1 (Company Confidential)
XRF Metrology XRF Metrology
Tools for Solar Tools for Solar
PhotovoltaicPhotovoltaic
ManufactureManufacture
Company Confidential
2 (Company Confidential)
Age of Solid State Energy PV Efficiency Gains & Cost Reduction
will achieve Convergence With Fossil Fuel Grid Costs
Solar Metrology: The Convergence
3 (Company Confidential)
Low-cost solar PV factories of the
future will utilize:
New Materials: R&D
Products: Process
Develop and commercialize
new low cost solar PV panels through
capacity ramp and yield
management.
Solar Metrology: The Market Driver
4 (Company Confidential)
Solar Metrology: The Market Potential
PV Metrology Equipment Market: $5 billion TAM projected by 2012.
One Trillion-Dollar Global Electricity Generation Industry
Solar PV currently <1% of total annual electric
power generation worldwide.
Solar PV market share in vicinity of 10%
anticipated by 2020.
5 (Company Confidential)
Solar Metrology: What We Do
We Provide an Enabling
Technology…
Solar Metrology tools are required to
manufacture the active layer in
photovoltaic (PV) cells that converts
sunlight to electricity.
Solar Metrology technology enables
manufacturers to conduct R&D, control
processes and manage yield to produce
high-efficiency, low-cost commercial solar PV
panels.
TCOWindow Layer (CdS)
CIGSBack Contact (Mo)
Glass, Stainless, Plastic
CIGS Layer
6 (Company Confidential)
MoCIGS
CdS
Substrate
Photons from the X-Ray tube impinge on the sample material (CdS or CIGS/Electrode Layer/Substrate). Atoms are ionized and fluoresce characteristic emissions that are collected by a detector then amplified, digitized , and sorted into a histogram (intensity vs. energy – spectrum) and displayed
Solar Metrology: How We Do It
7 (Company Confidential)
Solar Metrology: Who Will Do It
THE SOLAR MANAGEMENT TEAM…
Has over 100 years cumulative experience in the XRF business.
Formed Matrix Metrologies in 2003
Has existing base of success to leverage in transition to solar.
Has designed and marketed six XRF product lines, with an installed base in excess of 5000 units.
Members have held key management positions at Thermo, Veeco Instruments, Fisons and Kevex.
8 (Company Confidential)
Solar Metrology: Who Will Do ItMANAGEMENT TEAM:
FRANK REILLY: President & Sales/Marketing Director (Principal)Successfully managed Matrix Metrologies as a going concern for five years.
(Years XRF Experience: 22) FRANK FERRANDINO: V.P. & Dir. of Technology/Project Management (Principal)
Patented X-ray optical beam and detector column with vacuum conduit; developed
and patented NIST-traceable metal calibration standards. (Years XRF Experience: 26) JIM BOGERT: Director, Domestic Sales, Spectroscopist (Principal)
Developed advanced mathematical methods for spectral analysis; extensive surface analysis, materials engineering and sales force management experience. (Years XRF Experience: 26)
IGOR LENICKY: Director, International Sales, QC Engineer (Principal)Experienced global marketer of advanced technology-based instrumentation.(Years XRF Experience: 30)
TIM CAHANEY: Director, Marketing/Product Management (Principal)Experienced in development of process and metrology equipment solutions for semiconductor industry and Polytechnic Inst. of NY graduate (Years Semi Experience: 30)
BOARD OF DIRECTORS: Frank Reilly, Frank Ferrandino, Walter ScherrADVISORS: WALTER SCHERR: Founder of Panafax (first commercially availably fax machine), Litton,
Sperry and Veeco Instruments; operated XRF Industrial Measurement Group at Veeco.
EDWARD BRAUN: MBO Veeco instruments (1991); CEO Veeco; President of SEMI and Solar Product Development Specialist at Veeco.
9 (Company Confidential)
Solar Metrology: Product Platforms
Our Products SMX-BEN, SMX-ILH, SMX-ISI
The System SMX is a unique family of three platforms designed exclusively for the Photovoltaic manufacturing industry for multi-layer thickness and composition measurements of flexible or rigid substrates. Presently containing XRF technology it allows for the inclusion of other “best-of-breed” measurement technologies.
SMX-BEN for Bench top Measurements
SMX-ILH for In-Line, Near-Line Atmospheric Measurements- Integrated or Remote X-Ray head; Static, Linear, and Dual-Axis Configurations
SMX-ISI for In-situ Vacuum Measurements- Static or Linear X-Ray headConfigurations
10 (Company Confidential)
Solar Metrology: Tool Insertion Points
XRF Tool Insertion Points
R&D, Process development, Failure analysis Material selection, Layer formulations
Off-Line Process Control
Detailed individual Product Sampling
Yield Management
In-line and In-situ measurement of PV cells and panels
11 (Company Confidential)
Solar Metrology: Moving Forward
Future PV Manufacturing Requirements
Capacity Ramp of existing technology
Enhanced Yield Management
Continuous Gains in Conversion Efficiency
Future Solar Metrology Requirements
Expansion of global distribution channels
Rapid product development
Procurement of additional metrology Methods