chip. CSPs include small, reliable solder connections directly under the chip, thereby

allowing the package to take up a small amount of space on the printed circuit board (“PCB”) on

which it is mounted. See Engelmaier Tr. 705-707.

When an integrated circuit package heats up and cools down, through repeated cycles, the

circuit board and the semiconductor chip will expand and contract differently, according to the

difference in their coefficients of thermal expansion (“CTE’)). See McWilliams Tr. 43-44. This

phenomenon can lead to reliability problems associated with the solder joints. See, e.g.,

Engelmaier Tr. 670-680. Tessera takes the position that Sharp’s solution to this problem is to

use inventions of the ‘977 and ‘326 patents, which, Tessera argues, revolutionized semiconductor

packaging and permitted the use of compact packages that are also reliable. Sharp denies that its

products use the claimed inventions.

11. IMPORTATION AND SALE

The statutory requirement of importation and/or sale has not been raised as a significant

issue in this investigation. Respondents have sold for importation, imported and/or sold aRer

4

importation the accused products. See FF, Section 11 and Section IV G.

111. INFRINGEMENT

Tessera asserts dependent claim 6 (and independent claim 1 from which clam 6 depends)

and claim 22 of the ‘977 patent,3 and claimsl, 3 and 11 of the ‘326 patent. Tessera argues that all

of Sharp’s CSP semiconductor chip products, including but not limited to Sharp’s F800BGHB

8Mb flash memory device and F16OS3HB 16Mb flash memory device practice the asserted

patent claims. Lists of Sharp’s CSP semiconductor chip devices are attached as Attachment 1

and 2 to Respondents Sharp Corporation and Sharp Electronics Corporation’s First Supplemental

Responses to Complainant Tessera, Inc.’s Interrogatories, Nos. 1-3, 5-14, 18-19, 22-36, 45, 47-

50, 53-58, 62-64. See CX-14C. Sharp disclosed additional CSP products in Attachment One to

c x - 2 2 c .

A finding as to infringement or non-infringement requires a two-step analytical approach.

First, the claims of the patent must be construed to determine their scope. Carroll Tomch, Inc.,

15 F.3d at 1576. Second, a determination must be made as to whether the properly construed

claims read on the accused device. Id. Accord Vitronics Corp. v. Conceptronic, Inc., 90 F.3d

1576, 1581-82 (Fed. Cir. 1996).

A. Claim Construction

1. The General Law Pertaining to the Interpretation of Patent Claims

Carroll Touch Inc. v. Electro Mechanical Sys., Inc., 3 F.3d 404, 407 (Fed. Cir. 1993) (“Although claim 24 was the only claim asserted at trial, it is turn is dependent on claim 16, which in turn is dependent on addressing whether claim 24 was infringed by the accused . . whether claim 1 was infringed.”).

dependent on claim 23, which in independent claim 1. Thus, in . products, we must consider

5

Claim construction is a question of law decided by the court. Markman v. Westview

Instruments, Inc., 52 F.3d 967, 979 (Fed. Cir.l995)(en hanc), aff’d, 517 U.S. 370 (1996).

To construe a claim, one first looks to the claim language. Pitney Bowes, Inc. v.

Hewlett-Packard Co., 182 F.3d 1298, 1305 (Fed. Cir.1999)( “The starting point for any claim

construction must be the claims themselves.”); Comark Communications, Inc. v. Harris Corp.,

156 F.3d 11 82, 1186 (Fed. Cir. 1998) (“The appropriate starting point . . . is always the language of

the asserted claim itself.” ). Then, one looks to the rest of the intrinsic evidence, beginning with

the specification and concluding with the prosecution history, if in evidence. Vitronics, 90 F.3d at

1582; Maihnan, 52 F.3d at 979 (“Claims must be read in view of the specification, of which they

are a part.”).

If the claim language is clear on its face, then a court’s consideration of the rest of the

intrinsic evidence is restricted to determining if a deviation from the clear language of the claims

is specified. Interacfive Gift Express, Inc. v. Conipuserve Inc., 23 1 F.3d 859, 865 (Fed.

Cir.2000). A deviation may be necessary if, for example, “a patentee [has chosen] to be his own

lexicographer and use[s] terms in a manner other than their ordinary meaning.” Id. (quoting

Vitronics, 90 F.3d at 1582).4 A deviation may also be necessary if a patentee has “relinquished

[a] potential claim construction in an amendment to the claim or in an argument to overcome or

distinguish a reference.” Inferactive G@ Express, 23 1 F.3d at 865 (quoting EIkay Mfg. Co. v.

E l m Mfg. Co., 192 F.3d 973, 979 (Fed. Cir. 1999). If, however, the claim language is not clear

on its face, then a court’s consideration of the rest of the intrinsic evidence is directed to

Any special definition given to a word must be clearly defined in the specification Marknzan, 52 F.3d at 980.

6

resolving, if possible, the lack of clarity. Interactive G f t Express, 23 1 F.3d at 865.

In looking to the specification to construe claim terms, care must be taken to avoid

reading “limitations appearing in the specification . . into [the] claims.” Intervet Am., Inc. v.

Kee-Vet Lab., Inc., 887 F.2d 1050, 1053 (Fed. Cir. 1989). Examples or embodiments appearing

in the written description may not be read into a claim. One looks “to the specification to

ascertain the meaning of the claim term as it is used by the inventor in the context of the entirety

of his invention,” and not merely to limit a claim term. C‘omark, 156 F.3d at 1 186-87.

If the meaning of the claim limitation is apparent from the totality of the intrinsic

evidence, then the claim has been construed. If, however, a claim limitation is still not clear, one

may look to extrinsic evidence to help resolve the lack of ~ l a r i t y . ~ Relying on extrinsic evidence

to construe a claim is “proper only when the claim language remains genuinely ambiguous after

consideration of the intrinsic evidence.” Bell & Howell Docunzenf Mgmf. Prods. C‘o. v. AItek Sys.,

132 F.3d 701, 706 (Fed. Cir.1997); Vitronics, 90 F.3d at 1583-85 (“Such instances will rarely, if

ever, occur.”). Extrinsic evidence may always be consulted, however, to assist in understanding

the underlying technology. See Pifney Bowes, 182 F.3d at 1309 (“[C]onsultation of extrinsic

evidence is particularly appropriate to ensure that [a judge’s] understanding of the technical

aspects of the patent is not entirely at variance with the understanding of one skilled in the art.”);

Vitronics, 90 F.3d at 1585 (“Had the district court relied on the expert testimony and other

extrinsic evidence solely to help it understand the underlying technology, we could not say the

Dictionaries are a form of extrinsic evidence with a special place in claim construction, and may sometimes be considered along with the intrinsic evidence. See Vitronics, 90 F.3d at 1584 n. 6 (stating that, although technically extrinsic evidence, the court is free to consult dictionaries at any time to help determine the meaning of claim terms, “so long as the dictionary definition does not contradict any definition found in or ascertained by a reading of the patent documents”).

5

7

district court was in error.”). Extrinsic evidence may never be used “for the purpose of varying

or contradicting the terms in the claims.” Markman, 52 F.3d at 98 1.

Throughout the claim construction process, the claims are construed in view of a person

skilled in the art.‘ Intellicall, Inc. v. Phonometvics, Inc., 952 F.2d 1384, 1387 (Fed. Cir.1992);

Hoechsf Celanese Coip 11. BP Cheins. Lfd, 78 F.3d 1575, 1578 (Fed. Cir.1996) (The court

assigns a claim term the meaning that it would be given by persons experienced in the field of the

invention.).

2. The Claims at Issue

The asserted claims of the ‘977 patent are as follows:

1. A semiconductor assembly comprising a semiconductor chip having a plurality of surfaces and having contacts on at least one of said surfaces and a flexible sheetlike element having terminals thereon, and flexible leads electrically connecting said terminals to said contacts, wherein said sheetlike element and at least some of said terminals overlie one said surface of said chip and said sheetlike element bears upon such surface of said chip, said terminals are movable with respect to said chip and said contacts, said flexible leads and said flexible sheetlike element being adapted to deform to accommodate movement of said terminals with respect to said contacts.

* * *

6 . A chip assembly as claimed in claim 1 or claim 2 or claim 3 or claim 4 wherein said chip has oppositely-facing front and rear surfaces, said contacts are disposed on said front surface, and said sheetlike element and said terminals overlie said rear surface of said chip.

* * *

‘ The hypothetical person of ordinary skill in the art in 1990 is someone who had an engineering degree with four to five years of industry experience in electronic packaging, with an interest in the reliability of electronic products. Engelmaier Tr. 653 -654, 707-708.

8

22. A semiconductor chip assembly as claimed in claim 1 firther comprising a substrate having contact pads thereon, said sheetlike element being disposed between said chip and said substrate, each said terminal being connected to one said contact pad of said sub st r at e.

CX-2/RX-1 (‘977 Patent).

The asserted claims of the ‘326 patent are as follows:

1. A semiconductor assembly comprising:

a semiconductor chip having oppositely facing front and rear surfaces and edges extending between said front and rear surfaces, said chip firther having contacts on a peripheral region of said front surface;

a backing element having electrically conductive terminals and lead portions thereon, wherein said lead portions are connected to said terminals, said backing element overlying said rear surface of said semiconductor chip such that at least some of said terminals overlie said rear surface of said chip;

bonding wires connected to said contacts on said front surface of said chip, said bonding wires extending downwardly alongside said edges of said chip and being connected to the lead portions on the backing element;

wherein said terminals are movable with respect to said chip.

* * *

3. The semiconductor assembly as claimed in claim 1, wherein said backing element is flexible to facilitate the movement of the terminals with respect to the chip.

* * *

9

11. The semiconductor assembly as claimed in claim hrther including bonding material attached to said terminals through said holes.

CX-URX-2 (‘326 Patent).

3. Interpretation of the Term “Movable,” As Used in Both the ‘977 and ‘326 Patents

Independent claim 1 of the ‘977 patent contains the following element: said terminals are

movable with respect to said chip and said contacts. CX-2 (‘977 Patent), col. 34, lines 9-10

(emphasis added). Independent claim 1 of the ‘326 patent contains the following element:

wherein said terminals are niovahle with respect to said chip. CX-1 (‘326 Patent), col. 34, lines

35-36 (emphasis added). The parties dispute the proper meaning of the term “movable” as used

in the patents at issue. Inasmuch as the ‘977 and ‘326 patent specifications are virtually identical,

and the term is used similarly in the patents, e.g., to refer to terminals that are movable, the

parties have presented their arguments pertaining to the term “movable” in general sections

applicable to both patents. The Administrative Law Judge has also determined that the most

As stated in claim 11 of the ‘326 patent, it depends from claim 10. Claim 10 depends from dependent claim 9. Claims 9 and 10 of the ‘326 patent are as follows:

9. The semiconductor assembly as claimed in claim 1, wherein:

a) said backing element has a top surface facing toward the chip and a bottom surface facing away from the chip; and

b) said lead portions and terminals are located on said top surface of said backing element.

10. The semiconductor assembly as claimed in claim 9, the backing element fbrther including holes therethrough from said top surface to said bottom surface, wherein the terminals are exposed through said holes.

C X - 1 M - 2 (‘326 Patent).

efficient way to discuss the term “movable” is to do so in a section applicable to both the ‘977

and ‘326 patents.

Dictionary definitions of “movable” may include: “inclined to move or quick in

movement . . , capable of being moved . . . not fixed . . . not stationary.” See Wehster ’,s Third

New Int ’I Dictiorinry 1479 (1976). However, each of the parties implicitly or explicitly

acknowledge that a simple dictionary definition of the term does not settle the disputes

concerning the movable terminals covered by the claims at issue. See, e.g , OUII Post-Hearing

Br. at 19 (“[Olne of ordinary skill in the art would understand from the patent disclosure and

prosecution history that ‘movable’ in the context of the present invention has a special meaning

and particular limitations.”). In connection with their arguments, the parties rely on the claims,

the lengthy remainder of the specification, the prosecution history, and in some cases extrinsic

evidence. The claim construction disputes pertain to: (1) the type of movement involved (Le.,

whether there are limitations requiring “fixed position” movement, including limitations as to the

direction of the movement), (2) the amount of movement required for “movable” terminals (i.e.,

whether terminals should be considered “movable” only if they compensate for a specific amount

of thermal expansion, or only if the movement of the terminals relieves a specific amount of

.

stress on solder joints), and (3) the conditions in which the claimed movement will occur (Le.,

whether there are limitations on operating or testing temperatures, and if so, the temperature

parameters).

Complainant Tessera argues that “[als properly construed, one of ordinary skill in the art

would understand that ‘movable’ refers to terminals that can move relative to the chip to provide

substantial compensation for differential thermal expansion, and thus significantly improve

solder joint reliability.” See Tessera’s Post-Hearing Br. at 13-14. Tessera argues that one of

ordinary skill who focuses on the claims and specification would never adopt respondents’

proposed claim construction, which requires “fixed position’’ movement, ostensibly to relieve all

or substantially all stress on the solder joints. Indeed, Tessera denies that the limited movement

proposed by Sharp would relieve all or substantially all of the stress on the solder joints. See,

e.g., Tessera’s Reply to Sharp’s Br. at 6- 7. Tessera argues that the movement covered by the

claims may occur in any direction. See, e.g., Tessera’s Post-Hearing Br. at 17. Tessera rejects

the argument that the claims require decoupiing or a compliant layer for the moveable terminals.

See, e.g., Id,; Tessera’s Reply to Sharp’s Br. at 8. Tessera hrther rejects arguments that seek to

limit “movable” to movement that occurs only when the chip package is turned on, or over a

“normal operating temperature” of the package. See, e.g., Tessera’s Reply to Sharp’s Br. at 9.

Tessera’s Reply to OUII Br. at 3 .

The Sharp respondents argue that one of ordinary skill in the art would discern from the

intrinsic evidence that the term “moveable” means movement of the terminals that compensates

for the thermal expansion between the chip package and the PCB. In particular, Sharp argues

that movement which compensates for differential thermal expansion is “fixed position”

movement, resulting in the relief of all or substantially all of the stress and strain on the solder

ball joints by which the solder ball joints of the chip package become substantially resistant to

fatigue failures caused by thermal cycling. Sharp argues that the “fixed position” movement

required as a result of the prosecution history means that the terminals will move in tandem with,

and to the same general extent as, the solder pads on the PCB substrate. See Sharp’s

Post-Hearing Br. at 5-8.

12

Sharp has illustrated the type of “fixed position” or “in tandem” movement that it

proposes, as follows:

Sharp’s Post-Hearing Br. at 1.

As seen in Sharp’s illustration, points located along an axis running from the top of the

solder ball (where the terminal is located) through the solder ball to the bottom of the solder ball

(where the contact is located) move in a strictly horizontal direction and remain in the same

relationship to each other as the entire solder ball moves, seemingly free of stress and strain.

The Commission Investigative Staff argues that in the context of the present invention

“‘movable’ means movable to an extent necessary to serve the inventors ’purposes, as

understood by one of ordinary skill in the art.” OUII Post-Hearing Br. at 19 (emphasis in

original)(citing Wright Medical Technology, Inc. v, Osteonics Corp., 122 F.3d 1440, 1443 (Fed.

13

Cir. 1 997)).8 Based on the patent specifications, the Staff argues that “the claimed movability

must occur during the operation of the chip, and must be sufficient to improve the reliability of

the chipRCB interconnections to a degree significant to one of ordinary skill in the art.”’ The

Staff argues that there is no particular purpose to be gained by relieving all or substantially all of

the mechanical stress on the solder joints, that not all stress is harmful, and it would be

impractically difficult to relieve all of it. OUII Post-Hearing Br. at 22-23.

The plain language of the patent claims in most cases provides answers to most of the

disputed questions. The claims at issue of both ‘326 patent and the ‘977 patent read on a

semiconductor assembly that includes a semiconductor chip. The claims of the patents require

that the terminals be located on “a backing element” which overlies the rear surface of the chip,

in the case of claim 1 of the ‘326 patent - or, in the case of the ‘977 patent, on “a flexible

sheetlike element” which overlies one surface of the chip. In the case of claim 1 of the ‘326

’ The Federal Circuit’s opinion in the Wrighi case quotes the court’s earlier opinion in Bausch & Lonib, Inc. v. BarMes-Hind/Hydrocurve, Inc., 796 F.2d 443 (Fed. Cir. 1986), which contains language similar to that relied on by the Staff. See Bausch & Lonzh, 796 F.2d at 450 (“We hold that smooth means smooth enough to serve the inventor’s purpose.”). However, by rejecting such a claim construction in the Wr.ight case, it is evident that under Federal Circuit precedent, such a claim construction does not apply in all cases in which a claim element is modified by an adjective, adverb or similar phrase, e.g., “smooth,” “SO that” or “closely fit.” Rather, it applies only when it is in agreement with the particular disclosure made by a patent’s claims, specification and prosecution history. See Wright, 122 F.3d at 1443. One cannot limit a claim only to the extent that it “serves the inventor’s purpose” and thereby ignore other genuine claim limitations. See Id at 1444 (“Wright does not seek to interpret the claim terms, as we did in Laitrani [Corp. 11. Cambridge Wire Cloih Co., 863 F.2d 855, 858 (Fed. Cir.1988)] and Bausch & Lomh, but seeks to eviscerate them.”).

From the Staffs discussion of the infringement issues, it is clear that the Staff argues that only movement during normal operation of a device is relevant. The Staff relies on test data allegedly pertaining only to the “normal operation” of Sharp’s accused CSP products. See OUII Post-Hearing Br. at 29.

14

patent, the specific claim language pertaining to the movable nature of the terminals requires that

the “terminals are movable with respect to said chip.” In the case of claim 1 of the ‘977 patent,

the claim language requires that the “terminals are movable with respect to said chip,” and

firther expressly specifies that the terminals be movable with respect to “said contacts,” i.e., the

contacts on at least one surface of the semiconductor chip.

The claim language does not state how much stress must be relieved by movement of the

terminals. Although the claim language states that the terminals must be movable with respect to

the chip or the contacts on the PCB, it does not specify the sort of “in tandem” movement

proposed by respondents. Furthermore, the asserted claim language requires a “backing element”

or a “flexible sheetlike element.” Yet, it does not specify “decoupling” or a “compliant layer,” as

proposed by respondents. Indeed, the ‘326 patent’s claim 17 (which depends from claim 1 or

claim 4 and is not asserted in this investigation), and the ‘977 patent’s claim 2 (which depends

from claim 1 and is not asserted in this investigation) add limitations requiring a compliant

layer.’” Thus, it would be expected that the asserted claims would not contain limitations added

‘‘I Claim 17 of the ‘326 patent is as follows:

17. The semiconductor assembly as claimed in claim 1 or claim 4, further comprising a compliant layer disposed between said backing element and said rear surface of said chip to facilitate the movement of said terminals.

CX-1 (‘326 Patent).

Claim 2 of the ‘977 patent is as follows:

2. An assembly as claimed in claim 1 wherein said sheetlike element includes a compliant layer disposed between said terminals and said chip.

CX-2 (‘977 Patent). (continued.. .)

15

in dependent claims. See Doiv C‘hein. Co. v. UnifedSfafes, 226 F.3d 1334, 1341- 42 (Fed. Cir.

2000)(applying the doctrine of claim differentiation and concluding that an independent claim

should be given broader scope than a dependent claim to avoid rendering the dependent claim

redundant); Karlin Tech., Inc. v. Surgical Dynamics, hzc., 177 F.3d 968, 971-72 (Fed.

Cir. 1999)(explaining that the doctrine of claim differentiation “normally means that limitations

stated in dependent claims are not to be read into the independent claim from which they

depend”).

The language of the asserted claims does not place limitations on direction of movement

or whether movement is in tandem with the solder balls. However, with respect to the question

of direction, unasserted claim 24 of the ‘326 patent, which depends from claim 1, explicitly adds

the limitation that movement must be in directions parallel to the chip surface, i.e. horizontal

movement.” Unasserted claim 25 of the ‘326 patent, which also depends from claim 1,

(. . .continued) Claims 3 and 4 of the ‘977 patent fbrther limit the compliant layer by specifling properties of

the compliant layer required by claim 2, as follows:

3. A chip assembly as claimed in claim 2 wherein said compliant layer is formed from an elastomeric material.

4. A chip assembly as claimed in claim 2 wherein said compliant layer includes masses of a low modulus material and holes interspersed with said masses of low modulus material, said masses of said low modulus material being aligned with said terminals, said holes in said compliant layer being out of alignment with said terminals.

CX-2 (‘977 Patent).

l 1 Claim 24 of the ‘326 patent is as follows:

24. The semiconductor assembly as claimed in claim 1, wherein said terminals are (continued.. .)

16

explicitly adds the limitation that the movement must be perpendicular to the chip surface, Le.,

vertical movement.

movement of the terminals that is both parallel and perpendicular to the rear surface of the chip. l 3

Thus, one would expect that independent claim 1 would be broad enough to cover both types of

movement, and would not be restricted to horizontal movement, as proposed by respondents.

See Desper Prods., Inc v. QSoundLahs, Inc., 157 F.3d 1325, 1338 n.5 (Fed. Cir.

1998)(dependent claims are necessarily narrower than the independent claims from which they

depend); Wahpeton Canvas Co., Inc. v. Frontier, Inc., 870 F.2d 1546 (Fed. Cir. 1989) (“It is

axiomatic that dependent claims cannot be found infringed unless the claims from which they

Claim 25 may also depend from claim 24, and thereby literally cover

I ’ (...continued) movable in a direction parallel to said rear surface of said chip.

CX-1 (‘326 Patent).

l 2 In its reply brief, Sharp appears to concede that perpendicular movement of the terminals in this context is the same as vertical movement. See Sharp’s Rebuttal Br. at 5. Nevertheless, Sharp argues the only vertical movement of terminals disclosed in the specification concerns the testing of chip contacts by probes, and that thus under Tessera’s analysis, claim 25 would lack support in the specification and would be invalid under 35 U.S.C. 6 112, fl 1. Id. However, it is not clear that the only disclosure of vertical movement is in fact in the context of testing. See, e.g., CX-1 (‘326 Patent) col. 3, lines 61-64; col. 8, lines 1-8. Moreover, if vertical movement is specifically discussed only in the context of testing, the significance of that fact would be unclear.

l3 Claim 25 of the ‘326 patent is as follows:

25. The semiconductor assembly as claimed in claim 1 or claim 24, wherein the terminals are movable in a direction perpendicular to said rear surface of said chip.

CX-1 (‘326 Patent).

17

depend have been found to have been infringed . . . . ” ) . I 4

No claim in either the ‘326 patent or the ‘977 patent contains an explicit limitation of

temperature associated with the movable terminals. The specifications of the ‘326 and ‘977

patents contain little information concerning temperature, other than to state under the caption

“TECHNICAL FIELD” that thermal cycling occurs when interconnection structures connecting a

chip to a substrate ordinarily are subject to substantial strain caused by thermal cycling as

temperatures within a device change during operation. See CX-l/RX-2 (‘326 Patent), col. 2,

lines 4-26; CX-2RX-1 (‘977 Patent), col. 1, line 59 - col. 2, line 14. While this is pertinent

background to the claimed inventions, it. does not elucidate any claim term.

The claim language would be significant to one of ordinary skill in the art, who would

understand more than a lay person about the terminals and their movement simply by reading the

claims. See, cg. , Engelmaier Tr. 724.‘ Nevertheless, reference must be had to the remainder of

the specification to be sure that the claims are properly construed and to resolve the specific

disputes about the term “movable” which the parties have raised in this investigation.

In the specification, the “SUMIVLARY OF THE INVENTION” portion begins with a description

of the physical features of one aspect of the invention, and thereby introduces a discussion of

how movement will occur according to the invention. The Summary begins with the following

paragraph:

One aspect of the present invention provides a semiconductor chip assembly. An assembly according to this aspect of the invention

It appears that the patentee in writing dependent claims that cover all possible types of 14

movement encompassed in the term “movable” sought to be particularly carehl not to exclude any type of movement from claim coverage. The patentee may also have added these dependent limitations to protect against patent invalidity. See, e.g., D. Chisum, Patents, Ej 8.06[5] (1998).

18

typically includes a semiconductor chip having a plurality of surfaces and having contacts on at least one of said surfaces. The assembly fbrther includes a sheetlike, preferably flexible, element having terminals thereon, the terminals being electrically connected to the contacts on the chip. Assemblies according to this aspect of the invention are characterized in that the sheetlike element and at least some of said terminals overly one surface of said chip, said terminals are movable with respect to said chip and in that resilient means for permitting displacement of the terminals toward the chip, but resisting such displacement are provided. Most preferably, a compliant layer is disposed between said terminals and said chip so that said compliant layer will be compressed upon movement of said terminals toward said chip.

CX-1 (‘326 Patent), col. 3, lines 48-64; CX-2 (‘977 Patent), col. 3, lines 34-51.

Thus, from the outset it is clear that a compliant layer, located between the terminals and

the chip, while preferable, is an optional element and need not be present according to the

invention. It is also clear that some “displacement of the terminals toward the chip” and

“movement of said terminal[s] toward said chip” is expected and accounted for in the invention,

with or without the complaint layer. Thus, perpendicular, or vertical, movement is disclosed in

the specifications

The Summary quickly proceeds to a short discussion of thermal expansion, as follows:

Because the terminals, and hence the contact pads on the substrate overlie the chip front or back surface, the assembly is compact. The ability of the terminals to move with respect to the chip in directions parallel to the chip surfaces provides compensation for differential thermal expansion of the chip and substrate.

C X - I N - 2 (‘326 Patent), col. 4, lines 6-1 1.

Consequently, in addition to perpendicular or vertical movement, movement parallel to

the chip surfaces, i.e., horizontal movement, is taught in the specification, as is the use of such

movement to compensate for differential thermal expansion.

19

In the Summary, there is no quantification of the amount of movement to be expected by

a device practicing the invention. Nor is there any discussion of operating temperature or

temperature parameters for testing the movable nature of the terminals. The Summary portion of

the specification does, however, support the claims, discu’ssed above, which demonstrate that a

semiconductor assembly according to the invention may or may not include a compliant layer.

See CX-I (‘326 Patent), col. 3, lines 61-65 (“Most preferably, a compliant layer is disposed

between said terminals and said chip so that said compliant layer will be compressed upon

movement of said terminals toward said chip.”); col. 4, lines 24-29 (“Methods according to this

aspect of the invention desirably are characterized . . . in that a compliant layer is disposed

between said chip and said terminals.”); col. 5, lines 14-16 (“The assembly according to this

aspect of the invention optionally may include a compliant layer as discussed above.”); col. 6,

lines 11-14 (“Here again, the assembly may optionally include a compliant layer as discussed

above.”); col. 8, lines 6-8 (“Desirably, the terminals on the backing elements are also moveable

relative to the chip in directions towards the bottom surface of the chip as discussed above, and

the assembly may include resilient means for permitting movement of the terminals towards the

bottom surface but resisting such movement. For example, the assembly may incorporate a layer

of a compliant material disposed between the chip rear surface and the terminal^.").'^

l 5 Sharp argues that the asserted claims must be interpreted to require a compliant material located between the terminals and the chip (if they are attached). It is argued that if the claims are not so interpreted, they lack written description support and are invalid under 35 U.S.C. 9 112. See Sharp’s Post-Hearing Br. at 15. However, as discussed, supra, the specification unequivocally states that a compliant layer, while preferable, is an optional element and need not be present according to the invention. Furthermore, Sharp has not demonstrated by clear and convincing evidence that its proposed narrower interpretation of the disputed claims is the only possible interpretation. See OUII Post-Hearing Br. at 36 (citing Johnson Worldwide A.s~socs., Inc.

(continued.. .)

20

The portions of the ‘326 and ‘977 patent specifications that contain a discussion of the

preferred embodiments of the claimed invention (“DETAILED DESCRIPTION OF THE PREFERRED

EMBODIMENTS”) are identical in the two patents, and include references to the following Figures

2 and 3 .

CX-l/RX-2 (‘326 Patent); CX-2RX-1 (‘977 Patent).

In Figure 2, a rigid substrate 20 has a top surface 22 on which contact pads 24 are

disposed. A semiconductor chip 28 is depicted above the substrate 20. The chip 28 has a

generally planar rear face 36, and a generally planar front face 38 on which electrical contacts 40

l5 (...continued) v. Zehco C o p , 175 F.3d 985, 993 (Fed. Cir. 1999).

21

are disposed. The electrical contacts 40 are electrically connected to the internal electronic

components of the chip 28. The chip is mounted on the substrate 20 in a front-face-down

orientation, i.e., with the front face 38 of the chip facing toward the top surface 22 of the

substrate. In this embodiment, a flexible, sheetlike, dielectric interposer 42 is located between

the chip and the substrate. The interposer may incorporate one or more layers (not depicted), and

prqferahly includes a compliant, compressible layer. l6 The interposer 42 has a plurality of

terminals 48 on its second face 46. Each terminal is associated with one of the contacts 40 on the

chip and is connected to a contact 40 by a flexible lead 50. The lead associated with each

l 6 As indicated in detail above with respect to the Summary portion of the specification and the embodiment depicted in Figures 2 and 3, the interposer may have a plurality of layers, and may include a compliant layer. Where an embodiment of the invention includes more than one layer, the specifications of the ‘326 and ‘977 patents provide as follows:

In an assembly method according to one embodiment of the invention, a sheet-like dielectric interposer 836 is assembled to chip 820. Interposer 836 includes a flexible top layer 838 (FIG. 13) formed by a thin sheet of material having a relatively high elastic modulus and a compliant bottom layer 840 formed from a material having a relatively low elastic modulus. The high-modulus material of top layer 838 may be a polymer such as a polyimide or other thermoset polymer, a fluoropolymer or a thermoplastic polymer. The compliant, low-modulus material of bottom layer 840 may be an elastomer. Desirably, the low-modulus material has elastic properties (including modulus of elasticity) comparable to those of soft rubber, about 20 to 70 Shore A durometer hardness. Interposer 836 has a first or bottom surface 842 defined by bottom layer 840 and a second or top surface 844 defined by top layer 838. Bottom, compliant layer 840 includes holes or voids 841 interspersed with masses 843 of the low-modulus material.

See CX-1RX-2 (‘326 Patent), col. 17, lines 45-62; CX-2/RX-1 (‘977 Patent), col. lines 32-49.

Such “particular embodiments appearing in a specification will not be read into the claims when the claim language is broader than such embodiments.” EIectro Med. S’s. S.A. v. Cooper Life Sci., Inc., 34 F.3d 1048, 1054 (Fed. Cir.1994). See also Intervet, 887 F.2d at 1053 (Care must be taken to avoid reading “limitations” appearing in the specification into the claims.).

22

terminal 48 has a contact end 56 which is disposed within an associated aperture 54 and

connected to the associated contact on the chip. An elastomeric, dielectric encapsulant 60 is

disposed in the apertures 54 so that the encapsulant covers the contact ends 56 of the leads 50

and the junctures of the leads with the contacts 40. Each lead also has a terminal end 58

connected to an associated terminal 48. Each terminal is also associated with one contact pad 24

on the substrate 20, and each terminal 48 is bonded to the associated contact pad 24 by a mass 52

of electrically conductive binding materials such as solder or a conductive polymer. Thus, the

contacts on the chip are interconnected via leads, terminals and masses (such as solder) with the

contact pads on the substrate. CX-1 (‘326 Patent), col. 10, line 23 - col. 11, line 18; CX-2 (‘977

Patent), col. 10, line 11 - col. 11, line 5.

Sharp argues that contrary to the description of one embodiment of the invention depicted

in Figures 2 and 3, when the terminals are attached to the chip, a compliant layer must be used,

and that when the terminals are decoupled from the chip, a compliant layer is not required.

Sharp’s argument depends, however, on its own particular reading of the claims and the

specifications which does not hold up upon scrutiny. For example, in its reply brief Sharp

argues :

Claim I does not require a compliant layer. However, the patents clearly state that when the terminals are physically attached to the chip (e.g., by a “die bond”), a coniplimt mnterial must be located between them in order for the terminals to remain “movable.” (RX-2, Col. 22, lines 9-20) Thus, a compliant layer is not required when the chip is literally decoupled from the substrate (i.e., unattached). When a die attach is used, a compliant layer is necessary to effectively decouple the chip and substrate.

Sharp’s Rebuttal Br. at 13

23

The portion of the specification cited by Sharp discusses a specific embodiment of the

claimed invention, which is an “alternate” arrangement to that depicted in Figures 11-14. In this

alternate arrangement, an interposer incorporates a “flexible top layer similar to the top layer 838

of the interposer discussed . . . with reference to FIGS. 11-14.” The “[tlerminals and leads are

positioned on the first or bottom surface of this layer, so that the terminals face toward the chip

when the layer is in position on the chip.” See C X - I N - 2 (‘326 Patent), col. 22, lines 3-8.

However, the subsequent 12 lines, relied on by Sharp, address the question of how horizontal

movement is to be accommodated in such an arrangement in which the terminals face toward the

chip. However, there is no indication that one wishing to practice the claimed invention must

stay within the construct proposed by Sharp, Le., terminals attached to the chip with a compliant

layer versus decoupled chip and terminals with no compliant layer. The construct argued by

Sharp is necessary to support its argument concerning horizontal, “fixed position” or “in tandem”

movement, which neither the claims nor the specification support.

Indeed, in addition to a description of many physical characteristics of this embodiment,

the specifications of the ‘326 and ‘977 patents also discuss the behavior of the interposer and the

terminals. With reference to the embodiment depicted in part by Figure 3, the specification

states:

The contact end 56 of each lead 50 is moveable relative to the associated terminal 48. As best seen in FIG. 3, the contact end 56n of lead 50n can be displaced from its normal, undeformed position (shown in solid lines) in the directions parallel to the faces 44 and 46 of interposer 42 and parallel to the front face 38 of chip 28. For example, the contact end 56n may be displaced to the position indicated in broken lines at 56n’. This displacement is permitted by the flexibility of the lead 50 and by buckling and wrinkling of interposer 42. Encapsulant 60 is compliant, and does not substantially

24

resist flexing of leads 50 and buckling and wrinkling of interposer 42. The displacement illustrated in FIG. 3, from the normal undisplaced position 56a to the displaced position 56a’ places the lead 50 in compression. That is, the terminal end 56n moves generally toward the associated terminal 48 in moving from position 56n to position 56n’. Movement in this direction is particularly well accommodated by buckling of the lead 50. The contact end of each lead can also move in other directions, such as in the opposite direction from position 56n away from the associated terminal 48, and in directions perpendicular to these directions, into and out of the plane of the drawing as seen in FIG. 3 .

CX-1R.X-2 (‘326 Patent), col. 1 1 , lines 19-41; CX-2RX-1 (‘977 Patent), col. 11, lines 6-28

Thus, the specification describes “buckling and wrinkling” of the interposer upon which

the terminals are located. Such action does not connote uniform movement, such as strictly

horizontal or strictly vertical. Indeed, while the illustration of Figure 3 depicts movement

parallel to the faces 44 and 46 of interposer 42 and parallel to the front face 38 of chip 28, the

portion of the specification quoted above states that the terminal end 56n moves generally toward

the associated terminal 48 in moving from position 56n to position 56n’. In addition, the

specification teaches that the movement depicted in Figure 3 is not the only movement that may

occur or that the invention is designed to accommodate. The specification explicitly states that

“[tlhe contact end of each lead can also move in other directions, such as in the opposite

direction from position 56a away from the associated terminal 48, and in directions

perpendicular to these directions, into and out of the plane of the drawing as seen in FIG. 3.”

Such movement of the contact end of the lead follows from movement of the interposer, which is

not described as, e.g., sliding, shifting or any other movement that could possibly be thought of

as strictly horizontal or parallel in nature. Rather the “movable” characteristic of the terminals is

better understood when one considers the movement of the interposer in this preferred

25

embodiment, which bears the terminals and, as discussed above, is described as “wrinkling and

buckling.”

The question of the amount of movement that must occur in the movable terminals is also

discussed in connection with a krther embodiment of the claimed inventions disclosed in the

specifications of the ‘326 and ‘977 patents. That embodiment, which is depicted in part in Figure

13, has a sheetlike dielectric interposer that includes a flexible top layer and a compliant bottom

layer. See C X - I N - 2 (‘326 Patent), col. 17, lines 45-62; CX-2/RX-1 (‘977 Patent), col. lines

32-49. The specification contains a detailed discussion of the movement of the terminals and the

stresses and the bonds between the terminals and contacts:

The interconnections between the chip and the substrate (between peripheral contacts 830 and contact pads) are accommodated within the area of the chip itself, Le., within the area on the substrate occupied by chip 820. Thus, no space on the surface of the substrate is wasted by a conventional “fan-out” pattern of interconnections. Moreover, the assembly is suhstantially resistant to themal cycling. Each of the composite leads connecting one of the chip peripheral contacts and one of the central terminals 848 on the interposer is flexible Thus, the partial leads 50 (FIG. 13) on the interposer surface itself preferably are flexible, and the fine bonding wires 856 are also flexible. The interposer itself, and particularly the top layer 838 and bottom compliant layer 840 may be flexible. Accordingly, there can be substantial niovenzent of terniinals 848 on the interposer relative to contacts 830 on the chip in directions parallel to the chip front surface. Such movement can be accommodated without applying substantial forces to the junctions between the leads and the chip contacts. During use of the assembly, differential thermal expansion of chip 820 and substrate may cause appreciable displacement of the contact pads on the substrate relative to peripheral contacts 830 on the chip. Inasmuch as the central terminals 848 of the interposer are bonded to the contact pads of the substrate by relatively stiff noncompliant conductive masses, the central terminals will tend to niove with the contact pads. However, such movement is readily accommodated and does not result in substantial stresses at the bonds between the central terminals and contact pads.

26

CX-IRX-2 (‘326 Patent), col. 20, lines 34-62; CX-2RX-1 (‘977 Patent), col. 20, lines 21-49

(emphasis added).

The patent specifications teach that differential thermal expansion of the chips and

substrate may cause appreciable displacement of the contact pads on the substrate relative to

peripheral contacts on the chip. The assembly is “substantially resistant” to thermal cycling. In

this embodiment of the claimed inventions, there can be “substantial movement” of the terminals

on the interposer relative to contacts on the chip in directions parallel to the chip front surface,

and the central terminals will “tend to move” with the contact pads. In the specifications, there is

no indication that the terminals move to the same extent as the contact pads, in tandem with the

contacts, or in a “fixed position” with respect to the contacts. Furthermore, the specifications

teach that “substantial stresses” at the bonds between the central terminals and contact pads will

be avoided. However, there is no teaching that the existence of “movable” terminals relieve all

or substantially all of the stress

Thus, if Sharp’s proposed claim construction were adopted, this preferred embodiment,

which is prominently discussed and depicted in the patent specifications, would be read out of

the patent claims. As explained by the Federal Circuit, “ it is unlikely that an inventor would

define the invention in a way that excluded the preferred embodiment, or that persons of skill in

this field would read the specification in such a way.” Hoechst Celanese Corp. v. BP C’hems.,

Ltd., 78 F.3d 1575, 1581 (Fed. Cir.), cerf. denied, 519 U.S. 911 (1996). “Such an interpretation

is rarely, if ever, correct and would require highly persuasive evidentiary support . . . .”

Vifronics, 90 F.3d at 1583 Indeed, the Federal Circuit is adverse to claim interpretations that

exclude preferred embodiments, and has made strong statements to that effect. See, e.g., Burke,

27

Inc. 11. Bruno Independent LivingAids, Inc., 183 F.3d 1334, 1341 (Fed. Cir. 1999)c‘The district

court’s claim interpretation requiring a single plane would exclude the preferred embodiment

described in the specification and, thus, cannot be sustained.”).

In this case, there is no evidence sufficient to find that the inventors wrote their

specifications with a preferred embodiment outside the scope of their claim inventions, or that

one of ordinary skill in the art would understand the patents to be so written. The preferred

embodiment in which the terminals “tend to move” with the contacts, which is “substantially

resistant” to thermal cycling, and alleviates “substantial stress” - yet not necessarily all or

substantially all stress - is in conformity with the claims, which do not contain the limitation

proposed by Sharp. This embodiment also conforms with other portions of the specifications

that discuss movement and movable terminals in general terms, without quantifjling the degree of

movement. See, e.g., CX-l/RX-2 (‘326 Patent), col. 4, lines 6-11; col. 11, lines 19-41.

In addition, there is evidence that one of ordinary skill in the art would read the claims

and specifications to teach significant improvement in solder joint reliability. See Engelmaier Tr.

7 15-7 16, 723. Indeed, one of ordinary skill in the art would understand that it would be

impossible to construct an assembly capable of eliminating all the stress on solder joints due to

thermal cycling in contemporary semiconductor chip assemblies. Qu Tr. 351-353. In fact, a

theoretical device modeled by Sharp’s expert according to Sharp’s proposed claim construction

showed that stress would still remain on the solder joints. See Pitarresi Tr. 1406; RX-833.

Nevertheless, one skilled in the art would understand that there is an exponential relationship

between the reduction of stress and improvement in reliability. For example, a 50 percent

reduction in strain in this equation would result in a fourfold increase in fatigue life. See Charles

28

Tr. 1800-1 802. To a person of ordinary ski.11 at the time the of the invention, applying industrial

standards to manufactured products, a “significant” improvement in reliability of a solder joint

would begin at about 20 to 25%. Engelmaier Tr. 973-974. Consequently, it would be apparent

to one of ordinary skill in the art that the “fixed position” movement proposed by Sharp or an

attempt to avoid all stress on a solder joint is impossible and not required by the claims of the

‘326 and ‘977 patents in view of the specifications and patent claims.

Despite these facts, Sharp argues that the claims of the ‘326 and ‘977 patents must be

construed to require “fixed position” or in tandem movement to avoid all or substantially all of

the stress on the solder joints because of statements made during patent prosecution to overcome

a rejection in view of a prior art patent, Le., United States Patent No. 4,878,098 to Saito et al.

(RX-4 (Saito Patent)).

The statements at issue pertain directly to the prosecution of U.S. Patent No. 5,148,266,

Semiconductor Chip Assemblies Having Interposer and Flexible Lead, which issued on

September 15, 1992, to the inventors listed on the ‘326 and ‘977 patent, i.e., Khandros and

DiStefano.I7 The ‘266 patent is a parent of the ‘326 and ‘977 patents-in-suit.’* The specification

l 7 A copy of the ‘266 patent is included in its prosecution history. See CX-5; RX-3e.

The ‘326 patent is a continuation of U.S. patent application Ser. No. 08/861,280, filed on 18

May 21, 1997, which is in turn a continuation of U.S. patent application Ser. No. 08/3 19,966, filed on Oct. 7, 1994, now U.S. Patent No. 5,685,885. U.S. patent application Ser. No. 08/319,966 is a continuation of U.S. patent application Ser. No. 08/030,194, filed Apr. 28, 1993 as the national phase of International Application PCT/US91/06920 filed Sep. 24, 1991. Ser. No. 08/030,194 application, now U.S. Patent No. 5,679,977, was in turn a continuation of U.S. patent application Ser. No. 07/765,928, filed Sep. 24, 1991, now U.S. Patent No. 5,347,159. U.S. patent application Ser. No. 07/765,928 was a continuation in part of U.S. patent application Ser. No. 071673,020, filed Mar. 21, 1991, now U.S. Patent No. 5,148,265 and said U.S. patent application Ser. No. 07/765,928 was a continuation in part of U.S. patent application Ser. No.

(continued.. .)

29

of the ‘266 patent consequently contains several portions that are identical to the specifications of

the ‘326 and ‘977 patent Among the identical illustrations in the ‘266 patent are Figures 2 and 3

of the ‘326 and ‘977 specifications, which are reproduced above.

Sharp points out that according to Federal Circuit precedent, “[wlhen multiple patents

derive from the same initial application, the prosecution history regarding a claim limitation in

any patent that has issued applies with equal force to subsequently issued patents that contain the

same claim limitation.” See, e . g , Sharp’s Rebuttal Br. at 1 1 (quoting Elkay Mfg. Co. v. Ehco

wfg. Co., 192 F.3d 973, 980 (Fed Cir. 1999)). Thus, Sharp argues, the January 8, 1992

Amendment is significant intrinsic evidence in the claim interpretation of both the term

“movable,” and the term “flexible,” which is below.

Tessera argues that the claims of the ‘266 patent are addressed to face-down

embodiments, while most of the asserted claims are addressed to face-up embodiments, and

fbrther that the ‘977 and ‘326 patents are continuations-in-part of the ‘266 patent, and their

specifications include material not disclosed in the ‘266 patent. Because the claims at issue in

the ‘266 patent differ from those of the asserted patents, Tessera argues that the prosecution

history of the ‘266 patent is of limited relevance to the interpretation of the asserted claims. See,

’’ (...continued) 07/586,758, filed Sep. 24, 1990, now U.S. Patent No. 5,148,266. Said U.S. patent application Ser. No. 08/030,194 is also a continuation in part of said U.S. patent application Ser. Nos. 07/586,758 and 07/673,020. CX- 1RX-2 (‘326 Patent).

The application for the ‘977 patent was a continuation in part of U.S. patent application Ser. No. 07/586,758, filed Sep. 24, 1990, now U.S. Patent No. 5,148,266, which was a continuation in part of U.S. patent application Ser. No. 07/673,020 filed Mar. 21, 1991, now U.S. Patent No. 5,148,265, and a continuation of U.S. patent application Ser. No. 07/765,928 filed as PCT/US91/06920 Sep. 24, 1991, now U.S. Patent No. 5,347,159. The ‘977 patent issued with the notice that the term of the patent shall not exceed the expiration date of U.S. Patent No. 5,148,266. CX-2RX-1 (‘977 Patent).

30

e.g. , Tessera’s Post-Hearing Br. at 18

Despite the clear differences between the ‘266 patent and the patents at issue, among

them there is a continuity in the concepts relating to the terms “moveable” and “flexible.”

Furthermore, claim limitations pertaining to those terms appear in the ‘266 patent. Thus, an

examination of the prosecution of the application which led to the ‘266 patent is relevant and

important to claim construction of the patents-in-suit

On August 8, 1991, the PTO mailed an office action relative to Application No. 586,758,

which led to the ‘266 patent, and parent to the suit patents. The Examiner rejected claims 1-3, 5-

10 and 15-1 8 of the pending ‘758 application “under 35 U.S.C. 5 103 as being unpatentable over

Saito et a1 in view of Quinn et a1 [U.S. Patent No. 4,685,9981,” CX-5 (Part 8); RX-3a. The

substance of the Examiner’s rationale is, as follows:

Saito et a1 show a semiconductor chip assembly comprising a chip 10 having a plurality of contacts 14 and a sheet like dielectric interposer 16 formed of flexible material having apertures in the form of vias extending from surface to surface.

A plurality of generally, planar terminals 20 are shown disposed in a pattern overlying a second surface of interposer 16 and associated with one of the contacts on said chip. A conductive lead 18 in the form of a metallic strip is shown extending between said terminals 20 and contact 14, extending through said aperture or via and formed integrating with said terminal. Said lead in shown to have a contact end connected to contact 14 and a terminal end connected to terminal 20. Said apertures are aligned with the contacts of chip 10, and said leads are shown connected to the contacts on said chip. Figures 1 and 2 shows lead 18 having a curved portion in a direction perpendicular to the second gurface of the interposer.

Saito shows consistent or even spacing between terminal and chip contacts in figures 5 and 6.

As the materials of the interposer of Saito et a1 are disclosed to formed of such materials as polyamide. It would have been obvious to one having ordinary skill in this art to form the leads of Saito et a1 flexible because substrates formed of materials such as polyamide are

31

conventionally formed with flexible leads and as said substrate are formed of flexible materials said leads are deemed to also be inherently flexible.

Figures 6 of Saito et a1 shows terminals 20 disposed in a rectilinear grid pattern.

Quinn et a1 discloses interposer 310 bonded to chip 30 by an adhesive (Le SiO,, nitride).

It would have been obvious to one having ordinary skill in this art to bond the interposer of Saito to chip 10 with an adhesive because Quinn et a1 teaches use of adhesives to bond interposers to chips.

CX-5 (Part 8); RX-3a.

On January 2, 1992, the Examiner conducted an interview with the applicants’ patent

attorney, Marcus Millet, concerning rejected claim 1 of the ‘758 application. Relative to the

interview, the Examiner recorded:

Mr. Millet presented arguments relative to the Saito et a1 reference as well as discussed an amendment to claim 1 relative to the “movable” element in the last line. Mr Millet% arguments were noted and will be considered upon receipt ofthe response to the rejections of the last office action.

CX-5 (Part 9).

Indeed, on January 13, 1992, the PTO received an Amendment and Remarks on behalf of

applicants. Among the amended claims was the following:

1. (Amended) A semiconductor chip assembly comprising:

(a) a semiconductor chip having a front surface and a plurality of contacts disposed in a pattern on said front surface, said pattern encompassing a contact pattern area on said front surface;

a sheetlike dielectric interposer overlying said front surface of said chip, said interposer having a first surface facing toward said chip and a second surface facing away from said chip, an area of said interposer overlying said contact pattern area of said chip, said interposer having apertures extending from said first

surface to said second surface;

(b)

32

(c) a plurality of terminals disposed in a pattern on said second surface of said interposer, at least some of said terminals being disposed in said area of said interposer overlying said contact pattern area, each such terminal being associated with one of said contacts on said chip; and

(d) a flexible conductive lead extending between each said terminal and the associated one of said contacts, each such lead extending through one of said apertures, each said lead having a contact end connected to the associated contact and a terminal end connected to the associated terminal, said terminals being moveable relative to the contact ends of said leads so as to compensate for thermal expansion of said chip.

CX-5 (Part 13); RX-3b (underlining in original to show added text in claim).

With respect to amended claim 1 of the ‘758 application, a series of statements appeared

in the Remarks, some of which form the basis of Sharp’s prosecution history arguments in this

investigation. Specifically with respect to amended claim 1, the Remarks state:

Claim 1 was rejected under 35 USC 5 103 on Saito et al, U.S. Patent 4,878,098 in view of Quinn et al, U.S. Patent 4,685,998. By the present amendment, claim 1 has been modified to more clearly state a hnction of the moveability referred to in the last line of the claim. As discussed in the interview, and as set forth in applicant’s specification at page 6, lines 25 et seq and page 7, line 26 et seq moveability of the contact ends of the leads relative to the terminals permits movement of the chip contacts relative to the terminals and thus permits movement of the chip contacts relative to the terminals. This allows for movement of the chip contacts relative to a substrate when the terminals are ultimately bonded to a substrate. Such relative movement typically is in directions parallel to the planes of the chip surface and the interposer surface. See page 13, line 15 et sey in the specification[ .]

Saito was relied upon in the Official Action as teaching a chip assembly having a chip with contacts, a sheetlike interposer overlying the chip and having terminals thereon. The Official Action characterizes Saito as having an interposer “formed of flexible material” and as suggesting that the leads should be flexible “because substrates formed of materials such as polyimide are conventionally formed with flexible leads” and also because the leads [of Saito] “are deemed to also be inherently flexible.” It is thus understood that

33

Saito is relied upon as meeting the recitation in applicant’s claim 1 that the terminals on the interposer are “moveable relative to the contact ends of the leads”

As noted in the interview however, Saito does not suggest or teach an interposer which is flexible or leads which are flexible. Applicant need not dispute that polyimide under certain circumstances can be formed into a flexible structure. But as pointed out at the interview, there is no reason whatever to believe that the interposer of Saito, if formed from polyimide, would be flexible, or that any such flexibility would permit relative movement of the terminals and the contact ends of the leads. As noted during the interview, Saito nowhere states explicitly that the interposer or leads should be flexible. Indeed, Saito suggests that the interposer can be made from “SiOx or SiNx” (column 4, line 4), which are manifestly non-flexible and essentially rigid materials. Insofar as the reference teaches a synthetic resin interposer layer 16, the reference suggests that the same should be formed from a synthetic resin, such as polyimide, epoxy, acrylic or teflon resin, which can be hardened by ultraviolet rays (column 3, lines1 5- 17). That range of polymers encompasses materials of widely varying physical properties including brittle, inflexible materials. The reference does not state or suggest that the polymer should be or must be flexible in any way. Moreover, the statement that the polymer should be selected so that

the polymer “can be hardened by ultraviolet rays” instantly informs one of ordinary skill that the reference contemplates a coating process, in which the polymer is deposited on the chip face and cured in place. One of ordinary skill in this art thus would understand the Saito disclosure of polyimide as calling for a coating of polyimide on the chip surface adherent to the chip itself and forming a part of the chip. Moreover, one of ordinary skill would appreciate that such coatings ordinarily are of microscopic thickness. Although not mentioned at the interview, it is noted that Quinn also relied upon for this rejection, discloses a polyimide coating “6 microns” thick (column 4, line 9). One of ordinary skill in the art would understand Saito as calling for a layer of polyimide of similar thickness firmly bonded to the top surface of the chip. The terminals 20 on the top surface of Saito’s coated layer 16 would be in fixed position relative to the contacts on the chip Therefore, Saito’s terminals would be in fixed positions relative to the contact ends of the leads.

Applicant does not concede that leads on polyimides substrates are “inherently” or “conventionally” flexible, but insofar as Saito is concerned it makes no difference. Whether or not the leads themselves might be flexible is immaterial. In the Saito structure,

34

with a thin coated layer firmly fixed in position on the chip, the leads would be incapable of flexing even if the lead structure itself, apart from the underlying structure, were flexible. As pointed out in the interview, Saito’s leads 18 entirely fill the holes or vias in layer 16 (Fig. 1). Saito does not suggest an arrangement where part of a lead extending in an aperture is free to flex whether or not the interposer flexes, as is used in some of applicant’s embodiments (specification, pages 13 - 14) With Saito’s bound, coated layer, the leads cannot flex.

Clearly, Saito offers not the slightest suggestion that terminals should be moveable relative to the contact ends of the leads “so as to compensate for thermal expansion of said chip,” as set forth in amended claim 1, Le., to compensate for movement of the chip contact relative to the terminals, and hence to allow the terminals to remain in fixed positions when bonded to a substrate. There is not the slightest hint in Saito that the polyimide layer, or the lead structure or both should provide sufficient flexibility to accommodate relative movement between the terminals and the contact ends of the leads, so as to provide substantial compensation for thermal expansion of the chip and movement of the contacts caused by such thermal expansion. Nothing in Saito has been pointed out as suggesting that the interposer and lead structure could or should accommodate any such relative movement.

At the interview, counsel noted that, under applicable law the burden of proof with regard to obviousness is upon the Patent and Trademark Office. Thus, mere speculation that the terminals on the Saito interposer might be moveable with respect to the contacts on the chip is not enough. Speculation and assumptions cannot take the place of a clear teaching in the reference. In Re Warner, 154 USPQ 173,178 (CCPA 1967). Quinn was not relied upon as offering any disclosure relevant to the

moveability feature discussed above But in any event, Quinn does not support the rejection of claim 1 . As noted above, Quinn’s disclosure clearly contemplates a 6-micron (about .0002 inch) coating of polyimide firmly bonded to the chip and forming an integral part of the chip itself (column 4, lines S - 29). Indeed, Quinn speaks of the 6-micron “thick layer of polyimide” as forming part of “chip 300” (column 4, lines 54 - 58). Quinn therefore teaches away from any arrangement involving movement of terminals on such a layer relative to the remainder of the chip. Quinn thus leads away from the invention of claim 1 Quinn subsequently bonds this composite “chip” to a conventional lead frame for connection to a substrate (Figs. 5 - 7).

35

For all of the reasons set forth above, the 35 USC $103 rejection should be withdrawn with respect to claim 1, and also with respect to claims 2 - 3, 5 - 10 inclusive and 1.5 - 18 inclusive, dependent from claim 1.

CX-5 (Part 13); RX-3b (emphasis in original).

Sharp argues that to distinguish the claimed invention of the ‘758 application (and ‘266

patent) over Saito, Tessera19 amended its claims to require a particular type of movement, Le.,

movement which compensates for differential thermal expansion, and in its Remarks also

provided a clear understanding that the movement which compensates for thermal expansion

allows the terminals to move in fixed positions with the PCB substrate to which the chip package

is attached. It is argued that as stated in the prosecution history, the terminals “remain in fixed

positions” with respect to the PCB substrate, and thus the terminals will move in tandem with

and to the same general extent as, the solder pads on the PCB substrate. Sharp argues that as

stated in Tessera’s Remarks, and as confirmed by Dr. Pitarresi during the hearing, because the

terminals move in “fixed positions” with the PCB, the solder ball joints of the chip package

become substantially resistant to fatigue failures caused by thermal cycling, as also described in

the specification of the ‘977 patent.2” Sharp’s Post-Hearing Br. at 5-7.

l9 Although Sharp refers to “Tessera’s” amendment and statements before the PTO, the ‘266 patent was, or course, prosecuted on behalf of the applicantshnventors, A Tessera predecessor was listed as the patent’s assignee. See CX-5; Bottoms Tr. 97-98, 102-103 (concerning IST Associates, “which later became Tessera.”).

2” In related arguments, Sharp states that in connection with the prosecution of the ‘977 patent, Tessera removed the phrase “so as to compensate for thermal expansion” from the “movable” clause in its claims, thus making the ‘977 claims appear broader. The PTO rejected the ‘977 claims, and asked Tessera to explain where the movable feature was taught in the specification. Sharp argues that in response to the rejection, Tessera represented to the PTO that the term movable by itself means movement that “compensates” for the differential thermal

(continued.. .)

36

Tessera argues that none of the prosecution history, not even the January 1992

Amendment, approaches a “clear disavowal” of the claim interpretation it proposes in this

investigation or that is contained in the specifications of the ‘977 and ‘326 patents. See Tessera’s

Post-Hearing Br. at 7-8 (citing York Prods., Inc. 11. Central Tractor Farm & Family c‘tr., 99 F.3d

1568, 1575 (Fed. Cir. 1996)). It is argued that Sharp has failed to consider the prosecution

history as a whole. See Tessera’s Post-Hearing Br. at 7-8 (citing Buyer AG v. Elan Pharm.

Research Corp., 212 F.3d 1241, 1252 (Fed Cir 2000)).

As an initial matter, the Administrative Law Judge observes that the prosecution history

of the ‘758 application (which led to the ‘266 patent) pertains to movement which “Compensates

for differential thermal expansion” and is wholly consistent with the claim construction proposed

by Tessera for the ‘977 and ‘326 patents in this investigation. This appears to be without

controversy in the parties’ briefs. The fact that the movement involved in the ‘758 application

compensates for differential thermal expansion was significant to that patent prosecution

because, as pointed out to the Examiner, Saito disclosed no movement that would compensate

for thermal expansion. The controversies arise in this investigation when one considers the

actual movement which takes place according to the claimed inventions, particularly its direction

and its extent.

2” (. . .continued) expansion that occurs between the chip and the PCB substrate. See Sharp’s Post-Hearing Br. at 7-8 (RX-10 at 5-6 (All of the passages cited above state the concept that the terminals should be movable with respect to the chip and with respect to the contacts of the chip so as to compensate for thermal expansion of elements in the svstem.”)). As indicated supra in this opinion, the movement at issue compensates for differential thermal expansion. That point does not appear to be in controversy. The qusstions at issue in the argument between the parties are the type of movement covered by the claimed invention, and the extent to which movement relieves stress on the solder joints according to the claimed invention.

37

To support its argument that the terminals and solder pads must move in tandem, Sharp

relies on the fact that the applicants, through their patent attorney, stated that in the claimed

invention of amended claim 1 of the ‘758 application, the terminals move “in fixed positions.”

However, a reading of that statement in context shows that it does not require the sort of in

tandem movement proposed by Sharp. The portion of the prosecution history relied on by Sharp

is herein repeated:

Clearly, Saito offers not the slightest suggestion that terminals should be moveable relative to the contact ends of the leads “so as to compensate for thermal expansion of said chip,” as set forth in amended claim 1 , i.e., to compensate for movement of the chip contact relative to the terminals, and hence to allow the terminals to remain in fixed positions when bonded to a substrate. There is not the slightest hint in Saito that the polyimide layer, or the lead structure or both should provide sufficient flexibility to accommodate relative movement between the terminals and the contact ends of the leads, so as to provide substantial compensation for thermal expansion of the chip and movement of the contacts caused by such thermal expansion. Nothing in Saito has been pointed out as suggesting that the interposer and lead structure could or should accommodate any such relative movement.

It is evident from the applicants’ statement, when considered in context, that the

applicants did not seek to limit their invention to fixed position movement. The Remarks speak

of an invention that would “allow” the terminals to remain in a fixed position, yet they do not

suggest that fixed position movement would constitute the entirety of the movement according to

the invention, nor do the Remarks indicate that fixed position (or in tandem) movement would

alleviate all or substantially all stress on the solder joints. The applicants state that there is not

the slightest hint in Saito of sufficient flexibility to accommodate relative movement between the

terminals and the contact ends of the leads, so as to provide substantial compensation for thermal

38

expansion of the chip and movement of the contacts caused by such thermal expansion. There is

no indication that “relative movement” would always require the terminals to move in horizontal,

fixed positions, as proposed by Sharp. In fact, as quoted above, the applicants pointed out that

“[a]s discussed in the interview, and as set forth in applicant’s specification . . . the claimed

invention permits movement of the chip contacts relative to the terminals and thus permits

movement of the chip contacts relative to the terminals. This allows for movement of the chip

contacts relative to a substrate when the terminals are ultimately bonded to a substrate. Such

relative movement typically is in directions parallel to the planes of the chip surface and the

interposer surface.” It is clear that the movement of the applicants’ invention is “relative” and

thus only “typically” in directions parallel to the planes of the chip surface and the interposer

surface.

Finally, there is the question of the extent to which movement must occur. Sharp relies

on the ‘758 application for the ‘226 patent to argue that Tessera is bound by prosecution history

to movement that relieves all or substantially all of the stress. As shown above, the ‘758

applicants’ Remarks call for “substantial compensation for thermal expansion of the chip and

movement of the contacts caused by such thermal expansion.” Such “substantial compensation”

in the prosecution history of the ‘266 patent is not the equivalent of the limitation that Sharp

would read into the claims of the ‘977 and ‘326 patents. “Substantial compensation” for thermal

expansion (with no mention of relieving all or substantially all the stress on the solder joints)

supports Tessera’s proposed construction of the ‘977 and ‘326 patents at issue, which requires

.

39

“substantial compensation for differential thermal expansion.”21 Indeed, the language used by

Tessera is virtually the same as its proposed claim construction here.

Summary with Eiespecf l o lhhe 7 k i w “A4ovuhle ’’ us (/.sed in the ‘977 urd ‘326 Patents

Claim 1 of the ‘326 patent and claim 1 of the ‘977 patent, the patent specifications and

the relevant prosecution histories in evidence all support the conclusion that the term “movable,”

as used in those claims, refers to terminals that provide substantial compensation for differential

thermal expansion by horizontal movement, vertical movement, or movement in directions with

both horizontal and vertical components (e.g., in response to “wrinkling and buckling). The

“movable” terminals may, but need not, move in tandem with and to the same general extent as

the solder pads on the PCB substrate. Although the claimed inventions cover the use of a

compliant layer, the term “movable” does not refer to a limitation such that when the terminals

are physically attached to the chip (e.g., by a “die bond”), a compliant material must be located

between them in order for the terminals to remain “movable” within the scop of the claims.22

4. Interpretation of the Term “Flexible,” As Used in Both the ‘977 and ‘326 Patents

As shown above, the semiconductor assembly of independent claim 1 of the ‘977 patent

includes “a plurality of surfaces [ ] having contacts on at least one of said surfaces and a.flexihle

21 As quoted, supru, in connection with a preferred embodiment in the ‘977 and ‘326 patent specifications, the applicants stated that “the assembly is sinhstunfiully resistunf to therniul CJ’Cling. ”

22 The claims of the ‘977 and ‘326 patent do not set forth temperature parameters with reference to the movable terminals. The question of how temperature may be a factor in determining whether the claims read on particular devices will be discussed below in the section on infringement I

40

sheetlike elemen1 having terminals thereon, andaflexihfe feuds electrically connecting said

terminals to said contacts . . . said terminals are movable with respect to said chip and said

contacts, suid,flexihfe fends and .suid,flcxihle sheetlike efenient k i n g udupted to dcfomi to

ncconiniodute movement of mid feniiiirals with respect to mid contacts.” CX-2KX- 1 (‘977

Patent)(emphasis added). The semiconductor assembly of independent claim 1 of the ‘326 patent

comprises “a hacking element having electrically conductive terminals and lead portions thereon,

wherein said lead portions are connected to said terminals . .” CX-l/RX-2 (‘326

Patent)(emphasis added). With respect to the backing element, claim 3 (which depends from

claim 1) adds a limitation “wherein said backing element is,flexihle to facilitate the movement of

the terminals with respect to the chip ” fd (emphasis added).

As pointed out by the Commission Investigative Staff, there is no evidence that the term

“flexible” is a term of art. Indeed, the patent specifications do not expressly define “flexible,” or

indicate that it is a term of art. They use the term consistently with its ordinary meaning, and the

Administrative Law Judge construes the term as such for the purposes of interpreting the asserted

claims of the ‘326 and ‘977 patents. The ordinary meaning of the term “flexible” is “capable of

being bent or flexed.” See OUll Post-Hearing Br. at 13-14 (citing SX-3 (dictionary) at 487; SX-4

(dictionary) at 5 13; SX- 1 (dictionary) at 973) To “bend” is to “[florce (a thing having some

rigidity) out of straightness or normal form; bow, curve, crook, inflect;” also, to “assume a

curved, crooked, or angular form or direction ” Id. (citing SX-1 (dictionary) at 213; SX-3

(dictionary) at 165) No party contests the definition of “flexible” and this simple concept of

flexibility. The disputes arise when the term is applied to the specific claim elements at issue,

particularly, the extent to which the elements must be flexible, and whether the elements must be

41

flexible throughout their entire length

Tessera argues that one of ordinary skill in the art would understand that the claims at

issue require that the leads, the sheetlike element and the backing element be flexible prior to

assembly, Le., bendable or pliable, and retain sufficient flexibility in the completed assembly so

- in the words of the claims - to be “adapted to conform,” or to “accommodate” or to “facilitate”

the movement of terminals in the package. It is argued that if the term “flexible” only referred to

flexibility in the completed assembly. the limitation “flexible,” and the limitation “adapted to

deform,” “accommodate,” or “facilitate” would collapse into a single limitation, which is

disfavored under the canons of claim construction. See Tessera’s Post-Hearing Br. at 21-22

(citing Texas Instrimeiits, Inc. 1). (Jiiifed States Int ’ I Trade Conm ’n, 988 F.2d 1165, 1171 (Fed.

Cir. 1993). Tessera also relies on examples from the specifications which refer to the leads, the

sheetlike element and the backing element as flexible before assembly. See Id. at 22-23. Tessera

argues that nothing in the file histories disavows partially flexible elements that are adapted to

deform to accommodate movement in the completed assembly. See Id. at 24-25.

Tessera rejects Sharp’s proposed construction which would require the elements to be

“not restrained” or completely free to flex Tessera characterizes Sharp’s proposed construction

as an attempt to import limitations from specific embodiments. It is argued that flexibility has

been recognized to be a relative concept, and further that the specifications confirm that the

flexible leads, sheetlike or backing elements need not be completely flexible, Le., flexible over

their entire lengths. See Id. at 23-24; Tessera’s Reply to Sharp at 10-1 1.

Tessera argues that the proposed construction of the Commission Investigative Staff is

nearly consistent with its own, except that the Staff would impermissibly import certain language

42

from the specification into the claims. The Staff urges that the discussion of “tape automated

bonding” or “TAB” in the “TECHNICAT, FIELD” portion of the specifications shows that “flexible”

means that the leads must “bend readily” in the completed assembly. See OUII Post-Hearing Br.

at 14. Tessera argues that TAB assemblies, while discussed in the “TECHNICAL FIELD,” appear to

be constructed differently than the claimed packages.23 Moreover, it is argued that inasmuch as

the specification does not require a “bend readily” limitation, it should not be read into the

claims.24 Rather, the amount of flexibility necessary in the completed assembly is defined in the

claim language itself, Le., “adapted to deform to accommodate movement” of the terminals. See

Tessera’s Reply to OUT1 at 2-3 (citing L S / m x i / / y Coni,tms//e 11. Cahot Corp,, 845 F 2d 981, 987

(Fed. Cir. 1988); Coinark, 156 F 2d at 1 1 86).25

The Administrative Law Judge finds Tessera’s arguments concerning the proposed “bend

23 For example, the specifications state that in TAB, “because the leads utilized in tape automated bonding extend outwardly in a radial, ‘fan out’ pattern from the chip, the assembly is much larger than the chip itself.” CX-I/FW-2 (‘326 Patent), col. 3, lines 9-12; CX-2/RX-1 (‘977 Patent), col. 2, lines 64-67.

24 Within the context of the ‘326 and ‘977 patent specifications, the discussion of TAB is part of the explanation of the technical field in which the claimed inventions occurred. There is no indication that the features of TAB were meant by the inventors necessarily to constitute any limitations on the claimed inventions. See, e . g , CX-l/RX-2 (‘326 Patent), col. 2, lines 29-35 (“Various attempts have been made heretofore to provide primary interconnection structures and methods to meet these concerns, but none of these is truly satisfactory in every respect. At present, the most widely utilized primary interconnection methods are wire banding, tape automated bonding or “TAB” and flip-chip bonding.”); CX-2/RX-1 (‘977 Patent), col. 2, lines 17-23.

2s For example, in Specinlty C‘o~i~posi fc.~, the Federal Circuit stated: “Though polyvinylchloride entails a very high concentration of external plasticizer added to preformed polymer, the specification does not require a numerically high concentration of external plasticizer, but only a ‘suficiently high concentration of organic plasticizer’ to achieve specified results. Where a specification does not require a limitation, that limitation should not be read from the specification into the claims.” 845 F.2d at 987 (emphasis in original).

43

readily” limitation to be persuasive i n view of the intrinsic evidence, and does not construe

“flexible” to mean or require that a lead or any other element of the claim must “bend readily.”26

Sharp argues that the proper interpretation of “flexible” is “free to flex” in the completed

assembly, and that this interpretation is required by the specification and prosecution history of

the patents at issue.27 Sharp also relies on the deposition testimony of inventor Igor Khandros.

26 In addition, the Staff rejects Tessera’s argument that the term “flexible” refers to the nature of the sheetlike element and leads prior fo n.s.seiiihly Citing Exxon Chenz. Patents, Inc. v. Lubrzzol C O I . ~ . , 64 F 3d 1553 (Fed Cir 1995), the Staff argues that the asserted claims of the ‘977 patent “must be interpreted as containing the specified elements - here, a flexible sheetlike element and flexible leads - at any t i i i ie , j ion i the iiioment a t which the ingredients a re assembled.” See OUlI Post-Hearing Br at 14-16 (emphasis in original). In Luhrizol, the Federal Circuit held that a patent’s claims to a “lubricating oil composition . . . comprising” five ingredients were not to a “recipe,” a product-by-process covering any composition made of the ingredients, or a “final” product with the ingredients Rather, the Luhrizol claims covered a composition that contains simultaneously all the ingredients at any time. In any event, the Luhrizol holding does not prohibit temporal limitations in all composition claims, but rather to afirm that each composition claim, like other claims, must be construed in the context of its unique specification and prosecution history See Biogt.71, Inc. v. Berlex Labs., Inc, 113 F. Supp.2d 77 (D. Mass 2000)(interpreting and applying the Lubrizol case). Furthermore, the holding in Luhrzzol appears to be limited to similar composition claims, and appear not to apply to the ‘977 patent As discussed, .si/prcr, the ‘977 patent specification contains teachings that support Tessera’s argument that “flexible” applies to a type of element which is modified to arrive at the claimed final product, a type of semiconductor assembly.

27 Sharp argues that although the term “flexible” is not expressly included in the ‘326 patent, proper construction of the patent requires that there be a “flexible” component within the chip assembly to permit the claimed relative movement. See Sharp’s Post-Hearing Br. at 15-16. This argument is unclear inasmuch as there are numerous occurrences of the term “flexible” in the ‘326 patent, including occiirrences of the term in asserted claim 3 (“said backing element is

flexible”), unasserted claim 4 (“said lead portions are.flexihle”), unasserted claim 5 (“said backing element is a,jkxib/e sheet of a material selected from the group comprising . . .”), and unasserted claim 13 (“a,flexihle dielectric material connected to and covering at least a portion of said bottom surface of said backing element theflexible dielectric material acts as a solder mask”). CX-1RX-2 (‘326 Patent)(emphasis added).

Sharp appears to argue that a person of ordinary skill in the art would interpret claim 1 of the

. said.ji’exihle dielectric material has apertures . . .

It is, however, the case that the term “flexible” is not found in claim 1 of the ‘326 patent.

(continued.. .)

44

See Sharp’s Post-Hearing Br. at 15-1 9; Sharp’s Rebuttal Br. at 4-5. In particular, Sharp relies on

a portion of Mr. Khandros’ testimony that the lead and the sheetlike elements must be flexible

and either unattached or attached with a soft material. See Id. at 15-16 (quoting RX-12

(Khandros Dep.) Tr. 181. Sharp fiirther relies on a portion of the prosecution history of the ‘977

patent in which the applicants discuss “free to move” and “free to flex,” and argues that Tessera

distinguished the claimed invention over the Saito patent’s bound leads, see Id. at 16-17 (quoting

RX-3b, Jan. 1992 Resp. at S), and over the epoxy encapsulated sheetlike element of the Hawkins

patent, U.S. Patent No. 4,989,069 (RX-5), see Zd at 17-18 (quoting RX-3d at 2). Based upon the

specification of the ‘977 patent and prosecution history, Sharp also argues that the flexible

component must be surrounded by a compliant material in the completed assembly. See Zd. at

18-19 (quoting CX-2/RX-1 (‘977 Patent), col. 5, lines 24-35, col. 11, lines 13-17; and RX-10 at

4-5).

Any claim construction analysis begins with the patent claims. Pitney Bowes, 182 F.3d at

1305. In this case, based on the plain language of the claims, one of ordinary skill in the art

would understand that the claimed flexible elements - “leads” and “sheetlike element” in claim

1 of the ‘977 patent, and the “backing element” in claim 3 of the ‘326 patent - are flexible (i.e,,

bendable or pliable) prior to assembly. See Engelmaier Tr. 727-729. One of ordinary skill in the

27 (...continued) ‘326 patent implicitly to require that either the bonding wires or the backing element, or both, be flexible to permit the terminals to move with respect to the chip. See Sharp’s Post-Hearing Br. at 16 (not specifically mentioning claim 1). While some flexibility may be implicitly understood by a person skilled in the art with respect to claim 1 of the ‘326 patent, that is not a material point in this investigation because, as discussed in the infringement section, Sharp’s accused devices have enough flexibility to infringe claim 1 , even if a “flexible” limitation is read into, or understood to be implicit in, the claim.

45

art would know that the components used for ‘‘leads’’ and the “sheetlikehacking elements” in the

electronic packaging industry are bendable or pliable prior to assembly. For example, package

substrate materials - corresponding to the sheetlike or backing element - are commonly referred

to as “flex substrates” by those in the industry In addition, flexible package substrates often

come with “lead portions” or metallic traces already installed, and the entire package substrate is

bendable or pliable before assembly Engelmaier Tr 727-728; Kada Tr. 1303; CX-33 1C (Kada

Dep.) Tr. 81, Thin gold bonding wires are also obviously flexible before assembly. In addition,

one of skill in the art would understand that the leads and sheetlike/backing elements must retain

sufficient flexibility in the completed assembly to be “adapted to deform” to “accommodate” or

“facilitate” the movement of terminals in the package. Engelmaier Tr. 728-729.

Indeed, the claims recite a separate limitation which provides that the flexible leads and

sheetlike element are “adapted to deform to accommodate movement of [the] terminals with

respect to [the chip] contacts ” CX-2/RX-l (‘977 Patent), col. 34, lines 11-13. Claim 3 of the

‘326 patent requires that the flexible backing element be able to “facilitate the movement of the

terminals with respect to the chip ” CX-I/RX-2 (‘326 Patent), col. 34, lines 41-42. This claim

language identifies a subset of flexibility that characterizes the behavior of flexible elements aRer

they are assembled into a completed product. Engelinaier Tr. 731, 733-734. If the term

“flexible” only referred to flexibility in the completed assembly, the limitations “flexible” and

“adapted to deform” to “accommodate” or “facilitate” movement would collapse into a single

limitation. Such a construction is disfavored See Texus Instruments, Inc. v. US. Int ’I Trade

Comm ’n, 988 F.2d 1 165, 1 17 1 (Fed Cir 1993) (rejecting construction that renders disputed

claim language “mere surplusage”) Thus. the separate limitation, “adapted to deform,” confirms

46

the understanding of one of ordinary skill in the art that “flexible” refers to the characteristics of

the elements prior to assembly.2x

The ‘977 and ‘326 patent specifications support the understanding of one of ordinary skill

in the art who has read the claims to mean that “flexible” refers to a characteristic of components

before assembly. For exaniple, the specifications refer to: (a) “assembling a flexible, sheetlike

element having terminals thereon to a [semiconductor] chip” (CX-2RX-1 (‘977 Patent), col. 4,

lines 9-10); and (b) “[tlhe fine, flexible bonding wires 856 applied in the wire bonding operation”

(CX-2RX-I (‘977 Patent), col. 18, lines 33-35). These descriptions clearly refer to the

characteristics of the elements prior to assembly.

The specifications also discuss the retention of enough flexibility in the completed

assembly to accommodate or facilitate movement. For example, the specifications state that a

“flexible top layer” can be attached to a die through an adhesive compliant layer, so that “the top

layer will reniain flexible even when bound to the chip through the compliant layer, and the

terminals will still be movable.” CX-2/RX-1 (‘977 Patent), col. 21, lines 57-60; col. 22, lines 4-6

(emphasis added). Here, the specifications clearly refer to an element that is flexible before

assembly that retains enough flexibility to allow movement of the terminals in the final package.

With respect to claim language, Sharp argues that “[c]ommon sense and the basic rules of 28

grammar dictate that the ‘adapted to deform’ element occurs prior to assembly. Sharp’s Rebuttal Br. at 4 (emphasis in original). Sharp also argues that Tessera’s proposed interpretation is incorrect. See Sharp’s Reply to Tessera’s PFF at 120 - 122 (“‘Adapted’ is in the past tense, rendering Tessera’s interpretation grammatically incorrect.”). The Administrative Law Judge observes that word “adapted” is “in the past tense” in the sense that it is a past participle, which is apparently used in this instance as an adjective. The word indicates that the subject elements are or become “adapted” at some point. Yet the fact that “adapted” is a past participle does not indicate precisely when the adaptation occurred, or how long and to what extent the subject elements must remain in their adapted state.

47

In another example, the specifications state that “the assembly also includes flexible,

electrically conductive leads ” CX-URX- 1 (‘977 Patent), col. 4, lines 57-58. This obviously

refers to flexibility prior to assembly, because the specifications also state that “[tlhe leads and

the interposer are constructed and arranged so that the contact ends of the leads are movable

relative to the terminals. , . . The leads desird7ij) nre,flexih/e to permit such movement.”

CX-2/RX-1 (‘977 Patent), col 4, lines 62-67 (emphasis added). That is, the leads desirably are

flexible enough after assembly to facilitate movement.

Sharp construes “flexible” to niean “not restrained” by other package components, and

completely free to flex. However, the notion that an element must be “absolutely flexible” or

“completely flexible” tends toward the absurd In a general sense, flexibility is a feature that

must be thought of in relative terms ’‘) The degree to which something must be flexible depends

on the circumstances. This is consistent with the understanding of one of ordinary skill in the art

that a flexible lead need not be flexible over its entire length. As Tessera’s expert stated by way

of example at the hearing, even though a human arm is not “flexible” between the wrist and the

elbow, it is still “flexible” because it is bendable at the elbow. Engelmaier Tr. 734.

The specifications confirm that the tlexible leads and sheetlike or backing element need

not be “completely” flexible For example, in the SIJMMAKY OF THE INVENTION portion of the

specifications, the patents state

The assembly also includes flexible, electrically conductive leads.

29 In Stryker Corp v. Inferiim/ic.s Orfhopedics, h c . , 891 F. Supp. 751, 81 1 (E.D.N.Y. 1995), ajf’d, 96 F.3d 1409 (Fed. Cir. 1996), the district court stated that “[fllexibility, like size and weight, is a relative concept.” While that observation may not be universally applicable to all claimed inventions, it does apply to the ordinary concept of flexibility, and to the ‘977 and ‘326 patents.

48

The leads preferably extend through the apertures in the interposer. Each such lend has a contact end connected to the associated contact ofthe chip and a terminal end connected to the associated terminal on the second surface of the interposer. The leads and the interposer are constructed and arranged so that the contact ends of the leads are moveable relative to the terminals at least to the extent required to compensate for differential thermal expansion of components. The leads desirably w e ,flexible to permit such movement. Most pr<ferahly, the i i i le iymsei . itself’ i s jlexihle so as to facilitate such movement. The assembly according to this aspect of the invention optionally may include a compliant layer as discussed above.

CX-2RX-1 (‘977 Patent), col. 4, line 57 - col. 5, line 3; CX-1RX-2 (‘326 Patent), col. 5, lines

3-16 (emphasis added).

The SUIvlMARY OF 1’1 11: 1NVl:N’fION further teaches “partial” flexibility, as follows:

A chip assembly according to yet another aspect of the present invention incorporates a chip having a front surface including a central region and a peripheral region surrounding the central region, the chip having a plurality of peripheral contacts disposed in the peripheral region of the front surface. * * * The peripheral contact leads and yr~fhraldy /he iirler~~oser as well are at least partially jZexihle so that the central terminals are movable with respect to peripheral contacts to accommodate movement caused by differential thermal expansion. Here again, the assembly may optionally include a compliant layer as discussed above. Desirably, the peripheral contact leads include bent portions.

CX-2RX-1 (‘977 Patent), col. 5 , lines 36 - 67; C X - I N - 2 (‘326 Patent), col. 5, line 50 - col. 6,

line 14 (emphasis added).

In the detailed description of the preferred embodiments, the specifications teach that the

flexible lead deforms so that its contact end - the end attached to the chip - moves relative to the

terminal:

The contact end 56 of each lead SO is moveable relative to the associated terminal 48 As best seen in FIG. 3, the contact end 56a of lead 50a can be displaced from its normal, undeformed position

49

(shown in solid lines) in the directions parallel to the faces 44 and 46 of interposer 42 and parallel to the front face 38 of chip 28. For example, the contact end 56a may be displaced to the position indicated in broken lines at 56a’. This displacement is permitted by the flexibility of the lead S O and by buckling and wrinkling of interposer 42.

CX-2/RX-1 (‘977 Patent), col. 1 1 , lines 7-13; CX-l/RX-2 (‘326 Patent), col. 11, lines 19-28

(emphasis added). While this passage states that the contact end must be flexible, it suggests that

the remainder of the lead need not be flexible.

With respect to another preferred embodiment, the specifications state that a “portion of

the lead can themfbre,jlex to accommodate relative movement of the contact and terminal.” Id.,

col. 11, lines 34-36 (emphasis added). See also id., col. 5 , lines 58-64 (leads “at least partially

flexible” so that terminals are movable relative to contacts); col. 20, lines 30-33 (“partial leads”

that “ppreferahly are flexible” and “fine bonding wires” that “are also flexible”).”)

All of these passages confirm that the only flexibility which is necessary in the completed

assembly relates to the ability of the flexible elements to deform to accommodate or facilitate the

movement of the terminals relative to the chip. One of ordinary skill, considering the claims in

light of the specification, would understand that this is why the flexible elements are recited. See

Engelmaier Tr. 727-729, 73 1

Although Sharp has pointed to several prosecution history references, none approaches a

clear disavowal of the clear and unambiguous meanings of the claim terms “flexible” and

3” In addition, Sharp’s proposed interpretation of “flexible” would appear to exclude these preferred embodiments from coverage by the patent’s claims. As indicated, supra, with respect to the term “movable,” such an outcome is highly unlikely and almost completely excluded by the canons of claim construction See Burke, 183 F 3d at 1341; Hoechst Celanese, 78 F.3d at 1581; Yitronics, 90 F 3d at IS83

50

“adapted to deform to accommodate movement.” See York, 99 F.3d at 1575, For example, one

of ordinary skill in the art would understand that the prosecution history of the ‘977 patent clearly

distinguishes between the flexible sheetlike element of claim 1 of the ‘977 patent and the

sheetlike element in Saito which is obviously not free to deform in the completed assembly. This

is consistent with the understanding that the sheetlike element must retain sufficient flexibility to

be adapted to deform in the completed assembly Engelmaier Tr. 73 1-732; CX-4 (June 26, 1995

Amendment) at TESS0023 14; CPX-82

Similarly, one of ordinary skill i i i the art would understand that the ‘266 patent

prosecution history distinguishes Saito on the grounds that Saito does not disclose a structure in

which the leads would be flexible.in any way in the completed assembly. Again, this is

consistent with the understanding that tlie flexible elements recited in the asserted claims are

flexible before assembly, and must be adapted to deform to accommodate or facilitate movement

after assembly. Engelmaier Tr 732-733, CX-5 (January 1992 Amendment and Remarks) at

8/RX-3b; CPX-78.31 The discussions of the invention in the relevant prosecution histories

confirm that the leads and/or sheetlike element are “adapted to deform to accommodate

movement” in the final assembly, while certain prior art references (e.g., Saito and Hawkins) do

not disclose this feature. Thus, the tile history does not alter the plain meaning of flexible or

adapted to deform to accommodate or facilitate movement.

Sharp’s construction of “flexible” also focuses on extrinsic evidence while ignoring the

* plain claim language. Sharp iniproperly cites argument of counsel and the testimony of Dr.

31 An extensive portion of the January 1992 Remarks is quoted, supra, in connection with the discussion of the claim term “movable.”

51

Khandros to support its position that there must be “complete” flexibility, and that both the leads

and the sheetlike element must be flexible. Yet, one cannot use such extrinsic evidence to “vary

or contradict the claim language.” I ’ i / ro// ics, 90 F.3d at 1584.

a Furthermore, the specification passages on which Sharp relies repeatedly use permissive

and exemplary language, indicating that the specific flexibility advocated by Sharp is not

required by the claims. The passages quoted by Sharp include language such as “may” and “for

example.” See, e.g., Sharp’s Post-Hearing Br. at 18 (quoting RX-1 (‘977 Patent), col. 5 , lines 24-

35 (“The assembly may also include a compliant dielectric encapsulant having a low elastic

modulus . . . .”)). However, “[w]here a specification does not require a limitation, that limitation

should not be read from the specification into the claims.” Specialty Composites, 845 F.2d at 987

(emphasis in original). Therefore, the limitation that Sharp would read into the claims at issue

cannot be accepted.

In summary, the plain language o f the asserted claims, the text of the patent

specifications, and the prosecution histoiy support the conclusion that the term “flexible” refers

to the pre-assembly state of the elements, and fh-ther that the term “flexible” is a relative term

whose ordinary meaning is “bendable” or “pliable.” Furthermore, after assembly, a flexible

element must retain enough flexibility to be “adapted to conform,” to “accommodate” or to

“facilitate” the movement of terminals in the paclcage. Such flexibility may be achieved without

the element being flexible over its entire

32 On May 25, 200 1, in 7i.xa.s I i i , s / r i i m r i / s , Inc. v. Tessera, Inc., No. C-00-2 1 14 (N.D. Cal.), the United States District Judge entered an Order construing the claims of the ‘326 and ‘977 patents. It appears that under the doctrine of issue preclusion, or collateral estoppel, the Commission could apply the claini construction of the District Judge. See Jet, Inc. v. Sewage

(continued.. .)

52

5. Additional Clilinl Elements of the ‘977 Patent

In addition to the “movable” and “flexible” terms discussed above, several claim

elements are construed in order to interpret the asserted claims of the ‘977 patent.

a. “a s em ico n d 11 c t o I’ ass em h I y coin p ris i ng”

To one of ordinary skill in the art, the term “semiconductor assembly” as used in the

claims of the ‘326 and ‘977 patents refers to a chip package that contains the elements recited in

the claim. Engelmaier Tr. 744-745. The transitional phrase “comprising” is a term of art,

meaning that the claim is open-ended. That is, the claimed semiconductor assembly includes at

least the elements listed in the body of the claim, and may include additional components. See

Genentech, Inc. v. C‘hiron (’orp., 112 F 3d 495, 501 (Fed. Cir. 1997).

b. “a semiconductor chip having a plurality of surfaces and having contacts”

This element is an ordinaiy integrated circuit (IC) chip with electrical contacts on at least

one of its surfaces. See Engelrnaier TI-. 753-754

C. “sheetlike el em en t h a v i n g t er in in als thereon”

(...continued) 32

Aeration Sys., 223 F.3d 1360, 1365-66 (Fed. Cir.2000)(Collateral estoppel requires four factors: (1) the issues are identical to those in a prior proceeding, (2) the issues were actually litigated, (3) the determination of the issues was necessary to the resulting judgment, and (4) the party defending against preclusion had a full and fair opportunity to litigate the issues.).

In any event, the claim construction of the District Judge does not differ sufficiently from that of the Administrative Law Judge so as to affect the outcome of this investigation. In particular, the District Judge construed the term “flexible” to mean “pliable.” In addition, the District Judge found that “[tlhe sheetlike element and leads accommodate movement of the terminals with respect to the contacts but need not remain h l l y flexible in the completed assembly.” Furthermore, the District Judge, adopting a Tessera proposal, found “that ‘movable’ means that ‘in the operation of the assembly, the terniinals are capable of being displaced relative to the chip by external loads applied to the terniinals, to the extent that the displacement appreciably relieves mechanical stresses, such as those caused by thermal expansion which would be present in the electrical connections absent such displacement. ”’

53

A sheetlike element is an element that is thin in comparison to its length and breadth. See

Engelmaier Tr. 754. “Terminal” refers to an end point for connection of the package to the

outside. See Engelmaier Tr 745-746, 754-755. One of ordinary skill in the art would understand

that the terminal itself could not be made of solder, because it would melt and lose its shape

during solder reflow, which could break the electrical connection between the contact and the

terminal. Id.

The phrase “terminals thereon” means that the terminals are “on or upon” the sheetlike

element, in the sense that they are carried by the sheetlike element. Typically, terminals are

glued or adhesively laminated to the sheetlike element. See Engelmaier Tr. 753-754.

d.

A person of ordinary skill in the art who has read the patents would understand a “lead”

“leads electrically connecting said terminals to said contacts”

to be an electrically conductive piece of metal, typically thin and elongated (like wire and/or

metallic trace) that connects two or inore discrete points. Engelmaier Tr. 735, 756-757. The

claim is clear that leads connect terminals to contacts. See CX-2RX-1, claim 1.

Examples in the specification are consistent with the conclusion that a lead is typically a

thin, elongated metal conductor See CX-2/RX-l, col. 5, line15-17 (formed integrally with the

terminals on the interposer or separately formed fine wire); col. 7, lines10-13 (fine wire); Figs. 2,

3, 4, 5A and 5B (label 50) and col I O , lines 45-57 (trace lead on substrate); Fig. 9 (label 50’) and

col. 15, lines 40-47 (wire bond lead); Figs 13, 14 (labels 50 and 856) and col. 18, lines 8-15, 33-

41, and col. 20, lines 27-32 (composite leads); Fig. 15 (label 850’) and col. 20, lines 52-54

(prefabricated trace leads); Fig. 16 (labels 8350, 8354 and 8374), col. 22, lines 28-30, col. 23,

lines 5-9 and col. 23, lines 13-1 5 (trace leads); Fig. 26 (labels 948 and 974) and col. 30, lines 48-

54

53 (composite leads); Figure 29 (label 7395) and col. 33, lines 7-9 (wire bond leads).

Moreover, one of ordinary skill in the art would understand that the specification of the

‘977 patent distinguishes the tern1 “lead” from a mass of conductive bonding material, such as

solder or a conductive paste. Engelinaier Tr. 735-737; CX-2 (‘977 patent) at Fig. 2, col. 10, lines

44-54; CPX-83. For example, Figure 2 identifies conductors that are “leads” and other

conductors that are “masses” of contJuc,ting material. CX-2, col. 10, lines 45-54; Fig. 2. The

leads (50) in Figure 2 are relatively long and thin, while the masses (52) do not have the long,

thin shape that one of ordinary skill in the art would associate with the term “leads.” See also

CX-2, col. 32, lines 42-48 and col. 32, lines 52-58, Fig. 28 (leads 9248 are long and thin;

conductive masses 9253 are not)

e. “said sheetlike eleinriit and at least some of said terminals overlie one said surface of said chip and said sheetlike element bears upon such surface of said chip”

This limitation states that the chip rests upon or is carried by the sheetlike element, and

that at least some of the terminals on the sheetlike element are within the periphery of the chip.

See Engelmaier Tr. 760.

f. The additional lengii;ige of claim 6 which orients the semiconductor assembly as a “face-up” chip p;ick;ige

The additional language of claim 6 describes a “face-up” configuration for a chip

package. Thus, the semiconductor chip’s electrical contacts are on the front or top surface of the

chip, facing up and away from the sheetlike element. Engelmaier Tr. 760-761

g* The additional language of claim 22 refers to the connection of the chip package to a printed circuit hoard “substrate”

The language of claim 22 requires a PCB substrate with contact pads. It firther requires

5 5

the sheetlike element to be disposed between the chip and the substrate, with each terminal being

connected to one of the contact pads of the substrate. One of ordinary skill in the art would

understand that the terminals of the semiconductor assembly would normally be connected to the

contact pads on the PCB substrate with solder joints. Engelmaier Tr. 761-764.

6. Additional Claim Elements of the ‘326 Patent

In addition to the “movable” and “flexible” terms discussed above, several claim

elements are construed in order to interpret the asserted claims of the ‘326 patent.

a. “a semicon ti rir to r assembly comprising”

As in the ‘977 patent, claim I of the ‘326 patent recites a “semiconductor assembly,”

which is a chip package with the elements recited in the claim. See Engelmaier Tr. 744-745.

b. “a semiconductor chip having oppositely facing front and rear surfaces anti edges extending between the front and rear surfaces, the chip further having contacts on a peripheral region of the front surface”

This limitation refers to an 1C chip with electrical contacts on its front surface. See

Engelmaier Tr. 762.

C. “a backing element having electrically conductive terminals and lead portions thereon, wherein said lead portions are connected to said terminals”

One of ordinary skill in the art would understand that the “backing element” is an element

that is generally sheetlike and ~inderlies the rear surface of the chip. See Engelmaier Tr. 744;

CX-IRX-2, claim 1. Because the claim language does not require it, one of ordinary skill in the

art would not understand that the backing element must be flexible. Id. “Terminals . . . thereon”

56

has the same meaning as in claims 6 and 1 of the ‘977 patent. See Engelmaier Tr. 754, 756.

“Lead portions” refers to the inetallic trace portions on the backing element, which, together with

the bonding wires, form the composite leads of claim 1. See, e.g., CX-1, Fig. 13 (850); Fig. 26

(948).

d. “said backing clement overlying said rear surface of said semiconductor chip such that at least some of said terminals overlie said rear surface o f said chip”

This limitation requires the backing element to overlie the rear surface of the chip, which

orients the assembly “face-up,” with the contact bearing surface facing up and away from the

backing element. Also, at least some of the terminals on the backing element must be underneath

the chip. See Engelmaier Tr. 763

e. “bonding wires roritiected to said contacts on the front surface of said chip, said bonding wires extending downwardly alongside said edges of said chip and heing connected to the lead portions on the backing element”

The “bonding wires” are electrically conductive wires that extend from contacts on top of

the chip down to the backing element, where they connect to “lead portions,” or metallic traces

on the backing element. The lead poi-tions are in turn connected to terminals. Engelmaier

Tr. 737-738. Thus, composite leads, \vliicIi include bonding wires and lead portions, electrically

connect the contacts on the top surface o f the chip to terminals on the backing element. See

Engelmaier Tr. 735, 756-757. The bonding wires lie to the side of the chip, and one of ordinary

skill in the art would understand that through the wire bonding process, the bonding wires may

extend up, and then outward and dowiward to the backing element. Engelmaier Tr. 737-738.

One of skill in the art would understand that the bonding wires may be relatively

57

inflexible. Engelmaier Tr. 742-743. There is nothing in claim 1, the specification, or the file

history of the ‘326 patent that would suggest that the claim language cannot cover “bonding

wires” that have been rendered relatively inflexible by encapsulation in a rigid mold compound

(e.g., ceramic). One of skill in the art would understand that the invention will fbnction with

relatively rigid bonding wires as long as the terminals are movable relative to the chip. See, e.g.,

Id.

f. The additional limitations of claim 9: terminals and lead portions on top of the backing element

Claim 9 requires that the terminals and lead portions (metallic traces) be located on the

top surface of the backing element, closer to the chip. See Engelmaier Tr. 765; CX-l/RX-2,

claim 9.

g* The additional limitations of claim 10: holes through the backing element througli which the terminals are exposed

Claim 10 requires holes through the backing element through which the terminals are

exposed. One of ordinary sltill in the art would understand that the purpose of the holes is to

expose the terminals to allow an electrical connection through the holes. See Engelmaier

Tr. 765; CX-l/RX-2, claim 10.

h. The additional limitations of claim 11: solder attached to the terminals througli the holes

Claim 11 requires that bonding material such as solder or a conductive polymer be

attached to the terminals through the holes i n the backing element. See Engelmaier Tr. 765-766;

C X - 1 M - 2 , claim 10.

58

B. Infringement Determination

Tessera argues that Sharp’s accused CSPs include every limitation of every asserted ‘326

and ‘977 patent claims. See, c g . , Tessera’s Post-Hearing Br. at 25-36; Tessera’s Reply to Sharp

at 11-18; Tessera’s Reply to OUIl at 6-9. Tessera’s position is based on literal infringement,

inasmuch as it has not offered arguments based on the doctrine of equivalents. In particular,

Tessera argues that tests and analyses performed by its expert, Dr. Jianmin Qu, demonstrate that

each of the accused Sharp CSPs includcs terminals that are movable with respect to the contacts

on the chip, and that the terminal inovement is facilitated by the CSPs’ flexible leads and flexible

sheetlike backing element which deform to accommodate the movement. Tessera argues that the

relative movement between the terminals and the chip in Sharp’s CSPs significantly improves

thermal cycling test reliability, which translates into substantially longer product life.

Sharp denies that its accused devices infringe any asserted claim of the ‘326 or ‘977

patent. See, e.g., Sharp’s Post-Hearing 131- at 20-28; Sharp’s Rebuttal Br. at 4-14. Sharp’s

position is based in large part on its proposed interpretations of the claim terms “movable” and

“flexible.” As discussed above, Sharp’s proposed interpretations have not been adopted by the

Administrative Law Judge because the evidence of record, including the patent specifications and

prosecution history, support different meanings for those terms. Sharp’s arguments on the

infringement issue are also based on tests and analyses, which in addition to being presented

against the backdrop of faulty claim interpretation, lack the relevancy and reliability of those

performed by Tessera.

The Commission Icvestigative S ta f argues that none of Sharp’s accused products

infringes the asserted claims of the ‘977 patent. The Staff hrther argues that Sharp’s single-layer

59

CSP products infringe the asserted claims of the ‘326 patent, yet Sharp’s double-layers CSP

products do not infringe. See, e.g , OUll Post-Hearing Br. at 27-34; OUII Reply Br. at 3-8. The

Staff arguments against infringement are based primarily on its view that movement only

between -40°C and +85”C is relevant, and differences between the accused single-layer and

double-layer devices. However, the asserted patent claims do not contain the temperature

limitation proposed by the Staff. This issue is addressed in detail below, as is the question of

differences between the accused single-layer and double-layer devices.

1. Structure of Sharp’s Accused Devices

Sharp’s CSPs have two basic constructions, i.e., a “single-layer” device (as shown in

CPX-97C) and a “double-layer” device (as shown in CPX-98C). See Engelmaier Tr. 810-812.

From a structural standpoint, the difference between the devices is that the single-layer uses a

layer of die bond film, DF-400, to attach the chip to the package substrate, and the double-layer

uses a layer of insulation, SD-500, and above that a layer of die attach paste, EN-4322.

Engelmaier Tr. 814.

Each Sharp CSP includes a chip attached to a polyimide package substrate. Copper traces

and terminals are adhered to the top side of the package substrate, beneath the chip. Bonding

wires connect contacts on top of the chip to the copper traces on the polyimide package substrate.

The copper traces connect the bonding wires and the terminals. Thus, the component leads in

Sharp’s CSPs are made up of the bonding wires and the copper traces. Engelmaier Tr. 779-780,

810-81 1; CX-19C; CX-2OC; CX-22C, CX-174C; CPX-97C; CPX-98C. Solder balls are attached

to the underside of the polyimide package substrate, and are connected to the terminals on top of

60

the substrate through holes in the substrate Engelmaier Tr. 848-849; CPX-1OOC; CPX-1OlC;

CX-37 (Response to Request for Admission No. 156).

The die attach material attaches the chip to the copper traces on the polyimide substrate.

The die attach material does not contact the polyimide package substrate itself, and there are

vacant spaces in between the copper traces. Engelmaier Tr. 8 10-8 1 1.

As discussed in the section on claim construction, the claim term “movable” does not

require a compliant layer. However, the die attach for Sharp’s single-layer and double-layer

construction is a compliant layer Qu T r 364-368, 394-395, 404-407; CPX-146; CPX- 145; CX-

167C; CX-546, Figures 7.8 2., 7.8.6 and 7.8.3. The die attach materials each have a relatively

low modulus of elasticity. Engelmaier Tr 732, 816-817, 830-83 1; Qu Tr. 637; Charles Tr. 1826;

CX-387C. This layer allows the flexible polyimide package substrate and the thin flexible

copper traces on the polyimide to retain flexibility and deform in the completed assembly. Qu

Tr. 364-368, 394-395, 404-407.

Differential thermal expansion between the chip and the PCB causes strain in the solder

joints in Sharp’s C S P S . ~ ~ This differential thermal expansion causes both shearing and warping,

resulting in both shear strain and nornial strain in the solder joints. This strain causes failure of

the solder joints in Sharp’s CSPs, particularly the solder joints under the corners of the chip. Qu

Tr. 1852-1859; Engelmaier Tr 822-823, CPX-500. The movable terminals in Sharp’s CSPs

relieve strain due to differential thermal expansion between the chip and the PCB, resulting in

increased reliability. See, e.g., Qu Tr. 346-348, 444-446, 539-578, 618-619, 1862-1863.

33 The chip expands relatively little to increases in temperature, whereas the PCB expands to a much greater extent. Engelmaier TI-. 679.

61

As discussed in more detail below, Sharp’s CSPs have terminals that move to compensate

substantially for differential thermal expansion, significantly improving solder joint reliability.

The movement is facilitated by flexible leads, a flexible package substrate and a compliant die

attach. See, e.g., Engelmaier Tr. 843, 552-853, 863-865; Qu Tr. 438-439. The accused Sharp

devices do not have characteristics of a so-called “monolithic block,” referred to by Sharp See,

e g . , Sharp’s Post-Hearing Br at 2. Indeed, the evidence shows that Sharp has been aware since

very early in its CSP development that a compliant die attach layer can be used to improve solder

joint reliability, as reflected in thermal cycling test results. CX-331C (Kada Dep.) Tr. 321-322,

363-365, 438-439; CX-73C. [

]34 Kada Tr. 1163,

1211, 1230, 1293-1294, 1314-1328; CX-331C (Kada Dep.) Tr. 250-251, 321-322, 363-365,

438-439; Qu Tr. 399-400, 636-637. The improvements resulting from Sharp’s use of compliant

die attach materials are not incidental 01- unintended. See, e.g., Kada Tr. 1246- 1267, 1297- 1299;

Pitarresi Tr. 1463-146s; Engelmaier 7’1. 829-83 1.

Sharp apparently does not dispute that its accused CSPs include every element of every

asserted claim, other than “movable” terminals, “flexible leads,” and a “flexible sheetlike

element” (or flexible backing element) See Sharp’s Post-Hearing Br. at 20-28. Tessera’s expert,

] Kada Tr. 1327-1328, 1336; CX-87; CX-378C.

62

Dr. Qu,~’ tested and analyzed the accused Sharp CSPs. Qu Tr. 355, 41 1; CX-545. The

representative samples analyzed in detail by Dr. Qu include the differences in structure and

relevant variances among Sharp’s CSPs Qu Tr 43 1, 440, 638; Engelmaier Tr 785; CX-2OC;

CX-545C; CX-675C. Based on his analysis, he concluded that similar terminal movement will

occur in all accused Sharp CSPs As detailed below, Dr. Qu7s tests and analyses demonstrate

that Sharp’s accused CSPs have movable terminals, and include flexible leads and a flexible

sheetlike element which are adapted to deform in the completed assembly. See, e.g., Qu Tr. 364-

368, 394-409, 432-440. Dr. Qu’s tests and analyses also demonstrate that Sharp’s accused CSPs

include a compliant layer S c v , c.R., Qu TI- 364-368, 394-407; CPX-145; CPX-146; CX-I 67C;

CX-546. See also FF, Section IT1 B. 1 (The Structure and Pertinent Characteristics of Sharp CSPs

(FF 251-819)).

2. Sharp’s Accused CSPs Infringe Dependent Claim 6 (and Independent Claim I ) of the ‘977 Patent

The record demonstrates by at least a preponderance of the evidence that Sharp’s accused

products contain each element of claim 6 of the ‘977 patent. See, e.g., FF 861-879

a. Sharp’s nccused CSPs include a semiconductor chip with contacts, R sheetlike element and terminals underlying and bearing upon the chip, and leads connecting the contacts to the terminals

35 Dr. Qu is a highly credible witness. He is a highly qualified expert in packaging technology and solder joint reliability. Qu Tr. 317-325, 330-331, 615-616; CX-164. He is also a highly qualified expert in the various measurement and analysis techniques that he used to investigate Sharp’s CSPs, i.e., finite element analysis, moire interferometry and in situ scanning electron microscopy displacement analysis. Qu Tr. 3 17-321, 326-329, 371-373, 417-420, 429; CX-164.

63

Sharp’s accused CSPs are “semiconductor assemblies.” Properly construed, the claim

preamble “semiconductor assemblies” refers to a chip package with the various elements recited

in claim 1. The accused CSPs are chip packages that include a chip, a package substrate, and the

other package components recited in claim 1 , Engelmaier Tr. 849-853; CPX-48C; CPX-100C;

CPX-101c; cx-37 .

The accused CSPs include “a semiconductor chip having a plurality of surfaces and

having contacts on at least one of said surfaces.” This term refers to an ordinary integrated

circuit (IC) chip. The accused CSPs each include a semiconductor chip, with contacts on one

surface. Engelmaier Tr. 849-850; CPX- 1 OOC; CPX-1OlC; CX-37.

The accused CSPs include a “flexible sheetlike element having terminals thereon.”

Engelmaier Tr. 850. As discussed above in the section on claim construction, the term “sheetlike

element,” properly construed, refers to an element that is thin relative to its length and width.

See Engelmaier Tr. 754. Sharp’s CSPs include a polyimide package substrate, which is thin

relative to its length and width Engelmaier Tr. 850; CPX-1OOC; CPX-1OlC; CX-37 (Response

to Request for Admission No. 128) It IS thus a sheetlike element. Id On the package substrate

there are also terminals, sometimes referred to as “lands,” to which solder balls are attached.

Engelmaier Tr. 850-85 1; CPX- I OOC, CPX-1OlC; CX-37 (Response to Request for Admission

No. 134. The polyimide package substrate is flexible prior to assembly, and adapted to deform to

accommodate movement in the completed assembly, as discussed below. See also Engelmaier

Tr. 850; CPX-1OOC; CPX-1OlC; CX-37 (Response to Request for Admission No. 130).

The accused CSPs include “flexible leads electrically connecting [the] terminals to [the]

contacts.” Engelmaier Tr. 85 1, CPX- 1 OOC; CPX-10 1C; CX-37. Each lead consists of a bonding

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wire combined with a copper trace on the polyimide package substrate. Engelmaier Tr. 8 10-8 1 1 ,

85 1; CPX-97C; CX-174C; CX-19C; CX-2OC; CX-22C; CPX-98C. Each bonding wire connects

a contact on the top of the chip to a copper trace on the polyimide sheet. Id. The copper trace

then connects the bonding wire to a terminal. Id. Thus, the combination of the copper traces and

the bonding wires are “leads electrically connecting [the] terminals to [the] contacts.” Id. The

leads are flexible prior to assembly, and adapted to deform to accommodate movement in the

completed assembly, as discussed below. Engelmaier Tr. 851, 853; Qu Tr. 439; CPX-1OOC;

CPX-101 c.

The phrase “sheetlike element and at least some terminals overlie [a] surface of the chip,

and [the] sheetlike element bears upon the chip” means that some of the terminals on the

sheetlike element are underneath the chip Engelmaier Tr. 760; CX-2RX-2 (‘977 patent),

claim 1. Sharp’s CSPs each include at least some terminals underneath the chip. Engelmaier Tr.

851-852; CX-37 (Response to Request for Admission No. 139); CPX-IOOC; CPX-1OlC.

The additional language of claim 6 orients the package so the contacts on the chip face up

and away from the flexible sheetlike element, Le., a “face-up” package. Sharp’s CSPs have

contacts that are on top of the chip, facing away from the package substrate, and the package

substrate and at least some terminals are underneath the chip. Engelmaier Tr. 854-855;

CPX- 1 OOC; CPX- 10 I C; CX-3 7 (Response to Request for Admission Nos. 137- 13 9).

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b. Sharp’s accused CSPs include movable terminals

Sharp’s accused CSPs include terminals which are movable with respect to the chip and

the contacts on the chip. See Engelmaier Tr. 843, 852-853, 865; Qu Tr. 438-439. “Movable,” in

the context of the claims, refers to terminals that move with respect to the chip (and chip

contacts). The terminal movement must substantially compensate for differential thermal

expansion between the chip and the PCB, and thus significantly increase solder joint reliability.

See Section on Claim Construction; Engelmaier Tr. 715-716. During thermal cycling, the

terminals in Sharp’s accused CSPs move with respect to the chip and chip contacts. Engelmaier

816-818, 834-838, 852; Qu Tr. 351-355, 363-370, 394-41 1, 426-443, 534-538; Pitarresi Tr.

1458. The terminal movement substantially compensates for differential thermal expansion, and

thus significantly increases package reliability. Engelmaier Tr. 852-853; Qu Tr. 346-348, 445-

446, 492, 618-619; CPX-48.

1. Finite element models demonstrate that the terminals in Sharp’s CSPs move with respect to the chip and the contacts on the chip

Finite element modeling, which calculates values for internal movement and stress, is a

computer modeling technique that is widely-accepted in the industry for determining movement

internal to a package. Qu Tr. 326, 356-359. Finite element models (FEMs) of several

representative Sharp CSPs demonstrate that the terminals in Sharp’s CSPs move with respect to

the chip and the chip contacts. Qu Tr. 363-368. The FEMs of Sharp’s CSPs used accurate

information about the dimensions and materials in Sharp’s CSPs. Qu Tr. 355, 369-370, 375-379,

524-525. Proper modeling techniques, including performing a convergency study and selecting a

reasonable stress-free temperature, ensured that the FEMs accurately reflect the behavior of

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Sharp's C S P S . ~ ~ Qu Tr. 373-384, 401-406, 1884-1885. The FEMs determined the internal

package movement in Sharp's CSPs over a temperature range from -40°C to 125"C, and

obtained results at intermediate temperatures of O"C, 25"C, 75°C and 100°C. Qu Tr. 385;

CX-550. Companies in the semiconductor industry, including Sharp, routinely use the

temperature range of -40°C to 125 "C to run thermal cycling tests to determine solder joint

reliability. Qu Tr. 324, 385-394, 1340-1341; Kada Tr. 1287-1289.

Moire interferometry and scanning electronic microscopy (SEM) analysis confirmed the

FEM results. Qu Tr. 409-4 10, 426, 43 1 ; CX-553 at 2. Moire analysis of several Sharp CSPs

confirmed that there is movement in Sharp's CSPs between the terminals and the chip. Qu Tr.

423-426. The moire analysis included careful sample preparation, review of the moire images,

and a repeatability study. See, e.g., Qu Tr. 409-43 1, 606-608, 1878-1880. As a result, the moire

results are accurate and reliable. Qu Tr. 426.

The FEMs, confirmed by the moire and SEM physical tests, demonstrate that the

outermost terminals under the die in Sharp's CSPs - the terminals that have the greatest impact

on package solder joint reliability - move approximately one to two microns when the

36 Sharp did not provide Tessera with temperature-dependent material properties for its solder balls. See Qu Tr. 376 Sharp provided only one value for the modulus of elasticity, 32 GPa, at room temperature. Dr Qu therefore used temperature-dependent information obtained from a TI source document, RX-789C. Compare RX-789C at 1 and CX-548C at 2. TI uses the same solder balls as Sharp, and the TI source document included a modulus of elasticity of 29 GPa at room temperature - about 10% higher than the modulus provide by Sharp. Qu Tr. 376-377, 524-525 Dr Qu testified that using a solder ball modulus that is 10% higher at room temperature than the actual value does not necessarily impact the results, because: (i) the higher room temperature modulus does not mean that the modulus is any higher, even by an insignificant lo%, at any other temperature; and (ii) the higher modulus at room temperature -- the stress free temperature -- does not impact the results at all. There is no evidence that the 10% difference in solder ball modulus at room temperature has any impact on the results of the finite element models. Qu Tr. 5 17-525

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temperature changes from 25°C to 125°C. Qu Tr. 381-382, 403-407. These terminals

correspond to the solder joints that break first in Sharp's CSPs, the ones under the corners of the

die. Qu Tr. 1852-1 860; Engelmaier Tr. 822-823; CPX-500; CPX-501. These solder joints are

the outermost solder joints underneath the die in a diagonal c ross -~ec t ion .~~ Qu Tr. 381-382,

403-407. Allowing these outermost terminals to move one to two microns has a significant

impact on package reliability. See Qu Tr. 409, 43 1-445; CX-560. The FEMs calculated values

for the effective solder joint strain, which demonstrate that for four representative Sharp CSPs -

the LHl6K27, the LHF80BZE (single-layer version), the LHFSOBZE (double-layer version) and

the LR38714 - the movable terminals reduce strain by 30% to 6O%, when compared to a rigid

CSP structure. Qu Tr. 441-445, 539-540, 577-578, 1893-1894; CPX-48. This 30% to 60%

reduction in strain increases the reliability of these representative Sharp CSPs very significantly,

by a factor of two to three.3x Qu Tr. 346-348, 501, 1862-1863; CX-56OC; CPX-64.

All of Sharp's CSPs allow similar internal package movement to that of the four

representative Sharp CSPs, as confirmed by the FEMs of several additional representative CSPs.

37 Dr. Qu calculated additional displacements, for the outermost terminal in a normal cross section, for several Sharp CSPs. These displacements were calculated at intermediate temperatures as well as at 125°C. See CX-550. The displacements for the outermost solder terminal in a diagonal cross-section are greater than these displacements for a normal cross- section. Qu Tr. 403. These normal cross-section displacements therefore understate the improvement in reliability due to movable terminals.

38 Using Tessera's baseline for comparison, the movement of the terminals in Sharp's double-layer CSPs increases solder joint life significantly, even at 75" C. For example, for the double-layer LHF16K27, the solder joint strain is reduced 39%, which would at least double the solder joint life. For the double-layer LHF80BZE, the solder joint strain is reduced 43%, which also would more than double the solder joint life. Qu Tr. 346-348; CX-56OC; CPX-64. This is a significant increase, and all Sharp's double-layer CSPs have similar increased reliability due to movable terminals. See Engelinaier Tr. 785.

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Qu Tr. 408-41 1; CX-I 65C. The representative CSPs include all the variations in Sharp’s CSPs,

such as package and chip size, pitch, stacked structures, and both single-layer and double-layer

structures. See Engelmaier Tr. 785; Qu Tr 43 1, 440; CX-484C; CX-2OC. The detailed analysis

of the representative CSPs therefore demonstrates that all accused Sharp CSPs have movable

terminals that increase reliability significantly. Id.; Engelmaier Tr. 785. The terminals also

move relative to the chip contacts, on the order of 2 to 3 microns, over the modeled temperature

range. See Qu Tr. 396-409; CX-550.

As discussed above, the proper construction of movability depends on substantial

compensation for differential thermal expansion, which provides a significant improvement in

reliability. Thus, one of ordinary skill in the art would understand that improved reliability is the

ultimate benefit and goal of movable terminals. Movable terminals allow the CSP to absorb

some of the displacement inside the package, which reduces stress and strain in the solder joints

to improve reliability. However, Sharp and the Commission Investigative Staff take the position

that the claim term “movable” can only apply to movement that occurs over the “normal

operating temperature” of a package; i.e., the limited temperature range which the chip

experience when the package is in use.

The specification passage quoted by Sharp regarding the temperature range for movability

does not support the proposed restriction. The specification states that “thermal cycling [occurs]

as temperatures within the device change during operation.” CX-2RX-1 (‘977 Patent), col. 1,

line 59 - col. 2, line 9. While this is true and knowledge of this fact is important, one skilled in

the art would also be aware that differential thermal expansion occurs, and affects reliability, as a

direct result of temperature change beyond the changes due to “electrical operation.” The normal

69

use and operation of a device includes much greater changes in temperature than those due to

“electrical operation.” For example, environmental temperature changes - such as storage

temperatures - will affect reliability just as much (if not more) than “electrical operation”

temperature cycling.

devices are routinely subjected to 125” C and 255” C during thermal cycling tests and solder

reflow (part of the manufacturing process), respectively. See, e.g., Kada Tr. 1287-1292; CX-

50C. Thus, one of ordinary skill understands that reliability is affected by temperature variations

regardless of whether those variations are due to environmental factors, electrical use, or

manufacturing processes such as solder reflow.

See, e.g., Kada Tr. 1277-1296, 1337-1339; Qu Tr. 587. In addition, such

Limiting the claimed movement to a “normal operating” temperature range would inject

an unacceptably arbitrary element into the claim. For example, the same package could be sold

by two different vendors who have arbitrarily chosen two different electrical “operating”

temperature ranges. In such a case, a package sold by one vendor might infringe because it has

“movement” over the stated “operating” temperature range of -20” to 100” C. However, the same

package sold by a second vendor might not infringe because the second vendor has chosen an

“operating” temperature range of 0” to 50O.”‘

It is undisputed that one of ordinary skill knows that the amount of differential thermal

In this litigation, Sharp relies in part on an article by Mr. Engelmaier in an attempt to 39

explain how its own temperature range for reliability testing is somehow “inappropriate.” The article recommends, not testing only at “maximum service temperature,” as Sharp claims, but accelerated testing at a maximum of 100” C, which is above the “worst use environment” temperatures listed in the article. RX-28 at 10. This is merely accelerated TCT at 100” C instead of 125” C. The reason Mr. Engelmaier recommended limiting thermal cycling tests to 100” C in the 1990 time frame was based on the Tg of PCB materials at that time. Engelmaier Tr. 807, 1021-1024. However, modern PCB materials have a higher Tg. Therefore, as Mr. Engelmaier testified, reliability testing up to 125” C is entirely appropriate. See Engelmaier Tr. 807.

70

expansion depends on the amount of temperature change. See Kada Tr. 1277-1280. Thus, it is

also true that the reliability of a CSP depends upon the amount of temperature change it

experiences over its life. Kada Tr. 1291; Qu Tr. 324, 386-391. In determining whether a CSP

practices the invention by gaining the benefit of movable terminals to improve reliability, one

should perform movability measurements over the industry-standard temperature range for

reliability testing. The overwhelming evidence indicates that this range is -40" to 125" C. See,

e.g., Kada Tr. 1286-1292, 1340-1341; Qu Tr. 385-394; Pitarresi Tr. 1480-1482; CX-477.

Without successfid TCT testing from -40" to 125" C, manufacturers would not be able to sell

their CSPs. Qu Tr. 385-388, 392-394; Kada Tr. 1285-1286; CX-49. Thus, movability that

increases reliability should be measured according to this standard.

Sharp itself performs TCT testing from -40" to 125" C. See, e.g., Kada Tr. 1283-1292,

1340-1341. Indeed, Sharp provides its customers with an upper "storage temperature" rating of

either 125" C or 150" C for essentially all of its CSP products. Sharp does not inform its

customers that this high storage temperature should not be used for the storage of CSPs that are

already mounted to a PCB. Thus, CSPs can be stored at these temperatures during their normal

life and operation. They will undergo differential thermal cycling as the assemblies heat and cool

during storage, and this will obviously affect their reliability. See Pitarresi Tr. 1463-1465; Kada

Tr. 1280, 1295-1296, 1337-1338; Kada Tr. 1286-1292, 1340-1341. Another aspect ofthe normal

life and operation is exposure to solder reflow temperatures. For example, if multiple Sharp

CSPs are mounted to opposite sides of the same PCB, some of the CSPs will undergo solder

reflow temperatures of up to 255" C after they have been mounted to a PCB. Kada Tr.

1289-1291; CX-5OC at 17. This temperature exposure and cycling during the normal life and

71

operation of the CSPs will clearly affect their reliability.

At the hearing, the testimony of one of Sharp's key witnesses, Mr. Kada's, was

inconsistent regarding the maximum "normal operating" temperature for consumer electronics

products that use Sharp CSPs. On direct examination, he testified that this temperature was 60"

C for cell phones. Kada Tr. 1230-123 1. However, it appears that Sharp chose that value because

it is below the 67" C glass transition temperature of DF-400, the insulator/die attach film for

Sharp's single-layer CSPs. CX-548C, at 1 (Tg for single-layer die attach film). On cross-

examination Mr. Kada admitted that he testified at his deposition that cell phones could be rated

for use up to 70" or 80" C. Kada Tr. 1299-1300, 1301-1302. In addition, Sharp's own data

sheets show that the absolute maximum temperature rating for Sharp CSPs is 85" C, Mr. Kada

admitted on cross-examination by the Staff that the 85" C is the ambient temperature, not the

actual temperature of the CSP. The temperature at the surface of the CSP itself would actually

be 5" to 10" C degrees higher. See RX-35C. Thus, the real "absolute maximum temperature" for

the CSP itself is actually 95" C - which is very close to the 100" C level for which Tessera

obtained data on the accused Sharp CSPs. Pitarresi Tr. 1476-1477; Kada Tr. 1338-1339; CX-

422; CX-550, CX-552.

Finally, Mr. Kada testified that it was common industry practice to do reliability testing

for CSPs at temperatures above their highest rated temperatures as an "acceleration" factor.

Kada Tr. 1291. Mr. Kada admitted that Sharp tests the CSPs for cell phones from -40" to 125" C.

Thus, it makes sense for Sharp to do board level reliability TCT testing of its CSPs up to 125" C.

It is also undisputed that Sharp tests to 125" C. See Kada Tr. 1291; CX-5OC at 17.

For the foregoing reasons, "normal operating" temperature should not be a limitation of

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“movable.” Furthermore, it is entirely appropriate to measure the movement for an infringement

analysis over the industry-standard temperature range for reliability testing, i.e., -40” to 125” C.

See, e.g., FF 48, 55-76, 253-368, 440-462.

.. 11. Tessera’s comparison with the “flip-chip” is more

relevant than a comparison to Sharp’s hypothetical rigid package; Sharp’s FEMs are not accurate.

Sharp argues that the improvement due to movability in its devices is insignificant, and

that Tessera should not have compared the accused CSPs to a “flip-chip.” Tessera calculated the

reduction in solder joint strain based on an ideally-rigid CSP. This is not an “impossible”

baseline, as Sharp claims. Although Dr. Qu testified that a CSP package (including a layer of die

attach paste and a package substrate) cannot be ideally rigid, he also testified that his ideally-rigid

CSP is equivalent to a prior art “flip-~hip.”~”

Flip-chip prior art is specifically mentioned in the patents-in-suit. It is clear that a

primary objective of the patents was to approach the compact size of the flip-chip assembly,

while overcoming its solder joint reliability problems. See C X - I N - 2 (‘326 Patent), col. 3,

lines 22-24; col. 4, lines 6-1 1; col. 3 1-35. The strains in flip-chip solder joints are therefore a

particularly appropriate basis for comparison. Compared to this baseline, the movable terminals

in Sharp’s CSPs reduce solder joint strains by 35% to 60%, increasing solder joint fatigue life by

There is very little difference in solder joint strains between a realizable rigid CSP and a 40

flip-chip. See Qu Tr. 1887-1888, 1907-1908. Dr. Qu testified that these strains would be “very close.” Thus, the impact of “incidental” movement on the solder joint strain - the movement in a very rigid, realizable CSP - is very limited and can be disregarded. Qu Tr. 1887-1888, 1907- 1909; Engelmaier Tr. 1074-1 075; CX-56OC.

73

a factor of two to four.” Qu Tr. 346-348, 446, 501,1862-1863; CX-56OC; CPX-64

In contrast, Sharp used a hypothetical “rigid” baseline package with a flexible substrate,

which grossly understates the improvement in Sharp’s CSPs resulting from use of movable

terminals.42 Dr. Pitarresi essentially modeled a Sharp CSP with what he termed “OMPAC-type

die attach” from the 1996 OMPAC article. Pitarresi Tr. 1460-1461, 1495-1499; RX-833;

CX-438. Dr. Pitarresi compared the solder joint stress from a Sharp CSP model to the stress

from this “rigid” package to show that terminal movement in Sharp’s CSPs does not improve

reliability significantly. This comparison between Sharp’s CSP and the fictional “rigid” package

would significantly understate the reliability improvement in Sharp’s CSPs. Dr. Pitarresi

admitted that he used a polyimide substrate, identical to Sharp’s, in his “rigid” baseline package.

This polyimide substrate has a modulus ‘/4 the modulus of the BT glass substrate disclosed in the

1996 OMPAC article, about which the “OMPAC-type” rigid package was supposedly based.

Pitarresi Tr. 1459-1461, 1494-1503; CX-212; CX-438; CX-439; RX-833. In other words, the

modulus of elasticity of BT glass is 400% higher than the modulus of p ~ l y i m i d e . ~ ~ See Pitarresi

Tr. 1459-1460, 1494, 1500-1501; CX-212. This is a much greater difference than the minor 10%

41 Sharp also suggested that Tessera could have compared internal displacements in an unmounted CSP to displacements in a CSP mounted on a PCB to determine the amount of “incidental” movement in Sharp’s CSPs. See Sharp’s Post-Hearing Br. at 41 n.34. As Dr. Qu testified on cross-examination, such a comparison is meaningless, and would not determine the amount of “incidental” movement in Sharp CSPs. See Qu Tr. 485-486.

42 Sharp also claims that it is practicing the prior art - even though Dr. Pitarresi admitted that the “rigid” package was a fiction, built using information from an article published years after the patents were filed (the “1 996 OMPAC article”). See Pitarresi Tr. 1495-1499.

An article, relied on in Dr. Pitarresi’s expert report to describe an “OMPAC,” states that for 43

a given substrate thickness, polyimide “tends to produce the lowest solder stresses” and that BT glass “tends to generate the highest solder stresses.” CX-439; Pitarresi Tr. 1502-1503.

74

difference in room temperature solder joint modulus in Dr. Qu’s models, which Sharp claims

will “grossly over calculate the improvement” in Sharp’s packages. See Sharp’s Post-Hearing

Br. at 43. Yet, Dr. Pitarresi chose to use Sharp’s flexible polyimide substrate in his “rigid”

model, which according to the 1996 OMPAC article, generates “the lowest solder stresses.”

Pitarresi Tr. 1494-1 503; CX-439; RX-833.

It is clear that Sharp’s supposedly rigid baseline package does, in fact, grossly

underestimate the improvement in reliability for Sharp CSPs. See, e.g., Pitarresi Tr. 1502- 1504;

Qu Tr. 432-440. Compared to Tessera’s flip-chiphigid CSP baseline, the movable’ terminals in

Sharp CSPs reduce strain and increase reliability by a factor of 2 to 4. Qu Tr. 346-348, 444-446,

492, 577-578, 618-619, 1862-1863, 1893-1894; CX-56OC; CPX-64; CPX-48. Dr. Pitarresi’s

calculations in RX-833, on the other hand, actually show that Sharp single-layer and double-layer

CSPs have higher solder joint stress, and the single-layer has higher solder joint strain, than Dr.

Pitarresi’s supposedly “rigid” baseline package. See Pitarresi Tr. 1404; RX-833. As a result, Dr.

Pitarresi’s calculations indicate that the Sharp single-layer CSP is actually less reliable than the

supposedly “rigid” baseline package. See RX-833. Dr. Pitarresi’s deliberate use of Sharp’s

flexible package substrate instead of the “concrete-like” BT glass disclosed in the 1996 OMPAC

article clearly made his “rigid” baseline less than rigid, and essentially invalid as a proper

comparison. See Pitarresi 1459-1460, 1501 ; CX-212. It is therefore not surprising that, as Sharp

notes, the results for Dr. Pitarresi’s “rigid” baseline are within a few percent of his results for

Sharp’s C S P S . ~ ~

Also, Sharp’s attempts to compare its CSPs to Tessera products are improper. 44

“Infringement . . . is determined by comparing an accused product not with a preferred (continued., .)

75

Even if Dr. Pitarresi had used an appropriate “rigid” baseline package his comparisons

between the “rigid” baseline and Sharp CSPs would be accorded no weight because the FEMs

relied on by Sharp are inaccurate and unreliable. One of the primary faults in Dr. Pitarresi’s

analysis is that he failed to perform a necessary convergency study to ensure the proper number

ofelements in his FEM. See Qu Tr. 1882-1886, 1900-1904; CX-546 at Fig. 7.2.7; RX-830C at

2. In fact, he used too few elements - far fewer than Dr. Qu - and his model is extremely coarse.

Qu Tr. 1882-1886, 1904. As Dr. Qu testified, when a model is not converged, “the result simply

is not representative of what the physics is.” Qu Tr. 1903. In addition, Dr. Pitarresi used

elements of the wrong shape, hrther degrading model performance. Qu Tr. 1882- 1883; compare

RX-830C at 2 wifh CX-546 at Fig. 7.2.7. The results from Dr. Pitarresi’s FEMs are therefore

inaccurate and include random errors.45 See Qu Tr. 1900-1903; Kada Tr. 1292-1295; CX-49 at

TESS272785; CX-538C.

Sharp suggests that Dr. Pitarresi’s models are accurate, despite his failure to perform a

convergency study, because they are “validated” by his moire results. His moire results,

however, are unreliable because he did not conduct a repeatability study. Dr. Pitarresi’s attempt

at validation, by comparing a single moire result with a single finite element result, is

44 (...continued) embodiment described in the specification, or with a commercialized embodiment of the patentee, but with the (Fed. Cir. 1985); see also Radplug Co. v. Illinois Tool Works, Inc., 11 F.3d 1036, 1044 n.7 (Fed. Cir. 1993).

claims.” SRI Inf ’ I v. Matsushita Elec. Coip., 775 F.2d 1107, 1121

45 The problem of the prior art OMPAC chip was solder joint failure due to high stress. Nonsensically, Dr. Pitarresi’s models show that Sharp’s single-layer and double-layer CSPs have higher solder joint stress than his supposedly “rigid” baseline. See Pitarresi Tr. 1404; RX-833. His rigid baseline is grosslv inaccurate.

76

meaningless, and indicates nothing about the reliability of the models. Qu Tr. 417-4 19,

1899- 1900. These inaccurate results do not present any meaningfbl information, because the

random errors do not cancel out. They compound the unreliability of the information. See Qu

Tr. 1902-1903; RX-26; see also FF 820-860.

iii. Differences in the thickness of the attach paste in the two-layer model did not significantly affect the results

Sharp claims that Tessera’s models overstate the movement in Sharp’s CSPs by using die

attach paste that is too thick. It appears to be undisputed that Tessera modeled the correct

thickness of die bond film for Sharp’s single-layer packages. For the double-layer packages,

Sharp’s own interrogatory responses state that Sharp’s double-layer CSPs include a layer of EN-

4322 die attach paste that is between 10 and 25 microns thick. Qu Tr. 375-379, 548; CX-2OC,

Attachment 9. It is entirely reasonable, therefore, to model Sharp’s CSPs with a 25 micron layer

of EN-4322. Indeed, there is no evidence that any of Sharp’s CSPs use EN-4322 that is thinner

than 25 microns.

Most of the double-layer CSP models built by Dr. Qu and Pacific Consultants used a 25

micron thick layer of EN-4322. However, Pacific Consultants ran one case with a 10 micron

thick layer of EN4322. Sharp improperly relies on these test results, which Sharp had since

before Dr. Qu’s deposition to support its assertion that thickness of the die attach paste overstates

the amount of movement in Sharp’s CSPs. Dr. Qu testified that he reviewed these test results,

and that, in his opinion, the displacements did not differ significantly. Qu Tr. 378-379. He

specifically testified that the difference in die attach thickness “may change some numbers, but

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will not change the overal! conclusion.” Thus, Dr. Qu concluded that the manufacturing tolerance

in the thickness of the die paste in Sharp’s CSPs does not impact the movability of the

terminals.46 Qu Tr. 379.

iv. Tessera’s moirC measurements are accurate and validate its FEM results

Sharp claims that Tessera’s moire results are invalid because: Tessera’s experts lack

experience, and have never done “room temperature to high temperature” tests before; Tessera

allegedly used an inappropriate epoxy; and out of the dozens of moire measurements presented, a

handhl appeared to be “physically impossible.” These arguments are without merit.

As an initial matter, Tessera’s expert, Dr. Qu, is a highly-qualified and experienced expert

in moire analysis. See, e.g., CX-164C. Indeed, he owns one of the first moire interferometers

available for commercial use. Qu Tr. 327-328, 41 8 . Dr. Qu routinely reviews moire analyses

performed by his students and by authors of articles submitted to international journals. Qu Tr.

3 17-320, 372-429. Dr, Klopp of Exponent Failure Analysis Associates (“Exponent”) in Menlo

Park, California obtained moire images of Sharp products, and Dr. Qu is more than capable of

determining whether those images resulted from correct sample preparation - including grating

application - and correct operation of the moire equipment. After reviewing Dr. Klopp’s work,

Dr. Qu was confident that the moire images were obtained CX-555C (Klopp Dep.)

The difference between 10 and 25 microns represents only the range of Sharp’s 46

manufacturing tolerance in the application of die attach paste. Thus, the thickness of the Sharp die attach paste will vary in this range. Qu Tr. 546-548

Dr. Klopp is highly qualified, and obtained moire images on other CSPs prior to 41

(continued.. .)

78

at 12-14, 34, 60-65; Qu Tr. 419-420.

Although Sliarp has raised questions about the grating application used in Tessera’s moire

sample preparation, there is no evidence that the epoxy used to attach the gratings affected the

moire measurements. Qu Tr. 414-415, 606-608, 1878-1880; Pitarresi Tr. 1426. The case in

which the grating detached at 135” C merely confirms that testing up to 125” C does not pose

problems for the grating, and demonstrates that any actual problems caused by the epoxy are

readily detected. Qu Tr. 1878-1879. Dr. Pitarresi’s conclusory statement that the Tg of the

epoxy causes unspecified “problems” does not support Sharp’s claims that degradation occurs

prior to detachment of the grating. See Pitarresi Tr. 1427. There is no evidence of any such

“degradation.” In fact, Dr. Qu’s moire images are sharper than Dr. Pitarresi’s. Compare

RX-831C, page 4, with CX-554C, figure 8.5.1.

Finally, the fact that a handfbl of moire measurements out of nearly fifty listed in CX-552

were “physically impossible” demonstrates only that experimental measurements are not always

100% accurate. However, as Dr. Qu testified, it is for precisely this reason that “you want to do

multiple samples” and a repeatability study. Qu Tr. 417-418, 602-603. Indeed, it is for this

reason that Dr. Pitarresi’s own moire measurement from a single image (the only one he reported

out of the mere six that he made) is meaningless. See Qu Tr. 417-418, 1899-1900; Pitarresi Tr.

1479.

C. Sharp’s accused CSPs include a flexible sheetlike element and flexible leads that are adapted to deform to accommodate

(. . .continued) obtaining images of Sharp’s CSPs. Qu Tr. 418-420, 61 I ; CX-55% at 7-14, 3 1 ,49.

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movement in the completed assembly

As previously discussed, the flexible elements must be flexible prior to assembly, and

must retain sufficient flexibility in the completed assembly to be adapted to deform to

accommodate movement of the terminals. See Engelmaier Tr. 727-728. Deformation of the

flexible sheetlike element (i.e., the polyimide package substrate) and flexible leads facilitates the

movement between the package terminals and the chip in Sharp’s CSP packages. See Qu Tr.

364-368, 394-407, 432-439; CX-167C; CX-546; Engelmaier Tr. 852-853; CPX-144C; CPX-

145C; CPX-146C. These elements are flexible prior to assembly. See Engelmaier Tr. 850-851;

CX-37 (Response to Request for Admission No. 130); CPX-IOOC; CPX-IOIC. They retain

sufficient flexibility to be adapted to deform in the completed assembly to accommodate

movement of the terminals relative to the chip and the chip contacts. See Engelmaier Tr. 852-

853; Qu Tr. 363-365,438; CPX-145C; CPX-146.

CPX-I46C, an animation of the LRS I33 1 FEM, shows the flexing of the polyimide

package substrate as temperature increases from 25°C to 125°C. As the polyimide flexes, the

terminal moves to accommodate differential thermal expansion. Other FEMs, for example CX-

145C, for the single-layer LHFSOBZE, show similar flexing of the polyimide package substrate,

facilitating terminal movement. Qu Tr. 364-368, 432. Deformation of the polyimide package

substrate is also demonstrated by contour plots of the polyimide layer. These contour plots were

extracted from 3D FEMs of the LHFl6K27 and the single-layer LHF80BZE. The irregularity of

these contour plots shows that the deformation of the polyimide package substrate is due to

retained flexibility. If the deformation were due to thermal expansion alone, the displacement

would be uniform. Qu Tr. 432-438; CX-546. Thus, the sheetlike element in Sharp’s accused

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CSPs is flexible prior to assembly, and adapted to deform to accommodate movement of the

terminals in the completed assembly.

Sharp's accused CSPs include copper traces, adhered to the polyimide substrate, which

form part of the leads. The copper traces are flexible prior to assembly, and retain sufficient

flexibility in the completed assembly to be adapted to deform to accommodate movement

between the terminals and the chip contacts. The copper traces are thin and flexible, and deform

along with the package substrate to which they are adhered. The flexible bonding wire, which is

connected to the copper trace and forms the rest of the lead, also deforms in the completed

assembly. Qu Tr. 364-368, 432, 438-439; Engelmaier Tr. 851; CPX-1OOC; CPX-1OlC.

The Commission Investigative Staff argues that the flexible lead and flexible sheetlike

elements in Sharp's products have been shown to deform only at 125" C. Because the Staffs

position is that the relevant temperature range ends at 85" C, the Staff finds that the element

"adapted to deform to accommodate movement" does not read on Sharp's products. However, in

addition to the fact that testing may occur up to 125" C, the evidence demonstrates that the

flexible leads and flexible sheetlike element deform at 75" C and at 100" C, as well as at 125" C.

This is shown by the raw frame-by-frame FEM output, CX-167C7 contained in a CD-ROM

attached to Dr. Qu's expert report and entered into evidence as part of Dr. Qu's FEA data. CX-

167C. It is a set of animations from the finite element models, made up of frame-by-frame plots

showing the deformation of the CSP as the temperature changes. Qu Tr. 363; CPX-146. Exhibit

CPX-146, the subject of the cited testimony, was a copy of the frame-by-frame raw data,

LRS133-1, from the CD-ROM marked CPX-167, with a title added, and time-adjusted for better

viewing,

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The frame-by-frame finite element outputs for the LRS133 1, as Dr. Qu testified, run from

25" C to 125" C. As CPX-167 at LRS133-1 shows, there are a total of 20 frames over this 100"

C range, so each increment or frame is 5" C. Therefore, frame 10 is 25" C plus 5" C times ten, or

75" C. At frame 10, the polyimide package substrate in the LRS 133 1 (medium blue) is

deformed, allowing terminal movement. Qu Tr. 363-364 (colors in the finite element output);

CX-167, LRS133-1. The copper traces on the polyimide (light blue) are also deformed. Qu Tr.

363-364 (colors in the finite element output); CX-167, LRS133-1. At frame 15, which will be

25" C higher (or 100" C), there is additional deformation of the polyimide package substrate and

the copper traces.

Similar results are provided in CX-167 for the LHF80BZE (single layer) and the

LHFl6K27. Qu Tr. 363-364, 432. Furthermore, Sharp's other single-layer and double-layer

CSPs will have similar flexing and deformation at 75" C and 100" C. See Engelmaier Tr. 785;

Qu Tr. 434,440.

Thus, there is ample evidence that each of Sharp's CSPs, both single-layer and double-

layer, has a sheetlike element and leads that deform at 75" C and 100" C to accommodate

movement of the terminals. Even under the Commission Investigative Staffs proposed

temperature limitations, each of Sharp's CSPs may be shown to contains this element of the '977

patent claims.

3. Sharp's Accused Devices Infringe Claim 22 of the '977 Patent

Claim 22 depends from claim 1, and adds the requirement that the terminals of the

semiconductor assembly be connected to the contact pads of a PCB substrate.

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a. Sharp directly infringes claim 22

Sharp infringes claim 22 directly, by attaching its CSPs to a PCB substrate for use in

Sharp camcorder products that include the accused CSPs. Engelmaier Tr. 858-859; CX-484C,

attachment 2 (Sharp’s Supplemental Response to Interrogatory No. 1, Attachment 2, identiQing

camcorder products containing Sharp CSPs) See, e.g., FF 880-883.

b. Sharp contributorily infringes claim 22

The evidence of record also demonstrates that Sharp contributorily infringes claim 22 by

selling its CSPs to customers who mount them on PCBs. Sharp contributorily infringes because

(i) Sharp sells a component of the invention of the asserted claim; (ii) the component (a CSP) is

not a staple article of commerce capable of substantial noninfringing use; (iii) Sharp knows of

the patent; and (iv) Sharp knew or should have known that its CSPs would be used by its

customers to infringe an asserted claim. See Sevano v. Tellular Covp., 11 1 F.3d 1578, 1583

(Fed. Cir. 1997).

The CSPs that Sharp sells to its customers are a component of the invention of claim 22.

When Sharp’s customers mount a CSP onto a PCB substrate, the assembly will infringe claim

22. See Engelmaier Tr. 858-860. Sharp’s CSPs are not a staple article of commerce, capable of

substantial non-infringing iise. Rather, Sharp’s CSPs are designed to be attached to PCB

substrates, and have no other use. Engelmaier Tr. 858; CX-37 (Response to Request for

Admission Nos. 140, 141) See FF 880-889.

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c. Sharp induces infringement of claim 22

In addition, Sharp induces its customers to infringe claim 22 by mounting Sharp CSPs to

PCBs. Under applicable case law, Sharp induces infringement because (i) Sharp’s customers

infringe claim 22 by mounting Sharp’s CSPs on a PCB; and (ii) Sharp actively and knowingly

aids and abets that infringement of claim 22 by its customers. See Wafer Techs. Corp. v. c‘alco,

850 F.2d 660, 668 (Fed. Cir. 1988).

As an initial matter, Sharp’s customers infringe claim 22 by mounting Sharp’s CSPs on

PCBs. See Engelmaier Tr. 858-860. Sharp’s CSPs have practical use only if they are mounted

on a substrate, such as a PCB. Engelmaier Tr. 858; CX-37 (Response to Request for Admission

Nos. 140, 141). By mounting Sharp’s CSPs onto PCBs, Sharp’s customers infringe claim 22.

Furthermore, Sharp actively and knowingly aids and abets infringement by its customers. Sharp

intends for its customers to mount its CSPs on a PCB, and provides its customers with

instructions on how to do so. For example, Sharp distributes a mounting guide to its customers,

instructing its customers on mounting Sharp’s CSPs onto a printed circuit board for use in the

customers’ products. Engelmaier Tr. 859-860; CX-5OC (Sharp CSP Mounting Technology

Guidelines). Moreover, Sharp has been aware of Tessera’s ‘977 patent since at least November

of 1997, and therefore knows that its customers infringe claim 22 of the ‘977 patent. See Smith

Tr. 243; RX-722. Consequently, Sharp induces infringement of claim 22 by its customers. See

FF 880-889.

4. Sharp’s Accused Devices Infringe Claim 1 of the ‘326 Patent

The record demonstrates by at least a preponderance of the evidence that the accused

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Sharp products contain all elements of claim 1 of the ‘326 patent. See, e.g., FF 890-905.

a. Sharp’s accused CSPs include a semiconductor chip with contacts, a backing element with terminals and lead portions, and bonding wires extending downwardly alongside the edges of the chip

Sharp’s accused CSPs are “semiconductor assemblies.” See Engelmaier Tr. 849-853,

Sharp’s CSPs also include “a semiconductor chip having oppositely facing front and rear

surfaces and edges extending between said front and rear surfaces, said chip hrther having

contacts on a peripheral region of said front surface.” This term refers to an ordinary IC chip

with contacts around the periphery of the top surface. Sharp’s CSPs each include a

semiconductor chip, with contacts around the periphery of the top surface. Engelmaier Tr.

841-842; CPX-IOOC; CX-37 (Response to Request for Admission Nos. 125-127, 137-138,

142-143); CPX-IOlC.

The accused CSPs include “a backing element having electrically conductive terminals

and lead portions thereon, wherein said lead portions are connected to said terminals.” As

discussed above, this term refers to a sheetlike element under the chip’s rear surface. Sharp’s

CSPs include a backing element, the package substrate, under the chip’s rear surface.

Engelmaier Tr. 842; Pitarresi Tr. 1458-1459; CX-37 (Response to Request for Admission Nos.

128, 134, 135, 144, 145); CPX-1OOC; CPX-1OlC. In addition, at least some of the terminals on

the backing element overlie the rear surface of the chip. As discussed above, this limitation

simply means that some of the terminals must be underneath the chip. Sharp’s CSPs have

terminals underneath the chip. Engelmaier Tr. 842; CPX-1 OOC; CPX- 10 1 C; CX-37 (Response

to Request for Admission No. 139).

85

The accused CSPs include bonding wires “connected to [the] contacts on [the] front

surface of [the] chip, [the] bonding wires extending downwardly alongside [the] edges of [the]

chip and being connected to the lead portions on the backing element.” Sharp’s CSPs include

bonding wires, as shown, for example, in CPX- 1 OOC and CPX- 10 1 C. Engelmaier Tr. 842;

CX-37 (Response to Request for Admission No. 147). In Sharp’s CSPs, each bonding wire

extends from a chip contact downwardly alongside the edges of the chip to the polyimide

package substrate, where it forms a connection with a copper trace. Engelmaier Tr. 842; Pitarresi

Tr. 1458-1459; CX-37 (Response to Request for Admission Nos. 128, 132, 134, 135, 139, 147,

148); CPX- 1 OOC; CPX-I 0 1 C.

b. Sharp’s CSPs include terminals that are movable with respect to the chip

As discussed above, Sharp’s accused CSPs include terminals that are “movable with

respect to [the] chip,” as recited in claim 1 of the ‘326 patent. The terminals in Sharp’s CSPs

move with respect to the chip. See Engelmaier Tr. 843, 852-853, 865; Qu Tr. 438-439. This

movement accommodates differential thermal expansion and significantly improves package

reliability. See Engelmaier Tr. 852-853; Qu Tr. 346-348, 445-446, 492, 618-619; CPX-48.

c. The backing element in Sharp’s CSPs is flexible and deforms to facilitate movement between the chip and the terminals

As discussed above, claim 1 of the ‘326 patent does not require the backing element to be

flexible. However, the polyimide package substrate - the backing element - in Sharp’s accused

CSPs is flexible prior to assembly. See, e . g , CX-37 (Response to Request for Admission Nos.

86

149, 128, 130). The backing element retains sufficient flexibility to deform to facilitate

movement in the completed assembly. See Engelmaier Tr. 845-846; CPX-145; CPX-146.

d. The bonding wires in Sharp’s CSPs are flexible and deform in the assembled package

As discussed above, the bonding wires need not be flexible in the completed assembly

However, the bonding wires in Sharp’s CSPs are flexible prior to assembly, and are adapted to

deform to accommodate movement after assembly. Engelmaier Tr. 851-853; Qu Tr. 438;

CPX- 10 1 c.

5. Sharp’s Accused Devices Infringe Claim 3 of the ‘326 Patent

This claim adds the limitation that the backing element is “flexible to facilitate movement

of the terminals with respect to the chip.” That is, the backing element must be flexible prior to

assembly, and deform in the completed assembly to facilitate movement.

The polyimide package substrate - the backing element - in Sharp’s accused CSPs is

flexible prior to assembly. See CX-37 (Response to Request for Admission Nos. 149, 128, 130).

Because Sharp uses a compliant die attach layer, the polyimide package substrate retains

sufficient flexibility to deform to facilitate movement between the terminals and the chip in the

completed assembly. Engelmaier Tr. 845-846; CPX-145; CPX-146. Sharp’s CSPs therefore

infringe claim 3 of the ‘326 patent. See also FF 902-905.

87

6 . Sharp’s Accused Devices Infringe Claim 11 of the ‘326 Patent

As discussed above, this claim adds the limitation that “bonding material,” such as solder

balls, are attached to package terminals located on top of the backing element, through holes in

the backing element. Sharp’s accused CSPs include vias, or holes, from the top surface to the

bottom surface of the polyimide package substrate. The terminals on top of the backing element

are exposed through the holes. Solder balls - the “bonding material” - are attached to the

terminals through the holes. Engelmaier Tr. 848-849; CX-37 (Response to Request for

Admission Nos. 132, 134, 144, 151, 152, 153, 155, 156); CPX-IOOC; CPX-1OlC. Sharp’s CSPs

therefore infringe claim 11 of the ‘326 patent. See also FF 906-91 1.

7. Conclusion Regarding Patent Infringement

For the reasons stated above, the Administrative Law Judge finds by at least a

preponderance of the evidence that Sharp’s accused devices literally infringe all asserted claims

of the ‘326 and ‘977 patents.

IV. VALIDlTY

A.

Sharp argues that Tessera’s proposed interpretation of “movable” - which Sharp

characterizes as “significantly improving reliability” - renders the asserted claims indefinite. It is

argued that a person of ordinary skill in the art cannot determine whether an assembly

“significantly” improves reliability, and hrther that Tessera’s proposed interpretation does not

clearly delineate the claimed movement from the prior art. See, e.g., Sharp’s Post-Hearing Br. at

Alleged Indefiniteness Under 35 U.S.C. Section 112, Paragraph 2

88

3 1-32. Tessera argues that its proposed construction of “movable” is definite, and rejects Sharp’s

arguments. The Commission Investigative Staff agues that the claims are not indefinite.

The proper interpretation of “movable” is not simply movement that significantly

improves reliability The term “movable,” as used in the asserted claims, refers to terminals that

provide substantial compensation for differential thermal expansion. However, as discussed

above, substantial compensation for thermal expansion is understood by one of ordinary skill in

the art to be within the framework of improved solder joint reliability, which is taught by the

patents-in-suit.

A claim term is definite “[ilf the claims read in light of the specification reasonably

apprise those skilled in the art of the scope of the invention.. , . The degree of precision

necessary for adequate claims is a function of the nature of the subject matter.” Miles Lahs., Inc.

v. Shandon, fnc., 977 F.2d 870, 874-875 (Fed. Cir 1993).

Terms such as significant and substantial are “ubiquitous in patent claims” and routinely

are upheld by the courts See Andrew C‘orp. v. Gahriel Electronics, Inc., 847 F 2d 8 19, 821 (Fed

Cir. 1988) (the term “closely approximate” is definite); see also Charvat v. Coniniissioner qf

Patents, 503 F.3d 138, 148 (Fed. Cir. 1978) (courts frequently validate terms such as

“substantial”) (citing Eihel Process Co. v. Minnesota di Ontario Paper Co. 261 U S 45, 65-66

(1 923). Definiteness does not require quantification of terms such as “movable,” because

“patentable inventions cannot always be described in terms of exact measurements.”

Georgia-Pacific Corp. v. (Jnited States Pijnvood Corp., 258 F.2d 124, 136 (2d Cir. 1958).

Sharp is incorrect that Tessera’s construction renders “movable’’ indefinite because

“significant” improvement is a “word of degree.” In Seattle Box Co., Inc. v. Industrial Crating Cfi

89

Packzng, Znc., 731 F.2d 818, 826 (Fed. Cir. 1984), which Sharp cites for this proposition, the

Federal Circuit, despite its general observations about difficulties which may arise as a result of

such phrases in patent claims, upheld the definiteness of the claims at issue in that case. The

Federal Circuit held in Seattle Box, that “substantially equal” is a term of degree, and that its

acceptability depends on whether one of ordinary skill in the art would understand what is

claimed ... in light of the specification,” even if experimentation may be needed. See Andrew

Corp., 847 F.2d at 821 (discussing Seattle Box, 73 1 F.2d at 826). Indeed, qualitative terms, such

as “substantial” or “closely spaced” - or movable - may be “necessitated by variations in the

practice of the patent.” 258 F.2d at 138. The amount of movement needed in the claims at issue

is “necessitated by variations in the practice of the patent,” which in this case may include the die

size, and solder ball height. The reliability required will vary for different package designs and

applications. See, e.g., Engelmaier Tr. 694-698; Qu Tr. 342-34. Thus, quantification is not

necessary. The patent need only “reasonably apprise those of skill in the art” of the scope and

utilization of the in~ent ion.~’ 258 F.2d at 138.

In this case, one of ordinary skill in the art can readily calculate - for a given application

- the amount of internal movement of the package terminals (as taught by the patents) that would

significantly relieve solder fatigue caused by differential thermal expansion. Qu Tr. 324-325,

48 Citing Baiisch & Lomb, 769 F.2d at 450, discussed supra in the section on claim construction, Tessera and the Commission Investigative Staff argue that a claim construction requiring “substantial” compensation for differential thermal expansion and “significant” improvement in reliability properly defines the claim term “movable” so as to serve the inventor’s purpose. In this case, the principles set forth in Bausch & Lomb, 769 F.2d at 450, appear to be appropriate because the term “movable,” in view of the teachings of the patents-in- suit and the level of ordinary skill in the art, reasonably apprises one of the scope of the invention.

90

346-351; Charles Tr. 1797-1799; Pitarresi Tr. 1477; RX-873. Thus, one of ordinary skill in the

art easily could apply the principles taught in the patents to design an improved package with the

desired reliability. See Pitarresi Tr. 1485-1488; Qu Tr. 349-351, 357-359; Kada Tr. 13 13. The

evidence shows that one of ordinary skill can determine the amount of movement needed for an

application to achieve the desired improvement in reliability.

Sharp has not demonstrated by any measure, and decidedly not by clear and convincing

evidence, that any asserted claim is invalid for indefiniteness.

B.

Sharp argues that the asserted claims of the ‘977 and ‘326 patents at issue in this

The Art Asserted Against the Patents-in-Suit

investigation are invalid in view of several patents and a device (referred to as an OMPAC

device), especially as that device is described in an article.49 In its Post-Hearing Brief, Sharp

argues that under 35 U.S.C. 4 102, all of the asserted art anticipates “the patents” at issue. See

Sharp’s Post-Hearing Br. at ii, 35. However, in one instance respondents argue obviousness

under 35 U.S.C. 5 103.5” See Id. at 35 n.30. Tessera denies that any of the art relied on by Sharp

invalidates any asserted claim of the ‘977 patent or ‘326 patent. The Commission Investigative

Staff argues that Sharp has not offered evidence sufficient to find that the asserted patent claims

49 See Section I (discussion of respondents’ motion to reopen the record to receive an alleged

5” It appeared at the hearing that Sharp may have intended to set forth additional obviousness OMPAC device and related testimony).

arguments. Such arguments did not, however, appear in Sharp’s Post-Hearing Brief. See, e.g., Sharp’s Post-Hearing Br. at 37-38. While certain Findings of Fact contained in this Initial Determination may be relevant to, and disprove, allegations of obviousness that Sharp might have made against the asserted claims, only the obviousness allegation actually made by Sharp in its briefing is addressed in this opinion.

91

are invalid. Each patent or article (and the device) relied on by respondents is discussed

separately below.

1. U.S. Patent No. 5,216,278 to Lin

Sharp argues that the ‘278 patent to Lin is prior art to both the ‘977 and ‘326 patents

under 35 U.S.C. 5 102(e) and 3 102(g), and that the Lin patent anticipates both patents. See, e.g.,

Sharp’s Post Hearing at 35-37. Sharp fbrther argues that in view of the Lin patent, claim 11 of

the ‘326 is invalid under section 103 for obviousness. See Sharp’s Post-Hearing Br. at 35 n.30.

The evidence in this investigation shows that Sharp has failed to carry its burden of proof by

clear and convincing evidence, and that the Lin patent and its claimed invention does not

anticipate the ‘977 and ‘326 patents, does not render them obvious, and hrther that the Lin

patent is not prior art to the patents-in-suit.

a. If the Lin patent were prior art, it nevertheless could not anticipate any asserted claim

It is undisputed that the Lin patent fails expressly to disclose the “movable” limitation of

the asserted claims. See Sharp’s Post-Hearing Br. at 35-36 (relying on alleged inherent

disclosure of “movable” element). Thus, even if the Lin patent were prior art, it cannot anticipate

any asserted claim, unless it inherently discloses the claimed “m~vabi l i ty .”~~ See Finnigun Corp.

51 If a prior art reference does not expressly set forth a particular claim element, the reference may be anticipatory only if the element is inherent in the reference’s disclosure. In re Robertson, 169 F.3d 743, 745 (Fed. Cir. 1999). To be inherent, the feature must necessarily be present in the prior art. See Finnigun Co7p., 180 F.3d at 1365-1366 (reversing a finding of anticipation based on inherency because one skilled in the art would not necessarily recognize the claimed feature in

(continued.. .)

92

v. UnitedStates Inf’I Trade Coninz’n, 180 F.3d 1354, 1365-1366 (Fed. Cir. 1999).

In its only discussion of solder joint fatigue, the Lin patent provides a solution that is very

different from the patents-in-suit. The Lin patent teaches a package substrate of a material that

has a CTE similar to that of the PCB, and the use of compliant solder balls. See RX-6 (Lin

Patent), col. 3, lines 9-17. This is consistent with the fact that no claim in the Lin patent recites

movability of the terminals relative to the chip.52 See, e.g., RX-6, col. 7, line 46 - col. 12, line 52.

Notwithstanding Sharp’s argument to the contrary, Dr. Charles provided no testimony

that “movable” terminals, as claimed by Tessera, are inherently disclosed in Lin. Dr. Charles

merely opined that Lin discloses movement that occurs due to the difference in CTEs of the

package substrate and chip. Nor did Dr. Charles testifL that the Lin patent discloses movement

that provides substantial compensation for differential thermal expansion or movement that

significantly reduces solder strain.53 See Charles Tr. 1 706- 1707, 17 19- 1720, 1 8 1 0- 1 8 1 1 .

Furthermore, it is error for Sharp to argue that “the selection of die attach in Lin’s

package is controlled by Lin’s teaching of low internal package stress.” See Sharp’s

Post-Hearing Br. at 36. As demonstrated at the hearing, Lin does not teach that the die attach has

5 1 (...continued) the prior art). Inherency may not be established by probabilities or possibilities. See C’ontinental Can Co. v. Moiisanto Co., 948 F.2d 1264, 1269 (Fed. Cir. 1991).

52 Only one independent claim (out of seven) recites “compliant solder balls” and only two independent claims recite CTE matching between the package substrate and the PCB. The Abstract - while mentioning other claimed features of the Lin patent such as displaced vias (discussed below) - fails to discuss matching the CTEs of the package substrate and the PCB. See RX-6. Thus, the problem of solder joint fatigue was not a central focus of the Lin patent, and the only solution disclosed in Lin is the use of compliant solder balls and matching the CTEs of the package substrate and the PCB.

53 Moreover, Dr. Charles did not opine that the Lin patent inherently discloses “movable” terminals, as that term is construed pursuant to Sharp’s or the Staffs claim construction. See Sharp’s Post-Hearing Br. at 3 5; Charles Tr 1 700- 1728, 17 19-1 720, 1790-1 8 12, 1828- 1829.

93

any effect on internal package stress.54 See Charles Tr. 1703-171 1. In fact, the Lin patent

expressly refers to “related material” that uses a high modulus material to achieve low internal

package stress. Charles Tr. 1796; RX-6, col 1, lines 9-1 1; RX-72. Thus, if there is any teaching

in Lin regarding internal package stress, it is to use a rigid, not a compliant,

Inasmuch as Dr. Charles admitted that it is possible to build a Lin package with a rigid

material between the package substrate and chip, it is possible that terminal movement in a chip

covered by the Lin patent will be significantly constrained. See Charles Tr. 1786- 179 1.

Dr. Charles fkrther admitted that the thinner or more rigid the die attach material, the more the

CTE of the chip will constrain the movement of the top surface of the package substrate and the

more the top surface of package substrate will track the expansion of the chip. When there is a

thin, rigid die attach, the package substrate will be constrained such that it will expand or

contract in close relation to the chip. Charles Tr. 1786-1787. Therefore, it is possible to build a

Lin package that has a rigid die attach, a thin die attach, or even a thin, rigid die attach so that the

chip will significantly constrain the movement of the terminals. Such constraint of movement

5 4 The Lin patent says nothing about the material or modulus of the die attach, other than that the chip is “conventionally bonded to die attach surface 14 by a die bond 20” and that the thickness of the die attach “is of sufficient thickness to support electronic component 18 above the plane of first wiring layer 30.” See Charles Tr. 1790-181 1; RX-6, col. 2, lines 49-53, col. 5, lines 26-33. [

] Mr. Lin did not say that the purpose of the die attach was to reduce solder joint fatigue. Lin Tr. 1552. In fact, no claim in Lin recites a die attach, let alone its material, thickness or modulus. RX-6, col. 7, line 46 - col. 12, line 52.

5 5 A PTO rejection in a subsequently-filed and currently pending application should not be given any weight. The Office Action does not constitute an action by Tessera affecting the scope of a pending claim. Furthermore, the Examiner did not find that Lin inherently disclosed movement that significantly improves solder joint reliability. Moreover, the Examiner’s statement is preliminary, may be based on a misreading of Lin, and is not final. See RX-473 at TES S 500027-42.

94

would preclude a finding that the displacement of terminals in Lin provides significant

compensation for differential thermal expansion. See Charles Tr. 1786- 179 1; RX-6.

Accordingly, Sharp has failed to prove that the claimed movability is inherently disclosed

by the Lin patent. See FF, Section IV B (FF 1017-1 127).

b. The Lin patent could not render any asserted claim obvious

1. The Lin patent teaches away from an embodiment having electrically active solder balls and terminals directly underneath vias

Sharp essentially admits that Lin does not anticipate claim 11 of the ‘326 patent.56

Sharp’s Post-Hearing Br. at 35 n.30. Sharp attempts to argue in a footnote that Lin’s reference to

a “single layer carrier substrate” means that it would have been obvious to modi@ Lin’s package

substrate so that it reads on claim 1 1. Id. Lin expressly teaches away from a design having: (i)

terminals located on the top surface; and (ii) through-hole vias in direct alignment with the

terminals. See, e.g., RX-6, col. 5, lines 7-9 (“It should be noted that solder pads 34 and solder

balls 26 are, in all cases, displaced away from vias 32 on package mounting surface 16.”). Thus,

there can be no finding that claim 11 would be rendered obvious by Lin.

Dr. Charles opined that it would have been obvious to combine Figures 4 and 6 of the Lin

patent to make an embodiment with terminals on the top surface of the package substrate that are

directly aligned with through-hole

56 Indeed, the Lin patent fails

vias (as required ‘326 patent, claim 11). Charles Tr. 1734.

to anticipate claim 11 of the ‘326 patent. In addition to the deficiencies discussed in connection with independent claim 1, the Lin patent fails to disclose, and in fact teaches away from, the limitations of claim 1 1. See Charles Tr. 1807-1 809; RX-6, col. 5, line 7- col. 12, line 5 2 , Figs. 1 , 3-6.

95

Dr, Charles’ apparent justification for this is his belief that the Lin patent discloses single-layer

package substrates. Charles Tr. 1720-1721. What Dr. Charles meant by single-layer was a

package substrate with a single metallization layer. Id. However, Lin fails to disclose such a

package substrate. See RX-6, col. 5, line 58 - col. 6, line 10, Figs. 1, 4, 5, 6. Rather, the

single-layer package substrate disclosed in the Lin patent is one with a single insulating layer and

two metallization layers. Id. In fact, claim 35 of the Lin patent specifically recites a structure

having a single-layer package substrate and terminals displaced away from the vias. See RX-6,

col. 12, lines 14-39.

Sharp has failed to establish a motivation for creating a new embodiment having

electrically active solder balls and terminals directly underneath vias. The Lin patent not only

fails to disclose such an embodiment, it expressly teaches away from it by emphasizing that in all

cases, the terminals on the package substrate bottom surface should be displaced away from

through-hole vias. See FF, Section IV B (FF 1128-1 186).

.. 11. Secondary considerations provide strong evidence of

novelty in this case

Secondary considerations “may often be the most probative and cogent evidence of

nonobviousness in the record.” Stratoflex, Inc. v. Aeroyuip Corp., 713 F.2d 1530, 1538 (Fed.

Cir. 1983). Important secondary considerations, or objective indicia, factors may include:

(i) general industry acquiescence; (ii) commercial success of Sharp’s infringing products; and

(iii) long-felt, but unresolved need. See WMS Gnniing Inc. v. Int’I Ganze Tech., 184 F.3d 1339,

1359 (Fed. Cir. 1999). Tessera’s evidence of secondary considerations rebuts any argument of

obviousness.

96

Tessera has weighty evidence that the chip packaging industry has embraced its

technology covered by the patents-in-suit. The Commission has already determined that

Tessera’s licensing activities are sufficiently extensive to constitute a domestic industry in the

patents-in-suit. See Notice of Commission Determination Not to Review an Initial

Determination Granting a Motion for Summary Determination That the Domestic Industry

Requirement of Section 337 Is Satisfied (Feb. 26, 2001). Indeed, more than 30 different

companies have agreed to pay Tessera for the use of its patented chip packaging technology.

McWilliams Tr. 35-37; CX-536, CX-323C. These license agreements either expressly include

the ‘977 and ‘326 patents, or, if they were entered into before these patents issued, expressly

include the earlier patents to which the ‘977 and ‘326 are related. Thus, nearly all of Tessera’s

licensees have licensed Tessera’s face-up packaging technology. McWilliams Tr. 3 7; see, e.g. ,

Smith Tr. 234-237; CX-241C [

Tessera’s licensees have paid an up-front license fee. See, e.g., CX-241C at TESS006332-33;

CX-259C at TESS005598; CX-309C at TESS005908; CX-297C at TESS005806; CX-3 11C at

TESS005928; CX-3 14C at TESS005988-89. In addition, many of Tessera’s licensees pay

royalties. McWilliams Tr. 94; CX-323C. These royalties are directly tied to the manufacture

and/or sale of products that utilize Tessera’ s patented technology, including the patents-in-suit.

See, e.g. , McWilliams Tr. 36-39, 85-86; Smith Tr. 251-259; Order No. 13 (initial determination)

Tessera has already received royalty payments in excess of [

1; c x - 2 5 9 c [ 1. The majority of

1. See CX-323C.

Sharp has also been successfd in selling CSPs which use Tessera’s face-up technology.

1,

1. CX-579 (RX-878); CX-576C, Sharp’s

From 1996 to March 2001, Sharp’s worldwide sales of CSPs have exceeded [

with revenues of more than [

97

Response to Interrogatory No. 206, Attachment 3; CX-582C, Sharp’s Response to Interrogatory

No. 206, Attachment 3. Sharp’s CSP sales in the United States alone have exceeded 16.3 million

units, with revenues of more than [ 1. CX-14C; CX-32C; CX-44C; CX-576C;

CX-582C. Moreover, contrary to Sharp’s assertion that there is no “nexus” between its

commercially successfbl CSP sales and Tessera’s patents, the evidence clearly demonstrates that

the vast majority of the CSPs that Sharp currently sells in the United States are [

1, which infringe the asserted claims. See Infringement

Section; Qu Tr. 346-348, 363-365, 43 1, 442-445, 473-474, 467-468, 499 618-619, 1872;

Engelmaier Tr. 8 16: 18-8 17; CX-2OC, Sharp’s Response to Interrogatory No. 126(d), Attachment

5 at 2-3; CX-580 (RX-879). [

1 Sharp’s customers

want this type of product because it is more reliable, and Sharp actively advertises this fact.

Kada Tr. 1284-1287, 1291-1295, 1336; Qu Tr. 399-400; Engelmaier Tr. 813-814; CX-49 at

TESS272772-73, TESS272778-87, TESS272785.

Nonobviousness is fbrther established by the long-felt but previously unresolved need in

the industry for a solution to solder joint fatigue. See McWilliams 43-56; CPX-50; CPX-52.

Although many companies before Tessera attempted solutions to reduce the solder joint strain,

none proved to be satisfactory in the long run. Engelmaier Tr. 693-695; Lin Tr. 1554; Charles

Tr. 1786-1791; CPX-54; CPX-74; RX-6, col 3, lines 9-17. The claimed inventions, with

movable terminals inside the package, was dramatically different from previous attempts to

improve reliability. Engelmaier Tr. 695-698. The fact that so many companies quickly took

licenses to Tessera’s technology highlights the significance and novelty of Tessera’s solution to

98

solder joint fatigue.

Thus, evidence relating to secondary considerations, or objective indicia, lends hrther

support to the conclusion that Sharp has failed to demonstrate that any asserted claim is invalid

for obviousness. See FF, Section TV G.

c. The Lin patent is not prior art to the ‘977 or the ‘326 patent

In addition to the substantive grounds for holding that the Lin patent does not invalidate

the ‘977 patent or the ‘326 patent, the evidence shows that the Lin patent cannot be considered

prior art to the patents-in-suit. The Lin patent has an effective filing date of December 4, 1990.

Sharp argues that the Lin patent is prior art under 35 U.S.C. 5 102(e) because it was filed prior to

the invention of the asserted patent claims. Sharp’s Post-Hearing Br. at 36-37. However,

Tessera asserts and has presented strong evidence that the invention date for its patent claims is

no later than June 10, 1990.57 See FF, Section IV A. Therefore, Sharp must prove that the June

10, 1990 invention date relied on by Tessera is incorrect, or that the Lin patent has an invention

date prior to June 10, 1990. See Innovalive Scuha Concepts, Inc. v. Feder Indus., Inc., 26 F.3d

11 12, 1 1 15 (Fed. Cir. 1994); Mahurkar v. C‘.R. Bard Inc., 79 F.3d 1572, 1576 (Fed. Cir. 1996);

Ganznia-Metrics, Inc. v. Scantech Ltd., 52 U.S.P.Q.2d 1579, 1584 (S.D. Cal. 1998)

During questioning by counsel for respondents and for the Commission Investigative

Staff, Dr. DiStefano gave detailed testimony that he and Dr. Khandros conceived a face-up chip

package with terminals under the chip on a flexible interposer, with wire bonds that connected

Tessera also introduced evidence of diligence following the June conception up until 57

constructive reduction to practice in March 1991. Bottoms Tr. 107-1 08, 127- 130, 13 5- 136, 146- 149; CX-329C (DiStefano Dep.) Tr. 427-43 1, 437-438, 452; CX-1OOC.

99

the chip contacts to traces on the interposer. His testimony as to the time of conception was

based on his own recollection (as recorded in a previously filed affidavit) and the notebooks of

co-inventor, Igor Khandros. See CX-329C (DiStefano Dep.) Tr. 404-4 17, 43 1-43 8; CX-

94CDiStefano Dep. Ex. 56 (DiStefano Affidavit), 11 4-12.

The Khandros notebooks demonstrate that work on the claimed inventions began well

before June 10, 1990, and that the inventions were complete no later than that date. See CX-

328C (Khandros Dep.) Tr. 55-62; CX-12C at TESS070649-57. The notebooks provide

documentation of conception of the claimed inventions. For example, in the June 1, 1990 entry,

Dr. Khandros wrote: “The problem with FLIP-CHIP joining is that solder balldjoints must

accommodate the thermal stresses due to TCE mismatch between silicon chip and the substrate.”

Later in that entry he recorded a design in which “the direction of the wirebond is towards the

chip centers, so that the thermal stress buckles the wires, instead of tensile force being applied.

* * * The chip is decoupled from the substrate, and the thermal stresses simply buckle the wires

of a wirebond, without danger of failure ofjoints.” CX-12C at TESS07065 1-53 (emphasis in

original).

The testimony of Drs. DiStefano and Khandros was confirmed at the hearing by that of

Dr. Wilmer bottom^.'^ Dr. Bottoms testified that he advised Drs. Khandros and DiStefano to

5 8 Dr. Wilmer Bottoms was an original member of the Board of Directors of IST Associates, Inc. (“IST”), which later changed its name to Tessera, and a general partner of the venture capital firm that provided the initial investment in IST. Bottoms Tr. 97-98, 11 1-1 12. Dr. Bottoms received a bachelor’s degree in physics from Huntington College and a Ph.D. in physics from Tulane University. After graduating from Tulane, Dr. Bottoms was a member of the faculty of Princeton University for seven years. While at Princeton, Dr. Bottoms worked in the area of surface physics associated with insulators and semiconductors. Bottoms Tr. 96-97, 100-1 01.

Beginning in about April 1990, Dr. Bottoms made at least monthly visits to IST’s facility in (continued.. .)

100

document their engineering ideas carefully in a notebook, and that each entry should be dated,

and reviewed and witnessed by another person who regularly reviewed the notebooks. Bottoms

Tr. 107-127, 157-158. In his testimony, Dr. Bottoms was able to answer questions about the

progress of the work by Drs. DiStefano and Khandros, and his understanding of the Khandros

notebook entries. See, e.g., Bottoms Tr. 106-135, 149-153, 160-162.

Sharp argues that the Khandros notebook first disclosed a face-up chip package on

January 6, 1991. See Sharp’s Post-Hearing Br. at 36-37. However, Sharp’s position is based on

the erroneously assertion that Dr. Khandros testified that the June 10, 1990 notebook entry, on

which Tessera relies in part, was not directed to the claimed inventions. See Sharp’s Post-

Hearing Br. at 37. The exhibit discussed in the portion of the Khandros deposition relied on by

Sharp is actually an abortive attempt at a patent dated June 9, 1990. See CX-332C (Khandros

Dep.) at 148-153; see RX-63 (Khandros Dep. Ex. 26) at 1. Sharp has not established that the

June 9, 1990 document is a draft of the application that led to the patents-in-suit. Similar

argument is found in Sharp’s proposed findings 1104 and 1105. However, as pointed out by

Tessera in its objections to those proposed Sharp findings, Sharp has failed to establish that the

draft application referred to by Sharp during the Khandros deposition led to the patents-in-suit.

58 (. . .continued) New York where he met personally with Drs. DiStefano and Khandros. In addition, Dr. Bottoms spoke with Drs. DiStefano and Khandros on the telephone more than once a week. Bottoms Tr. 109-1 10. Dr. Bottoms was present during many of the inventors’ meetings in April and May of 1990, in which they discussed the problems they intended to solve, as well as the technologies that might address those problems. Bottoms Tr. 106-107. During his meetings with the inventors, Dr. Bottoms regularly read the engineering notebooks of both Drs. Khandros and DiStefano, and confirmed that the notebooks had been witnessed. Dr. Bottoms personally witnessed and signed several pages of at least one of the Khandros engineering notebooks. Bottoms Tr. 110-1 11, 117-1 18; CX-12C at TESS70688, TESS70691, TESS70693.

101

According to Tessera, the draft may be, at best, a communication regarding an application that

was filed in September, 1990. See Tessera’s Objection’s to Sharp’s PFF.59’ ‘()

Based on the arguments of the parties and the evidence of record, June 10, 1990 is found

to be the invention date for Tessera’s asserted patent claims.

Perhaps realizing that it cannot prove that Lin’s filing date predates Tessera’s invention,

Sharp argues that Lin is prior art under 35 U.S.C. 5 102(g). In particular, Sharp argues that the

Lin invention was conceived in February 1989, diligently reduced to practice in 1989-90, and

ready to be shipped for sale in August 1990. Sharp’s Post-Hearing Br. at 37.

[

] Lin Tr. 1588-1589. An inventor’s testimony, standing alone, is

insufficient to prove conception. Corroboration is necessary. See Price v. Symsek, 988 F.2d

1187, 1194 (Fed. Cir. 1993). A “rule of reason” analysis is applied to determine the

corroboration of the inventor’s prior conception testimony. Id. at 1195. The allegedly

corroborating evidence is a set of drawings that fail to disclose [

1. Furthermore, the

drawings fail to discuss solder joint fatigue or the allegedly inventive solution of coefficient of

thermal expansion (CTE) matching. See RX-607C (Motorola Production Nos. 003 8 1-0037).

The testimony of Sharp’s Dr. Charles on this point is also based on an erroneous interpretation of the Khandros deposition. Charles Tr. 1685-1 688.

Far from providing testimony that his June 10, 1990 notebook entry was outside the claimed inventions, when Dr. Khandros was directly asked whether the June 10 entry discloses a face-up chip carrier with the chip being glued down to a package substrate, he testified that the drawing in the June 10 entry “could be” a face-up design. See CX-328C (Khandros Dep.) Tr. 208.

59

60

102

Thus, the February 6, 1989 drawings fail to corroborate Mr. Lin’s testimony regarding

conception.

Moreover, any alleged diligence in 1989 and 1990 has not been established. No

documents from that time discuss solder joint fatigue or CTE matching. See RX-5 12C; RX-

607C. Sharp’s statement that Motorola products with OMPACs passed tests and were ready for

shipment by August 1990 is not supported by any credible evidence. Sharp has failed to prove

what components were in the particular OMPAC parts that passed the tests, such as the material,

thickness and modulus of the die attach and package substrate. In addition, Sharp has failed to

prove that such parts had Lin’s feature of CTE matching to reduce solder joint fatigue. The cited

document also says nothing about the components of the tested OMPACs. See RX-5 12-C at

MOT 00036. Finally, there is no support in the cited testimony that the OMPACs were ready to

be shipped for sale, as argued by Sharp. Based on Mr. Lin’s testimony one can establish that

testing is necessary for shipment. However, testing alone does not confirm that shipment took

place. See Lin Tr. 158 1. There is no clear and convincing evidence that the Lin invention was

actually reduced to practice by August 1 990.6’

In summary, Sharp has failed to prove that the Lin patent was conceived in February

1989, or conceived and reduced to practice by any date prior to June 10, 1990 (which is the

conception date of the claimed inventions). Sharp therefore has failed to prove by clear and

convincing evidence that Lin is prior art under Section 102(e) or 102(g).

‘’ Indeed, for purposes of argument only, the earliest possible date for conception of Lin is August 3, 1990, the date of an entry from Mr. Lin’s notebook that describes [

Motorola Production No. 00575. The notebook entry fiu-ther states that these are the ideas of the three inventors of the Lin patent. See id.

1. RX-409 at

103

2. The OMPAC Article

a. The 1991 OMPAC article is not prior art

The 1991 OMPAC article relied on by Sharp (RX-99) was published in May 1991.

Charles Tr. 1737-1738; RX-99 at 176; RX-372. See FF 1189. That publication date is eleven

months after the invention date established in this investigation for Tessera’s patents, and two

months after Tessera’s constructive reduction to practice. Thus, the 199 1 OMPAC article cannot

be considered prior art to the claimed inventions.

b. The 1991 OMPAC article does not anticipate claims 6 and 22 of the ‘977 patent or claims 1 and 3 of the ‘326 patent

Even if the 199 1 OMPAC article were prior art, it could not anticipate any asserted claim.

Like the Lin patent, the 1991 OMPAC article does not expressly disclose the “movable”

limitation of the asserted claims. This does not appear to be in dispute. See Charles Tr. 18 13;

RX-99. Furthermore, the 1991 OMPAC article also does not inherently disclose the claimed

movability, for a number of reasons. The package described in the article has a BT resin package

substrate. RX-99 at 177. Dr. Charles did not - and cannot - point to any express disclosure in

the article stating that the package substrate is flexible. Moreover, the article fails to disclose

anything about the die attach, other than it is a “conventional epoxy die attach.” Charles Tr

1813; RX-99 at 177. The 1991 OMPAC article thus does not exclude the possibility that a

package built according to its teachings would have a thin or rigid die bond

Furthermore, the 1991 OMPAC article discusses tests that analyzed the adhesion strength

ofthe encapsulant (mold compound). RX-99 at 177-178, Figs. 6, 7, 10-15. Figure 7 ofthe 1991

104

OMPAC article illustrates the fracture interface of the package substrate and the mold compound

after torque testing. RX-99 at Fig. 7. Figures 10, 11 and 12 of the article illustrate delamination

of the mold compound at one of its interfaces, while Figures 13, 14 and 15 illustrate an

improvement where no delamination is detected. RX-99 at Figs. 10-14. The article is clearly

focused on ensuring that the mold compound remains rigidly adhered to the materials with which

it interfaces. There is no discussion at all regarding solder joint fatigue. See RX-99. The 199 1

OMPAC article is directed toward solving an entirely different problem from that resolved by the

asserted pat en t claims.

In light of the foregoing, the movable limitation of the asserted claims is not inherently

disclosed in the 1991 OMPAC article. Not only is there no discussion whatsoever regarding

solder joint fatigue, but it is possible to build a package according to the article’s disclosure with

a thin or rigid die attach. Such a die attach would constrain the “movability” of terminals and

preclude a finding of substantial compensation for thermal expansion mismatch. See Charles Tr.

1786-1789, 1813; RX-99. Thus, the article does not necessarily disclose movable terminals

relative to the chip to provide substantial compensation for differential thermal expansion. Dr.

Charles opined that the article discloses terminals that move relative to the chip due to the natural

expansion of materials. See Charles Tr. 1739-1742. As in the case of the Lin patent, Dr.

Charles’ opinion is not relevant to a finding of invalidity. His testimony does not prove or even

tend to prove that the 1991 OMPAC article discloses movement that substantially reduces the

strain in the solder joints, based on Sharp’s construction. Nor does the testimony prove that the

article discloses movement that provides substantial compensation for differential thermal

expansion. Thus, there is no evidence that one of ordinary skill in the art would find that the

105

1991 OMPAC article discloses “terminals movable relative to the chip.” See FF 1190-1239.

3. U.S. Patent No. 4,887,148 to Mu

Sharp maintains that the Mu patent (RX-90) invalidates each asserted patent claim even

though the Mu patent was considered by the PTO examiner during the prosecution of the

application that issued as the ‘977 patent. In determining whether Sharp has established

invalidity, deference should be given to the PTO examiner’s consideration of the Mu patent. See

Anzerican Hoist & Derrick Co. I). Sowa Ce Sons, Inc., 725 F.2d 1350, 1359 (Fed. Cir. 1984).

a. The Mu patent does not anticipate any asserted claim

1. The claimed movability is not expressly or inherently disclosed

The Mu patent does not expressly disclose the claimed movability or discuss the

problems of CTE mismatch or solder joint fatigue. Charles Tr. 1822-1830:2 (Charles); RX-90

(Mu Patent). Sharp argues that although the Mu patent discloses a pin grid array package, the

external pins are very short and very large in diameter such that they would experience the same

fatigue problems as solder joints of ball grid array packages. See Charles Tr. 1749-1 75 1.

Sharp’s expert, however, failed to point to any text in the Mu patent that supports this position.

See Charles Tr. 1753-1755. Indeed, such text could not be found in the Mu reference because

there is no such disclosure. See Engelmaier Tr. 1910-191 1; RX-90, col. 3 , line 11- col. 4, line 2.

The Mu patent does not disclose the use of very short pins that are very large in diameter to one

of ordinary skill in the art at the time of the Mu patent. Id. If a pin were made shorter, it would

106

extend only halfway through the board. Id. One skilled in the art would recognize that this

presents a reliability problem because the plated through-hole of the printed circuit board would

crack due to the stress concentration. Id. If the pins were larger in diameter, then the

corresponding holes in the printed circuit board would have to be larger, thereby giving up

desired “real estate” on the board Id. The drive in the industry at the time was to make the holes

in the PCB smaller to gain more real estate. Id. Accordingly, the Mu patent does not disclose

short external pins that are very large in diameter. Rather, the Mu patent discloses that the length

of the traces on the package substrate should be reduced so that the electrical signal delay

between different channels is equalized. RX-90, col. 1, line 24 - col. 2, line 7, col. 4, lines 16-23,

col. 5 , lines 34-48. Thus, Sharp’s basis for arguing that the Mu patent somehow addresses the

problem of solder joint fatigue is unsupported.

In addition, the Mu patent fails to disclose inherently the claimed movability. The only

information the patent provides regarding the die attach is that it could be “any type of adhesive

material such as adhesive glue.” RX-90, col. 4, lines 33-36. Therefore, the Mu patent does not

exclude the possibility that a package built according its teachings would have a thin or rigid die

attach, which would constrain movement to prevent substantial compensation for differential

thermal expansion. See Charles Tr. 1786-1789, 1822-1823, 1829. The Mu patent thus does not

necessarily disclose terminals that move relative to the chip to provide substantial compensation

for differential thermal expansion. There is no inherent disclosure of the claimed movability.

Dr. Charles opined that Mu discloses “movable” terminals because the CTE of the package

substrate would be different from that of the chip. See Charles Tr. 1749-1764, 1821-1823, 1829-

1830. This testimony does not support a finding of invalidity.

107

ii. The Mu patent does not expressly or inherently disclose a flexible package substrate

The Mu patent discloses that the package substrate is a printed circuit board material, but

fails to disclose its modulus or thickness, or state that it is flexible. Engelmaier Tr. 191 1-1912;

RX-90, col. 3, lines 50-52, Fig. 1. One of ordinary skill in the art would understand that such a

substrate is rigid because a large number of pins must be inserted into corresponding holes of a

PCB. Engelmaier Tr. 19 1 1 - 19 12. The Mu patent, in fact, contemplates a pin grid array package

having up to 410 pins. Inserting 410 pins would not be possible if the package was flexible

because the pins would bend out of alignment given the large number of holes in the PCB.

Engelmaier Tr. 191 1-1 9 12; RX-90, col. 3, lines 20-23. Accordingly, the Mu patent does not

expressly or inherently disclose a flexible sheetlike element. See FF, Section IV D.

4. US. Patent No. 4,549,247 to Hoppe

The Hoppe patent (RX-92) discloses embodiments used in smart cards or similar devices.

Engelmaier Tr. 19 12- 19 14; RX-92 (Hoppe Patent), col. 1 , lines 40-42. Smart cards are placed in

automatic dispensing machines, so that the terminals on the smart card make sliding contact with

pins in the machine. Engelmaier Tr. 1912-1 914; RX-92, col. 1, lines 46-54, Fig. 1 , The Hoppe

patent provides no disclosure or teaching of the terminals soldered to a PCB. Engelmaier Tr.

19 12-1 9 15, 1926- 1927; RX-92. Thus, it is not surprising that Hoppe lacks a discussion of solder

joint fatigue or differential thermal expansion. See Charles Tr. 1819, 1830; RX-92. Based on the

false premise that Hoppe embodiments are soldered to PCBs, Dr. Charles opined that the chip

will expand and contract according to its CTE; because the carrier film substrate (with its higher

108

CTE) will expand more than the chip, the contacts will move relative to the terminals. Charles

Tr. 1767-1768. Dr. Charles provided no testimony or evidence to support a finding that Hoppe

discloses movable terminals relative to the chip to provide substantial compensation for

differential thermal expansion, to reduce the strain in the solder joints, or to substantially

improve solder joint reliability. See Charles Tr. 1786-1 789, 18 19, 1830; RX-92. Sharp thus has

failed to establish by clear and convincing evidence that the Hoppe patent discloses the claimed

“movable” limitation. See FF, Section IV E.

5. U.S. Patent No. 5,086,558 to Grube and Khandros

The Grube patent (RX-95) is not prior art because its filing date is after Tessera’s

invention date. Also, it does not anticipate claim 22 of the ‘977 patent because it does not

expressly or inherently disclose “terminals [that] are movable with respect to said chip and said

contacts.” It also fails to disclose “leads.”

The Grube patent discloses a low temperature method of directly attaching a chip

(face-down) to a PCB or module substrate. RX-95 (Grube Patent), col. 2, lines 3-30. An

interposer, which may be made of glass-filled or ceramic-filled elastomer, has holes which

conform to the chip contacts. RX-95, col. 4, lines 3 3 - 5 3 , Fig. 2. The holes of the interposer are

filled with a composite paste, which joins the chip to a PCB or module substrate. RX-95, col. 5,

lines 14-18, Fig. 2. The composite joining material is “preferably formed of a composite of a

thermoplastic polymer such as a copolymer of polyimide and siloxane and a fine metal such as

gold powder.” RX-95, col. 1, lines 11-18, col. 4, line 61 - col. 5, line 1, col. 5, lines 59-66. The

Grube patent does not di$close the modulus of the composite joining material. RX-95, col 1,

109

lines1 1-18, col. 4, line 61 - col. 5, line 13, col. 5, lines 59-66. Adopting arguendo Dr. Charles’

apparent interpretation of “terminal” (i.e., the bottom of a conductive column), the Grube patent

does not expressly disclose terminals that are movable relative to the chip. See Charles Tr. 1824;

RX-95. Nor is such a feature inherently disclosed. This is because it is possible to build an

arrangement according to the teachings of the Grube patent with a glass-filled or ceramic-filled

interposer and rigid conductive joining material. Charles Tr. 732, 830-831, 1826; RX-95, col. 4,

lines 33-40, col. 4, line 64 - col. 5, line 13. Accordingly, the Grube patent does not necessarily

disclose terminals that move relative to the chip to provide substantial compensation for

differential thermal expansion. See Charles Tr. 1786-1787, 1789; RX-95, col. 4, lines 33-40, col.

4, line 64 - col. 5, line 13.

Dr. Charles opined that the “movable” claim limitation is inherently disclosed because

the bottom surface of the interposer expands with the PCB, while the top surface of the

interposer is tied to the chip and will thus expand less because the chip expands less. As with Dr.

Charles’ opinions regarding other prior art references, his opinion as to the Grube patent does not

support a finding of invalidity. His testimony failed to establish that the Grube patent discloses

the claimed movability. Charles Tr. 1775-1 780, 1824-1 827. Accordingly, Sharp has failed to

prove anticipation by clear and convincing evidence.

The Grube patent also fails to disclose “leads.” The Grube patent refers to the composite

joining material as “contact joints” or “joints,” never as “leads.” See RX-95, col. 2, lines 15-18,

col. 4, lines 18-26, col. 4, lines 29-33, col. 5, lines 29-33. Dr. Charles failed to explain why one

skilled in the art would consider such conductive columns to be “leads.” See Charles Tr. 1825,

Sharp therefore has failed to establish by clear and convincing evidence that the Grube patent

110

discloses “flexible leads electrically connecting said terminals to said contacts.” See FF, Section

IV F.

V. ENFORCEABILITY

Sharp alleges that the ‘326 patent and the ‘977 patent are unenforceable because the

applicants or attorney for the ‘326 and 977 patents committed inequitable conduct when they

failed to bring the ‘558 patent to Grube and Khandros to the attention of the examiner during the

prosecution of the applications that resulted in the issuance of the patents-in-suit.62 See Sharp’s

Post-Hearing Br. at 49-50; Sharp’s Rebuttal Br. at 24. Tessera denies Sharp’s allegations, and

presents facts and arguments in opposition. The Commission Investigative Staff also argues that

Sharp has failed to present clear and convincing evidence that inequitable conduct occurred in

connection with the Grube patent.

In order to prevail on its defense of inequitable conduct, Sharp must demonstrate, by clear

and convincing evidence, that the applicants misrepresented information or failed to disclose

information that would have been material to the examination of the application, and that the

applicants had the specific intent to mislead or deceive the PTO. Molins PLC v. Textyon, Inc., 48

F.3d 1172, 1181, 33 U.S.P.Q.2d 1823 (Fed. Cir. 1995). In the case of nondisclosure of

information, the evidence must show that “the applicant made a deliberate decision to withhold a

known material reference.” Molins, 48 F.3d at 1 18 1.

62 “When a court has finally determined that inequitable conduct occurred in relation to one or more claims during prosecution of the patent application, the entire patent is rendered unenforceable.” Kingsdo~vn Medical C‘onmlfanfs, Ltd. v. Hollister, Inc., 863 F.2d 867, 874 (Fed. Cir. 1988) (in baric a s to porlion tiled), cert. denied, 490 U. S . 1067 (1 989).

111

First, Sharp has failed to prove by clear and convincing evidence that Grube is material.

Sharp apparently claims Grube was material because it anticipates claim 1 of the ‘266 patent and

claims 1 and 22 of the ‘977 patent. Sharp’s Post-Hearing Br. at 49. As discussed above, the

Grube patent is markedly different from the inventions of the patents-in-suit. The Grube patent

lacks several elements from claim 1 of the ‘266 patent and claims 1 and 22 of the ‘977 patentb3

Second, Sharp has failed to establish by clear and convincing evidence that Dr. Khandros

or Mr. Millet knew of any alleged materiality of the Grube patent. As an initial matter, there is

no evidence that Dr. Khandros even knew that the Grube patent issued. He testified at his

deposition that he could not recall if he had ever become aware of its issuance. RX 332-C

(Khandros Dep.), Tr. 206-207. Sharp also failed to establish by clear and convincing evidence

that Mr. Millet knew that Grube was material to the examination of the ‘977 patent application.

Mr. Millet’s citation of Grube in two unrelated Tessera patent applications does not prove such

knowledge of materiality

The two Tessera patents in which Grube was cited - U.S. Patent No. 5,808,874 issued to

Smith (“Smith”) (RX 445) and U.S. Patent No. 6,020,220 issued to Gilleo et al. (“Gilleo”) (RX

448) - are very different from the ‘977 patent. Smith discloses a face-down arrangement that

uses liquid, flowable conductive masses to connect a chip to its package substrate. See RX-445

(Smith Patent), Fig. 4, col. 2, lines 12-42. Gilleo similarly discloses a face-down arrangement

having conductive polymer disposed within apertures of an interposer layer. RX-448 (Gilleo

63 Dr. Charles failed to make any comparison between Grube and claim 1 of the ‘266 patent. This omission is significant because claim 1 of the ‘266 patent recites, among other things, “a plurality of terminals disposed in a pattern on said second surface of said interposer.” That limitation that clearly cannot be met because the Grube interposer does not have a metallization layer on it from which a pattern of terminals would be formed.

112

Patent), col. 5, lines 32-37. Like Grube, both Smith and Gilleo disclose the use of conductive

material in a face-down arrangement. By contrast, the ‘977 patent recites leads - not conductive

polymer paste - to connect chip contacts to terminals on a package substrate. See RX-445, Fig.

4, col. 2, lines 12-42; RX-448, col. 5, lines 32-37; RX-95, col. 1, lines 11-18, col. 4, line 61 - col.

5 , line 1, col. 5, lines 59-66. Sharp has failed to establish how Mr. Millet’s citation of Grube in

the Smith and Gilleo patents translates,to knowledge of its materiality for the ‘977 patent. Thus,

Sharp has failed to establish that Mr. Millet knew that Grube was material to the patentability of

the ‘977 patent claims.

Finally, there is no evidence of record which establishes any intent to deceive the PTO.

Sharp has failed to establish that either Dr. Khandros or Mr. Millet made a deliberate decision to

withhold a known material reference. See CX-352C at 2-3.

Sharp has failed to establish that Dr. Khandros or Mr. Millet intentionally withheld the

Grube patent to mislead the PTO. Thus, Sharp’s allegation that the ‘977 and ‘326 patents are

unenforceable is unsupported by the record. Sec FF, Section V.

VI. DOMESTIC INDUSTRY

Domestic industry was not raised as an issue during the hearing or in the parties’

post-hearing briefs. Furthermore, in Order No. 13 (initial determination), the Administrative

Law Judge issued a summary determination based on Tessera’s patent licensing activities in

connection with the ‘977 patent and the ‘326 patent that an industry exists in the United States, as

required by subsection (a)(2) of section 337. The Commission determined not to review Order

No. 13, and thus it became the final determination of the Commission. See Notice of

113

Commission Determination Not to Review an Initial Determination Granting a Motion for

Summary Determination That the Domestic Industry Requirement of Section 337 Is Satisfied

(Feb. 26, 2001). See FF, Section V1.

114

FINDINGS OF FACT

1. BACKGROUND

1. Solder joint fatigue is the most significant threat to semiconductor package reliability for

primarily two reasons. First, the material behavior of solder is unique in the engineering

world. Second, solder joints are used to connect electronic packages to printed circuit

boards. Since a wide variety of materials are used in the electronic packages, and heat is

generated by use, problems with differential thermal expansion are prevalent. Tr. 670: 12-

67 1 : 1 8 (Engelmaier).

The material behavior of solder is unique because (in a solid state) it is close to its

melting point. In particular, solder is commonly used above its homologous temperature,

which is half of its melting temperature on the Kelvin (or absolute) temperature scale.

For example, typical eutectic tidlead solder has a melting point of 183 O C; thus, its

homologous temperature is approximately -45 O C. Like other metals, solder experiences

"creep" when used above its homologous temperature. Tr. 671 : 19-672: 18 (Engelmaier).

Creep is a time, temperature and stress-dependent property of solder. This means that if a

load is applied to a metal above its homologous temperature, it will deform. Essentially,

the metal flows like a viscous fluid, like molasses in the winter. When solder creeps

above its homologous temperature, it experiences plastic deformation, which leads to

solder fatigue and electronic circuit failure. Tr. 672: 19-674:24 (Engelmaier).

In solder joints which connect an electronic package to a printed circuit board, differential

thermal expansion between the package materials and the printed circuit board causes

plastic deformation in the solder joints. This deformation is applied on a cyclic basis, so

2.

3.

4.

115

that each cycle subjects the solder joint to fatigue damage. The fatigue damage is

cumulative, so that failure will eventually occur. Tr. 676:3-677: 14 (Engelmaier).

Differential thermal expansion results from the fact that the materials used in electronic

packaging have varying coefficients of thermal expansion ("CTE"). In other words, some

materials will expand and contract relatively.more than other materials when they are

heated and cooled. Tr. 678:9-23 (Engelmaier).

In the context of electronic packaging, differential thermal expansion typically results

because the printed circuit board to which a package is attached has a higher CTE than

the package and/or the silicon chip within the package. This means that the PCB will

expand and contract more than the package during thermal cycling, which ultimately

results in fatigue and failure of the solder joints that connect the package to the PCB. Tr.

678:24-680:21 (Engelmaier); CPX-152.

Prior to the use of organic printed circuit boards, the industry used ceramic substrates

(analogous to circuit boards) to which electronic components were attached. Due to their

brittle nature, ceramic substrates were limited in size to roughly 4 inches square. The

packages attached to ceramic substrates included ceramic chip capacitors/resistors,

leadless ceramic chip carriers, and flip-chips. At that time, flip-chips were essentially

silicon dies that were directly attached to the ceramic substrate with solder joints. In

5 .

6.

7.

hybrid technology, differential thermal expansion between electronic components and the

ceramic substrate was not a serious problem, because there was very little CTE mismatch

between the silicon components and the ceramic substrate. Tr. 681 : 10-683:9

(Engelmaier); CPX-49.

116

8. After hybrid technology, the electronic industry began to use organic printed circuit

boards, and attached components to the circuit boards by using through-hole technology.

With through-hole technology, the electronic components had relatively long, compliant

external leads that would extend through holes in the printed circuit board, after which

they were soldered. Because through-hole technology included compliant external leads

with very robust solder joints, there were few problems with solder joint reliability as a

result of differential thermal expansion. Examples of electronic packages that employed

through-hole technology were dual-inline packages (DIPS) and pin grid arrays (PGAs).

Tr. 683 : 10-685 : 14 (Engelmaier); CPX-50; CPX-5 1.

In order to obtain greater package density with greater numbers of I/Os, the industry

moved to surface mount technology ("SMTII). SMT included electronic packages like

leaded chip carriers and quad flat packages (QFPs) with external compliant leads that

were soldered to contact pads on top of the printed circuit board. For leaded chip carriers

and QFPs, differential thermal expansion is largely taken up by the compliant external

leads, which come in various shapes, such as gull-wing, J or S. Tr. 686:20-688:20

(Engelmaier); CPX 52; CPX-53,

Those in the industry also attempted to use surface mount technology with flip-chips on

organic printed circuit boards. However, with larger chips, there is a huge differential

thermal expansion mismatch between the flip-chip and the printed circuit board, which

leads to early solder joint failure. Efforts have been made to solve this problem through

the use of underfill epoxy, which has the effect of creating a very strong adhesive bond

between the flip-chip and the printed circuit board. The problem with the use of underfill

9.

10.

117

is that it usually requires the destruction of the entire printed circuit board to replace a

defective flip-chip. Tr. 688:21-690:4 (Engelmaier); CPX-52; CPX-54.

1 1. Quad flat packs and other externally leaded packages became less practical as chips

became more and more complex, and the number of I/Os increased. Thus, the industry

began to use ball grid array packages ("BGAII). BGAs are similar to pin grid arrays,

except that surface-mounted solder balls replace the pins which would normally extend

through plated through-holes in the printed circuit board. Thus, the solder connections of

BGAs are much less robust than the soldered pins of pin grid arrays, which utilize

through-hole technology. In response, the industry developed strategies such as the use

of solder columns, which are essentially tall surface-mounted solder joints, in an attempt

to improve solder joint reliability in BGAs. Tr. 690:5-691: 13 (Engelmaier); CPX-52;

CPX-54.

The Strain Equation can be used to calculate strain in the solder joints of an electronic

package, such as a BGA. The equation is as follows:

12.

DNP . A o ~ . A T Strain =A€ =

h

Where:

A& is the strain range;

DNP is the "distance from the neutral point" to the corner solder joint;

A a is the difference between the CTEs of the package and the PCB;

A T is the difference in minimum and maximum temperature over which the package is cycled; and

h is the height of the solder joint (i. e., the distance from the top of the solder joint to the PCB).

118

Tr. 691: 14-693:8 (Engelmaier); CPX-74.

To improve solder joint reliability, those in the industry attempted to manipulate the

variables of the Strain Equation to reduce strain in the solder joints of an electronic

package. This generally involved solutions that were external to the electronic package.

Tr. 693 :9-695:20 (Engelmaier); CPX-74.

For example, strain could be reduced by using smaller packages to reduce the distance to

the neutral point, or DNP. However, this ran counter to the industry's need for larger

chips with a greater number of I/Os. Tr. 693:9-21 (Engelmaier); CPX-74.

Strain could also be reduced by attempting to "match" the CTEs of the package and the

PCB to reduce ha; for example, through the use of ceramic packages on a ceramic

mounting substrate. However, this limited the materials that could be used for packages

and/or printed circuit boards. Tr. 693 :9-694:6 (Engelmaier); CPX-74.

Another strategy for reducing strain might be to limit the temperature range to which the

mounted package will be subjected. Tr. 693:9-694:6 (Engelmaier); CPX-74.

One could also attempt to reduce solder joint strain by increasing the height of the solder

joints, such as through the use of solder columns. Tr. 693:9-694:6 (Engelmaier); CPX-

54; CPX-74.

The invention of the '977 and '326 patents differed from the prior art in that the inventors

brought the solution of movable terminals inside the package. This solution can be

illustrated in the Strain Equation by subtracting the displacement that occurs within the

patented package from the total displacement caused by the expansion mismatch between

13,

14.

15.

16.

17.

18.

119

the chip and the printed circuit board substrate, as follows:

DNP. A a . AT - [movement in package] Strain = A & =

h

This solution was a "paradigm shift," i.e., something that apparently nobody had thought

of before. Tr. 694:21-698: 12 (Engelmaier); CPX-74.

The invention of the '977 and '326 patent includes movable terminals. The purpose of the 19.

, movability is to take up a significant portion of the large expansion mismatch between the

chip and the circuit board internally in the chip rather than as strain in the solder joints.

Tr. 70 1 :8-703:9 (Engelmaier); CPX-21.

The prior art did not allow for the use of very small solder joints, because such small joints 20.

could not easily withstand the differential thermal expansion of thermal cycling. Tr.

703: 10-705: 1 1 (Engelmaier); CPX-148.

The movable terminals of the invention distinguished it from the prior art, and allowed the 21,

use of more compact packages. Due to the movability of the terminals of the patented

packages, a good deal of the thermal expansion mismatch can be taken up inside the

package. In the patented packages, the terminals tend to move in the same direction as the

printed circuit board, which reduces the amount of deformation in the solder balls. This

removes strain from the solder joints and improves the reliability of the package. Tr.

705: 13-707:2 (Engelmaier); CPX-149.

The general structure of a face-up CSP according to the asserted claims of the '977 and

'326 patents is shown in CPX-2 1. Tr. 70 1 : 8-702:3 (Engelmaier); CPX-2 1 ,

22.

120

23.

24.

25.

26.

27.

28.

29.

30.

31.

A face-up CSP, such as a Sharp CSP, includes a silicon chip or die, a package substrate

beneath the chip, and electrical connections between the silicon die and the solder joint.

Tr. 331:19-332:16 (Qu); CPX-160.

The electrical connections between the contacts and terminals are referred to as leads. In

face-up CSPs, these leads may consist of bonding wires from the chip contacts to the

package substrate and metallic traces on the substrate that connect the bonding wires to the

terminals. Tr. 331:19-332:16 (Qu); CPX-160.

Conductive masses, such as solder balls, are attached to the terminals on the substrate. Tr.

331119-332116 (Qu); CPX-160.

The chip and bonding wires are typically covered by encapsulant or overmold. Tr.

331:19-332:16 (Qu); CPX-160.

The solder balls are used to connect the CSP to a printed circuit board (PCB), which is

typically made of a material such as FR-4. Tr. 331:19-332:16 (Qu); CPX-160.

The patents address the problem of differential thermal expansion by removing strain froin

the solder joints. Tr. 695:21-698: 12 (Engelmaier).

Materials in general expand and contract with changes in temperature. Tr. 678:9-23

(Engelmaier).

The rate at which a material expands or contracts is referred to as the "coefficient of

thermal expansion," or CTE, of the material. Tr. 678:9-23 (Engelmaier).

The CTE of the materials used to make PCBs is significantly greater than the CTE of

silicon, so that the PCB will typically expand and contract much more than the silicon chip

during changes in temperature. Tr. 332: 17-333:8 (Qu).

121

32. This difference in expansion and contraction is referred to as thermal mismatch or

differential thermal expansion. Tr. 332: 17-333:8 (Qu); Tr. 678:9-23 (Engelmaier).

In prior art packages with compliant external leads, the external "gullwing" leads, as

illustrated in CPX-52 and CPX-53, absorb most of the expansion mismatch between the

chip and the PCB. Tr. 822:6-23 (Engelmaier); CPX-52; CPX-53.

As Mr. Kada, Sharp's CSP manager, has admitted in a technical publication, the solder

balls in a CSP are much less able to relieve stress compared to prior art packages with

compliant "gullwing" type external leads. For this reason, the reliability achievable with a

standard CSP is less than the reliability for a package with external compliant leads. Tr.

821 :5-822:5 (Engelmaier); CX-87 ("Triple-Chip Stacked CSP"), p. 3, first column, last

paragraph.

According to a technical publication authored by Mr. Kada, Sharp's CSP development

manager, in a CSP "considerable stress is generated in solder balls sandwiched between

the mounting board and the chip." That is, the solder balls undergo stress due to the

thermal expansion mismatch between the chip and the PCB. Tr. 822:24-823: 13

(Engelmaier); CX-87 ("Triple-Chip Stacked CSP"), p. 3, first column, last paragraph.

The "considerable stress [that] is generated in solder balls sandwiched between the

mounting board and the chip" is due to differential thermal expansion. Because the solder

ball joints on the CSP are attached to both the silicon die and the "mounting board," or

PCB, the differential thermal expansion pulls the solder joint back and forth, deforming

the shape of the solder joint. This differential thermal expansion and solder ball

deformation is illustrated in the animation provided as CPX-152. Tr. 333:9-334:4 (Qu);

33,

34.

35.

36.

122

37.

38.

39.

40.

41.

42.

43.

44.

45.

CPX-161; Tr. 679:8-680:15 (Engelmaier); CPX-152.

The solder joint deforms because force is applied, and this applied force generates stresses

in the solder joint. Tr. 339:2-12 (Qu).

Strain is a measure of the solder joint deformation - the change in shape or volume -

resulting from the applied force. Tr. 339:2-12 (Qu).

Shear strain is strain that occurs if the applied force distorts the shape of the solder joint.

Tr. 336: 19-337: 14 (Qu).

Normal strain is strain that occurs if the applied force simply stretches the solder joint. Tr

336:19-337:14, 534:3-9 (Qu).

Normal strain can also compress the solder joint. Tr. 534:3-9 (Qu).

As illustrated in CPX-24, differential thermal expansion pulls the solder joint horizontally.

This results in shear strain. CPX-24; Tr. 818:8-819:3 (Engelmaier); Tr. 336: 19-337: 14

( Q 4

In addition to pulling the solder joint horizontally, or "shearing," the differential thermal

expansion causes warpage of the PCB, which compresses and stretches the solder joint.

This results in normal strain. This warpage is illustrated in CPX-500, and in RX-476

CPX-500 (solder joint A); RX-476 at SHA008956-C; Tr. 336:19-337: 14, 534:3-9,

1852:11-1853:11 (Qu).

Differential thermal expansion between the chip and the PCB causes both shear and

normal deformation, or strain, in the solder joint. Tr. 1860: 15-22 (Qu).

Solder joint deformation, or strain, leads to solder joint fatigue and failure. The solder

joint stain thus impacts solder joint reliability. Tr. 333:9-334:7 (Qu); CPX-161.

123

46.

47.

48.

49.

50.

51.

52.

53.

The total effective strain consists of both normal strain and shear strain. Tr. 443:23-

444: 14 (Qu).

Thermal cycling tests are commonly used in the industry to determine solder joint

reliability for a package mounted onto a printed circuit board. This is sometimes referred

to as "board level reliability." CX-87 ("Triple-Chip Stacked CSP"), p. 3, Figure 7; Tr.

32413-23 (Qu).

In a thermal cycling test, the package assembly is placed in a thermal chamber, and the

temperature is cycled over a temperature range, for example from -40°C to 125 OC, until

the solder joint fails. Tr. 324:3-23 (Qu).

Thermal cycling tests typically include a "dwell time" at the high and low temperatures in

the range. Tr. 361:16-23 (Qu).

In a thermal cycling test, the temperature is increased and decreased, or cycled, between

the high and low temperatures in the range. Tr. 387:3-8 (Qu).

During thermal cycling, the solder joints will fail due to differential thermal expansion.

Tr. 332:17-334:7 (Qu); CPX-161.

Thermal cycling tests may be conducted by removing the mounted CSPs from the thermal

chamber periodically, to check far solder joint fractures, or by using a "daisy chain" that

runs power through the solder balls, and electrically monitors when there is a solder joint

failure. Tr. 796: 19-797: 11 (Engelmaier).

When thermal cycling tests are conducted using a daisy chain, there is current running

through the package while the temperature cycling test takes place. Tr. 797: 12-23

(Engelmaier).

124

54.

55.

56.

57.

58.

.59.

60.

Thermal cycling tests are accelerated tests: they use a higher temperature range to

accelerate the failure and obtain information about failure quickly. Tr. 388:9-25 (Qu); Tr.

1291: 15-25 (Kada); CX-5OC (Sharp's CSP Mounting Technology Guidelines) at

SHA067463-C.

The semiconductor and chip packaging industries frequently use the temperature range -

40" C to 125 O C for accelerated thermal cycling tests: the increased temperature range

accelerates the failures of the solder joints in the chip packages, so that they fail more

quickly than they will in the field. Tr. 324:3-23, 388:9-25 (Qu).

Other temperature ranges are sometimes used, including the range from -40 O C to 160" C,

but the range of-4OoC to 125°C is the industry standard. Tr. 385:lO-17, 393:24-394:5

(QU).

Dr. Pitarresi, in his expert report, relied upon an article that listed an industry survey of

temperatures used for reliability testing. Of the "consumer applications" companies

surveyed, 60% tested for reliability at 125°C. Tr. 1481:16-1482:ll (Pitarresi); CX-477.

Sharp tests its own CSPs over the range of -40°C to 125°C as part of its product

qualification. Tr. 386:7-387:2 (Qu); CX-5OC (Sharp CSP Mounting Technology

Guidelines) at SHA067460-C through SHA067463-C.

During development of its improved single-layer CSP design, Sharp conducted tests over

the range of -40°C to 125°C. Tr. 795:ll-25, 797:24-798:4 (Engelmaier); CX-75C.

Sharp publishes reliability test data obtained over the range -40°C to 125°C on its public

website. Tr. 392:24-393:17

Reliability), at TESS272773

(Qu); CX-49 (Sharp website presentation, Sharp CSP

and TES S272778-TES S272786,

125

61. The number of cycles until solder joint failure from a thermal cycling test can be used to

predict long-term life in the field. Tr. 324:3-23, 389:l-7 (Qu).

62. In order to extrapolate from thermal cycling tests to life in the field, the upper temperature

for thermal cycling tests should be below the glass transition temperature of the FR4 PCB,

which is above 150°C. An upper temperature of 125°C is well below 15OoC, so results

from thermal cycling tests that are run with an upper temperature of 125 "C can be used to

extrapolate to life in the field. Tr. 807:l-21 (Engelmaier).

Typically, long-term life in the field is determined by multiplying the cycles to failure

from a thermal cycling test by an acceleration factor. Tr. 344:24-345:22 (Qu).

63,

64. Sharp's CSP mounting guidelines explain how its accelerated thermal cycling test data,

obtained over the range of -40°C to 125"C, predicts product performance in the field. Tr.

389:8-21 (Qu); CX-5OC (Sharp CSP Mounting Technology Guidelines) at SHA067463-C.

65. Solder joint reliability is a more severe problem for CSPs than for other packages. As Mr.

Kada, Sharp's CSP manager, admitted in a technical publication, the solder balls in a CSP

are much less able to relieve stress compared to prior art packages with compliant

"gullwing" type external leads. For this reason, the reliability achievable with a standard

CSP package is less than the reliability for a package with external compliant leads. Tr.

821 :5-822:5 (Engelmaier); CX-87 ("Triple-Chip Stacked CSP"), p. 3, first column, last

paragraph.

Mr. Engelmaier testified that when, in RX-28, he wrote that test conditions must not be

more extreme than in "actual use," this depended on the kind of PCB used in the test:

66.

ceramic PCBs used in military environments may be tested over different ranges than

126

plastic, or FR4, PCBs used in consumer applications. Tr. 1021 :24-1022:24 (Engelmaier);

RX-28.

67. RX-28 expressly recommends the use of temperatures for accelerated testing that are

greater than those that will be experienced in actual use. RX-28, abstract, and at 10, Table

1.a.

Mr. Engelmaier testified that during the time frame 1988-1990, when he wrote RX-28, the

plastic (FR4) substrates then in use went into nonlinear regions at high temperatures. TCT

tests at high temperatures using these FR4 boards therefore did not give results that could

be extrapolated. Tr. 1021 :24-1022: 12, 1022:25-1023:9 (Engelmaier).

Mr. Engelmaier testified that the limits on test temperatures that he recommended in 1990

came from the behavior of the FR4 PCBs when tested near their glass transition

temperature. Tr. 807:9-21, 102 1 :24- 1022: 14, 1024: 16-2 1 (Engelmaier)

Mr. Engelmaier testified that modern FR4 PCB substrates have a higher glass transition

temperature then PCB substrates in the 1990 time frame, and therefore are not subject to

the same test temperature limits. Tr. 807:9-21,1023 :25-4 (Engelmaier).

It is Mr. Engelmaier's view that at this time, testing up to 125 "C is perfectly acceptable as

an upper limit. Tr. 807:9-21 (Engelmaier).

Mr. Engelmaier testified that the limits on test temperatures that he recommended in 1990

came from the behavior of the FR4 PCBs when tested near their glass transition

temperature. Tr. 807:9-21, 102 1 :24- 1022: 14, 1024: 16-2 1 (Engelmaier)

Mr. Engelmaier testified that modern FR4 PCB substrates have a higher glass transition

temperature then PCB substrates in the 1990 time frame, and therefore are not subject to

68.

69.

70.

71,

72.

73.

127

the same test temperature limits. Tr. 807:9-21,1023:25-4 (Engelmaier).

74.

75.

76.

77.

78.

79.

80.

81

It is Mr. Engelmaier's view that at this time, testing up to 125°C is perfectly acceptable.

Tr. 807:9-21 (Engelmaier).

The glass transition temperature, T,, of the FR4 used in Dr. Qu's tests and analyses was

150°C. CX-548C at 2.

Thermal cycling tests between 40°C and 125°C are sometimes conducted with power to

the chips. Tr. 583:12-23 (Qu).

Mr. Engelmaier testified that at the time he wrote the article cited as RX-28, tests from -

65°C to 150°C were being performed in the industry. At these temperatures, the plastic

materials being used went into nonlinear regions. As a result, the reliability test results

could not be extrapolated. Tr. 1021 : 1-24 (Engelmaier).

Mr. Engelmaier testified that in order to determine how terminals behave in actual service

conditions, it was necessary to stay 25 "C below the glass transition temperature of the

printed circuit board. Tr. 1023:23-1024:4, 1024: 13-21 (Engelmaier).

Dr. Qu used a PCB with a glass transition temperature of 150°C in his tests. CX-table

from Qu report. CX-548C at 2.

The nonlinearity problems Mr. Engelmaier wrote about in RX-28 do not impact the

validity of reliability analyses using modern PCB material, such as Dr. Qu's analyses. Tr.

1010:4-16 (Engelmaier).

Mr. Engelmaier testified that at the time he wrote the article cited as RX-28, tests up to

165 " C were being performed in the industry. At these temperatures, the plastic materials

being used went into nonlinear regions. As a result, the reliability test results could not be

128

extrapolated. Tr. 1022: 5-24 (Engelmaier).

During cross-examination, Mr. Kada denied that he had earlier testified that board level

reliability was up to the customer. Tr. 1283:ll-25 (Kada).

On cross-examination, Mr. Kada denied stating that package-level reliability was up to

Sharp, and board-level reliability was up to the customer. Tr. 1283: 11-25 (Kada)

Solder reflow, high temperature storage, and thermal cycling tests are all part of the

"normal" life and operation of chip packages according to the asserted claims. Tr. 1288:3-

1291:3, 1295:16-1296:ll (Kada); CX-5OC at 15-17; RX-35C.

There is no question that temperature cycling over a very wide range of temperatures

(storage, solder reflow, TCT) will affect the reliability of chip packages according to the

asserted claims, Tr. 128O:lO-24, 1316:5-1317:22 (Kada).

Power dissipation from a chip increases temperature 5-10°C. Tr. 1339: 19-24 (Kada).

The Coffin-Manson equation has been widely used in the industry to predict the fatigue

life of solder ball joints. Tr. 1799:9-13; RX-873.

Solder ball fatigue life can be estimated, based on changes in solder joint strain, using the

Coffin-Manson equation:

82.

83.

84.

8 5 .

86.

87.

88.

Where:

Nf represents the number of thermal cycles to failure;

129

C represents a constant that is determined empirically, using experimental data;

AE represents the strain range for one thermal cycle over a given temperature range; and

P represents a constant that is also determined empirically, using experimental data; it is usually between .4 and . 8 .

RT 342: 14-343: 17 (Qu); CPX-62 (Coffin-Manson equation).

89. The Coffin-Manson equation determines the number of cycles to (solder joint) failure, N ,

based on changes in solder joint strain, A&. Tr. 342:14-343:2, 618:5-12 (Qu); CPX-62.

90. The constants C and p depend on the actual test conditions, including the temperature

range used in the thermal cycling test, and how long parts stay at each temperature. Tr

343:25-344:14 (Qu).

91, The actual values for C and p can be determined, for example, by conducting an actual

thermal cycling test to determine the number of cycles to failure, and then doing a curve

fitting to obtain the constants C and p from the test data. Tr. 344:24-345:22 (Qu).

Long-term reliability, or life in the field, can be determined by multiplying the number of

cycles to failure predicted by Coffin-Manson by an acceleration factor. Tr. 344:24-345:22

92.

(QUI.

93, Strain, not stress, is used in the Coffin-Manson equation to determine solder joint fatigue

life. Tr. 346:2-21 (Qu); CPX-63.

Strain and stress are related, as shown in CPX-58. 339:18-340:2 (Qu); CPX-58.

In the elastic region, stress and strain have a linear relationship. Tr. 340:4-13 (Qu); CPX-

59.

94.

95.

130

96.

97.

98.

99.

100.

101.

102.

103.

104.

105.

In the elastic region, a reduction in stress leads to a proportional reduction in strain. Tr.

341113-22 (Qu); CPX-60.

When solder ball strain occurs in the elastic region - that is, when it deforms elastically -

the solder ball recovers from the strain with little damage. Tr. 340: 19-341 :4 (Qu); Tr.

673 :9-24 (Engelmaier).

In the plastic region, the change in stress is no longer proportional to the change in strain.

Tr. 340:6-18 (Qu); CPX-61.

In the plastic region, a small reduction in stress corresponds to a large reduction in strain.

Tr. 342: 1-9 (Qu); CPX-61.

When solder ball strain occurs in the plastic region, the deformation results in permanent

damage. Tr. 340: 19-341 :8 (Qu); Tr. 673:9-24 (Engelmaier).

Removing strain from the solder balls in the plastic region yields greater benefits than

removing strain in the elastic region. Tr. 352: 17-353: 18 (Qu).

Creep in solder is a time, temperature and stress-dependent property that causes the solder

to "flow." Tr. 672: 19-673:2 (Engelmaier).

When creep occurs, the elastic strains in solder are converted to plastic deformation, which

damages the solder permanently. When creep has occurred, there is plastic deformation in

the solder, which is permanent. Tr. 672: 19-674:24 (Engelmaier).

Creep effects become significant when solder is under a load or force for some period of

time. Tr. 672: 19-23 (Engelmaier).

During thermal cycling tests, the effects of creep must be considered during the "dwell

time" of the thermal cycling tests. Tr. 360:24-361:2 (Qu).

13 1

106.

107.

108

109.

110.

111 .

112.

113

In the Coffin-Manson equation, the constants include the effects of creep on the solder

joint. Tr. 360:24-362: 11, 1877:12-1878:3 (Qu); CPX-64.

The constants in the Coffin-Manson equation account for the dwell time in a thermal

cycling test. Tr. 1877:12-1878:3 (Qu).

The value of p in the Coffin-Manson equation is typically between 0.4 and 0.8, and the

value of I / p is therefore greater than 1 .O. Thus, in the Coffin-Manson equation, the

relationship between the number of cycles to failure, Nf, and the change in strain is

exponential, because the exponent l / p is always greater than one. Tr. 343:3-24 (Qu);

CPX-62.

Under the Coffin-Manson equation, a small decrease in strain yields an exponential

increase in the number of cycles to failure. Tr. 343:3-24 (Qu); CPX-62.

The impact of a small decrease in solder joint strain is particularly significant in the plastic

region. Tr. 346:2-21 (Qu); CPX-63.

The most common value for Beta in use of the Coffin-Manson formula, as recognized by

Sharp’s expert Dr. Harry Charles, is 0.6. RX-873 at 3.17.

If the Coffin-Manson equation is used with a typical value of 0.6 for p, and a baseline

design is assumed to have 300 cycles to failure, decreasing the effective strain by 1/3 will

increase the solder joint fatigue life to 600 cycles, Tr. 346:22-347:22 (Qu); CPX-64 (three

examples of Coffin-Manson with strain reduction).

If the Coffin-Manson equation is used with a nominal value of 0.6 for p, and a baseline

design is assumed to have 300 cycles to failure, decreasing the effective strain by % will

increase the solder joint fatigue life to 900 cycles. Tr. 346:22-348:3 (Qu); CPX-64 (three

132

examples of Coffin-Manson with strain reduction),

Solder joint strain can be reduced by allowing the terminals to move relative to the chip.

Tr. 705: 13-706: 10 (Engelmaier); CPX-149 (animation of CSPs with movable and non-

movable terminals).

If the terminals tend to move in the same direction as the printed circuit board when it

expands, the solder ball joints will deform less than if the terminals do not move. Tr.

705: 13-706: 10 (Engelmaier); CPX-149 (animation of CSPs with movable and non-

movable terminals).

The movable terminals allow the expansion mismatch between the chip and the PCB to be

taken up, in part, by the CSP package, instead of all the mismatch being taken up in the

solder joints. Movable terminals take away strain that would occur in the solder joints by

accommodating motion inside the package. Tr. 706: 11-707:2 (Engelmaier); CPX-149

(animation of CSPs with movable and non-movable terminals).

Terminal movement can be facilitated by including a compliant layer in the package,

between the chip and the solder terminals. Tr. 364:ll-365:15, 366:23-368:15 (Qu).

For example, Mr. Kada, in a technical publication, recognized that using a compliant

"bonding material" above the solder balls "will hrther alleviate the stress on the solder

balls." Tr. 823: 17-824: 11 (Engelmaier); CX-87 ("Triple-Chip Stacked CSP"), at 3, first

column, last paragraph.

Mr. Kada conducted tests, published in the "Triple-Chip Stacked CSP" article, CX-87,

showing that changing the insulator, or die bond film, can increase solder joint reliability.

An enlargement of Figure 7, showing the test results, is provided as CPX-176. A CSP

1 14.

1 15.

116.

117.

1 18.

1 19.

133

with a layer of Insulator A has greater reliability than a CSP with a layer of Insulator B. A

CSP with a 35 micron layer of Insulator A has greater reliability than a CSP with a 25

micron layer of Insulator A. Tr. 825:3-827:3 (Enge1maier);CX-87 ("Triple-Chip Stacked

CSP") at 3; CPX-176.

Insulator A, which yields greater reliability, has '/4 the modulus of Insulator B, which is

DF-400. That is, Insulator A is four times softer than Insulator B. Tr. 828:3-829: 10 CX-

87 ("Triple-Chip Stacked CSP"), p. 3, Figure 7; CPX-176; Tr. 829: 11-83 1 :2; CX-378C

(Sharp's interrogatory response identifying insulator A and insulator B), Attachment 6.

The shear strain on the solder joints is the distance (d l ) that the solder joint is stretched or

distorted, divided by the height of the solder joint (h), as shown in CPX-29. Tr. 349.12-

350: 18 (Qu); CPX-29 (illustration of geometry of movable and non-movable terminals);

Tr. 3 5 1 5 1 2 (Qu).

If the solder terminals (point A in CPX-29) cannot move relative to the chip (point B),

then all the strain due to differential thermal expansion must be borne by the solder joint.

Tr. 349: 12-3 50:2 (Qu); CPX-24 (illustration of movable and non-movable terminals);

CPX-29 (illustration of geometry of movable and non-movable terminals).

If the distance (dl) that the solder joint is stretched by differential thermal expansion can

be reduced, by allowing the terminal, point A in CPX-29, to move, the strain on the solder

joint will be reduced. Tr. 349: 12-35 1 :3 (Qu); CPX-24 (illustration of movable and non-

movable terminals); CPX-29 (illustration of geometry of movable and non-movable

terminals).

Sometimes shear strain may be reduced by horizontal terminal movement. Tr. 351 :5-12

120.

121

122.

123.

124.

134

125.

126.

127.

128.

129.

11.

(Qu); CPX-24 (illustration of movable and non-movable terminals); CPX-29 (illustration

of geometry of movable and non-movable terminals).

However, solder joints also experience normal strain, which is reduced by vertical

movement of the terminals. Tr. 351:5-12 (Qu); Tr. 534:25-535:25 (Qu).

The combination of shear strain and normal strain is the effective strain. Tr. 348:9-14;

443:23-444:14 (Qu).

To determine the impact of strain reduction on solder joint fatigue life, using the Coffin-

Manson equation, the @kcfive strain reduction should be used. Tr. 348:9-14, Tr. 443:23

444: 14 (Qu).

The decrease in strain, due to terminal movement, increases solder joint reliability. Tr.

353 120-23 (Qu).

Sharp’s expert, Dr. Pitarresi, agreed that a reduction in strain results in an increase in

solder fatigue life. Tr. 1477: 13-1 9 (Pitarresi).

IMPORTATION AND SALE

130. Sharp has imported or is importing into the United States CSPs with the following

identifying numbers:

AI LH5 1 BOJl (a.k.a. LH5 1 BOJl , 5 1 BV1 OJY7OLL, and LH5 1 BV1 OOOJY-7OLL);

AILH51BOJY (a.k.a. LH51BOJY, LH51BVlOOOJY-70L, LH5 lBV1000JY-70LL, and LH5 lBV10000JY-70L);

A1 LHF04C09 (a. k.a. LHF04C09, F04C09, and LH28F004SCB-L85);

AlLHF04Cl1 (a.k.a. LHF04C11, F04C11, and LH28F004SCHB-L85);

135

AlLHF08CC8 (a.k.a. LHFO8CC8, F008SCHB-TL12, and LH28F008SCHB- TL 12);

AlLHF08CF9 (a.k.a. LHF08CF9, F008SCB-V85, and LH28F008SCB-V85);

AlLHF08CZ7 (a.k.a. LHFO8CZ7, F008SCHB-27, and LH28F008SCHB-Z7);

A1 LHFl6BZO (a. k.a. LHFl6BZ0, F1 6OBGHB-BTLZO, LH28F160BGHB- BTLZO, and LH2F160BGHB-BTLZO);

AlLHF16C11 (a.k.a. LHF16C11, F016SCB-L95, and LH28FOlGSCB-L95);

AlLHFl6C 13 (a. k.a. LHFl6C 13, FO 16SCHB-L95, and LH28FO 16SCHB-L95);

A1 LHFl6CZ3 (a.k.a. LHF16CZ3, F016SCB-L95, and LH28FO16SCB-L95);

AlLHF16K11 (a.k.a. LHFl6Kl1, F160S3B-Ll0, LH28F160S3B-Ll0, and LH28F160S3B);

AlLHF16K27 (a.k.a. LHF16K27, F160S5B-L70, and LH28F160S5B-L70);

A 1 LHF 1 6K29 (a. k . a. LHF 1 6K2 9, F 1 60 S 5 HB -L70, and LH2 8F 1 60 S 5 HB -L7 0) ;

AlLHF16K52 (a.k.a. LHF16K52, F160S3HB-LlOA, and LH28F160S3HB-LlOA);

AlLHF32K05 (a.k.a. LHF32K05, F320S3B-Ll1, and LH28F320S3B-LlI);

A1 LHF32K14 (a.k.a. LHF32K14, F320S5B-L90, and LH28F320S5B-L90);

AI LW32K16 (a.k.a. LHF32K16, F320S5HB-L90, and LH28F320S5HBL90);

A1 LHF40B 17 (a. k.a. LHF40B 17, F40B 17 and LH28F400BGB-BL85);

AlLHF80BI 1 (a.k.a. LHF80B11, AlLHF80811, F800BGHB-TL85, and LH28F800BGHB-TL85);

AlLHF80B21 (a.k.a. LHF80B21, AlLHF80821, F800BGB-BL85, and LH28F800BGB-BL85);

A1 LHF80BZ2 (a, k.a. LHF80BZ2, A1 LHF808Z2, F800BGHB-BZ2, and LH2 8 F 8 0 OB GHB -B Z 2) ;

AlLHF80BZ4 (a.k.a. LHF80BZ4, AlLHF80824, FSOOBGHB-BZ2, and

136

AlLHF80BZA (a.k.a. LHF80BZA, AlLHF808ZA, F800BGHB-TTL90, F8000BGHB-TTL90, and LH28F800BGHB-TTL90);

AZLHF80BZE (a. k.a. LHF80BZE, AILHF808BZE, F800BGHB-BTLZE, and LH2 8F800B GHB -B TLZE);

AlLHF80G11 (a.k.a. LHF80G11, F800SGB-L70, and LH28F800SGB-L70);

AlLHF80G14 (a.k.a. LHF80G14, F800SGHB-10, F800SGHE3010, and LH28F800SGHB-L IO);

AI LROE569 (a.k.a. LROE569 and 65007B3);

AlLROE570 (a.k.a. LROE570 and LXA0360);

AI LROE593 (a.k.a. LROE593 and LXA0070);

A1 LROE701 (a.k.a. LROE7Ol);

AlLROE768 (a.k.a. LROE768);

AlLROYV002 (a.k.a. LROYV002 and 65056A1);

A1 LROZ48Cl (a.k. a. LROZ48C 1);

AlLROZ48C3 (a.k.a. LROZ48C3);

AlLROZ56C5 (a.k.a. LROZ56C5);

AlLROZ64C2 (a.k.a. LROZ64C2);

A1 LROZ72CO (a.k.a. LROZ72CO);

A1 LROZ72C1 (a.k.a. LROZ72Cl);

AlLROZ72C2 (a.k.a. LROZ72C2);

AlLROZB2CO (a.k.a. LROZB2CO);

AlLROZGOC2 (a.k.a. LROZGOC2);

137

A1 LROZH6CO (a. k. a. LROZH6CO);

AlLROZH6C 1 (a.k.a. LROZH6C 1);

AlLROZJOCO (a.k.a. LROZJOCO);

AlLROZVOCO (a.k.a. LROZVOCO);

AlLROZVOCl (a.k.a. LROZVOC1);

A1 LRS 132 1 (a. k.a. LRS 1321);

A1 LRS 1327 (a.k.a. LRS 1327);

AlLRS13271 (a.k.a. LRS13271 and LRS1327);

AlLRS1329 (a.k.a. LRS1329);

AlLRS1331 (a.k.a. LRS1331);

A1 LRS 134 13 (a. k.a. LRS 134 13);

A1 LRS 1342 (a. k.a. LRS 1342);

AlLRS1344 (a.k.a. LRS1344);

A1 LRS 1348 (a. k.a. LRS 1348);

LH-1x045 1 TAZZ (CSP contained in camcorder);

LH-1x045 1 TAZZ" (CSP contained in camcorder);

LZ9HTl8Y (CSP contained in camcorder);

LH-IX0530TAZZ* (CSP contained in camcorder);

RH-IX0494TAZZ" (CSP contained in camcorder);

LR38532A (CSP contained in camcorder);

LR3B532A (CSP contained in camcorder);

LHDV5001 (CSP contained in camcorder);

138

TH-IX0530TAZZ" (CSP contained in camcorder);

RH-IX0494TAZZ* (CSP contained in camcorder);

RH-IX0629TAZZ (CSP contained in camcorder);

RH-IX0629TAZZ" (CSP contained in camcorder);

LR38554 (CSP contained in camcorder);

LR3B554 (CSP contained in camcorder);

RH-1x071 OTAZZ (CSP contained in camcorder);

RH-1x07 1 OTAN 1 (CSP contained in camcorder);

LR38708/14 (CSP contained in camcorder);

LR38708 (CSP contained in camcorder);

RH-1x07 1 OTAN 1 (CSP contained in camcorder);

RH-1x0823 TAZZQ (CSP contained in camcorder);

LR38714 (CSP contained in camcorder);

LHFBSAO5 (a.k.a. LH16V07) (CSP contained in camcorder);

AI LHF40817 (a.k.a. F40817, LH28F80OBGHEbTL85);

AlLRS1331B;

AlLHF16JZB (a.k.a. LH28F160BJHG-TTL90 and F16OBJHG-TTL90);

AI LROZ72C4 (a.k.a. LROZ72C4 and AlLROZ7204);

AI LRS 133 13 (a.k.a. LRS 133 13);

AI LRS 1701 (a.k.a. LRSl701);

A1 LRS 1702 (a. k.a. EPCl6S3 5UC88);

AlLRS1348B (a.k.a. LRS1348B); and

139

AlLRS 13 6 1 A (a.k.a. LRS 13 6 1A).

CX-14C at Sharp’s Responses to Interrogatory Nos. 1, 2, 3, 5, 6, 8, 10 and 29, and at

Attachment 1 (SHAO15544-C) and Attachment 2 (SHAO15545-C); CX-484C at Sharp’s

Responses to Interrogatory Nos. 1, 5, and 10, and at (Revised) Attachment One

(SHA073858-C through SHA073860-C) and Attachment 2 (SHA073861 -C); CX-24C at

Sharp’s Response to Interrogatory No. 144, and at Attachment One; CX-13C at Sharp’s

Responses to Interrogatory Nos. 1, 2, 3, 5, 6, 8, 10 and 29; CX-17C at Sharp’s Response to

Interrogatory No. 144; CX-576C at Sharp’s Response to Interrogatory No. 1, and at

Attachment 3; CX-25C at Sharp’s Response to Interrogatory No. 149, and at Attachment

One; CX-335C (Thun Dep ) Tr. 13:13-19, 24:8-16, 31:23-32:5, 41:5-23; CX-582C at

Sharp’s Response to Interrogatory No. 1, and at Attachment 3; CX-485C at Sharp’s

Response to Interrogatory No. 150, and at Attachment 3 .

Sharp has imported or is importing into the United States camcorders with the following

identifying numbers, each of which camcorders contains one or more CSP:

13 1.

VLDX 1 OU;

VLDC3U;

VLPDlU;

VLPD3U;

VLSD20U;

VLFD 1 U; and

LFDlU.

140

CX-14C at Sharp’s Responses to Interrogatory Nos. 1, 2, 3, 5 , 6, 8, 10 and 29, and

Attachment 2 (SHAO15545-C); CX-484C at Sharp’s Responses to Interrogatory Nos. 1, 5 ,

and 10, and at Attachment 2 (SHA073861-C); CX-24C at Sharp’s Response to

Interrogatory No. 144, and at Attachment One at 5 ; CX-13C at Sharp’s Responses to

Interrogatory Nos. 1, 2, 3, 5 , 6, 8, 10 and 29; CX-17C at Sharp’s Response to Interrogatory

No. 144; CX-25C at Sharp’s Response to Interrogatory No. 149, and at Attachment One;

CX-576C at Sharp’s Response to Interrogatory Nos. 25 and 150, and at Attachments 1 and

2; CX-335C (Thun Dep.) 41:5-23.

The CSPs and products containing listed above have been imported into the United States

under Tariff Schedule Nos. 8542.13.80.92 and 8525.40.80.20 of the Harmonized Tariff

Schedules of the United States. CX-31C at Sharp’s Response to Interrogatory No. 199;

SX-9C at Sharp’s Response to Interrogatory No. 6(g).

Sharp has inventories in the United States of imported CSPs (and products containing

same). CX-485C at Sharp’s Response to Interrogatory No. 150, and at Attachment 3; CX-

576C at Sharp’s Response to Interrogatory No. 150, and at Attachment 2.

As of March 14, 2001, Sharp’s United States inventories of imported CSPs totaled

1. CX-485C at Sharp’s

132.

133.

134.

3 units, and had a value of approximately [

Response to Interrogatory No. 150, and at Attachment 3.

As of March 14, 2001, Sharp’s United States inventories of imported CSPs consisted of

[ ] units of Sharp CSP models AlLHF80BZE and AlLHF8OBZA, and those units

had a value of approximately [ 1. CX-485C at Sharp’s Response to Interrogatory

No. 150, and at Attachment 3.

135.

141

136. Virtually [ 1, i.e., more than [ 1, of Sharp’s United

States inventories of imported CSPs as of March 14, 2001, consisted of Sharp CSP models

[

150, and at Attachment 3.

As of April 6, 2001, Sharp’s United States inventories of imported camcorders that contain

one or more CSPs consisted of [ 1. CX-576C at

Sharp’s Response to Interrogatory No. 150, and at Attachment 2.

Sharp has sold products containing accused devices. See FF Section 1V F.

1. CX-485C at Sharp’s Response to Interrogatory No.

137.

1, and had a value of [

138.

111. INFRINGEMENT

A. Claim Construction

139. Tessera’s expert, Mr. Engelmaier, interpreted the asserted claims of the ‘977 and ‘326

patents. In so doing, he started with the claim language itself, and tried to understand it as

one of ordinary skill in the art in the 1990 time frame. He then looked at the specifications

of the patents to look for any clarifications or special meanings of the claim language. He

also looked at the specification to understand the context of the invention, and the problem

the inventors were trying to solve. Finally, he reviewed the file history of the ‘977 and

‘326 patents to confirm his understanding of the claim language. He also tried to

determine whether the file history created specific limitations on the meaning of claim

terms in the context of an agreement with the Patent Office during the applicants’ pursuit

of a patent. Tr. 707:ll-708:1, 708:18-709:19 (Engelmaier).

Mr. Engelmaier construed claims 6/1 and 22 of the ‘977 patent. He also construed claims 140.

142

1, 3 and 11 of the ‘326 patent. Tr. 712:25-713:lO (Engelmaier).

In reviewing the intrinsic evidence (the claims, specifications and file history), Mr.

Engelmaier used the perspective of one of ordinary skill in the art in approximately 1990.

Tr. 707:15-708:1, 709:14-19 (Engelmaier).

In his work to construe the asserted claims, Mr. Engelmaier reviewed the file histories for

the specific applications that led to the issuance of the ‘326 and ‘977 patents. Tr. 709:20-

710: 18 (Engelmaier); CX-3, CX-4.

Mr. Engelmaier reviewed the file histories of the ‘266 and ‘265 patents, as well as the ‘266

and ‘265 patents themselves, in his work to construe the asserted claims of the ‘977 and

‘326 patents. Tr. 7 10: 19-7 1 1 : 19 (Engelmaier); CX-5, CX-6, CX-39, CX-40.

In his review of the prosecution history of the ‘977 and ‘326 patents to construe the

asserted claims, Mr. Engelmaier also reviewed the file histories for the ‘ 159 and ‘885

patents. He also reviewed the ‘ 159 patent to a certain extent. Tr. 71 1 :20-7 12:24

(Engelmaier); CX-7, CX- 10, CX-93.

The hypothetical person of ordinary skill in the art in 1990 is someone who has an

engineering degree with four to five years of industry experience in electronic packaging,

with an interest in the reliability of electronic products. Tr. 708:2-17 (Engelmaier).

The basis for Mr. Engelmaier’s opinion about the person of ordinary skill in the art is his

attendance at hundreds of workshops over the years, as well as his teaching of dozens of

classes and workshops on the reliability of electronic packaging. Tr. 653:24-654:21,

707:15-708:17 (Engelmaier); CX-121.

Fatigue is the ultimate failure mode for most soldered interconnections. Tr. 1797:6-18

141.

142.

143.

144.

145.

146.

147.

143

148.

149.

1 50.

151.

152.

153.

154.

(Charles); RX-873 at 3.13 (book chapter written by Dr. Charles entitled “Thermal and

Mechanical Stress Behavior in Electronic Packaging”).

Fatigue models can be used to predict the expected life of a solder joint. Tr. 1797: 19-24

(Charles); RX-873 at 3.13.

Solder fatigue models can be categorized into three basic types: Inelastic strain amplitude

models; Total inelastic strain energy models; and Crack growth models. Tr. 1798:7-13

(Charles); RX-873 at 3.15.

The Coffin-Manson equation is an inelastic strain amplitude model for solder joint fatigue.

Tr. 1 799: 14-23 (Charles); RX-873 at 3.15.

The Coffin-Manson equation is well known in the art, and would be known to one of

ordinary skill in the art. Tr. 1477:lO-12 (Pitarresi).

Coffin-Manson type equations are widely used throughout the scientific and engineering

world. These equations have been used to model many different types of electrical

interconnections, including high-lead content flip chip connections, chip carriers, quad flat

packages, and ball grid arrays such as those used in Sharp CSPs. Tr. 1799:9-19 (Charles);

RX-873 at 3.19.

Among the widely used Coffin-Manson type equations is an equation derived by Werner

Engelmaier (one of the expert witnesses for Tessera) for eutectic-tin lead solder joints. Dr.

Charles explicitly recognized the wide use of Mr. Engelmaier’s model, and readily

admitted that Mr. Engelmaier is well qualified to testie as to the application of the Coffin-

Manson equation. Tr. 1798:24-1799:23 (Charles); RX-873 at 3.19

The Coffin-Manson equation can be used to determine the number of thermal cycles

144

before solder joint failure, by using the change in strain that the solder joint experiences

during the thermal cycle. Tr. 324:24-325:8, 342: 14-348:8 (Qu); CPX-62.

The CoMin-Mason equation allows one of skill in the art to determine levels of solder joint

strain reduction, and thus levels of terminal movement, needed to achieve a desired

improvement in solder joint fatigue life, and thus in reliability. Tr. 346:2-348:8, 349: 12-

155.

35 1 :3 (Qu); CPX-63; CPX-64; CPX 24; CPX-29.

156. As admitted by Sharp expert Dr. Charles, Coffin-Manson type equations are “easy to use

and are compatible with more complex computer numerical techniques such as the finite

element method.” RX-873 at 3.19.

One of ordinary skill in the art who is aware of the teachings of the Tessera patents-in-suit

can determine the desired amounts of terminal movement, and thus strain reduction,

needed to achieve a desired improvement in solder fatigue life and reliability by using the

well known Cofin-Manson equation. Tr. 1477: 10-19 (Pitarresi); Tr. 346:2-348:8; 349: 12-

157.

35 113 (Qu); CPX-63; CPX-64; CPX-24; CPX-29.

158. Dr. Pitarresi admitted that finite element modeling was well known in 1990, and would

have been known by a person of ordinary skill in the art of semiconductor packaging. Tr.

1485: I8-1486:4 (Pitarresi).

Finite element analysis is widely used in the semiconductor packaging industry. Tr.

357: 19-24 (Qu); Tr. 358: 16-359:6 (Qu).

For example, Sharp has used finite element analysis to analyze its CSP designs. Tr.

13 13 : 1-3 (Kada); CX-220C at SHA069344-C.

For example, one of ordinary skill in the art could use FEA modeling to calculate the

159.

160.

16 1.

145

material properties for a die attach layer that would result in a desired amount of reduction

in solder joint strain. Tr. 1486: 12-1488:23 (Pitarresi).

After these die attach properties have been identified by the FEA model, one of ordinary

skill in the art could look up the material properties of existing die attach materials to

determine which materials had properties similar to those identified by the finite element

model. Tr. 1487:25-1488:23 (Pitarresi).

Thus, using finite element modeling, one of ordinary skill in the art could determine the

desired material properties of a die attach or insulating layer. Tr. 1486:5-I I (Pitarresi).

Die attach layers can be selected to reduce solder joint strain by choosing die attach

materials that allow movement of the terminals (at the top of the solder joints) relative to

the die. Tr. 349:12-351:3 (Qu); CPX-24, CPX-29; Tr. 351:24-353:18 (Qu); CPX-63.

The term “movable” appears in all of the asserted claims, including claims 6/1 and 22 of

the ‘977 patent, and claims 1, 3 and 11 of the ‘326 patent. CX-1, CX-2.

In the asserted claims, the term “movable” refers to the ability of the terminals to provide

sufficient movement with respect to the chip and/or the contacts on the chip to provide

compensation for differential thermal expansion, and thus significantly improve solder

joint reliability. One of ordinary skill in the art would understand that the movability of

the terminals in the patented invention is for the purpose of significantly improving solder

joint reliability. Tr. 715: 15-716:4 (Engelmaier); CPX-83.

One of ordinary skill in the art would understand that movement of the terminals is

internal to the package; that is, the package terminals are movable relative to the chip

and/or the chip contacts within the package. The fact that thg: movability of the terminals

162.

163.

164.

165.

166.

167.

146

is internal to the package is clear from the language of claim 1 of the ‘977 patent and

claim 1 of the ‘326 patent. Tr. 717: 14-718:2 (Engelmaier); CX-1, CX-2; CX-87.

One of ordinary skill in the art would understand that the movement of the terminals must

provide compensation for differential thermal expansion between the chip and the printed

circuit board. In other words the design of the package facilitates movement of the

terminals; it does not occur by accident. The fact that the movability of the terminals must

provide substantial compensation for differential thermal expansion is also clear from the

specification of the ‘977 patent, which states: “the ability of the terminals to move . . .

provides compensation for differential thermal expansion.” Tr. 7 1 8: 3 -25 (Engelmaier);

CX-2 (‘977 patent) at 3:62-65; CPX-88.

One of ordinary skill in the art would not understand that the term “movable” requires that

the movement relieve all or substantially all stress. As an initial matter, such a limitation

is not required by the claim language. Rather, the specification of the ‘977 patent indicates

that the patented package is “substantially resistant to thermal cycling” because “the

central terminals will tend to move with the contact pads” on the printed circuit board

substrate. Tr. 719: 1-720: 11 (Engelmaier); CX-2 (‘977 patent (emphasis added)) at 20:26-

168.

169.

27, 45-46; CPX-89.

170. To one of ordinary skill in the art, the prosecution history of the ‘977 patent confirms that

the movement of the terminals need not relieve all or substantially all stress. Rather, the

file history indicates that movement of the terminals provides substantial compensation for

differential thermal expansion. For example, in the applicants’ April 18, 1996 response in

the file history of the ‘977 patent, the applicant stated that the ability of the terminals to

147

171.

172.

173.

174.

175.

176.

move with respect to the chip “provides compensation for differential thermal expansion

of the chip and the substrate.” One or ordinary skill in the art would not understand this

statement to mean that the movement of the terminals must provide complete

compensation for differential thermal expansion: Rather, one of skill in the art would

understand that the movement of the terminals provides some compensation. Tr. 722: 16-

723:6 (Engelmaier); CX-4 at TESS002332; CPX-68.

Mr. Engelmaier testified that in the structure described by the Saito patent “there will be

some movement in a total absolute sense, but there’s certainly no movement that would be

sufficient to increase any solder joint reliability, you know, in the context of what we’ve

been talking about of the patents-in-suit.” Tr. 906: 12-21 (Engelmaier).

Dr. Pitarresi agreed that the prosecution history of the ‘977 patent does not contain any

statement indicating that Tessera ever conceded that the Saito reference contained

structures providing significant compensation for differential thermal expansion. Tr.

1517:3-12 (Pitarresi).

To a person of ordinary skill at the time the of the invention, a “significant” improvement

in reliability would be about 20 to 25%. Tr. 973:15-974:lO (Engelmaier).

Dr. Qu did not testi6 on claim construction. Tr. 3 15: 10 - Tr. 446:23 (Qu) (no testimony

on claim construction).

Dr. Qu did not review the prosecution history of the patents in suit. Tr. 616: 19-617:9

(QUI.

Mr. Engelmaier specifically observed that Dr. Qu is an academic and an expert, aware of

the state of the art in the year 200 1. Mr. Engelmaier testified that this was the reason for

148

the apparent disagreement between his interpretation of "significant," in the context of the

claims, and Dr. Qu's opinion of significant improvement. Dr. Qu, who did not interpret

the claims, expressed the opinion that a 10% improvement is significant from the point of

view of an academic and an expert in the year 200 1, not a person of ordinary skill in the

1990 time frame. Tr. 973:15-975:15 (Engelmaier), 509:6-16 (Qu).

Dr. DiStefano is a person of extraordinary skill, Sharp CSP manager, Mr. Kada, testified

that Dr. DiStefano is famous and influential in the packaging industry. Tr. 11 76:3-6

(Kada).

Mr. Engelmaier testified on claim construction. Tr. 701:8 - 766:4.

An expert, such as Dr. Qu, working in an academic environment in the year 200 1, will

have different analysis capabilities and a different view of what is significant improvement

in solder joint reliability from a person of ordinary skill in the art in 1990. Tr. 973: 15-

974: 10.

A person of ordinary skill in the art would determine improvement in reliability of a given

package by using whatever testing or modeling is typical for such products. The person of

ordinary skill could thereby determine if reliability is improved significantly. Tr. 1025 : 1 I -

2 1 (Engelmaier).

Mr. Engelmaier stated that a person of ordinary skill in the art in 1990 would understand a

significant improvement in solder joint fatigue life to be on the order of 20 to 25%. Tr.

967: 18-968: 13 (Engelmaier).

Board level reliability testing, a longstanding industry practice, would have been well-

known to persons of ordinary skill in the art in 1990. Tr. 804:18-807:21 (Engelmaier).

177.

178.

179.

180.

181.

182.

149

183. The specification as a whole supports the movability of terminals in all directions to

compensate for differential thermal expansion. For example: “The ability to

accommodate relative movement between the chip and the terminals on the backing

element allows the assembly to accommodate differential thermal expansion between the

chip and [PCB] substrate. Desirably, the terminals on the backing elements are also

moveable relative to the chip in directions towards the bottom surface of the chip , , , .I1

CX-2 (‘977 patent) at 7:5 1-57.

184. One of ordinary skill in the art would also understand that a package that is mounted to a

PCB that experiences differential thermal expansion may experience some out-of-plane

warpage that is similar to the bimetallic strip expansion of a thermostat. This warpage

causes movement out of the horizontal plane that puts stress and strain in the solder joints.

Tr. 724:25-725: 19 (Engelmaier).

The application that gave rise to the ‘977 patent was a continuation in part of the 185.

application resulting in the ‘266 patent, and a continuation in part of that which resulted in

the ‘265 patent. CX-2 (Related U.S. Application Data).

186. Dr. Pitarresi did not know or appreciate, and hence did not consider, the implications of

the fact that the ‘977 patent issued from an application that was a continuation in part,

rather than a continuation, of the application that issued as the ‘266 patent. Tr. 1509:7-

15 10:6 (Pitarresi); CX-2 (Related U.S. Application Data).

As admitted in his testimony, Dr. Pitarresi did not know or appreciate the difference 187.

between a continuation in part and a continuation of a patent application. Tr. 1509:7-

15 10:6 (Pitarresi).

150

188. As admitted in his testimony, Dr. Pitarresi was unaware of or unable to recall any

differences between the specifications of the ‘977 and ‘266 patents. Tr. 15 10:8-15

(Pitarresi).

Dr. Pitarresi could recall no consideration given to any difference between the ‘977 and

the ‘266 patent specifications in his interpretation of the claims of the ‘977 patent. Tr.

15 10:8-15, 15 10: 16-25 (Pitarresi).

Dr. Pitarresi did not consider the differences between the specifications of the ‘977 and

‘266 patents in his analysis of the impact of the prosecution history of the ‘266 patent on

the scope ofthe claims ofthe ‘977 patent. Tr. 1510:8-25 (Pitarresi).

As admitted by Dr. Pitarresi in his testimony, the claim coverage of the ‘977 and ‘266

patents differs significantly, including the fact that the ‘977 patent language describes both

face up and face down embodiments, while the claim language of the ‘266 patent

describes only face down embodiments. Tr. 15 1 1 :2-6 (Pitarresi).

The January 8, 1992 Amendment to the ‘266 Patent prosecution history was limited to

face-down semiconductor chip assemblies. CX-5 (January 8, 1992 Amendment) at 2-4.

One of ordinary skill in the art would not understand isolated statements in the ‘266 patent

prosecution history to require the movement of the terminals to relieve all or substantially

all stress. Specifically, the statement “allow the terminal to remain in fixed positions

when bonded to a [PCB] substrate” does not require that the inventions of the ‘977 Patent

and ‘326 Patent to completely compensate for differential thermal expansion. The very

next sentence in the ‘266 Patent prosecution history declares that the movement of

terminals provides “substantial,” not complete, compensation for differential thermal

151

189.

190.

191,

192.

193.

expansion. See Tr. 720: 12-722: 15 (Engelmaier); CX-5 (January 8, 1992 Amendment) at

9; CPX-67; CPX-68.

194. In the January 1992 amendment, the applicants were merely trying to illustrate the

difference between Saito and their own invention. The Saito patent reveals to one of skill

in the art a construction in which there would be essentially no movability of the

terminals. Tr. 720: 12-722: 15 (Engelmaier); CX-5 (January 8, 1992 Amendment) at 9;

CPX-67; CPX-68.

195. Dr. Pitarresi agreed that the prosecution history of '266 patent does not contain any

statement indicating that Tessera ever conceded that the Saito reference contained

structures providing significant compensation for differential thermal expansion. Tr.

15 17:3-12 (Pitarresi).

Dr. Pitarresi agreed that Tessera never conceded anywhere in the prosecution history that

the Saito reference contained structures providing significant compensation for differential

thermal expansion. Tr. 15 17: 13- 16 (Pitarresi).

The claims in the January 8, 1992 Amendment to the '266 Patent prosecution history did

not contain the language "flexible leads and said flexible sheetlike element being adapted

to deform to accommodate movement of said terminals with respect to said contacts,"

which is recited in claims 6/1 and 22/1 of the '977 Patent. CX-5 (January 8, 1992

Amendment) at 2-4.

One of ordinary skill in the art would understand that it is not possible to remove all stress

from the solder joints. Any material that is attached to the solder joint will have some

rigidity, which will exert some force to the top of the solder joint. This will result in at

196.

197.

198.

152

least some stress and strain in the solder joint during thermal cycling. Tr. 353:2-16 (Qu).

One of ordinary skill in the art would also understand that it is not desirable to make the

solder joints last as long as possible, by removing all or substantially all strain. Pitarresi

testified that "the object typically isn't to make the package with the longest fatigue life .

. . [Tlhe driver is for a given number of cycles, how can we build that package as cheaply

as possible." Tr. 1389: 14-24 (Pitarresi).

Dr. Pitarresi did not refer to any of the prosecution history of the '265 patent in his

testimony, despite the fact that the '977 patent resulted from an application which was a

continuation in part of that leading to the '265 patent. Tr. 1349:21-1449:12, 15 1 1 : 16-20

(Pitarresi); CX-2 (Related U. S. Application Data).

In considering the possible implications of the statement in the prosecution history of the

'266 patent that refers to terminals remaining "fixed" relative to the PCB, Dr. Pitarresi did

not consider that this statement does not occur anywhere in the prosecution history of the

'265 patent. Tr. 1511:21-1512:3 (Pitarresi); CX-6 (January 8, 1992 Amendment at 8) .

As stated in his testimony, Dr. Pitarresi could not recall giving any consideration

whatsoever to the differences between the '266 and '265 patents and their respective

prosecution histories when he construed the claims of the '977 and '326 patents. Tr.

15 12:4-14 (Pitarresi).

As admitted in his testimony, Dr. Pitarresi did not rely on any of the prosecution history of

the '326 patent to support his construction of the term "movable" in patent claims. Tr.

15 12: 19-22 (Pitarresi).

199.

200.

20 1.

202.

203.

204. One of ordinary skill in the art would understand that the terminals can move in any

153

205

206

direction. The plain language of the claims, both asserted and unasserted, demonstrates

that the terminals may move in any direction. For example, dependent claim 24 of the

'326 patent indicates that the terminals may move in directions parallel to the chip,

whereas claim 25 of the '326 patent indicates that the terminals may move in directions

perpendicular to the chip. One of ordinary skill in the art would also understand the

specification to indicate that movement of the terminals may occur in any direction. For

ex ample, the '977 patent specification indicates that terminals are "movable relative to the

chip in directions toward the bottom surface of the chip," and "in directions parallel to the

chip surface." Thus, one of ordinary skill in the art would understand that the '977 patent

specification indicates that movement may occur in all directions along the x, y and z axes.

Tr. 724:5-24 (Engelmaier); CX-2 ('977 patent) at 7:54-56, 3 :62-65; CPX-90.

The understanding of one of ordinary skill in the art that movement of the terminals may

occur in any direction is confirmed by a basic understanding that movement caused by

thermal expansion may occur in both the horizontal and vertical directions. For example,

a package that is mounted to a printed circuit board that experiences differential thermal

expansion may experience some out-of-plane warpage that is similar to the bimetallic strip

expansion in a thermostat. This warpage causes movement out of the horizontal plane that

puts stress and strain on the solder joints between the package and the printed circuit

board. Tr. 724:25-725: 19 (Engelmaier); CPX-23,

One of ordinary skill in the art would not understand that the movement of the terminals

requires the use of a compliant layer. For example, claim 17 of the '326 patent and

claim 2 of the '977 patent specifically add a compliant layer to the more general structures

154

disclosed in the independent claims of those patents. In addition, the specification

repeatedly confirms that the use of a compliant layer is optional. For example, the

'977 patent states that "assembly may optionally include a compliant layer." In addition,

the use of a compliant layer that is "optional," "preferable," or "desirable" is described in

the '977 patent at various locations. Tr. 725:20-727:8 (Engelmaier); CX-2 ('977 patent) at

3148-50, 4 : l l -16 , 5:1-3, 5:64-65, 7159-61, 10143-44, 14165, 21 :63-64.

207. One of ordinary skill in the art would also understand that dependent claims 3 and 4 of the

'977 patent include a more specific recitation of materials for a possible compliant layer.

Thus, it is clear that claim 1 of the '977 patent does not require those specific materials for

a compliant layer. Tr. 725:20-727: 8 (Engelmaier); CX-2 ('977 patent).

Dr. DiStefano did not testify that without a compliant layer, an adhesive cannot be used,

so that the chip is unattached. CX-329C (DiStefano Dep.) Tr. 127:lO-128:2, 188:4-18,

208.

2 12:20-2 15: 1 1 , 3 13 12-3 14123.

209. Dr. DiStefano testified that the list of options capable of effectively decoupling the device

includes "all sorts of structures," including but not limited to a compliant layer, a foam

layer, a liquid, a gel, a complete disconnect between the die and its substrate, sliding

contacts, and numerous combinations of these and other structures. CX-329C (DiStefano

Dep.) Tr. 213:16-215:6.

Dr. DiStefano testified that a "compliant layer is not required . . . a compliant layer is not

essential to have it be movable . . . . I t CX-329C (DiStefano Dep.) Tr. 125:3-11.

The term "flexible" applies to the sheetlike element and the leads in claims 6/1 and 22 of

the '977 patent. In addition, the term "flexible" applies to the backing element of claim 3

210.

21 1.

155

of the '326 patent. CX-1, CX-2.

One of ordinary skill in the art would understand that the term "flexible" means that the

element to which it applies is bendable or pliable when a load is applied to it. In addition,

one of ordinary skill in the art would understand that the term "flexible" applies to

elements that are flexible prior to assembly. For example, the industry often uses the term

"flex circuit" as a general characteristic of a component that is later incorporated into an

electronic assembly Tr. 727:9-728:5 (Engelmaier), CX-2 ('977 patent) at claim 1 , CX-1

('326 patent) at claim 1; CPX-83.

With respect to claim 6/1 of the '977 patent, one of ordinary skill in the art would

understand that the flexible sheetlike element and flexible leads which are flexible prior to

assembly must retain sufficient flexibility to be "adapted to deform to accommodate

movement of said terminals" after assembly. This means that the construction of the

package must be adapted to preserve enough flexibility of the flexible elements to

accommodate movement of the terminals due to differential thermal expansion. Tr. 728:6-

729: 10 (Engelmaier); CX-2 ('977 patent) at claim 1 ; CPX-83.

One of ordinary skill in the art would understand that the flexible leads, flexible sheetlike

element ('977 patent, claim 1) and flexible backing element ('326 patent, claim 3) are

flexible prior to assembly. That means that these elements are bendable or pliable before

they are assembled into a completed package That is the plain meaning of the claim

language. This is confirmed by other language in claim 1 of the '977 patent which states

that these flexible elements must be adapted to deform to accommodate movement in the

completed assembly. Thus, the "adapted to deform" language clearly specifies the extent

212.

213.

214.

156

215.

216.

217.

to which the flexible elements must remain flexible in the completed assembly. In

addition, specification of the '977 patent refers to elements that are "flexible" prior to

assembly; for example: "assembling a flexible sheetlike element having terminals thereon

to a semiconductor chip." Tr. 729:15-73 1:2 (Engelmaier); CX-1 ('326 patent); CX-2

('977 patent) at 4:9-10; CPX-93.

One of ordinary skill in the art would understand from the plain language of claim 1 of the

'977 patent and claim 3 of the '326 patent that the recited flexible elements must retain

sufficient flexibility to be "adapted to deform to accommodate movement" or to "facilitate

movement" in the completed assembly. Tr. 73 1 :9-21 (Engelmaier); CX-I ('326 patent) at

claim 3; CX-2 ('977 patent) at claim 1; CPX 94.

One of ordinary skill in the art would understand that the prosecution history of the

'977 patent clearly distinguishes between the flexible sheetlike element of claim 1 of the

'977 patent and the sheetlike element in Saito which is obviously not free to deform in the

completed assembly. This confirms the understanding of one of ordinary skill in the art

that a flexible sheetlike element must retain sufficient flexibility in the completed

assembly to be adapted to deform to accommodate movement of the terminals.

Tr. 73 1 :22-732: 14 (Engelmaier); CX-4 (June 26, 1995 Amendment) at TESS0023 14;

CPX- 82.

Similarly, one of ordinary skill in the art would understand that the '266 patent

prosecution history distinguishes Saito on the basis that it does not disclose a structure in

which the leads would be flexible in any way in the completed assembly. This is clearly

different from the teaching of claim 1 of the '977 patent, which indicates that the leads

157

must be adapted to deform to accommodate movement in the completed assembly.

Tr. 732:15-733:9 (Engelmaier); CX-5 (January 8, 1992 Amendment) at 8; CPX-78.

One of ordinary skill in the art would understand that flexible elements must retain

sufficient flexibility to be "adapted to deform to accommodate movement" or to "facilitate

movement" in the completed assembly. As an initial matter, this is the plain meaning of

the words of claim 1 of the '977 patent and claim 3 of the '326 patent. In addition,

nothing about the language of these claims indicates that "adapted to deform to

accommodate" or "facilitate" movement requires that the flexible elements be completely

unrestrained in the completed assembly. Tr. 733: 10-734:3 (Engelmaier); CX-1

('326 patent) at claim 3; CX-2 ('977 patent) at claim 1; CPX-95.

One of ordinary skill in the art would understand that flexible elements need not be

flexible in their entirety in order to be "adapted to deform to accommodate movement

First, the plain meaning of "adapted to deform" does not require the flexible elements to

retain complete flexibility in the completed assembly. Rather, an engineer of ordinary

skill in the art would understand that flexibility refers to a flexible linkage. For example,

an arm is not flexible between the elbow and the wrist, but it is flexible between the wrist

and the shoulder because it bends at the elbow. Thus, one of ordinary skill in the art

would understand that a lead, for example, could be flexible if it flexes at one or more

points. It does not need to be flexible along its entire length. This is also confirmed by

the specification of the '977 patent which states that "each of the composite leads . , is

flexible. Thus, the partial leads on the interposer surface itself preferably are flexible, and

the fine bonding wires are also flexible." Thus, one of ordinary skill in the art would

158

2 18.

219.

understand that a lead could be flexible if part of it is flexible and part of it is not.

Tr. 734:4-735:5 (Engelmaier); CX-2 (‘977 patent) at 20:27-32; CPX-96.

In the context of the ‘977 and ‘326 patents, one of ordinary skill in the art would

understand that a lead is an electrically conductive piece of metal, typically thin and

elongated, that electrically connects two or more discrete points. Moreover, the asserted

claims specifically state that a lead connects a contact on a semiconductor chip to a

terminal underneath the chip. The ‘977 and ‘326 patents specify that leads may be

composite in nature. That is, a composite lead may consist of both a bonding wire and a

trace portion on the sheetlike or backing element, Tr. 735:6-16, 756:9-757:12

(Engelmaier); CX-1 (‘326 patent) at claim 1; CX-2 (‘977 patent) at claim 1; CPX-83.

One of ordinary skill in the art would also understand that the asserted patents specifically

distinguish leads from conductive masses such as solder or conductive polymers. Figure 2

of the ‘977 patent and its explanatory text in column 10 clearly describe a lead (50) as a

thin and elongated piece of metal that connects a contact to a terminal. This same passage

also identifies a mass 52, which would be understood to be a solder joint, as something

that is different from a lead. Tr. 735:20-737: 13 (Engelmaier); CX-2 (‘977 patent) at

Fig. 2, 10:44-54; CPX-83.

One of ordinary skill in the art would understand a bonding wire, as described in claim I

of the ‘326 patent, to be a wire that forms a connection with a contact on the top of a

semiconductor chip which then extends over and down to the level of the package

substrate to form a bond on a contact finger on the package substrate. At the contact

finger on the package substrate, the bonding wire would make contact with a metallic trace

220.

221.

222.

159

or "lead portion" which would run underneath the chip to a terminal, Tr. 737: 14-738:24

(Engelmaier); CX-1 ('326 patent) at claim 1; CPX-83.

One of ordinary skill in the art would definitely understand that the '326 patent discloses a

face-up, wire-bonded embodiment. As an initial matter, Figure 26 of the '326 patent

shows a face-up embodiment with a wraparound package substrate, in which flaps of the

substrate extend up along the edges of the semiconductor chip. However, in column 34 of

the '326 patent, the specification states that the flaps and the lead portions along the edges

of the chip may be omitted and replaced with bonding wires that extend downwardly

alongside the edges of the chip down to a backing element or package substrate under the

chip. Tr. 739:5-742:8 (Engelmaier); CX-1 ('326 patent) at Fig. 26, 34:2-11; CPX-83,

CPX- 143.

From the plain language of claim 1 of the '326 patent, one of ordinary skill in the art

would understand that the bonding wires in claim 1 need not be flexible. Clearly, claim 1

says nothing about the flexibility of the bonding wires. Rather, claim 1 discusses the

construction of a package in which the terminals are movable with respect to the chip.

Tr. 742:9-743:25 (Engelmaier); CX-I ('326 patent) at claim 1; CPX-83, CPX-147.

The Hawkins patent teaches rigidity; the whole structure is totally encapsulated. Tr.

1046:7-14, 1047:8-I 9 (Engelmaier)

Mr. Engelmaier testified that a specific passage in the patent specification "doesn't say

anything as to how things are put together at all." Tr. 889: 14-24 (Engelmaier).

Various encapsulants - including ceramic - would be well-known to one of skill in the art

who reads the patents. Tr. 1048:22-25 (Engelmaier).

223.

224.

225.

226.

227.

160

228. It is possible to build a package with movable terminals and inflexible bonding wires, for

example using a very rigid encapsulant. Such a package is illustrated in the animation

CPX-147. Tr. 742: 18-743:25 (Engelmaier); CPX-147.

The Saito reference does not disclose any particular material that it characterizes as

"rigid," but merely discusses synthetic resins such as polyimide for use as a coating. RX-4

at 3 : 14-17.

In Saito, the leads were restrained from flexing by a thin coating. Tr. 1037:3-17

(Engelmaier).

The Hawkins reference does not disclose any particular encapsulant, but refers generally to

epoxies and ceramics. CX-45 1; Tr. 1050: 18-25 (Engelmaier).

The Saito reference discloses a structure in which a chip has trace leads adhered to it by a

thin coating of a synthetic resin such as polyimide, and then coated with another coating of

a similar resin. CX-457, Figure 2, col. 2: 1-22; Tr. 1037: 10-1 7 (Engelmaier). Such a

structure is essentially a "flip-chip," in which a bare chip is attached to a PCB through

solder bumps. Tr. 1888:17-1889:8 (Qu) (describing a flip-chip structure).

The Hawkins reference discloses a package with break-away leads. The package is

completely surrounded by epoxy or ceramic encapsulant, except for the break-away leads

external to the package. Tr. 1046: 10-1 047: 19 (Engelmaier), CX-45 1, Figures 2-4

(showing external break-away leads).

Tessera successhlly argued that the leads in Saito were bound by a microscopic layer of

polyimide, and therefore did not flex. CX-5, January 8, 1992 Amendment, at 8.

The Saito reference does not disclose the modulus of elasticity for the polyimide coating.

229.

230

23 1.

232.

233.

234.

235.

161

Thus, Dr. Pitarresi has no foundation for asserting that the modulus of elasticity for

Sharp's die attach and insulating layers are similar to that of the polyimide coating of

Saito See RX-4; Tr. 1445:21-1446: 10 (Pitarresi).

One of ordinary skill in the art would understand that the backing element of claim 1 of

the '326 patent is merely an element that is generally sheetlike that underlies the rear

surface of the chip. There is nothing in the language of claim 1 which would indicate that

the backing element must be flexible. Thus, one of ordinary skill in the art would not

understand that the backing element must be flexible. Tr. 744: 1 - 12 (Engelmaier); CX- 1

('326 patent) at claim 1; CPX-83.

One of ordinary skill in the art would understand the preamble term "semiconductor

assembly" in claim 1 of the '977 patent to be a package with all of the claim elements

recited in claim 1 . Tr. 744: 13-22 (Engelmaier); CX-2 ('977 patent) at claim 1; CPX-27.

One of ordinary skill in the art would understand the preamble term "semiconductor

assembly" in claim 1 of the '326 patent to be a package with all of the claimed elements.

Tr. 744:23-745:3 (Engelmaier); CX-1 ('326 patent) at claim 1; CPX-20.

One of ordinary skill in the art would understand the word "terminal" to be an end point

for connection of the package to the outside world. In the context of the asserted claims of

the '977 and '326 patents, a terminal is essentially a land to which solder balls would be

attached to the package. One of ordinary skill in the art would understand that a terminal

cannot be made of solder because it would be capable of melting during solder reflow and

lose its shape. This could lead to the loss of an electrical connection between the terminal

and the contact via a lead. Tr. 745:4-746:4, 754: 19-755:24 (Engelmaier).

236.

237.

238.

239.

162

240. One of ordinary skill in the art would know that the term "semiconductor chip having a

plurality of surfaces" in claim I of the '977 patent is an ordinary integrated circuit (IC)

chip. Tr. 753:25-754:7 (Engelmaier); CX-2 ('977 patent) at claim 1; CPX-27.

With respect to claim 1 of the '326 patent, one of ordinary skill in the art would

understand the term "a semiconductor chip having oppositely facing front and rear

surfaces" to be an ordinary integrated circuit (IC) chip. Tr. 762:2-17 (Engelmaier); CX-1

('326 patent) at claim I ; CPX-85.

One of ordinary skill in the art would understand the term "sheetlike element'' to be thin

relative to its length and width. Tr. 754:8-13 (Engelmaier); CX-2 ('977 patent) at claim 1 .

One of ordinary skill in the art would understand the phrase "having terminals thereon" to

mean that the sheetlike or backing element has terminals on it. Typically, the terminals

would be glued or laminated to the sheetlike or backing element with some kind of

adhesive construction. Tr. 754: 14-1 8, 756:3-8 (Engelmaier); CX-2 ('977 patent) at

claim 1 ; CX-I ('326 patent) at claim I .

In reading claim 1 of the '977 patent, one of ordinary skill in the art would understand that

some of the terminals must be underneath the chip. Tr. 760:6-23 (Engelmaier); CX-2

('977 patent) at claim 1.

One of ordinary skill in the art would understand that at least some of the terminals of

claim 1 of the '326 patent must be underneath the chip itself. Tr. 763:2-9 (Engelmaier);

CX-1 ('326 patent) at claim 1 .

The additional language of claim 6 of the '977 patent merely orients the package as one in

which the contacts on the semiconductor chip face up and away from the flexible sheetlike

241.

242.

243.

244.

245.

246.

163

element. Thus, one of ordinary skill in the art would understand that claim 6 orients the

package as a face-up package. Tr. 760:24-761: 10 (Engelmaier); CX-2 (‘977 patent) at

claim 6.

247. One of ordinary skill in the art would understand that claim 22 of the ‘977 patent requires

that the semiconductor assembly of claim 1 be attached to a printed circuit board substrate.

Moreover, one of ordinary skill in the art would understand that a chip package such as the

one described in claim 1 cannot fhnction unless it is attached to a printed circuit board

Tr. 761 : 1 1-762: 1 (Engelmaier); CX-2 (‘977 patent) at claim 22.

248. One of ordinary skill in the art would understand that claim 9 of the ‘326 patent requires

that the backing element include lead portions and terminals on the top side of the backing

element closest to the chip. Tr. 765:l-10 (Engelmaier); CX-1 (‘326 patent) at claim 9. Y

249. One of ordinary skill in the art would understand, with respect to claim 10 of the

‘326 patent, that in order to be fhnctional, the terminals on the top surface of the backing

element must be exposed through holes in the backing element. Tr. 765: 1-1 5

(Engelmaier); CX-1 (‘326 patent) at claim 10.

250. One of ordinary skill in the art would understand that claim 11 simply adds the existence

of solder which contacts the terminals through the holes in the backing element for

connection of the package to a printed circuit board in a larger electrical system. Thus, the

term “bonding material” in claim 1 1 refers to solder. Tr. 765:20-766:4 (Engelmaier); CX-

1 (‘326 patent) at claim 11

164

B. Infringement Determination

1. The Structure and Pertinent Characteristics of Sharp CSPs

25 1 . As a general matter, die attach materials like die bond paste and die bond film have a glass

transition temperature. The modulus of elasticity of a die bond material is typically lower

above the glass transition temperature than it is below the glass transition temperature. In

addition, the coefficient of thermal expansion (CTE) of a die bond material is generally

higher above the glass transition temperature than it is below the glass transition

temperature. Tr. 1297:2-11 (Kada).

A lower modulus material is softer than a higher modulus material. Tr. 637: 18-22 (Qu);

Tr. 830: 10-83 1:2 (Engelmaier); CX-387C.

252.

253, Sharp's counsel provided Tessera with a letter that included information about the

modulus of [

that he had no reason to think that the information provided by Sharp's counsel is

inaccurate. The information provided by Sharp's counsel shows that the die attach

materials in Sharp's CSPs soften significantly (i.e., modulus decreases) as the temperature

increases from room temperature to 75", 1 00"' and 125°C. Tr. 1297:24- 1298: 1 I , 1299: 1-8

(Kada); CX-129C.

The upper operating temperature for some consumer electronics products is 80°C.

Tr. 1299:9-1300:9, 1301:20-1302:lS (Kada).

Sharp represents to its customers in product specifications that the following Sharp CSPs

have an operating temperature range from at least -10°C to at least 85°C' and a storage

temperature up to at least 125°C: LH5 1 BOJ 1, LHF04C 1 1, LHFO8CC8, LHF08CZ7,

165

] at various temperatures. Mr. Kada testified

254.

255.

256.

257.

258.

259.

260.

LHF16BZ0, LHF16C13, LHF16K29, LHF32K16, LHF80B11, LHF80BZ2, LHF80BZ4,

LHF80BZA, LHF80BZE, LHF80G14, LRS1327, LRS1329, LRS1331, LRS1342,

LRSl344, and LRS1348. Tr. 1463: 16-1465:2 (Pitarresi); CX-399-CX-403, CX-405, CX-

407, CX-4 1 1, CX-4 1 5 , CX-4 17, CX-4 19-CX-422, CX-424-CX-425, CX-427-CX-43 1 ,

Sharp represents to its customers in product specifications that the following Sharp CSPs

have an operating temperature range from at least -10°C to at least 85"C, and a storage

temperature up to at least 150°C: LHSIBOJ, LR38532A, LR38554, LR38708. Tr.

1463: 16-1465:2 (Pitarresi); CX-399, CX-433.

Sharp represents to its customers in product specifications that the following Sharp CSPs

have an operating temperature range from at least 0°C to at least 7OoC, and a storage

temperature up to at least 125°C: LHF I 6C 1 1, LHF 16CZ3, LHF 16K 1 1, LHF I 6K27,

LHF16K52, LHF3K05, LHF32K14, LHF40B17, LHF80B21, LHF80G11, LZ9HT18Y,

LHDV5001, Tr. 1463: 16-1 465:2 (Pitarresi); CX-406, CX-408-CX-410, CX-412-414,

CX-416, CX-418, CX-423, CX-432, CX-436.

The operating temperatures in Sharp CSP product specifications refer to ambient

temperatures, or temperatures of the environment, and that the actual temperature of the

chip package during operation may be up to 10°C higher due to the heat caused by

electrical operation. Tr. 1338:20-1339:24 (Kada).

The glass transition temperature of [

below the temperature a CSP package may experience in the operation of a consumer

electronics package. Tr. 1299:9-1300:9, 1301:20-1302: 15 (Kada).

The glass transition temperature for [

3. This temperature is significantly

1. Tr. 1302:16-18 (Kada).

166

261. The glass transition temperature of [ 1 is [ 1. Tr. 1302:19-21 (Kada).

262. Mr. Kada agreed with the following statement in his article, published in May 2000 in the

IEEE (May 2000 IEEE article): "[Iln CSP devices in which the external terminals are

arranged in a ball-grid array, the function of the stress-relieving structure is limited

compared to the QFP/TSOP, which features gull-wing type external terminals." Tr.

1246: 17-1247:s (Kada); CX-87 at 3.

Mr. Kada's May 2000 IEEE article states: "Consequently, considerable stress is generated

in solder balls sandwiched between the mounting board and the chip." Tr 1247:9-17

(Kada); CX-87 at 3.

Mr. Kada's May 2000 IEEE article states: "Since in CSP devices the die-bonding material

is located directly above the balls, a material is required that will further alleviate the

stress on the solder balls." The material to which he was referring that "will hrther

alleviate stress on the solder balls" in a CSP is die bond material. Tr. 1247: 18-1 248.2

(Kada); CX-87.

The "die bond material" in Sharp's two-layer CSP structure consisted of [

263.

264.

265.

1. Tr. 1248:3-16 (Kada); CX-87.

266. The "die bond material" in Sharp's single-layer CSP structure is [

(Kada); CX-87.

Although Mr. Kada's May 2000 IEEE article stated that a die bond material is required in

CSPs to "hrther alleviate the stress on the solder balls," Mr. Kada refused to admit that

DF-400 relieves stress on the solder balls in Sharp's CSPs, even though Mr. Kada was

asked this question five times. Finally, Mr. Kada admitted that Sharp had performed no

1. Tr. 1248: 17-20

267.

167

tests to determine whether DF-400 alleviated stress on the solder balls in Sharp's CSPs.

Tr. 1248:21-1253:2 (Kada); CX-87.

Sharp did no tests to determine whether DF-400 alleviates considerable stress on the

solder balls in Sharp's CSPs. Tr. 1256:8-11 (Kada); CX-87

Mr. Kada could provide no evidence that DF-400 does not alleviate stress on the solder

balls in Sharp's CSPs. Tr. 1248:21-1253:2 (Kada); CX-87.

The deadline for completing the text of his May 2000 IEEE article was relatively early; for

example, February or March 2000. Thus, Sharp likely submitted the May 2000 TEEE

article before March 28, 2000, the date on which Tessera filed the complaint which led to

the institution of this Investigation. Tr. 1253:3-11 (Kada).

Sharp did no tests to determine whether SD-500 alleviates considerable stress on the

solder balls in Sharp's CSPs. Tr. 1256:8-I 1 (Kada); CX-87.

Mr. Kada could provide no evidence that SD-500 does not alleviate stress on the solder

balls in Sharp's CSPs. Tr. 1248:21-1253:2 (Kada); CX-87.

Mr. Kada agreed with the following statement on page 3 of his May 2000 IEEE article:

"The test results [in Figure 71 showed that the average life varied depending on the type of

insulator, and that thicker insulators alleviated stress on the solder balls to a greater

extent." Tr. 1256: 12-21 (Kada); CX-87.

As shown in Figure 7 of the May 2000 IEEE article, Sharp performed thermal cycling

board level reliability tests (from -40°C to 125°C) for CSPs with two types of die bonding

materials in connection with the data reported in Figure 7. One of the die bonding

materials was designated Insulator A, and the other die bonding material was designated

268.

269.

270.

271,

272.

273.

274.

168

Insulator B. Tr. 1256:22-1257:8 (Kada); CX-87.

Mr. Kada admitted that Insulator B in Figure 7 of the May 2000 IEEE article was DF-400,

the same insulator that is currently used in Sharp's single-layer products. Mr. Kada also

admitted that Insulator A is a die bond film that Sharp obtained from Sumitomo Bakelite.

Tr. 1248: 17-20, 1261 : 19-1262:5 (Kada); CX-87, CX-378C.

When compared with packages with Insulator B at a thickness of 25 microns, the testing

reported in Figure 7 of the May 2000 IEEE article showed that packages with a 25 micron

layer of Insulator A had better board-level reliability. However, on cross examination,

Mr. Kada stated that it might not be "statistically meaningful." Figure 7 also showed that

Sharp obtained better board-level reliability with packages that included Insulator A at a

thickness of 35 microns than packages with Insulator A at a thickness of 25 microns.

Tr. 1257:9-1258:22 (Kada); CX-87 at 3.

Insulator A, which yields greater reliability, has '/4 the modulus of Insulator B, which is

DF-400. That is, Insulator A is four times softer than Insulator B. Tr. 829: 1 1-83 1 :2

(Engelmaier); CX-378 at Sharp's Response to Interrogatory Nos. 242-245, and at

Attachments 5 and 6.

When confronted with the test results reported in Figure 7 of the May 2000 IEEE article

on cross examination, Mr. Kada stated: "When you have technical publications of this

kind, to some degree you want to exaggerate the technology. You want to give the

impression that what you're doing is significant." However, Mr. Kada admitted that he

did not state anywhere in the article that the test data reported in Figure 7 were an

"exaggeration," or that they might not be statistically significant. Tr. 1258: 11-22 (Kada);

275.

276.

277.

278.

169

279.

280.

281.

282.

283.

284.

285

286

CX-87.

Ultimately, Mr. Kada admitted that Figure 7 of the May 2000 IEEE article showed that

Insulator A had better thermal cycling test results than Insulator B. Tr. 1262: 1 1-22

(Kada); CX-87.

In response to cross-examination, Mr. Kada testified that [

1. Tr. 1263:23-12663.

Mr. Kada admitted that the May 2000 IEEE article did not indicate that Insulator B was

the current insulator in Sharp’s single-layer CSP packages, even though Figure 7 showed

that the packages with Insulator B had worse thermal cycling test results than packages

with Insulator A. Tr. 1266:22-1267: 1 (Kada); CX-87.

Sharp uses two CSP structures: the single-layer structure, and the double-layer structure

Tr. 8 10: 16-1 9, 8 125-8 (Engelmaier); CPX-97C ; CPX-98C.

[

] Tr. 1336:13-25 (Kada).

The single-layer CSP includes a chip, with contacts on top of it, as illustrated in CPX-97C.

Tr. 8 10: 16-8 1 1 : 5 (Engelmaier); CPX-97C; CX- 174C; CX- 19C; CX-2OC; CX-22C.

The single-layer CSP includes a polyimide package substrate below the chip, with

terminals and copper traces on it. Tr. 779:21-780: 1 , 810: 16-81 1 : 5 (Engelmaier); CPX-

97c; cx- 174c; cx- 19c; c x - 2 o c ; c x - 2 2 c .

The single-layer CSP includes bonding wires, which are connected to the chip contacts, on

top of the chip, and to copper traces on the polyimide layer. Tr. 8 10: 16-8 1 1 : 5

(Engelmaier); CPX-97C; CX- 174C; CX- 19C; CX-2OC; CX-22C.

170

287. Each lead in Sharp’s single-layer CSP, which electrically connects a chip contact and a

terminal, consists of a bonding wire from the chip contact to the polyimide package

substrate, combined with the copper trace on the top surface of the polyimide package

substrate. The copper trace connects the bonding wire to the terminal. Tr. 810: 16-81 1 : 5

(Engelmaier); CPX-97C; CX- 174C; CX- 19C; CX-2OC; CX-22C.

288. An insulator (i,e., the single layer die bond film) sits on top of the terminals and copper

traces, and is attached to the underside of the chip. The insulator does not contact the

polyimide layer, so that vacant spaces exist between the insulator and the polyimide,

between the copper traces and terminals. Tr. 8 10: 16-8 1 1 : 19 (Engelmaier); CPX-97C; CX-

174c; cx- 19c; c x - 2 o c ; c x - 2 2 c .

289. There is empty space underneath the insulator and above the polyimide layer, as shown in

CPX-97C. Tr. 8 13 : 14-1 9 (Engelmaier); CPX-97C.

290. The insulator in Sharp’s single-layer CSPs rests on top of the copper traces, so that there

are air channels (vacant space) underneath the insulator. In addition, the insulator rests on

top of the terminals. Some of the terminals in Sharp’s CSPs are electrically inactive,

because they are not connected to a copper trace. However, such terminals serve the

mechanical fhct ion of supporting the insulator layer so that it does not come down into

contact with the polyimide layer of the package substrate. Tr. 13 10: 19- I 3 12:9 (Kada);

CPX-IO 1 C, CPX-l03C, CX-88C.

291. Because the insulator in the single-layer CSP structure rests on the tops of the terminals

and copper traces, the total distance between the polyimide substrate and the chip is a full

48 microns in Sharp’s single layer CSPs. Tr. 13 12: 10- 15 (Kada); CPX- 10 1 C.

171

292. The insulator is an adhesive die bond film 25 microns thick, called DF-400. Tr. 81 1 :6-12

(Engelmaier); CX-20C at Sharp’s Response to Interrogatory No. 126, Attachment 4, and

Sharp’s Response to Interrogatory No. 128, Attachment 9.

The insulator, or die bond film, DF-400, fimctions as a compliant layer, to alleviate stress

on the solder balls during thermal cycling. Tr. 823: 17-8245 833:8-24 (Engelmaier); CX-

87 at 3, col. 1 , last para.

Sharp double-layer CSPs are essentially the same as its single layer CSPs, except that the

single insulating layer in the single-layer CSPs, DF-400, is replaced by a die paste layer,

EN-4322, and a die bond layer/insulator, SD-500. Tr. 8 14: 1-1 3 (Engelmaier); CPX-98C;

CX- 173C; CX-2OC, Attachment 4 (Sharp’s response to Interrogatory No. 126, seeking

identification of materials used in Sharp’s CSPs).

As shown in CPX-98C7 the double-layer CSP, like the single-layer CSP, includes: a chip

with contacts on top; a polyimide package substrate with terminals and copper traces on it;

a vacant space above the polyimide and below the die attach materials; and bonding wires

connecting the chip contacts to the copper traces on the polyimide layer. CPX-98C.

Each lead in the double-layer CSP, like the single-layer CSP, consists of a bonding wire

from the chip contact to the polyimide package substrate, combined with the copper trace

on the polyimide package substrate, which connects the bonding wire to the terminal.

293.

294.

295.

296.

CPX-98C.

297. The double-layer structure has two layers of die attach, an insulating layer 14 microns

thick of SD-500 and above it a layer 10-20 microns thick of EN-4322 die bond paste,

instead of a single layer. Tr. 8 14: 1 - 13 (Engelmaier); CPX-98C; CX-2OC, Attachment 4

172

298.

299.

300.

301.

302.

303.

304.

(Sharp’s Response to Interrogatory No. 126, identifying materials used in Sharp CSPs),

and Attachment 9 (Response to Interrogatory No. 128 identifiing material thickness).

The die attach materials fbnction as a compliant layer, to alleviate stress on the solder

balls. Tr. 823:17-824:ll (Engelmaier); CX-87 at 3, col. 1, last para.

Because the insulator in the double-layer CSP structure rests on the tops of the terminals

and copper traces, the total distance between the polyimide substrate and the chip can be

as much as 62 microns in Sharp’s double layer packages. Tr. 13

1 ooc, cx- 173C’ cx- 19C’ c x - 2 o c , c x - 2 2 c .

The package substrate in Sharp’s CSPs is a polyimide substrate.

referred to as a “flex substrate. ‘I Tr. 13 03 : 9- 19 (Kada).

2: 16-25 (Kada); CPX-

[n the industry, it is

Mr. Engelmaier reviewed CX-28C, which is a response by Sharp to Tessera’s

Interrogatories Nos. 153-160, and which provides, as an attachment, a collection of

package substrate drawings for Sharp’s CSPs. Tr. 778:7-779:3 (Engelmaier); CX-28C.

Each package substrate drawing shows: the polyimide package substrate; the outline of

the insulating layer above the substrate; the metal circle defining each terminal; and the

hole through the polyimide package substrate through which each terminal is visible. Tr.

779:7-20 (Engelmaier); CPX-103C; CX-28C.

The substrate drawings show the terminals and the copper trace portions of the leads on

top of the substrate for particular Sharp CSP packages. Tr. 781: 12-782:8 (Engelmaier);

CX-28C.

From the side of the polyimide package substrate opposite that facing the chip, each

terminal would be visible through the corresponding hole in the polyimide. Tr. 779:21-

173

780: 1 (Engelmaier); CPX-103C; CX-28C.

The terminals are on the top side of the polyimide package substrate, the side that is

attached to the chip. Tr. 780: 16-781 :2 (Engelmaier); CPX-103C; CX-28C.

Some of the terminals are "dummy terminals" that are not attached electrically to a solder

joint or to a contact on the chip. For example, one such dummy terminal is shown in the

third row of terminals from the top, three rows in from the right, in CPX-103C. These

dummy terminals are provided only for support, to hold up the compliant insulating layer

The dummy terminals keep the compliant insulator from drooping down between the

vacant spaces and contacting the polyimide layer. Tr. 8 12:9-8 13: 10 (Engelmaier); CPX-

305.

306.

103C; CX-28C.

307. During assembly, the chip is attached to the polyimide package substrate through either an

adhesive insulator (the DF-400) in the single-layer structure, or through an insulator and a

die attach paste (SD-500 and EN-4322, respectively) in the double-layer structure. Tr.

78 1 :4-11 (Engelmaier); CPX-103C; CX-2OC, Attachment 4 (Sharp's response to

Interrogatory No. 126, seeking identification of materials used in Sharp's CSPs).

Mr. Kada testified that the polyimide sheet in Sharp CSPs is not flexible after assembly

because the package was encapsulated in a mold compound. However, Mr Kada admitted

that there was no encapsulant between the die and the polyimide layer. Mr. Kada also

admitted that there was no encapsulant in the area below the package where the solder

balls extend through the polyimide sheet. Mr. Kada admitted that if a Sharp CSP were

mounted on a printed circuit board with no underfill, there would be air under the

polyimide substrate between the package and the printed circuit board. The modulus of

308.

174

elasticity of air is zero. Thus, the polyimide package substrate in Sharp CSPs is

essentially unrestrained on the bottom side of the package. Tr. 1304: 16-1305: 15 (Kada).

Mr. Kada admitted that Sharp did not know whether the polyimide layer in Sharp’s CSPs

buffers or reduces stress resulting from thermal expansion. Tr. 1305: 19-24 (Kada).

During direct examination, Mr. Kada showed the Court samples of blocks of encapsulant

and polyimide to demonstrate the hardness and rigidity of those materials as they are used

in Sharp’s CSPs. However, Mr. Kada admitted that the samples he showed the Court were

ten times thicker than the actual components in Sharp CSPs. Mr. Kada also admitted that

309.

3 10.

the bending rigidity of those materials would increase substantially as the thickness of the

material increased. Indeed, Mr. Kada admitted that the bending rigidity of a material may

exponentially increase by the power of four as the thickness of that material increases.

However, Mr. Kada would not admit that the polyimide sheets and the blocks of

encapsulant that he showed the Court could have a bending rigidity that was actually

10,000 times the bending rigidity of those materials in an actual Sharp CSP, even though

that would obviously be the case if the bending rigidity increases exponentially by the

power of four. Tr. 1305:24-1309:20 (Kada).

Sharp’s CSPs include vent holes in the polyimide layer, connecting to empty spaces

between the insulator and the polyimide layer to allow vapor to be released. Tr. 81 1 :20-

8 12:4 (Engelmaier).

The polyimide layer has copper traces and terminals on it, and vent holes in it, as shown in

CPX-103C. Between the traces, there are empty spaces, with nothing but air in them. The

insulator, or die bond film, rests above the empty spaces. Tr. 8 12:9-8 13 : 1 3 (Engelmaier);

3 11 .

3 12.

175

CPX- 103C (illustration of an exemplary substrate drawing with traces); CX-28C.

The four encapsulants that Sharp uses for its CSPs are very similar. In fact, the modulus

of the four encapsulants is very similar, with negligible differences relating to a

component of shear stress for flexular modulus. Tr. 1302:22-1303:4 (Kada).

Sharp uses four different encapsulants, but there is no significant difference between the

encapsulants. Tr. 814:25-815:5 (Engelmaier); CX-33 IC (Kada Dep.) Tr. 258.22-259:4.

Sharp designs its CSPs so that its customers can mount them on printed circuit boards. In

fact, Sharp CSPs are essentially worthless unless they can be mounted to a printed circuit

board. See Tr. 1284:6-13 (Kada); CX-5OC.

Sharp provides its customers with a CSP mounting guide that discusses the mounting of

Sharp's CSPs to printed circuit boards. Tr. 1287:21-1288:2 (Kada); CX-5OC.

Once a Sharp CSP is mounted to a printed circuit board, it has undergone solder reflow

temperatures twice; once to install the solder balls on the package, and once to mount the

package on a printed circuit board. The solder reflow temperature that Sharp recommends

to customers is 255°C. Tr. 1287:l-17 (Kada); CX-5OC.

Mr. Kada agreed that in quad flat packs ("QFPs") and TSOPs, when solder joints

experience thermal stress from differential thermal expansion, a compliant affect occurs

due to the shape of the gullwing leads. Tr. 1275:25-1276:4 (Kada); CX-5OC at 13

Gullwing-shaped leads of QFP and TSOP packages experience a compliant effect during

differential thermal expansion This means that the gull-wing leads "follow the

movement" caused by differential thermal expansion. Tr. 1328:8-20 (Kada).

According to Mr. Kada, the entire solder ball in a Sharp CSP "follows the movement" of

3 13.

3 14.

3 15.

3 16.

3 17.

3 18.

3 19.

320.

176

thermal expansion to some degree. As an example, Mr. Kada agreed that the solder balls

in Sharp CSPs "follow the movement" of thermal expansion in the sense illustrated in the

bottom (blue) portion of RDX-37. Tr. 1329:7-24 (Kada); RDX-37.

Mr. Kada admitted that he did not know whether the solder ball lands or terminals in a

Sharp CSP "follow the movement" of differential thermal expansion. He stated: "We've

321.

never measured that, so 1 don't know." Thus, Sharp has no evidence that the terminals in

its CSPs do not "follow the movement" of differential thermal expansion. See Tr.

1330:14-1332:16 (Kada).

Sharp conducts TCT board-level reliability tests over a temperature range of -40°C to

125°C. Tr. 1287:18-20 (Kada).

Sharp's CSP mounting guide provides TCT board-level reliability test data for a number

of tests that were conducted over a temperature range of -40°C to 125°C. The test results

reported by Sharp in the CSP mounting guide are accurate and reliable because Sharp

would not want to provide its customers with inaccurate data. Tr. 1288:3-1289:18 (Kada);

CX-5OC at 15-17.

Sharp shares in the responsibility for the board-level reliability of the CSPs it sells to

customers. Tr. 1283:22-25 (Kada).

Mr. Kada admitted that he thought Sharp's customers needed to have some idea, when

they buy a Sharp CSP, as to how long it will last after it is soldered onto a printed circuit

board. Tr. 1284: 1-5 (Kada).

Despite his 30 years of experience in the semiconductor packaging industry, Mr. Kada

claimed that he did not know whether Sharp's Japanese competitors conduct thermal

177

322.

323.

324.

325.

326.

cycling tests for board-level reliability for their CSPs. Tr. 1284: 14-1285: 1 (Kada).

Mr. Kada admitted that [ 327.

328.

329.

330.

331.

332.

333

1. Thus, Mr. Kada admitted that TCT data is

important to some of Sharp's customers. Tr. 1285:22-1286:3 (Kada).

Mr. Kada admitted that in 1997, some customers cared about TCT board-level reliability

data over a temperature range of -40°C to 25°C so that they could decide whether to buy

Sharp's CSPs or a competitor's. Tr. 1286: -17 (Kada).

For the customers who cared about TCT board-level reliability data over a temperature

range of -40°C to 125 "C, Mr. Kada admitted that Sharp tried very hard to make sure that

the TCT data presented to them was accurate and reliable. Tr. 1286: 18-25 (Kada).

Mr. Kada admitted that some of Sharp's customers are probably very concerned with the

use of TCT board-level reliability data over a temperature range of -40°C to 125°C to

project the life of Sharp CSPs in the field. Tr. 1291 :4-14 (Kada).

Mr. Kada also admitted that even for cell phone manufacturers who may not be concerned

with TCT data to predict the life of Sharp CSPs in the field, Sharp still conducts such tests

over a temperature range of -40°C to 125 "C, because these are acceleration tests in which

Sharp can obtain quicker results by applying stronger stresses. Tr. 1291 : 15-25 (Kada);

CX-5OC at 17.

Mr. Kada admitted that there is differential thermal expansion between a Sharp CSP and

the printed circuit board to which it is mounted. Tr. 1277: 1-6, 1278:lO-16 (Kada).

During differential thermal expansion, the additional amount by which the printed circuit

board expands and contracts with respect to a Sharp CSP depends on how much the

178

334.

335.

336.

337

338

temperature changes. Tr. 1280:3-9 (Kada).

Because differential thermal expansion puts stress on the solder joints in Sharp's CSPs, the

amount of temperature change, AT, affects the amount of stress on the solder balls in a

Sharp CSP. Tr. 128O:lO-24 (Kada).

In his trial testimony, Mr. Kada evaded the question about whether the amount of

temperature change AT affects the reliability of Sharp's CSPs during thermal cycling.

Tr. 1280:25-1283:2 (Kada); CX-87.

Sharp's CSP mounting guide provides TCT board-level reliability information about

situations in which Sharp CSPs are mounted on opposite sides of the same printed circuit

board. In this situation, a Sharp CSP would undergo solder reflow temperatures of

approximately 255" C at least three times. For example, a Sharp CSP would undergo

solder reflow temperatures for the installation of its own solder balls. After that, the Sharp

CSP would be subjected to solder reflow temperatures when it is mounted to the printed

circuit board. Finally, the same Sharp CSP would be subjected to solder reflow

temperatures when other CSPs are mounted to the opposite side of the same printed circuit

board. Tr. 1289:19-1291:3 (Kada); CX-5OC at 17.

Sharp has published TCT board-level reliability test results on the Internet. Because this

information is available on the Internet, Sharp's customers and competitors can view it. In

fact, Sharp has published on the Internet a number of the TCT board-level reliability tests

that were conducted over a temperature range of -40" C to 125" C. Tr. 1292: 1-1 5 (Kada);

cx-49 .

According to Mr. Kada, the test results for Sharp's "current type" of CSP reported on

179

page 14 of CX-49 was Sharp's "Improved Basic" two-layer CSP. That structure included

[ 1 and [ 1. Tr. 1293:2-17

(Kada); CX-49, CX-54C, CPX- 1 OOC.

According to Mr. Kada, the "improved type" of Sharp CSP for which test results are

reported on page 14 of the CX-49 included [

film. Sharp's current single-layer products ("Improved #2") have [

339.

] as the insulator

1. Tr. 1294:5-20 (Kada); CX-49, CX-53C, CPX-IOlC.

340. Sharp provides data sheets to its customers for the CSP products it sells. The data sheets

include information about storage temperature ranges which may be as wide as -65 "C to

150" C. However, Sharp's data sheets do not indicate that the customer may not store its

CSPs at these temperatures after the CSPs are mounted on printed circuit boards. Tr.

1295:16-1296:ll (Kada); RX-35C.

Because the amount of temperature change (AT) affects the amount of stress on the solder

balls in a Sharp CSP, the reliability of a Sharp CSP will definitely be affected by storage at

temperatures from -65 " C to 150" C, even if the CSP is not "operated" at those

temperatures. Tr. 1280: 10-24, 1295: 16-1296: 11 (Kada); RX-35C.

The upper limit for the storage temperature range for Sharp CSPs is higher than the upper

limit for the operating temperature range because the CSPs might be stored in a warehouse

at very high temperatures for some period of time. Thus, if the CSPs are mounted to

printed circuit boards and stored in a warehouse, which could include very high

temperatures, they could experience differential thermal expansion during severe

temperature cycling conditions. Tr. 1295: 16-1296: 11, 1337:7-1338:ll (Kada); RX-35C.

341.

342.

180

343. In actual use, solder joint stress results primarily from changes in environmental, or

ambient temperature, rather than changes in temperature due to internal power dissipation. a

Tr. 587:5-23 (Qu).

344. The operating temperature listed in Sharp's specifications is the ambient temperature of

the environment, not the temperature of the CSP inside an electronic product. Thus, the

upper temperature of the CSP during operation could actually be five to 10 degrees higher

than the upper limit of the operating temperature range. Tr. 1338:20-1339:24 (Kada)

345. Quite obviously, leaving a cell phone on the dashboard of an automobile in a hot climate

for several weeks will affect the reliability of the CSPs in the cell phone, regardless of

whether the cell phone is in "operation." This is because large temperature changes - as,

for example, when the cell phone heats up during the day and cools at night - subject the

solder joints of a CSP to significant stresses. Tr. 13 16:5-13 17:22, Tr, 1280: 10-24 (Kada).

346. Although Sharp claims that it increased the size of its solder balls from [ 1

in January 1997 to improve reliability, Sharp still has a CSP with solder balls with a

diameter of [

[

1. In addition, Sharp has some CSPs with solder balls with a diameter of

3. Thus, to the extent the Sharp CSPs with smaller solder balls have improved

reliability, it was not due to an increase in solder ball diameter. Tr. 13 14:7-1315:3 (Kada);

RDX-I 8.

347. Mr. Kada testified that during 1997, Sharp made several improvements to its CSP design,

to improve solder joint reliability. Mr. Kada testified about a timeline, RDX-18, which

showed that in November 1997, Sharp had improved solder joint reliability over its initial

design. Tr. 1163:3-10; RDX-18 (timeline of Sharp design improvements).

181

348. During his deposition, Mr. Kada testified that for purposes of adhesion, die attach

adhesives "you don't want it to be thick. It can be thin , . . And if it sticks then the thinner

the better." Mr. Kada then testified that 10 microns was a desirable thickness for a die

attach paste. CX-33 1C (Deposition of M. Kada) at 250:21-251: 1.

In May 1997, Mr. Kada's senior researcher, Mr. Fujita, investigated [ 349.

1. A report sent to Mr. Fujita, CX-73C, entitled [

1. CX-33 1C (Deposition of M. Kada) at 363: 19-364: 12,

365:4-15; CX-73C.

350. Mr. Fujita specifically investigated [

] The report to Mr. Fujita on [

] CX-73C, described [

1. CX-33 1 C (Deposition of M. Kada) at 363 : 19-

364: 12, CX-73C.

35 1 , In an e-mail dated September 1997, [

] Although Mr. Kada attempted to take

the position that the e-mail did not discuss [

that [

13 19: 14 (Kada).

3, he admitted

1. CX-82C; Tr. 13 17:23-

352. [

] Tr. 1320:12-22 (Kada); CX-82C.

182

353. During his direct examination, Mr. Kada testified that [

1

Specifically, Mr. Kada did not mention in his direct examination any improvements to the

insulator or die attach layer of Sharp's CSPs for [

However, two documents dated April 1998 indicate that [

1. Tr. 1321:3-13 (Kada).

354.

1

Indeed, an e-mail, CX-74C dated April 16, 1998 states: [

] The April 16, 1998 e-mail says nothing about any

improvement due to an increase in: polyimide thickness, solder ball diameter, or via size.

Tr. 1321 : 14-1324:3 (Kada); CX-74C, CX-75C.

Sharp presented a document to Lucent in April 1998 with test results for an improved

Sharp CSP structure compared to Sharp's former CSP structure. That document shows

thermal cycling test data for board level reliability over a temperature range of -40°C to

125°C. The document emphasizes that the structural change which led to the improvement

in reliability was [

355.

1, instead of the [

] The document says nothing

about any structural change based on an increase in: polyimide thickness, solder ball

diameter, or via size. Indeed, the document shows that both the "Current Structure" and

the "Improved Structure" have a polyimide layer that is [ 1. CX-75; Tr.

183

1324:4- 1325 : 10 (Kada).

Sharp has known for years that it could improve the TCT board level reliability of its

CSPs by altering the die attach layer. For example, in May 1997, Mr. Kada's senior

researcher, Mr. Fujita, investigated [

356.

1. See CX-73C.

357 In April 1998, Sharp demonstrated improved TCT board level reliability by [

] Specifically, Sharp provided [ ]with data which showed

that a CSP with [

1. CX-74C, CX-7%; Tr. 1324:4-

1325:lO (Kada).

358. Sharp began using the "Improved #2" [ 1. Tr.

121 1 : 15-25 (Kada); RX-421-0001M (Sharp's single-layer "Improved #2" CSP)

Sharp obtained improved TCT board level reliability results over its "Improved Basic"

two-layer design [

reliability by [

"Improved #2" single layer structure [

17, 1294:s-20, 1326:3-20 (Kada); CX-49, CX-53C, CX-54C; CPX-IOOC, CPX-IOIC.

3 59.

1. Specifically, Sharp obtained better

1. Sharp's current

1. Tr. 1293:2-

360. [

] Therefore, its modulus of elasticity drops significantly

at a lower temperature than the modulus of elasticity of the die attach materials used in the

double-layer structure. As a result, [

the materials used in the [

] is more compliant at lower temperatures than

1. Tr. 399:18-400:18, 636:18-637:lS (Qu);

184

CX- 129C (temperature-dependent modulus of elasticity for the die attach materials).

Mr. Kada claimed that Sharp selected its [ ] die bond film, [ 361.

1, based solely on manufacturing considerations, and not to improve reliability.

However, Sharp has known since at least [

materials, such as the [

1230: 1-5 (Kada).

] that low modulus or thick die bonding

3, will improve thermal cycling reliability. Tr.

362. [ ] Tr.

1336: 13-25 (Kada).

In a May 2000 IEEE article, Sharp published improved TCT board level reliability results

by altering the material properties and the thickness of the die attach layer in its CSPs.

The structure with the lowest level of reliability reported in Figure 7 of the article was a

CSP with a 25-micron layer of DF-400 ("Insulator B"). Sharp demonstrated an increase in

TCT board level reliability by changing the die attach layer to a 25-micron layer of

"Insulator A," which is significantly softer than DF-400. (Insulator A has a modulus of

elasticity that is only about one fourth the modulus of DF-400 at 25°C. Insulator A also

has a glass transition temperature of 62"C, which is below the 67°C glass transition

temperature of DF-400 ) Sharp's results showed a hrther increase in reliability by

increasing the thickness of Insulator A to 35 microns. Tr. 1327:l-1328:4 (Kada); CX-87

("Triple-Chip Stacked CSP"); CX-378C.

Thus, Sharp's actions have demonstrated a longtime awareness of, and a conscious effort

toward, the improvement of the reliability of its CSPs by continually improving the die

attach structure to make it more compliant. This is also confirmed by the following

185

363.

364.

statement in Mr. Kada's May 2000 IEEE article: "The test results showed that the average

life varied depending on the type of insulator, and that thicker insulators alleviated stress

on the solder balls to a greater extent.'' Tr. 1327:l-1328:4 (Kada); CX-49, CX-74C, CX-

75C, CX-87 ("Triple-Chip Stacked CSP"); CX-378C.

Sharp has known about Tessera's packaging technology - including the use of a compliant

die attach layer to improve solder joint reliability - since well before Sharp started

shipping its CSPs in August 1996. Indeed, Tessera first visited Sharp in Japan in March

1995. Sharp evaluated samples of Tessera licensed pBGA packages in June 1995. Sharp

also met with Tessera in July 1995 and April 1996. Mr. Kada also testified in deposition

that he was well aware of Tessera's compliant die attach technology. RDX-19; CX-33 1 C

(Kada Dep.) Tr. 321 : 15-322: 13, 438: 14-439: 18.

Sharp has performed finite element analysis for its CSP packages. Tr. 13 13.1-3 (Kada).

In some of its finite element modeling for its CSPs, Sharp has considered the fact that the

encapsulant of the Sharp CSPs has one modulus at 25°C and a different modulus at 150°C.

Tr. 1313:4-15 (Kada).

In the finite element models that Sharp has done for its CSPs, Sharp has modeled stress or

strain in the Sharp CSPs over temperature ranges like -25°C to 125°C. Sharp has done

these finite element models to learn about the tendencies of stresses on Sharp's solder

joints in its CSPs. Tr. 13 13: 16-23 (Kada).

In the finite element modeling Sharp performed on its CSPs, Sharp found that the greatest

stress was in the solder balls at the four corners of the chip. Tr. 13 13:24-13 14:6 (Kada).

As shown in CPX-500, the solder joints in Sharp's CSPs experience both "board-level"

365

366.

367.

368.

369.

370.

186

warpage ("BW") and shearing, due to differential thermal expansion between the die and

the printed circuit board ("DTE (DEI)"). In CPX-500, solder joint A is impacted primarily

by shearing and by board-level warpage. This solder joint A, under the edge of the die,

will fail due to both shearing and board level warpage. Tr. 1852:24-1853: 11 (Qu); CPX-

500 (solder joint A).

Mr. Kada, Sharp's CSP manager, testified during his deposition that Sharp's finite element

models of the Sharp CSPs showed that the solder balls underneath the four corners of the

chip experience the greatest stress. CX-33 1C (deposition of M. Kada) at 272:21-273: 15.

A letter from Sharp to a CSP customer at [ 1, CX-134 C, stated that "the initial failure

location is the balls around die corners regardless of die size." Tr. 1859:6-25 (Qu); CX-

134C.

371.

372.

373. Similarly, an email regarding CSP solder joint failures encountered by [ 1, CX-8OC,

stated that Il[a]ll failing balls were at the edge of the die." Tr. 1856: 12-24 (Qu); CX-8OC.

In Sharp's CSPs, the "board-level" warpage has a much greater impact on solder joint

reliability than "package warpage" resulting from mismatch between the die and the

encapsulant, Tr. 1 85 5 : 5 - 1 856: 1, 1 856: 12-24, 1 858 :2 1-24 (Qu); CPX-500.

The solder joints hrthest from the neutral point, but still under the die, fail first in Sharp's

CSPs, because board-level warpage has a greater impact than package-level warpage.

These solder joints correspond to solder joint A, shown in CPX-500. Tr. 1856: 12-1858:6

(Qu); CX-80C (Sharp email); CPX-501; Tr. 1859:6-1860:14 (Qu); CX-134C (Sharp

letter); CPX-500 (solder joint A).

If package-level warpage had the most impact on the solder joints in Sharp's CSPs, the

374.

375.

376.

187

solder joints furthest from the neutral point and outside the periphery of the die would fail

first - that is, the solder joints at the edge of the package, not the edge of the die. These

solder joints, labeled B in CPX-500, do not fail first in Sharp’s CSPs. Tr. 1858:25-1859:5

(Qu); CPX-500 (solder joint B).

In an article by Mr. Kada, Sharp’s manager for CSP development, Sharp recognized that

the solder joints are stressed because they are “sandwiched between the mounting board

and the chip.” That is, the solder joints experience stress, and ultimately fail, because of

thermal mismatch between the chip and the PCB - not because of package-level warpage.

Tr. 822:24-823: 13 (Engelmaier); CX-87 (“Triple-Chip Stacked CSP”) at 3, first column,

last paragraph.

Tessera’s expert, Mr. Engelmaier, reviewed numerous documents describing Sharp’s

CSPs. Tr. 767:3-20 (Engelmaier).

Mr. Engelmaier reviewed CX-20C and CX-21C, which is a response by Sharp to Tessera’s

Interrogatory No. 127, seeking information about material properties for the materials used

in Sharp’s CSPs: the modulus of elasticity, the coefficient of thermal expansion, and

Poisson’s ratio for each material as a function of temperature. Tr. 774: 13-24

(Engelmaier); CX-2 1 C.

Mr. Engelmaier also reviewed CX- 129C, which provides supplemental information

regarding the material properties of materials used in Sharp’s CSPs, and which was used

to prepare Sharp’s response to Interrogatory No. 127, CX-21C. Tr. 774:25-775,20

(Engelmaier).

Mr. Engelmaier reviewed CX-484C’ which is Sharp’s response to Tessera’s Interrogatory

377.

378.

379.

3 80.

38 1.

188

382.

3 83

3 84

385

No. 1, identifying all Sharp CSPs, in Attachment 1, as well as Sharp products that include

CSPs, in Attachment 2. Tr. 784:2-785:2 (Engelmaier); CX-484C, Attachment 1 ; Tr.

785:20-786: 17 (Engelmaier); CX-484C, Attachment 2.

The Sharp CSPs analyzed by Dr. Qu had characteristics - package size, die size, package

construction - similar to Sharp's other CSPs. Consequently the package structure and

function of Sharp's other CSPs is similar to the package structure and hnction of the

CSPs analyzed by Dr. Qu, See Tr. 785:3-19 (Engelmaier); CX-484C, Attachment 1 ; CX-

20C, Attachment 1 .

One document reviewed by Mr. Engelmaier, CX-2OC, is a supplemental response to

Tessera's interrogatories 125 through 128. This response at Attachment 1, provides the

package dimensions for each model number: the external dimensions of the package; the

die size for the die inside each package for that model number; the solder ball pitch, or

spacing; and the outer dimensions of the array, or matrix, of solder balls under the

package. Tr. 770:3-772: 19 (Engelmaier); CX-2OC, Attachment 1.

The solder ball array dimensions simply describe the width and length of the field on

which the solder balls sit. It is typically smaller than the package dimensions, and

depends on the number of "IOs", or solder joint connections, required. 772: 1 I - 19

(Engelmaier); CX-2OC, Attachment 1 ,

Some of the model numbers for Sharp CSPs (the LRS models) include two stacked chips,

or dies, one on top of the other, and the sizes for both chips are provided in CX-2OC. Tr.

772:20-773 : 10; CX-20C' Attachment 1, page 4.

386. Two of Sharp's CSPs, according to CX-2OC, have solder ball pitches of . 5 mm. Tr.

189

387.

388.

389.

390.

391.

392.

393,

394.

395.

773 : 1 1-774: 12 (Engelmaier); CX-20C’ Attachment 1 at 5 (solder ball pitch for LR3 87 14

and LR38708).

In addition to the two different structures - single-layer and double-layer - Sharp’s CSPs

vary by chip size, the number of solder balls and package size. Tr. 81 5:6-14 (Engelmaier).

The solder ball spacing, or pitch, will also vary, as well as the solder ball size. Tr. 8 15:24-

816: 17 (Engelmaier); CX-2OC, Attachment 1 (Sharp’s response to Interrogatory No. 125,

seekins various dimensions of Sharp’s CSPs).

The stacking of chips in the stacked CSP products will not impact the movability of the

terminals. Tr. 8 15: 15-22 (Engelmaier).

The primary difference in the basic construction of Sharp’s CSPs is whether the package is

double-layer or single-layer. Tr. 8 14:25-8 15: 14 (Engelmaier).

Sharp’s accused CSP devices include terminals that can move sufficiently with respect to

the die to significantly improve reliability by accommodating differential thermal

expansion. Tr. 43 1 :23-25; 442:s-443:9 (Qu); CPX-48.

Dr. Pitarresi, Sharp’s infringement expert, admitted that the terminals in Sharp’s CSPs will

move relative to the chip when the temperature ofthe CSP changes. Tr. 1458:5-12

(Pitarresi).

Dr. Pitarresi’s own test results show displacement of the terminals in Sharp’s CSPs,

relative to the chip. Tr. 8 17:20-818: 1 (Engelmaier); RX-833,

The movability of the terminals in Sharp’s CSPs is illustrated for an exemplary double-

layer Sharp CSP in CPX-150C. Tr. 834,15-837:16 (Engelmaier); CPX-15OC.

Similarly, CPX- 15 1 C illustrates terminal movability for an exemplary single-layer Sharp

190

CSP. Tr. 837:17-838:6 (Engelmaier); CPX-151C.

To investigate whether the terminals in Sharp’s CSPs are movable, Dr. Qu analyzed

Sharp’s CSPs using finite element analysis (FEA), moire interferometry, and iii situ

scanning electronic microscopy (SEM) measurements. Tr. 355: 11-25, 369:7-370:2 (Qu);

cx-545.

Dr. Qu conducted finite element analyses for twelve representative Sharp CSPs, listed in

CX-545C. See, cg., Tr. 355:11-25 (Qu).

396.

397

398. The finite element analyses (FEA) performed by Dr. Qu demonstrate that the terminals in

Sharp’s CSPs move with respect to the chip to accommodate differential thermal

expansion. Tr. 363: 1-365: 15 (Qu); CPX-146C (time-scale modified FEA results for

LRS1331); CX-167C (raw FEA results for LRS1331); Tr. 365:22-366:14, 367:l 1-368:22

(Qu); CPX- 145C (time-scale modified FEA results for single-layer LHF80BZE); CX-

167C (raw FEA results for single-layer LKF80BZE).

Sharp’s CSPs include a flexible polyimide substrate, flexible leads, and a compliant die

attach structure that allows the polyimide substrate and copper traces, which are part of the

flexible leads, to retain flexibility and deform in the completed assembly. This CSP

structure facilitates terminal movement. Tr. 363: 1-365: 15 (Qu); CPX-I 46C (time-scale

modified FEA results for LRSl33 I ) ; CX-I 67C (raw FEA results for LRS 133 1); Tr.

365:22-366: 14, 367: 11-368:22 (Qu); CPX-145C (time-scale modified FEA results for

single-layer LHF80BZE); CX- 167C (raw FEA results for single-layer LHF80BZE).

The compliant die attach layers in Sharp’s CSPs facilitate movement of the terminals,

which has a significant impact on solder joint reliability. Tr. 8 16: 18-8 17: 19 (Engelmaier);

399.

400.

191

401.

402.

403.

404.

405.

406.

407.

408.

409.

CPX-99c; c x - 173 c ; cx- 174c.

Finite element analysis, sometimes called finite element modeling, is a numerical

technique that uses digital computers to simulate or predict the actual behavior of a

package during changes in temperature. Tr. 326:5-15 (Qu).

Finite element analysis is widely-used in the semiconductor packaging industry. Tr.

357:19-24, 358:16-359:6 (Qu).

Commercial software is available to perform finite element analysis by building finite

element models. Tr. 357:8-18 (Qu).

In finite element analysis, a package is first divided up into small pieces, or elements. Tr.

356:6-357:7 (Qu); CX-546 at 15, Figure 7.2.1.

The stress or displacement within each element may reasonably be assumed to be

constant, if the elements are small enough. Tr. 356:6-357:7 (Qu).

The assumption of constant behavior within each element results in a system of algebraic

equations. Tr. 356:6-357:7 (Qu).

The unknown constants for each element may then be determined by solving the system of

equations. Tr. 356:6-357:7 (Qu).

In order to ensure that the elements in the finite element model are small enough - that is,

that there are enough elements - it is necessary to conduct a convergence study, by

increasing the number of elements used for a given model until the results from the model

do not change significantly when more elements are used. Tr. 373: 14-374: 1, 1884:s-

1885:3 (Qu).

A finite element model that does not include a sufficient number of elements will provide

192

410.

411.

412.

413.

414.

415.

416.

417.

incorrect results for the displacement and stress. Tr. 1886: 10-18 (Qu).

In addition to the number of elements needed for a convergent solution, it is necessary to

consider the kind of elements, proper boundary conditions, the correct constitutive laws

for the materials, the initial conditions, and an appropriate temperature range Tr. 373 :7-

13, 377:22-378:10, 382:25-383:10 (Qu).

Finite element models are built using geometrical dimensions of the materials in the

packages, as well as the material properties. Tr. 374:24-375:6 (Qu).

The material properties may vary with temperature. Tr. 375: 17-376: 1 (Qu); CX-548C.

Dr. Qu, working with Pacific Consultants, Inc., built finite element models for several

representative Sharp CSPs, including: LHF 16K27; LHF80BZE (single-layer and double-

layer); LR3 87 14; LHF04C09; LHF80BZA; LHF80B 1 1 ; LHF80BZ2/LHF80BZ4;

LH5 1 BOJ 1 /LH5 1BOJY; LRS 1327; LRS 1329; LRS 133 1LRS 133 13; LRS 133 1 B;

LRS1342LRS1342A. Tr. 355:ll-25, 369:7-370:2 (Qu); CX-545C.

These models were built using information about the geometrical dimensions of Sharp’s

CSPs provided in Sharp documents and Sharp interrogatory responses. Tr. 375.7-1 6 (Qu);

CX-547C; Tr. 377:7-21 (Qu); CX-I 9C; CX-2OC; CX-22; CX-21C.

Sharp provided a range of thickness for the die bond paste, EN-4322, used in the double-

layer CSP, but the difference in the thickness of the die bond paste had little impact on the

results obtained from the model. Tr. 378: 11 -379: 1 1 (Qu); CX-2OC, attachment 9.

The range of thickness for the die bond paste is a manufacturing tolerance. Tr. 548:20-25

( Q 4 .

The models also included information about material properties, most of which were

193

provided in Sharp documents and interrogatory responses. Tr. 375: 17-376:20, 377:7-

378110 (Qu); CX-548C; CX-19C; CX-2OC; CX-22; CX-21C; CX-129C.

41 8. Dr. Qu obtained information about the material properties of the FR-4 printed circuit

board by measuring the properties of a sample of the FR-4 used in the moire

measurements, discussed below. Tr. 376:2-20 (Qu).

In addition, because Sharp did not provide Tessera with temperature-dependent

information about its solder ball properties, Dr. Qu and Pacific Consultants used

temperature-dependent information about solder ball material properties for a similar

solder ball obtained from a [

The solder ball used in the finite element models had a slightly higher modulus of

elasticity than the Sharp solder ball at the one temperature for which Sharp supplied

information, 25°C: 32 GPa as opposed to 29 GPa. Tr. 376:2-377:6 (Qu).

The fact that the modeled solder ball had a slightly higher modulus at room temperature

does not mean that it will have a higher modulus than the actual Sharp solder ball at other

temperatures. Tr. 525:6-11 (Qu).

This difference in solder ball properties at room temperature therefore may or may not

impact the calculations of displacement by the finite element models. Tr. 524: 15-525:5

4 19.

] document. Tr. 376:2-20 (Qu).

420.

421.

422.

(QUI.

423. The difference between the solder ball material properties used in the finite element

models and the limited, known material properties of Sharp’s solder balls is quite small

and does not have a significant impact on the results provided by the models. Tr. 376:21-

377:6 (Qu).

194

424. Finite element models may be three-dimensional or two-dimensional, Tr. 379: 12-380: 13

(Qu); CX-546 at 15 (Figure 7.2.1) and at 22 (Figure 7.2.9).

Dr. Qu and Pacific Consultants built three-dimensional models for the LHF16K27, which

is a double-layer structure, and for the single-layer version of the LHF80BZE. Tr. 379: 12-

21 (Qu); CX-546 at 22 (Figure 7.2.9 - 3D model of the LHF16K27) and at 39 (Figure

7.9.2 - solder balls from 3D model of the LHF16K27); Tr. 401 : 19-402: 18 (Qu); CX-55 1

(solder balls from 3D model of the LHF80BZE); Tr. 405:20-406: 1 (Qu); CX-546 at 22

(Figure 7.2.9 - 3D model of the LHF16K27).

Dr. Qu and Pacific Consultants also built two-dimensional models for the LHFl6K27 and

the single-layer LHF80BZE, and compared the results from these two-dimensional models

to the results from the three-dimensional models to ensure the accuracy of the two-

dimensional models. Tr. 380:25-381:8 (Qu); CX-546 at Figure 7.2.2 (2D model of the

LHFl6K27) and at Figure 7.2.5 (2D model of the LHF80BZE).

Dr. Qu and Pacific Consultants conducted convergence studies for the three-dimensional

and two-dimensional models, to ensure that the models included a sufficient number of

elements. Tr. 1884:s-1885:3, 373:7-374:l (Qu); CX-549.

Dr. Qu and Pacific Consultants used appropriate boundary conditions for the finite

element models, Tr. 373:7-13, 374:2-23 (Qu); CX-546 at Figure 7.2.1 (2D model of the

LHF 16K27).

Dr. Qu and Pacific Consultants selected appropriate constitutive laws for the finite element

models, to describe the relationship between stress and strain for the various materials

used in Sharp’s CSPs. Tr. 373:7-13, 377:22-378: 11 (Qu).

425.

426.

427.

428.

429.

195

430.

431.

432.

433.

434.

435.

436.

437.

438.

In order to determine the impact of changes in temperature on Sharp's CSPs, the model

must include a starting temperature, referred to as the "stress-free temperature, 'I for which

the CSP is assumed to be stress-free. Tr. 382:25-383:14 (Qu).

Dr. Qu and Pacific Consultants selected 25°C as the stress-free temperature for the finite

element models ofthe Sharp CSPs. Tr. 382:25-383:25 (Qu).

Room temperature is approximately 25°C. Tr. 448:9-14 (Qu).

When a CSP package has been recently assembled on a PCB, and the stresses have not had

a chance to relax over time through creep, the stress-free temperature will be relatively

high. Tr. 3 84: 1 - 17, 459: 1-8 (Qu).

The stresses relax over time, due to creep, lowering the stress-free temperature. Tr 459.9-

14, 459:21-460:7 (Qu).

A "flip-chip" direct chip attach assembly will have a stress-free temperature at or near

room temperature after about two or three weeks. Tr. 642:24-643: 10 (Qu)

A CSP package that has been stored for a relatively long period of time can have a stress-

free temperature of 25°C. Tr. 448:9-18 (Qu).

Dr. Pitarresi, Sharp's finite element modeling expert, admitted that CSPs that have been

assembled onto PCBs and left at or near room temperature would have a stress-free

temperature at or near room temperature, or 25"C, after about three months. Tr. 152 1 : 14-

1522:7 (Pitarresi).

Dr. Pitarresi admitted that a CSP that was assembled into a product, and stored at room

temperature (about 25°C) for 3 months, would likely have a stress-free temperature close

to room temperature, even if that product had been used about ten minutes a day during

196

that three months. Tr. 1522:3-7 (Pitarresi).

The expected operating life for Sharp’s CSPs when mounted on PCBs is, according to

Sharp, on the order of years, much longer than a few weeks. Sharp’s CSP Mounting

Technology Guidelines give, as an example, a lifetime of ten years. CX-SOC (Sharp CSP

Mounting Technology Guidelines) at SHA067463-C.

Therefore, 25°C is a reasonable value to use as the stress-free temperature. Tr. 383: 15-1 8

439.

440.

(QUI.

441. Because the finite element models simulate the behavior of Sharp CSPs that have been

stored for a longer period of time than a few days, a stress-free temperature of 125°C is not

appropriate. Tr. 459:21-460:7 (Qu).

In order to obtain the deformation of the CSP package - the displacement or movement

within the package - the finite element model starts at room temperature and then changes

the temperature. Tr. 364: 1 1 -365: 15 (Qu).

The finite element model could have started at a higher temperature, such as 125OC, and

then decreased the temperature, instead. However, the moire measurements were made

from low temperature to high temperature, so the finite element simulation was also

performed from low temperature to high temperature. Tr. 458:9-I 5 (Qu).

During thermal cycling, temperatures will be increased, as well as decreased, during each

cycle, so computations of reliability can be based on modeling the behavior that occurs

with increasing temperature. Tr. 460: 17-461 : 1 ; 46 1 :6-15 (Qu).

Dr. Qu and Pacific Consultants used a temperature range of -40°C to 125°C for the finite

element models of Sharp’s CSPs. Tr. 385:3-9 (Qu).

442.

443.

444.

445.

197

446.

447.

448.

449,

450.

45 1

452.

453.

This is a standard temperature range used in the industry to determine the reliability of

solder joints in a semiconductor package. Tr. 385: 10-386:6 (Qu).

Other temperature ranges are sometimes used, including the range from -40°C to 160"C,

but the range of -40°C to 125°C is typical. Tr. 385:lO-17, 393:24-3945 (Qu).

The industry uses the temperature range -40°C to 125°C for accelerated thermal cycling

tests: the increased temperature range accelerates the failures of the solder joints in the

chip packages, so that they fail more quickly than they will in the field. Tr. 324:3-23,

38819-25 (Qu).

~ In accelerated thermal cycling tests, chip packages are cycled repeatedly through

temperatures from -40°C to 125°C and back down again, typically until the solder joints

fail. Tr. 324:3-23, 387:3-8 (Qu).

Companies typically use the data from accelerated thermal cycling tests to predict life in

the field, by multiplying the number of cycles to failure by an acceleration factor. Tr.

389~1-7 (Qu).

Sharp tests its own CSPs over the range of -40°C to 125" as part of its product

qualification. Tr. 386:7-387:2 (Qu); CX-5OC (Sharp CSP Mounting Technology

Guidelines) at SHA067460-C through SHA067463 -C.

Sharp's CSP mounting guidelines explain how its accelerated thermal cycling test data,

obtained over the range of -40°C to 125"C, predicts product performance in the field. Tr.

389:8-21 (Qu); CX-5OC (Sharp CSP Mounting Technology Guidelines) at SHA067463-C.

Customers for chip packages require reliability data over the temperature range of -40 " C

to 125°C in order to compare products from different vendors. Tr. 387:9-19 (Qu).

198

454. Sharp includes reliability test data, obtained over the temperature range of -40°C to

125"C, on its public website. Tr. 392:24-393:17 (Qu); CX-49 (Sharp website

presentation, Sharp CSP Reliability) at TESS272773 and TESS272778-TESS272786.

Sharp provides reliability test data for the temperature range of -40°C to 125 "C on its

public website to inform its customers that its CSPs are reliable Tr. 393: 11-23 (Qu); CX-

49 (Sharp website presentation, Sharp CSP Reliability) at TESS272773 and TESS272778-

TESS272786.

During development, Sharp tested its improved single-layer CSPs and its current (original)

double-layer CSPs using thermal cycling tests over the temperature range of -40 " C to

125°C. Tr. 795:11-796:18; CX-75.

Sharp's expert, Dr. Pitarresi, prepared a report, prior to his involvement in this action, in

which he analyzed a Sharp CSP and performed finite element modeling of the Sharp CSP

over the range -40°C to 125°C. Tr. 1480:7-1481:14 (Pitarresi); CX-220 (March 31, 1998

report to the CSP Consortium).

Of the "consumer applications" companies surveyed in an industry survey, provided in an

article relied on by Dr. Pitarresi in his expert report, 60% tested for reliability at 125 "C

Tr. 148 1 : 16- 1482: I 1 (Pitarresi); CX-477.

Packages that will not encounter temperatures from -40°C to 125 "C in use in the field,

such as packages used in pacemaker devices, are nevertheless tested at these temperatures

to determine package reliability. Tr. 387:20-388:s (Qu).

Sharp's CSP development manager, Mr. Kada, admitted that Sharp uses accelerated

thermal cycling tests at -40°C to 125 "C. Mr. Kada testified that these accelerated tests

45.5.

4.56.

4.57.

4.58.

4.59.

460.

199

apply "stronger stresses" to get "quicker results", even for Sharp CSPs that are intended

for consumer products such as cell phones. Tr. 1291:15-22 (Kada).

Mr. Kada determined that Tessera's microBGA products were not usable for applications

such as cellular phones because they failed package-level thermal cycling tests over the

range -60°C to 150°C. Tr. 1340:16-1341:6 (Kada).

The finite element models of Sharp's CSPs help determine the solder joint fatigue life of

Sharp's CSPs, even though the temperature range of -40°C to 125°C exceeds the glass

transition temperature of some of the materials, including the die attach materials, in

Sharp's CSPs. Tr. 391 :25-392:23 (Qu).

Dr. Qu performed finite element analysis results for several representative CSPs. These

representative CSPs include both single-layer and double-layer CSPs, and cover the range

of values for solder ball pitch, package size, and die size. The results obtained from these

detailed analyses apply generally to Sharp's CSPs. See Tr. 785:3-19 (Engelmaier).

Compression of the die attach layer in the vertical direction shows that the vertical

displacement is not due to thermal expansion, but to the compliance of the die attach layer.

For example, the finite element analysis for the LHF80BZE single-layer illustrates this

compression. Tr. 394: l l -395: l ; CX-546 at 30 (Figure 7.8.12 - close-up of LHF80BZE,

single layer at 125°C); Tr. 477:17-478:3 (Qu).

The compression of the die attach layer is occurring because the solder joint is in

compression. Tr. 535:23-536:12; 537:15-538:7 (Qu).

The vertical movement relieves strain on the solder ball. Tr. 538:8-I 1 (Qu).

The vertical movement improves reliability by relieving strain caused by solder joint

200

,461.

462.

463. .

464.

465.

466.

467.

468.

469

470

47 1

compression. Tr. 351 :5-12, 534:25-535:22 (Qu).

The finite element analysis of the single-layer version of Sharp's LHF80BZE CSP shows

that the terminals move with respect to the die. Tr. 394:ll-395:l (Qu); CX- 546 at 30

(Figure 7.8.12 - close-up of LHF80BZE7 single layer at 125°C).

The LHF80BZA is virtually mechanically identical to the LHF80BZE. Tr. 63 8: I 0-2 1

(Qu); CX-545C (footnote 3).

In the analysis, the outermost terminal under the die is identified as point A, the point on

the die directly above the terminal is identified as point B, and the contact on the chip is

identified as point C, as illustrated in CPX-162. Tr. 334:15-22; CPX-162; Tr. 395:5-13,

396115-39711, 397:lO-18 (Qu).

When the temperature changes from 25°C to 75"C, the outermost terminal under the die

(point A) in a normal cross-section of the single-layer LHF80BZE moves relative to the

chip (point B) .36 microns in the horizontal direction, and -.20 microns in the vertical

direction, for a total of .41 microns. Tr. 395:2-396:9 (Qu); CX-550, Table 7.9.4; Tr.

381 19-22 (Qu).

472. When the temperature changes from 25°C to 100"C7 the outermost terminal under the die

in a normal cross-section of the single-layer LHF80BZE moves relative to the chip .60

microns in the horizontal direction, and -. 10 microns in the vertical direction, for a total of

.61 microns. Tr. 395:2-396:9 (Qu); CX-550, Table 7.9.4.

When the temperature changes from 25°C to 125"C, the outermost terminal under the die

in a normal cross-section of the single-layer LHF80BZE moves relative to the chip 1.01

microns in the horizontal direction, and -.4 microns in the vertical direction, for a total of

473.

20 1

1.09 microns. Tr. 395:2-396:9 (Qu); CX-5.50, Table 7.9.4.

The finite element analysis of the single-layer version of Sharp's LHFSOBZE CSP shows

that the terminals move with respect to the contacts on the die. Tr. 396:15-21; CX-550,

Table 7.9.4.

When the temperature changes from 25 "C to 75 "C, the outermost terminal under the die

(point A) in a normal cross-section of the single-layer LHFSOBZE moves relative to the

474.

475.

nearest contact on the chip (point C) .45 microns in the horizontal direction, and -.64

microns in the vertical direction, for a total of .78 microns. Tr. 396:lS-21; CX-550, Table

7.9.4.

When the temperature changes from 25°C to 1OO"C, the outermost terminal under the die

in a normal cross-section of the single-layer LHF80BZE moves relative to the nearest

contact on the chip .64 microns in the horizontal direction, and -.56 microns in the vertical

direction, for a total of .85 microns. Tr. 396:15-21; CX-550, Table 7.9.4.

When the temperature changes from 25°C to 125°C' the outermost terminal under the die

in a normal cross-section of the single-layer LHFSOBZE moves relative to the nearest

contact on the chip 1.23 microns in the horizontal direction, and -1.30 microns in the

vertical direction, for a total of 1.79 microns. Tr. 396:lS-21; CX-550, Table 7.9.4.

The finite element model of the LHFSOBZE, single layer, shows that the polyiinide

476.

477.

478.

package substrate and the copper traces flex and bend, and the insulator deforms, at

temperatures below 125°C. CX-167, BZEfilmAVII; Tr. 363:5-9 (Qu) (the FEA

animation results are "the frame-by-frame picture of the actual deformed shape."), Tr.

364: 15-20 (Qu) (FEA animation results are stepped from 25°C to 125°C); Tr. 432:l-14

202

479.

480.

481.

482.

483.

(Q4.

The finite element outputs are included in CX-167. This exhibit contains the raw finite

element animation outputs attached to Dr. Qu's report, and includes BZEfilinAVIl , the

time-stepped finite element outputs for the LHF80BZE. As can be seen in the AVI, the

FEA output steps from 25°C to 125"C, in 20 increments. The 20 increments are over a

100°C change, and therefore are five degrees each. CX-167, BZEfilmAVIl; Tr. 363.5-9,

364:15-20, 432:l-14 (Qu).

Increment 10, in the BZEfilmAVI1 FEA output, corresponds to a fifty degree increase

from 25 "C, or data obtained at 75 " C. At 75 " C, as shown in BZEfilmAVI 1, the polyimide

substrate is deformed, and the copper traces on the substrate are also deformed. CX-167,

BZEfilmAVI 1 .

Increment 15, in the BZEfilmAVIl FEA output, corresponds to a 75 degree increase from

25"C, or data obtained at 100°C. At lOO"C, as shown in BZEfilmAVIl, the polyimide

substrate is deformed, and the copper traces on the substrate are also deformed CX-167,

BZEfilmAVI 1 .

The finite element model of the LHFl6K27 shows that the polyimide package substrate

and the copper traces flex and bend, and the insulator deforms, at temperatures below

125°C. CX-167, LHF16KAVI7; Tr. 363:5-9 (Qu) (the FEA animation results are "the

frame-by-frame picture of the actual deformed shape."), Tr. 364: 15-20 (Qu) (FEA

animation results are stepped from 25°C to 125°C); Tr. 432:l-14 (Qu).

The finite element outputs are included in CX-167. This exhibit contains the raw finite

element animation outputs attached to Dr. Qu's report, and includes LHFl6KAVI7, the

203

time-stepped finite element outputs for the LHF16K27. As can be seen in the AV1, the

FEA output steps from 25°C to 125"C, in 20 increments. The 20 increments are over a

100" C change, and therefore are five degrees each. CX- 167, LHF16KAV17.

Increment 10, in the LHF16KAVI7 FEA output, corresponds to a fifty degree increase

from 25"C, or data obtained at 75°C. At 75"C, as shown in LHF16KAVI7, the polyimide

substrate is deformed, and the copper traces on the substrate are also deformed. CX-167,

LHF 1 6KAVI7.

Increment 15, in the LHF16KAVI7 FEA output, corresponds to a 75 degree increase from

25"C, or data obtained at 100°C. At 1OO"C, as shown in LHFl6KAVI7, the polyimide

substrate is deformed, and the copper traces on the substrate are also deformed. CX- 167,

LHF 1 6KAV17.

The finite element model of the LRS133 1, which is a stacked chip package, shows that the

polyimide package substrate and the copper traces flex and bend, and the insulator

deforms, at temperatures below 125°C. CX-167, LRS133-1; Tr. 363:5-9 (Qu) (the FEA

animation results are "the frame-by-frame picture of the actual deformed shape."), Tr.

364: 15-20 (Qu) (FEA animation results are stepped from 25°C to 125°C); Tr. 432:l-14

484.

485.

486.

(QUI.

487. The finite element outputs are included in CX-167. This exhibit contains the raw finite

element animation outputs attached to Dr. Qu's report, and includes LRS133-1, the time-

stepped finite element outputs for the LRS133-1. As can be seen in the AVI, the FEA

output steps from 25 "C to 125 " C, in 20 increments. The 20 increments are over a 100 O C

change, and therefore are five degrees each. CX- 167, LRS 133-1,

204

488. Increment 10, in the LRS133-1 FEA output, corresponds to a fifty degree increase from

25"C, or data obtained at 75°C. At 75"C, as shown in LRS133-1, the polyimide substrate

is deformed, and the copper traces on the substrate are also deformed. CX-167,

LRS 1 3 3- 1

489. Increment 15, in the LRS133-1 FEA output, corresponds to a 75 degree increase from

25"C, or data obtained at 100°C. At 1OO"C, as shown in LRS133-1, the polyimide

substrate is deformed, and the copper traces on the substrate are also deformed. CX-I 67,

LRS 133-1

490. The following table, from CX-550, summarizes the movement between the terminals and

the chip, and the movement between the terminals and the contacts on the chip, for a

normal cross-section of the single-layer LHF80BZE:

Table 7.9.4 Displacements between points A and B and points A and C -at various temperatures for LHF80BZE (single layer).

Temp. Disp. Between A and I3 (pm) Disp. Between A and C (pm)

("C) U 1) total U 1) total

-40 -0.10 0.25 0.27 -0.39 1.16 I .22 0 -0.04 0.10 0.1 1 -0.15 0.45 0.47

25 0.00 0.00 0.00 0.00 0.00 0.00 75 0.36 -0.20 0.41 0.45 -0.64 0.78 100 0.60 -0.10 0.61 0.64 -0.56 0.85 125 1 .O1 -0.4 1.09 1.23 -1.30 I .79

491, The impact of movable terminals on reliability should be determined by considering the

movement of the solder terminal furthest from the neutral point, but still under the die,

since the solder joint connected to this terminal will fail first. Tr. 381:23-382:14 (Qu); Tr.

205

492.

493,

494.

495.

496

1859:6-15; CX-134C (Sharp letter).

The solder joint fixthest from the neutral point, but still under the die, will be included in a

diagonal cross-section. Tr. 381:23-382:14 (Qu).

The displacement for the outermost terminal in a diagonal cross-section is generally

greater than the displacement for the outermost terminal in a norinal cross-section. Tr.

403 14-1 8 (Qu).

Dr. Qu obtained the displacement of the outermost solder terminal under the die, using a

diagonal cross-section of the single-layer version of the LHF80BZE extracted from the

three-dimensional model of the LHF80BZE. Tr. 401 : 19-402:25 (Qu); CX-55 1 .

When the temperature changes from 25°C to 125OC, the outermost terminal under the die

in a diagonal cross-section of the single-layer LHF8OBZE moves relative to the chip 2.25

microns in the horizontal direction, and - .58 microns in the vertical direction, for a total of

2.32 microns. Tr. 403:4-22 (Qu); CX-550, Table 7.9.7.

The following table, from CX-550, suminarizes the movement between the terminals and

the chip for a diagonal cross-section of the double-layer LHF80BZE:

Table 7.9.7 Displacements between points A and B and points A and C on the outermost solder joint at various temperatures for the single layer LHF8OBZE.

Temp. Disp. Between A and U (pm) Disp. Between A and C (pm)

("C) U 17 total U 1' total

-40 -0.12 0.36 0.38 -0.21 0.80 0.83 25 0.00 0.00 0.00 0.00 0.00 0.00 125 2.25 -0.58 2.32 2.11 -0.35 2.14

497. The finite element analysis of the double-layer version of Sharp's LHF80BZE CSP shows

206

that the terminals move with respect to the die. Tr. 398: 1-399: 1 (Qu); CPX- 546 at 38

(Figure 7.8.9. - close-up of LHF80BZE, double-layer at 125 "C).

When the temperature changes from 25°C to 75"C, the outermost terminal under the die

(point A) in a normal cross-section of the double-layer LHF80BZE moves relative to the

chip (point B) .10 microns in the horizontal direction, and -.20 microns in the vertical

direction, for a total of .22 microns. Tr. 399:2-13 (Qu); CX-5-50, table 7.9.3.

When the temperature changes from 25°C to 1OO"C, the outermost terminal under the die

in a normal cross-section of the double-layer LHF80BZE moves relative to the chip . I 6

microns in the horizontal direction, and -.30 microns in the vertical direction, for a total of

.34 microns. Tr. 399:2-13 (Qu); CX-550, Table 7.9.3.

When the temperature changes from 25 O C to 125 O C, the outermost terminal under the die

in a normal cross-section of the double-layer LHF80BZE moves relative to the chip .87

microns in the horizontal direction, and -.59 microns in the vertical direction, for a total of

. I .05 microns. Tr. 399:2-13 (Qu); CX-550, Table 7.9.3.

The finite element analysis of the double-layer version of Sharp's LHF80BZE CSP shows

that the terminals move with respect to the contacts on the die. Tr. 399:14-I 7 (Qu); CX-

550, Table 7.9.3.

When the temperature changes from 25 "C to 75 "C, the outermost terminal under the die

(point A) in a normal cross-section of the double-layer LHF80BZE moves relative to the

nearest contact on the chip (point C) .33 microns in the horizontal direction, and -.91

microns in the vertical direction, for a total of .97 microns. Tr. 399: 14-17 (Qu); CX-550,

Table 7.9.3.

498.

499.

500.

501.

502.

207

503,

504.

505.

When the temperature changes from 25°C to 1OO"C, the outermost terminal under the die

in a normal cross-section of the double-layer LHF80BZE moves relative to the nearest

contact on the chip .48 microns in the horizontal direction, and -1.28 microns in the

vertical direction, for a total of 1.37 microns. Tr. 399:14-17 (Qu); CX-550, Table 7.9.3.

When the temperature changes from 25°C to 125 "C, the outermost terminal under the die

in a normal cross-section of the double-layer LHF80BZE moves relative to the nearest

contact on the chip 1.20 microns in the horizontal direction, and -1.67 microns in the

vertical direction, for a total of 2.06 microns. Tr. 399: 14-17 (Qu); CX-550, Table 7.9.3.

The following table, from CX-550, summarizes the movement between the terminals and

the chip, and the movement between the terminals and the contacts on the chip, for a

normal cross-section of the double-layer LHF8OBZE:

Table 7.9.3 Displacements between points A and H and points A and C' at various temperatures for LLHF80BZE (double layer).

Temp.

("C)

-40 0

25 75 100 125

Disp. Between A and I3 (pm)

U 1' total -0.12 0.27 0.30 -0.05 0.11 0.12 0.00 0.00 0.00 0.10 -0.20 0.22 0.16 -0.30 0.34 0.87 -0.59 1.05

Disp. Between A and C (pm)

U V

-0.43 1.21 -0.16 0.46 0.00 0.00 0.33 -0.91 0.48 -1.28 1.20 -1.67

total 1.28 0.49 0.00 0.97 1.37 2.06

208

506. The finite element analysis of Sharp's LHF16K27 CSP shows that the terminals move

with respect to the die. Tr. 404:2-405:l (Qu); CX- 546 at 32 (Figure 7.8.3 - close-up of

the LHFl6K27 at 125°C).

When the temperature changes from 25 " C to 75 " C, the outermost terminal under the die

(point A) in a normal cross-section of the LHF16K27 moves relative to the chip (point B)

.09 microns in the horizontal direction, and -.2 microns in the vertical direction, for a total

of .22 microns. Tr. 405:4-13 (Qu); CX-550, Table 7.9.1.

When the temperature changes from 25°C to 1OO"C, the outermost terminal under the die

in a normal cross-section of the LHFl6K27 moves relative to the chip ,14 microns in the

horizontal direction, and -.29 microns in the vertical direction, for a total of .32 microns.

Tr. 405:4-13 (Qu); CX-550, Table 7.9.1.

When the temperature changes from 25°C to 125"C, the outermost terminal under the die

in a normal cross-section of the LHFl6K27 moves relative to the chip .82 microns in the

horizontal direction, and -.56 microns in the vertical direction, for a total of 1 .OO microns.

Tr. 405:4-13 (Qu); CX-550, Table 7.9.1.

The finite element analysis of the LHFl6K27 shows that the terminals move with respect

to the contacts on the die. Tr. 405:14-16, CX-550, Table 7.9.1.

When the temperature changes from 25 "C to 75 "C, the outermost terminal under the die

(point A) in a normal cross-section of the LHF16K27 moves relative to the nearest contact

on the chip (point C) .30 microns in the horizontal direction, and -1.06 microns in the

vertical direction, for a total of 1.10 microns. Tr. 405: 14-16; CX-550, Table 7.9.1,

When the temperature changes from 25°C to 1OO"C, the outermost terminal under the die

507.

508.

509.

5 10.

5 1 1 .

512.

209

513.

5 14.

in a normal cross-section of the LHF16K27 moves relative to the nearest contact on the

chip .41 microns in the horizontal direction, and -1.47 microns in the vertical direction,

for a total of 1.53 microns. Tr. 405:14-16; CX-550, Table 7.9.1.

When the temperature changes from 25 "C to 125"C, the outermost terminal under the die

in a normal cross-section of the LHFl6K27 moves relative to the nearest contact on the

chip 1.10 microns in the horizontal direction, and -1.84 microns in the vertical direction,

for a total of2.14 microns. Tr. 405:14-16; CX-550, Table 7.9.1.

The following table, from CX-550, summarizes the movement between the terminals and

the chip, and the movement between the terminals and the contacts on the chip, for a

normal cross-section of the LHF 16K27:

Table 7.9.1 Displacements between points A and R and points A and C at various temperatures for LHF 1 6K27.

Temp. Disp. Between A and B @m) Disp. Between A and C (pin)

("C) U 1) total U 1) total

-40 -0.11 0.27 0.29 -0.39 1.41 1.46 0 -0.05 0.1 0.1 1 -0.15 0.53 0.55

25 0.00 0.00 0.00 0.00 0.00 0.00 75 0.09 -0.2 0.22 0.30 -1.06 1.10 100 0.14 -0.29 0.32 0.41 -1.47 1.53 125 0.82 -0.56 1 .oo 1.10 -1.84 2.14

5 15. Dr. Qu obtained the displacement of the outermost solder terminal under the die, using a

diagonal cross-section of the LHFl6K27 extracted from the three-dimensional model of

the LHF16K27. Tr. 405:17-406:6 (Qu); CX-546 at 39 (Figure 7.9.2. - array of solder

balls extracted from 3D model of the LHF16K27).

210

516.

517.

When the temperature changes from 25 "C to 125 "C, the outermost terminal under the die

in a diagonal cross-section of the LHF16K27 moves relative to the chip 85 microns in the

horizontal direction, and -.94 microns in the vertical direction, for a total of 1.27 microns.

Tr. 406:2-12 (Qu); CX-550, Table 7.9.6.

The following table, from CX-550, summarizes the movement between the terminals and

the chip for a diagonal cross-section of the LHF 1 6K27:

Table 7.9.6 Displacements between points A and R and points A and c' on the outermost solder joint at various temperatures for LHFl6K27.

518.

519.

520

Temp. Disp. Between A and B (pm) Disp. Between A and C (pm)

U I' total U I' total -40 -0.14 0.39 0.41 -0.06 2.03 2.03 25 0.00 0.00 0.00 0.00 0.00 0.00 125 0.85 -0.94 1.27 0.89 -4.2 4.32

("C)

The finite element analysis of Sharp's LR38714 CSP shows that the terminals move with

respect to the die. Tr. 406:13-407:2 (Qu); CPX- 546 at 35 (Figure 7.8.6 - close-up of

LR38714 at 125°C)

When the temperature changes from 25 "C to 75"C, the outermost terminal under the die

in a normal cross-section of the LR38714 moves relative to the chip .18 microns in the

horizontal direction, and -.04 microns in the vertical direction, for a total o f , 18 microns

Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

When the temperature changes from 25°C to lOO"C, the outermost terminal under the die

in a normal cross-section of the LR387 14 moves relative to the chip .28 microns in the

horizontal direction, and -.64 microns in the vertical direction, for a total of .70 microns

21 1

Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

When the temperature changes from 25°C to 125"C, the outermost terminal under the die

in a normal cross-section of the LR38714 moves relative to the chip .63 microns in the

horizontal direction, and -.62 microns in the vertical direction, for a total of .88 microns.

Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

The finite element analysis of the LR38714 shows that the terminals move with respect to

the contacts on the die. Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

When the temperature changes from 25 "C to 75 O C, the outermost terminal under the die

(point A) in a normal cross-section of the LR38714 moves relative to the nearest contact

on the chip (point C) .35 microns in the horizontal direction, and -.08 microns in the

vertical direction, for a total of .36 microns. Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

When the temperature changes from 25°C to lOO"C, the outermost terminal under the die

in a normal cross-section of the LR38714 moves relative to the nearest contact on the chip

.81 microns in the horizontal direction, and -1.25 microns in the vertical direction, for a

total of 1.49 microns. Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

When the temperature changes from 25°C to 125"C, the outermost terminal under the die

in a normal cross-section of the LR38714 moves relative to the nearest contact on the chip

1.33 microns in the horizontal direction, and -1.40 microns in the vertical direction, for a

total of 1.93 microns. Tr. 407:3-11 (Qu); CX-550, Table 7.9.2.

The following table, from CX-550, summarizes the movement between the terminals and

the chip, and the movement between the terminals and the contacts on the chip, for a

normal cross-section of the LR3 87 14:

521.

522.

523,

524.

525.

526.

212

Table 7.9.2 Displacements between points A and B and points A and C at various temperatures for LR38714.

Temp.

("C)

-40 0

25 75 100 125

527.

528.

529.

530.

Disp. Between A and B (pm) Disp. Between A and C (pm)

U v total U v total -0. I4 0.25 0.29 -0.76 0.93 1.20 -0.07 0.10 0.12 -0.30 0.36 0.47 0.00 0.00 0.00 0.00 0.00 0.00 0.18 -0.04 0.18 0.35 -0.08 0.36 0.28 -0.64 0.70 0.8 1 -1.25 1.49 0.63 -0.62 0.88 1.33 -1.40 1.93

Dr. Qu and Pacific Consultants built a two-dimensional diagonal cross-section model of

the LR38714. Tr. 407:22-408:13 (Qu); Tr. 408:14-18.

When the temperature changes from 25 "C to 75 "C, the outermost terminal under the die

in a diagonal cross-section of the LR38714 moves relative to the chip .23 microns in the

horizontal direction, and -.43 microns in the vertical direction, for a total of .49 microns.

Tr. 408:7-13 (Qu); CX-550, Table 7.9.5.

When the temperature changes from 25°C to lOO"C, the outermost terminal under the die

in a diagonal cross-section of the LR38714 moves relative to the chip .36 microns in the

horizontal direction, and -.85 microns in the vertical direction, for a total of .92 microns.

Tr. 408:7-13 (Qu); CX-550, Table 7.9.5.

When the temperature changes from 25 "C to 125 "C, the outermost terminal under the die

in a diagonal cross-section of the LR38714 moves relative to the chip .73 microns in the

horizontal direction, and -.80 microns in the vertical direction, for a total of 1.08 microns.

Tr. 408:7-13 (Qu); CX-550 Table 7.9.5.

213

53 1. The following table, from CX-550, summarizes the movement between the terminals and

the chip for a diagonal cross-section of the LR387 14:

Table 7.9.5 Displacements between points A and B and points A and C at various temperatures for LR3 87 14 from a diagonal cross-section model (outermost solder joint)

Temp. Disp. Between A and B (,urn) Disp. Between A and C (,urn)

(“C) U 1’ Total U 11 total

-40 -0.19 0.25 0.3 1 -1.16 1.64 2.0 1 0 -0.07 0.10 0.12 -0.44 0.63 0.77

25 0.00 0.00 0.00 0.00 0.00 0.00 75 0.23 -0.43 0.49 0.86 -1.35 1.60 100 0.36 -0.85 0.92 1.24 -2.14 2.47 125 0.73 -0.80 1.08 1.90 -2.48 3.12

532. Finite element models for additional Sharp CSPs - the LHF8OBZ2LHFSOBZ4, the

LHF04C09, the LHF80B 1 1, the LH5 1 BOJ 1LH5 1 BOJY, the LRS 1327, the LRS 1329, the

LRS 1 33 1, and the LRS 1342 - demonstrate that these additional CSPs have similar

features to the LHFSOBZE, the LHF16K27, and the LR38714. Tr. 41 1:19-23 (Qu); CX-

165C; Tr. 408: 19-409:7 (Qu).

533, This terminal movement in the LHFSOBZE (single-layer and double-layer), the

LHFl6K27, and the LR38714 corresponds to a reduction in solder joint strain, relative to a

rigid CSP, of 35% to 60%. Tr. 1862:12-1863:2, 1863:25-18 (Qu); CX-560.

534. The finite element models of Sharp’s CSPs accurately represent the behavior of Sharp’s

CSPs. See Tr. 409: 1-7 (Qu)

535. The LHF80BZE is manufactured in both the single-layer and the double-layer structure

Tr. 625: 12-22 (Qu); CX-2OC, Attachment 4 at 2-3 (listing materials for Sharp’s CSPs:

214

both DF-400 die bond film, and the combination SD-500 and EN-4322 are listed for

LHF80BZE).

At 125"C, the displacements for the single-layer and the double-layer versions of the

LHF80BZE are very similar. Tr. 399:18-400:18 (Qu); CX-550, Tables 7.9.3 and 7.9.4.

However at lower temperatures such as 75 "C, the single-layer LHF80BZE allows

significantly more displacement between the terminals and the die. Tr. 399: 18-400: 18

(Qu); CX-550, Tables 7.9.3 and 7.9.4.

A lower modulus material is softer than a higher modulus material. Tr. 637: 18-22 (Qu);

Tr. 830: 10-83 1 :2 (Engelmaier); CX-387C (material properties of Insulator A and

Insulator B).

The modulus of elasticity of a material drops at the glass transition temperature, and is

lower above the glass transition temperature, Tr. 83 1 : 1-832: 13 (Engelmaier); CX-3 87C

(material properties of Insulator A and Insulator B).

In order to improve reliability, one should use an insulator, or die bond film, with a lower

glass transition temperature, so as to get a lower modulus of elasticity, and thus a more

compliant material at higher temperatures. Using a more compliant material will facilitate

terminal movement. Tr. 83 1 :25-833:3 (Engelmaier).

At lower temperatures, the single-layer LHF80BZE allows more displacement because the

die bond film used in the single-layer structure has a much lower glass transition

temperature than the die attach materials used in the double-layer structure. Tr. 399: 18-

400: 18 (Qu); Tr. 400:25-401: 18 (Qu); CX-548C.

The glass transition temperature of the single-layer die bond film, DF-400, is 67°C. Tr.

536.

537.

538.

539.

540.

541.

542.

21 5

1468:2-4; CX-2 1 C, attachment 1, table c.

543. The glass transition temperatures of the die attach paste, EN-4322, and the insulator,

SD-500, used in the double-layer structure are 100°C and 1 2OoC, respectively. CX-2 1 C,

attachment 1, table c.

The lower glass transition of the die bond film, DF-400, in the single-layer structure

causes it to be more compliant at lower temperatures, such as 75"C, than the die attach

materials in the double-layer structure. Tr. 399:18-400: 18 (Qu); CX-550, Tables 7.9.3 and

7.9.4.

The lower glass transition temperature means that the modulus of elasticity of the die bond

film in the single-layer structure (DF-400) drops significantly at a lower temperature than

the modulus of elasticity of the die attach paste (EN-4322) and insulator (SD-500) used in

the double-layer structure Tr. 636: 18-637: 15 (Qu); CX-I 29C (temperature-dependent

modulus of elasticity for the die attach materials).

Dr. Pitarresi admitted that the actual material properties of the die attach can have a large

impact on the displacement between the terminal and the chip in a Sharp CSP. Tr.

1496: 18-23 (Pitarresi).

Dr. Pitarresi admitted that the modulus of DF-400 drops more than 98% between 50°C

and 75°C. Tr. 1470: 10-1471:9 (Pitarresi); CX-21C (Sharp's lnterrogatory Responses

Attachment 1 at Table A).

Dr. Pitarresi admitted that the modulus of DF-400 drops more than 98% over temperatures

that fall within the operating range of the LHFSOBZE. Tr. 1470:20-1471: 12 (Pitarresi)

Dr. Pitarresi, for his "compliant die attach" comparison model, used a die attach with a

544.

545.

546.

547.

548.

549.

216

550.

551.

552

553

554

modulus of elasticity that is higher at 84"C, than the modulus of elasticity of the single-

layer die bond film, DF-400. That is, Dr. Pitarresi's soft rubber "compliant die attach" is

more rigid at 84"C, than the die attach material used in Sharp's single-layer CSPs. Tr

1468:s- 15, 1468:2 1-1469: 1 (Pitarresi).

Dr. Pitarresi testified that if a temperature increase of 1O"C, due to internal power

dissipation, is added to the ambient operating temperature for the LHF80BZE, the

temperature of the device will be 95°C. Tr. 1476:s-1477:6 (Pitarresi); CX-422; Tr

133 8:20-1339:24 (Kada) (the operating temperature refers to the ambient temperature, and

power dissipation would increase the chip temperature beyond the ambient temperature).

The difference between the single-layer and double-layer versions of the LHF80BZE is the

die attach structure, which is significantly softer in the single layer at temperatures such as

75°C. Tr. 639:2-640:2 (Qu).

The single-layer version of the LHF80BZE is more reliable than the double-layer version,

because the die attach material allows more movement between points A and B, the

terminal and the die. Tr. 641: 14-23 (Qu).

Sharp's expert, Dr. Pitarresi, admitted that it was his understanding that the only

difference between the Sharp single-layer structure and the Sharp double-layer structure

was the type of die bond material used, one using a paste and an insulator, and the other

using the die bond film DF-400. Tr. 1459: 10-20 (Pitarresi).

Dr. Pitarresi admitted that the thermal cycle reliability of a Sharp CSP package can be

affected by the type of insulator or die attach material used in the package. Tr. 1453:2S-

1454:4 (Pi tarred

217

5 5 5 .

556.

557.

558.

559.

560.

561.

562.

Dr. Pitarresi admitted that choosing an insulator that has a lower modulus over a

temperature range can increase the thermal cycle reliability of a Sharp CSP package. Tr.

1456: 12-17 (Pitarresi).

Dr. Pitarresi admitted that the temperature variation of the modulus of a die bond or

insulating material can have an impact on the thermal cycle reliability of a Sharp CSP

package. Tr. 1456:22-1457:2 (Pitarresi).

Dr. Pitarresi admitted that it is possible to select a die bond material for the Sharp CSP

package that would reduce the amount of stress on the solder balls. Tr. 1457:3-8

(Pitarresi),

Dr. Pitarresi admitted that he would expect the single-layer LHFSOBZE to have more

displacement between the terminal and the chip than the double-layer LHF80BZE. Tr.

1493 : 1-23 (Pitarresi).

Dr. Qu conducted moire analysis of Sharp CSPs, including the LHF16Kl1, the

LHF80BZE (double-layer version), the LR38714, the LHF80BZ2, the LHF04C09, and the

LRS1327. Tr. 409:8-10, 409:19-22 (Qu); 411:12-18 (Qu); CX-545C.

Moire measurement is an optical technique that measures displacement or movement on a

surface: for example, moire measurement can be used to measure the movement of points

on the surface of a cross-section. Tr. 412:4-20 (Qu); Tr. 327:l-16 (Qu).

Moire analysis of a CSP measures movement on a cross-section of the CSP. Tr. 412:25-

413:3 (Qu).

Moire measurement is well-accepted in the semiconductor packaging industry for product

design and analysis. Tr. 412:21-24 (Qu).

218

563.

564.

565.

566.

567.

568.

569.

570.

571,

Moire pictures (or images) were taken for Sharp CSP samples, using moire equipment

called PEMI 2. Tr. 413:12-20 (Qu); CX-554C, Figure 8.1.1 (photograph of PEMl 11

equipment); Tr. 418: 14-22 (Qu).

The samples of Sharp’s CSPs were prepared by and under the supervision of Dr. Richard

Klopp of Exponent Failure Analysis. Tr. 416:6-10 (Qu); Tr. 417:7-13 (Qu).

Each Sharp CSP package analyzed was first assembled on an FR4 board. Tr. 413:22-

414:7 (Qu); CX-554C, Figure 8.2.1,

The assembly included mechanically connecting the CSP to the FR4 board through the

solder ball joints, using Sharp’s mounting specifications. Tr. 41 3:22-414:7 (Qu); CX-

554C, Figure 8.2.1; Tr. 416:15-22 (Qu).

After assembly, each mounted CSP was inspected to make sure the sample was assembled

properly. Tr. 416:23-417:6 (Qu).

The mounted CSP was then sectioned to show a cross-section of the CSP and the FR4

PCB. Tr. 416:23-417:6 (Qu); Tr. 413:22-415:1 (Qu); CX-554C, Figure 8.4.1 (photo of a

cross-sectioned sample).

The cross-section exposed the solder joints. Tr. 414:8-18 (Qu); CX-554C, Figure 8.4.1

(photo of a cross-sectioned sample).

The cross-sectioned assembly was polished to make sure it was very flat and smooth, and

then inspected using a microscope to ensure that there were no cracks or scratches on the

surface. Tr. 413:22-415:l (Qu); Tr. 416:23-417:6.

Any improperly-prepared samples were identified during the inspection and rejected. Tr.

416:23-417:18 (Qu); Tr. 418:4-7 (Qu).

219

572.

573.

574.

575.

576.

577.

578

579

After sectioning and polishing, a grating was attached to the sample with an epoxy. Tr.

4 14: 8 :-4 1 5 1 (Qu).

The purpose of the epoxy is to attach the grating to the surface. Tr. 606:24-607: 12 (Qu).

The properties of the commercial epoxies, such as glass transition temperature and

modulus of elasticity, do not impact the deformation of the specimen, or sample, and

therefore do not impact the true replication of the specimen by the moire. Tr. 606:24-

608:2 (Qu).

The gratings on the various samples remained intact: if they had not remained intact, it

would not be possible to see the fringe patterns clearly. Tr. 1878:21-1879:2 (Qu).

The fact that the gratings remained intact confirms that the glass transition temperature of

the epoxy used to attach the gratings did not impact the results. Tr. 1878:4-1879:2 (Qu)

Dr. Qu discussed the issue of the glass transition temperature of the epoxy with his

colleague, Dr. Bongtae Han, whom Sharp has acknowledged as an expert in moire

analysis. Dr. Qu’s discussion with Dr. Han confirmed his belief that the only issue is

whether the grating remains intact: if it does, the epoxy characteristics will not impact the

moire results. Tr. 1879:3-1880:4 (Qu); Tr. 1426:ll-18 (Pitarresi) (Dr. Han is recognized

as an expert in moire).

Dr. Klopp and Mr. Brent Buescher, of Pacific Consultants, operated the moire equipment

to obtain moire images of the prepared samples of the Sharp CSPs. Tr. 416:6-10 (Qu); Tr

421:8-13 (Qu); CX-554C, Figure 8.5.1 (a raw moire image).

Mr. Buescher is very familiar with moire interferometry and measurement. Tr. 42 1 ,14-2 1

( Q 4 .

220

580.

581,

582.

583.

584.

5 8 5 .

586.

587,

Dr. Klopp had recent experience in obtaining moire images for CSPs. Tr. 420:6-15 (Qu).

A moire image is created when lines on the grating on the sample are superimposed with

lines on a grating in the interferometer, creating moire fringes. Tr. 412:4-20 (Qu); CPX-

185; Tr. 414:19-415:l (Qu).

In a moire image, the moire fringes between two points can be counted to determine

displacement between those points. Tr. 41 2:4-20 (Qu).

Dr. Klopp and Mr. Buescher took moire images or pictures of the cross-section of each

sample by placing the prepared sample in the thermal chamber of the moire interferometer,

and then taking a picture. Tr. 414:19-415:18 (Qu).

Dr. Klopp and Mr. Buescher took a set of four moire images at each temperature of

interest. Tr. 415:6-18 (Qu); CX-554C, figures 8.5.1 (raw moire image) and 8.5.2 (moire

phase map).

Each of the four images was shifted by a quarter wavelength, to provide four different

picture at four different phases. Tr. 415:6:18 (Qu) ; CX-554C, figures 8.5.1 (raw moire

image) and 8.5.2 (moire phase map).

For each sample, Dr. Klopp and Mr. Buescher obtained sets of images for both vertical

and for horizontal displacement. An exemplary set of images is shown in CX-552, Figure

8.7.6(a). Tr. 423:21-424:4; CX-552, figure 8.7.6(a).

Dr. Klopp and Mr. Buescher obtained sets of moire images at room temperature,

approximately 25OC, and at 75"C, lOO"C, and 125°C. An exemplary set of images at

different temperatures is shown in Figure 8.7.6(a). Tr. 423:21-424:4; CX-552, figure

8.7.6( a).

22 I

588. At each temperature, Dr. Klopp and Mr. Buescher refocused the interferometer to account

for warpage of the package. Tr. 421 :22-422:4 (Qu).

589. As a result of the refocusing, the moire results did not reflect mere rotational movement,

because refocusing removed the rotational movement from the analysis. Tr. 422: 5-9 (Qu).

Sharp's expert, Dr. Pitarresi, testified that with regard to the rigid body rotation or

warpage, the procedure performed by Dr. Klopp and Mr. Buescher was consistent with his

own procedures. Tr. 1508: 18-1 509:6 (Pitarresi).

590.

591. Dr. Qu is experienced at evaluating moire images, and therefore can determine by

examining a moire image whether it was obtained correctly. In particular, he was actively

involved in the overall process of obtaining such images for this investigation. He advised

Dr. Klopp, and provided guidance. Furthermore, Dr. Qu has the expertise to be able to tell

from the results whether the tests were done properly. He does that on a daily basis, in his

words, "to watch over my students' shoulders to make sure that they do it right and make

sure they do it correctly." Tr. 41 9:4-12 (Qu).

During his investigation, Dr. Qu rejected moire images that were of poor quality. Tr. 592.

420: 16-21 (Qu).

593, The moire images obtained by Dr. Klopp and Mr. Buescher were processed and analyzed

by Dr. Qu, Dr. Klopp and Mr. Buescherjointly, to determine displacements between the

chip contacts and the terminals. Tr. 420:22-421:lO (Qu); Tr. 422: 10-423:7 (Qu).

594. First, Mr. Buescher performed phase unwrapping of each set of four phase-shifted moire

images, using a standard program, to obtain a phase map. Tr. 415:6-25 (Qu); CX-554C,

figures 8.5.1 (raw moire image) and 8.5.2 (phase map); Tr. 420:22-421:ll (Qu)

222

595. Dr. Qu used a commercial version of the program used by Mr. Buescher for the phase

unwrapping to double-check the phase unwrapping, and confirmed that Mr. Buescher's

program worked correctly. Tr. 420:22-11 (Qu).

Dr. Pitarresi, Sharp's expert, did not dispute that this technique, which he called "fringe 596.

shifting," allows better differentiation between the fringes, but testified that in his lab he

had been unable to find a good way to perform fringe shifting accurately at high

temperatures. Tr. 1427:15-1428:14.

Dr. Pitarresi's inability to successhlly use fringe shifting at high temperatures does not

demonstrate that Dr. Qu's use of this technique was not successhl. Tr. 1427: 15-1428: 14.

After Mr. Buescher generated the phase maps, Dr. Qu copied outlines of the sample

features - the silicon die, solder joint, and FR4 PCB - from pictures of the cross-sections

onto the phase maps Tr 422: 10-423:7 (Qu); CX-554C, figures 8.7.1 and 8.7.2 (showing

optical images, and points A, B and C on optical images and phase maps); Tr. 423: I 1 -1 5

597.

598.

(QUI.

599. Dr. Qu, Dr. Klopp and Mr. Buescher then counted the fringes between point A - the

terminal - and point C - the contact on the chip - to obtain the displacement between the

chip contact and the terminal. Tr. 422:21-423: 10, 424: 19-23 (Qu).

Dr. Qu did not determine the displacement between point A - the terminal - and point B -

the point on the die directly above the terminal - using the moire measurements, because

the ability to make a moire measurement for such an extremely small distance is limited

Tr. 424:24-425:6 (Qu).

Dr. Qu, Dr. Klopp and Mr. Buescher obtained moire measurements for multiple samples

600.

601.

223

of several chips - that is, measurements for three to five samples of the same chip - to

ensure repeatability of the results. Tr. 417:19-418:3 (Qu); Tr. 424:5-18 (Qu).

Repeatable results are necessary to demonstrate that the sample preparation process and

measurement process are well-controlled. Tr. 417: 19-418:3, 1899: 12-20 (Qu).

The moire analysis for the Sharp CSPs demonstrated movement between the solder

terminal and the chip that was consistent with the results of the finite element modeling of

the CSPs. Tr. 426:ll-17 (Qu).

The displacements measured by the moire analysis and calculated by the finite element

analysis agreed, and the discrepancies between the measured results and the simulated

results are reasonable. Tr. 409:23-410:25 (Qu).

Some of the moire measurements agreed with the finite element results within a few

percent. Tr. 410:2-8 (Qu); compare CX-550, table 7.9.3 and CX-552, table 8.7 3 (total

displacement at 125 O C).

To validate his study, Dr. Pitarresi, Sharp’s expert, compared a single measurement from a

finite element model, and found that it agreed with a single measurement from a single

moire within 15%. Tr. 1401:5-21; Tr. 1450.17-1451:15 (Pitarresi).

Dr. Pitarresi made more than one moire measurement, but conducted a validation study for

only one moire measurement. Tr. 1450:21-145 1 :6 (Pitarresi).

According to Dr. Pitarresi, having a single moire measurement at one temperature that

602.

603.

604.

605.

606.

607.

608.

agrees with a single finite element result within 15% indicates that the finite element

model and the moire measurement are valid. Tr. 1402:8-17 (Pitarresi).

According to the method used by Dr. Pitarresi to validate his study, Dr. Qu’s finite

224

609.

element model and moire results, with at least one comparison between moire

measurements and finite element model results agreeing within 2%, are valid, and in fact

agree much better than Dr. Pitarresi’s results. Tr. 1451 :25-1452:21 (Pitarresi).

Some differences between the moire measurements and the finite element analysis are due

to manufacturing tolerances, differences in sample preparation and differences in material

properties. Tr 410:9-25, 1901 : 12-1902:2 (Qu).

In addition, some of the difference between the moire measurements and the finite element

results is due to the difference in the stress-free temperature between recently-assembled

samples and CSPs that have been assembled onto a PCB for a longer period of time. Tr.

384:l-17 (Qu).

Some displacements for the LHFl6K27 measured using moire interferometry were lower

than the displacements shown in the finite element analysis using a stress-free temperature

of 25°C. Tr. 384: 1-1 7 (Qu); compare CX-550, table 7.9.1 and CX-552, table 8.7.1 (total

displacement at 125°C).

Stresses are initiated when the CSP is mounted onto a PCB. Tr. 384: 1 - 1 7 (Qu).

The stress-free temperature of a CSP depends on the length of time the CSP has been

mounted onto a PCB, because the stresses relax due to creep after assembly. Tr. 384: 1-1 7

610.

6 1 1 .

6 12.

61 3.

614.

(Qu).

615. The Sharp CSPs used for the moire analysis were typically assembled onto the FR4 PCB

only a few days before the moire measurements were made. Tr. 384: 1-1 7 (Qu).

The stress-free temperature for the recently-assembled Sharp CSPs used for the moire

analysis was probably higher than the 25°C stress-free temperature assumed for the finite

61 6.

225

element analysis, because the stress has had little time to relax. Tr. 384: 1-17 (Qu).

For comparing finite element results with moire measurements, a stress-free temperature

of 125°C is sometimes used, for packages that have just been assembled. Tr. 458:20-459:s

6 17.

(QUI.

6 18. Higher stress-free temperatures are often used because early moire equipment did not have

a thermal chamber to heat the samples, so moire measurements were made on samples

prepared at high temperature and then cooled from high temperature to room temperature.

Tr. 462:2-463:4 (Qu).

The PEMI 2 equipment has a thermal chamber, so the samples can be prepared at room

temperature and then heated. Tr. 61 1:5-9, 413:12-20, 414:19-21 (Qu).

A simulation of an LHF16K27 with a stress-free temperature of 125°C was run by Pacific

Consultants. Tr. 452: 12-21 (Qu); RX-819C; Tr. 458:9-19 (Qu).

This simulation was run some time after the decision was made to do the moire

measurements from low temperature to high temperature. Tr. 452: 12-21 (Qu); RX-8 19C;

Tr. 458:9-19 (Qu).

The displacements in this simulation with a stress-free temperature of 125°C differ

significantly from the displacements measured by the moire analysis of the LHF16K27.

Conipare RX-8 19C and CX-552, table 8.7.1 (a-c).

Dr. Qu and Pacific Consultants also ran a finite element model with a stress-free

temperature of 7OoC, for the purpose of comparing with the Sharp CSPs used in the moire

analysis, which had been assembled onto PCBs just a few days before the moire

measurements were made. Tr. 384:l-17 (Qu); Tr. 448:25-449: 10 (Qu).

619.

620.

621.

622.

623.

226

624. The results from running a finite element model with a stress-free temperature of 70°C

compared more closely with some moire measurements made on the recently-assembled

CSPs than the results from using a 25°C stress-free temperature. Tr. 384:l-17 (Qu).

625. Some of the recently-assembled CSP samples had a stress-free temperature closer to 70°C

than to 25°C. Tr. 384:l-17 (Qu).

626. However, 70°C is not a suitable stress-free temperature for simulating the behavior of

Sharp's CSPs in the field, since Sharp's CSPs will typically be assembled onto PCBs for

consumer products and then stored for long enough for the stress to relax more, lowering

the stress-free temperature. Tr. 384: 18-385:2 (Qu).

627. Overall, the results of the comparison of the moire measurements and the finite element

models were good. Tr. 410:9-25 (Qu).

Dr. Qu analyzed moire measurements for three samples of the LHF80BZE (double-layer).

Tr. 423: 16-424:4 (Qu); CX-552, figure 8.7.6 (a-c).

For the first sample of the LHF80BZE, when the chip was heated from room temperature

628.

629.

(approximately 25°C) to 75°C' the displacement between the chip contact (point C) and

the terminal (point A) was .42 microns in the horizontal direction and -. 17 microns in the

vertical direction, for a total of .45 microns. Tr. 424:5-18; CX-552, Table 8.7.3(a).

For the first sample of the LHF80BZE, when the chip was heated from room temperature 630.

(approximately 25°C) to 1 OO"C, the displacement between the chip contact and the

terminal was 1.04 microns in the horizontal direction and -.42 microns in the vertical

direction, for a total of 1.12 microns. Tr. 424:5-18; CX-552, Table 8.7.3(a)

63 1. For the first sample of the LHF80BZE' when the chip was heated from room temperature

227

(approximately 25°C) to 125"C, the displacement between the chip contact and the

terminal was 1.67 microns in the horizontal direction and -1.04 microns in the vertical

direction, for a total of 1.97 microns. Tr. 424:5-18; CX-552, Table 8.7.3(a).

For the second sample of the LHF80BZE, when the chip was heated from room

temperature (approximately 25°C) to 75"C, the displacement between the chip contact

and the terminal was .33 microns in the horizontal direction and .42 microns in the vertical

direction, for a total of .53 microns. Tr. 424:5-18; CX-552, Table 8.7.3(b).

For the second sample of the LHF80BZE, when the chip was heated from room

temperature (approximately 25°C) to 1 OO'C, the displacement between the chip contact

and the terminal was 1.46 microns in the horizontal direction and 1.04 microns in the

vertical direction, for a total of 1.79 microns. Tr. 424:5-18; CX-552, Table 8.7.3(b).

For the second sample of the LHF80BZE, when the chip was heated from room

temperature (approximately 25°C) to 125"C, the displacement between the chip contact

and the terminal was 1.25 microns in the horizontal direction and I .67 microns in the

vertical direction, for a total of 2.09 microns. Tr. 424:5-18; CX-552, Table 8.7.3(b).

For the third sample of the LHF80BZE, when the chip was heated from room temperature

(approximately 25°C) to 75"C, the displacement between the chip contact and the terminal

was .21 microns in the horizontal direction and .63 microns in the vertical direction, for a

total of .66 microns. Tr. 424:5-18; CX-552, Table 8.7.3(c).

For the third sample of the LHF80BZE, when the chip was heated from room temperature

(approximately 25°C) to 100°C, the displacement between the chip contact and the

terminal was .42 microns in the horizontal direction and 1.04 microns in the vertical

228

632.

633.

634.

635.

636.

direction, for a total of 1.12 microns. Tr. 424:5-18; CX-552, Table 8.7.3(c).

For the third sample of the LHF80BZE, when the chip was heated from room temperature 637.

(approximately 25°C) to 125"C, the displacement between the chip contact and the

terminal was 1.25 microns in the horizontal direction and 1.67 microns in the vertical

direction, for a total of 2.09 microns. Tr. 424:5-18; CX-552, Table 8.7.3(c)

638. The following table, from CX-552, summarizes the moire measurements for the

LHF80BZE:

Table 8.7.3(a) Measured displacements between points A and C at various temperatures for sample #1 of the double layer LHF80BZE.

Temp. Disp. Between A and C (pm)

U 17 total 25 0.00 0.00 0.00 75 0.42 -0.17 0.45 100 1.04 -0.42 1.12 125 1.67 -1.04 1.97

Table 8.7.3(b) Measured displacements between points A and C at various temperatures

for sample #2 of the double layer LHF80BZE.

229

Temp. Disp. Between A and C (urn)

u 1’ total 25 0.00 0.00 0.00 75 0.33 0.42 0.53 100 1.46 1.04 1.79 125 1.25 1.67 2.09

Table 8.7.3(c) Measured displacements between points A and C‘ at various temperatures

for sample #3 of the double layer LHF80BZE.

Temp. Disp. between A and C (um)

U 1’ total 25 0.00 0.00 0.00 75 0.21 0.63 0.66 100 0.42 1.04 1.12 I25 1.25 1.67 2.09

639. Dr. Qu analyzed moire measurements for three samples of the LHF16K27. Tr. 425:7-15

(Qu); CX-552, figures 8.7.4(a-c).

640. For the first sample of the LHF16K27, when the chip was heated from room temperature

(approximately 25°C) to 75”C, the displacement between the chip contact (point C) and

the terminal (point A) was .04 microns in the horizontal direction and -.OS microns in the

vertical direction, for a total of .09 microns. Tr. 425:7-15; CX-552, table 8.7.l(a).

641. For the first sample of the LHF16K27, when the chip was heated from room temperature

23 0

(approximately 25°C) to lOO"C, the displacement between the chip contact and the

terminal was ,13 microns in the horizontal direction and -.42 microns in the vertical

direction, for a total of .44 microns. Tr. 425:7-15; CX-552, table 8.7.l(a).

For the first sample of the LHF16K27, when the chip was heated from room temperature

(approximately 25°C) to 125"C, the displacement between the chip contact and the

terminal was .42 microns in the horizontal direction and -.83 microns in the vertical

direction, for a total of .93 microns. Tr. 425:7-I 5; CX-552, table 8.7.1(a).

For the second sample of the LHF16K27, when the chip was heated from room

temperature (approximately 25°C) to 75"C, the displacement between the chip contact and

the terminal was .08 microns in the horizontal direction and - . 17 microns in the vertical

direction, for a total of . I9 microns. Tr. 425:7-15; CX-552, table 8.7.l(b).

For the second sample of the LHF16K27, when the chip was heated from room

temperature (approximately 25°C) to 1 OO'C, the displacement between the chip contact

and the terminal was .25 microns in the horizontal direction and -1.25 microns in the

642.

643.

644.

vertical direction, for a total of 1.28 microns. Tr. 425:7-15; CX-552, table 8.7.1(b).

For the second sample of the LHF16K27, when the chip was heated from room

temperature (approximately 25°C) to 125"C, the displacement between the chip contact

and the terminal was .83 microns in the horizontal direction and -.63 microns in the

vertical direction, for a total of 1.04 microns. Tr. 425:7-15; CX-552, table 8.7.l(b).

For the third sample of the LHF16K27, when the chip was heated from room temperature

(approximately 25°C) to 75"C, the displacement between the chip contact and the terminal

was .17 microns in the horizontal direction and -.25 microns in the vertical direction, for a

645.

646.

23 1

total of .30 microns. Tr. 425:7-15; CX-552, table 8.7.l(c).

647. For the third sample of the LHF16K27, when the chip was heated from room temperature

(approximately 25°C) to 1 OOOC, the displacement between the chip contact and the

terminal was ,17 microns in the horizontal direction and -.42 microns in the vertical

direction, for a total of .45 microns. Tr. 425:7-15; CX-552, table 8.7.l(c).

648. For the third sample of the LHFl6K27, when the chip was heated from room temperature

(approximately 25°C) to 125OC, the displacement between the chip contact and the

terminal was .42 microns in the horizontal direction and -.96 microns in the vertical

direction, for a total of 1.05 microns. Tr. 425:7-15; CX-552, table 8.7.1(c).

649. The following table, from CX-552, summarizes the moire measurements for the

LHF 1 6K27:

Table 8.7. ](a) Measured displacements between points A and C at various temperatures for sample #1 of the LHF16K27.

Temp. Disp. Between A and C (pm)

("C)

U 1' total 25 0.00 0.00 0.00 75 0.04 -0.08 0.09 100 0.13 -0.42 0.44 125 0.42 -0.83 0.93

Table 8.7.l(b) Measured displacements between points A and C' at various temperatures

for sample #2 of the LHF16K27

232

Temp. Disp. between A and C (pm)

("C)

U 1' Total 25 0 0 0 75 0.08 -0.17 0.19 100 0.25 -1.25 1.28 125 0.83 -0.63 1.04

Table 8.7.1 (c) Measured displacements between points A and C at various temperatures

for sample #3 of the LHF 16K27

Temp. Disp. between A and C (pm)

U 1' Total 25 0 0 0 75 0.17 -0.25 0.30 100 0.17 -0.42 0.45 125 0.42 -0.96 1.05

650. Dr. Qu analyzed moire measurements for two samples of the LR38714. Tr. 425: 16-23

(Qu); CX-552, figure 8.7.5 (a-b)

65 1 . For the first sample of the LR38714, when the chip was heated from room temperature

(approximately 25") to 75"C, the displacement between the chip contact (point C) and the

terminal (point A) was .25 microns in the horizontal direction and -.42 microns in the

vertical direction, for a total of .49 microns. Tr. 425: 16-23 (Qu); CX-552, table 8.7.2(a).

652. For the first sample of the LR38714, when the chip was heated from room temperature

23 3

(approximately 25°C) to lOO"C, the displacement between the chip contact and the

terminal was .63 microns in the horizontal direction and -.83 microns in the vertical

direction, for a total of 1.04 microns. Tr. 425:16-23 (Qu); CX-552, table 8.7.2(a).

For the first sample of the LR38714, when the chip was heated from room temperature

(approximately 25°C) to 125"C, the displacement between the chip contact and the

653.

terminal was .83 microns in the horizontal direction and -.50 microns in the vertical

direction, for a total of .97 microns. Tr. 425: 16-23 (Qu); CX-552, table 8.7.2(a).

For the second sample of the LR38714, when the chip was heated from room temperature

(approximately 25°C) to 75"C, the displacement between the chip contact and the terminal

654.

was .25 microns in the horizontal direction and -.83 microns in the vertical direction, for a

total of .87 microns. Tr. 425: 16-23 (Qu); CX-552, table 8.7.2(b).

For the second sample of the LR38714, when the chip was heated from room temperature

(approximately 25°C) to 1 OOOC, the displacement between the chip contact and the

655.

terminal was .21 microns in the horizontal direction and -.63 microns in the vertical

direction, for a total of .66 microns. Tr. 425:16-23 (Qu); CX-552, table 8.7.2(b).

For the second sample of the LR38714, when the chip was heated from room temperature

(approximately 25°C) to 125"C, the displacement between the chip contact and the

656.

terminal was 1.04 microns in the horizontal direction and -1.67 microns in the vertical

direction, for a total of 1.97 microns. Tr. 425: 16-23 (Qu); CX-552, table 8.7.2(b).

657. The following table, from CX-552, summarizes the moire measurements for the LR38716:

Table 8.7.2(a) Measured displacements between points A and C' at various temperatures for sample #1 of the LR38714.

23 4

Temp. Disp. between A and C (urn)

(“C)

U v total 25 0.00 0.00 0.00 75 0.25 -0.42 0.49 100 0.63 -0.83 1.04 125 0.83 -0.50 0.97

Table 8.7.2(b) Measured displacements between points A and C‘ at various temperatures

for sample #2 of the LR38714.

Temp. Disp. between A and C (pm)

U 1’ total 25 0.00 0.00 0.00 75 0.25 -0.83 0.87 100 0.21 -0.63 0.66 125 1.04 -1.67 1.97

658. Dr. Qu, Dr. Klopp and Mr. Buescher made moire measurements for additional Sharp

CSPs: LHF32K16, LHF80BZ2, and LRS1327. Tr. 425:24-426:4 (Qu); CX-166C.

659. The moire measurements for these additional Sharp CSPs show results similar to the

results obtained for the LHF80BZE, the LHF16K27, and the LR38714. Tr. 426: 18-22

(Qu); CX-166C.

660. The moire measurements accurately measured the movement between the chip and the

terminals in Sharp’s CSPs. Tr. 426:5-14 (Qu).

23 5

661.

662.

663,

664.

665.

666.

667.

668.

669.

670.

The moire measurements show terminal movement consistent with the finite element

analysis. Tr. 426:ll-17 (Qu).

Scanning electronic microscopy (SEM) measurements show that the terminals of the

LR38714 are movable with respect to the chip. Tr. 431:6-8 (Qu).

Scanning electronic microscopy is similar to moire, but measures movement over a

smaller area with higher resolution, Tr. 426:23-427: 12 (Qu).

SEM is used to make i17 s i l in measurements, by taking a picture of a sample at two

different temperatures and using software to track displacements on the surface of the

sample. Tr. 328:8-18 (Qu).

Dr. Qu is familiar with SEM measurements and has had a system for making SEM

measurements in his laboratory for three or four years. Tr. 428:4-10 (Qu).

Dr. Qu is experienced in reviewing SEM measurements made by others. Tr. 429: 1 1-1 4

(QUI.

Dr. Qu’s SEM equipment was broken at the time the measurements were made, so the

measurements were made by Dr. Richard Page, of Southwest Research Institute. Tr.

428: 11-20 (Qu).

Dr. Page is a well-known specialist in material analysis, failure analysis and fracture

mechanics. Tr. 428:21-429: 1 (Qu).

Dr. Qu determined, based on reviewing Dr. Page’s results and on his discussions with Dr.

Page, that Dr. Page performed the SEM measurement correctly. Tr. 429:2-14 (Qu).

To make an SEM measurement, a cross-sectioned sample must be prepared, similar to

moire, but without a grating. Tr. 426:23-427: 12 (Qu).

23 6

671.

672.

673,

674.

675,

676

677

678

a

To make the measurement, the SEM equipment is used to take high-resolution pictures of

the sample at two different temperatures. Tr. 426:23-427: 12 (Qu).

Software then analyzes the two pictures, tracking the movement of features on the sample

surface. Tr. 426:23-427: 12 (Qu).

The high-resolution SEM pictures show the die attach area, which is between points A and

B (the terminal and the point on the die just above the terminal.). Tr. 427:13-428:3 (Qu);

CX-553 at 1.

Dr. Page used a stereo viewer, specifically designed to look for cracks, to inspect a feature

in one SEM picture that resembles a crack, and determined that there were no cracks in the

sample. Tr. 429:lS-430:5 (Qu); CX-553 at 1.

Dr. Qu plotted the displacement results obtained by Dr. Page into contour plots. The

contour plots show vertical and horizontal displacements between point A and point B -

the terminal and the chip. Tr. 430: 12-43 1 :2 (Qu); CX-553 at 2, figures 9.1.2 and 9 1.3.

The displacements obtained from the SEM analysis, 0.63 microns in the horizontal

direction, and -1.2 microns in the vertical direction, are consistent with the displacements

calculated by the finite element models. Tr. 43 1:3-5 (Qu); CX-553 at 2.

Dr. Qu performed a detailed analysis of representative samples of Sharp CSPs identified

by Sharp as actual products in response to Interrogatory No. 1 . This sample was

comprised of twelve (approximately 'A) of the Sharp CSPs identified in interrogatory

responses. CX-484C, Attachment 1 ; Tr. 785:3-9 (Engelmaier); CX-2OC, attachment 1

(identifying several products as "technical samples" not actually produced)

The Sharp CSPs analyzed by Dr. Qu had characteristics - package size, die size, package

3'27

construction - similar to Sharp’s other CSPs. Sharp’s other CSPs therefore will have

movability and flexibility similar to the movability and flexibility shown by Dr. Qu’s

analysis. Tr. 43 1:9-25, 440: 12-21 (Qu).

679. For example, Dr. Qu analyzed the LHF16K27, which is a double-layer structure. CX-

545C (list of products analyzed); CX-2OC, Attachment 4 at 2 [

680. [

1.

1. CX-2OC, Attachment 4

[

I .

68 1 . The LHF16K27 is identical in structure to the LHFl6K11, the LHFl6K29 and the

LHFl6K52. CX-2OC, Attachment 1 (package size, die size, pitch and outer dimensions of

solder ball matrix are identical)

682. The solder ball pitch ofthe LHF16K27 is [ 3, which is the pitch for most of Sharp’s

CSPs. CX-2OC, Attachment 1 , col. 4 (listing solder ball pitch).

Among Sharp’s double-layer structure CSPs, with [

LH5 lBOJl, the LHF04C09, and the LHF80B 1 1. CX-545C (list of products analyzed);

CX-2OC, Attachment 1 (listing die sizes).

The die dimensions of the LHF16K27, the LH51BOJ1, the LHF04C09, and the LHF80Bll

range from [

Sharp’s CSPs. CX-20C, Attachment 1 (listing die sizes).

The package dimensions of the LHFl6K27, the LH5 lBOJ 1, the LHF04C09, and the

LHF80Bll range from [

683. 3, Dr. Qu also analyzed the

684.

3, which covers the range of die sizes for most of

685.

1, which covers the range of package sizes for most

23 8

686.

687.

688.

689.

690.

691.

692.

693.

694.

of Sharp’s CSPs. CX-2OC, Attachment 1 (listing die sizes).

Dr. Qu analyzed several stacked CSPs: the LRS1331, the LRS1327, the LRS1329 and the

LRS1342, nearly half of Sharp’s stacked CSPs. CX-545C; CX-2OC, Attachment 1 at 4

(listing CSP models with two die sizes, an upper and a lower, for stacked CSPs).

The LRS133 13 is identical to the LRS133 1. CX-581C, Attachment 1 (attached to Motion

No. 432-82 (EDIS No. 200105040034)).

The packages for Sharp’s stacked CSPs are all [ 1, and either [ I , or

[

The LRS 1327, which was analyzed, is [

analyzed, is [ 1. CX-20, Attachment 1 at 4.

The die dimensions for Sharp’s stacked CSPs range from [

LRS 1327, which was analyzed, has the smallest die dimension - [

3. CX-20, Attachment 1 at 4.

3, and the LRSl342, which was

3 The

] - and the

LRS 133 1, which was analyzed, has the largest die dimension - [ 1. cx-20 ,

Attachment 1 at 3.

Dr. Qu analyzed the single-layer and double-layer versions of the LHF8OBZE. CX-545C

(list of products analyzed); CX-2OC, Attachment 4 at 2, 3 (listing both double-layer

materials - [ ] - for the

LHF80BZE).

The package and die size for the LHF80BZE are typical of Sharp’s CSPs, and the pitch is

slightly smaller than most of Sharp’s CSPs. CX-20C’ Attachment 1 .

The LHF80BZE and the LHF16JZB are identical. CX-581C, Attachment 1 .

The LHF80BZA and the LHF80BZE are nearly identical. Tr. 638:4-21 (Qu); CX-2OC,

] - and single-layer material - [

23 9

Attachment 1.

Both the LHFSOBZE and the LHF80BZA come in both the single-layer and the double-

layer structure, CX-2OC, Attachment 4 at 2, 3 (listing both double-layer materials - [

695.

] - and single-layer material - [ ] - for the LHF80BZE and

LHF80BZA).

In addition, Dr. Qu analyzed the LR38714, which is a single-layer structure with a [

pitch. This structure is somewhat unique, since Sharp's only other [

the LR38708, with identical dimensions. CX-20, Attachment I at 5 .

The LR38714 is the only one of the CSPs used in Sharp's camcorders that Dr. Qu

analyzed, but the other camcorders in Sharp's CSPs have similar die and package

dimensions. CX-20, Attachment 1 at 5 (listing camcorder "sets for America using CSP");

CX-675C, Attachment 2.

The LHF80BZE, the LHF80BZA' the LR38714 and the LR38708 are the only CSPs Sharp

currently makes with the [

"Die Attach Paste ("Die Attach Film)," listing die attach film [

LHF80BZE, the LHF80BZA' the LR3 87 14 and the LR3 8708).

The CSPs analyzed by Dr. Qu thus include the LHF80BZE, which is nearly identical to

the LHF80BZA, and the LR38714, which is identical to the LR38708. CX-2OC,

Attachment 1 at 2 (listing dimensions for the LHF80BZE and the LHF80BZA), and at 5

(listing dimensions for the LR38714 and the LR38708).

All Sharp's CSPs will exhibit behavior similar to the movability and flexibility found in

the Sharp CSPs analyzed in detail by Dr. Qu, Tr. 785:3-19 (Engelmaier).

696. ]

3 pitch product is

697.

698.

1. CX-2OC, Attachment 4 (column labeled

] for only the

699.

700.

240

701.

702.

703.

704.

705,

706.

707.

708.

709.

Effective strain reduction, A&, is used in the Coffin-Manson equation to predict solder

joint fatigue life. Tr. 618:s-13 (Qu).

The reduction in effective strain that should be used in the Coffin-Manson equation is

reduction in plastic strain, not elastic strain. Tr. 497: 19-498:s (Qu).

However, the elastic strain is extremely small compared to the plastic strain. Tr. 498: 12-

19 (QUI.

The total effective strain reduction can therefore be used in the Coffin-Manson equation,

and the presence of elastic strain in the overall effective strain can be neglected. Tr.

497119-498:s (Qu).

Effective strain reduction, A&, can be obtained from a finite element model. Tr. 61 85-1 3

(QUI.

The relative displacement between the terminal (point A) and the point above it on the

chip (point B) provides the best prediction of movement between the terminal and the chip

for analyzing reliability. Tr. 632:24-633:9 (Qu); Tr. 1491: 11-19 (Pitarresi); CPX-I 62.

Shear strain reduction, A&, can be calculated by hand using the displacement between the

terminal (point A) and the point above it on the chip (point B). Tr. 349: 12-350: 18,

1870:13-1871:16 (Qu); CPX-502; CPX-29.

The values of the empirical constants C and p in the Coffin-Manson equation account for

factors such as solder joint creep and thermal plasticity. Tr. 472: 17-473: 1 (Qu); CPX-62.

Because the constants C and p in the Coffin-Manson equation account for solder joint

creep, there is no need to include solder joint creep in the finite element model. Tr.

472: 17-473: 1 (Qu).

24 1

710. Because the constants C and p in the Coffin-Manson equation account for viscoplasticity,

there is no need to include viscoplasticity in the finite element model. Tr. 471 :2-10 (Qu).

The correct values of the constants C and p can be determined by using or simulating a

thermal cycling test. Tr. 343:25-344: 14, 362: 12-15 (Qu); CPX-62.

The value of the constant p does not vary greatly, and is typically between 0.4 and 0.8. A

chapter in a technical handbook, written by Sharp’s expert, Dr. Charles, identifies this

range and states that the usual value for /3 is .6. Tr. 343:3-9, 362:16-25 (Qu); CPX-62;

CX-5 1 8 at 3.17 (chapter by Dr. Charles).

It is necessary to determine the correct values for the empirical constants, C and p, for a

given chip package to use the Coffin-Manson equation to accurately predict the cycles to

71 1 .

712.

7 13.

failure for that chip package. Tr. 360:24-361:25, 362: 12-15, 471 :21-472:5 (Qu); CPX-62.

It is not necessary to determine the exact values for the empirical constants, C and p, to

use the Coffin-Manson equation to determine the improvement in reliability between two

different chip packages. Tr. 362: 1-25 (Qu); CPX-62.

The Coffin-Manson equation can be used to determine the improvement in reliability

between two packages using nominal values for C and p, so long as the same values for C

and j3 are used for both packages. Tr. 467:25-468:17, 1877:12-1878:3 (Qu).

In order to use the Coffin-Manson equation to predict the cycles to failure accurately for a

given chip package, it is necessary to perform or simulate a complete thermal cycling test

and obtain the effective strain range over a hysteresis loop. This loop is shown in CPX-

503 at the far right. The effective strain over the hysteresis loop is labeled A&, Tr.

714.

71 5 .

71 6.

1874:11-1875:24 (Qu); CPX-503.

242

7 17. It is not necessary to perform or simulate a complete thermal cycling test to use the

Coffin-Manson equation to determine the improvement in reliability between two different

chip packages. It is only necessary to use the same measure of the amplitude of the strain

- for example, part of a cycle - for the two chip packages being compared. Tr. 1874: 1 1 -

18, 1875:25-1876:21 (Qu); CPX-503.

71 8. The strain measure used by Dr. Qu to compare Sharp’s CSPs with the rigid case is shown

in CPX-503, and labeled As, . This strain measure, and the measure for the complete

hysteresis loop, labeled A€, are very close. Tr. 1874: 1 1-1 876:3 (Qu).

The Coffin-Manson equation can be used to determine the improvement in reliability

between two packages using only a portion of a thermal cycle, for example a change in

temperature from 25°C to 125OC, so long as the same portion of a thermal cycle is used for

both packages. Tr. 1874: 11-1876:21 (Qu); CPX-503.

It is not necessary to consider the dwell times used during thermal cycling to use the

Coffin-Manson equation to determine the improvement in reliability between two different

chip packages. Tr. 469:4-470: 13 (Qu).

The purpose of Dr. Qu’s Coffin-Manson analysis was to determine whether the movable

terminals in Sharp’s CSPs significantly improve reliability. Tr. 467:25-468:22, 473 :24-

7 19.

720.

721.

474:8, 499:l-lO (Qu).

722. Dr. Qu used nominal values for C and fi in the Coffin-Manson equation to compare the

reliability of Sharp’s CSPs, with movable terminals, to the baseline case of an ideally-rigid

CSP package with no terminal movement. If Dr. Qu had used the actual values for C and

fl, it would not have changed his calculations of improvement in the reliability of Sharp’s

243

CSPs significantly. Tr. 360:24-362:25 (Qu); CPX-64.

Dr. Qu used a portion of a thermal cycle - the change in temperature from 25°C to 125°C -

to compare the reliability of Sharp's CSPs, with movable terminals, to the baseline case of

an ideally-rigid CSP package with no terminal movement. Dr. Qu's use of the strain

amplitude over a portion of a thermal cycle, instead of a complete cycle or a hysteresis

loop, does not impact his comparison of Sharp's CSPs with a rigid CSP. Tr. 464:21-

465:4, 1874:ll-1876:21 (Qu); CPX-503.

Dr. Qu used the Coffin-Manson equation to compare the reliability for Sharp's CSPs to

the reliability of a CSP with the same dimensions and an ideally-rigid die attach. Tr.

723.

724.

1862: 12-1 863 :2 (Qu); CX-56OC.

725. It is appropriate to compare improvement due to movable terminals to an ideally-rigid

CSP (especially when no rigid prior art package exists for comparison). Tr. 486:9-25,

505:21-506:10 (Qu),

726. A model of a CSP with a die attach as rigid as silicon - the "worst-case scenario" of a

package with no terminal movement - is essentially a "flip-chip" direct chip attach

assembly. Tr. 1887:22-1888:21(Qu); CX-56OC.

A realistic rigid CSP, with the same configuration as CPX-162, and terminals that are not

movable, can be built using very rigid materials. Tr. 1074: 18-1075:6 (Engelmaier); CPX-

162.

The strains in the solder joints for "flip-chip" or "ideally rigid" assemblies are comparable,

but not identical, to the strains in the solder joints of a realistic rigid CSP. Tr. 1907:21-

1909:s (Qu).

727.

728.

244

729. The incidental terminal movement, caused by internal differential thermal expansion, in a

realizable rigid CSP is negligible, because the strains in a realizable rigid CSP are "very

close" to the strains in a flip chip with no movement. Tr. 1908: 18-24 (Qu).

"In flip-chip bonding, contacts on the front surface of the chip are provided with bumps of

solder. The substrate has contact pads arranged in an array corresponding to the array of

contacts on the chip. The chip, with the solder bumps, is inverted so that its front surface

faces toward the top surface of the substrate, with each contact and solder bump on the

chip being positioned on the appropriate contact pad of the substrate. The assembly is

then heated so as to liquify the solder and bond each contact on the chip to the confronting

contact pad of the substrate. Because the flip-chip arrangement does not require leads

arranged in a fan-out pattern it provides a compact assembly. The area of the substrate

occupied by the contact pads is approximately the same size as the chip itself. Moreover,

the flip-chip bonding approach is not limited to contacts on the periphery of the chip.

Rather, the contacts on the chip may be arranged in a so-called "area array" covering

substantially the entire front face of the chip. Flip-chip bonding therefore is well suited to

use with chips having large numbers of I/O contacts. However, assemblies made by flip-

chip bonding are quite susceptible to thermal stresses. The solder interconnections are

relatively inflexible, and may be subjected to very high stress upon differential expansion

ofthe chip and substrate." CX-1 at 3:13-35.

A "flip-chip" is a bare chip that is attached to a PCB through solder bumps. Tr. 1888: 13-

1889:s (Qu).

The '326 Patent identified "flip-chips" as compact prior art assemblies with unreliable

245

730.

73 1 .

732.

solder joints. Thus, an objective of the '326 Patent was to approach the compact size of

"flip-chips" without having solder joint problems. CX-2 at 3: 12-37.

Dr. Pitarresi never modeled an actual Sharp single layer product, even though he admitted

at his initial deposition in this investigation that he believed the single layer products

would exhibit more movement than the double layer products. Tr. 1404:8- 10, 1493 :4- 13

(Pitarresi).

Dr. Pitarresi did not testify regarding any specific prior art. There is no evidence that

Dr. Pitarresi reviewed any specific prior art. Dr. Pitarresi was not offered to test@

regarding prior art. See Tr. 1349:21 - Tr. 1449:12 (Dr. Pitarresi's direct testimony shows

no evidence that he reviewed any specific prior art references outside the file history).

According to Dr. Pitarresi's FEA results, Sharp's single-layer CSP has higher solder joint

stress than Dr. Pitarresi's "rigid" baseline package, which, as an upper "boundary" for

comparisons, should have the highest stress level. Tr. 1404: 13-20 (Pitarresi). Thus, Dr.

Pitarresi's models, his "rigid" baseline, or both are of questionable validity. Id. RX-833,

According to Dr. Pitarresi's FEA results in RX-833, Dr. Pitarresi's "rigid" baseline

package is more compliant than Sharp's single-layer CSP. This is a nonsensical result,

which suggests that Dr. Pitarresi's models, his "rigid" baseline, or both are invalid. Tr.

1404:2-20 (Pitarresi); RX-833,

Dr. Pitarresi's moire image, shown at RX-83 lC, page 4, has fringes that are far less sharp

and distinct then the fringes shown in Dr. Qu's equivalent image in CX-554C, figure 8.5.1

(raw, non-phase-wrapped image).

Dr. Klopp's background, experience, and the quality of his work demonstrate his ability to

733.

734.

735.

736.

737.

738.

246

oversee the sample preparation process. Tr. 419:4-RT 420:21.

Dr. Klopp attempted to obtain an image at 135"C, instead of 125"C, and the grating failed.

This failure at the higher temperature of 135"C, with no such failures at 125"C,

demonstrates that testing up to 125°C does not pose problems for the grating. It also

demonstrates, as Dr. Qu testified, that an epoxy failure merely means that the grating

detaches and the fringe pattern cannot be seen. Tr. 1878: 10-1879:2.

Experimental measurements, such as moire measurements, are not always 100% accurate.

Errors will sometimes occur, giving results that are physically impossible. It is for

precisely this reason that "you want to do multiple samples" and a repeatability study. Tr.

739

740.

602122-60312 (Qu).

741. Dr. Qu provided 48 moire measurements for Sharp CSPs. CX 166C. He also provided

moire images with similar fringe patterns, from which 60 similar measurements could be

calculated by counting the fringes. CX-552, Tr. 602:22-603: 19 (Qu); CX-I 66C.

Out of the nearly fifty moire measurements of Sharp's CSPs reported by Dr. Qu, four did

not make physical sense. Tr. 6OO:lO-602:8 (Qu).

Because moire measurements are experimental measurements, there will be statistical

errors. Thus, having four incorrect measurements out of nearly fifty does not invalidate

the measurements as a whole. Tr. 602:22-603: 19.

The stress-free temperature used in the finite element models should correspond to the

stress-free temperature of Sharp CSPs in the field. Tr. 459:21-460:7 (Qu).

If the movement facilitated by the die attach layer was "normal thermal expansion," the

die attach would be expanded, not squished, when the temperature is increased. Tr.

247

742.

743,

744

745.

477117-47813 (Qu).

746 Dr. Pitarresi, Sharp expert, testified that "quarter symmetry" means that "a quarter of the

package with the appropriate boundary conditions can give you the same results as

modeling the entire package. . , It's a full three-dimensional model." Tr. 1397: 19-1398:9

(Pitarresi).

Dr. Pitarresi built only one-quarter package finite element model. Tr. 1397:22-1398:9

(Pitarresi); RX-83OC.

Dr. Qu's two 3D finite element models were also one-quarter package models. Tr. 380:8-

13 (Qu); CX-546, Figure 7.2.9.

There is no dispute that a 3D model of a quarter of a package is "a full three-dimensional

model." See Tr. 1397-1 9-25 (Pitarresi).

A 2D model is not an "approximation of an approximation." A two dimensional model

can give results just as good as or better than a three-dimensional model. Tr. 549.23-

550: 14 (Qu).

If solder ball material has a higher modulus of elasticity than another solder ball material

at room temperature, this does not mean that the solder ball modulus of elasticity is higher

at any other temperature. Tr. 525:6-11, 521 :12-17 (Qu).

If the modulus of elasticity of a solder ball material, used in a FEM, is incorrect at the

stress-free temperature, but the correct value is used at other temperatures, the incorrect

value at the stress-free temperature will not impact the results of the FEM. This is because

the stress-free temperature is the starting point, and no displacement occurs at the stress-

free temperature. Tr. 524: 15-5 (Qu).

747.

748.

749.

750.

75 1 ,

752.

248

753. "Near-eutectic" solder is eutectic solder - it simply has some other elements added. Tr.

51711 1-16 (Qu).

754. A modulus that differs at room temperature - the stress-free temperature - does not impact

the finite element results at all. Tr. 524: 15-525:5 (Qu).

Sharp informed the Court, during the hearing, that the values for modulus of elasticity for

its solder balls are unknown, other than the value at room temperature. Tr. 521 :4-10,

755.

524: 15-52515 (Qu).

756. There is no evidence of the values of the modulus of elasticity for Sharp's solder balls for

temperatures other than room temperature. Tr. 521 :4-10.

A modulus that is 10% higher than the actual modulus at room temperature only does not

impact the results, since room temperature is the stress free temperature, and "25 degrees

is where we started. There's nothing happening there yet." That is, there is no

displacement at the stress-free temperature, so an incorrect modulus does not change the

results. Tr. 524:15-525:5 (Qu).

Upon reviewing the SEM images, prior to discussing them with Dr. Page, Dr. Qu observed

the features in the SEM images and was of the opinion that none of them was a crack.

Dr. Qu discussed the features with Dr. Page and determined that there was no crack in the

images. Tr. 429: 15-430: 1 1.

The case discussed in Dr. Qu's opening expert report, at pages 7-9, was merely an

illustrative example. In Dr. Qu's example, he assumed nominal values for CTE and the

dimensions of Sharp chips, and ignored vertical movement for simplicity. Tr. 491 : 18-

757.

758.

759.

492:8, 493:22-494:13, 35115-12 (Qu); CPX 29, CPX 24.

249

760.

761.

762.

763,

764.

765,

766.

767.

Dr. Qu used the actual values for CTE and for Sharp dimensions in the calculations he

made in his rebuttal report. Tr. 491 : 18-4923 (Qu)

In an illustrative example, Dr. Qu used 3 millimeters to represent the distance from the

neutral axis to the outer solder ball. Tr. 493:22-494:13 (Qu).

Dr. Qu testified during his direct testimony in Tessera's case-in-chief that the strain in

Sharp CSPs is reduced, based on the finite element models, by an amount that is

equivalent to 1-2 microns of movement. He testified that he determined this by reviewing

strain data from the finite element models. Dr. Qu confirmed this during his cross-

examination in Tessera's case-in-chief. See, e.g., Tr. 444: 18-445: 11, 539: 19-540:5 (Qu).

Using an illustrative, example with horizontal movement, Dr. Qu explained that 1-2

microns of terminal movement would increase reliability by a factor of two or three. Tr.

35413-35515 (Qu); CPX-28.

Point B is directly above Point A, and therefore at the same distance from the neutral axis.

CPX- 1 62.

Dr. Qu stated that for specific examples of Sharp-type CSPs, movement of the terminals

with respect to the dies of I micron would increase reliability on the order of 80%, which

he considered a significant improvement. Dr. Qu did not test@ that 1 micron, without

any context, is a threshold for "significant" movement. Tr. 442: 14-443:9 (Qu); CPX-48.

Solder joint strain due to thermal mismatch occurs during both heating and cooling. Tr.

333 13-33414 (Qu), CPX- 16 1 ,

During cooling, solder joints are stretched by warpage, instead of compressed, as shown in

CX 500, solderjoint A. Tr. 1853:2-11, 1853:22-1854:7 (Qu).

250

768. Dr. Qu accounted for creep through his application of the Coffin-Manson equation to the

finite element modeling results. Tr. 360:24-362: 11, 1876:22-1878:3 (Qu).

The "OMPAC-type" CSP package, used by Dr. Pitarresi as a "rigid" package for the

purpose of comparison to Sharp's CSP, was not an actual prior art package. Tr. 1460: 19-

146 1 : 8 (Pitarresi).

The movable terminals in Sharp's CSPs increase reliability by as much as a factor of three

or four, as compared to the solder joint strains in a rigid CSP. Tr. 445: 12-446: 16 (Qu);

CPX-48; Tr. 492:2-8 (Qu).

A decrease of 30% to 50% in the effective strain in the solder joints of a typical Sharp

CSP is equivalent to decreasing shear strain by allowing 1 to 2 microns of horizontal

movement. Tr. 444:18-445:5 (Qu); CPX-48; Tr. 1893:22-1894:21; 539:19-540:5 (Qu); Tr.

577:21-578: 18 (Qu).

The finite element models of Sharp's CSPs showed that the movable terminals in Sharp's

CSPs reduced the strain by an amount equivalent to allowing 1 to 2 microns of horizontal

movement. Tr. 445:6-11 (Qu); CPX-48; Tr. 618:ll-619:lO (Qu).

The movable terminals in Sharp's CSPs reduce strain 35% to 60% for exemplary Sharp

CSPs, compared to a rigid CSP. Tr. 1862:12-1863:2, 1863:25-18 (Qu); CX-56OC.

According to the Coffin-Manson equation, if solder joint strain is reduced by one-third, or

about 33%, the solder joint fatigue life will approximately double. Tr. 346:22-348:8 (Qu);

769.

770.

771.

772.

773.

774.

CPX-64.

775. According to the Coffin-Manson equation, if solder joint strain is reduced by one-half, or

50%, the solder joint fatigue life will approximately triple. Tr. 346:22-348:8 (Qu), CPX-

25 1

64,

776. Movable terminals reduce strain in exemplary Sharp CSPs by more than 1/3 and therefore

increase the solder joint fatigue life by at least a factor of two, compared to an rigid CSP

See CX-56OC; CPX-64

777. Increasing the solder joint fatigue life by a factor of two is significant. Tr. 501 : 10-1 7

778. The improvement in reliability in Sharp’s CSPs due to movable terminals is significant if

Sharp’s CSPs are compared to a realizable rigid CSP package with some terminal

movement. Tr. 446: 17-23 (Qu).

779. The movable terminals in Sharp’s CSPs reduce the strain in the solder joints of the

LHFl6K27, as compared to a rigid CSP, by at least 35% at every temperature other than

the stress-free temperature of 25’C. Tr. 1862: 12-1 863:2, 1863:25-18 (Qu); CX-56OC

780. The following table, from CX-56OC, summarizes the effective strains, in percent strain, on

the solder joints at various temperatures for the LHF16K27 and an LHF16K27 with rigid

die attach:

Effective strains (%) on the solder joints at various temperatures for LHFl6K27

Temp. Comparison of Average Effective Strains

(“C) Rigid Die Attach Actual Die Attach Reduction

-40 0.579 10 0.35033 40% 0 0.22273 0.13485 3 9%

25 0.00000 0.00000 0% 75 0.44546 0.273 8 5 3 9% 100 0.66819 0.43126 3 5% 125 0.89092 0.5835 1 3 5%

252

781. The decrease in solder joint strain in the LHF16K27 of at least 35% increases the solder

joint fatigue life by approximately a factor of two. Tr. 346:22-348:8 (Qu), CPX-64

782. The movable terminals in Sharp’s CSPs reduce the strain in the solder joints of the

LR38714, as compared to a rigid CSP, by at least 55% at every temperature other than the

stress-free temperature of 25°C. Tr. 1862:12-1863:2, 1863:25-18 (Qu); CX-56OC.

783. The following table, from CX-S60C, summarizes the effective strains, in percent strain, on

the solder joints at various temperatures for the LR38714 and an LR38714 with rigid die

attach:

Effective strains (%) on the solder joints at various temperatures for LR3 87 14.

Temp. Comparison of Average Effective Strains

(“C) Rigid Die Attach Actual Die Attach Reduction

-40 1.36036 0.523 76 61% 0 0.5232 1 0.19929 62%

25 0.00000 0.00000 0% 75 1,04643 0.40606 61% 100 1,56964 0.63 25 5 60% 125 2.09286 0.9341 1 55%

784. The decrease in solder joint strain in the LR38714 of at least 55% increases the solder

joint fatigue life by approximately a factor of three. Tr. 346:22-348:8 (Qu), CPX-64

785. The movable terminals in Sharp’s CSPs reduce the strain in the solder joints of the

LHF80BZE (double layer), as compared to a rigid CSP, by at least 40% at every

temperature other than the stress-free temperature of 25°C. Tr. 1862: 12-1 863:2, 1863:25-

18 (Qu); CX-56OC.

253

786. The following table, from CX-560C' summarizes the effective strains, in percent strain, on

the solder joints at various temperatures for the LHF80BZE (double layer) and an

LHF80BZE with rigid die attach:

Effective strains (?A) on the solder joints at various temperatures for LLHF80BZE (double layer).

Temp. Comparison of Average Effective Strains

("C) Rigid Die Attach Actual Die Attach Reduction

-40 0.61076 0.34507 44% 0 0.23491 0.13061 44%

25 0.00000 0.00000 0% 75 0.46982 0.26748 43 % 100 0.70473 0.42226 40% 125 0.93964 0.56300 40%

787. The decrease in solder joint strain in the LHF80BZE (double layer) of at least 40%

increases the solder joint fatigue life by approximately a factor of two. Tr. 346:22-348:8

(Qu), CPX-64.

788. The movable terminals in Sharp's CSPs reduce the strain in the solder joints of the

LHFSOBZE (single layer), as compared to a rigid CSP, by at least 40% at every

temperature other than the stress-free temperature of 25°C. Tr. 1862: 12-1 863:2, 1863:23-

1864: 18 (Qu); CX-56OC.

254

789. The following table, from CX-560C’ summarizes the effective strains, in percent strain, on

the solder joints at various temperatures for the LHF80BZE (single layer) and an

LHF80BZE with rigid die attach:

Effective strains (?A) on the solder joints at various temperatures for LHF80BZE (single layer).

Temp Comparison of Average Effective Strains

(“C)

-40 0.6 1076 0.34334 44% 0 0.23491 0.13293 43%

25 0.00000 0.00000 0% 75 0.46982 0.25039 47% 100 0.70473 0.40665 42% 125 0.93 964 0.563 00 40%

Rigid Die Attach Actual Die Attach Reduction

790. At temperatures between 0°C and 1 OOOC, the movable terminals in the single-layer

LHF80BZE decrease strain more than the movable terminals in the double-layer

LHF80BZE. Tr. 1862: 12-1863:2, 1863:23-1864:18 (Qu); CX-56OC.

791. The decrease in solder joint strain in the LHF80BZE (single layer) of at least 40%

increases the solder joint fatigue life by approximately a factor of two. Tr. 346:22-348:8

(Qu), CPX-64.

792. Terminal movement in Sharp CSPs is facilitated by a flexible polyimide package substrate

and flexible leads that are adapted to deform in the completed assembly. The flexing of

the substrate and leads is shown in the animation outputs of the finite element models,

CPX-l44C, CPX-145C and CPX-146C. These animations are time-sequenced frames

showing the deformation of Sharp’s CSPs, and the components in Sharp’s CSPs, as

25 5

temperature changes. Tr. 432: 1-8 (Qu); CPX- 144C (time-modified output of finite

element model of the LHF16K27); Tr. 364:21-365:2 (Qu); CPX-146C (time-modified

output offinite element model ofLRS1331); Tr. 367:17-21 (Qu); Tr. 368:17-21 (Qu);

CPX- 145C (time-modified output of finite element model of LHF80BZE); CX- 167C

(raw output of finite element model of LRS 133 1, LHF 16K27, and LHF80BZE).

The finite element model of the two-dimensional cross-section of the LHFl6K27, in CPX-

144C, shows that the polyimide substrate, together with the trace leads on the substrate,

deform to accommodate movement of the solder terminal. Tr. 432: 1 - 12 (Qu); CPX- 144C.

The polyimide package substrate for the LHFl6K27, extracted from the three-dimensional

finite element model of the LHF16K27, is shown in CX-546, pages 1 1 and 12. The

substrate, as shown in the extract from the model, deforms both horizontally and vertically

as temperature changes. Tr. 432: 16-22 (Qu); CX-546 at 11-12 (polyimide layer for the

LHF 16K27 substrate).

The uneven contour lines in CX-546, pages 11 and 12, show that the deformation of the

polyimide substrate is non-uniform. Tr. 432: 16-433:22 (Qu); CX-546 at 11-12 (polyimide

layer for the LHF16K27 substrate).

The non-uniform deformation of the polyimide substrate shows the polyimide layer is

flexible and that its deformation is due to flexibility, and not merely to thermal expansion

of the polyimide. Tr. 432:16-433:22 (Qu); CX-546 at 11-12 (polyimide layer for the

16K27 substrate).

The polyimide substrate and the leads in Sharp’s other double-layer CSPs have flexibility

similar to polyimide substrate and leads in the LHFl6K27, which is a double-layer

793.

794.

795.

796.

797.

256

structure, because their structures are very similar and their materials are almost identical.

Tr. 440: 12-1 8 (Qu); Tr. 434: 18-25 (Qu) (the LHFl6K27 is a double-layer structure).

The finite element model of the two-dimensional cross-section of the single-layer version

of the LHF80BZE, in CPX-145C, shows that the polyimide substrate, together with the

trace leads on the substrate, deform to accommodate movement of the solder terminal. Tr

798.

437116-25 (Qu); CPX-145C.

799. The polyimide package substrate for the single-layer version of the LHF80BZE, extracted

from the three-dimensional finite element model of the single-layer LHF80BZE, is shown

in CX-546, pages 13 and 14. The substrate, as shown in the extract from the model,

deforms both horizontally and vertically as temperature changes. Tr. 438:8-25 (Qu); CX-

546, pages 13 and 14 (polyimide layer for the LHF80BZE, single layer).

The uneven contour lines in CX-546, pages 13 and 14, show that the deformation of the

polyimide substrate in the single-layer version of the LHF80BZE is non-uniform. Tr.

438: 10-25 (Qu); CX-546, pages 13 and 14 (polyimide layer for the LHF80BZE, single

layer).

The non-uniform deformation of the polyimide substrate in the single-layer version of the

LHF80BZE shows the polyimide layer is flexible and that its deformation is due to

flexibility, and not merely to thermal expansion of the polyimide. Tr. 438: 10-25 (Qu);

CX-546, pages 13 and 14 (polyimide layer for the LHF80BZE, single layer).

The trace leads attached to the polyimide substrate also deform with the substrate. Tr.

800.

801.

802.

439: 1-4 (Qu).

803. The finite element analysis shows that the bonding wires also deform in the completed

257

assembly. Tr. 438: 1-9 (Qu).

The polyimide substrate and the leads in Sharp’s other single-layer CSPs have flexibility

similar to the polyimide substrate and leads in the single-layer LHF80BZE, because their

structures are very similar and their materials are almost identical. Tr. 440: 19-22 (Qu).

The flexible sheetlike element and the flexible leads in Sharp’s CSPs retain flexibility and

are adapted to deform in the completed assembly because Sharp’s CSPs include a

compliant die attach structure. Animation outputs from Dr. Qu’s finite element models,

for example in CPX-I 46, show the die attach layer or layers being compressed to

accommodate movement of the terminals. Tr. 364: 11-365: 15, 367:22-368:2; 368: 10-1 5

(Qu); CPX-146 (time-modified output of finite element model of LRS 133 1); CPX- 145

(time-modified output of finite element model of single-layer LHF80BZE); CX- 167C (raw

output of finite element model of LRS133 1 and LHF80BZE).

The die attach structure - the die bond film - in the single-layer structure acts as a

compliant layer between the polyimide package substrate and the silicon die. Tr. 394: 1 1 -

395: 1 (Qu); CX-546, Figure 7.8.2.

The die bond film above the solder terminals compresses at increased temperatures,

demonstrating that its deformation is not simple thermal expansion. Tr. 394: 1 1-395: 1

(Qu); CX-546, Figure 7.8.2; Tr. 406: 13-407:2 (Qu); CX-546, Figure 7.8.6.

The compliant layer in the single-layer structure allows the polyimide package substrate

and trace leads to retain flexibility and deform to accommodate movement of the

terminals. Tr. 394:ll-395:l (Qu); CX-546, Figure 7.8.2; Tr. 406:13-407:2 (Qu); CX-546,

Figure 7.8.6.

804.

805.

806.

807.

808.

258

809. The die attach structure - the insulator and die attach paste - in the double-layer structure

acts as a compliant layer between polyimide package substrate and the silicon die. Tr.

398:5-399:l (Qu); CX-546, Figure 7.8.9; Tr. 404:2-16 (Qu); CX-546, Figure 7.8.3.

The compliant layer in the double-layer structure allows the polyimide package substrate

and trace leads to retain flexibility and deform to accommodate movement of the

terminals. Tr. 3985-399: 1 (Qu); CX-546, Figure 7.8.9; Tr. 404:2-16 (Qu); CX-546,

Figure 7.8.3.

Dr. Pitarresi's Sharp-type finite element models all showed displacement within the

package, even though they all used the Sharp encapsulant. See RX-833; Sharp's Post-

Hearing Brief at 23 (table, cases 3, 4, 6 and 7); Tr. 1493:24-1497:4 (Pitarresi).

Dr. Pitarresi admitted that his Sharp CSP finite element models all give widely varying

displacements. This displacement varies depending on whether the CSP model uses

Sharp's single layer die attach, double layer die attach, or a hypothetical "rigid" or

"compliant" die attach. See RX-833; Sharp's Post-Hearing Brief at 23 (table, cases 3, 4, 6

and 7); Tr. 1493 :24-1497:4 (Pitarresi).

The top surface of the die attach materials that are in contact with the chip expands and

contracts with the chip. CX 546 at 1, top of paste for LI-IF16K27, Tr. 434: 17-435:2,

435:9-21 (Qu).

In a monolithic block held together by rigid epoxy, changing an internal die attach or

insulator layer would not impact the mechanical behavior of the package. Tr. 1362: 18-24

(Pitarresi) (description of rigid block structure); RX-50 (Chart showing that changes in

internal die attach or insulator layer do affect behavior.).

8 10.

8 1 1.

8 12.

813.

814.

259

8 15. According to Dr. Pitarresi's finite element models of a "compliant" package, which

Dr. Pitarresi testified was built in accordance with his understanding of the teachings of

the patent (RT 1405:3-8), a "compliant" package has stress in the solder balls of about

1,200 psi. This is about 2/3 of the stress in Dr. Pitarresi's hypothetical "rigid" package.

CX-833 (Dr. Pitarresi's test results).

Dr. Qu was able to determine the cause of the relative movement in Sharp CSPs by

reviewing the deformation shown in contour plots and animations output by the finite

element models. Tr. 476:5-12 (Qu); CPX-146; Tr. 364: 15-36535 (Qu) (describing the

frame-by-frame FEM output, showing the mechanisms for retaining flexibility and

facilitating terminal movement).

The CTE of the encapsulant that Sharp uses for its CSPs is greater than the CTE of the die

attach. Thus, at elevated temperatures, the encapsulant expands at a faster rate than the die

attach. CX-20.

Mr. Kada testified that [

81 6.

8 17.

8 18. ] was an improvement that could not be used

on all chip packages. Tr. 1171 :2-3, 1172: 17-21 (Kada).

The rigidity of the blocks of material of encapsulant and polyimide presented by Mr. Kada

in his testimony is not representative of the rigidity of the materials used in Sharp's CSP

packages, inasmuch as the increased thickness of the samples prepared by Mr. Kada result

in an increased rigidity on the order of 10,000 times the rigidity of the corresponding

materials in Sharp's CSP packages. Tr. 1305:25-13 10:04 (Kada).

819.

260

820.

821.

822.

823,

824.

825.

826.

827.

The Movability Analysis of Sharp Expert Dr. Pitarresi Is Unreliable and Incorrect

Dr. Pitarresi testified that his finite element analysis and moire analysis correlate within

15%, and that his results were therefore reliable. Tr. 1401 :5-21 (Pitarresi).

However, Dr. Pitarresi's comparison of a single moire measurement and a single finite

element result does not support his claim that the measurement or the finite element model

agree, or that his results are reliable. Tr. 1899:2-19OO:l (Qu).

Dr. Pitarresi's comparison of a single moire measurement and a single finite element result

"is not enough to say anything about [a] comparison" between the moire and the finite

element analysis. Tr. 1899:2-1900: 1 (Qu).

Sharp's expert, Dr. Pitarresi, suggested that Dr. Qu7s finite element models are inaccurate

because they do not include the effects of creep. Tr. 1424: 19-1425: 17 (Pitarresi).

Dr. Qu included the effects of creep in the Coffin-Manson analysis, in the constants C and

p, instead of in the finite element models. Tr. 472: 17-473: 1 (Qu).

Dr. Pitarresi could have duplicated the temperature conditions used in Dr. Qu's finite

element results for his own finite element analysis, but did not. Tr. 1489:4-I 490: 1

(Pitarresi); RX-833,

Dr. Pitarresi could have generated a data table similar to the ones provided in Dr. Qu7s

expert report to compare the results obtained from the finite element models of Dr.

Pitarresi and Dr. Qu, yet he did not. Tr. 1490:2:8 (Pitarresi); RX-833.

Dr. Pitarresi has no data permitting a one-to-one comparison between the results he would

have obtained in an FEA analysis, and the results obtained by Dr. QLL Tr. 1490:9-17

(Pitarresi).

26 1

828. Dr. Pitarresi has no data to identify the magnitude of any error or difference that may exist

between his finite element analysis approach, and Dr. Qu’s. Tr. 1490: 18-21 (Pitarresi).

If a convergence study is not performed for a finite element model, the model will not

include enough elements and the results of the model will be inaccurate. Tr. 1885: 19-

1886: 18 (Qu).

Dr. Pitarresi’s models included far fewer elements that Dr. Qu’s, as may be seen by

comparing CX-546 at Fig. 7.2.7 (an example of one of Dr. Qu’s 2D models) and RX-830C

at 2 (a 2D cross-section from Dr. Pitarresi’s model). Tr. 1882: 1-21 (Qu); CX-546 at Fig.

7.2.7, Fig. 7.2.9; RX-83OC at 1-2.

Dr. Pitarresi did not perform a convergence study for the two models he built of Sharp’s

CSPs, and as a result he did not use enough elements to ensure accurate results. Tr.

829.

830.

83 1.

I 885 : 14- 1 886: 1 8 (Qu).

832. Dr. Pitarresi’s model is very coarse, as a comparison of his model, RX-830C at 2, and Dr.

Qu’s converged model, CX-546 at Fig. 7.2.7, shows. For this reason, Dr. Pitarresi’s

results cannot be relied upon. Tr. 1904: 1-1 8, 1882: 1-1 6 (Qu); CX-546 at Fig. 7.2.7; RX-

830C at 2.

In addition to using too few elements, Dr. Pitarresi used elements that are the wrong

shape. The “aspect ratio” of elements in a finite element model - the ratio of the

dimensions of the element - should be close to one. That is, elements should be

approximately square, not long and thin. Dr. Pitarresi’s model has elements that are long

and thin, as shown in RX-83OC at 2. Consequently, Dr. Pitarresi’s model is unstable and

the results are not good. In contrast, Dr. Qu’s elements are essentially square, as shown in

833.

262

CX-546 at Fig. 7.2.7, and therefore have an aspect ratio close to one. See Tr. 1882: 17-

1883:9 (Qu).

Any previous experience Dr. Pitarresi may have in modeling Sharp’s CSPs cannot

substitute for performing a convergence study, and the number of elements he used was

not sufficient to provide accurate results. Tr. 1900:15-1901:1, 1901:8-11 (Qu).

Comparing results from two improperly-converged models is not valid - the errors in the

two models are random and do not simply cancel out. Tr. 1902:21-1903:15 (Qu).

Dr. Pitarresi’s models clearly have random errors in them, because his results indicate that

a single-layer Sharp-type CSP has fewer cycles to failure - that is, it is less reliable - than

a double-layer CSP. This contradicts, not only Dr. Qu’s results, but Sharp’s own thermal

cyclinz test results, as shown in CX-49 at page 14. Sharp’s test results, in CX-49 at page

14, show that a single-layer CSP using DF-400 is more reliable than Sharp’s double-layer

CSP. Tr. 1903:16-25 (Qu); Tr. 1292:5-1295:15 (Kada); CX-49 at TESS272785; CX-

538C.

Dr. Qu’s models were carefully formatted and properly converged, so that the results of

his finite element models are correct and accurately represent the behavior of Sharp’s

CSPs. Tr. 409:l-7 (Qu).

Dr. Pitarresi did not include the temperature variation of solder material properties in his

finite element model, but instead used the material properties provided by Sharp for 25OC,

specifically a modulus of elasticity of 29,33 1 megapascals at every temperature. Tr.

1471 : 16-1472:5 (Pitarresi).

The modulus of elasticity for solder decreases when temperature increases. Thus, the

263

834.

835.

836.

837.

838.

839.

840.

841.

842.

843.

844.

845.

846.

847.

848.

modulus of elasticity for solder that Dr. Pitarresi used in his finite element model was

higher than the correct value at every temperature above 25 C. Tr. 1472:6-10 (Pitarresi).

The response of solder during thermal cycling is not governed by creep deforination as

opposed to elastic modulus. Tr. 1876:22-1877: 11 (Qu).

It is not correct to ignore the temperature-dependence of modulus of elasticity of solder,

and simply "substitute" creep: creep and modulus of elasticity are simply different

characteristics. Tr. 1876:22-1877: 11 (Qu).

Dr. Qu performed moire analysis of six Sharp CSPs. CX-545C.

Dr. Pitarresi presented results for a single moire image of a single Sharp CSP. RX-83 1 C

at 4.

For each Sharp CSP analyzed, Dr. Qu obtained multiple moire images, and ensured that

the results of the moire analysis were repeatable. Tr. 417:19-418:3 (Qu).

A repeatability study ensures that the sample preparation process and the measurement

process were well-controlled - that is, that the samples were properly prepared, and that

the moire images were obtained properly. Tr. 41 7: 19-41 8:3 (Qu).

If moire measurements are not repeatable, that is, if there is no repeatability study, the

measurements cannot be relied upon to give accurate information. Tr. 4 17: 19-4 1 8 : 3,

1899: 12-1900: 1.

Dr. Pitarresi did not conduct a repeatability study, and his moire results are therefore

unreliable. Tr. 1899:2-18 (Qu).

Dr. Pitarresi's comparison of a single moire measurement and a single finite element result

says nothing about whether the measurement or the finite element model agree, or whether

264

849.

850.

851.

852.

853.

854.

855.

his results are reliable. Because Dr. Pitarresi did not conduct a repeatability study, and

compared his finite element results to a single moire measurement, his results are not

reliable. Tr. 1899:2-1900: 1 (Qu).

Dr. Pitarresi did not ensure that the Sharp CSP packages that he tested were mounted in

accordance with Sharp's CSP Mounting Technology Guidelines. Tr. 1479: 19-23

(Pitarresi); CX-5OC.

Dr. Qu analyzed displacement in a Sharp CSP, the LR38714, using SEM displacement

analysis. CX-545C.

The SEM displacement analysis demonstrates terminal movement that is consistent with

the results of the finite element analysis. Tr. 43 1 :3-8 (Qu).

In Dr. Pitarresi's own models, the Sharp CSPs experienced more than twice as much

displacement between the chip and the terminals than the "rigid" Sharp CSP with

"OMPAC-type" die attach substituted for Sharp's die attach. Tr. 1495:4-18 (Pitarresi);

Rx-833.

Dr. Pitarresi extracted the information about the "OMPAC-style" die attach from an article

published in November 1996. Tr. 1499: 19-22 (Pitarresi); CX-438.

The "OMPAC-type" CSP package, used by Dr. Pitarresi as a "rigid" package for the

purpose of comparison to Sharp's CSP, was not an actual prior art package. Tr. 1460:23-

146 1 : 8 (Pitarresi).

The November 1996 article describing an "OMPAC" identified the substrate of the

"OMPAC" as BT glass, with a modulus of 2.2 million psi. Tr. 1500:25-1501:6 (Pitarresi);

CX-43 8,

265

856. The OMPAC described in CX-212 used a BT resin package substrate, while the Sharp

CSP product used a polyimide substrate, with a modulus of elasticity about "4 the modulus

of BT resin at room temperature. Tr. 1459:21-1460:22 (Pitarresi); CX-212.

Dr. Pitarresi testified that a material such .as BT glass, with a modulus of 2.2 million psi,

has rigidity properties similar to concrete and will substantially resist deformation when a

load or force is applied. Tr. 1501: 1-17 (Pitarresi).

Dr. Pitarresi did not use BT glass for the substrate in his "rigid" CSP model, but instead

used the same (polyimide) substrate as Sharp uses in its CSPs. Tr. 1501 :7-9 (Pitarresi);

Tr. 1494:4-22 (Pitarresi); RX-833.

An article, relied on in Dr. Pitarresi's expert report to describe an "OMPAC," stated that

for a given substrate thickness, polyimide "tends to produce the lowest solder stresses" and

BT glass "tends to generate the highest solder stresses." Tr. 1502:25-1503: 19 (Pitarresi);

c x - 4 3 9,

Dr. Pitarresi could not identify any facts that would indicate that the results of his "rigid"

model would not have given higher solder joint stresses if he had used a BT glass substrate

instead of polyimide. Tr. 1504:3-20 (Pitarresi).

857.

858.

859.

860.

2. Sharp CSPs Include Every Element of the Asserted Claims of the '977 Patent; Contributory Infringement; Induced Infringement

861. Each of Sharp's CSPs includes a semiconductor chip with a plurality of surfaces and

contacts on the top surface. Tr. 849: 15-850:2 (Engelmaier); CPX- 1 OOC; CPX- 10 1 C; CX-

37 (Response to RFA Nos. 125, 126, 127, 137, 138).

266

862.

863.

864.

865.

866

867

868

869

870

Each of Sharp’s CSPs includes a sheetlike element, the polyimide package substrate. Tr.

850:3-10 (Engelmaier); CPX-1OOC; CPX-101C; CX-37 (Response to RFA No. 128).

The sheetlike element is flexible prior to assembly. Tr. 850:3-18 (Engelmaier); CPX-

1OOC; CPX-1OlC; CX-37 (Response to RFANo. 130).

The sheetlike element retains flexibility after assembly, as shown in the finite element

analysis. Tr. 850:3-18.

The flexible sheetlike element has terminals on it. Tr. 850: 19-85 1 : 1 (Engelmaier); CPX-

1OOC; CPX-101C; CX-37 (Response to RFA No. 134).

The leads in Sharp’s CSPs are the copper traces on the backing element, and the bonding

wires connecting the chip contacts to the copper traces. The leads connect the chip

contacts to the terminals, Tr. 851:2-14 (Engelmaier); CPX-1OOC; CPX-IOIC; CX-37

(Response to RFA No. 132, 135, 145, 147 and 148).

The bonding wires are flexible prior to assembly. 85 1 : 15-1 8 (Engelmaier); CPX-1 OOC;

CPX- 101 c.

The leads, consisting of copper traces and bonding wires, are flexible prior to assembly.

Tr. 85 1 :2- 18 and 85 1 : 17- 19 (Engelmaier); CPX- 1 OOC; CPX- 10 1 C.

The finite element analysis shows that the copper traces on the polyimide package

substrate retain flexibility after assembly. Tr. 8S3:3- 10 (Engelmaier).

In Sharp’s CSPs, the chip sits on top of the sheetlike element - the polyimide package

substrate - and is bonded to it by die attach material. The sheetlike element therefore

bears upon the chip, and overlies the chip. Tr. 851: 19-852:4 (Engelmaier); CPX-1OOC;

CPX- 101 c.

267

871. The terminals are underneath the chip. The terminals therefore overlie the chip. Tr.

851:19-852:4 (Engelmaier); CPX-1OOC; CPX-1OlC; CX-37 (Response to RFA No. 139)

(admitting that at least some of the terminals in Sharp CSPs are underneath the chip).

The terminals in Sharp’s CSPs are movable with respect to the contacts, as shown by Dr

Qu’s tests. Tr. 852:5-10 (Engelmaier).

The movable terminals in Sharp’s CSPs significantly increase the fatigue life, and

therefore the reliability, of the solder joints. Tr. 852: 11-18, Tr. 853: 1 1-23 (Engelmaier);

872.

873.

CPX-48C.

874. The flexible sheetlike element - the polyimide package substrate - flexes when the

temperatures changes to accommodate movement between the terminals and the chip

contacts. Tr. 852: 19-853: 10 (Engelmaier).

The portions of the leads on the polyimide package substrate - the flexible copper traces -

flex when temperature changes to accommodate movement between the terminals and the

chip contacts. This flexing is shown in, for example, the finite element output animation,

CPX-l46C, of the LRS1331, In CPX-l46C, the copper layer (which is combined with the

air layer) is shown as the blue layer just below the yellow insulator layer. Tr. 852: 19-

853:lO (Engelmaier); Tr. 363:5-365:2, 438:22-439:4 (Qu); CPX-145C.

The bonding wire portions of the leads deform when temperature changes, to

accommodate movement between the terminals and the chip contacts. Tr. 438: 1-9 (Qu);

Tr. 853:3-10 (Engelmaier).

The contacts on the chips in Sharp’s CSPs are on the front surface of the chip, which is the

top. Tr. 854:4-19 (Engelmaier); CPX-1OOC; CPX-101C; CX-37 (Response to RFA Nos.

875.

876.

877.

268

878.

879.

880.

881,

882.

883,

884.

885.

886.

13 7- 13 8).

In Sharp’s CSPs, the polyimide package substrate and at least some of the terminals on the

substrate are located underneath the chip. CPX-1 OOC; CPX- 10 1 C; CX-37 (Response to

RFANo. 139).

The sheetlike element and the terminals in Sharp’s CSPs thus overlie the rear surface, or

bottom, of the chip. Tr. 8 5 5 : 1-9 (Engelmaier); CPX-1OOC; CPX-101C.

The “substrate with contact pads thereon” in claim 22 refers to a printed circuit board

substrate, to which the solder balls on the semiconductor assembly are connected at the

contact pads. Tr. 855: 11-857:2 (Engelmaier); CPX-118C.

The contact pad is a connection on the printed circuit board, to which the solder balls on

the package can be connected. Tr. 856: 14-857:2.

In the solder reflow, the solder balls melt and form a metallurgical bond between the

solder balls and the (usually copper) contact pads. Tr. 857:s-858:2 (Engelmaier).

The solder balls on both Sharp’s single-layer CSP and Sharp’s double-layer CSP can be

connected to a contact pad on a printed circuit board using solder reflow. Tr. 8 5 5 : 1 1 -

857:7 (Engelmaier); CPX-118C.

Sharp’s CSPs are intended to be used by soldering them onto a printed circuit board. Tr.

858:4-9 (Engelmaier); CX-37 (Response to RFA No. 140).

When Sharp’s CSPs are soldered onto a printed circuit board, the polyimide package

substrate will be between the printed circuit board and the chip. CX-37 (Response to RFA

No. 141).

Sharp’s camcorder products contain Sharp CSPs soldered onto a printed circuit board. Tr.

269

858: 10-859:8 (Engelmaier); CX-484C, attachment 2 (Sharp’s Supplemental Response to

Interrogatory No. 1, Attachment 2, identifying camcorder products containing Sharp

CSPs).

887. Sharp distributes a mounting guide to its customers, instructing its customers on mounting

Sharp’s CSPs onto a printed circuit board for use in the customers’ products. Tr. 859:9-

20, 860:3-6 (Engelmaier); CX-5OC (Sharp CSP Mounting Technology Guidelines).

Sharp knows that its customers are going to mount Sharp CSPs onto printed circuit boards.

Tr. 859:9-20, 860:3-6 (Engelmaier); CX-SOC (Sharp CSP Mounting Technology

888.

Guidelines).

Sharp’s customers mount Sharp’s CSPs on printed circuit boards in their products. Tr

858: 19-24, 859:5-8, 859:21-860:2 (Engelmaier).

889.

3. Sharp CSPs Include Every Element of the Asserted Claims of the ‘326 Patent

890. Each of Sharp’s double-layer CSPs includes a semiconductor chip that has a plurality of

sides, oppositely-facing front and rear surfaces, edges extending between the front and rear

surfaces, and contacts on a peripheral region of the front surface. Tr. 84 1 : 12-

842: l(Enge1maier); CPX-1OOC; CX-37 (Response to RFA Nos. 125-127, 137-138, 142-

143).

Each of Sharp’s single-layer CSPs includes a semiconductor chip that has a plurality of 891.

sides, oppositely-facing front and rear surfaces, edges extending between the front and rear

surfaces, and contacts on a peripheral region of the front surface. Tr. 841 : 12-842: 1

270

(Engelmaier); CPX- 10 1 C; CX-37 (Response to RFA Nos. 125- 127, 137- 13 8, 142- 143)

Each of Sharp's double-layer CSPs includes a backing element - a polyimide package

substrate - with electrically conductive terminals and lead portions on the backing

element, with the lead portions connected to the terminals. Tr. 842: 1-9 (Engelmaier);

CPX-1OOC; CX-37 (Response to RFA Nos. 128, 134, 135, 144, 145).

Each of Sharp's single-layer CSPs includes a backing element - a polyimide package

substrate - with electrically conductive terminals and lead portions on the backing

element, with the lead portions connected to the terminals. Tr. 842: 1-9 (Engelmaier);

CPX-1OlC; CX-37 (Response to RFA Nos. 128, 134, 135, 144, 145).

In both the single-layer and the double-layer Sharp CSP structures, the backing element is

the polyimide package substrate. CPX-IOOC; CPX-101C; CX-37 (Response to RFA No.

128).

In both the single-layer and the double-layer Sharp CSP structures, the leads consist of the

bonding wires, from the chip contact to the substrate, and the copper traces on the

polyimide package substrate. The copper traces on the polyimide package substrate are

892.

893,

894.

895.

thus portions of the leads - the "lead portions," which are connected to terminals that are

above the solder balls. Tr. 1458:22-1459:6 (Pitarresi); CPX-1OOC; CPX-101C; CX-37

(Response to RFA Nos. 128, 132, 134, 135).

In both the single-layer and the double-layer Sharp CSP structures, the backing element -

the polyimide package substrate - overlies the rear surface of the chip. Tr. 842: 10-16

(Engelmaier); CPX- 1 OOC; CPX- 10 1 C; CX-3 7 (Response to RFA No. 13 9).

In both the single-layer and the double-layer Sharp CSP structures at least some terminals

896.

897.

27 1

898.

899.

900.

901,

902

903

904

905

are underneath the chip, and therefore overlie the rear surface of the chip. Tr. 842: 10- 16

(Engelmaier); CPX-I OOC; CPX-101C; CX-37 (Response to RFA No. 139).

Each single-layer and double-layer Sharp CSP includes bonding wires connected to

contacts on the front surface of the semiconductor chip. Tr. 842: 17-25 (Engelmaier);

CPX-1OOC; CPX-1OlC; CX-37 (Response to RFA No. 147).

The bonding wires in each Sharp CSP extend downwardly alongside the edges of the chip,

and connect to the copper traces, or "lead portions," on the polyimide backing element.

Tr. 842: 17-25 (Engelmaier); CPX- 1 OOC; CPX- 10 1 C; CX-37 (Response to RFA No. 148).

The terminals in each Sharp CSP are movable with respect to the chip. Tr. 843: 1-18

(Engelmaier).

The movable terminals significantly improve the solder joint reliability for Sharp's CSPs

Tr. 843:l-18 (Engelmaier).

The backing element - the polyimide package substrate - in Sharp's CSPs is flexible prior

to assembly. CX-37 (Response to RFA 149, 128 and 130).

The backing element retains flexibility in the completed assembly to facilitate terminal

movement. Tr. 845: 11-25 (Engelmaier).

The flexibility of the backing element - the polyimide package substrate - is shown by the

results of the finite element analysis for an exemplary single-layer structure, which shows

the backing element flexing. Tr. 845 : 1 1-846: 13 (Engelmaier); CPX- 145 (tiine-modified

results of finite element analysis for the LHF80BZE).

The flexibility of the backing element - the polyimide package substrate - is shown by the

results of the finite element analysis for an exemplary double-layer structure, which shows

1 71 LIL

the backing element flexing. Tr. 846: 14-847:2 (Engelmaier); CPX- 146 (time-modified

results of finite element analysis for the LHFl6K27).

The backing element - the polyimide package substrate - in each Sharp CSP has a top

surface and a bottom surface. Tr. 848:6- 16 (Engelmaier); CPX- 1 OOC; CPX-10 1 C; CX-37

(Response to RFA No. 15 1).

The backing element in each Sharp CSP has leads and terminals located on the top

surface. Tr. 848:6-22 (Engelmaier); CPX-IOOC; CPX-101 C; CX-37 (Response to RFA

No. 152, 153, 132, 134, 144).

The backing element - the polyimide package substrate - in each Sharp CSP includes

holes from the top to the bottom, with terminals exposed through the holes. Tr. 848.23-

849:s (Engelmaier); CPX-IOOC; CPX-101C; CX-37 (Response to RFA No. 155).

The holes are above the solder balls and below the terminals shown in CPX-I OOC and

CPX- 10 1 C, allowing the terminals on top of the polyimide package substrate to be

connected to the solder balls beneath the polyimide package substrate. Tr. 848:23-849: 8

(Engelmaier); CPX- 1 OOC; CPX-IO 1 C.

The solder balls on the underside of Sharp’s CSPs are bonding material. Tr. 848:23-

849: 14 (Engelmaier); CPX-1 OOC; CPX- 10 1 C.

The solder balls are attached to the terminals in Sharp’s CSPs through the holes in the

backing element. Tr. 848:23-849: 14 (Engelmaier); CPX-1OOC; CPX-IO1 C; CX-37

(Response to RFA No. 156).

906.

907.

908.

909.

910.

91 1 .

273

1v.

912.

913.

914.

915.

91 6.

917.

918.

VALIDITY

A.

No later than June 10, 1990, the inventors conceived of the inventions recited in the

asserted claims of the patents-in-suit. Tr. 107:7-108: 15, 113:4-114: 18 (Bottoms).

While at IST/Tessera, Drs. Khandros and DiStefano memorialized their technical ideas in

engineering notebooks, a practice they followed since their days at IBM. Each notebook

page was witnessed and dated. CX-329C (DiStefano Dep.) Tr. 41 :21-42:6; CX-328C

(Khandros Dep.) Tr. 54:s-55: 1 ,

Dr. Bottoms advised Drs. Khandros and DiStefano to carefblly document their engineering

ideas in a notebook and that each entry should be dated and reviewed and witnessed by

another person. Tr. 11O:l l -111:7, 1153-13, 157:lO-158:2 (Bottoms).

Dr. Bottoms made at least monthly visits and regular phone calls (one per week or more)

to IST's ofices in New York. Tr. 109:9-110:20 (Bottoms).

Each time Dr. Bottoms visited IST, Drs. DiStefano and Khandros drew their ideas on a

whiteboard and discussed them with Dr. Bottoms. Tr. 1 14:5-1 15:4 (Bottoms).

During his visits, Dr. Bottoms also reviewed the engineering notebooks of Drs. DiStefano

and Khandros. Tr. 110: 11-1 11:7 (Bottoms).

No later than June 10, 1990, Drs. DiStefano and Khandros conceived of a face-up and

face-down chip packages in which terminals are underneath the periphery of the

semiconductor chip. The mechanism for accomplishing this arrangement was a

"redistribution layer." Tr. 118: 15-1 19:22, 121 :20-122: 10 (Bottoms); CX-328C (Khandros

Dep.) Tr. 55:5-56: 19; CX-12C at TESS070649-50.

Conception and Diligent Reduction to Practice of the Claimed Invention

274

9 19. The purpose of the "redistribution layer" was to connect the contacts on the periphery of

the silicon chip to an area array of terminals underneath the silicon chip. Tr. 1 18: 15-

119:22, 121:20-122: 10, 126:17-127:12 (Bottoms); CX-328C (Khandros Dep.) Tr. 58.4-

59:8; CX-12C at TESS070649-50.

Semiconductor chips generally have relatively fine geometries: the chip contact pads are

relatively sinall and close together. In contrast, the printed circuit boards on which

semiconductor chips are mounted have relatively large geometries: the circuit board

contact pads are larger and more separated. The redistribution layer "opens up'' the fine

geometries of the semiconductor chips to relatively larger geometries of solder balls for

mounting on the circuit board. Tr. 118:15-119:22, 126:17-127:12 (Bottoms); CX-12C at

TES S070649.

The redistribution layer consists of the metal traces on the sheetlike element which,

together with the wire bonds, form composite leads. The combination of wire bonds and

the redistribution layer allow the chip contact pads (most often located around the

periphery of the top of the chip in a face-up embodiment) to be connected to the solder

balls that lie beneath the chip. Tr. 118:15-1 19:22, 121:13-122:10, 126:17-127:12, 186:21-

190:2 (Bottoms); CX-12C at TESS070649.

Solder balls are typically arranged in an array on the bottom of the package substrate, with

at least some solder balls located beneath the semiconductor chip Tr. 126: 17-127: 12,

186:21-190:2 (Bottoms); CX-12C at TESS070649.

The number of contact pads on a semiconductor chip corresponds to the number of solder

balls in the solder ball area array. If the number of solder balls required for any particular

920.

92 1.

922.

923.

275

semiconductor chip is small, the array might not be hlly populated with solder balls.

However, due to the differences in geometries of the semiconductor chip and the circuit

board, some solder balls still have to be redistributed beneath the chip. Tr. 188: 16-1 89:2 1

(Bottoms).

In the June 10, 1990 notebook entry, the figure (under heading 1, on the right-hand side) is

a face-up chip package. This is what Drs. DiStefano and Khandros were working on at the

time. The text relates to making packages that include a chip that rests directly on the

flexible package substrate. However, they were faced with the problem of voids in the

space between the chip and the package substrate. CX-329C (DiStefano Dep.) Tr. 408.4-

409: 12; CX-12C at TESS070657.

The figure in the June 10, 1990 notebook entry is a face-up package with terminals under

the die. Dr. DiStefano did not think it could be anything else. This is what the company

was about at that time. Dr. DiStefano testified: "The fact that there are no terminals under

the die and the fact there is no encapsulation around the wires i s simply because it is not a

finished package. The reason why solder balls are not illustrated in the June 10, 1990

notebook entry is because a chip i s not attached to a package substrate at the time solder

balls are present under the package substrate. Solder balls are not connected until after the

wires are encapsulated. If the solder balls were on at the part in the process depicted in the

figure, then the process would not work." Dr. DiStefano had absolutely no doubt that the

figure illustrates the step of attaching a chip to a package substrate. CX-329C (DiStefano

Dep) Tr. 410:15-411:7, 4 5:8-417:18; CX-12C at TESS070657.

The figure in the June 10, 990 notebook entry does not illustrate a chip attached to a heat

924.

925.

926.

276

sync because a heat sync would have a thickness and would have fins on it. CX-329C

(DiStefano Dep.) Tr. 415:15-18; CX-12C at TESS070657.

The June 10, 1990 notebook entry illustrates conception of a face-up chip package with

terminals under the die. Tr. 120:9-121:12, 124:18-125:25, 149:lO-150:19 (Bottoms); CX-

329C (DiStefano Dep.) Tr. 408:4-409:12, 410:15-411:7, 415:8-417:18; CX-12C at

TESS070657.

At his December 5 , 2000 deposition, Dr. DiStefano testified that this figure depicts a face-

up chip package. CX-329C (DiStefano Dep.) Tr. 408:4-409: 12, 41 5:8-417: 18; CX-12C at

927.

928.

TESS070657; CX-94C, 1 12.

929. Dr. Bottoms corroborated Dr. DiStefano’s sworn testimony that this drawing from the

June 10, 1990 entry of Dr. Khandros’ witnessed engineering notebook illustrates a face-up

chip package. Tr. 120:9-121:12, 124:18-125:21 (Bottoms), CX-12C at TESS070657.

The face-up and face-down configurations of the inventors’ ideas consisted of many of the

same elements. Tr. 126:17-127:12, 135:5-136:5 (Bottoms).

The inventors’ development work on many elements of their chip packages, such as the

interposer and redistribution layer, were applicable to both face-up and face-down

configurations. Tr. 126: 17-127: 12, 135:5-136:5, 160: 18-1 62: 1, 162: 1 1 - 16 (Bottoms); CX-

329C (DiStefano Dep.) Tr. 43 1 :6-10, 438: 16-24.

While IST Associates worked on face-down configurations for high-end customers, the

inventors’ simultaneous work on face-up packages progressed more smoothly. Tr.

107:18-108:15, 131.19-132:6, 135:5-136:5 (Bottoms); CX-329C (DiStefano Dep.) Tr.

930.

93 1 ,

932.

445 : 5-23,

277

933. In May or June 1990, Drs. Khandros and DiStefano conceived of a semiconductor

assembly comprising either a face-up or face-down semiconductor chip package that

compensated for the differential thermal expansion between the printed circuit board and

the silicon die. Tr. 107:18-108:15, 124:18-125:18 (Bottoms); CX-94C, 11 4, 5.

No later than June 10, 1990, Drs. DiStefano and Khandros conceived of using an 934.

interposer between the semiconductor chip and printed circuit board. Tr. 107: 16-1 08: 15,

113:4-114:4, 118:15-119:22, 126:9-127:19 (Bottoms); CX-329C (DiStefano Dep.) Tr.

404:21-405:4, 408:4-17; CX-94C, 77 5, 12.

935. The June 1, 1990 entry of Dr. Khandros' notebook describes flex materials ("polyimide,

ULTEM, teflon, etc.") that the inventors considered using for the sheetlike package

substrate material between the chip and the PCB. The package substrate had traces (or

lead portions) thereon. CX-328C (Khandros Dep.) Tr. 61 :23-62: 17; CX-12C at

TESS070653; CX-94C, 77 9-1 1 .

936. The package substrate that the inventors conceived had a redistribution layer. The

redistribution layer consists of the metal traces which, together with the wire bonds, form

composite leads. The combination of wire bonds and the redistribution layer allow the

chip contact pads (most often located around the periphery of the top of the chip in a face-

up embodiment) to be connected to the solder balls that lie beneath the chip. Tr. 1 18: 15-

1 19:22, 121 : 13-122: 10, 126: 17-127: 12, 186:21-190:2 (Bottoms); CX-12C at

TES S070649,

In the June 1, 1990 entry of his notebook, Dr. Khandros wrote that "[tlhe area array pads

on the chips [the contacts] are wirebonded with a standard process to the WB pads [the

937.

278

terminals] on the decal. The wires are then encapsulated with a silicone or epoxy

encapsulant. Appropriate metallurgy is applied to the bonding pads for subsequent

bonding to the substrate." CX-12C at TESS07065 1.

On the next page of his notebook, Dr. Khandros wrote that "the decal structure [the

interposer] [is] overlayed on top of the chip" and "[tlhe i/o pads on the chip [the contacts]

are connected with WB pads on the decal [the terminals] by way of ball or wedge

WIREBONDING." CX-12C at TESS070652.

Dr. Khandros also wrote in the June 1, 1990 entry of his notebook that "[tlhe chip is

decoupled from the substrate, and the thermal stresses simply buckle the wires of the

wirebond, without danger of failure ofjoints." CX-12C at TESS070653.

These entries document the inventors' ideas for electrically connecting the contacts [the

area array pads] on the chip through the terminals [pads on the decal] on the sheetlike

material [the decal] in a manner to accommodate differential thermal expansion. CX- 12C

at TESS07065 1-53 (Figure 3 at TESS070652 and figure on TESS070653), CX-94C, 1 9.

In May or June 1990, Drs. DiStefano and Khandros conceived of using either a flexible or

rigid package substrate between the chip and printed circuit board to accommodate

differential thermal expansion. The traces [or portions of leads] are on the package

substrate. CX-329C (DiStefano Dep.) Tr. 408:4-17; CX-94C, 11 5, 12.

In May or June 1990, the inventors conceived that the electrical connection between the

bonding pads [the contacts] on the chip to the bonding pads of the package substrate [the

terminals on the interposer] would accommodate the movement of the chip relative to the

package substrate associated with thermal differential expansion. Tr. 107: 16-108: 15,

279

938.

939.

940.

941,

942.

118:lS-119:22 (Bottoms).

The June 10, 1990 notebook entry illustrates bonding wires connecting the contacts of the

chip to lead portions on the package substrate. CX-329C (DiStefano Dep.) Tr. 408:4-

409:12, 410:15-411:7, 415:8-417:18; CX-12C at TESS070657; CX-94C, 1 12.

No later than June 10, 1990, the inventors conceived their idea of using an interposer to

accommodate the relative motion of the silicon die with respect to the printed circuit

board. Tr. 107:18-108:15, 113:4-114:4, 118:15-119:22 (Bottoms).

No later than June 10, 1990, the inventors conceived that the electrical connection between

the bonding pads [the contacts] on the chip to the bonding pads of the package substrate

[the terminals on the interposer] would accommodate the movement of the chip relative to

the package substrate associated with thermal differential expansion. Tr. 107: 16-1 08: 15,

1 1 8: 15-1 19:22 (Bottoms).

The chip design conceived by the inventors in this time frame enabled the terminals on the

interposer to be movable with respect to the contacts on the chip, thereby decoupling

thermal stresses. Tr. 113:4-114:4, 118:15-119:22 (Bottoms); CX-12C at TESS070651-53;

943.

944.

945,

946.

CX-94C, I T [ 6, 9.

947. Dr. DiStefano and Dr. Khandros’ solution to the problem of thermal expansion mismatch

included a nonrigid interposer between the silicon chip and package substrate to

accommodate the relative motion of the silicon and the package substrate. Tr. 107: 18-

108: 15 (Bottoms).

948. The inventors intended the interposer to decouple thermal stresses by enabling the

terminals on the interposer [contact pads on the substrate] to be movable with respect to

280

949

950

95 1

the contacts pads on the chip. Tr. 113:4-114:4, 118:lS-119:22, 126:9-127:19 (Bottoms);

CX-12C at TESS070651-53.

Dr. Bottoms recalled that, no later than May 1990, the inventors conceived that the

electrical connection between the bonding pads on the chip [chip contacts] and the

bonding pads of the package substrate [terminals] would be flexible so as to accommodate

the movement of the chip relative to the package substrate which resulted from differential

thermal expansion. Tr. 107:16-108:15, 118:lS-119:22 (Bottoms).

In May or June 1990, Drs. DiStefano and Khandros conceived that the interposer would

decouple thermal stresses by enabling the terminals on the interposer to be movable with

respect to the contacts on the chip. CX-12C at TESS07065 1-53; CX-94C, 11 6, 9.

In a notebook entry dated June 1 , 1990, there is a description of using a material, which

may be flexible, between the chip and PCB to decouple thermal stresses. As stated in the

notebook entry, "[tlhe problem with FLIP-CHIP joining is that solder balls/joints must

accomodate [sic] the thermal stress due to TCE mismatch between silicon chip and the

substrate." The notebook entry continues: "The thermal stress DECOUPLING can be

done with a decal similar to that I've described on pp. 9-10 . . . . The area array pads on

the chips are wirebonded with a standard process to the WB pads on the decal. The wires

are then encapsulated with a silicone or epoxy encapsulant Appropriate metallurgy is

applied to the bonding pads for subsequent bonding to the substrate." This notebook entry

documents the inventors' ideas for making connections from the contacts on the chip,

through the terminals on the sheetlike material (the decal) to the PCB substrate. CX-

at TESS07065 1-53; CX-94C, 7 9.

2 c

28 1

952. As stated on the next page of the notebook, the "decal structure [is] overlayed on top of the

chip . . , , The i/o pads on the chip are connected with WJ3 pads on the decal by way of

ball or wedge WIREBONDING." (TESS070652) The next notebook page adds: "The

chip is decoupled from the substrate, and the thermal stresses simply buckle the wires of

the wirebond, without danger of failure of joints. 'I (TESS070653) These notebook entries

document the inventors' ideas for designing packages that decouple thermal stresses. CX-

12C at TESS070651-53; CX-94C, 1 10.

The inventors conceived of a chip package to solve the differential thermal expansion

problem - the difference in the coefficients of thermal expansion between the

semiconductor chip and the printed circuit board that causes solder joint fatigue.

Accordingly, the inventors conceived that the chip package they invented would be

mounted onto a printed circuit board. Tr. 106:4-107:6, 1 1 8: 15-1 19:22, 126:22-127: 12

(Bottoms); CX-94C, 11 4, 7, 9.

No later than June 10, 1990, the inventors conceived holes in the interposer that exposed

the terminals. Tr. 113:4-114:4, 121:20-122:10, 152:13-153:ll (Bottoms); CX-12C at

953,

954

TESS070649; CX-94C, 7 7.

955. No later than June 10, 1990, the inventors conceived that solder balls would connect the

terminals on the interposer to the printed circuit board through holes in the interposer. The

holes were to be filled with bonding material - solder - that attached the terminals to the

solder balls. Tr. 113.4-1 14:4, 121:20-122:10, 152:13-153:11 (Bottoms); CX-12C at

TESS070649; CX-94C, 7 7.

956. Following conception of the inventions recited in the asserted claims of the patents-in-suit,

282

the inventors continuously exercised reasonable diligence in reducing their inventions to

practice until the filing of a patent application on March 2 1, 199 1. There was never a time

between the founding of IST in April or May of 1990 and the filing of a patent application

in March 199 1 when the inventors were not developing both the face-up and face-down

embodiments of their invention. Tr. 107:18-108:15, 1355-136:5, 146:25-149:9

(Bottoms); CX-329C (DiStefano Dep.) Tr. 427:22-428:7.

To conserve resources and expedite development of their inventions, the inventors sought

to use materials and equipment that were readily available to build prototype chip

packages. The inventors also identified outside vendors that could build portions of their

inventions for them. Tr. 127:25-128: 17, 129: 17-130: 16 (Bottoms); CX-329C (DiStefano

Dep.) Tr. 43O:ll-431:10, 437:lO-438:24, 452:lO-25; CX-1OOC

To hrther conserve resources and expedite development of their inventions, the inventors

sought to use materials and equipment that could be used to construct both face-up and

face-down chip packages and developed elements of packages that could be used in both

face-up and face-down chip packages. For instance, the inventors developed flexible

package substrates that could be used in both configurations. Tr. 135:5-136:5, 146:25-

149:9 (Bottoms); CX-329C (DiStefano Dep.) Tr. 428:9-429:4, 430: 11 -43 1 : 10, 437: 10-

957.

958.

438124, 452: 10-25; CX-1OOC.

959. As a first step in reducing their conceived inventions to practice, the inventors constructed

physical models of face-up and face-down chip packages. Tr. 114: 14-1 15:4, 128: 18-

129:16, 176:12-24, 184:24-185:7 (Bottoms).

The earliest physical models of face-up and face-down chip packages were made in May 960.

283

961.

962.

963,

964.

of 1990 of materials such as plastic and manila folders, cardboard, tape, and piano wire.

Tr. 114:14-115:4, 128:18-129:16, 176:12-24, 184:24-185:7 (Bottoms).

At least one early physical model of a face-up chip package had representations of a chip,

a package substrate, wire bonds from the top of the chip to the substrate, and contacts on

the bottom of the package substrate that were underneath the chip. Tr. 185:21-186:2,

186: 18-187:5, 187:21-188:7 (Bottoms).

In addition to constructing physical models of face-up and face-down chip packages, the

inventors began development of prototype packages embodying their inventions. Tr.

133: 1 -135:4 (Bottoms); CPX-I C; CPX-2C; CPX-3C; CPX-4C; CX-329C (DiStefano

Dep.) Tr. 41 9: 19-420: 1 1 , 427: 15-429:24, 453 : 1-20; CX-94C, 71 13, 14.

During the Summer and Fall of 1990, the inventors were developing a prototype chip

package that had the following elements: a flexible sheetlike package substrate between

the semiconductor chip and the printed circuit board; flexible leads connecting contacts on

a front surface of the chip to terminals on the package substrate; contacts at least on the

periphery of the front surface of the chip; the package substrate facing the rear surface of

the chip; terminals on the package substrate under the chip; terminals movable with

respect to the chip and the contacts on the chip to allow for compensation of thermal

expansion mismatch; the flexible leads and flexible package substrate adapted to deform

to accommodate movement of the terminals with respect to the contacts; and terminals on

the package substrate connected to the PCB via solder connections. CX-329C (DiStefano

Dep.) Tr. 450:21-452:9; CX-94C, 7 15.

The inventors developed prototype chip packages in the 1990-1991 time period which

284

were similar - if not identical - to physical exhibits CPX-1C through CPX-4C. Tr. 133: 1-

135:4 (Bottoms); CPX-IC; CPX-2C; CPX-3C; CPX-4C.

Physical exhibits CPX-lC, CPX-3C and CPX-4C are face-up packages with wirebonds

connecting the contacts on the top of the chip to the redistribution layer on the substrate

Tr. 133:20-134: 19 (Bottoms); CPX-1C; CPX-3C; CPX-4C; CX-328C (Khandros Dep.)

Tr. 89:4-90:20.

Physical exhibit CPX-2C is a face-down package connected to a printed circuit board with

a heat sink attached to the silicon test fixture. Tr. 133:20-134:19 (Bottoms); CPX-2C.

Every little model or prototype was memorable because it signified an event and a

benchmark in the history of IST. Tr. 178:12-21 (Bottoms).

As part of the process of obtaining, evaluating and selecting materials required to

construct the inventions of the asserted claims of the patents-in-suit, Dr. Bottoms and Dr

DiStefano visited a number of potential materials suppliers in Japan. Tr. 129: 17-1 30: 16

(Bottoms).

In November 1990, IST purchased a wire bonder from Vermont Semiconductor which the

inventors and technicians used to wire bond both face-up and face-down chip packages

Tr. 130: 17-132:6 (Bottoms); CX-329C (DiStefano Dep.) Tr. 422:21-425: 1, 424:7-14; CX-

965.

966.

967.

968.

969.

101 c; cx-329c; c x - 9 4 c , 1 21.

970. Prior to the purchase of a wire bonder from Vermont Semiconductor in November 1990,

the inventors had attempted to borrow time on a wire bonder. Tr. 13 1: 10-15 (Bottoms).

An October 8, 1990 invoice from Leo Meyers Design, Inc. to IST reflects charges for the

generation of "Gerber files on TBI." Gerber files are the data used to generate masks for

971.

285

making circuits on flex material. These circuits were adapted for both face-up and face-

down packages. CX-97C; CX-94C, 7 17.

An invoice having a shipping date of October 26, 1990 from Silica Source Technology

Corporation reflects charges for "emulsion master and 2 chrome working plates for

lithography." This refers to the mask that IST used for making test chips for use in both

face-up and face-down packages. CX-98C; CX-94C, 7 18.

A separate invoice from Silica Source Technology Corporation with a shipping date of

October 26, 1990, identifies 4" P- 100 wafers, materials and set-up charges. These wafers

were used for making both face-up and face-down packages. CX-99C; CX-94C, 7 19.

An invoice dated November 5, 1990 from Elastomeric Technologies identifies charges for

1 'I square copper/silicone skins. This refers to the flexible pads that were used between

the chip and the flexible substrate in making face-up packages. CX-329C (DiStefano

Dep.) Tr. 452: 10-25; CX-1 OOC; CX-94C, 7 20.

A November 21, 1990 invoice from Select Circuits reflects IST's purchase of a test board.

IST soldered a prototype package to this test board to illustrate the thermal stress

decoupling capabilities of the package. CX- 102C; CX-94C, 7 20.

Numerous additional invoices from 1990 and 1991 illustrate that IST was diligently

building various face-up and face-down packages. These include the following:

(i) December 17, 1990 invoice from Silicon Source Technology Corporation ("SST");

(ii) January 8, 1991 invoice from Leo Meyers Design, Inc.; (iii) January 15, 1991 invoice

from SECON Metals Corporation; (iv) January 21, 1991 invoice from Select Circuits; (v)

January 29, 1991 invoice from SST; (vi) January 30, 1991 invoice from Elastomeric

286

972.

973.

974.

975.

976.

Technologies, Inc.; (vii) February 19, 1991 invoice from Laser Machining, Inc.; and (viii)

February 2 1, 199 1 invoice from S ST. These invoices reflect purchases of chips,

packaging materials, package layout design services and other packaging services for

building packages. CX-103C; CX-94C, fi 23.

U.S. Patent No. 5,148,265 ("the '265 patent") was filed on March 21, 1991. CX-40 at

front page.

The '265 patent is related to the patents-in-suit. In particular, the '977 patent issued from

a PCT application that was a continuation-in-part of the '265 patent. The '326 patent is a

continuation ofthe '977 patent. CX-1 at 1:5-25; CX-2 at 1:5-14.

The '265 patent discloses "a semiconductor assembly," as recited in claims 6/1 and 22 of

the '977 patent and claims 1, 3 and 11 of the '326 patent. CX-40 at 1:13-16; 4:37-38;

18:36-19:2; 19:3-23; Figures 3, 9, 10, 13, 14.

The '265 patent discloses "a semiconductor chip having a plurality of surfaces and having

contacts on at least one of said surfaces," as recited in claims 6/1 and 22 of the '977 patent.

CX-40 at 3:62-4:26; 4:37-45; 18:36-19:2; Figures 1 (semiconductor chip 20, contacts 30),

3 (same), 9 (chip 320, contacts 330), 13 (chip 620, contacts 630), 14, 16.

The '265 patent discloses "a flexible sheetlike element having terminals thereon," as

recited in claims 6/1 and 22 ofthe '977 patent. CX-40 at 3:62-4:14; 5:57-63; 6:9-15;

977.

978.

979.

980.

98 1 .

6 134-59; 9 148-66; 10 :40-47; 12: 52- 13 : 6; 14: 19-3 7; 1 5 5-44; 16 :20-28; 1 8 13 6- 1 9:2; 19: 3 -

23; Figures 3 (flexible sheetlike element 36, terminals 48), 9 (flexible sheetlike element

336, terminals 348), 10, 13 (flexible sheetlike element 660, terminals 666, 668), 14

(flexible sheetlike element 660, terminals 666, 668).

287

982. The '265 patent discloses "flexible leads electrically connecting said terminals to said

contacts," as recited in claims 6/1 and 22 of the '977 patent. CX-40 at 3:62-67; 6:34-59,

10:40-57; 12:52-13:6; 18:36-19:2; 19:3-23; Figures 3 (50, 56), 13 (654), 14.

The '265 patent discloses "wherein said sheetlike element and at least some of said

terminals overlie one said surface of said chip and said sheetlike element bears upon such

surface of said chip," as recited in claims 6/1 and 22 of the '977 patent. CX-40 at 3:62-

4 : l ; 6:34-59; 18:36-19:2; 19:3-23; Figures 1-3, 9, 10, 13, 14.

The '26.5 patent discloses "said terminals are movable with respect to said chip and said

contacts, said flexible leads and said flexible sheetlike element being adapted to deform to

accommodate movement of said terminals with respect to said contacts," as recited in

claims 6/1 and 22 ofthe '977 patent. CX-40 at 3:62-4:14; 4:65-5:l; 12:52-13:6; 18:36-

19:2; 19:3-23; Figures 1-3, 9, 10, 13, 14.

The '265 patent discloses "wherein said chip has oppositely-facing front and rear surfaces,

said contacts are disposed on said front surface, and said sheetlike element and said

terminals overlie said rear surface of said chip," as recited in claim 6/1 of the '977 patent

and "said backing element overlying said rear surface of said semiconductor chip such that

at least some of said terminals overlie said rear surface of said chip," as recited in claims 1 ,

3 and 11 ofthe '326 patent. CX-40 at 6:34-59; 18:36-19:2; 19:3-23; Figures 13, 14.

The '265 patent discloses "fbrther comprising a substrate having contact pads thereon, said

sheetlike element being disposed between said chip and said substrate, each said terminal

being connected to one said contact pad of said substrate," as recited in claim 22 of the

'977 patent. CX-40 at 5:26-35; 12:3-17; 18:36-19:2; 19:3-23; Figures 3, 5 (substrate 66,

983.

984

985.

986.

288

contact pads 68), 9, 10, 13, 14.

The '265 patent discloses "a semiconductor chip having oppositely facing front and rear

surfaces and edges extending between said front and rear surfaces, said chip hrther having

contacts on a peripheral region of said front surface," as recited in claims 1, 3 and 1 1 of

the '326 patent. CX-40 at 3:62-4:26; 4:37-45; 18:36-19:2; 19:3-23; Figures 1-3, 9, 10, 13,

14.

The '265 patent discloses "a backing element having electrically conductive terminals and

lead portions thereon, wherein said lead portions are connected to said terminals," as

recited in claims 1, 3 and 1 1 of the '326 patent. CX-40 at 5:57-63; 6:34-59; 10:40-47;

18:36-19:2; 19:3-23; Figures 1-3, 9, 10, 13, 14.

The '265 patent discloses "bonding wires connected to said contacts on said front surface

of said chip, said bonding wires extending downwardly alongside said edges of said chip

and being connected to the lead portions on the backing element," as recited in claims 1 , 3

and 1 1 ofthe '326 patent. CX-40 at 6:34-59; 10:40-57; 12:52-13:6; 18:36-19:2; 19:3-23;

Figures 3, 9, 10, 13, 14.

The '265 patent discloses "wherein said terminals are movable with respect to said chip,"

as recited in claims 1, 3 and 1 1 ofthe '326 patent. CX-40 at 3:62-4:14; 4:65-5:l; 12:52-

13:6; 15:5-44; 16:20-28; 18:36-19:2; 19:3-23; Figures 1-3, 9, 10, 13, 14.

The '265 patent discloses "wherein said backing element is flexible to facilitate the

movement of the terminals with respect to the chip," as recited in claim 3 of the '326

patent. CX-40 at 3:62-4:14; 5:57-63; 6:9-15; 6:34-59; 9:48-66; 10:40-47; 12:52-13:6;

14:19-37; 1 5 5 4 4 ; 16:20-28; 18:36-19:2; 19:3-23; Figures 1-3, 9, 10, 13, 14.

987.

988.

989.

990.

991.

289

992. The '265 patent discloses "said backing element has a top surface facing toward the chip

and a bottom surface facing away from the chip" and "said lead portions and terminals are

located on said top surface of said backing element," as recited in claim 9 (from which

claim 11 depends) of the '326 patent. CX-40 at 6:34-59; 18:36-19:2; 19:3-23; Figures 3,

5 , 13, 14.

The '265 patent discloses "the backing element hrther including holes therethrough froin

said top surface to said bottom surface, wherein the terminals are exposed through said

holes" as recited in claim 10 (from which claim 1 1 depends) of the '326 patent. CX-40 at

5:26-35; 14:52-64; 18:36-19:2; 19:3-23; Figures 3, 5, 9, 13, 14.

The '265 patent discloses "bonding material attached to said terminals through said holes"

as recited in claim 11 ofthe '326 patent. CX-40 at 5:26-35; 12:3-17; 1452-64; 18:36-

19:2; 19:3-23; Figures 5 (bonding material 70), 13, 14.

Figure 13 of the '265 patent illustrates a sheetlike backing element 660 overlying the rear

surface of the chip 620. The backing element has terminals thereon. At least some of the

terminals overlie the rear surface of the chip. CX-40 at 18:36-19:2, Figure 13.

Figure 14 of the '265 patent illustrates a sheetlike backing element 660 overlying the rear

surface of the chip 620. The backing element has terminals thereon. At least some of the

terminals overlie the rear surface of the chip. The terminals 668 may be bonded to

corresponding contact pads on a printed circuit board substrate. CX-40 at 19:3-23, Figure

14.

The '265 patent discloses face-up semiconductor assemblies to one of ordinary skill in the

art at the time the '265 patent was filed (on March 21, 1991). Tr. 1915:15-1917:3

290

993

994.

995.

996.

997.

998.

999.

1000.

1001

1002

1003

(Engelmaier).

Dr. Charles admitted that he did not hear Dr. Bottoms’ live hearing testimony or review

Dr. Bottoms’ testimony afterwards. Tr. 1830:23-183 1 :4 (Charles).

Dr. Charles admitted that he is not more knowledgeable than Dr. Bottoms regarding the

development work that occurred at IST Associates in 1990 and facts related to Dr.

Khandros’ 1990 engineering notebook. Tr. 183 1:5-1832:8 (Charles).

While it is true that Dr. Khandros regularly made reference in his notebook entries to

previous entries, he did not always follow this practice. For instance, Sharp expert

Dr. Charles recognized a relation between the subject matter of page 14 of the Khandros

notebook (TESS070654) and that of pages 11-1 3 of the notebook (TESS070651-653),

even though page 14 contains no reference to pages 11-13. Tr. 1681:13-20 (Charles).

Although Dr. Bottoms testified that the drawings on pages 17-1 8 of the Khandros

notebook (TESS070657-658) do not explicitly depict terminals under the chip, he also

testified that the drawings on at least page 9 of the notebook (TESS070649) include, ii7lc.r

alia, solder balls that would appear below the substrate depicted on page 17. Tr. 152:22-

154:23 (Bottoms).

Dr. DiStefano also stated that although the drawing of page 17 of the Khandros notebook

does not explicitly depict terminals under the chip, the packages he and Dr. Khandros

conceived had terminals under the chip. CX-94C, 7 12.

Although Dr. Bottoms was not qualified as an expert in electronic packaging for purposes

of the Hearing in this Investigation, Dr. Bottoms has had extensive academic and industry

experience in the area of electronic packaging. Tr. 97: 11-99:25 (Bottoms).

29 1

1004. Although Dr. Bottoms testified that the drawing on page 17 of the Khandros notebook

(TESS070657) does not define the properties of the interposer layer, he also testified that

at the time the notebook was written "we clearly were discussing the requirements for that

interposer layer to have the flexibility to accommodate the differences in thermal

coefficients of expansion." Tr. 150:8-14 (Bottoms).

1005. Dr. DiStefano stated that page 17 of the notebook depicts a "substrate, which may be

flexible, under the rear surface of the chip." CX-94C, 7 12.

1006. Although Dr. DiStefano testified that page 17 of the Khandros notebook (TESS070657)

describes the use of ultrasonic bonding to eliminate voids between the chip and the

substrate, Dr. DiStefano also stated that page 17 contains a depiction of a face-up package

which would have a flexible package substrate, flexible leads, and terminals under the

chip. CX-94C 7 12.

1007. Dr. DiStefano testified that he relied on his memory of events in 1990 as well as the

Khandros notebook to recall that he and Dr. Khandros conceived of face-up and face-

down chip packages in May or June 1990. CX-329 (DiStefano Dep.) Tr. 404:21-405: 15.

1008. Dr. Khandros testified that page 17 of his notebook (TESS070657) contains a figure

depicting a face-up chip that is wirebonded to what could be a chip carrier package

substrate. CX-328C (Khandros Dep.) Tr. 72:7-74:3.

1009. Dr. DiStefano stated that he and Dr. Khandros applied the ideas contained on pages 1 1-1 3

of the Khandros notebook to both face-up and face-down chip packages. CX-94C 77 9-1 2.

101 0. Dr. Bottoms testified that the face-up and face-down configurations of the inventor's ideas

consisted of many of the same elements and that the entries in Dr. Khandros' notebook

292

related to both configurations. Dr. Bottoms also testified that the inventors' work on many

elements of their chip packages, such as the interposer and redistribution layer, were

equally applicable to face-up and face-down configurations. Tr. 126: 17- 127: 12, 13 5 : 5-

136:5, 152:22-154:23, 160: 18-162: 1, 162.11-16 (Bottoms).

101 1 . Dr. Bottoms testified that IST was "working continuously on both face-up and face-down''

chip package configurations from the date of conception until at least March 1991. Tr.

1355-1 365 , 146:25-147: 12 (Bottoms).

1012. Although Dr. Bottoms testified that the four prototype chip packages bear no indication of

when they were built, Dr. Bottoms also testified that he saw prototypes that were similar

to the four prototype chip packages CPX-IC to 4C and that these exhibits may have been

the packages that were built in the very early 1990s. Tr. 134:20-135:4 (Bottoms).

10 13. Dr. Bottoms testified that black ink on early physical models represented contacts (or

terminals) on the bottom of the substrate, not solder balls. Tr. 186:3-188:7 (Bottoms).

1014. Dr. Bottoms testified that he did not know whether one particular physical model had an

interposer, not that he did not know whether all early physical models had an interposer

Tr. 184: 18-1 86:2 (Bottoms)

1015. Dr. Bottoms testified that he believed it likely that he knew more about the chip packages

that were made at IST in 1990 than Gary Grube. Tr. 146:5-17 (Bottoms).

101 6. Mr. Grube had difficulty recalling many relevant dates and events, including when he first

began working for IST and when he began working on face-up chip packages. CX-330C

(Grube Dep.) Tr. 48:l 1-49:1, 50:17-51:l.

293

B. The Lin Patent

1017. U.S. Patent No. 5,216,278 issued to Lin et al. ("the Lin patent") has an effective filing date

of December 4, 1990. RX-6 at front page.

10 18. The only Motorola documents Mr. Lin testified about regarding conception or reduction to

practice are RX-607C (Tr. 1557:22-1561:7), RX-852C (Tr. 1561:8-1566:3), RX-619C (Tr

1566:4-1568:2), RX-608C (Tr. 1568:4-1569:1), RX-609C (Tr. 1569:2-1570:7), RX-61 IC

(Tr. 1570:8-16), RX-615C (Tr. 1570:17-1571:25), RX-612C at MOT 000776 (Tr. 1572.2-

1574:19), RX-612C at MOT 000775 (Tr. 1575:23-1576:23), RX-512C (Tr. 1577:4-

1582:9), CX-565C (Tr. 1607:9-1611:3), RX-333C (Exhibit 5 ) (Tr. 1613:4-1614:17), RX-

516C (Tr. 1614:18-l615:14) and RX 335 (Exhibit 6) (Tr. 1617:5-1618:12).

1019. RX-607C is two sets of mechanical drawings for a Low Cost DSP Pad Array Carrier With

Solder Bumps. Both sets of drawings are dated [ 1. RX-607C.

1020. RX-607C does not identify any materials for any of the components of the package. RX-

607C.

1021. RX-607C does not identi@ the material or modulus of the package substrate. RX-607C.

1022. RX-607C does not identify the material, modulus or thickness of the die attach. RX-

607C.

1023. RX-607C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-607C.

1024. RX-607C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board. RX-607C.

294

1025. RX-607C fails to discuss solder joint fatigue. RX-607C.

1026. RX-852C is a June 15, 1989 letter to Citizen America and Citizen Japan from Paul Lin.

RX-8 52C.

1027. RX-852C does not identify any materials for any of the components of the packages in

which the Communications DivisiodPortable Products has an interest. RX-852C.

1028. RX-852C does not identify the material or modulus of the package substrate for the

packages in which the Communications Divisioflortable Products has an interest

RX- 8 5 2C.

1029. RX-852C does not identify the material, modulus or thickness of the die attach for the

packages in which the Communications DivisiodPortabIe Products has an interest.

RX-8 5 2C.

1030. RX-852C fails to disclose matching the CTEs of the package substrate and the printed

circuit board for the packages in which the Communications Divisioflortable Products

has an interest. RX-852C.

103 1 . RX-852C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board for the packages in which the Communications DivisionPortable Products

has an interest. RX-852C.

1032. RX-852C fails to discuss solder joint fatigue. RX-852C.

1033. RX-6 19C does not identifjl any materials for any of the components of the package. RX-

619C.

1034. RX-6 19C does not identify the material or modulus of the package substrate. RX-6 19-C

295

1035. RX-619C does not identify the material, modulus or thickness of the die attach. RX-

6 19C.

1036. RX-619C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-6 19C.

1037. RX-619C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board. RX-6 19C.

103 8. RX-6 19C fails to discuss solder joint fatigue. RX-6 19C.

1039. RX-608C is a May 9, 1989 letter with three attachments from Howard Wilson to Ron

Mundwiller at Citizen America. RX-608C.

1040. RX-608C seeks a [

3 . The[ ] is interested in [

1. As of May 9, 1989, [

1. The part is to replace a [ 1. RX-608C at

MOT 00146-47.

104 1. RX-608C does not identify the modulus of the package substrate. RX-608C.

1042. RX-608C does not identi@ the material, modulus or thickness of the die attach. RX-

608C.

1043. RX-608C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-608C.

1044. RX-608C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

296

circuit board. RX-608C.

1045. RX-608C fails to discuss solder joint fatigue. RX-608C.

1046. RX-609C is a September 28, 1989 letter from Howard Wilson to Citizen Japan and

Citizen America. RX-609C.

1047. [

] RX-609C.

1048. RX-609C does not identify the modulus of the package substrate. RX-609C.

1049. [ ] RX-609C.

1050. RX-609C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-609C.

105 1 . RX-609C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board. RX-609C.

1052. RX-609C fails to discuss solder joint fatigue. RX-609C.

1053. RX-611 C does not identify any materials for any of the components of the package. RX-

61 1C.

I 054. RX-6 1 I C does not identi@ the material, modulus or thickness of the package substrate or

the die attach. RX-611C.

1055. RX-6 1 1 C fails to disclose matching the CTEs of the package substrate and the printed

297

1570:

1059. RX-6

circuit board. RX-6 1 1 C.

1056. RX-611C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board RX-611C.

1057. RX-611 C fails to discuss solder joint fatigue. RX-611C.

1058. RX-615C is an [

I . [ ] considered that quantity as prototype building. Tr

7-1571:8, 1571:20-25 (Lin); RX-615C.

5C does not identify any materials for any of the components of the package. RX-

615C.

1060. RX-615C does not identify the material, modulus or thickness of the package substrate or

the die attach. RX-615C.

1061. RX-615C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-615C.

1062. RX-615C fails to disclose relative movement between the chip and the terminals on the

package substrate due to differential thermal expansion between the chip and the printed

circuit board. RX-615C.

1063. RX-615C fails to discuss solder joint fatigue. RX-615C.

1064. RX-6 12C (at MOT 000776) does not identify the material, modulus or thickness of the

package substrate, and does not identify the thickness of the die attach. RX-612C (at MOT

000 7 7 6).

1065. RX-6 12C (at MOT 000776) fails to disclose matching the CTEs of the package substrate

0

298

and the printed circuit board. RX-612C (at MOT 000776). 0

1066. RX-612C (at MOT 000776) fails to disclose relative movement between the chip and the

terminals on the package substrate due to differential thermal expansion between the chip

and the printed circuit board. RX-612C (at MOT 000776)

1067. RX-6 12C (at MOT 000776) fails to discuss solder joint fatigue. RX-6 12C (at MOT

0007 7 6).

1068. RX-6 12C (at MOT 000775) does not identify any materials for any of the components of

the package. RX-612C (at MOT 000775).

1069. RX-612C (at MOT 000775) does not identify the material, modulus or thickness of the C

package substrate or the die attach. RX-612C (at MOT 000775).

1070. RX-6 12C (at MOT 000775) fails to disclose matching the CTEs of the package substrate

and the printed circuit board. RX-612C (at MOT 000775).

1071. RX-6 12C (at MOT 000775) fails to disclose relative movement between the chip and the

terminals on the package substrate due to differential thermal expansion between the chip

and the printed circuit board. RX-612C (at MOT 000775).

1072. RX-612C (at MOT 000775) fails to discuss solder joint fatigue. RX-612C (at MOT

000775).

1073, RX-5 12C does not identifi the material, modulus or thickness of the package substrate or

the die attach for the packages described therein. RX-5 12C.

1074. RX-5 12C fails to disclose matching the CTEs of the package substrate and the printed

circuit board. RX-5 12C.

1075. RX-5 12C fails to disclose relative movement between the chip and the terminals on the

299

package substrate due to differential thermal expansion between the chip and the printed

circuit board. RX-5 12C.

1076. RX-5 12C fails to discuss solder joint fatigue. RX-5 12C.

1077. MOT 00135-144 is an [

1. The [

1. RX-335C Exhibit 6 at MOT 00135-

137, 138.

1078. Mr. Lin’s engineer signed off on this specification. Tr. 16175-1618:12 (Lin).

1079. Mr. Lin did not testify about any documentation that evidences conception of the

inventions ofthe Lin patent prior to December 4, 1990. See Tr. 1555:3-1618:12 (Lin).

1080. Mr. Lin did not test@ about any documentation that evidences conception of the

inventions ofthe Lin patent prior to June 10, 1990. See Tr. 1555:3-1618:12 (Lin).

108 1 . Mr. Lin did not testifL about any documentation that evidences conception of the

invention of claim 6 ofthe ‘977 patent prior to June 10, 1990. See Tr. 1555:3-1618:12

(Lin).

1082. Mr. Lin did not testify about any documentation that evidences conception of the

invention of claim 22 ofthe ‘977 patent prior to June 10, 1990. See Tr. 1555:3-1618:12

(Lin).

1083. Mr. Lin did not testify about any documentation that evidences conception of the

invention of claim 1 ofthe ‘326 patent prior to June 10, 1990. See Tr. 1555:3-1618:12

(Lin).

1084. Mr. Lin did not testify about any documentation that evidences conception of the

300

1085.

1086.

1087.

1088

1089

1090

1091

1092

invention of claim 3 ofthe ‘326 patent prior to June 10, 1990. See Tr. 1555:3-1618:12

(Lin).

Mr. Lin did not testify about any documentation that evidences conception of the

invention of claim 11 ofthe ‘326 patent prior to June 10, 1990. See Tr. 1555:3-1618:12

(Lin).

Mr. Lin’s testimony regarding conception no later than February 1989 was not

corroborated by documentation. Tr. 15 5 8:2 1 - 15 59: 8, 155 5:3- 16 18: 12.

The Lin patent does not expressly disclose movement of terminals relative to the chip

RX-6; Tr. 1708: 19-1 709:4 (Charles).

The Lin patent does not expressly disclose terminals that move relative to the chip (and/or

chip contacts) to provide substantial compensation for differential thermal expansion

between the chip and the printed circuit board. RX-6; Tr. 1708,19-1709:4 (Charles).

The Lin patent does not expressly disclose terminals that are movable relative to the chip

(and/or chip contacts) to significantly reduce the strain in the solder joints that results from

the differential thermal expansion between the chip and the printed circuit board. RX-6;

Tr. 1708: 19-1 709:4 (Charles).

The Lin patent does not expressly disclose terminals that are movable relative to the chip

and the chip contacts to significantly improve solder joint reliability. RX-6; Tr. 1708: 19-

1709:4 (Charles).

The Lin patent purports to improve the life of the solder joints by matching the thermal

coefficients of the package substrate and the printed circuit board. Tr. 1 5 5 4 5 1 3 (Lin).

. It is possible according to the teachings of the Lin patent to build a package with a

301

package substrate made of the same material (FR-4) as the printed circuit board to which

the package is attached; and use compliant solder balls to attach the package to the FR-4

printed circuit board. RX-6 at 2:56-3:16.

1093. The only discussion in the Lin patent of solder joint fatigue is as follows: "Solder joint

fatigue is a frequently encountered problem when pad array carrier packages are mounted

to a PCB. This problem is minimized in the present invention by using a circuit board

material to construct carrier substrate 12, which has a similar coefficient of thermal

expansion as the PCB. Further, by using compliant solder balls, fatigue resistant joints

can be formed connecting semiconductor device 10 to the PCB." RX-6 at 3:9-17.

1094. The Abstract of the Lin patent does not discuss the problem of differential thermal

expansion or the problem of solder joint fatigue. RX-6 at Abstract.

1095. The Abstract of the Lin patent does not disclose the feature of matching the CTEs of the

package substrate and the printed circuit board. RX-6 at Abstract.

1096. No claim in the Lin patent recites movability of the terminals relative to the chip. RX-6 at

7146- 12: 52.

1097. The only claims in the Lin patent that recite "compliant solder balls" are independent

claim 3 1 and the claims which depend from claim 3 1 (namely, claims 32, 33 and 34). RX-

6 at 7146-1232, 1 1 :45-48.

1098. The only claims in the Lin patent that discuss substantially matching the CTE of the

package substrate with the CTE of the substrate onto which the package is mounted are

independent claims 3 1 and 35 and the claims which depend from these claims. RX-6 at

7:46-12:52, 11120-24, 12114-21.

3 02

1099. The Lin patent does not identi@ the material used for the die attach, the thickness of the

die attach, the modulus of the die attach, or how the modulus of the die attach would be

affected by temperature. See RX-6; Tr. 1790: 19-24, 181 1 :2-16 (Charles).

1100. The only descriptions of the die attach in the Lin patent are as follows:

substrate 12 having a die attach surface 14 and a package mounting surface 16 supports an

electronic component 18 which is conventionally bonded to die attach surface 14 by a die

bond 20;" and "Shown in FIG. 4, in cross section, is another embodiment of the invention

wherein a semiconductor device 1 10 has a package lead[] 24 connecting electronic

component 18 through an internal via 42. Die bond 20 extends onto a portion of first

wiring layer 30 and is of sufficient thickness to support electronic component 18 above the

plane of first wiring layer 30." RX-6 at 2:49-53, 5:26-33.

"A carrier

1 10 1. Mr. Lin testified that [ I .

The inventors wanted [

1. Tr. 1552:lO-16 (Lin).

1 102. It is Mr. Lin's understanding that the die attach acts as a buffer to reduce stresses on the

die. Mr. Lin did not testify that the purpose of the die attach was to reduce solder joint

fatigue. Tr. 1552:lO-1553:13 (Lin).

1103. Mr. Lin does not recall the exact thickness of the die attach used in the early OMPACs.

Tr. 1616:19-1617:4 (Lin).

1104. At the time the initial Lin patent application was filed, there was a range of materials that

could have been placed in between the flexible carrier substrate and the chip. Tr. 1790:25-

1791:4 (Charles).

3 03

1105. It is possible to build a package according to the teachings of the Lin patent with a set of

high modulus (i,e., rigid) die attach materials. Tr. 1791:ll-15 (Charles).

1 106. It is possible to build a package according to the teachings of the Lin patent with a die

attach of varied thickness (varying several microns). Tr. 179 1 : 1 1 - 18 (Charles).

1107. The Lin patent does not exclude the possibility that a package built according to the

teachings of the Lin patent would have a thin die attach. RX-6; Tr. 1791 : 1 1-1 8 (Charles).

1 108. The Lin patent does not exclude the possibility that a package built according to the

teachings of the Lin patent would have a rigid die attach. RX-6; Tr. 1791: 11-18 (Charles).

1109. The more thin and the more rigid the die attach is, the more the CTE of the chip will

constrain the amount of movement experienced by the terminals on the top surface of the

package substrate. Tr. 1789: 13-20 (Charles).

1 1 10. For a given die attach thickness, the more rigid the die attach material, the more the CTE

of the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:3-7 (Charles).

1 1 1 1 . For a given modulus of rigidity, the thinner the die attach material, the more the CTE of

the chip will constrain the movement of the top surface of the package substrate. Tr

1786:s-13 (Charles).

11 12. When you have a thin, rigid die attach, the package substrate will be constrained such that

it will expand or contract in close relation to the expansion or contraction of the chip. Tr.

1786: 18-25 (Charles).

1 1 13. The more rigid the die attach is, the more the top surface of package substrate will track

the expansion of the chip. Tr. 1787: 1-14 (Charles).

3 04

I 114. Because a package built according to the teachings of the Lin patent may have a rigid die

attach, the package substrate may be constrained by the chip to the extent that the package

is incapable of providing sufficient movement of terminals (which are on the bottom

surface of the package substrate) to provide substantial compensation for differential

thermal expansion. Tr. 1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20, 1791.1 1-18

(Charles); RX-6.

1 1 15. Because a package built according to the teachings of the Lin patent may have a thin die

attach, the package substrate may be constrained by the chip to the extent that the package

is incapable of providing sufficient movement of terminals (which are on the bottom

surface of the package substrate) to provide substantial compensation for differential

thermal expansion, Tr , 1 786: 3 - 1 3, 1 786: 1 8-25, 1 787: 1 - 1 4, 1 789: 1 3 -20, 1 79 1 : 1 1 - 1 8

(Charles); RX-6.

1 116. The Lin patent does not necessarily disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. Tr 1786:3-13, 1786.18-25,

1787:l-14, 1789:13-20, 1791:ll-18 (Charles); RX-6.

1 1 17. The Lin patent does not necessarily disclose terminals that are movable relative to the chip

(and/or chip contacts) to significantly reduce the strain in the solder joints that results from

the differential thermal expansion between the chip and the printed circuit board. Tr.

1786:3-13, 1786: 18-25, 1787: 1-14, 1789: 13-20, 1791 : 11 -1 8 (Charles); RX-6.

1 1 18. The Lin patent does not necessarily disclose terminals that are movable relative to the chip

and the chip contacts to significantly improve solder joint reliability. Tr. 1786:3-13,

3 05

1119.

1120.

1121,

1122.

1123.

1124.

1125.

1126.

1127.

1128.

1786:18-25, 1787:l-14, 1789:13-20, 1791:ll-18 (Charles); RX-6.

The Lin patent does not specifically define how one would achieve low internal package

stress. Tr. 1703 : 12- 18 (Charles).

Mr. Lin testified that [

Tr. 1 5 50:24- 1 5 5 1 : 9 (Lin).

There is nothing in the Lin patent that says that you have to be carehl about which die

attach you use in order to reduce the internal stresses of the package. Tr. 171 1 :8-13

(Char 1 es) .

The Lin patent does not explicitly state that the die attach is an important part of reducing

internal package stress. Tr. 171 1 : 14-23 (Charles).

It is possible that low internal package stress can be achieved when a chip is rigidly

attached to the carrier substrate disclosed in the Lin patent. Tr. 1705: 11-15 (Charles).

No claim in the Lin patent recites a die attach, let alone its material, thickness or modulus.

RX-6 at 7:46-12:52.

Mr. Lin did not say that solder was ever considered to be the die attach disclosed in the

Lin patent. See Tr. 1551:20-1552:3, 1584:23-1585:7 (Lin).

There is no testimony or evidence that solder was a conventional die attach in the 1990

time frame. See Tr. 1551:20-1552:3, 1584:23-1585:7 (Lin); 1745:lO-19 (Charles).

Dr. Charles did not opine that solder was a conventional die attach in the 1990 time frame

See Tr. 1733:4-16, 1745:lO-19 (Charles).

The Lin patent expressly states that, in all cases, the solder terminals and the electrically

active solder balls are displaced away from the vias. RX-6 at 5:7-9; Tr. 1808:2-9

1

306

(Charles).

1 129. The Lin patent states that the feature of displaced vias is important during the eutectic

bonding of electrically active solder balls to solder terminals where heat is applied to form

the bond. If the solder balls were placed directly over the via, wicking of the solder into

the via would occur. RX-6 at 5 : 9- 13.

1 130. The Abstract of the Lin patent discloses the feature of solder balls displaced away from

vias. Rx-6 at Abstract.

1 13 1 . Each independent claim of the Lin patent recites either terminal solder pads that are

displaced away from the vias or terminal solder pads located at positions in a periodic

array and via holes located at positions in an a-periodic array. RX-6 at 7:46-12:52.

1132. Independent claim 1 of the Lin patent recites "a plurality of solder balls which are

displaced away from the vias and joined to the terminal solder pads." RX-6 at 7:66-68.

1 133, Independent claim 3 of the Lin patent recites "a plurality of terminal solder pads . . . which

are displaced away from the vias." RX-6 at 8:36-38.

1134. Independent claim 8 of the Lin patent recites "a plurality of solder balls which are

displaced away from the vias and are bonded to the terminal solder pads." RX-6 at 9: 19-

21.

1135. Independent claim 19 of the Lin patent recites terminal solder pads located at selected

positions in a periodic array and "a plurality of via holes located at positions in [an] a-

periodic array. ' ' RX-6 at 10: 1-7.

1 136. Independent claim 25 of the Lin patent recites "wherein each via is displaced away from a

terminal solder pad." RX-6 at 10:57-58.

3 07

1137.

1138.

1139.

1140.

1141.

1142.

1143.

1144.

1145.

1146.

1147.

Independent claim 3 1 of the Lin patent recites ''an array of terminal solder pads on the

package mounting surface displaced away from the vias." RX-6 at 11:38-39.

Independent claim 35 of the Lin patent recites "an array of terminal solder pads on the

package mounting surface and displaced away from the vias." RX-6 at 12:3 1-33.

Claim 35 of the Lin patent recites a structure having, among other things, a single layer

package substrate and terminal solder pads that are displaced away from the vias. RX-6 at

12:14-39.

No figure in the Lin patent illustrates solder terminals in direct alignment with through-

hole vias. RX-6 at Figs. 1-8.

Figure 1 of the Lin patent shows solder balls 26 displaced away from via 32. RX-6 at Fig.

1 .

Figure 3 of the Lin patent shows solder balls 26 displaced away from vias 32. RX-6 at

Fig. 3.

Figure 4 of the Lin patent shows solder balls displaced away from via 42. RX-6 at Fig. 4.

Figure 5 of the Lin patent shows solder balls displaced away from vias 50 and 52. RX-6 at

Fig. 5.

Figure 6 of the Lin patent shows electrically active solder balls 26 displaced away from

through-hole vias. RX-6 at Fig. 6; 5:7-13.

The Lin patent does not expressly disclose electrically active solder terminals that are

directly aligned with through-hole vias. RX-6 at 5:7-13, 5:61-6:10, Figs. 1, 3, 4, 5, 6.

There is no teaching or suggestion in the Lin patent of having electrically active solder

balls and terminals directly aligned with vias. RX-6 at 5:7-13, 5:61-6:10, Figs. 1, 3, 4, 5 ,

308

6.

1148. The Lin patent teaches away from having electrically active solder balls and terminals

directly aligned with vias. RX-6 at 5:7-13, 5:61-6:10, Figs. 1, 3, 4, 5 , 6.

1 149. Figure 6 of the Lin patent shows thermal solder balls 56 directly aligned with filled vias

60. Thermal solder balls do not conduct electricity, and do not have contact with electrical

terminals. Instead, filled vias 60 make contact to die bond 20, not with the wiring layer of

the package substrate. RX-6 at Fig. 6; Tr. 1807: 12-1 9 (Charles).

1 150. The Lin patent does not require electrically active terminals and electrically active solder

balls to be under the die. In fact, Figures 6, 7a and 7b of the Lin patent do not illustrate

electrically active terminals or electrically active solder balls under the die. RX-6 at Figs.

6, 7a, 7b; 6:32-40.

1 15 1 . The Lin patent discloses a single layer carrier substrate in the sense that it has a single

insulating layer with two metallization layers. RX-6 at 5:58-6: 10; Figs. 1 , 4, 6.

1 152. The Lin patent states that "the present invention is not limited to a single layer carrier

substrate but can have multiple layers including layers devoted to signal transmission as

well as power and ground plane functions." RX-6 at 6:7-I 0; Fig. 5.

1 153, Figure 5 of the Lin patent illustrates a multiple layer carrier substrate where there is a

second insulating layer 44. RX-6 at 5:61-6:lO; Fig. 5.

1 154. The Lin patent does not disclose a carrier substrate having a single metallization layer.

RX-6 at 5:61-6:lO; Figs. 1 , 4, 5, 6.

1155. Sharp's expert Dr. Charles admitted that there is no explicit language in the Lin patent that

suggests having the terminals on the top surface of the package substrate (as required by

3 09

1156.

1157.

1158.

1159.

1160.

1161.

1162.

1163.

1164.

1165.

claim 11 of the '326 patent). Tr. 1810:4-12 (Charles).

No figure in the Lin patent illustrates terminals on the top surface of the package substrate,

RX-6 at Figs. 1-8.

Figure 1 of the Lin patent shows terminals 34 on the bottom surface of package substrate

12. RX-6 at Fig. 1 .

Figure 4 of the Lin patent shows terminals on the bottom surface of package substrate 12.

RX-6 at Fig. 4.

Figure 5 of the Lin patent shows terminals 34 on the bottom surface of the second

insulating layer 44 of the package substrate. RX-6 at Fig. 5.

Figure 6 of the Lin patent shows terminals on the bottom surface of package substrate 12.

RX-6 at Fig. 6.

The Lin patent does not expressly disclose terminals on the top surface of the package

substrate. RX-6 at 3.26-48, 5:58-6:10, Figs. 1, 4, 5 , 6.

There is no teaching or suggestion in the Lin patent of having terminals on the top surface

of the package substrate. RX-6 at 3:26-48, 5:58-6:10, Figs. 1, 4, 5, 6.

The Lin patent teaches away from having terminals on the top surface of the package

substrate, RX-6 at 3:26-48, 5:58-6:10, Figs. 1, 4, 5 , 6.

It is possible to build a Lin package that does not practice claim 11 of the '326 patent. Tr.

1809:5-8 (Charles).

The Lin patent expressly references the abandoned parent application of U.S. Patent No.

5,241,133 issued to Mullen et al. ("the Mullen patent"). In particular, at column 1, lines

9-1 1, the Lin patent states: "Related material is disclosed in co-pending, commonly

3 10

assigned patent application Ser. No. 07/63 1,848, filed Dec. 21, 1990." The co-pending

patent application referred to here is the abandoned parent application of the Mullen

patent. RX-6 at 1:9-11; RX-72 at front page.

1 166. The parent application of the Mullen patent was filed seventeen days after the parent

application of the Lin patent was filed. RX-6 at front page; RX-72 at front page.

1 167. The named inventors of the Mullen patent are William Mullen, Glenn Urbish and Bruce

Freyman, all of whom resided in Florida. RX-72 at front page.

1 168. William Mullen is an engineer at Motorola who was involved in the development of the

68 OMPAC package. RX-335C (Mullen Dep.) Tr. 39:6-17.

1169. The Mullen patent discloses a face-up ball grid array package having a chip that is

adhesively bonded to a package substrate and wire bonded to the metallization patterns of

the package substrate. RX-72 at 3:15-17, Figs. 4-6.

1 170. The Mullen patent describes the following problem in the background section: "When

larger chips are used, ceramic substrates are employed to accommodate the thermal

expansion mismatch between the substrate and the silicon chip. Clearly, a need exists for

a low-cost, high density plastic package that would overcome the inherent problems of

density, lead fragility, electrical performance, cost, and reliability found in conventional

ceramic and printed circuit board pin grid array packages." RX-72 at 2:25-32.

The only description of the die attach in the Mullen patent is that the die attach may be a

"conductive adhesive." The Mullen patent does not disclose the modulus or thickness of

the die attach. RX-72 at 3:54-56, 3:13-17, 4:37-41.

1172. The Mullen patent discloses the use of a metal stiffener (having a modulus in excess of

1171

311

2,000,000 psi) to reduce the mechanical stress imparted by the mismatch between the

thermal expansion coefficients of the printed circuit board and the silicon chip. RX-72 at

4:3 1-46.

1 173. The Mullen patent states: "A fbrther embodiment of the invention (FIG. 6) employs a

metal member or stiffener 60 made from a thin sheet of a material such as steel, nickel,

copper clad invar, alloy 42, or other materials having a flexural modulus in excess of about

2,000,000 psi. The thickness of the stiffener varies from about 3 to about 10 mils

depending [on] the type of material used. The stiffener is adhesively bonded to the pad 63

of the printed circuit board 62 using an adhesive material 68. The chip 64 is then attached

to the stiffener 60 using a conductive adhesive 67 as in the previous example. The metal

stiffener acts to reduce the mechanical stress imparted by the mismatch between the

thermal expansion coefficients of the printed circuit board and the silicon chip. By

reducing this stress, larger integrated circuit chips may be used in the plastic pad array

chip carrier package." RX-72 at 4:3 1-46.

1 174. The Mullen patent teaches the use of a metal stiffener (having a modulus in excess of

about 2,000,000 psi) so that larger chips may be used in a plastic ball grid array package.

RX-72 at 4:3 1-46.

1 175. The Mullen patent teaches the use of a metal stiffener (having a modulus in excess of

about 2,000,000 psi) to reduce internal package stress. RX-72 at 4:3 1-46.

I 176. There is no discussion in the Mullen patent regarding solder joint stress (or strain) or

solder joint reliability. RX-72.

1177. There is no suggestion in the Mullen patent that die attach materials could be used to

312

reduce solder joint strain or increase solder joint reliability. RX-72.

1178. The only solution described in the Mullen patent for reducing the mechanical stress

imparted by the mismatch between the thermal expansion coefficients of the printed

circuit board and the silicon chip is to use a metal stiffener having a modulus in excess of

2,000,000 psi. RX-72 at 4:3 1-46.

1 179. There is no disclosure in the Mullen patent of using a compliant die attach. RX-72 at 3 :6-

4:65; Tr. 1796:3-7 (Charles).

11 80. The Mullen patent does not disclose the use of a compliant or a thick die attach to reduce

internal package stress. RX-72 at 3:6-4:65.

1 18 1 . The approach in the Mullen patent to reducing stress on the die is different from the

approach disclosed in the Suhir articles. Tr. 1796: 17-20 (Charles).

11 82. The Lin patent does not identify or refer to the Suhir articles. Tr. 1829:9-11 (Charles);

RX-6.

1 183, Neither the 1986 Suhir article nor the 1987 Suhir article expressly discusses the reliability

of solder joints that connect a package to a printed circuit board substrate. Tr. 1827: 15-1 9

(Charles) .

1 184. The Suhir articles relate to the problems of die cracking and delamination. RX-371 at

383; RX-372 at 508, 516; Tr. 1743:3-16, 1827:20-23 (Charles).

1 185. The 1986 Suhir article compares the effects of adhesively bonded or soldered interfaces,

where the entire interface geometry is bonded or soldered continuously. RX-371 at 383;

Figs. 1, 2, 4 and 5 .

1 186. The 1987 Suhir article discloses the use of a "compliant" epoxy adhesive to reduce chip

313

cracking and delamination caused by thermal mismatch between the chip and the ceramic

package substrate. RX-372 at 508.

C. The OMPAC Article

1187. The 1991 OMPAC article was published in May 1991, RX-99 at 176; Tr. 1737:20-

173 8: 1 , 18 13 :2-8 (Charles); RX-372 (stating that the 199 1 Electronic Components

Conference will take place May 1 1-1 6, 1991).

1188. There is no express language in the 1991 OMPAC article that states that the terminals are

movable relative to the chip. Tr. 1813:9-13 (Charles).

1 189. The 1991 OMPAC article does not expressly disclose terminals that move relative to the

chip (and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. RX-99; Tr. 18 13 :9- 1 3

(Charles).

1 190. The 1991 OMPAC article does not expressly disclose terminals that are movable relative

to the chip (and/or chip contacts) to significantly reduce the strain in the solder joints that

results from the differential thermal expansion between the chip and the printed circuit

board. RX-99; Tr. 1813:9-13 (Charles).

1191. The 1991 OMPAC article does not expressly disclose terminals that are movable relative

to the chip and the chip contacts to significantly improve solder joint reliability. RX-99;

Tr. 1813:9-13 (Charles).

1192. The 1991 OMPAC article does not discuss the problem of solder joint fatigue. RX-99.

1 193. The 199 1 OMPAC article discusses tests performed to analyze the adhesion strength of the

encapsulant (mold compound). RX-99 at 177- 178, Figs. 6, 7, 10- 15.

3 14

1194.

1195.

1196.

1197.

1198.

1199.

1200.

1201,

The 1991 OMPAC article states that a C-Mode Scanning Acoustical Microscope was used

to monitor the integrity of the mold compound - substrate interface, mold compound - die

interface, die - die paddle interface and any internal cracking of the die. RX-99 at 177

(Environmental Testing).

Figure 6 of the 199 1 OMPAC article illustrates the adhesive strength of various inold

compounds. RX-99 at Fig. 6.

Figure 7 of the 199 1 OMPAC article illustrates the fracture interface of the BT-epoxy

package substrate and the mold compound after torque testing. RX-99 at Fig. 7.

Figure 10 of the 199 1 OMPAC article illustrates an acoustical micrograph of mold

compound-solder resist interface of in-coming OMPAC in which delamination is

designated by a white area in the upper left corner. RX-99 at Fig. 10.

Figure 1 1 of the 1991 O W A C article illustrates an acoustical micrograph of mold

compound-solder resist interface after exposure to factory solder reflow environment. The

figure illustrates an increase in the amount of delamination. RX-99 at Fig. 1 1 .

Figure 12 of the 199 1 OMYAC article illustrates an acoustical micrograph of mold

compound-solder resist interface after exposure to 144 hours of autoclave. The figure

illustrates an increase in the amount of delamination. RX-99 at Fig. 12.

Figure 13 of the 1991 OMPAC article illustrates an acoustical micrograph of mold

compound-solder resist interface after exposure to factory solder reflow environment. The

figure caption states: "No delamination detected, Process modifications were made to

improve mold compound adhesion." RX-99 at Fig. 13.

Figure 14 of the 199 1 OMPAC article illustrates an acoustical micrograph of mold

compound-solder resist interface after exposure to autoclave. The figure caption states:

"No delamination detected." RX-99 at Fig. 14.

1202. Figure 15 of the 199 1 OMPAC article illustrates an acoustical micrograph of mold

compound-solder resist interface after exposure to 1000 thermal shock cycles. The figure

caption states: "No delamination detected. 'I RX-99 at Fig. 15,

1203. The 1991 OMPAC article states that conventional epoxy die attach technology is used to

interconnect the chip to the package substrate (which is made of printed circuit board

material). RX-99 at 177, 7 4.

1204. The 1991 OMPAC article fails to disclose anything about the die attach, other than it is a

"conventional epoxy die attach." RX-99 at 177, 7 4. The 1991 OMPAC article does not

disclose the thickness or modulus of the die attach. RX-99 at 177, 'T[ 4; Tr. 18 13: 14-20

(Char 1 es) .

1205. The 1991 OMPAC article does not discuss the compliancy ofthe die attach. RX-99.

1206. The 1991 OMPAC article does not exclude the possibility that a package built according

to the teachings of the 1991 OMPAC article would have a thin die bond attaching the

silicon chip to the BT resin package substrate. RX-99.

1207. The 1991 OMPAC article does not exclude the possibility that a package built according

to the teachings of the 1991 OMPAC article would have a rigid die bond attaching the

silicon chip to the BT resin package substrate. RX-99.

1208. The more thin and the more rigid the die attach is, the more the CTE of the chip will

constrain the amount of movement experienced by the terminals on the top surface of the

package substrate. Tr. 1789: 13-20 (Charles).

316

1209.

1210.

1211.

1212

1213

1214

For a given die attach thickness, the more rigid the die attach material, the more the CTE

of the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:3-7 (Charles).

For a given modulus of rigidity, the thinner the die attach material, the more the CTE of

the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:8-13 (Charles),

When you have a thin, rigid die attach, the package substrate will be constrained such that

it will expand or contract in close relation to the expansion or contraction of the chip. Tr.

1786: 18-25 (Charles).

The more rigid the die attach is, the more the top surface of package substrate will track

the expansion of the chip. Tr. 1787: 1-1 4 (Charles).

Because a package built according to the teachings of the 199 1 OMPAC article may have

a rigid die attach, the package substrate may be constrained by the chip to the extent that

the package is incapable of providing sufficient movement of terminals (which are on the

bottom surface of the package substrate) to provide substantial compensation for

differential thermal expansion. Tr. 1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20,

1 8 13: 14-20 (Charles); RX-99.

Because a package built according to the teachings of the 199 1 OMPAC article may have

a thin die attach, the package substrate may be constrained by the chip to the extent that

the package is incapable of providing sufficient movement of terminals (which are on the

bottom surface of the package substrate) to provide substantial compensation for

differential thermal expansion. Tr. 1786:3-13, 1786: 18-25, 1787:l-14, 1789: 13-20,

317

1 8 13 : 14-20 (Charles); RX-99.

The 1991 OMPAC article does not necessarily disclose terminals that move relative to the

chip (and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board Tr. 1786:3-13, 1786.18-25,

1787: 1-14, 1789: 13-20, 18 13: 14-20 (Charles); RX-99.

121 6. The 1991 OMPAC article does not necessarily disclose terminals that are movable relative

to the chip (and/or chip contacts) to significantly reduce the strain in the solder joints that

results from the differential thermal expansion between the chip and the printed circuit

board. Tr. 1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20, 1813:14-20 (Charles); RX-99.

1217. The 1991 OMPAC article does not necessarily disclose terminals that are movable relative

to the chip and the chip contacts to significantly improve solder joint reliability. Tr.

1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20, 1813:14-20 (Charles), RX-99.

The 1991 OMPAC article states that all OMPACs then in production used a package

substrate made of BT epoxy printed circuit board laminate. RX-99 at 177, 7 2.

The 1991 OMPAC article states that the overall height of the OMPAC ranges from 40

mils (1 .O mm) to 80 mils (2.0 mm) without the solder bumps, and that solder bumps add

an additional 15 mils (.38 mm) to the height of a soldered OMPAC. RX-99 at 177.

1220. The package substrate disclosed in the 1991 OMPAC article has a top side metallization

pattern (shown in Figure 5 ) . The top side metallization is comprised of a die pad for back

side device grounding and the wire bond fingers. The wire bond fingers extend outward to

plated through-holes in the package substrate located near the edge of the package The

plated through-holes provide electrical continuity from the top side to the bottom side of

1215

121 8

121 9

318

the package. The signal path is completed on the bottom side of the package by plated

copper traces extending from the plated through-hole to the solder bump termination. RX-

99 at 177, r[ 2.

1221. The 1991 OMPAC article states that all OMPAC designs at that time had metallization

layers on both sides of the package substrate. RX-99 at 177, 7 1.

1222. As illustrated in Figure 2 of the 1991 OMPAC article, the device has terminals on the

bottom side of the backing element and displaced vias. Tr. 18 14: 1 1-1 6 (Charles); RX-99

at Fig. 2.

As of the date of the May 1991 OMPAC article, all OMPAC designs had used double-

sided printed circuit boards; fbture plans include the investigation of multilayer boards to

accommodate multichip and high speed circuit applications. With such a design, there

would be no terminals on the top surface of the backing element. RX-99 at 177, 7 1 ; Tr

18 15: 19-1 8 16:20 (Charles).

1224. The 1991 OMPAC article does not disclose a package having terminals on the top surface

of the package substrate. Rx-99.

1225. The 1991 OMPAC article does not disclose a package having terminals or solder balls in

direct alignment with through-hole vias. RX-99.

1226. There is no teaching or suggestion in the 1991 OMPAC article of having electrically

active solder balls and terminals directly aligned with vias. RX-99 at second page, first

paragraph; Tr. 1815:19-1816:20 (Charles).

1227. The 1991 OMPAC article teaches away from having electrically active solder balls and

terminals directly aligned with vias. RX-99 at second page, first paragraph.

1223

3 19

1228. There is no teaching or suggestion in the 1991 OMPAC article of having terminals on the

top surface of the package substrate. RX-99 at second page, first paragraph; Tr. 18 15: 19-

1816:20 (Charles).

1229. The 199 1 OMPAC article teaches away from having terminals on the top surface of the

1230.

1231.

1232.

1233.

1234.

1235.

1236.

1237.

package substrate. RX-99 at second page, first paragraph.

Sharp has failed to establish that any particular OMPAC is a commercial embodiment of

the Lin patent. See Tr. 1542:3-1588 (Lin).

Sharp has provided no documentation that any DSP, HCl 1 chip or FSRAM was packaged

with any version of OMPAC in 1989 or 1990 for sale in the United States. Tr. 1542:3-

1588:9 (Lin).

Sharp has provided no documentation that any L8 chip was packaged using any version of

OMPAC in 1990 for sale in the United States. Tr. 1542:3-1588:9 (Lin).

Sharp failed to provide any documentation that any OMPAC package built in 1990 used

Amicon 900 as its die attach material. Tr. 1542:3-1588:9 (Lin).

Sharp has provided no documentation establishing that any OMPAC chip packages

containing hnctional dies were built by work week 37 of 1989. Tr. 1584:23-1585:7 (Lin).

Sharp has provided no documentation that any OMPACs were sold in the United States by

1990. Tr. 1542:3-1588:9 (Lin).

Sharp has provided no documentation about the material properties of the allegedly

anticipatory OMPACs that Motorola tested by October 1989. Tr. 1542:3-1588:9 (Lin).

Sharp has provided no documentation about material properties of the allegedly

anticipatory OMPACs being used in Motorola products in the 1990 time period. Tr.

3 20

1238.

1239.

1240.

1241

1242

1243

1244

1245

1542:3-1588:9 (Lin).

D. The Mu Patent

The Mu patent was cited by Tessera to the U.S. Patent and Trademark Office during the

prosecution of the ‘977 patent application. CX-4 (October 18, 1996 Information

Disclosure Statement).

In a pin grid array package with thin and long pins, it is recognized that the external pins

will take up all of the CTE mismatch. Tr. 1749:23-1751:4 (Charles).

The Mu patent does not disclose the use of very short pins that are very large in diameter

to one of ordinary skill in the art at the time of the Mu patent. Tr. 1 9 10: 8- 19 1 1 : 13

(Engelmaier),

The Mu patent does not disclose using pins that are large in diameter. Tr. 19 10:8- 19 1 1 : I3

(Engelmaier); RX-90 at 3: 11-4:2.

If the pins were larger in diameter, then the corresponding holes in the printed circuit

board would have to be larger, thereby giving up valuable space on the printed circuit

board. The whole drive in the industry was to make the holes in the board smaller to gain

more space. Tr. 1910:8-1911:13 (Engelmaier).

The Mu patent does not disclose the use of very short pins. RX-90 at 3 : 11-4:2.

If a pin is made shorter, it goes (for example) only halfway through the printed circuit

board. One of ordinary skill in the art would recognize that this presents a reliability

problem because the plated through-hole of the printed circuit board would crack due to

the stress concentration. Tr. 19 10: 8- 19 1 1 : 13 (Engelmaier).

The Mu patent discloses the problems associated with the metal conductors or traces on

321

prior art package substrates. In particular, “very long trace lengths had an increased

parasitic inductance and capacitance over the very short lengths. Further, this would

create the problem of an electrical signal delay between the different traces or signal

channels.” RX-90 at 1 :24-39.

1246. The Mu patent discloses that it would be expedient to reduce the physical length of the

very long traces so that the difference in lengths of all of the traces are less than the

conventional pin grid array structures, thereby equalizing the electrical signal delay

between different channels. RX-90 at 1 :40-47.

1247. To this end, the Mu patent discloses the following objects of the invention: to provide a

pin grid array structure which has a wiring board having a plurality of conductor runs in

which first conductor runs extend outwardly from the bonding pads on the outer lead bond

area and alternating second conductor runs extend inwardly from the bonding pads on the

outer lead area; and to provide a pin grid array package structure which has a wiring board

in which the physical lengths of all of the traces are substantially equal for equalization of

signal delays. RX-90 at 1:64-2:7.

1248. The Mu patent discloses making the physical lengths of some of the traces on the package

substrate shorter: “Due to the alternating pattern of the conductor runs away from the

OLB area 34a, the physical lengths thereof are made shorter, and there has been eliminated

the very long and very short interconnection traces among the different terminal pads as in

the prior art PGA packages. Consequently, the differences between the physical length of

the present conductor runs are less than 50% of the conventional PGA packages.” RX-90

at 4: 16-23.

322

1249. Towards the end of the detailed description, the Mu patent summarizes the invention as

follows: “From the foregoing detailed description, it can thus be seen that the above

described embodiment provides a pin grid array package structure which has a higher

packaging density than the conventional PGA packages. The PGA structure of the present

invention includes a substrate or wiring board in which very long and very short

interconnection traces among the different terminal pads have been halved. This is

accomplished by the provision of first conductor runs which extend outwardly from the

bonding pads on the outer lead bond area and alternating second conductor runs which

extend inwardly from the bonding pads on the outer bond area. Further, capacitive loading

networks are formed in the conductor runs so as to equalize electrical signal delays

between the conductor runs.” RX-90 at 5:34-48.

1250. The Mu patent only discloses one material for the package substrate: a printed circuit

board material. The Mu patent does not disclose the modulus or thickness of the package

substrate. RX-90 at 3:50-52, Fig. 1 .

125 1. The Mu patent fails to disclose that the package substrate is flexible. Tr. 19 1 1 : 14- 19 12: 18

(Engelmaier).

1252. The standard understanding of one of ordinary skill in the art of a printed circuit board is

that it is rigid. Tr. 191 1:14-1912:18 (Engelmaier).

1253. The point of a pin grid array package is to insert a large number of pins into corresponding

holes in a printed circuit board. Tr. 191 1:14-1912:18 (Engelmaier).

1254. The Mu patent contemplates a pin grid array package having up to 410 pins. RX-90 at

3:20-23; Tr. 191 1:14-1912:18 (Engelmaier).

3 23

125 5. Inserting 4 10 pins into 4 10 holes is not easy to do, and it would be impossible if the

package was flexible because the pins would bend out of alignment. Tr. 19 1 1 : 14- 19 1 2: 1 8

(Engelmaier).

1256. The Mu patent does not discuss the problems of CTE mismatch or solder joint fatigue. Tr.

1822:3-5, 1829:24-1830:2 (Charles).

1257. The Mu patent does not expressly disclose terminals that move relative to the chip (and/or

chip contacts) to provide substantial compensation for differential thermal expansion

between the chip and the printed circuit board. RX-90.

1258. The Mu patent does not expressly disclose terminals that are movable relative to the chip

(and/or chip contacts) to significantly reduce the strain in the solder joints that results from

the differential thermal expansion between the chip and the printed circuit board. RX-90.

1259. The Mu patent does not expressly disclose terminals that are movable relative to the chip

and the chip contacts to significantly improve solder joint reliability. RX-90.

1260. The only information the Mu patent provides regarding the die attach is that it could be

“any type of adhesive material such as adhesive glue.” RX-90 at 4:33-36.

1261, The Mu patent does not identify the particular material, modulus or thickness of the die

attach. RX-90 at 4:33-36; Tr. 1822:20-1823:7, 1829:12-23 (Charles).

1262. The Mu patent does not exclude the possibility that a package built according to the

teachings of the Mu patent would have a thin die attach. RX-90; Tr. 1822:20-1823:7,

1829: 12-23 (Charles).

1263. The Mu patent does not exclude the possibility that a package built according to the

teachings of the Mu patent would have a rigid die attach. RX-90; Tr. 1822:20-1823 :7,

3 24

1264.

1265.

1266.

1267.

1268.

1269.

1270.

1829: 12-23 (Charles).

The more thin and the more rigid the die attach is, the more the CTE of the chip will

constrain the amount of movement experienced by the terminals on the top surface of the

package substrate. Tr. 1789: 13-20 (Charles).

For a given die attach thickness, the more rigid the die attach material, the more the CTE

of the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:3-7 (Charles).

For a given modulus of rigidity, the thinner the die attach material, the more the CTE of

the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:8-13 (Charles).

When you have a thin, rigid die attach, the package substrate will be constrained such that

it will expand or contract in close relation to the expansioh or contraction of the chip. Tr.

1786: 18-25 (Charles).

The more rigid the die attach is, the more the top surface of package substrate will track

the expansion of the chip. Tr. 1787: 1-14 (Charles).

Because a package built according to the teachings of the Mu patent may have a rigid die

attach, the package substrate may be constrained by the chip to the extent that the package

is incapable of providing sufficient movement of terminals (which are on the bottom

surface of the package substrate) to provide substantial compensation for differential

thermal expansion. Tr. 1786:3-13, 1786:18-25, 1787:l-14, 1789: 13-20, 1822:20-1823:7,

1829: 12-23 (Charles); RX-90.

Because a package built according to the teachings of the Mu patent may have a thin die

325

attach, the package substrate may be constrained by the chip to the extent that the package

is incapable of providing sufficient movement of terminals (which are on the bottom

surface of the package substrate) to provide substantial compensation for differential

thermal expansion. Tr. 1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20, 1822:20-1823:7,

1829: 12-23 (Charles); RX-90.

1271. The Mu patent does not necessarily disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. Tr. 1786:3-13, 1786: 18-25,

1787:l-14, 1789:13-20, 1822:20-1823:7, 1829:12-23 (Charles); RX-90.

1272. The Mu patent does not necessarily disclose terminals that are movable relative to the chip

(and/or chip contacts) to significantly reduce the strain in the solder joints that results from

the differential thermal expansion between the chip and the printed circuit board. Tr.

1786:3-13, 1786:18-25, 1787:l-14, 1789:13-20, 1822:20-1823:7, 1829: 12-23 (Charles);

RX-90.

1273. The Mu patent does not necessarily disclose terminals that are movable relative to the chip

and the chip contacts to significantly improve solder joint reliability. Tr. 1786:3- 13,

1786:18-25, 1787:l-14, 1789:13-20, 1822:20-1823:7, 1829:12-23 (Charles); RX-90.

E. The Hoppe Patent

1274. The Hoppe patent is entitled “Carrier Element for IC Modules.” The IC module of the

Hoppe patent is a semiconductor chip. In Figures 1 and 2 of the Hoppe patent, the IC

module - a semiconductor chip - is labeled 6. RX-92 at front page, 2: 17-18, Figs. 1 and 2.

1275. The contacts on the chip are called “terminals 8” in the Hoppe patent. RX-92 at 2:22-

326

25.The terminals on the film strip are called “contact surfaces 4” in the Hoppe patent. RX-

92 at 2:22-25.

1276. As shown in Figure 2 of the Hoppe patent, leads 7 connect the terminals 8 on the chip to

the contact surfaces 4 on the film strip. RX-92 at 2:22-25. The leads 7 are connected to

the terminals 8 of the chip by a soldering process. RX-92 at 2:48-5 1.

1277. The Hoppe patent states that “[tlhe invention relates to a carrier element for IC modules, in

which the module is soldered to a contact frame having a spider-like pattern in such a way

that the leads of the frame are connected with the corresponding terminals of the module at

one end (outer leads) and run into contact surfaces at the other end.” RX-92 at 1 :4-9. The

soldering referred to here is the soldering of the terminals 8 of the chip to the leads 7. RX-

92 at Fig. 2; Tr. 1912:19-1914:3 (Engelmaier).

1278. The Hoppe patent states that the arrangements disclosed in the Hoppe patent “can also be

soldered by hand e.g. into printed circuits of the usual construction, if need be.” RX-92 at

1 :37-39. The soldering referred to here is the soldering of the terminals 8 of the chip to

the leads 7. Tr. 1926: 1 1 - 1927: 1 1 (Engelmaier).

1279. In Figure 5 of the Hoppe patent, there are no soldered connections. Tr. 1914:24-1915: 1 1

(Engelmaier); RX-92 at Fig. 5 .

1280. The Hoppe patent discloses embodiments that are for use in smart cards or similar data

carriers. RX-92 at 1:40-42; Tr. 1912:19-1914:23 (Engelmaier).

128 1. The Hoppe patent discloses that “the contact surfaces on the film bearing the module

should be designed from the start in such a way that direct contacting is possible when the

card is used in automata, e.g. by means of contact pins.” RX-92 at 1 :46-50. The contact

3 27

pins referred to are the pins in an automatic card-reader machine. Tr. 1912: 19-1914:23

(Engelmaier). When the card is inserted into a slot in the card-reader machine, the contact

surfaces 4 make sliding contact with the pins in the machine. Tr. 19 12: 19- 191 4:23

(Engelmaier).

1282. The Hoppe patent discloses that “the contact surfaces, which must have a minimal area of

1-2 rnm’ in the case of galvanic contacting in an automaton, are arranged in a circle around

the window area. . , .” RX-92 at 151-54. The area of the contact surfaces is illustrated in

Figure 1 of the Hoppe patent. Tr. 1912: 19-1914:23 (Engelmaier); RX-92 at Figure 1 . The

“galvanic contacting in an automation” refers to the fact that the pins in the dispensing

machine make electrical contact with the contact surfaces 4 of the various embodiments

illustrated in the Hoppe patent. Tr. 19 12: 19- 19 14:23 (Engelmaier); RX-92 at 1 : 5 1 -54.

1283. The Hoppe patent does not disclose soldering the contact surfaces (4) on the film strip to

contact pads on a printed circuit board. Tr. 19 12: 19-1 9 15 : 1 1, 1926: 1 1 - 1927: 1 1

(Engelmaier); RX-92.

1284. The Hoppe patent does not discuss the problem of solder joint fatigue. RX-92; Tr.

18 19: 12- 16 (Charles).

1285. The Hoppe patent does not discuss the problem of CTE mismatch. RX-92; Tr. 1830: 15-1 8

(Charles).

1286. The Hoppe patent does not expressly disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. RX-92.

1287. The Hoppe patent does not expressly disclose terminals that are movable relative to the

3 28

chip (and/or chip contacts) to significantly reduce the strain in the solder joints that results

from the differential thermal expansion between the chip and the printed circuit board.

RX-92.

1288. The Hoppe patent does not expressly disclose terminals-that are movable relative to the

chip and the chip contacts to significantly improve solder joint reliability. RX-92

1289. The only description in the Hoppe patent of the die attach is in the context of Figure 3:

Hoppe states that the chip 1 1 may be attached to the film strip 1 “by a suitable glue 12

before the bending process so that it is securely positioned during same.” RX-92 at 3:2-4,

Figs. 3 and 5.

1290. The Hoppe patent does not expressly disclose the material, thickness or modulus of the die

attach. RX-92; Tr. 1830:6-14 (Charles).

1291. The Hoppe patent does not exclude the possibility that a package built according to the

teachings of the Hoppe patent would have a thin die attach. RX-92.

1292. The Hoppe patent does not exclude the possibility that a package built according to the

teachings of the Hoppe patent would have a rigid die attach. RX-92.

1293. The more thin and the more rigid the die attach is, the more the CTE of the chip will

constrain the amount of movement experienced by the terminals on the top surface of the

package substrate. Tr. 1789: 13-20 (Charles).

1294. For a given die attach thickness, the more rigid the die attach material, the more the CTE

of the chip will constrain the movement of the top surface of the package substrate. Tr

1786:3-7 (Charles).

1295. For a given modulus of rigidity, the thinner the die attach material, the more the CTE of

3 29

the chip will constrain the movement of the top surface of the package substrate. Tr.

1786:8- 13 (Charles).

1296. When there is a thin, rigid die attach, the package substrate will be constrained such that it

will expand or contract in close relation to the expansion or contraction of the chip Tr.

1786: 18-25 (Charles).

1297. The more rigid the die attach is, the more the top surface of package substrate will track

the expansion of the chip. Tr. 1787:l-14 (Charles).

1298. Because a package built according to the teachings of the Hoppe patent may have a rigid

die attach, the package substrate may be constrained by the chip to the extent that the

package is incapable of providing sufficient movement of terminals (which are on the

bottom surface of the package substrate) to provide substantial compensation for

differential thermal expansion. Tr. 1786:3-1787: 14, 1789: 13-20 (Charles); RX-92.

1299. Because a package built according to the teachings of the Hoppe patent may have a thin

die attach, the package substrate may be constrained by the chip to the extent that the

package is incapable of providing sufficient movement of terminals (which are on the

bottom surface of the package substrate) to provide substantial compensation for

differential thermal expansion. Tr. 1786:3-1787: 14, 1789: 13-20 (Charles); RX-92.

1300. The Hoppe patent does not necessarily disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. Tr. 1786:3-1787: 14, 1789: 13-20

(Charles); RX-92.

1301. The Hoppe patent does not necessarily disclose terminals that are movable relative to the

330

1302.

1303.

1304.

1305.

1306.

1307.

1308.

1309.

1310.

chip (and/or chip contacts) to significantly reduce the strain in the solder joints that results

from the differential thermal expansion between the chip and the printed circuit board. Tr.

1786:3-1787:14, 1789: 13-20 (Charles); RX-92.

The Hoppe patent does not necessarily disclose terminals that are movable relative to the

chip and the chip contacts to significantly improve solder joint reliability. Tr. 1786:3-

1787: 14, 1789: 13-20 (Charles); RX-92.

The Hoppe patent does not mention either the Suhir article or any reference relating to die

attach compliancy. RX-92; Tr. 1830: 19-22 (Charles).

Figure 2 of the Hoppe patent (which has no die attach between the chip and the film

carrier) illustrates a face-down embodiment. Tr. 18 19:4-6 (Charles); RX-92 at Fig. 2.

F. The Grube Patent

The Grube patent was filed September 13, 1990. RX-95 at front page.

The Grube patent does not predate the invention date of any asserted claim of the

patents-in-suit. RX-95.

The Grube patent discloses a low temperature method of directly attaching a chip

(face-down) to a PCB substrate or a substrate of a multi-chip module. RX-95 at 2:3-30.

As illustrated in the first step of Figure 2 of the Grube patent, the interposer 16 has a

number of vias (holes) that conform to the C-4 solder bump pattern of the chip. RX-95 at

4:48-53, Fig. 2.

The interposer may be made of a filled elastomer (with typical fillers including glass or

ceramic). RX-95 at 4:33-40.

The interposer does not have a copper layer from which terminals and leads are etched.

?? 1 J J I

Instead, the holes of the interposer are filled with a composite paste, the excess of which is

wiped off (as illustrated in the second step of Figure 2). RX-95 at 5: 14-18, Fig. 2.

13 1 1. The Grube patent discloses the use of a composite joining material to join the chip to a

PCB or module substrate. The composite joining material is a paste “preferably formed of

a composite of a thermoplastic polymer such as a copolymer of polyimide and siloxane

and a fine metal such as gold powder.” Alternatively, low temperature solder may be

used. RX-95 at 1: l l -18, 4:61-5:1, 5:59-66.

13 12. The Grube patent does not disclose the modulus of the composite joining material. RX-95

at 1:ll-18, 4:61-5:13, 5:59-66.

13 13. The Grube patent discloses the filling of via holes in an interposer with joining (bonding)

material consisting of either a metal/polymer composite paste or solder paste. RX-95 at

5:14-18, Fig. 2, 1:11-18, 4:61-5:1, 5:59-66. Injoining the chip to aPCB or module

substrate by applying heat and pressure, the interposer provides a controlled contact joint

height for the formation of encapsulated contact joints. RX-95 at 2:55-59.

13 14. The Grube patent refers to the connections between the chip and the PCB or module

substrate as “contact joints” or “joints,” never as “leads.” RX-95 at 2: 15-1 8; 4: 18-26,

4129-33; 5:29-33.

13 15. The Grube patent does not expressly state that there are terminals that are movable relative

to the chip. Tr. 1824: 18-21 (Charles); RX-95.

13 16. The Grube patent does not expressly disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. RX-95; Tr. 1824: 18-2 1

332

1317.

1318

1319

1320

1321

1322

1323

(Charles).

The Grube patent does not expressly disclose terminals that are movable relative to the

chip (and/or chip contacts) to significantly reduce the strain in the solder joints that results

from the differential thermal expansion between the chip and the printed circuit board.

RX-95; Tr. 1824: 18-21 (Charles).

The Grube patent does not expressly disclose terminals that are movable relative to the

chip and the chip contacts to significantly improve solder joint reliability. RX-95; Tr.

1824: 18-21 (Charles).

The Grube patent does not exclude the possibility that an arrangement built according to

the teachings of the Grube patent would have a glass- or ceramic-filled interposer. RX-95

at 4:3 3-40.

The Grube patent does not exclude the possibility that an arrangement built according to

the teachings of the Grube patent would have a rigid conductive material connecting the

chip contacts to the PCB or module substrate. RX-95 at 4:64-5: 13.

The more rigid a material is, the more it resists deformation. Tr. 7323-I 4, 830: 14-83 1 :2

(Engeltnaier), 1826:s-10 (Charles).

The Grube patent does not necessarily disclose terminals that move relative to the chip

(and/or chip contacts) to provide substantial compensation for differential thermal

expansion between the chip and the printed circuit board. Tr. 1786:3-1787:14, 1789.13-20

(Charles); RX-95 at 4:33-40, 4:64-5: 13.

The Grube patent does not necessarily disclose terminals that are movable relative to the

chip (and/or chip contacts) to significantly reduce the strain in the solder joints that results

333

from the differential thermal expansion between the chip and the printed circuit board. Tr.

1786:3-1787:14, 1789: 13-20 (Charles); RX-95 at 4:33-40, 4:64-5:13.

1324. The Grube patent does not necessarily disclose terminals that are movable relative to the

chip and the chip contacts to significantly improve solder joint reliability. Tr. 1786.3-

1787:14, 1789:13-20 (Charles); RX-95 at 4:33-40, 4:64-5:13.

G. Secondary Considerations

1325. In lieu of having Mr. Brian Napper testify as to Sharp’s CSP sales live at the Hearing in

this Investigation, Sharp has stipulated that its CSP sales are accurately summarized by

CX-578 (RX-877), CX-579 (RX-878)’ and CX-580 (RX-879). CX-578 (RX-877);

CX-579 (RX-878); CX-580 (RX-879).

1326. From 1996 to March 2001, Sharp’s worldwide sales of CSPs exceeded [

and resulted in revenues to Sharp of more than [

1 7

1. cx -579

(RX-878); CX-576C at Sharp’s Response to Interrogatory No 206, and at Attachment 3;

CX-582C at Sharp’s Response to Interrogatory No. 206, and at Attachment 3. At the

currency exchange rate prevailing as of April 30, 2001 (124: 1 (JPY/$U.S.)), Sharp’s CSP

1327

sales revenues amount to more than [ I .

From June 1997 to February 2001, Sharp’s CSP sales into the United States alone

exceeded [ 3, and resulted in revenues to Sharp of more than [

1. CX-578 (RX-877); CX-14C at Sharp’s Response to Interrogatory No. 25;

CX-44C (SHA066559-C through SHA066576-C); CX-377C at Sharp’s Response to

Interrogatory No. 206, and at Attachment 1; CX-576C at Sharp’s Responses to

Interrogatory Nos. 1 and 206, and at Attachment 3; CX-582C at Sharp’s Response to

334

Interrogatory Nos. 1 and 206, and at Attachment 3 ,

1328. Moreover, from 1997 to April 2001, Sharp’s sales of camcorders that contain one or more

CSPs exceeded [ 1, and resulted in revenues to Sharp of more than [

1. CX-576C at Sharp’s Response to Interrogatory No. 25, at p. 4, and at

Attachments 1 and 2.

1329. Sharp has sold CSPs (and products containing same) that have been imported into the

United States, to numerous customers including, but not limited to, [

1. CX-32C at Sharp’s

Response to Interrogatory No. 200, and at Attachment 1 .

1330. Of the more than 50 models of CSPs that Sharp imports into the United States,

[ ] are produced in a single-layer forma i.e., with

die attach film DF-400. CX-20C at Sharp’s Response to Interrogatory No. 126(d), and at

Attachment Five at 2-3.

133 1 . Sharp’s sales of CSP models AILHF80BZE and AI LHF8OBZA account for [

] models

] of Sharp’s CSP sales into the United States. CX-580 (RX-879).

1332. Mr. Morihiro Kada, the general manager of Sharp’s chip packaging development

department, testified that [

1. Tr. 1336:13-25 (Kada).

1333. On its Internet Website, Sharp has published a graph that compares the board-level

reliability of Sharp’s single-layer structure CSP, with the board-level reliability of Sharp’s

double-layer structure CSP. Tr. 1292:5-1295: 15 (Kada); CX-49 at TESS272785.

335

1334. Mr. Kada testified that the "current type" interposer material identified in the graph is

Sharp's two-layer structure CSP. Tr. 1292: 16-1293: 13 (Kada).

1335. Mr. Kada testified that the "improved type" interposer material identified in the graph is

Sharp's single-layer structure CSP. Tr. 1293:21-1294:20 (Kada).

1336. Mr. Kada acknowledged that the graph illustrates that Sharp's single-layer structure CSP

has an improved reliability over Sharp's double-layer structure CSP. Tr. 1292: 16-1 295: 15

(Kada); CX-49 at TESS272785.

1337. Dr. Jianmin Qu testified that Sharp's single-layer CSP structure allows for more

movement between the terminal and the die than does Sharp's double-layer CSP structure.

Tr. 399:22-400: 18 (Qu).

1338. Mr. Werner Engelmaier testified that Sharp's single-layer CSP structure provides greater

solder joint reliability than does Sharp's double-layer CSP structure. Tr. 813:20-814: 19

(Engelmaier),

1339. Reliability is of utmost concern to manufacturers of products containing CSPs, primarily

because of the cost associated with CSP failure. Companies that use chip packaging

technology in their products impose on all semiconductor companies' rigorous reliability

standards. If a semiconductor company cannot meet the industry standards for reliability,

it is unlikely that they will be able to sell their CSP products into the market. Tr. 5 1 : 17-

52:7, 55: 1-19 (McWilliams).

1340. Reliability is a key concern in chip scale package development. Specifically, chip scale

packages must be able to meet industry standards for reliability during thermal cycling.

Much of the development and ingenuity in developing chip scale packages has focused on

336

making chip scale packages as reliable as conventional technology. Tr. 48:7-17

(McWilliams).

1341, Mr. Kada testified that board-level reliability is one factor that is important to CSP

customers in deciding which CSPs to purchase. Tr. 1284: 1-1285: 11 (Kada).

1342. In particular, Mr. Kada admitted that thermal cycling test data does matter to some of

Sharp's customers, and that in the past, some of Sharp's customers have complained about

low thermal cycling test data for Sharp CSPs. Tr. 1285:22-1286:3 (Kada).

1343. Further, Mr. Kada admitted that Sharp subjects its CSPs for cell phone applications to

thermal cycling tests at a temperature range from -40 "C to 125 "C. Tr. 1291 : 15-22

(Kada).

1344. The thermal cycling testing Sharp performs on its CSPs for cell phones from -40 "C to

125 "C indicates that Sharp's cell phone customers care about the thermal cycling test

data. See Tr. 1291 : 15-22 (Kada).

1345. Mr. Kada admitted that in 1997, certain customers of Sharp were concerned about thermal

cycling test board-level reliability data over a temperature range of -40 "C to 125 "C.

Customers used reliability data to decide whether to buy Sharp's CSPs or a competitor's

CSPs. Tr. 1286:12-17 (Kada).

1346. For the customers who cared about thermal cycling test board-level reliability data over a

temperature range of -40 "C to 125 "C, Mr. Kada admitted that Sharp tried very hard to

make sure that the thermal cycling test data presented to those customers was accurate and

reliable. Tr. 1286: 18-25 (Kada).

1347. Sharp conducts thermal cycling board-level reliability tests over a temperature range of -

337

40 “C to 125 “C. Tr. 1287:18-20 (Kada).

1348. Sharp advertises thermal cycling board-level reliability test results for CSPs on its Internet

Website, where Sharp’s CSP customers and competitors can view them. Tr. 1292:l-15

(Kada); CX-49 at TESS272772-73, TESS272778-87.

1349. Sharp’s Internet advertising explains the manner in which board-level reliability during

thermal cycling is affected by the material out of which the CSP interposer (e.g., die paste,

die bond film, insulator, etc.) is made. CX-49 at TESS272785.

13 50. Sharp’s Internet advertising explains how board-level reliability during thermal cycling is

affected by polyimide (PI) thickness. CX-49 at TESS272779-80.

135 1 . Sharp’s Internet advertising explains how board-level reliability during thermal cycling is

affected by solder ball size. CX-49 at TESS272780.

13 52. Sharp’s Internet advertising explains how board-level reliability during thermal cycling is

affected by the position in which the CSP is mounted on a printed circuit board. CX-49 at

TESS272783.

1 3 53. Sharp’s Internet advertising explains how board-level reliability during thermal cycling is

affected by the size of the semiconductor ship used in the CSP. CX-49 at TESS272787.

13 54. Sharp’s Internet advertising concerning thermal cycling board-level reliability tests

indicates that Sharp considers such reliability to be important to its CSP customers and

potential customers. CX-49 at TESS272772-73, TESS272778-87.

1355. Sharp’s CSPs include a flexible polyimide substrate, flexible leads, and a compliant die

attach structure that allows the polyimide substrate and copper traces to retain flexibility

and deform in the completed assembly. This CSP structure facilitates terminal movement.

338

Tr. 363:l-365: 15 (Qu); CPX-146C (time-scale modified FEA results for LRS133 1); CX-

167C (raw FEA results for LRS1331); Tr. 365:22-366:14, 367:11-368:22; CPX-145C

(time-scale modified FEA results for single-layer LHF80BZE); CX- 167C (raw FEA

results for single-layer LHF80BZE).

1356. The compliant die attach layers in Sharp’s CSPs facilitate movement of the terminals,

which has a significant impact on solder joint reliability. Tr. 8 16: 1 8-8 17.19 (Engelmaier),

CPX-99c; cx- 173 c ; cx- 174c.

1357. The purpose of Dr. Qu’s Coffin-Manson analysis was to determine whether the movable

terminals in Sharp’s CSPs improve reliability. Tr. 499: 1-10, 473:24-474:8, 467:25-468:22

(QU).

1358. According to the Coffin-Manson equation, if solder joint strain is reduced by one-third, or

about 33%, the solder joint fatigue life will approximately double. Tr. 346:22-348:8 (Qu);

CPX-64.

1359. According to the Coffin-Manson equation, if solder joint strain is reduced by one-half, or

50%, the solder joint fatigue life will approximately triple. Tr. 346:22-348:8 (Qu);

CPX-64.

1360. The finite element models of Sharp’s CSPs showed that the movable terminals in Sharp’s

CSPs reduced solder joint strain by an amount equivalent to allowing I to 2 microns of

horizontal movement. Tr. 445:6-11 (Qu); CPX-48; Tr. 618.1 1-619:lO (Qu).

1361. Dr. Qu extracted strain values for four representative Sharp CSPs from the finite element

models and compared these values to strain value for rigid CSPs with the same

dimensions. The movable terminals in these representative CSPs reduce strain 35% to

339

6O%, compared to a rigid CSP or flip chip. Tr. 1872:6-10 (Qu); CX-56OC.

1362. Sharp’s accused CSP devices include terminals that move with respect to the die to

accommodate differential thermal expansion, and thereby significantly improve reliability.

Tr. 43 1 :23-25, 442:s-443:9, 443:23-445:5 (Qu); CPX-48.

1363. As early as 1993, Mr. Smith believed that Tessera had novel and compelling packaging

technology which would dramatically change the packaging industry. Tr 23 1 :24-232:9

(Smith) .

1364. In the last ten years, more than 30 different companies have agreed to pay Tessera for the

use of Tessera’s patented chip packaging technology. Tr. 3 5 :4-37:5 (McWilliams);

CX-536 at 6.

1365. The long list of companies that have paid Tessera for licenses to use Tessera’s patented

chip packaging technology includes: Advanced Micro Devices, Inc. (AMD), Hitachi, Ltd.,

Hyundai Electronics Industries, Co., Ltd., Infineon, Siemens Aktiengesellschaft, Intel

Corporation, Samsung Electronics Co., Ltd., Samsung Aerospace, Samsung Electro-

Mechanics Co., Ltd., Sharp, Sony Corporation, ST Microelectronics, Toshiba Corporation,

ASE, MHT, Amkor Electronics, Inc., ChipMOS Technologies, Inc., Orient Semiconductor

Electronics, Ltd. (OSE), ChipPAC, Inc., Mitsui & Co., Ltd., Mitsui High-tec, Inc., Hitachi

Cable, Ltd., Integrated Packaging Assembly Corp. (PAC), EEMS Italia, SPA, Meicer

Semiconductor, Inc., Payton Technologies, Siliconware Packaging Industries, Ltd. (SPIL),

Shinko Electric Industries Co., Ltd., Dow Corning, North Corporation, Minnesota Mining

and Manufacturing (3M), Read Rite Corporation, LG Electronics, Inc., LG Semicon Co.,

Ltd., LG Micron Ltd., Flexera Pte. Ltd., Compeq Manufacturing Co., Ltd., and Flextech

340

Holdings, Ltd. Tr. 35:4-21 (McWilliams); CX-536 at 6; CX-323C.

1366. Tessera’s licensees include companies in different fields of the semiconductor chip

business, including semiconductor design and manufacturing, packaging and test, and

equipment and materials manufacturers. Tr. 35:4-37:5 (McWilliams); CX-536 at 6.

1367. [

1

1368. Some of the companies that have taken licenses to the technology contained in the ‘977

and ‘326 patents have gone on to take additional licenses from Tessera for patents that

involve the next generation of chip packaging technology, such as WAVE technology. Tr.

59:7-60:4 (McWilliams).

1369. The list of companies that have paid royalties to Tessera pursuant to license agreements

with Tessera includes: [

1

1370. Tessera’s receipt of royalties is directly tied to its licensees’ manufacture and/or sale of

products that utilize Tessera’s patented technology pursuant to the license agreements. Tr.

36: 19-37:5 (McWilliams).

1371.

1372. As part of its license agreement with Tessera, Advanced Micro Devices, lnc. (AMD)

agreed to pay Tessera a licensing fee of [

fee to Tessera up-front, [

The amount of royalties to Tessera totals at least [ 1. See c x - 3 2 3 c .

1. AMD paid [ ] licensing

1. CX-241C at

34 1

TESS006332-33.

1373. As part of its license agreement with Tessera, Hitachi, Ltd. agreed to pay Tessera a

licensing fee of [

[ 1. CX-259C at TESS005598.

1374. As part of its license agreement with Tessera, Hyundai Electronics Industries, Co., Ltd.

1. Hitachi paid [ 3 licensing fee to Tessera up-front,

(Hyundai) agreed to pay Tessera a licensing fee of [ 1. Hyundai paid [ 1

licensing fee to Tessera up-front, [

TESS005747.

1375. As part of its license agreement with Tessera, Siemens Aktiengesellschaft (Siemens)

3. CX-262C at

agreed to pay Tessera a licensing fee of [ 1. Siemens paid [ 1

licensing fee to Tessera up-front, [

TES S005908.

1376. As part of its license agreement with Tessera, Intel Corporation agreed to pay Tessera a

licensing fee of [

1. CX-309C at

1. Intel paid [ ] licensing fee to Tessera up-front, [

1. CX-266C at TESS005697.

1377. As part of its license agreement with Tessera, Samsung Electronics Co., Ltd. (Samsung)

agreed to pay Tessera a licensing fee of [ 1. Sainsung paid [ ] licensing

fee to Tessera up-front, [

TESS005806.

1378. As part of its license agreement with Tessera, Sony Corporation agreed to pay Tessera a

licensing fee of [

1. CX-297C at

1. Sonypaid [ ] licensing fee to Tessera up-front, [

1. CX-3 11C at TESS005928.

3 42

b

1379. As part of its license agreement with Tessera, Silicon Precision Industries Co., Ltd. (SPIL)

agreed to pay Tessera a licensing fee of [ 1. SPIL paid [ ] licensing

fee to Tessera up-front, [

1. CX-3 1OC at TESS005944-45

1380. As part of its license agreement with Tessera, Toshiba Corporation agreed to pay Tessera a

licensing fee of [

[ 1. CX-314C at TESS005988-89.

1. Toshiba paid [ ] licensing fee to Tessera up-front,

13 8 1. As part of its license agreement with Tessera, Advanced Semiconductor Engineering, Inc.

(ASE) agreed to pay Tessera a licensing fee of [ 1. ASE paid [ 1

licensing fee to Tessera up-front, [

1. CX-301C at TESS006386-87

1382. As part of its license agreement with Tessera, Amkor Electronics, Inc. (Atnkor) agreed to

pay Tessera a licensing fee of [ 1. Amkor paid [ ] licensing fee to

Tessera up-front, [

1. CX-242C at TESS006353-54.

1383. As part of its license agreement with Tessera, ChipMOS Technologies, Inc. (ChipMOS)

agreed to pay Tessera a licensing fee of [ 1. ChipMOS paid [ 1

licensing fee to Tessera up-front, [

1. CX-249C at TESS006405-06.

1384. As part of its license agreement with Tessera, Orient Semiconductor Electronics, Ltd.

(OSE) agreed to pay Tessera a licensing fee of [ 1. OSE paid [ 1

licensing fee to Tessera up-front, [ 1

3 43

I: 1. CX-290C at TESS247567-68.

1385. As part of its license agreement with Tessera, ChipPAC, Inc. agreed to pay Tessera a

licensing fee of [

[ 1. CX-250C at TESS006427.

1386. As part of its license agreement with Tessera, Mitsui High-tec, Inc. agreed to pay Tessera a

licensing fee of [

front, [

1387. As part of its license agreement with Tessera, Hitachi Cable, Ltd. agreed to pay Tessera a

licensing fee of [

front, [

1388. As part of its license agreement with Tessera, EEMS Italia, SPA (EEMS) agreed to pay

Tessera a licensing fee of [ 1. EEMS paid [

Tessera up-front, [

3. ChipPAC paid [ ] licensing fee to Tessera up-front,

]. Mitsui High-tec paid [ ] licensing fee to Tessera up-

1. CX-286C at TESS005637.

]. Hitachi Cable paid [ ] licensing fee to Tessera up-

3. CX-257C at TESS006504.

] licensing fee to

1. CX-252C at TESS00645 1 .

1389. As part of its license agreement with Tessera, Meicer Semiconductor, Inc. (Meicer) agreed

to pay Tessera a licensing fee of [

Tessera up-front, [

1. Meicer paid [ 3 licensing fee to

1. CX-275C at TESS005775-76.

1390. As part of its license agreement with Tessera, Shinko Electric Industries Co., Ltd. (Shinko)

agreed to pay Tessera a licensing fee of [ 1. Shinko paid [ ] licensing

I . fee to Tessera up-front, [

CX-304C at TESS005868.

3 44

1391. As part of its license agreement with Tessera, Mitsui & Co., Ltd. (Mitsui) agreed to pay

Tessera a licensing fee of [

front, [

1392. As part of its license agreement with Tessera, Read-Rite Corporation (Read-Rite) agreed

to pay Tessera a licensing fee of [ ] licensing fee to'

Tessera up-front, [

1393. As part of its license agreement with Tessera, Flexera Pte. Ltd. (Flexera) agreed to pay

Tessera a licensing fee of [ 3 licensing fee to Tessera

up-front, [

1394. As part of its license agreement with Tessera, Compeq Manufacturing Co., Ltd. (Compeq)

agreed to pay Tessera a licensing fee of [

fee to Tessera up-front, [

TESS006069.

1395. As part of its license agreement with Tessera, LG Semicon Co. Ltd. (LG Semicon) agreed

to pay Tessera a licensing fee of [

to Tessera up-front, [

TES SO05 724.

1396. As part of its license agreement with Tessera, LG Micron Ltd. (LG Micron) agreed to pay

Tessera a licensing fee of [ 1. LG Micron paid [

Tessera up-front, [

1397. As part of its license agreement with Tessera, Flextech Holdings Limited (Flextech)

]. Mitsui paid [ ] licensing fee to Tessera up-

1. CX-285C at TESS006187.

1. Read-Rite paid [

1. CX-293C at TESS00623 1 .

3. Flexera paid [

1. CX-253C at TESS006112.

1. Compeq paid [ ] licensing

1. CX-263C at

1. LG Semicon paid [ ] licensing fee

1. CX-272C at

] licensing fee to

1. CX-271C at TESS006143.

agreed to pay Tessera a licensing fee of [ 1. Flextech paid [ 1

345

1. CX-255C at licensing fee to Tessera up-front, [

TESS006092.

1398. As part of its license agreement with Tessera, Samsung Aerospace (SA) agreed to pay

Tessera a licensing fee of [

front, [

1399. As part of its license agreement with Tessera, Minnesota Mining and Manufacturing (3M)

agreed to pay Tessera a licensing fee of [

to Tessera up-front, [

TESS006011.

1400. To improve solder joint reliability, those in the industry attempted to manipulate the

variables of the Strain Equation to reduce strain in the solder joints of an electronic

package. This generally involved solutions that were external to the electronic package.

Tr. 693:9-695:20 (Engelmaier); CPX-74.

140 1. For example, strain could be reduced by using smaller packages to reduce the distance to

the neutral point, or DNP. However, this ran counter to the industry's need for larger

chips with a greater number of I/Os. Tr. 693:9-21 (Engelmaier); CPX-74.

1402. Strain could also be reduced by attempting to "match" the CTEs of the package and the

PCB to reduce Aa; for example, through the use of ceramic packages on a ceramic

mounting substrate. However, this limited the materials that could be used for packages

and/or printed circuit boards. Tr. 693 :9-694:6 (Engelmaier); CPX-74.

1403. One example of the attempt to solve the problem of solder joint failure by CTE matching

is found in the Lin patent, which purports to improve the life of the solder joints by

]. SA paid [ ] licensing fee to Tessera up-

1. CX-295C at TESS006279.

1. 3M paid [ ] licensing fee

3 . CX-278C at

3 46

matching the thermal coefficients of the package substrate and the printed circuit board.

Tr. 1554:7-13 (Lin); RX-6 at 3:9-17.

1404. The Lin patent does not necessarily disclose terminals that are movable relative to the chip

and the chip contacts to significantly improve solder joint reliability. Tr. 1786.3-1 3,

1786: 18-25, 1787: 1-14, 1789: 13-20, 1791:ll-18 (Charles); RX-6.

1405. Another strategy for reducing strain might be to limit the temperature range to which the

mounted package will be subjected. Tr. 693 :9-694:6 (Engelmaier); CPX-74.

1406. One could also attempt to reduce solder joint strain by increasing the height of the solder

joints, such as through the use of solder columns Tr. 693:9-694:6 (Engelmaier); CPX-54,

CPX-74.

1407. The invention of the ‘977 and ‘326 patents differed dramatically from the prior art in that

the inventors brought the solution of moveable terminals inside the package. Tr. 695.21 -

698: 12 (Engelmaier).

1408. In an e-mail dated September 1997, [

] In another e-mail dated September

1997, [

] Although Mr. Kada attempted to take the position that the e-mail

did not discuss [ 1, he admitted that [

] CX-82C; CX-8OC; Tr. 1317:23-1319:14 (Kada).

1409. In addition, Mr. Kada understood in September 1997 that he needed to show [

Sharp could solve the problem with its CSPs. Tr. 1320: 12-22 (Kada); CX-82C.

1410. During his direct examination, Mr. Kada testified that Sharp did improve its package for

] that

3 47

[ ] by increasing: [ I .

Specifically, Mr. Kada did not mention in his direct examination any improvements to the

1. Tr. 1321:3-13 (Kada).

141 1. However, two documents dated April 1998 indicate that [

3. Tr.

1321 : 14-1324:3 (Kada); CX-74C, CX-75C.

1412. Also, in April 1998 with test results for an improved Sharp CSP structure compared to

Sharp’s former CSP structure. The document emphasizes that [

The document says nothing about any structural change based on [

3. CX-75; Tr. 1324:4-1325:lO

(Kada).

14 13. Sharp has known about Tessera’s packaging technology - including the use of a compliant

die attach layer to improve solder joint reliability - since well before Sharp started

shipping its CSPs in August 1996. Indeed, Tessera first visited Sharp in Japan in March

1995. Sharp evaluated samples of Tessera licensed pBGA packages in June 1995. Sharp

also met with Tessera in July 1995 and April 1996. Mr. Kada also testified in deposition

that he was well aware of Tessera’s compliant die attach technology. RDX-19; CX-33 1 C

(Kada Dep.) Tr. 321:15-322:13, 438:14-439:lS.

1414. From the beginning of the development of its CSPs to the present, Sharp has continually

improved the TCT board level reliability of its CSPs by altering the die attach materials.

348

Tr. 1325:15-1326:2 (Kada); CX-54C, CPX-1OOC.

1415. Thus, Sharp's actions have demonstrated a longtime awareness of, and a conscious effort

toward, the improvement of the reliability of its CSPs by continually improving the die

attach structure to make it more compliant. Tr. 1327: 1-1328:4 (Kada); CX-49, CX-74C,

CX-75C, CX-87; CX-378C.

V. ENFORCEABILITY

1416. The Notice of Allowability in the '266 patent application was mailed January 28, 1992.

c x - 5 .

1417. The claims pending in the '266 patent application were allowed before the Grube patent

issued. CX-5; RX-95.

1418. The Grube patent does not disclose the following limitation of claim 1 of the '266 patent:

"a plurality of terminals disposed in a pattern on said second surface of said interposer."

Tr. 745:4-746:4, 754: 19-755:24 (Engelmaier); RX-95 at 5:26-33, Figures 3-4.

141 9. The Grube patent does not disclose the following limitation of claim 1 of the '266 patent:

"a flexible conductive lead extending between each said terminal and the associated one of

said contacts." Tr. 735:20-737: 13 (Engelmaier).

1420. The Grube patent does not disclose the following limitation of claim 1 of the '266 patent:

"said terminals being moveable relative to the contact ends of said leads so as to

compensate for thermal expansion of said chip." Tr. 1824: 18-21 (Charles); RX-95 at

4133-40, 4:64-5:13.

1421. The Grube patent does not disclose the following limitation of original claim 1 of the '266

349

patent application: "a plurality of terminals disposed in a pattern on said second surface of

said interposer." Tr. 745:4-746:4, 754: 19-755:24 (Engelmaier); RX-95 at 5:26-33, Figures

3-4.

1422. The Grube patent does not disclose the following limitation of original claim 1 of the '266

patent application "a flexible conductive lead extending between each said terminal and

the associated one of said contacts." See Tr. 735:20-737: 13 (Engelmaier).

1423. The Grube patent does not disclose the following limitation of original claim 1 of the '266

patent application "said terminals being moveable relative to the contact ends of said

leads." See Tr. 1824:18-21 (Charles); RX-95 at 4:33-40, 4:64:-5: 13.

1424. The Grube patent does not disclose the following limitation of claims 1 and 22 of the '977

patent "flexible sheetlike element having terminals thereon." See RX-95 at 5:26-33,

Figures 3-4; Tr. 745:4-746:4, 754: 19-755:24 (Engelmaier).

1425. The Grube patent does not disclose the following limitation of claims 1 and 22 of the '977

patent "flexible leads electrically connecting said terminals to said contacts." See Tr.

735:20-737: 13 (Engelmaier).

1426. The Grube patent does not disclose the following limitation of claims 1 and 22 of the '977

patent "said terminals are movable with respect to said chip and said contacts." See Tr.

1824:18-21 (Charles); RX-95 at 4:33-40, 4:64-5:13.

1427. The Grube patent does not disclose the following limitation of claims 1 and 22 of the '977

patent "said flexible leads and said flexible sheetlike element being adapted to deform to

accommodate movement of said terminals with respect to said contacts." See Tr. 1824: 18-

21 (Charles); RX-95 at 4:33-40, 4:64-5:13.

350

1428. The Grube patent does not disclose the following limitation of originally filed claim 1 of

the '977 patent application "a flexible sheetlike element having terminals thereon

electrically connected to said contacts." See RX-95 at 5:26-33, Figures 3-4; Tr. 745:4-

746:4, 754: 19-755:24 (Engelmaier).

1429. The Grube patent does not disclose the following limitation of originally filed claim 1 of

the '977 patent application "said terminals are movable with respect to said chip." See Tr.

1824: 18-21 (Charles); RX-95 at 4:33-40, 4:64-5: 13.

1430. The Grube patent does not disclose the following limitation of originally filed claim 1 of

the '977 patent application "the assembly includes resilient means for permitting

movement of said terminals toward said chip." See Tr. 1824: 18-21 (Charles); RX-95 at

4:33-40, 4:64-5:13.

143 1 . The Grube patent does not disclose the following limitation of originally filed claim 7 of

the '977 patent application "assembling a flexible, sheetlike element having terminals

thereon to a semiconductor chip." See RX-95 at 5:26-33, Figures 3-4; Tr. 745:4-746:4,

754: 19-755:24 (Engelmaier).

1432. The Grube patent does not disclose the following limitation of originally filed claim 7 of

the '977 patent application "connecting terminals on said sheetlike element to contacts on

said chip." See RX-95 at 5:26-33, Figures 3-4; Tr. 745:4-746:4, 754: 19-755:24

(Engelmaier).

1433. The Grube patent does not disclose the following limitation of originally filed claim 7 of

the '977 patent application "the assembly includes resilient means for permitting

movement of said terminals towards said surface of said chip." See Tr. 1824:18-21

351

(Charles); RX-95 at 4:33-40, 4:64-5: 13.

1434. Figure 4 of the invention disclosure form for the '558 patent identifies the conductive

column as "polyimide/siloxane-gold composite joint. 'I It does not identify the connection

as a "lead." RX-777C at 11.

1435. Figure 8 of the invention disclosure form for the '558 patent depicts an actual cross-

section of a direct chip attach (DCA) joint between a solder bumped chip and a substrate.

RX-777C at 15.

1436. The invention disclosure form for the '558 patent consistently refers to the connection

between the chip and the substrate as a "joint." The disclosure never refers to such a

connection as a "lead." See RX-777C at 1 of 15 (problem solved by invention is

"[flluxless low temperature direct chip attach scheme compatible with chip burn-in and

resulting in joint encapsulation"), 4 of 15 ("Due to the need to apply pressure, it is difficult

to control the height of a joint, which in turn can result in an increase of effective thermal

stresses. The joint height can be readily controlled by introducing an interposer, as shown

if Figure 2."), 5 of 15 ("If the properties of the interposer material match those of the

PISI/Au joint (or any other joining material used in conjunction with the interposer

scheme), the interposer ends up performing the fbnction of an encapsulant. As such, it

distributes the stresses along the entire chip/substrate area, effectively lowering stresses on

the joints themselves."), 6 of 15 ("Reduction of the invention to practice is demonstrated

in Figure 8, depicting a [cross-section] of the actual Chiphnterposer to substrate joint. ").

1437. The IBM invention disclosure form does not disclose the following limitation of claim 1

of the '266 patent "a plurality of terminals disposed in a pattern on said second surface of

352

said interposer." See RX-777C; Tr. 745:4-746:4, 754: 19-755:24 (Engelmaier).

1438. The IBM invention disclosure form does not disclose the following limitation of claim 1

of the '266 patent "a flexible conductive lead extending between each said terminal and

the associated one of said contacts." See RX-777C; Tr. 735:20-737: 13 (Engelmaier).

1439. The IBM invention disclosure form does not disclose the following limitation of claim 1

of the '266 patent "said terminals being moveable relative to the contact ends of said leads

so as to compensate for thermal expansion of said chip." See RX-777C; Tr. 1824: 18-21

(Charles).

1440. Dr. Khandros testified that he did not recall becoming aware of the Grube patent when it

issued. RX 332C (Khandros Dep.) Tr. 206:24-207: 10.

1441. Sharp failed to prove that Dr. Khandros was aware of the Grube patent when it issued. See

RX 332C (Khandros Dep.) Tr. 206:24-207: 10.

1442. Sharp failed to prove that Dr. Khandros was aware of the Grube patent during the

pendency of the '266 patent application. See RX 332C (Khandros Dep.) Tr. 206:24-

207: 10.

1443. Sharp failed to prove that Dr. Khandros was aware of the Grube patent during the

pendency of the '977 patent application. See RX 332C (Khandros Dep.) Tr. 206:24-

207: 10.

1444. Sharp failed to prove that Dr. Khandros was aware of the materiality of the Grube patent

during the pendency of the '266 patent application. See RX 332C (Khandros Dep.) Tr.

206:24-207: 10.

1445. Sharp failed to prove that Dr. Khandros was aware of the materiality of the Grube patent

3 53

during the pendency of the '977 patent application. See RX 332C (Khandros Dep.) Tr.

206124-207: 10.

1446. Dr. Khandros testified that he did not recall talking to Mr. Millet about the Grube patent

application RX 332C (Khandros Dep.) Tr. 120:3-12.

1447. Sharp failed to prove that Mr. Millet was aware of the Grube patent during the pendency

of the '266 patent application. See RX 332C (Khandros Dep.) Tr. 120:3-12.

1448. Sharp failed to prove that Mr. Millet was aware of the materiality of the Grube patent

during the pendency of the '266 patent application. See RX 332C (Khandros Dep.) Tr.

120: 3 - 1 2.

1449. Sharp failed to prove that Mr. Millet was aware of the materiality of the Grube patent

during the pendency of the '977 patent application. See RX-95; RX-445; RX-448.

1450. Mr. Millet cited the Grube patent in two different Tessera patents that are unrelated to the

patents-in-suit. These two Tessera patents are U.S. Patent No. 5,808,874 issued to Smith

("Smith") (RX-445) and U.S Patent No. 6,020,220 issued to Gilleo et al. ("Gilleo") (RX-

448).

145 1 . Smith discloses a face-down arrangement that uses liquid, flowable conductive masses to

connect a chip to a printed circuit board substrate. RX-445 at Fig. 4, 2: 12-42.

1452. Gilleo discloses a face-down arrangement that has conductive polymer disposed within the

apertures of an interposer layer. RX-448 at 5:32-37.

1453. Like Grube, both Smith and Gilleo disclose the use of conductive material in a face-down

arrangement. In contrast, the claimed inventions use leads - not conductive polymer paste

- to connect chip contacts to terminals on a package substrate. See RX-445 at Fig. 4,

3 54

2:12-42; RX-448 at 5:32-37; RX-95 at 1:11-18, 4:61-5:1, 5:59-66.

1454. In a February 21, 1991 memorandum prepared by Roger Borovoy, Mr. Borovoy

memorialized a conversation he had with Igor Khandros. CX-352C at 2-4.

1455. In the Borovoy memorandum, Mr. Borovoy wrote that Dr. Khandros said that IST had

absolutely no plans for using IBM’s proprietary joining material technology. Instead, IST

planned to employ surface mount technology using commercially available solder pastes

CX-352C at 2.

1456. In the Borovoy memorandum, Mr. Borovoy wrote that Dr. Khandros said that applications

of IST’s chip attach techniques do not require any joining materials that are not

commercially available. CX-3 52C at 2-3.

VT. DOMESTIC INDUSTRY

1457. On January 24, 200 1 , the Administrative Law Judge issued Order 13 : INITIAL

DETERMINATION Granting Complainant Tessera’s Motion for Summary Determination

of Domestic Industry, in which he found that Tessera established a domestic industry

protected by the patents-in-suit as required by 19 U.S.C. 5 1337. Order No. 13 (Jan. 24,

2001).

1458. On February 26, 200 1, the U. S. International Trade Commission determined not to review

the initial determination of the Administrative Law Judge granting summary determination

that the domestic industry requirement of section 337 of the Tariff Act of 1930 is satisfied.

Notice of Commission Determination Not to Review Initial Determination (Feb. 26,

200 1).

355

CONCLUSIONS OF LAW

1. The Commission has personal jurisdiction over the parties and subject matter

jurisdiction over this investigation. See Op. at 2-3

2. Sharp has imported accused products, and has sold accused products after importation

See Op. Section 11; FF, Sections I1 and IV G.

3. The accused Sharp products directly infringe the asserted claims of the ‘977 patent

See Op. at 63-83, 88.

4. Sharp contributorily infringes, and induces infringement of, claim 22 of the ‘977

patent. See Op. at 83-84.

5 . The accused Sharp products directly infringe the asserted claims of the ‘326 patent.

See Op. at 84-88.

6. It has not been established by clear and convincing evidence that the asserted claims

are invalid for indefiniteness under 35 U.S.C. 8 112, r[ 2. See Op. 91.

7. It has not been established by clear and convincing evidence that either the ‘977 patent

or ‘326 patent is invalid due to the prior art. See, e.g., Op. at 92 (the Lin patent), 104-106 (the

OMPAC article), 106-108 (the Mu patent), 108-109 (the Hoppe patent), 109-1 11 (the Grube

patent). s

8. It has not been established that either the ‘977 patent or the ‘326 patent is

unenforceable due to inequitable conduct. See, e.g., Op. 11 1-1 13

9. A domestic industry exists, as required by section 337. See Op. at 113-1 14

356

INITIAL DETERMINATION AND ORDER

Based on the foregoing opinion, findings of fact, conclusions of law, the evidence, and the

record as a whole, and having considered all pleadings and arguments, including the proposed

findings of fact and conclusions of law, it is the Administrative Law Judge's INITIAL

DETERMlNATION ("ID") that a violation of section 337 of the Tariff Act of 1930, as amended,

exists in the importation into the United States, sale for importation, or the sale within the United

States after importation of certain semiconductor chips with minimized package size and products

containing same by reason of infringement of claims 6 and 22 of U. S. Letters Patent 5,679,977

and claims 1 , 3 and 11 of U.S. Letters Patent 5,852,326.

The Administrative Law Judge hereby CERTIFIES to the Commission this ID, together

with the record of the hearing in this investigation consisting of the following:

1, The transcript of the hearing, with appropriate corrections as may hereafter be

ordered by the Administrative Law Judge; and further,

2. The exhibits accepted into evidence in this investigation as listed in the attached

exhibit lists.

In accordance with 19 C.F.R. $ 210.39(c), all material found to be confidential by the

Administrative Law Judge under 19 C.F.R. tj 210.5 is to be given in cnniera treatment.

The Secretary shall serve a public version of this ID upon all parties of record and the

confidential version upon counsel who are signatories to the Protective Order (Order No. I ) issued

by the Administrative Law Judge in this investigation, and upon the Commission investigative

357

attorney. To expedite service of the public version, counsel are hereby ORDERED to serve on the

Administrative Law Judge by no later than October 5, 2001, a copy of this ID with those sections

considered by the party to be confidential bracketed in red, accompanied by a list indicating each

page on which such a bracket is found. . Pursuant to 19 C.F.R. 5 210.42(h), this ID shall become the determination of the

Commission unless a party files a petition for review pursuant to 4 210.43(a) or the Commission,

pursuant to 9; 210.44, orders on its own motion a review of the ID or certain issues herein.

Sidney Harrif Administrative Law Judge

Issued: September 25, 2001

f

358

CERTAIN SEMICONDUCTOR CHIPS WITH MINIMIZED CHIP PACKAGE SIZE AND PRODUCTS CONTAINING SAME

INV. NO. 337-TA-432

CERTlFICATE OF SERVICE

I, Donna R. Koehnke, hereby certifj that the attached Initial Determination was served upon Benjamin D. M. Wood, Esq. and upon the following parties via first class mail, and air mail where necessary, on November 5 ,2001.

Donna R. Koehnke, Secrefary U. S. lnternational Trade Commission 500 E Street, S W. Washington, D.C. 20436

FOR COMPLAINANT TESSERA, INC.:

Michael A. Ladra, Esq. James C. Otteson, Esq. Lisa G. McFall, Esq. Jonathan G. Chance, Esq. Wilson Sonsini Goodrich & Rosati 650 Page Mill Road Palo Alto, California 94304- 1050

Thomas L. Jarvis, Esq. Stephen L. Peterson, Esq. Smith R. Brittingham, Esq. Finnegan, Henderson, Farabow,

Garrett & Dunner, LLP 1300 I Street, N.W. Washington, D.C. 20005-33 15

CERTAIN SEMICONDUCTOR CHIPS WITH MINIMIZED CHIP PACKAGE SIZE AND PRODUCTS CONTAINING SAME

INV. NO. 337-TA-432

FOR RESPONDENTS SHARP CORPORATION, AND SHARP ELECTRONICS CORPORATION:

Ken-lchi Hattori, Esq. Scott M. Daniels, Esq. Armstrong, Westerman, Hattori,

McLeland & Naughton 1725 K Street, N.W. - Ste. 1000 Washington, D.C. 20006

Michael A. O’Shea, Esq. Frank C. Cimino, Jr., Esq. George Kleinfeld, Esq. Clifford Chance Rogers & Wells LLP 2001 K Street, N.W. Washington, D.C. 20006-1 001

John E. Kidd, Esq. Clifford Chance Rogers & Wells LLP 200 Park Avenue New York, New York 10 166-0 153

PUBLIC MAILING LIST

Donna Wirt

1 150 18th Street, NW Suite 600 Washington, D.C. 20036

LEXIS - NEXIS

Ronnita Green West Group 901 Fifteenth Street, NW Suite 230 Washington, D.C. 20005

OFFICE OF THE SECRETARY

UNITED STATES INTERNATIONAL TRADE COMMISSION

November 5, 2001

Joanne St um p , Chief Intellectual Property Rights Branch United States Customs Service Ronald Reagan Building, 3rd Floor 1300 Pennsylvania Avenue, N.W. Washington, D.C. 20229

Dear Ms. Stump:

A Commission administrative law judge has issued an initial determination ( ID") in Inv. No. 33 7-TA-43 2, Certain Semiconductors Chips with Minimized Chip Package Size and Products Containing Same.

A copy of the ID will be provided to you upon request, and written comments may be filed thereon. If you would like to have a copy of the ID, please contact Marilyn R. Abbott, Deputy Secretary at (202) 205-1 802.

If you have questions about the investigation, please telephone the Commission advisory attorney Michael Diehl, Esq., at (202) 205-3095.

Donna R. Koehnke Secretary

OFFICE OF THE SECRETARY

~

UNITED STATES INTERNATIONAL TRADE COMMISSION

Ch rl

November 5, 2001

s S. Stark, Esq. U. S. Department of Justice Antitrust Division Pennsylvania Avenue & 10th Street, N.W. Washington, D.C. 20530

Dear Mr. Stark:

A Commission administrative law judge has issued an initial deter m i nation ( I' I D I' ) i n I nv . N 0.3 3 7 -T A- 43 2, C e rt a i n S em icon d u c t o rs Chips with Minimized Chip Package Size and Products Containing Same.

A copy of the ID will be provided to you upon request, and written comments may be filed thereon. If you would like to have a copy of the ID, please contact Marilyn Abbott, Deputy Secretary, a t (202) 205-1 802.

If you have questions about the investigation, please telephone the Commission advisory attorney Michael Diehl, Esq., at (202) 205-3095.

Donna R. Koehnke Secretary

OFFICE OF THE SECRETARY

UNITED STATES INTERNATIONAL TRADE COMMISSION

WASHINGTON. D.C. 20436

November 5, 2001

Randy Tritell, Esq. Director for Int'l Antitrust Federal Trade Commission Room 380 Pennsylvania Avenue & 6th Street, N.W. Washington, D.C. 20580

Dear Mr. Triteil:

A Commission administrative law judge has issued an initial determination ("ID") in Inv. No.337-TA-432, Certain Semiconductors Chips with Minimized Chip Package Size and Products Containing Same.

A copy of the ID will be provided to you upon request, and written comments may be filed thereon. If you would like to have a copy of the ID, please contact Marilyn R. Abbott, Deputy Secretary, at (202) 205-1 802.

If you have questions about the investigation, please telephone the Commission advisory attorney Michael Diehl, Esq., at (202) 205-3095.

Donna R. Koehnke Secretary

OFFICE OF THE SECRETARY

~ ~

UNITED STATES INTERNATIONAL TRADE COMMISSION

LVASHINGTO” D.C. 20436

November 5, 2001

Richard Lambert, Esq. Department of Health & Human Services Office of General Counsel National Institute of Health Building 31, Room 2850 9000 Rockville Pike Bethesda, Maryland 20892-21 11

Dear Mr. Lambert:

A Commission administrative law judge has issued an initial determination (“ID”) in Inv. No.337-TA-432, Certain Semiconductors Chips with Minimized Chip Package Size and Products Containing Same.

A copy of the ID will be provided to you upon request, and written comments may be filed thereon. If you would like to have a copy of the ID, please contact Marilyn R. Abbott, Deputy Secretary, at (202) 205-1 802.

If you have questions about the investigation, please telephone the Commission advisory attorney Michael Diehl, Esq., a t (202) 205-3095.

Sincerely,

Donna R. Koehnke Secretary


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