Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 1
Julien Palluel BE/CO/FE
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 2
WorldFIP Description and principleLHC problematic
RadHard SolutionsProtection systemsRe-initialisation systemsChoice of components
Radiation tests : repeater Co/Co exampleGammas radiationsProtons tests
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 3
DescriptionMaximum length of wiring
○ 8000m with a speed of 31.25Kb/s○ 1000m with a speed of 1Mb/s○ 500m with a speed of 2.5Mb/s
300 km of WorldFIP fieldbus
Consequences Repeaters RadHardDiagnostic Agent Rad-Hard (FIPDiag)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 4
LHC problematicAll elements must be RadHard
○ Protection against latch-up○ Protection against single event○ Lifetime under radiation : >200 Gy
Components high life○ Durability of the radiation tested cards
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 5
Protection against latch-upPowercycle System
Example : Repeater RadHard Protection system : cut the power line with a MOS
power for 1 second after the detection of an
overcurrent (ex threshold 4xInom)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 6
Principle of protection against latch-up:
Schema of protection against latch-up:
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 7
Protection against latch-up Component reference
○ Cut-off element : MOS-FET OD 22-16V ○ Current measure : LMV 393 ○ Cut-off timer : CMOS 74HC4538
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 8
Protection against Single Event module Re-initialisation
Example : Repeater RadHard
Protection system : inactivity of one of the two mediums, detected by the component FIELDRIVE generates a reset signal which is processed by an integrated function in the FPGA.
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 9
Protection against Single Event Up-set:Corruption of memory (address, configuration…)
Example : FIPDiag module
re-initialisation of the software by a remote reset triggered by a specific message (255 characters)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 10
Lifetime under radiation selection of components not sensitive to
radiation …)
Example : Galvanic isolation provided by the
transformer in place of optocoupler Repeater RadHard A 5V supply is obtained from 230V sector.
The regulation is linear (type regulator Balasta) with transformer and diode bridge.
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 11
Principle of power supply:
Schema of power supply :
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 12
Lifetime under radiation selection of components not sensitive to radiationExample : Repeater RadHard
Repetition process embedded in a type ACTEL FPGA anti-Fuse resistant to radiation (Ref : Actel eX128 TQ100)
CMOS components
WorldFIP technology tested in 1998 (FIELDRIVE)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 13
Lifetime under radiationRepeater RadHard WorldFIP technology tested
in 1998 (TCC2, mixed fields) Référence composant :
○ SSSB222 FIELDRIVE 0421A○ FIELDTRx.S JMF 9539 04/47
Currently these two components have evolved to a new technology that seems to be more sensitive to radiation.
Tests are planned at CNGS
!
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 14
Components turnover Period of production too shortSolution Use virtual device defined in VHDL and
integrated in FPGA already testedExample : In-sourcing WorldFIP technology
○ Purchase technology WorldFIP VHDL ○ Adaptation to CERN needs○ Realisation
Project under the responsibility of Javier Serrano’s team
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 15
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 16
General architecture of the card :
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 17
Gammas radiations tests at Pagure’s CEA, Saclay
Conditions of irradiation○ Cobalt-60 source○ Total Irradiation of the card (active part)○ Dose and period:
1h30 at 20Gy/h (2.60m from the source)5h at 60Gy/h (1.51m from the source)
○ FIP Speed : 1MB/s.○ MacroCycle period : 100ms○ Variables : 2 (1xRead + 1xWrite on FIPDIAG)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 18
Gammas radiations tests at Pagure’s CEA, SaclayResults :
○ 1) 20Gy/h irradiationNo functionnal fault (Up-set, Latch-up and Reset) The overall current of the module remained constant at 147mA Test of the anti-latch-up was working well
○ 2) 60Gy/h irradiationNo functionnal fault (Up-set, Latch-up and Reset) until 310Gy up where the module has stopped working.
Remarks :○ The overall current of the module has increased from 147mA to 152mA, then
147mA just before stop working. ○ We have made some power reset until the end of this test. The repeater
stayed silent ○ Once testing is completed, after 5 minutes of rest, the module was working
normally. Possible reason : the supply current has drained the trapped charges in MOS thresholds and allowed them to re-operate properly.In the LHC where the modules will experience a much lower fluence, it should therefore not have any operational defect related to gamma radiation.
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 19
Protons tests at Louvain,Belgium
Conditions of irradiation○ Proton beam 62 Mev○ Flux between 5x10exp7 and 5x10exp8 P/cm2/s○ Total Irradiation of the card (active part)○ Speed : 2.5MB/s○ MacroCycle period : 20ms○ Variables : 2 (1xRead + 1xWrite on FIPDIAG)
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 20
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 21
Protons tests at Louvain,BelgiumResults
○ 235gy (1 Up-Set seen) on first repeater○ 512gy (2 Up-Sets seen) on second repeater
before first faults○ Overall current mainly constant○ Test of the anti-latch-up was working well
Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 22
Main repository www.cern.ch/cern-worldfip
Repeater Rad Hardwww.cern.ch/cern-worldfip/Docs/CERN
Presentations/Radiation Hard Repeater-ENG.pdfhttp://documents.cern.ch//archive/electronic/cern/others/ab/ab-
note-2005-039.pdfwww.cern.ch/cern-worldfip/Docs/Hardware Modules/Repeater
CU-CU Radiation Hard/Manuel Repeteur Cu_Cu-FR.pdf
FIPDiagwww.cern.ch/cern-worldfip/Docs/CERN Presentations/Fipdiag
and FipADUC Modules-ENG.pdf
Radiation Répéteur FPGA Proton Gamma WorldFIP Latch-up Upset Dose