_=
NASA Conference Publication 10046
I
LDEF MaterialsData Analysis
Workshop(NASA-CP'IOO4_) PR_C_EOINGS GF THE LnEF
MAT_KIALS OATA ANALYSIS WORKSHOP (NASA)CSCL
289 p
N90-2607 5
07AUncles
G3/Z3 0295175
Compiled byBland A. Stein
and Philip R. YoungLangley Research Center
Hampton, Virginia
Proceedings of a workshop sponsored byLangley Research Center and held at
John F. Kennedy Space Center
Kennedy Space Center, Florida
February 13-14, 1990
w
w
July 1990
National Aeronautics and
Space Administration
Langley Research CenterHampton, Virginia 23665-5225
https://ntrs.nasa.gov/search.jsp?R=19900016759 2018-09-09T00:11:00+00:00Z
NASALONG DURATION EXPOSURE FACILITY
..... LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA- KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
FOREWORD
The National Aeronautics and Space Administration Long Duration Exposure FacilityDEF) was launched into low-Earth orbit (LEO) from the payload bay of the Spaceuttle Orbiter Challenger in April 1984. It was retrieved from orbit by the Columbia in
January 1990. The original flight plan called for a 1-year mission. The extended time inorbit, some 4 years and 10 months longer than originally planned, generally enhancedthe value of the 57 LDEF experiments which covered the disciplines of materials,coatings, and thermal systems; power and propulsion; space science; and electronicsand optics. LDEF was designed to provide a large number of economical opportunitiesfor science and technology experiments that require modest electrical power and dataprocessing while in space and which benefit from post-flight laboratory investigationsof the retrieved experiment hardware on Earth. Most of the materials experimentswere completely passive; their data must be obtained in post-flight laboratory tests andanalyses.*
The 5-year, 10-month flight of LDEF greatly enhanced the potential value of mostLDEF materials, compared to that of the original 1-year flight plan. NASA recognizedthis potential by forming the LDEF Space Environmental Effects on Materials SpecialInvestigation Group (MSIG) in early 1989 to address the expanded opportunitiesavailable in the LDEF structure and on experiment trays, so that the value of all LDEFmaterials data to current and future space missions would be assessed anddocumented. (Similar Special Investigation Groups were formed for the disciplines ofIonizing Radiation, Systems, and Meteoroids/Debris.) MSIG was chartered toinvestigate the effects of the long LEO exposure on structure and experimentmaterials which were not originally planned to be test specimens and to integrate the
*Clark, Lenwood G., Kinardl William H., Carter, David J. Jr:, and Jones, James L. Jr. (Eds.): TheLong Duration Exposure Facility (LDEF). NASA SP-473, 1984.
iii
PRECEDING PAGE BLANK NOT FILMED
results of this investigation with data generated by the Principal Investigators of theLDEF experiments into the LDEF Materials Data Base. This LDEF Materials DataAnalysis Workshop addressed the plans (and those of other LDEF groups) resultingfrom that charter (and similar charters for the other disciplines). The workshop ranconcurrently with the activities surrounding the successful return of the LDEFspacecraft to the NASA Kennedy Space Center. This document is a compilation of thevisual aids utilized by the speakers at the workshop.*
The LDEF Materials Data Analysis Workshop had several objectives. Session 1summarized current information on analysis responsibilities and plans; this informationwas aimed at updating the workshop attendees: the LDEF Advisory Committee,Principal Investigators (PIs), Special Investigation Group Members, and othersinvolved in LDEF analyses or management. Workshop Sessions 2 and 3 addressedmaterials data analysis methodology, specimen preservation/shipment/archival, andinitial plans for the LDEF Materials Data Base. An equally important objective of thisworkshop was to stimulate interest and awareness of the opportunities to vastlyexpand the overall data base by considering the entire spacecraft as a materialsexperiment. To this end, the voluntary contribution and sharing of samples betweenPIs and MSIG were encouraged. These samples include both materials on experimenttrays which were not intended to be test specimens and material test specimens whichare available after the original test objectives have been achieved.
The synergistic effects of atomic oxygen, ultraviolet and particulate radiation, thermalcycling, and vacuum in the 5-year, 10-month LEO exposure of materials on LDEF willproduce a data base unparalleled in the history of space environmental effects. Data ofthis type will not be available again until Space Station Freedom has deployed amaterials exposure experiment for more than 6 years. Thus, the LDEF PrincipalInvestigators and Materials Special Investigation Group now have the uniqueopportunity and responsibility to significantly contribute to spacecraft design,verification of analysis models based on previous in-space and Earth laboratory dataon space materials, and planning of space research and development for the 1990sand into the 21 st century. This workshop served as one step toward the realization of
that opportunity. .; _-_, ,q ,,,'-/,-
-81and A. Stein and Philip R. YoungCo-Chairmen, LDEF Materials Data Analysis Workshop
[ --_z _ __ z __
*Notes: These charts reflect general understanding of space environmental effects on materials,prior to specific analyses of LDEF materials specimens. The LDEF materials analysis planspresented herein are subject to revision as the analyses proceed during the next several years.
iv
CONTENTS
FOREWORD ................................... iii
INTRODUCTION .................................Bland A. Stein
NASA HEADQUARTERS PERSPECTIVE ......................
Robert J. Hayduk
7
LDEF DATA ANALYSIS PROJECT OFFICE OVERVIEW ............... 13
Darrel R. Tenney
LDEF SUPPORTING DATA GROUP PLANS
ENVIRONMENTS AND ORBIT AND ORIENTATION ................ 21William H. Kinard
SPACECRAFT THERMAL ........................... 25William M. Berrios
SPECIAL INVESTIGATION GROUP PLANS
METEOROID AND DEBRIS SIG ......................... 31William H. Kinard
SYSTEMS SIG ................................. 33James B. Mason
MATERIALS SIG ................................ 45Bland A. Stein
IONIZING RADIATION SIG ........................... 63Thomas A. Parnell
OVERVIEW OF PRINCIPAL INVESTIGATOR PLANS ................ 95James LoJones, Jr.
SDIO OVERVIEW ............................... 105Wayne E. Ward
MATERIALS DATA ANALYSIS METHODOLOGY OVERVIEW ........... 117Bland A. Stein
POLYMERIC MATERIALS CHARACTERIZATION . . . ,; ......... . . . . 121Philip R. Young - _-
,, _ • '." .
v
CONTENTS (CONCLUDED)
SURFACE CHEMISTRYJames Wightman
............................ 151
ATOMIC OXYGEN ...............................Bruce A. Banks
191
MATERIALS SPECIAL INVESTIGATION GROUP MATERIALS ANALYSIS .....Gary Pippin
MSIG/MAPTIS DATA BASE ...........................John M. Davis
217
231
MATERIALS SPECIMEN PRESERVATION AND CONTAMINATION AVOIDANCERussell Crutcher
249
STORAGE AND ARCHIVAL OF EXTRATERRESTRIAL MATERIALMichael E. Zolensky
........ 273
WORKSHOP AGENDA ............................. 283
WORKSHOP ATTENDANCE .......................... 287
vi
NASALONG DURATION EXPOSURE FACILITY
INTRODUCTION
BLAND A. STEIN
NASA - LANGLEY RESEARCH CENTERWORKSHOP CO-CHAIRMAN
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
I
i
_ iJ
_._/
LDEF
MATERIALS DATA ANALYSIS
WORKSHOP
/
_P
if
NASA - KENNEDY SPACE CENTERBUILDING M7-35i, TRAINING AUDITORIUM
FEBRUARY 13 & 14, 1990#
LONG DURATION EXPOSURE FACILITY
MATERIALS DATA ANALYSIS WORKSHOP
BLAND A. STEINNASA - LANGLEY RESEARCH CENTER,
WORKSHOP CHAIRMAN
LDEF MATERIALS DATA ANALYSIS WORKSHOPNASA - KENNEDY SPACE CENTER
FEBRUARY, 1990
2
LDEF INSPECTION TEAM
LDEF RETRIEVAL OBSERVATIONS FROM DOWNLINK VIDEO,IN-SPACE PHOTOGRAPHS, AND INITIAL KSC OBSERVATIONS
GENERAL
• NO STRUCTUF:iAL DAMAGE
• NO UNANTICIPATED PHENOMENA
• DAMAGE TO THIN FILMS, COATINGS, AND THERMAL BLANKET MATERIALSON EXPERIMENT TRAYS, PREDOMINANTLY ON:
- LEADING EDGE- SPACE END
• FLOATING DEBRIS VISIBLE NEAR LDEF, ESPECIALLY AFTER GRAPPLE
• MINIMAL DEBRIS IN CARGO BAY; SOLAR CELL MODULE ONLY LARGEPIECE OF DEBRIS FOUND
• LOCALIZED CONTAMINATION ON LDEF SURFACES IN SEVERAL AREAS
LDEF INSPECTION TEAM
LDEF RETRIEVAL OBSERVATIONS FROM DOWNLINK VIDEO,IN-SPACE PHOTOGRAPHS, AND INITIAL KSC OBSERVATIONS
(CONTINUED)
MECHANISMS AND SYSTEMS
• ALL FIVE EXPERIMENT EXPOSURE CONTROL CANISTERS (EECCs) ON LDEFCLOSED, AS PLANNED
• A CLAMSHELL CANISTER IS OPEN (PROBABLY CLOSED AND REOPENED)
• MSFC THERMAL CONTROL SURFACES EXPERIMENT (A0069) MECHANISMSAPPEAR TO HAVE FUNCTIONED CORRECTLY.
MICROMETEOROID AND DEBRIS EFFECTS
• SIGNIFICANT MICROMETEOROID AND DEBRIS IMPACTS OBSERVED ON EXPERIMENTTRAYS; IMPACTS GENERALLY CONSISTENT WITH EXPECTATIONS.
• NO LARGE, CATASTROPHIC IMPACT EVENTS DETECTED.
• MORE MICROMETEOROID/DEBRIS DAMAGE APPARENT ON LEADING EDGE THANON TRAILING EDGE.
• IMPACTS ALSO OBSERVED ON LDEF STRUCTURE.
4
LDEF INSPECTION TEAM
LDEF RETRIEVAL OBSERVATIONS FROM DOWNLINK VIDEO,IN-SPACE PHOTOGRAPHS, AND INITIAL KSC OBSERVATIONS
(CONCLUDED)
ATOMIC OXYGEN EFFECTS
• SIGNIFICANT ATOMIC OXYGEN DEGRADATION OBSERVED ON MOST LEADING
EDGE EXPERIMENTS.
• MORE THAN 0,005-INCH DEGRADATION OF KAPTON AND MYLAR FILMS ONLEADING EDGE EXPERIMENTS.
• SURFACES OF SILVER/TEFLON THERMAL BLANKETS ON LEADING EDGETURNED "MILKY" WHITE.
• THERMAL CONTROL PAINT "TARGET SPOTS" REMAINED WHITE ON ENTIRE LEADING
FACE OF LDEF.
ULTRAVIOLET RADIATION EFFECTS
• THERMAL CONTROL PAINT TARGET SPOTS DISCOLORED ON TRAILING FACE,
EARTH END, AND SPACE END OF LDEF.
INDUCED RADIATION EFFECTS
• INDUCED RADIATION SURVEYS SHOW MEASUREABLE RADIOACTIVE ACTIVITY.
• NO THREATS TO HUMAN HEALTH.
LDEF MATERIALS DATA ANALYSIS WORKSHOP
SESSION 1: LDEF DATA ANALYSIS RESPONSIBILITIES AND PLANS
OBJECTIVE: Understanding of the breadth and potential of LDEF experimentaland analytical data by LDEF Advisory Committee, PrincipalInvestigators, Special Investigation Groups, and other WorkshopAttendees
APPROACH: Presentations and Interactive discussions on
• LDEF
• LDEF Science Office and NASA HQ Management
• Supporting Data Group plans
• Special Investigation Group plans
• Principal Investigator Plans
5
LDEF MATERIALS DATA ANALYSIS WORKSHOP
SESSION 2: MATERIALS DATA ANALYSIS METHODOLOGY DISCUSSIONSAND
SESSION 3: MATERIALS ANALYSIS, DATA BASE, AND PRESERVATION
OBJECTIVE: Stimulate interest and awareness of the opportunities to expandthe LDEF data base through:
Understanding the potential of data synergismVoluntary contribution of materials which:
were not originally planned to be test specimensor
were duplicate specimens in the experimentor
are specimens whose initial experiment objectiveshave been satisfied
APPROACH: Interactive discussions on analysis methodology• Characterization• Surface science
Atomic oxygenContamination• Other parameters which define (or obscure) the data• Specimen preservation and shipment
6
NASALONG DURATION EXPOSURE FACILITY
NASA HEADQUARTERSPERSPECTIVE
LDEF
ROBERT J. HAYDUK
NASA HEADQUARTERSSCIENCE PROGRAM MANAGER
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
7
NASA HEADQUARTERS PERSPECTIVEOF
LONG DURATION EXPOSURE FACILITY
BY
ROBERT J. HAYDUKLDEF SCIENCE PROGRAM MANAGER
OAST, MATERIALS & STRUCTURES DIVISION
LDEF MATERIALS DATA ANALYSIS WORKSHOPNASA KENNEDY SPACE CENTER
FEBRUARY 13 & 14, 1990
LDEF SCIENCE ORGANIZATION
OAET
OAET- RM
LDEF J
INSPECTION TEAM I- -- -- --
ILANGLEY J
JSTRUCTURESDIRECTORATE
LDEF ADVISORYCOMMITTEE
I
INVESTIGATIONGROUPS
MATERIALSDIVISION
fI
SUPPORTINGDATA
GROUPS PRINCIPAL IINVESTIGATORS
8
LDEF HISTORY
• LDEF Announcement of Opportunity (OAET-76-1)
"Solicited Research Experiments in Long DurationTesting in Space" in Areas of Interest to OAET,OSSA, & OSF
• Open to NASA, Universities, Industry, U.S. GovernmentAgencies, & Foreign Participants
• AA OAET Selected Experiments
LDEF- EARLY 80's
• "Laboratory in the Sky"
• Many Flight Opportunities
• Sequential Plan of Experiments
- Flights: A, B, C, etc.
- Experiments: Based on Experiments
of Prior Flights
- Develop Large Data Base
9
LDEF - LATE 80's
• One Flight Opportunity
• LDEF Spacecraft & Experiments
- Have Higher Interest & Potential-Payoff
• Significant Changes in Science Plan
200 Principal Investigators
Plus
Special Investigation Groups
- Materials
- Environmental Stability
- etc.
LDEF SCIENCE PROGRAM
D.2.1F,,C,.T.Io Maximize Science Return From LDEF Mission
o Integrated Plan for Data Analysis
o Documentation and Timely Dissemination of Data
o Science Team of International Stature
10
LDEF SCIENCE
[ _PRINCIPALINVESTIGATORS __-.___ f
| _ LDEF 1
_ DATA |
_ _ ,_l BASE [
SPECIAL I _ /'_'_" 1
INVESTIGATION ['_ / LEO ENVIRONMENT
GROUPS ] / - Meteoroid & Debris& J / - Atomic Oxygen_lb / - Particle Fluxes
| / -etc.
DATA - Coatin s/ GROUPS ]/ : Cpticsg
_- / - Sensors" e{c.
SUMMARY
LDEF IS A UNIQUE OPPORTUNITY TO OBTAIN SCIENTIFIC
AND TECHNOLOGICAL INFORMATION IN COLLABORATION
WITH PRINCIPAL INVESTIGATORS FROM THE UNITED
STATES AND NINE OTHER COUNTRIES, FOUR SPECIAL
INVESTIGATION GROUPS, AND THREE SUPPORTING DATA
GROUPS.
AN LDEF DATA BASE WILL BE ASSEMBLED AND MANAGED TO
COLLECT ALL SCIENTIFIC AND TECHNOLOGICAL RESULTS.
THIS DATA BASE WILL BE ACCESSIBLE TO THE
INTERNATIONAL SCIENTIFIC COMMUNITY.
LDEF RESULTS WILL BE OF SIGNIFICANT BENEFIT TO
FUTURE SPACE SYSTEMS.
11
F
- . ;: NASALONG DURATION EXPOSURE FACILITY
LDEF DATA ANALYSISPROJECT OFFICE OVERVIEW
DARREL R. TENNEY
NASA- LANGLEY RESEARCH CENTERCHIEF, MATERIALS DIVISION
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
13
PAG|._ .INTENTt0NALLY BLANK PRECEDING PAGE BLANK NOT FILMED
LDEF DATA ANALYSIS
Darrel R. TenneyMaterials Division
NASA Langley Research Center
LDEF Materials Data Analysis Planning WorkshopNASA Kennedy Space Center
February 13, 1990
LONG DURATION EXPOSURE FACILITY
• Launched - April 1984 Retrieval - January 1990
57 Technology, Science, and Applications Experiments(More than 10,000 test specimens)
Participants
P.I.'s: >200
Industry: 33
NASA Centers: 7
Special Investigation Groups (Approx. 60 participants)(Materials, Systems, Meteoroid/Debris, & Radiation)
Countries: 9
Universities: 21
DOD Labs: 9
14
LDEF EXPERIMENTS (57 TOTAL)
. MATERIALS AND COATINGS (20 TOTAL)
- NASA, ll- INDUSTRY, 2
DOD, 1
FRANCE, 4- CANADA, 1- TEXAS A&M, 1
• PROPULSION, POWER, AND ENERGY (8 TOTAL)
NASA, 5WEST GERMANY, 1
MORTON THIOKOL, 1McDONNELL DOUGLAS, 1
• INFORMATION SCIENCES AND HUMAN FACTORS(14 TOTAL)
NASA, 7 DOD, 2
UK, 1 FRANCE, 4
• SCIENCE (15 TOTAL)
NASA, 6DOD, 2UK, 1GERMANY, 2
NETHERLANDS, 1FRANCE, 2PARK SEED, 1
LDEF SCIENCE ORGANIZATION
OAET
OAET - RM
l
LDEF /INSPECTION TEAM r- -- --
/
I LDEFADVISORY tCOMMITTEE
LANGLEY
ISTRUCTURESDIRECTORATE MATERIALS--- DIVISION
LI)EFSCIENCE ]OFFICE
i
SUPI'ORIINGGIIOupsDATA1
.... i
SPECIAL IINVESTIGATION
GROUPS
!PRINCIPAL
INVESTIGATORS
15
LDEF DATA ANALYSIS GROUPS ANDFUNCTIONAL RESPONSIBILITIES
LDEF AdvisoryCommittee
o Technical critique ofdata analyses plansand strategies
I
I LDEF ProgramManager
• NASA Hdqs. coordination• Programmatic issues• International cooperation• External affairs
I
• Planning and implementationof data analyses
LDEFTeamlnspectionJ
• Critical inspectionof LDEF
IExperiment
Pl's
• Ana!yses & reportingof results
SupportingData Groups
• Quantitativedefinition ofLDEF environment
Special Investigation
Groups
= Central analyses& discipline data bases
LDEF ADVISORY COMMITTEE
Membership, February, 1990
• Chairman: J. Garibotti, Ketema• Executive Secretary: R. Hayduk, NASA Hq.
• U.S. Spacecraft Industry- J. Blumenthal, TRW- E. Littauer, Lockheed- S. Greenberg, Aerojet- H. S. Greenberg, Rockwell
- M. Misra, Martin-Marietta- G. Wadsworth, Boeing
H. Babel, McDonnell Douglas- J. Schiewe, Aerospace Corp.
• NASA - User Community- J. Moacanin, JPL - D. Wade, JSC- K. Faymon, LeRC - H. Price, GSFC- A. Edwards, Space Station Freedom
• Science Community- J.Wightman, Va. Tech- J. Lewis, U. Arizona- R. Naumann, MSFC
• Department of Defense- A. Young, SDIO- M. Minges, USAF-WRDC
16
LDEF INSPECTION TEAM
Assess "Normality" of LDEF Spacecraft & Science Experiments
Membership
Chairman- Darrel R, Ten.,_ey - LaRC
Bland A. Stein - LaRCBill Kinard - LaRCLubert Leger- JSCAnn Whitaker - MSFCTom Parnell - MSFC
Dr. William Lehn - WRDCLt. Dale Atkinson - AF Weapons Lab.Bob Hayduk - NASA HeadquartersJim Mason - GSFC
LONG DURATION EXPOSURE FACILITY
INSPECTION TEAM
DARREL R. TENNEY
NASA - KENNEDY SPACE CENTERFEBRUARY 8, 1990
17
PI RELATIONS
• MOU/MOA's- (1) Trays Returned to Pl's
(2) Pl's provide data to NASA/Science Community •
• Addendum's to MOU/MOA's (Planned)
-- Identify specific samples/data SIG's require
SUPPORTING DATA GROUPS
Environments: William Kinard, LaRC
1. Solar and Planetary Fluxes- William Berrios, LaRC2. Particle Fluxes- Gene Benton, San Francisco State Univ.3. Atomic Oxygen Fluxes - l_ubert Leger, JSC4. Meteoroid and Space Debris Fluxes
- Don Humes, LaRC; Don Kessler, JSC5. Contamination- Lubert Leger, JSC6. Time Line of Operational Events - Larry Brumfield, LaRC
Spacecraft Thermal: William M. Berrios, LaRC
Orbit and Orientation: Mel Kelly, Analytical Mechanical Associates
18
LDEF Special Investigation Groups
IMeteoroid and Space
Debris
William H. Kinard
Special Investigation I ....Groups
II
Induced Radiation
Tom Parnell
Environmental Effectson Materials
Bland A. Stein
IEnvironmental Effects
on Systems
James B. _ason
SPECIAL INVESTIGATION(SlG)
STRATEGY
GROUPS
• Four working groups established (Jan. 1989) to address key technologyareas which are broader than individual experiments
• Technical expertise was the principal criteria for selection of.participants
• LDEF facilities and experiments studied to identify samples and systemsof key interest from a total LDEF perspective
• Contracts established to provide central analyses of samples with state-of-the-art analyses techniques and procedures
• SIG's providing key mechanism to implement cooperative activitiesbetween Pl's, NASA, and DOD
19
LDEF DATA ANALYSIS
Thrusts
LDEFretrieval
Environmentdefinition
LDEFexperiment
data analysis
Specialinvestigations
& documentation
FY-89 J FY-90
Retrieval & Iinspection I
VV
I LDEF supportingdata I
VV
FY-91 FY-92 FY-93
Individual experiment analyses by IPdncipal Investigators IV V V
l Materials/Systems/Debris impact/Radiationanalyses by Special Investigation Groups
V V V
0
Expected results
Early assessment ofspace environmentaleffects
Definition of LDEFmission environment
• Effects of LDEFexposure onmaterials & systems
• Enhanced modelsfor spaceenvironmental effects
• Space environmentalellects handbooksfor low earthorbit exposures
Major milestones
VV
LDEF retrieval & "quick-look-inspection" findings
Supporting data packagesto Prs & SIG's
LDEF investigator workshopto compare preliminary data
V
V
LDEF data conference
LDEF data & space environmentaleffects models symposium
LDEF materials, systems, & debriseffects data bases documented
SHUTTLE FLIGHTS WITH SAMPLE RETURNS
First shuttle LDEFlaunch launch4/81 4/84
1 IV V
I W VW V V
Space StationLaunch
3/19sV
V1980 _ I _ \_ . . 1,990
-. J\ ,4L-% I ISTS.., , - • EOIM-III3/82 (STS-5) t \ 10/84 LDEF.
11/82 \ retrieval 1991EOIM-II \ 1/90(STS-8) Solar Max9/83 repair
4/84
ITDMX-20! 1
~ 1996
2000
20
NASALONG DURATION EXPOSURE FACILITY
LDEF SUPPORTINGGROUP PLANS
- ENVIRONMENTS-ORBIT AND ORIENTATION
DATA
NASA -
WILLIAM H. KINARD _"
LANGLEY RESEARCH CENTERLDEF CHIEF SCIENTIST
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
21
LDEF DATA ANALYSIS TEAM & SUPPORTING DATA GROUP
LDEF Data Analysis Team
Team LeaderWilliam H. Kinard
LDEF Chief Scientist
t
[ t I
Experiment P.Us I I Supporting DataGroups
, l
Data Manager Data Manager
G. Mel Kelley TBDi
I| Meteoroid and Space II Debris II Gro,_ Leld_ I IL William I.L Kinalrd J i
I i
_nmentai Effects i
I on Materialsl Group Lead_
I Special investigation iGroups
I
I I IThermal Manager
William M. Berries
I I 'induced Radiation | Others
Group Leader TBDTom Pmnell
[E.v,o.=ant.JE,ectsJon SystemsGroup Leaci_rJamuesB. Mason
n
LDEF FIRST MI SSION EXPERIMENTS
CRYSTAL GROWTH
ATOMI C OXYGEN OUTGASSI NGATOMIC OXYGEN INTERACTION
HIGH-TOUGHNESS GRAPHITE EPOXYRADAR PHASED-ARRAY ANTENNACOMPOSITE MATERIALS FOR SPACE STRUCTURESEPOXY MATRIX COMPOSITES
COMPOSITE MATERIALS,_AETALLI C MATERI ALS UNDER ULTRAVACUUMGRAPHITE-POLYIMI DE AND GRAPHITE-EPOXY
POLYMER MATRIX COMPOSITE MATERIALSSPACECRAFT MATERI AL S
BALLOON MATERIALS DEGRADATIONTHERMAL CONTROL COATI NGS
S PACECRAFT COATI NGSTHERN_L CONTROL SURFACESTEXTURED AND COATED SURFACES
VARIABLE CONDUCTANCE HEAT PI PELOW-TEMPERATURE HEAT PI PETRANSVERSE FLAT-PLATE HEAT PlPE
THERMAL MEA SU REMENTS
HIGH VOLTAGE DRAINAGE
SOLAR ARRAY MATERIALS
ADVANCED PHOTOVOLTAI CS
COATINGS AND SOLAR CELLS
SOLID ROCKET MATERIALS
I._JTERSTEI_LAR GAS
ULTRA-HEAVY COSMI C RAY _JUCLEIHEAVY !ONS
TRAPPED-PROTON ENERGY SPECTRUMHEAVY COSMIC RAY NUCLEILI NEAR ENERGYTRANSFER SPECTRUM
MI CROABRA SI ON PACKAGEMETEOROID IMPACT CRATERSDUST DEBRI S COLLECTION
CHEMI STRY OF MI CROMETEOROIDSMEA SUREMENTS OF MI CROMETEOROIDSI NTERPLANETARY DUST
SPACE DEBRI S IMPACTMETEOROID DAMAGEB I 0 STACKSEEDS IN SPACE
STUDENT SEEDS EXPERIMENTHOLOGRAPHI C DATA STORAGE CRYSTALSINFRARED MULTILAYER FILTERS
PYROELECTRIC INFRARED DETECTORS_AETALFILM AND MULTILAYERSVACUUM-DEPOSITED OPT1CAL COATI NGS
RULED AND HOLOGRAPHIC GRATINGSOPTICAL FIBERS AND COMPONENTSERB EXPERI MENT COMPONENTSSOLAR RADIATION ON GLASSES
QUARTZ CRYSTAL OSCILLATORSA CTIVE OPTI CAL SYSTEM COMPONENTS_1BER OPTIC DATA TRANSMI SSION
FIBER OPTICS SYSTEMS
S PACE ENVI RONMENT EFFECTS
NASA L _-NGLEY _ESEARCH CENTER
22
ENVIRONMENTS DATA
J LDEF ENVIRONMENTS DATA GROUP
---t TIMELINE OF OPERATIONS J
_OLAR & PLANETARY FLUXES l
{ PARTICLE RADIATION
[ ATOMIC FLUXES !
I METEOROID& DEBRIS ,,j
f CONTAMINATION
J ,
RBIT AND ORIENTATION DATA
• Initial Orbit -
• Inclination
• Perigee Altitude
• Apogee Altitude• Semi-major Axis Altitude
• Time History of Semi-major Axis Altitude Decay
• Orientation and Range of Oscillations About Each Axis
23
NASALONG DURATION EXPOSURE FACILITY
LDEF SUPPORTING DATAGROUP PLANS
- SPACECRAFT THERMAL
WILLIAM M. BERRIOS
NASA- LANGLEY RESEARCH CENTERMEMBER, SUPPORTING DATA GROUP
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
P_|J-_ JNTENTeOttlq[.Ly B_.ANKPRECEDING PAGE BLANK NOT FILMED
25
LONa DURATION EXPOSURE
LDEF
FA OIL I T Y
LDEF THERMAL DATA
LDEF THERMAL
TOPICS OF DISCUSSION
• OBJECTIVE
• APPROACH
• EFFECTS OF EXTENDED MISSION
• DATA REDUCTION PLAN
• STATUS
26
L DEF THERMAL
OBJECTIVE
• VALIDATE THE LDEF THERMAL MODEL
• ASSESS THE EFFECTS OF THE EXTENDED
MISSION ON THE LDEF PREDICTED
TEMPERATURES
• UPDATE THE LDEF END OF MISSION
CALCULATED TEMPERATURES
• PROVIDE SCIENCE COMMUNITY WITH DATA
DESCRIBING THE THERMAL ENVIRONMENT
EXPERIENCED BY THE LDEF EXPERIMENTS
LDEF THERMAL
APPROACH
• UPDATE THERMAL MODEL ORBITAL PARAMETERS
• COMPARE AND VALIDATE BEGINNING OF MISSION
THERMAL MODELS WITH RECORDED FLIGHT
TEMPERATURE DATA
• SURVEY THE LDEF SURFACES END OF MISSION
A/E PROPERTIES
• UPDATE THE LDEF THERMAL MODELS WITH END
OF MISSION A/E PROPERTIES
• RUN END OF MISSION THERMAL MODELS
• PREPARE AND DISTRIBUTE THE LDEF THERMAL( ..
DATA PACKAGES
27
l.DEF THERMAl.
DATA PACKAGE
• BOUNDARY CONDITIONS
BEGINNING/END OF MISSION
ORBITAL PARAMETERS
HEAT FLUXES
SURVEY OF THERMAL COATINGS
LDEF STRUCTURE TEMPERATURES
• CALCULATED LDEF TEMPERATURES
BEGINNING OF MISSION
DEPLOYMENT ALTITUDE
NEW COATINGS
HOT & COLD CASES
1 YEAR BETA ANGLE TRACKING
END OF MISSION
RETRIEVAL ALTITUDE
DEGRADED COATINGS
HOT & COLD CASES
1 YEAR BETA ANGLE TRACKING
L DEF THERMAL
EFFECTS OF EXTENDED MISSION
• Temperature data recorded for the first year of the LDEF
mission, There are no active measurements of the LDEF
temperatures for the remainder of the extended mission,
• Data mismatch. There are no recorded end of mission
temperatures to correlate with the measured end of mission
coatings, .
• Uneven degradation of coatings will require increased sampling
of thermal coatings in order to characterize their behavior.
• Role of coatings interaction effects on their thermal control
performance needs to be characterized,
• On-board passive attitude detectors may be saturated at this
time.
28
LDEF
DATA REDUCTION PLAN
THERMAL
• BEGIN MEASUREMENT OF A/E PROPERTIES BY
FEBRUARY 20, 1990
• BEGIN UPDATE OF THERMAL MODEL A/E VALUES BY
FEBRUARY 23, 1990
• COMPLETE END OF MISSION SURVEY OF THERMAL
SURFACES A/E PROPERTIES BY END OF MARCH 1990
• RECEIVE FLIGHT TEMPERATURE DATA BY END OF
MARCH 1990
• PRELIMINARY REPORT BY SUMMER 1990
• FINAL REPORT BY WINTER 19.90
L DEF THERMAL
DATA REDUCTION STATUS
• AQUIRED NEW INSTRUMENTATION FOR MEASUREMENT OF
SOLAR ABSORPTANCE
• LOCATED INSTRUMENTATION IN THE SAEF II CLEAN ROOM
AREA
• LOCATED OPERATIONS CEI_TER ON SUPPORT TRAILER 633
• OPENED DATA LINE TO LaRC COMPUTING FACILITIES
• PERFORMED INSTRUMENTATION CHECK-OUT
• PERFORMED A/E MEASUREMENTS OFTHERMAL PANELS
REMOVED FROM THE FACILITY
• PERFORMED A/E MEASUREMENTS OF SILVERED TEFLONSURFACES ON LOCATIONS A10 & Bll
• READY FOR MEASUREMENT OF LDEF THERMAL COATINGS
DURING DEINTEGRATION SCHEDULE
29
LDEF THERMAI,
DATA REDUCTION PI,AN
_DATA ........................... .
PRE-FLIGHT !'_ 'fC_) REVISED LDEF ]
f COATINGS ) i[ _ MODEIJ[-ORBIT PARAMETERS ['-'---'TJ ] *-((_) THERMAL
k ATTITUDE J ]
POST-FLIGHT j|fMEASUREDCOATINCSI--_--J_-A_TUDE J REVISED CALCULATED
T_[- FUOHT TEMPERAI_IRES_I
i_\_ ACTIVE l
I _PASSIVE I
_ HAGHT TEMPERATURE_+ACTIVE+ PASSIVE
3O
- NASALONG DURATION EXPOSURE FACILITY
SPECIAL INVESTIGATION GROUPPLANS
-METEOROID AND DEBRIS SIG
WILLIAM H. KINARD -'
NASA- LANGLEY RESEARCH CENTERCHAIRMAN, M&DSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
31
To exploit the wealth of M&D data recorded on the LDEF duringthe 5 1/2 year space exposure in space by:
• Ensuring that natural meteoroid and man-made debriscraters in retrieved LDEF and experiment hardware, whichwere not originally intended to be meteoroid & debris testspecimens, are identified, investigated, and archived forfuture investigations.
• Coordinating the data obtained by the LDEF meteoroid &debris experiment P.l.'s with the data obtained by this SIGinto a single LDEF METEOROID & DEBRIS DATA BA_Efor use by engineers and scientists in future studies.
MEMBERS OF LDEF M&D SIG
Or William H. K;nam (Group Leader)
Ma,I Stop 358
NASA Langley Reseaml_ Center
Hampton. VA 23665-5225
Mr Donald H. Humes
Mail Stop 493
NASA Langley Research Center
Hampton, VA 23685-5225
Ms. Martha AIIbrooks
.=;-CUBED
2501 Yale SE, Su,te 300
Albu_uetclue, NM 8709(]
Members:
Lieut. Dale Arkinson
Air Force Weapons LaboratoryJNTCAS
K;tlland Air Force Base. NM 87117-6008
Dr. Donald E. Brownies "
University of Washington
Seato. WA 98102
Cr. Thacdom E. Bunch
Mad Stop 239-4 =
NASA Ames Research Center
Moffett Field, CA 94035
Mr Donald J. Kessler
Code SN31
NASA Johnson Space Caner
Houston, TX 77058
Or. J. A. M. McOonnell
Physics Laboratory
Un=ve_=ty of Kent at CantemuryCT2 7NR Kent
UNITED KINGD(_
Mr. Michael J. Mi_ct_. Jr.
Mail Stop 18-1
NASA Lew, s Researcl_ Center
Cleveland. OH 44135
Or. Michael Zolensky
Code SN2
NASA Johnson Soace Cemet
HoustOn. 1]( 77058
Mr. J-C. Mindewlle
CERT;C_ERA-DERT5
Toulouse
FRANCE
Ms. Sally Litlle
Co_l S.SQ
Space Statmn Freectom Program Of_ce
10701 Parkndge Boulevard
Restart. VA 22091
Or. Vtadimar ChoOotov
The Aerosl_lce Coq>orationM4-948
2350 E. El Segu,'_o Blvd.
P. O. BOx 9_57
Los Angeles. CA g0245
Mr. Rict_arcl E_gs_'om
PO0 Associates, _nc.
1860 Tranwly Terrace LOOp Ave.
Atbuquen:lue. NM 37"22
Dr. Fred Here
Coqe SN21NASA Johnson Seats Canter
HOuStOn. TX 77C58
Mr. Roy A. TaylorCode EHt5
NASA Me_hell Space Fllgnt Center
Marshall Space Right Center, AL 35812
Or. Ernst Z_nner
washington UniversJly
One Broo_¢,ngs Onva
St. LOU=S, Me 83130
Mr Herbert A. Zoo_
Code 5N31
NASA ,_ohnson S0ace Cent_'
Houston. TX 77058
Or. Jerry Weinb_gSpace Astronomy LaOoratory, ISST
1810 NW 8th Sb'eet
Ga,nlv,lle. FL 32609
Mr. Thomas H. See
C23
Loc_hee(:t/JSC
2400 NASA Road I
Houston. "IX 77058-3711
Mr. Chades G. SimOn
Wash,ngton Un,versltyCampus Box ', 105
I aroo_mgs Onve
SL LOu,L Me 63130
32
NASALONG DURATION EXPOSURE FACILITY
SPECIAL INVESTIGATIONPLANS
- SYSTEMS SIG
GROUP
JAMES B. MASON
NASA - GODDARD SPACE FLIGHT CENTERCHAIRMAN, SSIG
ANDJOEL EDELMAN AND HARRY DURSCH
SSIG SUPPORT
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTER
FEBRUARY 13 & 14, 1990
33
LDEF SPACE ENVIRONMENTAL EFFECTS ONSYSTEMS
SPECIAL INVESTIGATION GROUP
I MATERIALSSIG
B Slein
RADIATIONSIG
T Parnell
DEBRISSIG
W K nard
W Kinard
ISYSTEMSSIG
J Mason
I
I NASNSSFS Little
SIG
i , ,
NA_GSFCJ MasonR Mclnlosh
I
CNES/France
F Jam n-Changead
JPL
R Scott
EEFISUPPORT
J Edelman
BOF_.]NGSUPPCRT JH Dursch
I
I PrincipalInvestigators
COMMITTEE
artinJ NASALEWISL Kaszubinski
tDOD/AFWL
E Taylor
I
O Zimmerman
I
I IIF StaggsJ Gowdey
DODtSDIO/WPAFB
T Trumb e
I
W Killingsworlh
K Sco_
34
LDEF SYSTEMS SIG
CHARTER
INVESTIGATE THE EFFECTS OF THE NEARLY SIX YEAR EXPOSURE INSPACE ON LDEF AND EXPERIMENT SYSTEMS.
COORDINATE THE DATA FROM THE ANALYSIS OF THE LDEF ANDEXPERIMENT SYSTEMS INTO A SINGLE LDEF SYSTEMS DATA BASE.
LDEF SYSTEMS SIG
OBJECTIVE
DEVELOPMENT OF THE LDEF SYSTEMS DATA BASE
t35
SYSTEMS SIG
ROLE OF LDEF SYSTEMS SIG:
• DEFINE LDEF DATA BASE REQUIREMENTS
• DEFINE LDEF SYSTEMS FOR ANALYSIS AND MEASUREMENT
• DEFINE MEASUREMENT PROGRAM FOR SELECTEDSYSTEMS
- LDEF STRUCTURE AND SUBSYSTEMS- EXPERIMENT TRAYS- MATERIAL USED IN BUILDING OF LDEF AND EXPERIMENTS
(e.g., SPARES)
• DEVELOP INSPECTION, HANDLING, TESTING ANDREPORTING PLANS AND PROCEDURES
• COORDINATE WITH AND SUPPORT PROJECT, SIGs, ANDEXPERIMENTER ACTIVITIES
• COLLECT AND DOCUMENT SYSTEMS DATA BASE
THREE INVESTIGATION PHASES
I. PLANNING EFFORT
II. KSC OPERATIONS
III. POST-KSC TESTING AND DATABASE DEVELOPMENT
36
LDEF SYSTEMS SIG INVESTIGATION PLAN
1.0 Introduction
2.0 Requirements
2.1 Objectives, Rationale, Prioritization Considerations2.2 Data
2.2.1 Data Development
2.2.2 Data Management and Dissemination2.3 Hardware Systems Identification2.4 Standard Test Plans
3.0 Implementation3.1 Implementation Team3.2 Implementation Timeline
3.2.1 Pre-inspection Activities3.2.1.1 KSC-provided Equipment3.2.1.2 Boeing-provided Equipment
3.2.2 General Inspection3.2.3 Experiment and LDEF Systems Deintegration3.2.4 Post KSC Operations
3.3 Configuration Management
Appendix AAppendix BAppendix C
Appendix D
KSC Operations ProceduresIndividual Experiment Test and Implementation Plans/Procedures
System SIG/Boeing Personnel
Nomarski Analysis
SYSTEMS SIG
DATA BASE CONTRIBUTORS
SYSTEM SIGDATA
DATASOURCES
SYSTEM PIs, DATA_G-INSPIRED GROUPS, OTHER
OUTSIDE SIGsDATA DATA
DATABASE 1
37
LDEF SYSTEMS FLIGHT HARDWARE
STANDALONE
LDEFSTRUCTURE
VISCOUS MAGNETIC
DAMPER
TRUNNIONS/GRAPPLE
FIXTURE
EXPERIMENT INITIATE SYSTEM (EIS)
EXPERIMENT INITIATE BOX (EIB)
I-F
-t
SHARED
STANDARD EXPERIMENT POWER
AND DATA SYSTEM (EPDS):
• DATA PROCESSOR CONTROL
ASSEMBLY (DPCA)• MAGNETIC TAPE MEMORY UNIT
(MTM)• LiS02 BATTERY POWER SOURCE
EXPERIMENT EXPOSURE CONTROL
CANIS_FER (EECC): WITH LiS02BATTERIES
EXPERIMENT TRAYS
(CLAMPING ARRANGEMENT)
EXPER
ID NO.
A 0038 MANUAL
A 0054
A 0076 !PWR
_-o133A 0138-8
A O139-A MANUAL
A 0180
A 0187-1 MANUAL
A 0201
M 0003 MANUAL
M 0004 PWR
M 0006 PWR
K:SC USO2E OTHR
,,aCIVf'Y BA"I'-FI BA"I'r
• II
• i• i• i
o
!T
i
r
• i
• UCF
'NiCcl
UCFJ,
P 0003 PWR
S 0010,
S 0014
S 0069
S 1001
S 1002
S 1005
7 PASSIVE
MANUAL
MANUAL
PWR
MANUAL
!EPDS
,.
MTM
I ,
E1
LDEF EXPERIMENT SYSTEMS
ECE-COPT ! MECH
•
i.I. Ii'li .
i •I •
f
• I
• 1
i
• !]
• I
If
iII, ,
iI
COMM_'IS
PYRO CABLE CUTTER, FLIP UP MECH
HIGH VOLTAGE EQUIP, COULOMBMETER ....
• VARIABLE CONDUCTANCE HT PIPES
RADAR ANTENNA, SCUD STATE MEMORY
FRECOPA
SEALED CRYSTAL DEWERS
SEALED _ RECOROER
CLAM SHELL AND ELECTROMECHANISMS
SUN SSNSOR
• AU.S'&--rE_ST_ES• RBER OPTICS ELECTRONICS
OPTICAL SURFACES
• THERMOCOUPLES, EXTEI_IVE HARNESS
EECC ACCESSIBLE AT LaRC
!PV CELLS, SUN SENSOR, RADIOMETER
• CAROUSEL OPT SYSTEM, THERMAL SYSTEM
• SOLAR.ARRAY. POWER SYSTEM, FIT PIP_ES
SOLAR CELLS, QCM
• HEAT PIPES
MANUAt"VALVES, SEALS
38
I°
I1.
III.
STANDARD TEST PLAN OUTLINE
GENERAL
A. Review and Inspection
1. Preliminary Review
2. Visual Inspection
3. Initial Data Review
B. Calibration
1. General
2. Calibration Certification
3. Accumulative Errors
4. Statement of Accuracy
C. Contamination
ELECTRICAL
A. Electrical Systems
1. Component examination and failure
analysis
2. Systems and subsystems functional
testing
3, Circuit board p.vaiuation
B. Power
1. Batteries
2. Solar Cells
3. Power management and control
components
4. High voltage insulators/dielectrics
C. Wire Harnesses
OPTICAL
A. Glasses/Substrates/Filters
B. Sources�Detectors/Radiometers
C Fiber Optics
IV.
V.
MECHANICAL
A. Structures
B. Mechanisms
(3. Electro-Mechanical/Servo
D, Instrumentation
THERMAL
A. Insulation
1. Non-metallic insulators
2. Thermal blankets
B Surfaces
C. Instrumentation
39
LDEF SYSTEMS SIGDATA BASE COMPOSITION
Vendor and OEM specifications for systemsl assemblies, partsand materials
As-built drawings, schematics, and parts lists
Pre-flight proceduresPre-flight parts screening and failure analysis data
Pre-flight acceptance, qualification and performance test data
Pre-flight control sample test data and storage history dataEnvironmental data from supporting data groupsFlight operational history
Support equipment calibration dataPost-flight test plans, procedures, and supporting data
Post-flight failure/degradation analysis reportsPost-flight measured data
40
LDEF DATA ANALYSIS REPORT
£Td'TI_INE
t Introduction and Background
LDEF
Systems SIG
Inveshgahon Ptan
Data Package Format
2 Inveshgahon Results
General Systems
Summary of ',he tnveshgahonAbstracts of Specific Studies
, LOEF Systems
Expenmenter Samoles
Etectncal Systems
Summary o( the Invest_gat+on
Abstracts of Spec=fic StudiesLDEF Systems
Experimenter Samples
Mechanical Systems
Summary of the InvestigationAbstracts of Specific Studies
LDEF Systems
Expenmenter Samples
Optical Systems
Summary of the lnvestigahon
Abstracts of Specific Studies
LDEF Systems ..Expenmenter Samples
Thermal Systems
Summary _l 'he InveSttqat_onAbstracts ol Spec_tic Studies
LDEF Systems
Expenmenter San"oles
J Cross Reierence T,lDtes 3nd Tnd_ces
4 Assessment of :he qnvestgatlon Plan
MONTHLY REPORT
OBJECTIVES
DISSEMINATION
• SOLICITATION
MONTHLY REPORT
CONTENTS
DATABASE STATUS
RECENT EVENTS AND OBSERVATIONS
PROGRAM/PROJECT COMMENTARY AND NEWS
SIG(s) STATUS REPORT(s)
SDIO COMMENTARY AND NEWS
EXPERIMENTER PUBLICATION NOTICES/ABSTRACTS/NEWS
SCHEDULE�EVENTS�MEETINGS
PEOPLE/TRANSITIONS
41
LDEF SYSTEMS
PRIMARY STRUCTURE:
INTEGRATE SSIG-DEVELOPED PLANS INTO PROJECT OFFICE PROCEDURES
VISUAL INSPECTION, WELD INSPECTION, BOLT REMOVALLDEF COMPONENTS FOR STRUCTURAL ANALYSIS AT BOEINGNO POST-FLIGHT MODAL, WEIGHT AND ALIGNMENT MEASUREMENTS
EXPERIMENT INITIATE SYSTEM (EIS)
SSIG PROPOSED VERIFICATION OF EIS RELAY STATUS PRIOR TO TRAYREMOVAL
DISCONNECT OUTPUT CABLE AT EIS, PERFORM CONTINUITY TESTSMULTIMETER WILL NOT ACTIVIATE RELAYSALL TEST RESULTS RELEASED TO P.O.FOUR EXPERIMENTS PER CONNECTORNEED PI CONSENT
LDEFSYSTEMS
ENVIRONMENTAL EXPOSURE CONTROL CANISTER (EECC)° PI'S WiTH CANNISTERS HAVE BEEN CONTACTED AND COMMENTS
INCORPORATED• CANNISTER INTERNAL PRESSURE, SURGE CURRENT, SEAL,
MECHANISM, HARNESS AND CONNECTORS
EXPERIMENT POWER AND DATA SYSTEM (EPDS)• START-UP, FUNCTIONAL TESTING
VISCOUS DAMPER• LDEF PROCEDURE FOR REMOVAL
• ,. JSC AND/OR OEM (GE) WILL PERFORM POST-FLIGHT TESTING
GRAPPLE (ACTIVE & PASSIVE)• JSC AND/OR OEM (SPAR) WILL PERFORM POST-FLIGHT TESTING
BATTERIES _ _• PROJECT OFFICE PROCEDURES GOVERN REMOVAL• DISCHARGE EVALUATION ADDED TO NO-LOAD TESTING
42
INDIVIDUAL EXPERIMENT AND IMPLEMENTATION PLANS
EXPERIMENT NO. AND TITLE
NAME & PHONE NO. OF PI CONTACTED
LOCATION OF EXPERIMENT ON LDEF
DESCRIPTION OF HARDWARE OF SYSTEM SIG INTEREST
RESULTS OF DISCUSSIONS WITH PI
PROPOSED TEST PLAN FOR EVALUATION OF SYSTEM HARDWARE AT KSC
POST KSC TEST PLAN AND SCHEDULE
IDENTIFICATION OF PREFLIGHT AND CONTROL HARDWARE
NECESSARY ACTION ITEMS PRIOR TO THE GENERAL INSPECTION AT KSC
EDITORIAL COMMENTS
43
NASALONG DURATION EXPOSURE FACILITY
SPECIAL INVESTIGATIONPLANS
- MATERIALS SIG
GROUP
BLAND A. STEIN
NASA - LANGLEY RESEARCH CENTERCHAIRMAN, MSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
i_,..._INTENTtONALLX
PRECEDING PAGE BLANK NOT FILMED 45
LONGDURATIONEXPOSUREFACILITY
MATERIALSSPECIALINVESTIGATIONGROUP(MSIG)
BLAND A. STEINNASA - LANGLEY RESEARCH CENTER,
CHAIRMAN, LDEF MSIG
LDEF MATERIALS DATA ANALYSIS WORKSHOPNASA - KENNEDY SPACE CENTER
FEBRUARY, 1990
LONG DURATION EXPOSURE FACILITY
MATERIALS SPECIAL INVESTIGATION GROUP(MSIG)
• INVESTIGATE THE EFFECTS OF THE 5.5-YEAR EXPOSURE IN LEOON LDEF STRUCTURAL AND EXPERIMENT MATERIALS WHICHWERE NOT ORIGINALLY PLANNED TO BE TEST SPECIMENS
• INTEGRATE THE DATA/ANALYSES FROM THE MATERIALSEXPERIMENT TEST SPECIMENS (GENERATED BY THE PIs)
WITH THE MATERIALS DATA GENERATED BY MSIGINTO AN LDEF MATERIALS DATA BASE
46
MEMBERSHIP OF LDEF MSIGFebruary, 1990
NAME
Bland Stein
Lubert LegerAnn WhitakerWayne StuckeyBruce Banks
Wayne SlempJack BerengoltzJack Triolo
Lou McCreightCharles BerschTom CrookerPhil YoungPaul SagalynSally LittleJohn Davis
Rod TennysonFrancois LevadouAlain PaillousLou Teichman
Jim MasonBill KinardTom Parnell
AFFILIATION
NASA - LaRCNASA- JSCNASA - MSFCAerospace Corp.NASA- LeRCNASA - LaRCNASA- JPLNASA- GSFC
Aerospace CorpIDA/SDIONASA- HQNASA-LaRC
Army MTLNASA-SSFPONASA-MSFC.U. TorontoESTECCERTNASA-LaRC
NASA-GSFCNASA-LaRCNASA-MSFC
ROLE/EXPERTISE
Chairman
Atomic OxygenAtomic OxygenContamination and RadiationAtomic OxygenRadiation, CoatingsContamination
Space Materials and CoatingsSpace MaterialsSpace MaterialsSpace MaterialsAnalytical ChemistryRadiationSpace MaterialsMAPTIS Data BaseSpace MaterialsSpace Materials, Environmental EffectsSpace MaterialsExecutive Secretary
Liaison with Systems SIGLiaison with Meteoroid and Space Debris SlGLiaison with Induced Radiation SIG
47
LDEFMATERIALS SPECIAL INVESTIGATION GROUP
ANALYSIS AND DOCUMENTATION PLAN
• SYSTEMATICALLY EXAMINE IDENTICAL MATERIALS IN MULTIPLE LOCATIONSAROUND LDEF TO ESTABLISH DIRECTIONALITY OF ATOMIC OXYGEN EROSION,THERMAL EFFECTS, AND ULTRAVIOLET RADIATION DEGRADATION
• ANALYZE SELECTED SAMPLES FROM LDEF "NON-MATERIALS" EXPERIMENTS
• ESTABLISH CENTRAL MATERIALS ANALYSIS CAPABILITYSTANDARDIZED, NON CONTAMINATING PROCEDURES FOR
SAMPLING/SHIPPINGJARCHIVINGUNIFORM TEST/ANALYSIS PROCEDURESBASIS FOR ASSESSMENT OF LABORATORY-TO-LABORATORY VARIATIONS
IN MATERIALS DATA
• FOCAL POINT FOR COORDINATION OF ALL LDEF MATERIALS ANALYSESSPONSOR LDEF MATERIALS WORKSHOPS/SYMPOSIAGENERATE UNIFIED LDEF MATERIALS DATA BASE, INCLUDING DATA FROM
PRINCIPAL INVESTIGATORS, SUPPORTING DATA GROUPS, ANDSPECIAL INVESTIGATION GROUPS
48
LDEF DATA ANALYSIS
THRUSTS
LDEFRETRIEVAL
ENVIRONMENTDEFINITION
LDEFEXPERIMENT
DATA ANALYSIS
FY-89 FY90 FY-91 FY-92 FY-93
I I I I
PLANNING,RETRIEVAL AND
INSPECTION
LDEF SUPPORTING DATA I
I INDIVIDUAL EXPERIMENT ANALYSES BY PRINCIPAL INVESTIGATORS I
SPECIALINVESTIGATIONS
ANDDOCUMENTATION
MATERIALS/SYSTEMS/DEBRIS IMPACT/RADIATIONANALYSES BY SPECIAL INVESTIGATION GROUPS
V V v
EXPECTED RESULTS
• EARLY ASSESSMENT OFSPACE ENVIRONMENTALEFFECTS
• DEFINITION OF LDEFMISSION ENVIRONMENT
• EFFECTS OF LDEFEXPOSURE ON MATERIALSAND SYSTEMS
• ENHANCED MODELS FORSPACE ENVIRONMENTALEFFECTS
• SPACE ENVIRONMENTALEFFECTS HANDBOOKS FORLOW EARTH ORB_EXPOSURES
MAJOR MILESTONES
_17 LDEF RETRIEVAL AND "QUICK-LOOKy INSPECTION" FINDINGS
_' SUPPORTING DATA PACKAGES TOif PIs AND SIGs
LDEF INVESTIGATOR WORKSHOPY TO COMPARE PRELIMINARY DATA
LDEF DATA CONFERENCE
LDEF DATA AND SPACE ENVIRONMENTALY EFFECTS MODELS SYMPOSIUM
LDEF MATERIALS, SYSTEMS, ANDv DEBRIS EFFECTS DATA BASES
DOCUMENTED
49
LDEFMATERIALS SPECIAL INVESTIGATIONGROUP (MSIG)
- KEY MILESTONES-
• SELECT MSIG PARTICIPANTS, JANUARY 1989; HOLD 4 MEETINGS IN 1989
• ADOPT MSIG PHILOSOPHY, MARCH 1989
• RECOMMEND SECURITY POLICY REGARDING MATERIALS INFORMATIONTO LDEF PROGRAM OFFICE, APRIL 1989
• SELECT CONTRACTOR, INITIATE TASK CONTRACT FOR MATERIALS TESTSAND ANALYSES, MAY, 1989:
- IDENTIFY ANALYSIS TECHNIQUES, JULY 1989- DEVELOP SPECIMEN SELECTION PLANS, AUGUST 1989- DEVELOP INITIAL SPECIMEN PRESERVATION PLANS, OCTOBER 1989- PRE-/POST-RETRIEVAL LIAISON WITH PIs, MAY 1989 - MARCH 1990
• SUGGEST CONTAMINATION MONITORING METHODOLOGY TO LDEF PO, SEPTEMBER 1989
• PROVIDE ATOMIC OXYGEN FLUX ESTIMATES AND PHOTOGRAPHIC SURVEYRECOMMENDATIONS TO LDEF PO, OCTOBER 1989
• DEVELOP MSIG DETAILED TEST PLAN, OCTOBER - DECEMBER 1990
LDEF
MATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
- KEY MILESTONES (Continued) -
• PLAN LDEF MATERIALS DATA ANALYSIS WORKSHOP, NOVEMBER - DECEMBER 1989
• DETERMINE UTILITY OF NASA-MSFC MAPTIS DATA BASE CAPABILITY FORLDEF MATERIALS DATA BASE, JANUARY 1990
• RETRIEVE LDEF; FERRY TO KSC; INITIAL INSPECTIONS, JANUARY- FEBRUARY 1990
• CHAIR LDEF MATERIALS DATA ANALYSIS WORKSHOP AT KSC, FEBRUARY 1990
• OBTAIN MSlG SPECIMENS, FEBRUARY- MARCH 1990
° DATA GENERATION, DATA ANALYSIS, AND DATA BASING, 1990 - 1992
• MSIG REPORTS AT LDEF AND OTHER CONFERENCES, 1990 - 1993
• DEFINE, WITH PIs AND OTHER SlGs, MATERIALS DATA BASE, 1991 - 1992
• COLLATE AND DOCUMENT LDEF MATERIALS DATA BASE, 1992- 1993
5O
LDEF
MATERIp, LS SPECIAL INVESTIGATION GROUP (MSIG)
- TEST PLAN OUTLINE*
• GOALS AND PROCFDURES
• PRE-RECOVE t_Y PREPARATIONS
• NASA - KSC OPERATION REQUIREMENTS
• ON LINE/OFF LINE EXAMINATION PROCEDURES
• IDENTIFICATION OF PRIORllY MATERIALS
• ANALYSIS/TESF PLAN FOR EACH MATERIAL TYPE
• SAMPLE HANDLING/PACKAGING/SHIPPING
• CONTAMINATION CONTROL
• LDEF MATERIALS DATA BASE
• KEY PERSONNEl.
• SCHEDULE
• SEE TEST PLAN DOCUMENT FOR DETAILS
i ,
51
_ 4 _, ,
LDEF •MATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
- GOALS AND PROCEDURES* -
GOALS ,_
• INVESTIGATE THE EFFECTS OF LDEF EXPOSURES ON SPACECRAFT MATERIALS,ESPECIALLY THOSE NOT ORIGINALLY INTENDED TO BE MATERIAL SPECIMENS
- DEVELOP ENGINEERING DATA FOR SPACECRAFT DESIGN- DEFINE MECHANISMS OF MATERIAL DEGRADATION
• COORDINATE DATA FROM PIs, MSlG, AND OTHER SlGs INTO LDEF MATERIALSDATA BASE
- EFFECTS OF POSITION ON LDEF, ORIENTATION OF LDEF, POSITION ONEXPERIMENT TRAY
- COMPARISONS WITH CONTROL SPECIMEN. DATA- LABORATORY-TO-LABORATORY DATA VARIABILITY
• ESSENTIAL TASKS AT KSC DE-INTEGRATION- DETAILED PHOTGRAPHIC AND HIGH-RESOLUTiON VIDEO SURVEYS OF SURFACES- DEFINE CONTAMINATION- WORK CLOSELY WITH OTHER SlGs AND PIs- COLLECTION AND PRESERVATION OF SOME SPECIMENS- DEFINITION OF ADDITIONAL MSIG SPECIMENS
• EXTENSIVE TESTING AND ANALYSES AT BOEING AEROSPACE UNDER CONTRACTNAS1-18224, TASK 12
• COMPUTERIZED DATA BASES PLUS HANDBOOK(S)
* SEE TEST PLAN DOCUMENT FOR DETAILS
52
BOEING AEROSPACE MANAGEMENT PLAN
I • MSIG RCO) =I I, • Other SIGs r- ....I o Principal investors uI__ , _J
I
MechanicalProperty
Testing andAnalysis
Herb Lenhart
NDETechnologies
• Brian LemprlereUltasonic
= Jim NelsonCat Scan
I
I Chemical/SurfaceAnalysis I
• Wally Piageman
ln-Situ OpticalMeasurements
Program Manager ISylvester Hill
I
Technical Leader IGary Pippin
I ContamlnatlonControl i
_l Subc°ntract°rs JUniversities I
Engineering StaffHarry Dursch
• Ross Crutcher
I
I AnalysisSupport
• Derek MahaffeyPlasma Effects
• Ray RemptAtomic Oxygen
• Peter MajewsklMeteroid and
• Chris Shaw OperationsPersonnel
Debris Impact
!I
CombinedEffects
Simulation
• Larry Fogdal
Photovoltalcs& Electronic
DeviceEvaluation
• Walt Devaney
LDEFMATERIALS sPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
-PRE-RECOVERY PREPARATIONS*-
• PREPARATION OF CONTAMINATION TAPELIFT KITS, DOCUMENTATION, ANDINDEXING PROCEDURES
t
• ARRANGE FOR PHOTO AND VIDEO DOCUMENTATION EQUIPMENT
• OBTAIN PHOTOGRAPHS AND VIDEO FROM ON-ORBIT RETRIEVAL ACTIVITIES
• DEFINE SPECIMEN LABELING KEY; ARRANGE FOR LABELED PACKAGING
MATERIALS AND DOCUMENTATION FORMS
• DEFINE STORAGE AND SHIPPING ARRANGEMENTS FOR MSIG SPECIMENS
• DEFINE KSC-PROVIDED EQUIPMENT AND FACILITIES
• DEFINE MSIG/BOEING-PROVIDED EQUIPMENT AND FACILITIES
• ESTABLISH KSC COORDINATION TEAM AND BOEING ANALYSIS TEAMS
• PLAN LDEF MATERIALS DATA ANALYSIS WORKSHOP DURING "LDEFINSPECTION WEEK" AT KSC
* SEE TEST PLAN DOCUMENT FOR DETAILS
53
LDEF
MATERIALS SPECIAL INVESTIGATION GROUP (MSIG)TEST PLAN
- LDEF EXAMINATION PROCEDURES* -
ON-LINE EXAMINATIONS
• DON'T GO IN WITH PRECONCEIVED CONCLUSIONS; OBSERVE FROM A MODERATEDISTANCE, OBSERVE FROM CLOSE DISTANCE, STEP BACK AND OBSERVE AGAIN.TRY TO "LISTEN TO LDEF'S STORY".
• ASSURE PHOTGRAPHICNIDEO DOCUMENTATION OF ENTIRE LDEF AND CLOSEUPSOF ALL REGIONS OF PARTICULAR INTEREST
• COLLECT TAPELtFTS FROM STRUCTURAL SURFACES; INDEX AND DOCUMENT
• ASSURE ACCESS TO CONTAMINATION WITNESS PLATE DATA
• DOCUMENT ALL REMOVED PARTS
OFF-LINE ACTIVITIES
• COORDINATE AND PARTICIPATE IN LDEF MATERIALS DATA ANALYSIS WORKSHOP
• COORDINATE PHOTO/VIDEO SURVEYS WITH JSC/M&D SIG TEAM
• NEGOTIATE WITH PIs AND OTHER SIGs FOR HARDWARE OF INTEREST TO MSIG
•MONITOR DE-INTEGRATION; PACKAGE AND SHIP INITIAL MSIG SPECIMENS
* SEE TEST PLAN DOCUMENT FOR DETAILS
'T_ILINr. SURFACr_(ROWNO. 3)
"I_Y IDENI'I r ]CAI]ON/
4X
H-SURFACE'%
(SPACEEND :
I
..,1
-M I
(DIREETED 17='0.
IN ORBITER )
I-LEAD]NG SURFACE
/ (R(_NO. 9)
/ KEEL F]TI]NG
G-SURFACE
{EARTH END)
LOCAL
VERTICAL
LDEF Orbital Orientation Model.
54
LDEF ENVIRONMENTS
ENVIRONMENT
• ATOMIC OXYGEN
• METEOROIDS, MICROMETEOROIDS, AND SPACE DEBRIS
• COSMIC DUST AND HEAVY COSMIC-RAY NUCLEI
• HEAVY IONS
• SOLAR ELECTROMAGNETIC ENERGY AND ENERGY VARIATIONS
• PROTON AND ELECTRON RADIATION
LDEF EARTH. LAUNCH. RETRIEVAL. AND FERRY ENVIRONMENTS
• ATMOSPHERIC GASES (DRY AIR)
• HUMIDITY (BUT NOT CONDENSATION)
• CONTAMINANT GASES
• CONTAMINANT PARTICLES
PRELIMINARY APPROACH TO SPECIMEN SELECTIONFOR
MATERIALS ANALYSIS AND DATA BASE CREATION
• Materials not of primary interest to PIs
• Availability of extra exposed specimens
• Availability of extra control specimens
• Experiments with desirable locations
• Experiments with diverse materials
ANALYSIS ASSESSMENT
' "o Assessment of lab-to-lab _.i'iations ;i
55
LDEFMATERIALS SPECIALINVESTIGATION GROUP(MSIG)
TEST PLAN
- EXAMPLES OF "NON-MATERIALS EXPERIMENT" MATERIALS SOURCES*
• TRUNNIONS AND SCUFF PLATES
• SHUTI'LE PAYLOAD BAY DEBRIS
• REFLECTORS
• TRAY FASTENERS, BOLTS, WASHERS, NUTS, PLATES, ETC.
• MATERIALSAND COATINGS IN SYSTEMS EXPERIMENTS
• MATERIALS AND COATINGS IN SCIENCE EXPERIMENTS
• THERMAL BLANKET AND OTHER PROTECTION MATERIALS
• ELECTRONIC COMPONENT MATERIALS
* SEE TEST PLAN DOCUMENT FOR DETAILS
LDEF MATERIALS FOR ANALYSIS
Materials
• Polymeric films and composites• Metal-matrix composites• Polished metals
• Glasses, optical filters and fibers• Ceramics• Solar cell materials• Solid rocket materials
Coatings
• Black and white paints
• Anodized aluminum
• Sputter deposited coatings• Metallic coatings• Second-surface mirrors
• Optical solar reflectors
56
LDEFMATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
- PRIORITY MATERIALS FOR MSIG ANALYSIS* -
• KAPTON• COATED AND UNCOATED TEFLON• TH ERMOSETS• TH ERMOPLASTICS• ANODIZED ALUMINUM "• STAINLESS STEEL• BLACK AND WHITE THERMAL CONTROL PAINTS
TRAY LOCATIONS
• LEADING EDGE/TRAILING EDGE• SPACE END/EARTH END• 90 ° TO LEADING EDGE
* SEE TEST PLAN DOCUMENT FOR DETAILS
LDEFMATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
- MATERIALS OF INTEREST FOR MSIG ANALYSIS* -
MZLT.E,BJAL__ZE_
• POLYMERS• METALS• COMPOSITES• CERAMICS• COATINGS• INSULATION• LUBRICANTS• ELASTOMERS/ADHESlVES/POTTING COMPOUNDS
LDEF LOCATIONS/ENVIRONMENTS OF INTEREST
• RAM EDGE/AO, UV, SOLAR WIND, THERMAL CYCLING, M&D IMPACTS• 30°, 60°, AND 90° TO RAM EDGE/LESS AO, UV, SOLAR WIND, TC, M&D• TRAILING EDGE/UV, SOLAR WIND, TC, M&D IMPACTS• 30° AND 60° FROM TRAILING EDGE/UV, SOLAR WIND, M&D IMPACTS• SPACE END/UV, SOLAR WIND, TC, M&D IMPACTS• EARTH END/UV, SOLAR WIND, TC, M&D IMPACTS, EARTH RADIATION• INTERNAL AND PROTECTED AREAS/VACUUM, LESS TC, RELATIVE CONTAMINATION
* SEE 18 PAGES OF TEST PLAN DOCUMENT FOR DETAILS
57
LDEFMATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
NONDESTRUCTIVE EXAMINATION (NDE) TECHNIQUES*
-PULSE ECHO• HIGH FREQUENCY• SURFACE WAVE
EJ2D_Y_g_U__#J_
COMPUTED TOMOGRAPHY
• X-RAYS• MULTIPLANE RECONSTRUCTION
* SEE TEST PLAN DOCUMENT FOR DETAILS
LDEFMATERIALS SPECIALINVESTIGATION GROUP(MSIG)
TEST PLAN
-TESTS FOR MATERIAL CATEGORIES*-
COMMON PROCEDURES FOR MOST MATERIALS
VISUAL INSPECTIONDETERMINE WEIGHT AND DIMENSIONSOPTICAL PHOTOMICROGRAPHY
SURFACE ROUGHNESS (PROFILOMETER OR NOMARSKI MICROSCOPE)SOLAR ABSORBTANCE (UV-VIS/NIR SPECTROMETER, ASTM E-424 A)INFRARED EMI'I-rANCE (DB-IO0 IR REFLECTOMETER, ASTM E-408 A)TOTAL HEMISPHERICAL REFLECTANCE (UV-VIS/NIR AND FTIR SPECTROMETERS)
OUTGASSING (STANDARD TESTS PLUS PYROLYSIS GAS CHROMATOGRAPHY)COATING ADHESION PEEL TESTS
ADDITIONAL TESTS FOR ORGANICS
THERMAL CHARACTERIZATION (TGA TMAI DMA DSC)CREEP
HARDNESS (SHORE A AND D)DIELECTRIC CONSTANT AND STRENGTH (MIL-STD-202)ELECTRICAL RESISTANCE (MIL-P-13949)CONFORMAL COATING ANALYSIS (MICRO-IR. DSC, TGA, ETC.)SOLUTION PROPERTIES (HPLC, GPC)
• SEE TEST PLAN DOCUMENT FOR DETAILS
58
LDEF
MATERIALS SPECIALINVESTIGATION GROUP(MSIG)TEST PLAN
- TESTS FOR MATERIAL CATEGORIES* (CONTINUED) -
ADDITIONAL TESTS FOR METALS
• HARDNESS (ROCKWELL AND ROCKWELL SUPERFICIAL)• SURFACE ANALYSIS (SEM, EDS, AUGER, ESCA, X-RAY DIFFRACTION)• RESIDUAL STRESS (X-RAY DIFFRACTION)• MECHANICAL PROPERTIES (TENSILE, IMPACT, FRACTURE TOUGHNESS)• FRACTURE ANALYSIS (OPTICAL MICROSCOPY, SEM,EDS)• BULK CHEMICAL ANALYSIS (SPECTROCHEMICAL, EDS)• METALLOGRAPHY• OPTICAL AND THERMAL PROPERTIES (REFLECTIVlTY, EMMITANCE, HEAT TRANSFER)
ADDITIONAL TESTS FOR CERAMICS AND GLASSES
• ELEMENTAL ANALYSIS (AUGER, ESCA, SIMS)• CRYSTALLINITY (X-RAY DIFFRACTION)• TRANSMISSION ELECTRON MICROSCOPY• IN-SlTU TRANSMITTANCE AND REFLECTANCE (CETF)• BIDIRECTIONAL REFLECTANCE DISTRIBUTION (CETF)
* SEE TEST PLAN DOCUMENT FOR DETAILS
LDEFMATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
- TESTS FOR MATERIAL CATEGORIES* (CONTINUED) -
ADDITIONALTEST_ FOR COMPOSITES
SURFACE EROSION AND MICROCRACKING(OPTICAL MICROGRAPHY AND SEM)SPECIFIC GRAVITYDELAMINATIONS (NDETECHNIQUES, MICROSCOPY, AUGER, MICROPROBE)MECHANICAL PROPERTIES(FLEXURE, COMPRESSION, SHEAR, TOUGHNESS)OPTICAL PROPERTIES (EMI3-FANCE,ABSORPTANCE, REFLECTANCE)FIBER CONTENT, RESIN CONTENT, VOID CONTENT (RESIN BURNOUT, CALCULATION)THERMAL EXPANSION, THERMAL CONDUCTIVITY (TMA, DILATOMETRY, ASTM D1225)GLASS TRANSITION TEMPERATURE (DTA, ASTM D1225)SPECIFIC HEAT (DSC)OUTGASSING, VOLATILES, CONDENSlBILES (TGA, ASTM E595)
• CHEMICAL ANALYSIS (INFRAREDSPECTROSCOPY)
ADDITIONALTESTS FOR INSULATION MATERIALS
• THERMAL CONDUCTIVITY (DYNATECH, HEAT FLOW METER)• SPECIFIC HEAT (DSC)• COMPRESSIBILITY/RESILIENCY• WETTABILITY/CONTACT ANGLE (GONIOMETER)• ELECTROSTATIC CHARGING (SURFACE ELECTRICAL POTENTIAL, CONDUCTIVITY)
* SEE TEST PLAN DOCUMENT FOR DETAILS
59
LDEFMATERIALS SPECIALINVESTIGATION GROUP(MSIG)
TEST PLAN
- TESTS FOR MATERIAL CATEGORIES* (CONTINUED) -
ADDITIONALTESTSFORLUBRICANTS
•CREEP (VISUAL/OPTICALEXAMINATION,INFRAREDANALYSIS)• WEARANDLUBRICANTCONDITION(TRIBOMETER,CHROMATOGRAPHY,
SPECTROMETRY)• PEEL(FORSOLIDFILMLUBRICANTS)
ADDITIONALTESTSFORTHERMALCONTROLCOATINGS
• SURFACEANALYSIS/ROUGHNESS,CRACKING(SEM,NOMARSKIMICROSCOPY) • .• SURFACEANALYSIS/CHEMISTRY(FTIR,X-RAY PHOTOELECTRONSPECTROSCOPY)• TOTAL INTEGRATEDSCATTERAND BIDIRECTIONALREFLECTANCEDISTRIBUTION
(LASERILLUMINATION,VARYINGSOURCEANDDETECTORANGLES)• IN-SITUSOLARABSORPTANCE(COMBINEDRADIATIONEFFECTSTESTCHAMBER,
DOUBLEPASSREFLECTANCE)• COATINGTHICKNESS(PROFILOMETRY)
* SEETESTPLANDOCUMENTFORDETAILS
LDEFMATERIALS SPECIAL INVESTIGATION GROUP (MSIG)
TEST PLAN
- TESTS FOR MATERIAL CATEGORIES* (CONCLUDED) -
ADDITIONAL TESTS FOR ELASTOMERS, ADHESIVES. AND PQTTING COMPOUNDS
• VISUAL APPEARANCE (LOW MAGNIFICATION)• CHEMICAL ANALYSIS (FTIR)• SOLUTION PROPERTIES (HPLC, GPC)• HARDNESS (SHORE A OR D, ASTM 2240)• THERMAL CHARACTERIZATION (TGA, TMA, DMA, DSC)• DIELECTRIC CONSTANT AND STRENGTH (MIL-STD-202)• ELECTRICAL RESISTANCE (MIL-P-13949)
* SEE TEST PLAN DOCUMENT FOR DETAILS
60
LDEFENVIRONMENTAL EFFECTS ON MATERIALS
SPECIAL INVESTIGATION GROUP
- ACCOMPLISHMENTS THROUGH FEBRUARY, 1990 -
• MEETINGS HELD AT LaRC, WILLIAMSBURG, BOEING/KENT, AND KSC; MARCH, MAY,AUGUST, AND OCTOBER, 1989 (AND FEBRUARY, 1990)
• BRIEFINGS TO LDEF PRINCIPAL INVESTIGATORS, OTHER SPECIAL INVESTIGATIONGROUPS, SPACE STATION M&P WORKING GROUP, SDIO/AEROSPACE CORP., ANDNASA HQ
• MSIG PHILOSOPHY ADOPTED:- DEVELOP ENGINEERING DATA AS FIRST PRIORITY- DEVELOP MECHANISTIC DATA AS HIGH PRIORITY
• SECURITY POLICY REGARDING MATERIALS INFORMATION RECOMMENDEDTO LDEF PROGRAM OFFICE; LDEF INSPECTION TEAM FORMED
• CONTRACTOR SELECTED, TASK CONTRACT INITIATED FOR MATERIALS TESTSAND ANALYSES
- PRELIMINARY ANALYSIS TECHNIQUES IDENTIFIED- APPROACHES TO SPECIMEN SELECTION DEVELOPED- PLANNING, ANALYSIS, AND DOCUMENTATION TASKS INITIATED
LDEFENVIRONMENTAL EFFECTS ON MATERIALS
SPECIAL INVESTIGATION GROUP
- ACCOMPLISHMENTS THROUGH FEBRUARY, 1990 -(Continued)
. SPECIAL FY89 FUNDING REQUESTED FROM NASA ASSOCIATE ADMINISTRATORFOR AERONAUTICS AND SPACE TECHNOLOGY; JULY 1989
• MSIG CHAIRMAN INSPECTED LDEF-RE'LATED FACILITIES AT KSC TO ASSESSCONTAMINATION POTENTIAL; JULY 1989
• MSlG CONTAMINATION MONITORING SUGGESTIONS SENT TO LDEF PO; SEPT. :1989
• ATOMIC OXYGEN/PHOTOGRAPHIC SURVEY SUGGESTIONS SENT TO LDEF PO; OCT. 1989
• LDEF MATERIALS DATA-BASING OPTIONS REVIEWED; NASA-MSFC MAPTIS DATA BASESELECTED FOR INITIAL ASSESSMENT; AUGUST - OCTOBER 1989
• LDEF MATERIALS DATA ANLYSIS WORKSHOP PLANNED; NOVEMBER 1989 TOJANUARY 1990
• MSIG TEST PLAN DEVELOPED AND DOCUMENTED; TRANSMITFED TO LDEF PROJECTOFFICE; DECEMBER 1989
61
LDEFENVIRONMENTAL EFFECTS ON MATERIALS
SPECIAL INVESTIGATION GROUP
- ACCOMPLISHMENTS THROUGH FEBRUARY, 1990-(Concluded)
• SUPPORT OF LDEF INSPECTION TEAM DURING DOWNLINK VIDEO, IN-SPACEPHOTOGRAPHY, AND INITIAL KSC INSPECTIONS; JANUARY AND FEBRUARY 1990
• PRELIMINARY IDENTIFICATION OF LDEF LEADING EDGE POSITION, FEBRUARY 1990
• MSlG SPECIMEN IDENTIFICATION; FEBRUARY AND MARCH 1990
• ASSUMED RESPONSIBILITY FOR TOTAL LDEF CONTAMINATION IDENTIFICATIONAND DOCUMENTATION; FEBRUARY 1990
- PARTICULATE CONTAMINATION (PRE-DEINTEGRATION)- MOLECULAR CONTAMINATION (POST-DEINTEG RATION)
62
NASALONG DURATION EXPOSURE FACILITY
SPECIAL INVESTIGATIONPLANS
-IONIZING RADIATION SIG
GROUP
THOMAS A. PARNELL
NASA- MARSHALL SPACE FLIGHT CENTERCHAIRMAN, IRSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
63
" 7 " " .
LDEF IONIZING RADIATIONSPECIAL INVESTIGATION GROUP
KSC 2-13-90
• Objectives of IRSIG
• Review Team Members
• Radiation Measurements in LDEF Experiments
• Improvements in Radiation Environments Knowledge Anticipated from LDEF
• IRSIG Plans
• Predictions Booklet
• Calculations Plan
• P0006 Measurements and Analysis
• Induced Radiation Measurements and Analysis
• Radiations Effects Coordination
• Coordination with Experimenters and Other SIG's
• Status =
LDEF IONIZING FL&DIATION SIGREVIEW TEAM
Thomas A. ParnellMarshall Space Flight Center
E.V. BentonUniversity o! San Francisco
Gerald J. FishmanMarshall Space Right Center
Robed L. KinzerNaval Research Lab
Allan R. SmithLawrence Berkeley Lab
Jacob I. TrombkaGoddard Space Flight Center
James H. Adams (DOD Contract)Naval Research Laboratory
John W. WattsMarshall Space FlightCenter
Alex ThompsonDublin Institute for Advanced Studies
._/t I#.
James H. DerricksonMarshall Space Flight Center
Wolfgang HeinrichUniversity ol Siegen
C. Lewis SneadBrookhaven National Lab
Clive S. Dym (ESA Contact)Royal Aerospace E_ent
Rodney PierceyMississippi Slate University
Denis O'SuNivanDublin Ins0tute for Advanced Studies
James C, Rifler (SDIO Rep)Naval Research Laboratory
Richard Scott (SSIG Re_)Jet Propulsion Laboratory
Paul Sagalyn (MStG Rep)Army Materials Lab, Watertown, Mass.
W.H. Kinard (M&DSIG. Rep)Langley Research Ce,nt_
64
LDEF IONIZING RADIATION SIGCHARTER
1,
-° ,
2,
3,
4,
5.
6.
7.
8°
9.
Provide Radiation Environment Predictions (Boddet)
Analyze Supporting Radiation Data and Induced Radio-Activity and Compare to Calculations.
Provide Detailed Calculations of Radiation Dose, Linear Energy Transfer Spectra and Secondary
Components (Including Neutrons) as a Function of Position Around LDEF and Shielding Depth.Provide Detailed Calculations o! Induced Activity. Update Calculation Methods and Environment
Models as Warranted by Data.
Compare Radiation Data, when Available, from Experiments with Cak:ukiticns.
Disseminate Results of 2-4 as Available.
Coordinate Data Exchange Among LDEF Investk3ators with Radiation Measurements.
Provide Calculations/Estimates for Specific Locations in LDEF, or for Specific Components with
Suspected Radiation Effects.
Advise Experiment Investigators and Other SIG's About Potential Radiation Effects and Methods
of Post-Flight Radiation Testing.
Provide Final Report on LDEF Radiation Environment and Effects.
65
IMPROVEMENTS IN RADIATION ENVIRONMENT
KNOWLEDGE/CALCULATION METHODS WITH LDEF
• Elfects of Directional Properties of Trapped Protons
- Measurements of Dose with TLD's and Adivation Around Fllght-Direction Stabilized Spacecraft.
- Calculations witn Dtrectional Proton Model as a Function of Position and Deplh in LDEF. HETC Calculation ofActivation Using Directional Proton Flux.
• Accurate Neutron Fluence and Spectrum
- Measurements of Gamma Ray lines Only Caused by Neutron Activation. Measurements of Neutrons with FissionFoils.
- Calculations of Secondary Neutrons Created in Structure by Trapped Protons ,3od Cosmic P,_'-fysUsing HETCCalculations. Calculation of Flux of Atmospheric Albedo Neutrons from Cosmic Ray Bombardment.
• Measurement of Unear Energy Transfer Spectrum Beyond the "Iron Peak" _nCosmic Rays
- Measurement (by Long Exposure and Large Area Detectors) the LET Spectra Caused by "Anomolous" CosmicRays and Ultra Heavy Cosmic Rays.
• Fluence, LET Spectra, and Dose of Low Energy Target Spatlation Nuclides or "Star" Particles.
- Some New Measurements- HETC Calculations
• More Accurate Levels of AP8 Prolon Ruxes at Solar Minimum
Measurements of Dose wilh TLD's and Activation at Various Spacecraft Locations and Depth. Enhanced by FlightDirection Stability of LDEF.
Requires Application of Directional Proton Model (as AP8 Post Procossor) atvd HETC Calculations. Also RequiresMaximum Use of TLD's and Activation Materials in LDEF.
66
P0004-1 X
P0004-2 X
P0006 X
M0001 X
M0002-1 X x
M0002-2 X
M0003-12 X
M0003-17 X
M0004 ,X X
M0006 X
A0015 X X
A0138-7 .... • X •
A0114-1
A0114-2
A0178 X
LDEF STRUCTURE & EXPERIMENTS
RADIATION DETECTORS ON LDEF
ACTIVATED
ABSORB(=D "HEA"VY ION PROTON &DOSE FLUENCE & NEUTRON
(RADS) LET SPECTRA FLUENCE
X
X
X :. X
X
X
X
FISSION
NEUTRONS& SPECTRA
X
X
X
X
OTHERDETECTORS
MICROSPHERE
Agce
RADIATION MEASUREMENT PRINCIPAL CATEGORIES
ENVIRONMENT
P0004 - 1
P0004 - 2
P0006
M0001
M0002- 1
M0002 - 2
M0003- 12& 17
A0015
A0138 - 7
A0114
A0178
ACTIVATIONSUB-EXPERIMENT
FULL-LDEFACTIVATION
M0004
DOSIMETRY/EFFECTS
P0004 - 1
P0004 - 2
P0006
M0001
M0002-1
M0003-12 & 17
A0015
A0138-7
A0114
ACTIVATIONSUB-EXPERIMENT
FULL-LDEFACTIVATION
M0004
ASTROPHYSICS
M0001
M0002-2
A0178
SPONSOR
NASA
NASA
NASA
DOD
DOD
FRG
DOD
FRG
FRANCE
NASA
IRELAND
NASA
DOD
DOD
67
THE LONG DURATION EXPOSURE FACILITY
IONIZING RADIATION PREDICTIONS (BOOKLET)
I. • INTRODUCTION -- VALUE OF LDEF MEASUREMENT -- LIST OF LDEF RADIATION
MEASUREMENTS
II. , DESCRIPTION OF TRAPPED PARTICLES AND COSMIC RAYS IN LDEF ORBIT (REFERENCES)
' : : ,: - : ,:
ili. • RADIATION ABSORBEDDOSE -- DEPTH DOSE AND GENERAL DESCR_PTiON OF4
DIRECTIONAL EFFECTS m' _ ""
• MEASUREMENTS ON SHUTTLE COMPARED TO PREDICTIONS o
IV. • LET SPECTRA AND _ENERAL DESCRIPTION OF "SINGLE HiT I'ASPECT OF PARTICLES --
OISCUSSION OF SOURCE OF PARTiCLE_ IN VARIOUS PARTS OF LET SPECTRUM
• MEASUREMENTS ON SHUTTLE AND COMPARISON WITH PREDICTIONS
V. • NEUTRONS AND DISCUSSION OF OTHER SECOH_ARIES
VI. • EQUIVALENT DOSE (APPROXIMATE)
VII. • ACTIVATION OF MATERIALS
VIII. • RADIATION ErFE(_TS (GENERAL)
• BULK PROPERTIES -- MECHANICAL, OPTICAL (COLOR CENTERS)
• HIGH LET ELECTRONIC PHENOMENA/SEU's AND CATASTROPHIC FAILURE
• BIOLOGICAL EFFECTS
• POSSIgILITY OF SYNERGISTIC EFFECTS WITH TEMPERATURE, UV, VACUUM
IX. • RAD[ATION MEASUREMENT AND ANALYSIS PLAN FOR LDEF
• MEASUREMENTS IN EXPERIMENTS
• OTHERS ON S/C
• CALCULATIONS TO BE PERFORMED
X. . REFERENCZS
69
cALCULATION OF LDEF IONIZING RADIATION ENVDRtONMENT
External Environment Calculations
• Geomagnetically trapped protons and electronsdifferentialfluxes
(Vette AP8MIN proton and AESMIN electronenvironment)
• Directionalproton flux
(AP8 post-processor (Watts-MSFC))
• Galactic cosmic radiation (GCR) differenti',d _itLX
(CREME GCR environment)
• Albedo neutrons flux from atmosphere (T. Armstrong)
• Magnetic field Model
First Order Internal Environment Cakulations
• Dose and dose equivalentversus shieldthicknessfor trapped particles
(Burrell"straight-ahead,continuous slowing down" proton dose program)
(MSFC electrondose program based on fitsto ETRAN)
• Dose and dose equivalentversus shieldthicknesssfor GCR
(CREME)
• Let spectra for trapped protons versus shield thickness
(CREME)
• Let spectra for GCR/anomolous component versus shield thickness
(CREME)
70
Models of LDEF -
Vector mass model for dose and fluence calculations at shielding depths
Radioactivity model from sample/mass model calculations
Activation Calculations using HETC
• Activation of experiment samples
• Activation of materials available in other experiments
• Activation of spacecraft structure samples
• Activation for a simple total spacecraft model
Secondaries Calculations using HETC
• Secondary proton spectra
• Secondary neutron spectra
Approach for LI)EF Calculations
r'" Simulation Ir_mO ................................................................................................. ]
i I E,_os=. "
: J_.._L_Fu..,..J., J l _ , | , .L"i I ;_"I"'''_-'--; I _ Prolon Direci_afi_ I i"-,"r ......... I |-- [ l i
I / I u_1 I ' _ _.---_'- __L,-_:.... .... X ...... '--:
, _.,._o---.__: .............. :__ ............ J.. ..... , ...._: i .zTC _I JmRse I I cm_we I l e_ I ,
! I_,_....,..%.,o,.,..io._l,,o,._,,.-._,..o I I_._,._.,-_.,_.--_!I_Z:. ¢- I i: I_"_"P--"andI___/J_ e_'2'°_'<" J I ,_,._.,_, i I_=T,..,=.I :! l iilUtll_lm d i/ __jiLiiml_lIEHey/ran_ri__ . J • . -.. -.. j j ............... . /r" I i:
; ..,d......_ .... :_ ........... -_-----_- ................... / .................. 7 " ' _ -_ _ _----.._ "'---'----------_.:x -_ .£"..........,.. o,_,_ _, Si,,i,k,,, ............. _ ........... _ ............. "_'_ ""--"--'=__:"__'"7" .... lI " ,- , . _,,_ .-"_ _ "- r--- - t II I lied I I GaImI'RIISPEIrIIII _ ...... rl .... e.....-ti i I _- LllSllliil [ / No_lrbl_Dose J i
I n.,Io.,,¢tld.P,=J,,_.,.I I I.,x.:.d..(_._ I I ............... I " i " _ i !
..... ......:._,......................................................._ / ..... 1_ ..... - ..... . • - C emlwiih I
. l¢ompari;on with Acthtmlon Ueasu ..... 1,: I I Co.,p._,._,_--,hr_,_,,r<_ I I _,,/,, I I _ I• Mill# Sam#el (l_.Co,V,Ti,ln) and ._01e<I_I l_l MIl_ PNTD ll,,_mo,r,r_,r_ riD Immilnll
l" FugSpacecreflMeasuromonls I
:::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::::Z:::::::::::::::::::::• Characterize Radiation Environmenls to Aid in
LDEF Data Interprelaiton• Imporlancl of Trapped Prolon Directionality
- Importance of Secondary Neutrons
• Impedance of Vadous Sources (eq. GCR vs, Trapp_,d)
- Impedance of Spatial Dependence of Production
• Development of "Scaling Relations" for otherConditions- Orbits, Spacecraft Masses, etc..
• PredlCftons & Implications for Olher Missions- Inlernal Sp_ce _,'_lon rladlatlon .Environments
• Radiation B_ckgmurx_ for Space Ob_rvatofias
• Evaluale Acc_lrwy of I_t:x_.ls & Predictive Methods• Exlernal Environermnl_. Dk'acflonl#1ty Model; Transpod
71
Dose LDEF Missiondue toTrapped Protonsand Electrons
Behind a Plane Aluminum Slab with Inf_te Backing
Thickness Elecr,ron Proton TotM
(g/cm 2) (rads) (rads) (trois)
0 2.53x105 1340. 2.54x10 s0.01 25000. 712. 25700.0.02 12100. 648. 12700.
0.03 735[). 610. 796{).0.04 5050. 582. 5660.0.05 3680. 560. 4240.0.06 2760. 54 I. 33{)0.
0.08 1710. 511. 2220.0.1 1150. 488. 1640.0.2 31{). 418. 728.
0.3 130. 381. 511.0.4 69.0. 355.. 424.0.5 40.9 335. 376.1.0 4.13 274. 278.
2.0 0.990 212. 212.5.0 5.83x 10-" 130. 130.10.0 2.96x10 -_- 75.3. 75.3.20.0 35.0. 35.0.
30.0 19.6 19.640.0 12.0 12.0
Dose LDEF Missiondue toTrapped Protonsand Electrons
Centerofa SphericalAluminum Shell
Thickness Electron Proton Total
(g/cm 2) (fads) (r,'uts) (rads)0 5.06xI0 "_ 2680. 5.08x105
0.01 49900. 1600. 51500.0.02 24200. 1480. 25700.0.03 14700. 1410. 16104).0.04 10200. 1360. 11500.0.05 7350. 1320. 8670.0.06 5530. 1290. 6810.
0.08 3420. 1230 4640.0.1 2300. 1180. 3480.0.2 620. 1020. 1640.0.3 260. 937. 1200.0.4 138. 885. 1020.
0.5 81.8 846. 928.1.0 8.26 724. 732.2.0 0.198 606. 606.5.0 0.117 431. 431.
10.0 5.92x10 -_- 292. 292.20.0 161. 161.
30.0 101. ' 101.40.0 67.8 67.8
72
LDEF MISSION DOSE FROM TRAPPED PARTICLES
uJ(n0a
z
_ou)
I0 j
lot t
10 _ .
Io z .
I01 •
10o ,
10 1 •
10oD
D. ECTRONP_OTONTOTAL
0.2 04 06 0.B 10 12 1.4
SPHERICAL SHIELD THICKNESS (GJCM"2)
t6 18 20
Trapped Proton Fluence for LDEF
Eaer_)" Fluence
(MeV) (protons/cm2-MeV)
0.05 2.98x10 s
0.25 2.18x108
0.50 1.60x10 s
1.0 7.84x10 r
1.5 3.94x10 T
2.0 3.52x107
2.5 3.15x1() T
3.0 3:13x10 r
3.75 3.01x10 r
4.5 2.86x107
6.0 2.94x107
10.0 2.29x10 T
15.0 1-64x107
30.0 1.35x107
50.0 1.24x107
100.0 1.09x10 T
200.0 5.40x10 G
300.0 2.07x106
400.0 7.72x10 s
600.0 1.01xl0 _
73
Trapped Electron Fluenee for LDEF
Energy Fluence
(MeV) (electrons/cm-%MeV)
0.05 1.95x10 l_
0.25 2.06xi012
0.50 2.24xi011
1.0 2.30x10 I°
1.5 6.16x109
2.0 2.49x109
2.5 1.73xi0 s
3.0 5.18x10 s
3.75 2.08x107
I{}°
TRAPPED PROTON FLUENCE FOFILDEF
I@e
ll) t_
|w
Iool
ENERGY (MIEV)
74
Z
IE+5
lO00
o.1
lO
1
E-310
In[egral LET Spectra for LDEF
I (J.H.Adaml el at.)q
O_lt: .
, - 4_1._ kin,.-. 370.4 Io.n clreulor
D 28.5" Ir_llnatlon
" _ _ , S_tm [.¢lud*s:
• Ol_lOlOgl component {Z -- 1)
• , . , _ _ _ ;_._ _
g*omagr,_tl¢ cutoff _,¢l-uded
• no too?helle diltud_anc*
• •orth|' ihodo,a Ir¢l,Jdld
• no ih;ald_nf
1O0 1000 10000
MeV cm'/g
,,_
1E+5
100 /].. -:_
t
10-2
_'UP_WN
10"3
3oo 3_o _6o 4_,ALTTTUDE ( _(m;,
Average proton dose r_tes for 28,5" orbit for • dete<tor behind • 5 _/cm::
aluminum s_etd With iafmile bsc.kiag _th the pltee fadnl[ in the Ipee_e<l
_rec¢_o_s relative _ Ihe geog'rlp_ic coord_utt_.
75
DATA ANALYSIS PLAN
for
LDEF EXPERIMENT P0006
Linear Energy Transfer Spectrum Measurements Experiment
October 1989
E.V. Benton
76
POOO6:
LINEAR ENERGY TRANSFER SPECTRUM MEASUREMENT
EXPERIMENT (LETSME)
OBJECTIVES
THE MAJOR SCIENTIFIC OBJECTIVES OF THE PO006 EXPERIMENT ARE AS FOLLOWS:
I. MEASURE LET SPECTRA DUE TO HZE PARTICLES AT DIFFERENT SHIELDING DEPTHS
2. OBTAIN HIGH LET (7100 keV/um) PORTIONS OF LET SPECTRA WITH SUPERIOR
STATISTICAL ACCURACY
3. MEASURE TOTAL MISSION RADIATION DOSEt NEUTRON FLUENCES ANO ACTIVATION
OF METAL SAMPLES
4. PERFORM vECTOR SHIELDING CALCULATIONS TO DETERMINE COMPLEX SHIELDING
DISTRIBUTIONS OF LDEF EXPERIMENTS
5. CALCULATE LET SPECTRA, TOTAL RADIATION DOSES AND NEUTRON FLUENCES
FOR COMPARISON WITH EXPERIMENTAL LDEF RESULTS
6. DEVELOP CALCULATIONAL METHODS TO EXTRAPOLATE THE DATA TO OTHER ORBITS
7. PERFORM CALCULATIONS OF RADIATION FIELD FOR THE SPACE STATION ORBIT
t FROM LET SPECTRA, DETERMINE FLUENCE OF HIGH ENERGY DEPOSITION EVENTS
(IN SILICON) THAT CAUSE SINGLE EVENT UPSETS (SEU) IN MICROCIRCUITS IN
LDEF ORBIT
_o MEASURE FLUENCE OF RECOIL NUCLEI IN SILICON CAUSED BY PROTONS IN THE
SOUTH ATLANTIC ANOMALY (NEW METHOD)
IO. DETECT RADIATION EFFECTS ON BULK OR MECHANICAL PROPERTIES OF MATERIALS
(Li_, POLYCARBONATE, POLYESTERS)
78
OTHER LDEF EXPERIMENTS HAVING UNIVERSITY OF SAN FRANCISCO
RAOIATION DETECTORS
POOO6: LINEAR ENERGY TRAeISFERSPECTRUM MEASUREMENT EXPERIMENT .
(UNIVERSITY OF SAN FRANCISCO)
A. PNTOt.
1. CR-3g {PURE)
2. CR-39 (WITH OOP _LASTICIZER)
3. TUFFAK POLYCARBONATE
4. SHEFFIELD POLYCARBONATE
S. MELIN£X POLYESTER
B. MUSCOVITE MICA
C. TL0__.._
0, FISSION FOIL OETECTOR5
I, _]BU/MICA
2. 232TH/MICA
3, 20981/MICA
4. IBITA/MICA
S. 6LIF/CR-3g, with and without Gd
E. ACTIVATION FOILS
I. N|
2. Ta
3. In
4, V
F. SILICON WAFERS _ITH CR-]g
II. PO004-1: SEEDS IN SPACE EXPERIMENT
(G. PARK SEED CO.)
A, P_ffOs
I. CR-39
Z, TUFFAK POLYCARBOtIATE
3. TLOs
- 4
Co 6LIF/CR-39_ .ILh #rid_ithout Gd
_,_ _ ..... .: . . -
., : ,. , - •
.,. . • .;
,-K
i
ORIGINAL PAGE IS
OF POOR QUALITY
79
Ill. _004-2: SPACE EXPOSEO ZX_QI_ENT OEVELOPEO FOR S'rUO_T_
(NASA HEADQUARTERS)
PNTOs
I. CR-3g
2. TUFFAK P0L'tCA_,?'_A:E
3. TLOs
- _LJF/CR-3g, .Ith and _ithout Gd
IV. AOOIS: FREE-FLYER BIOSTACK EXPERIMENT
(0FVLR)
PNT01;
I. CR-3g
2. SHEFF[ELD POLYCARBONATE
3. TUFFAK POLYCARBONATE
8, MUSCOVITE MICA
C. TLDs
D. FISSION FOIL DETECTORS
I. 23BU/M|CA
2. 232TH/MICA
3. 20g3I/MICA
4. I_I?A/MICA
S. 5L_;CR-39, _fth and _(thou_ Gd
,HO004: SPACE ENVIRONMENT EFFECTS ,jN_IBER OPTICS sYSTEMS
(AFWL)
PNTD_
I. CR-]9
2. TUFFAK POLYCARBONATE
3. _HEFFIEL0 POLYCARBONATE
&, MELI_EX POLYESTER
3. TLOs
80
ORIGINAL PAGE IS
OF POOR QUALITY
LDEF RECOVERY
INITIAL INSPECTION--KSC
TRAY F2 REMOVAL
PO006 BENCH ACTIVITIES
PACKAGED HARDI_ARE RELEASF
LABORATORY HARDWARE
DELIVERY
HARDWARE DISASSEMBLY*
ACTIVATION FOILS DEL RE[TO READOUT LOCATION
READOUT OF ACTIVATIONFOILS
DATA ANALYSIS OF ACTI-VATION FOILS
READOUT OF TLDs
DATA ANALYSIS FOR TLDs
PROCESSING FISSION FOILDETECTORS
READOUT OF FISSION FOILDETECTORS
DATA ANALYSIS FOR FISSION
FOIL DETECTORS
PROCESSING OF PNTOs
READOUT OF PNTDs
DATA ANALYSIS OF PNTDs
PROCESSING OF MICA
DETECTORS
READOUT OF MICA DETECTORS
DATA ANALYSIS OF MICA_ETECTORS
LDEF CALCULATIONS
DATA ANALYSIS FOR PO006
TOTAL EXPERIMENT
FIRST POST-RETRIEVALI.w.G.
SECOND POST-RETRIEVAL;._.G. AND DATA CONF.
REPORTS
*disassemble experiment
early because of aCtl-vation materials
SCHEDULE -- POO06 ANALYSIS PLAN
CY 90
J F M A M J J A S 0 N D
' _ I w I ! , I i I I I
a _ CRITICAL FOR DATA READOUT
A
A A
CY gl
2 3I i !
CY g2
I 2 3r !
4!
ta.
81
LDEF IRSIG GJF 10/24/89
LDEF
INDUCED RADIOACTIVITY ANALYSIS PLAN
O FULL SPACECRAFT HF-,ASUREMEI_PIrS
0 INDIVIDUAL SAMPLE MEASUREMENTS
CALCULATIONS OF SAMPLE AND SPACECRAFT MATERIAL
RADIOACTIVITY AND COMPARISONS WITH
MEASUREMENTS
MASS MODEL AND RADIOACTIVITY MODEL OF
SPACECRAFT
o CALCULATION OF GA_IA FLUX AND SPECTRA AT
DETECTOR POINTS OF FULL SPACECRAFT
MEASUREMENTS
o EXTRAPOLATION OF CALCULATIONS TO OTHER ORBITS
10 _
10 s
I
10=I
r--
IL I _, I 3. k. .sl
coS7_J_ I m _v T,1_ , at214122 keY _, I - 1121 kay
"_,;) J j 8471k,V V4e fI"i { 1222 key
IqlAT£R TANK SAHPLES " '_ q' velql_N_
400,000 sac '11
,I | _ I , . l 1 [ , L , I _ I200 400 600 800 1000 1200 1400
E (keY)¥
_HHA-RAY sPECTRU_ - PACKET NO. 2. The activation _ _m:_'_J_s'rt" "'" "l_ .........
are fdentlf_ed; all o_her peaks are due to background ganmi.rl-y =* =- ......
11nes,: A strong backg_'ound continuum ts also appat'ent. _- _ "
82
ESTIMATIONS FOR LDEF FROM SKYLAB DEBRISMEASUREMENTS
TABLE 1. MEASURED INDUCED RADIOACTIVITY (SKYLAB DEBRIS)
MATERIAL grinMASS
A ! (6) - _5oSS (7) 367
SS (11) 175
SS ? (15) 117
SS (16, 281
ISOTOPE ENERGY HALF-LIFE NET COUNTS/(kaV| 1N_
Na 22 1278 _.8 yf 0.50:1:.15Co 58 811 71d 0.49:1:.13Mn 54 835 303(I 4.32 + .24Co 56 847 77d 0.90 + .16Co 58 811 71d 0.41 + .15Mn 54 835 303d 2.83 ± .28Co 56 847 77(:1 0.91 ± .18Mn 54 835 303(:1 4.14 ± .30Co 56 847 77d 0.50 ± .26
Mn 54 835 303:1 2.41 ± .35
RI_-ENTRYpLUS
3.6wks3- 6wks
3- 6wks3 -6wks3 -6wks3- 6wks3- 6wks3 - 6wks5 months5 months
SS = STAINLESS STEEL ( ) SAMPLE NUMBER
TABLE 2. TYPICAL SPECIFIC ACTIVmES OF SKYLAB DEBRISSAMPLES
SAMPLE MATERIAL ISOTOPE SPECIFIC ACTIVITY" (AT RE-ENTRY)
ALUMINUM Na22
STAINLESS STEEL Cor_
STAINLESS STEEL Mns4
STAINLESS STEEL Co r_
I. 1 DISINTEGRATIONS/sec/kg
0.8 DISINTE GRATION,S/IIc/kg
3.0 DISINllEGRAT1ONSamrJ_
1.5 DISINTEGRA_
*ESTIMATED ACCURACY: +30 PERCENT
LDEF
Long Duration Exposure Facility
INDUCED RADIOACTIVITY EXPERIMENT
Target Types :
I. Intentional Samples
- Metal Targets, 2" x 2" : Ni, Co, Ta, V, In
- Contained in : A0114 Atomic Oxygen (Cregory/Peters)
PO006 LET Spectra (Benton)
M0001 Heavy Ions (Adams)
" H000'2 Trapped Proton Spectra (AFCRL)
II. Spacecraft Structure/Components
- Stainless Steel Trunions
• - Aluminum Structural Components
III.Components of Other Experiments Desired :
- Samples of Metals or Alloys of High Atomic No. (>30)
with weights over 1/2 oz.
83
Lon_ Duration E_Jure FBcility [LDEF]
RADIATION SIG
IN[YJCED RADIOACTIVITY STUDIES
OBJECTIVES
I. Measurements o5 Induced Radioactivity in Spacecraft andZxperlaent Materials in Low Earth Orbit
A. Spacecraft Materials : Alusinum Alloys, 5rainlessSteels
B. Experiment Materials : Copper, _rmani_;m _rtl_tllr_TAlloys
C. Activation vs. depth in a large spacecraft
O. Activation vs. orientation in a gravz_y-qr_dien_
stabilized spacecraft
If. CharacterizatLon of the Nuclear-Active Particle
Envlro_ent in Low Earth OrbLt
A. Proton FLux and Spectra Above 20 HeY
5. Neutroh FIux and Coarse Spectral Heasuremen_s
C. Separation of Trapped Proton and Cosmic Ray ?roton
Fluxes
O. Proton An isotropy Measurements
III. Experiaental ';er_ticatlon of Spacecraft Ace=vat:on
Computer Codes Developed :or Future Prograas
A. 5pace Station
5. lunar _ase
=. Harmed Mars Hlss:_n
84
!argets/Reactlons/Gamma
MAJOR
TARGET PRODUCT ION
MATERIAL MODE
Aluminum27
A£ (p,-)
Ray Energy/Half Lives
GAMMA
RADIOACTIVE ENERGY
NUCLIDE MeV
Na 22 1.28
Be 7 .478
HALF
LIFE
2.6 y
53 d
Stainless
Steel
Nickel
Ni58(n,p) Co 58 .810 71 d
Ni58(p,2p) Co 57 .122 270 d
Ni58(p,2pn) Co56 .847 77 d
Fe56(p,2pn) Mn54 .835 313 d
Ni58(n,p) Co 58 .810 71 d
Ni58(p,2p) Co 57 .122 270 d
Ni58(p,2pn) Co 56 .847 77 d
Cobalt Co59(n,y)
Tantulum Tal81(n,_)
Co 60 1.173,
Ta 182 1.211
W 181 .153,
Hf 181 .482
etc.
etc.
5.26 y
115 d
I13 d
43 d
Titanium Ti46(n,p) Sc 46 .899
Ti48(p V 48,n) .983
Indium
Copper
Germanium
Gold
cdll5
inll4
cdll3
snll3
Ag II0
.940,
.72,
etc.
etc.
84
16
43
50
14
I18
260
d
d
i
d
d
F
d
d
85
O2
O10
L ....
I0
LDEFInduced RadloaclivltyShort-Lived Isolope_i
\\
\\
i
?o
Days After Recovery
oRIG|NAL PAGE IS
OF poOR QUALITY
86
LDEF IRSIG GJF I0124/89
LDEF INDUCED RADIOACTIVITY
REQUEST FOR LOAN OF OTHER EXPERIMENT MATERIALS
FOR GAMMA RAY COUNTING
EXP. NO. MATERIAL DESCRIPTION SIZE/WT
MOO03
MOO03
MOO03
Gallium Arsenlde
Molybdenum
Copper
Optical Mirrors (2)
Dia. Turned
2 X 2 X .09
114g
100g
MO005
M0005
CdSe
GaAs
Semiconductors (2)
Semiconductors (7)
A0056
A0056
A0056
A0056
BaF 2
Cd Telluride
Thallium
Bromolodlde
Germanium
Substrate
Substrate
Substrate
Substrate
25mm
25mm dta. x 1.2mm
1" Dta.
25m
A0139A Copper OFHC Instrumentation <100g
A0189 Copper OF.C Instrumentation <100g
S0014
S0014
S0014
Gallium Arsenlde
Copper OFHC
GaAIAs/Ga/As
APEX Sample
Instrumentation
APEX Samples (2)
1.6cm x 1.3cm
<lO0g
PO003 Copper Plate, Radiometer 115g
A0114 Copper Disc. 1" Dia.
87
EXP. NO. MATERIAL DESCRIPTION SIZE/WT
A0114
A0114
A0114
A0114
A0114
Germanium
Silver
Silver
Titanium Alloy
Titanium
Disc.
Single Crystal Disc.
Solid Disc.
6A-4B Alloy Disc.
75 A Disc.
I" Dia.
I" Dia.
I" Dia.
I" Dia.
i" Dia.
A0187 Gold Detector
A0178 Iridum Foil 0.5mm thick
$1002 Titanium Alloy Alloy 6V4
AMS 4911B
AMS 4928D
VFN 13307/20
LN 9247
SI002 Copper Electrolytic ?
SI001 Silver Diode Heat Pipe ?
* NOTE I: All samples on #M0003 have matching unexposed samples
attached to the bottom of the tray. Also, since #M0003 is on four
different trays, there may be more than one set of materials.
NOTE 2: These samples are desired for counting with low background
gamma ray detectors as soon as feasible following de-integration of
the experiments, since many nuclides of interest have short half
lives. The samples can be shipped and analyzed in thin, low
background radioactivity, hermetic enclosures (if required). A few
materials will have some long lived radlo-nuclldes allowing useful
analysis for several months or more following deintegration. The
desired loan period for gamma ray counting is two weeks minimum. The
availability of a ground control samples of the material would
considerably enhance the analysis.
88
L
LDEF
Long Duration Exposure Facility
List of LDEF spacecraft structural and systems materials suitable
for induced radioactivity studies.
This table contains only major parts; numerous other minor com-
ponents such as fasteners, and small structural parts would also
be of value for the induced radioactivity studies
pescript_on Material Wt.(ibs.) Ref. No.
Trunnion pins:
Main (middle)
End (2)
Keel (i)
(2) SS 17-4 PH 85.4 815934-ESS 17-4 PH 52.3 815835-B
SS 17-4 PH 61.6 815950-C
Ballast plates (ap. 18 total) Lead
Ballast cover plates (18) Alum., 6061
Keel plate Alum., 6061
7.5-30 819225
1.9, 2.8 819226
7.75 815947
Long Duration Exposure Facility (LDEF)
Nuclear Activation Measurements
Low Level Spectroscopy Facilities
LABORATORY�ADDRESS�PHONE
Battelle Memorial Institute
Pacific Northwest Laboratory
P.O. Box 999
Richland, WA 99352
509-376-3529, FTS 444-3529
Lawrence Berkeley Laboratory
Mail Stop 72-131
I Cyclotron Road
Berkeley, CA 94720
415-486-5679
Los Alamos National Laborator_
Mail Stop D-436
Los Alamos, NM 87545
(FTS 843-5066)
Lawrence Livermore National Laboratory
Nuclear Chemistry Division, L-232
P.O. Box 808
Live rmore, CA 94550
415-422-6680
Oak Ridge National Laboratory
Mail Stop 6204
Oak Ridge, TN 37831"6204
(FTS 624-4924) t _ _..
PRINCIPAL CONTACT
Dr. R.L. Brodzinski
Dr. Alan R. Smith
Dr. Calvin E. Moss
Dr. David C. Camp
Mr. Jim S. Eldridge
89
RADIATIONFROHTIlELD_
Results from 16 hours of counting with one detector on theSPACE end of LDEF compared to a background taken In theSAEF-11 high bay with no LDEF present. The line at 1274 keVcomes from nuclear reactions between the aluminum on LDEF
and the high-energy proton flux encountered in orbit.
ORIGINAL PAGE ISOF pOOR QUALITY
v
9O
LEGEND:
__ LEAST-SENSITIVE FORM OF MATERIALMOST SENSITIVE FORM OF MATERIAL (OR OEVICE) BEGINS TO SHOW-
ION DEVICE| BEGINS TO SIIOW SIGNIFICANT SIGNIFICANT DEGRADATION
O(GIIAF)ATION re.%,. 15% FOR TRANSISTOR G,_N) |e.g,. 15% FOR TRANSISTOR GAIJ_)
1 I I ! t ! r !
102
NMOS MICROPROCESSORS
PHOTOTRAN$1$TORS
"_.__ MO_ DEVK;ES I.T.O Z IN_U'LATOIII
TRANSISTORS
JL_-__| OPTICAL GLASSES |Cwown and Fkm_
TEFLOHIJN AIR)
" -'_-:"_:._ SEMICONDUCTOR DIODES
MOS TRANSISTORS (WITH" IMPROVED INOCULATORS}
CAPACITORS
_' TEFLON IN VAC_
Ot._A RTZ OPTICS
_-i_-._.-_ PLASTPC I/tSULATORS
__._ RESISTOR & VACUUM TUBES
t l l I I, z .... _ L .....
103 104 105 104 Te 7 10 | 106 10 TM
DOSE IRADSI
Sensitivity of Various Components to the Ionization Effects of Radiation
LDEF IRSIG TAP 2/13/90
LDEF - RADIRTIOH EFFECTS
DETAILED KHOWLEDOE OF RADIATION EH_IROMMENT IH LDEF
WILL HE SUPPLIEb BY IRSIG : ,_
0 THE IRSI@ WILL Afl_A_OE CONSULTANT8 TO ADVISE
CONCERNING POTENTIAL RADIATION EPFECTR IN RY_Tk"_S
AND MATERIALS
o SPECIAL CALCULATION_ HILL RE MADE FOR C0_PON_TS
WITH SUSPECTED EFFECT_
IF POST FLIGHT RADI&TIOH TESTINO 1S DESIRtO Ttt_
IRSIO WILL ADVISE OH PARTICLE REAM| TO UBt AWO
ARRANGE RADIATION EFFECTR CONgULTRTIOR TO DRBIOM
THE TESTS
1T IS RECOHHEHDED THAT ANY REOUIRED EADIATIOH
EFFECTS GROUND TESTS FOR S_tS, OPTICAL PROPERTIES
EFFECTS, DISPL&CEHENT DAMAGE IN CRY|TALLIHE
MATERIAL9 ETC. BE PERFORMED BY THE RELE_XNT
EXPERIHEHTER 08 SIC
ORIGINAL PAGE ISOF POOR QUALITY
91
1000
80O
600
4O0
200
/Trapped
_, _ Electrons LDEF SEEDSPreliminary EstimateAbsorbed Radiation Dose
_._. Trapped Protons and El ,ec.tr,ons
Omnidirectional AP8 ano ,_co
Spherical Shield
TrappedProtons
iSEEDS IBag 1 I i
I Bag 2 I i
I I Bag 3 II I [ Bag 4
I I I L I I 1 I I l
1 2 3 4 5 6 7 8
Depth Grams/Centimeter
92
i.
2.
LDEF Set. No.
LDEF'IONIZING RADIATION INFORMATION REQUEST
Originator:
Organization/Address:
Phone:
. LDEF Experiment�System�Component�Material:
4. Tray NumberLLocation:
5. Anticipated/Observed Effect:
. Suspected Radiation Component (Total Dose, High LET
Particles, Neutrons, etc.)
7. Other Justification for Radiation Analysis:
. Desired action by Ionizing Radiation SIG (Radiation
calculations at suspect site, recommendation for post-
_l_g,._ testing, radia_icn effects -_;__, etc. _
g o Please supply detailed drawing showing component in tray
and materials identification So that shielding model may
be developed.
I0. Requestor signature:
SIG Signature:
Add continuation sheets as necessary, send copies to the
following:
(i) LDEF Project Office, _ode 356, NASA, LaRC,
Hampton, VA 23665-5225
(2) T.A. Parnell, ES62, NASA, Marshall Space
Flight Center, AL 35812
NOTE: The LDEF IRSIG does not plan to perform experimental
radiation effect studies on materials/components. It does
plan to supply accurate information on radiation dose, flux,
seconda_z zemponents at suspect sites. It will also supply
references to relevant literature on radiation effects, and
advice z_±c_rning _os_ f!i_h_ cadiatlcn zeszing.
ORiGiNAL _AGE |S
OF POOR QUALITY
93
LDEF IRSIG TAP 2/13/g0
LD_r _SS_qS_TATUS
o _RSIO PL_HS COMPLETE
o PRELIMINARY _OSE, FLU_NCE AND LE_ NEASUREMENTR
COMPLETE AND CIRCULATED
o P_EDICTIONS _OOKLET IN PRES_ - DISTRIBUTION 3/15/g0
o RADIATION CALCUL_TION8 PLAN COMPLETE
o POO06 ANALYSIS PLANS COHPLETE
o INDUCED ACTIVITY ANALYSIS PLANS COMPLETE
O NERSURENENTS OF FULL SPACECRAFT iNOUCED ACTIVITY IN
PROGRESS
o INDUCED _CTIVITY CALCULATIONS PLANS COMPLETE
o RADIATION EFFECTS CONSULTING PLAN IM PROGRESS
AWAITING FUNDING
94
LONGNASA
DURATION EXPOSURE FACILITY
OVERVIEW OFPRINCIPAL INVESTIGATOR
PLANS
JAMES L. JONES, JR.
NASA - LANGLEY RESEARCH CENTERLDEF SCIENCE MANAGER
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
i|
I|I
95
PI EXPERIMENT ACTIVITIES
RETRIEVAL PLANS (COMPLETED)
• TRAY/EXPERIMENT PROCESSING
REMOVETO I-_"t REMOVE ITRAYFLOOR COVERS
1
t .,r--'qPHOTOGRAPH
FRONT&BACK
_[ BATrERYREMOVAL
DE-INTEGRATE
(IF NECESSARY)
t COWRSIITRAY
_ SELECTED _EXPERL
C/O OPERS.
__ II I
I DE.INTEGRATE I EXPERI. POWER(IF NECESSARY)I&DATASYS. Affr- I
OFF.LINE STS
PACK HFOR
SHIPPINGDELIVERFOR tSHIPPING
ORIGINAL PAGE IS
OF POOR QUALITY
EXPERIMENTS A0134 AND S0010-BEFORE INTEGRATION ON LDEF STRUCTURE.
ORIGINAC PAGE'
BLACK AND WHITE PHOTOGFM_PH'• 97 ¸
,L.LI1Vnb _OOd 40
SI 30Vd 1VNi_I_IO
EXPERIMENT S1001-BEFORE INTEGRATION ON LDEF STRUCTURE.
V
EXPERIMENT A0054-BEFORE INTEGRATION ON LDEF STRUCTURE.
98ORIGINAL PAGE IS
OF POOR QUALITY
DRfG]NAE PA(_E
BLACK A,r,;D Wi-41TE PHOTOG_APIt
INTEGRATEDTRAYC-3-BEFORE INTEGRATIONON LDEFSTRUCTURE.
EXPERIMENTA0178--BEFOREINTEGRATIONON LDEFSTRUCTURE.
ORIGINAL PAGE ISOF POOR QUALITY
j-
t)R_rGfNAC PAGE'
BLACK ArqD WHITE PHOTOGRAPH 99
INTEGRATEDTRAYD-12-BEFORE INTEGRATIONON LDEFSTRUCTURE.
|
t
EXPERIMENTS M0002 AND M0003--BEFORE INTEGRATION ON LDEF STRUCTURE.
100
ORIG!NA£ PAGE
BLACK AND WHITE- PHOTOGRAPH
i
TRAY GIO--BEFORE INTEGRATION ON LDEF STRUCTURE.
=
EXPERIMENT SO014-BEFORE INTEGRATION ON LDEF STRUCTURE.
bRIetNAE PACE
BLACK AND WHITE PHOTOGRAPH
101
i=----7
i
INTEG INTEGRATION "ON _LD_RUCTU RE.
'. L.>¢" - • ..............
tot
lO2
-!
ORIGINAL PAGE
BLACK AND WHITE PHOTOGEAPH
/cc
_ _H_
EXPERIMENT A0138--BEFORE INTEGRATION ON LDEF STRUCTURE.
ORtGINA[ PAGE
BLACK AND WHITE PHOTOGRAPH
103
NASALONG DURATION EXPOSURE FACILITY
SDIO OVERVIEW
U.S.AIR
WAYNE E. WARD
FORCE SYSTEMS COMMANDMEMBER, MSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOPr
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
PRECEDING PAGE BLANK NOT FILMED105
SDIO ASSESSMENT OF THE NASA LONGDURATION EXPOSURE FACILITY
(LDEF)
IDENTIFICATION OF DATA/SAMPLES DESIRED
NASA/LDEF WORKSHOP
KSC
13- 14 FEBRUARY 1990
WAYNE E. WARD
WRDC/MLBT
WRIGHT-PATTERSON AFB,
OHIO 45433-6533
; ," I
SPACE ENVIRONMENTAL EFFECTS
,BROGRAM OBJECTIVE S .
PROVIDE SELECTED, CRITICAL SPACE ENVIRONMENTAL EFFECTSDATA ON MATERIALS IN THE FORM TO ASSIST MORE CONFIDENT
DESIGN OF LONG LIFE SDS SPACECRAFT
TWO pHASE EFFORT
• UTILIZE EXISTING NATIONAL RESOURCES AND CURRENT OR CURRENTLYDEVELOPMENTAL MATERIALS TO ACQUIRE ESSENTIAL DATA FOR PHASEONE SYSTEM DESIGNS (e.g. BSTS, SSTS)
• ENHANCE AND INTEGRATE NATIONAL TESTING CAPABILITIES FOR LONGLIFE IN ALL ENVIRONMENTAL CONDITIONS
• EXPAND TESTING TO INCLUDE MATERIALS NOW IN EARLY DEVELOPMENT
• COMPLY WITH LONG LEAD TIME REQUIREMENTS BY IMMEDIATELY INITIATINGSPACE FLIGHT PLANNING TO ACQUIRE ESSENTIAL DATA
106
SPACE ENVIRONMENTAL EFFECTS
SUMMARY
I WRDC / ML: SERVE AS EXECUTING AGENT I
* TO PLAN AND EXECUTE THE SPACE ENVIRONMENTALEFFECTS PROGRAM
* TO MANAGE A COORDINATED NATIONAL EFFORT
* TO PROVIDE SELECTED SPACE ENVIRONMENTAL EFFECTS
INFORMATION FOR MATERIALS SELECTION, PERFORMANCE
AND END OF LIFE PREDICTIONS FOR NEAR TERM AND FUTURE
SDS SPACECRAFT
* TO FILL CRITICAL VOIDS IN THE TRANSITION OF NEW MATERIALSAND STRUCTURES TECHNOLOGY TO SDS SPACECRAFT
SPACE ENVIRONMENTAL EFFECTSNEEDS
• SPACE ENVIRONMENTAL EFFECTS ON MATERIALS PROPERTIES / PERFORMANCEMUST BE QUANTIFIED
• GROUND SIMULATION
• COMBINED EFFECTS
• ORBITAL DEPENDENCE
• ORBITAL EXPERIMENTS / DATA
., LDEF, DELTA STAR, OTHERS
• MATHEMATICAL MODELING .1""
• COMBINED EFFECTS .I"':
• ENHANCED DATA_A_SE• STANDARDIZED TES1_ METHODS AND PROCEDURES
ACCELE RAT.ED_:'ESTING
• SPACE ENVIRONMENTAL EFFECTS ON HARDNESS MUST BE QUANTIFIED
• COMBINED ENVIRONMENTAL / HARDNESS TESTING
• RESULTS MUST BE CORRELATED FOR EASY ACCESS BY SYSTEMS DESIGNERS
• GUIDE MATERIALS DEVELOPMENT
II
107
SPACE ENVIRONMENTAL EFFECTS
TECHNOLOGY INSERTION WORKING GROUP(TIWG)1
MEMBERSHIP
AIR FORCE
SDIO
• , E
NAVY
NASA
=
W.J. SCHAFER
AEROSPACE CORP.
JET PROPULSION LAB -
=
DR. WAYNE WARD
DR. ED MURAD
LT. DALE ATKINSON
LT, BRIAN LILLIE
LTC RICHARD YESENSKY
DR, AINSLIE YOUNG
LTC CHIP HILL
MR. AL BERTRAM
DR. DARREL TENNEY
DR. LUBERT LEGER
MR. ROBERT TURNER
DR. GRAHAM ARNOLD
DR. MIKE MESHISHNEK
DR. RANTY LIANG
DR. JOHN SCOTT-MONCK
WRDC/ML, CHAIRMAN
AFGL/PHK
AFWL/NTCAS
AFSTC/XLA
SDIO/TNK
SDIO/'TNK
SDIO/'rNK
NSWC/WL
LANGLEY RESEARCH CENTER
JOHNSON SPACE CENTER
CPL
MSL
SPACE MATERIALS S&T
SPACE MATERIALS S&T
P
' " LDEF: OBJECTIVES OF SDIO EFFORT
wRD£/MLI_T WPAFB_OX 45433-6533
IDENTIFY SDIO DATA ANALYSIS REQUIREMENTS ANDSAMPLE NEEDS
• SET SDIO PRIORITIES
• DEVELOP INPUT FOR NASA - LDEF SIG CHAIRMEN
• SORT REQUIREMENTS BY BENEFITING PROGRAMOFFICES
108
I'
PRIORITIES
WRDC/MLBT WPAFB,OH 45433-6533
CRITICAL TO SDIO SYSTEMS AND TECHNOLOGYPROGRAMS.
II ESSENTIAL TO SDIO DATA GENERATION ANDGROUND-TO-SPACE CORRELATIONS.
III SUPPORTS GENERIC RESEARCH NEEDS.
I I I IT ' I
SDIO PARTICIPATION IN NASA-LDEF
ORGANIZATION CHART
i
(LTC YESENSKY/DR. YOUNG}
I MATER/ALS iBIGSYSTEMS
81G
m. s'rmN) l (j. M,_tom I
SDIO REP 8DIO REP
(c. nZRSCm/mA I (n. "nCZR/SD,O) I
• I _-_Q I(J. AUBRUS}
• LARC PROJECT
(W. KINARD IB. LEIGHTNER/J. JONES)
I-I I81G SIG
I I ,o,o_P I I ,D,O=,'
(L. McCrelght/AEROSPACE)- SBI- BP
SSTSNPB
SDI TECHNOLOGY REQUIREMENTS J
- Materials [ W. Ward/WRDC]- Power ( T. Wheeler/WJSA]- Survivability(Lt D. Atklnson/WL)- Optics ( K. Scott/AEROSPACE)- Electronics (W. Dudney/USASDC)-" Thermal Management ( W. Ward/WRDC)
109
SDIO PARTICIPATION IN NASA-LDEFRESPONSIBILITIES
SDIO SIG REPRESENTATIVES
• COORDINATES _-LDEF REQUIREMENTS/I_2_ARATION• PROVIDE8 COORDINATED SDIO REQUIREMENTS TO NASA SIG's• PROVID_ _ ESTIMATES• PRIORrnzE REQUIREMENTS
SDIO SDI SYSTEMS AND TECHNOIA)GY REPRESENTATIVES
• REVIKWS /LDEF SPACECRAFT DATA OPPORTUN_II_S• PROVIDES SD|O SIG _ATIVES WITH R][r,Q_
FOR ASSIGNED AREA
- DATA NEEDS PER NASA FORMAT- SAMPLE NEEDS- ESTIMATE C061_
SDIO- LDEF COORDINATOR
• P0C FOR NASA LDEF PROJECT• SHEPHERDS ACTION TIMELIHK. SUPPORTS COORDINATION OF SDI0 ACTIVITIES, RESOLUTION OF
ISSUES
STATUS OF SDIO PLANNING EFFORT
• SDIO REQUIREMENTS DEFINED
MATERIAI_ OR SYSTEMS ANALYSES AND PRIORITIESARE IDENTIFIED BY LDEF EXPERIMENT
• " SAMPLE NEEDS AND TEST SEQUENCES AREIDENTIFIED BY LDEF-EXP
• FURTHER COORDINATION NEEDS ARE IDENTIFIED BYLDEF EXPERIMENT
., ............. __,._,q._ _,_._.,_:._,_r IG_ i [ _'_1_[]_.i _.M3:T_:_ I_/
•"" NEED _O IDENTIYY IMPLEMENTATION A/_PROACHES
:_f_ __ I_A¥_ _ALYS_S "_ _
110
EXPERIMENT # MOO06 (PI: TSGT MICHAEL STESKAL (407) 494-2531)
LEVEL III SUMMARY OF TYPE OF MATERIALS OR SYSTEMS REQUESTED AND TESTS REQUIRE_" ........SIG: COMBINED
SDIO TRAYCODE #
SYS 04 M0006
SYS 05 M0006
SYS 06 M0006
SYS O7 M0006
SYS 07 M0006
DEB01 M0006
MAT 02 M0006
MAT 06 M0006
MAT 07 M0006
TYPE OF MAWSYS
NAM_COMPANY PRIORITY
Vacuum canisler I
Detectors & shielding matl. II
Mechanisms I
Clocks, opt. fillers, substrs
Thermal paints, thermocpls
Mirrors-fused Si & Be I
Mirrors-Be I
Electro Oplics
Electronics (9)
PRIORITIZED 1 THRU nTEST/SAMPLEREQUIREMENT
Stiction, lube condit, migration
Performance (13) .
Contamination degradation (16)
iN Ieutra particle beam sun/.
AGT and laser survivability
Evaluate Impacts (1)
Optical Properties / Samples
Optical and TIC Tests (1)
Materials degradation data
ADD!_ONAL_JNFORMAT_N NEEDED
D_lubnca_ _._iF_a_ns
Preflightdata_contmlsampl_
Preflight, post-flighttest data
Preflight, post-flight test data
Orig. Specs.' Chars. (1)
Collaboration with M0003
Control Sample Into (1)
LEVEL III NOTES FOR SUMMARY OF TYPE OF MATERIALS OR SYSTEMS REQUESTED AND TESTS REQ,.,UII_I_D:' ' "SIG: MATERIALS
SDIO TRAYCODE #
MAT 06
Note (1)
i z
TYPE OF MAT/SYS
NAM.,E/COMPANY PRIORITY
PRIORITIZED 1 THRU nTEST/SAMPLEREQUIREMENT
If not performed by PI, perform thefollowingtests. For more complextests obtain samples from PI whenhisprior testing is complete:
Visual examination under varyinglightingconditions
Contamination collection, analysis,and identification
,- Total integrated scatter measure-ments before and aftercontamination removal
- "Reflectance/transmittancemeasurements
- "Analysisof defects of and causesfor:--separations--flaking--peeling--other surface anomalies
"Nomarski tests of selected surfaces.
ADDITIONAL
INFORM.A._.ON NEEDED
If available, obtain controlsamples corresponding to exposedsamples provided by the PI.
Where critical tests are)erformed by PI, review hisdataand if values or calibrationsun-certain, request flightand controlsamples be submitted to SIG forretest.
p
111
LEVEL III
SIG: DEBRIS
SDIO TRAY
CODE # =
Note (I)
Note (2)
NOT_STOSUMMA,FiyOFTYPEOFMATEmALSORSYSTE.MSREOUEST,EDANOTEs:rsREQUIRED
" TYPE OF MATERIAL TEST/SAMPLE
0,R-SYSTEM PRIORITY FI,EQUIREMENT
Evaluate:
Number ol impacts
Crater depths and diameters
Impact ellects (spalling,
cracking, delamination, etc.)
Impactor material/compositions
(especially on Be mirror)
Degradation of optical
characteristics due to impacts
Evaluate:
Secondary eject impacts
Contamination
Impactor andcontaminaton
malerials/composilionsDegradation of optical
characteristics due to
contamination
ADDITIONAL
INFORMATION NEEDED
;Original specifications and optical
icharacteristics (TIS, BRDF,TMR,
etc.), post retrieval optical
measurements on control samples
•-- I = , I J
LIMITATIONS TO THE DEFINITIONOF SDIO NEEDS
'@,OC/MI'_TmP,rB.o,._.,_3-65_3
• DEPTH OF REQUIREMENTS DEFINITION -- ID LIMITED BY AVAILABLE INFORMATION.
• TYPES OF MATERIALS ARE IDENTIFIED, NOT SPECIFIC SPECIMENS IN MOST CASES
• "ASSUMES" ALL TRAYS WILL BE ANALYZED
; . : L _ . .: :=
• REQUIREMENTS ARE NOT SEPARATED RELATIVE TO WHAT iS BEING DONE BY SIGsAND Pts VERSUS SDIO SPECIFIC NEEDS
• CONFLICTS / OVERLAPS BETWEEN SIGs NOT RESOLVED
. TIMELINESS OF AVAILABLfLITY OF DATA TO IMPACT SDI SYSTEMS
• INTERESTED IN "LEADING EDGE" SAMPLES OR BEST ALTERNATIVE
112
EXPERIMENTS OF INTERESTTO SDIO
A0019 A0023 P0003 S0001
A0034 A0038 P0005 S0010
A0044 A0054 S0014
A0056 A0076 S0050
A0114 A0133 M0001 S0069
A0134 A0135 M0003-4,-5 S0109
A0138 A0139 M0004 $1001
A0147 A0171 M0006 $1002
A0172 A0175 $1003
A0178 A0180 $1005
A0187 A0189
A0201
EXPERIMENTS OF INTERESTTO SDIO
EXPERIMENT (LOCATION)
A0019 (D12) A0023 (various)
A0034 (C3,C9) A0038 (various)
A0044 (ES) A0054 (B4,D10)
A0056 (aS,G12) A0076 (Fe)
A0114 (C3,C9) A0133 (H7)
A0134 (ag) A0135 (E5)
A0138 (B3) A0139 (GS)
A0147 (BS,G12) A0171 (AS)
A0172 (D2,G12) A0175 (A1,AT)
A0178 (various) A0180 (DlZ)
A0187 (variOus) A0189 (O2)
A0201 (various)
M0001 (H3,H12) S0001 (various)
M0003-4,-5 (o3,4,8,9) S0010 (ag)
M0004 (Fe) S0014 (E9)
M0006 (c2) S0050 (E5)
S0069 (_9)
S0109 (C12)
P0003 (CR) $1001 (F12,H1)
P0005 (CR) $1002 (E3)
$1003 (E6)
$1005 (B_O)
113
FUTURE DIRECTION AND COORDINATION
WRDi_/MLBT WPAFB_OH 4543:3-6533
NEED TO INTERACT FURTHER WITH SIGs AND PIs
IDENTIFY PLANNED PI TESTS AND ANALYSES
IDENTIFY PLANNED SIG TESTS AND ANALYSES
IDENTIFY ANY MISMATCHES BETWEEN SDIO AND NASAPLANS
NEED TO LAYOUT A MUTUALLY AGREEABLE PROCESS FORINTERACTION
SOME DETAIL MISSING FOR SOME REQUIREMENTS
IMPLEMENTATION PLAN
WROC/MLBT WPAFB,OH 45453-6533
SDI SPACE ENVIRONMENTAL EFFECTS (SEE) PROGRAM MANAGERRESPONSIBLE FOR COORDINATION OF SDI/LDEF ACTIVITIES
ESTABLISH SDI/LDEF ADVISORY PANEL {SEE TIWG & SDIO SIC REPS)
IMPROVE COORDINATION WITH NASA
INCREASED PARTICIPATION IN SIC ACTIVITIES
HELP IDENTIFY/RESOLVE DATNSAMPLE QUESTIONS AMONG Ph_'SIGs/SDI
DUPLICATIONS, CONFLICTS, TEST SEQUENCING, etc.
COMMUNICATE WITH PIs
PI INTERESTS/DATA GENERATION PLANS
SDI tNTERESTS/DATAAND/OR SAMPLES DESIRED
ENSURE COOPERATIVE APPROACH
MAXIMIZES BENEFITS FROM RESOURCE EXPENDITURES
BEST WAY TO PROTECT EVERYONE_ RIGHTS AND INTERESTS
114
HOW CAN SDI ACQUIRE DESIREDDATA/SAMPLES?
WROC/MLBT WPRF,.B?0H45433-6533
• EXPERIMENTS/SAMPLES BELONG TO PIs
• TWO KINDS OF DATA: "GENERAL INTEREST" AND "SDI UNIQUE"
• 'GENERAL INTEREST"
IS PI PLANNING TO GET IT?
IF YES
ASSURE COMPATIBILITY OF PIsPLANS WITH "GLOBAL"PLANS
KEEP IN TOUCH (THROUGH SIGS)
IIF NO
CAN/WOULD PI GET IT IF ASKED?
II
IFYES
KEEP IN TOUCH
I
IFNO
IIF YES
KEEP IN TOUCH=ll
WOULD PI AGREE TO LOAN/GIVE ASAMPLE FOR DATA GENERATION
- BY SIG/BOEING
- BY SOMEONE ELSE (TBD)- PI GETS PUBLICATION RIGHTS
II
IF NO..????.
,,i i ,,,
I I
HOW CAN SDI ACQUIRE DESIREDDATA/SAMPLES?
WRDC/MLBT WP_AFB_riH45433-6533
. "SDI UNIQUE" DATA (e.g. SURVIVABILITY)
• REQUEST SAMPLES FROM PIs
• SUITABLE FOR TESTING
• MAY NOT BE RETURNED (DEPENDS ON TESTS TO BE PERFORMED)• CONTROL SAMPLES MAY BE NEEDED FOR CORRELATION
• DATA GENERATED MAY NOT BE RELEASED (MAY BE CLASSIFIED)
• COOPERATIVE EFFORT TO MAXIMIZE DATA WHICH CAN BEOBTAINED FROM UNIQUE LDEF OPPORTUNITY
l,, , ,|
!
115
NASALONG DURATION EXPOSURE FACILITY
MATERIALS DATA ANALYSISMETHODOLOGY OVERVIEW
BLAND A. STEIN
NASA- LANGLEY RESEARCH CENTERWORKSHOP CO-CHAIRMAN
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
ilAtl_,._INTF.NTIOflALL._ BLANt-
PRECEDING PAGE BLANK NOT FILME D
117
LONG DURATION EXPOSURE FACILITY
BLAND A. STEINNASA- LANGLEY RESEARCH CENTER,
CHAIRMAN, LDEF MSIG
LDEF MATERIALS DATA ANALYSIS WORKSHOPNASA- KENNEDY SPACE CENTER ,
FEBRUARY, 1990
LDEF launch
\
\
118
LD EF retrieval
Ii
"l
LDEF MATERIALS CHARACTERIZATIONOPPORTUNITIES
UNIQUE MATERIALS DATA
• 5.5-year exposure in low Earth orbit• Well-defined environmental parameters
- Natural environment
- Induced environments (e.g.-contamination, debris)• Large variety of materials in materials experiments, systems experiments,
and science experiments
BENEFICIAL MATERIALS DATA
• Design data base for NASA, DoD, and Commercial missions- Space Station Freedom- In-Space Experiments- Global Change Technology Platforms/Experiments- SDI systems- Communications satellites
- Concept studies for advanced missionsDesign data for space-based operationsVerifrcation of space materials environmental degradation models
• Fundamental understanding of space environmental effects
119
COORDINATION OF LDEF MATERIALS DATA
MATERIALS SPECIAL INVESTIGATION, GROUP TASK:
>>> CONSIDER ENTIRE SPACECRAFT AS AN EXPERIMENT<<<
(Synergism: The whole is greater than the sum of its parts)
MSIG APPROACH:
• Provide central data analysis laboratory
• Encourage voluntary contribution of P.I. experiment materialsfor documentation, mapping, analysis, archival, and/or determinationof laboratory-to-laboratory variability
• Specimen requirements- 75% of objective can be accomplished with 10mg of sample- 95% of objective can be accomplished with 100 - 500mg
• All experimental and analytical data will be shared with contributor
LDEF MATERIALS DATA ANALYSIS WORKSHOP
SESSION 2: MATERIALS DATA ANALYSIS METHODOLOGY DISCUSSIONSAND
SESSION 3: MATERIALS ANALYSIS, DATA BASE, AND PRESERVATION
OBJECTIVE: Stimulate interest and awareness of the opportunities to expandthe LDEF data base through:
Understanding the potential of data synergismVoluntary contribution of materials which:
were not originally planned to be test specimensor
were duplicate specimens in the experimentor
are specimens whose initial experiment objectiveshave been satisfied
APPROACH: Interactive discussions on analysis methodology• Characterization• Surface science
Atomic oxygenContamination
° Other parameters which define (or obscure) the data• Specimen preservation and shipment
120
NASA • _LONG DURATION EXPOSURE FACILITY
POLYMERIC MATERIALSCHARACTERIZATION
PHILIP R. YOUNG
NASA - LANGLEY RESEARCH CENTERMEMBER, MSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTER
FEBRUARY 13 & 14, 1990
121
CHEMICAL CHARACTERIZATION OF LDEF POLYMERIC MATERIALS
PHILIP R. YOUNG
NASA LANGLEY RESEARCH CENTER
MD - POLYMERIC MATERIALS BRANCH
HAMPTON, VA 23665
LDEF MATERIALS DATA ANALYSIS WORKSHOP
FEBRUARY, 1990
KENNEDY SPACE CENTER
CHARACTERIZATION OPPORTUNITIES
• UNIQUE ENVIRONMENTAL EXPOSURE
• LARGE VARIETY OF MATERIALS
• DIRECT APPLICATION TO CURRENT AND FUTURE SPACE ACTIVITIES
• VERIFICATION OF ENVIRONMENTAL PERFORMANCE MODELS
• FUNDAMENTAL INSIGHTS INTO SPACE ENVIRONMENTAL EFFECTS
122
POLYMERS
POLYIMIDE (KAPTON, PMR-15)EPOXY (934/5208/3501)POLYESTER (MYLAR, DACRON)AROMATIC POLYAMIDE (KEVLAR)POLYAMIDE (NYLON 6/6, ZYTEL)POLYSULFONE (P-1700)POLYCARBONATE (LEXAN)BISMALEIMIDE (V378A)ACRYLIC (PLEXlGLASS)ACETAL (DELRIN)TEFLON (FEP)KYNAR (TFE)VITON (POI_YHEXAFLUOROPROPYLENE)GRAPHITE FIBER (PAN)PYRRONE
POLYOLEFIN:POLYETHYLENEBLACK POLETHYLENEPOLYPROPYLENE
VINYL:POLYVINYL CHLORIDE
POLYVINYL FLUORIDE CTEDLAR)POLYVINYLIDENEFLUORIDEPOLYSTYRENE
POLYURETHANEPOLYPARAXYLENEPHENOLICCELLULOSE NITRATE
POLYDIMETHYLSILOXANESlUCONE RUBBERBUNA N RUBBERNEOPRENE RUBBER
POLYMERS
o
Jo POLYIMIDE (KAPTON, PMR-15) POLYOLEFIN:EPOXY (93415208/3501) /v_yJ720/._S POLYETHYLENE
- o_r-_z_-o'_'¢ _" POLYESTER (MYLAR, DACRON) BLACK POLETHYLENE
9, AROMATIC POLYAMIDE (KEVLAR). _ o ?. POLYPROPYLENE
o POLYAMIDE (NYLON 6/6, ZYI1EL)__.(c,_._C_) - VINYL:
_' _ o _ " _ 0.POLYSULFONE (P-1700) _ 04"_i: " -_=-_ POLYCARBO_TE(LExAN)-o__o-_-_"' POL_.YL C.LORDDE
_ _ =,-EI BISMALEIMIDE(V378A) C_ c_=Cc/_'_'_ "_ ACRYLIC (PLEXIGLASS) - C, _-c--
ACETAL (DELRIN) F I= _,-°-c"38-O-OA z-
TEFLON (FEP) - C- _:- o
KYNAR CTFE) F
VITON (POLYHEXAFLUOROPROPYLENE)
GRAPHITE FIBER (PAN) -CH 2- _F_-PYRRONE o c--'N
o
- O[z-CH z-
CH 3
- c.2- _H-C/
1
POLYVINYL FLUORIDE CTEDLAR) -cHz- ¢/_ -
POLYVINYLIDENEFLUORIDE - C/4z -C _ -
POLYSTYRENE - C _z-_/- , o _POLYURETHANE c_.. _ °_cgz_ -h___b.
POLYPARAXYLENE _ _ _ _ _°_
PHENOLIC _ [_ c_._ --_ _t_
CELLULOSE NITRATE _,_
POLYDIMETHYLSILOXANE-o-_'- ('i_l-V_
SlUCONE RUBBER _ _,c_
BUNA N RUBBER -CH_- c = _.C_ --NEOPRENE RUBBER
CF/_ CI
-C _-_ - _ -_;_-
123
WHAT ELSE SHOULD WE DO?
• WHAT CAN BE LEARNED ABOUT SPACE ENVIRONMENTAL EFFECTS THAT HAS LASTING
VALUE?
• WHAT "GOOD" SCIENCE CAN WE DO?
• WHAT ADDrriONAL WORK SHOULD BE PERFORMED TO ASSURE THAT THE "CORRECT'"SCIENCE IS BEING DONE?
• WHAT IS THE "BEST" ANALYTICAL CHARACTERIZATION PLAN?
CHARACTERIZATION OF LDEF MATERIALS
OBJECTIVE:
APPROACH:
STIMULATE INTEREST AND AWARENESS OF OPPORTUNITY TO EXPAND THE
LDEF DATA BASE BY CONSIDERING THE ENTIRE SPACECRAFT AS AN
EXPERIMENT.
PRESENT DISCUSSIONS ON CHEMICAL CHARACTERIZATION, SURFACE SCIENCE,
ATOMIC OXYGEN, CONTAMINATION, AND OTHER PARAMETERS WHICH DEFINE
(OR OBSCURE) THE INFORMATION OF INTEREST.
124
OUTLINE
• RESPONSE OF POLYMERIC MATERIALS TO SPACE ENVIRONMENT
• ANALYTICAL CHARACTERIZATION
- MOLECULAR WEIGHT
- CHROMATOGRAPHY
- DIFFUSE REFLECTANCE-FTIR
- THERMAL ANALYSIS
- MODEL COMPOUNDS
• RECOMMENDED CHARACTERIZATION PLAN
ANALYTICAL CHARACTERIZATION
MUST FOCUS ON
• DEVELOPMENT OF NEw AND IMPROVED MATERIALS
• THE LONG-LIFE CERTIFICATION OF SELECTED MATERIALS
• FUNDAMENTAL INFORMATION AT THE MOLECULAR LEVEL
- STRONG AND WEAK CHEMICAL LINKS
- IMPROVEMENTS TO MOLECULAR STRUCTURE
- DEGRADATION MECHANISMS
125
CHARACTERIZE RESPONSE OF POLYMERIC MATERIALS TOLDEF ENVIRONMENT
• ATOMIC OXYGEN
• THERMAL CYCLING
• ULTRAVIOLET RADIATION
• IONIZING RADIATION (e.p+)
• COSMIC RADIATION
• METEOROID AND DEBRIS
• VACUUM
• SYNERGISTIC EFFECTS
ABSORPTION OF RADIATION
Primary processes
initial effects:
p _v_p++ e-
_p*
o"--_e_h
p+ + e_h--,- p
Ionization
Excitation
Energy loss
Recombination
Subsequent effects:
P'-*R; .R_p*--.A+ + B"
P+ -* C++ D"
p'+ p -* PX+D •
Homolytic cleavage
Heterolytic cleavage
Decomposition
Ion-molecule
Secondary reactions
R- + R'- H--. R- H + R'. }R.+R' CI-*R-CI+R: Abstraction
R° + CH 2 = CHR -* RCH 2 - C;HR' addition
Decomposition -* Small molecules(CO2, HCI ...)
Chain scission and crosslinking
P = PolymerR = RadicalA, B, C, D = Other molecular species
126
PHOTOCHEMICAL EFFECTS
ENERGYABSORBED BY A MOLECULE:
E=h_hc
CONVERT MOLECULES TO MOLES:
E=
IF _,= 4000A, E = 71.5 Kcal/moleIf _,= 2500A, E = 114.4 Kcal/mole
h = PLANCK'S CONSTANT
c = VELOCITY OF LIGHT= FREQUENCY
= WAVELENGTHN = AVAGADRO'S NUMBER
TYPICAL BOND ENERGIES (Kca!/mole):
C-H 99 C-N 70 C-O 84C-C 83 C=O 179 C-CI 79C.--C 146 SiO 100 • C_N 212
RESPONSE OF POLYMERS TO EXPOSURE
SMALL MOLECULEGENERATION STRUCTURALCHANGES
/
CROSSLIHK
\
DEGRADE
(CHAIN SCISSION)
127
INDUCED CHEMICAL CHANGES
1.
3.
4o
CROSSLINKING• INCREASE IN MOLECULAR WEIGHT
• MACROSCOPIC NETWORK
• SOLUBLE FRACTION DECREASES WITH DOSE
CHAIN SClSSION
• DECREASE IN MOLECULAR WEIGHT• DECREASE IN TENSILE AND FLEXURAL STRENGTH
• EMBRITTLEMENT
• DISSOLUTION RATE INCREASES
SMALL MOLECULE PRODUCTS
• RESULTS FROM SCISSION FOLLOWED BY ABSTRACTION/RECOMBINATION
• INFORMATION ON DEGRADATION MECHANISMS
• CRACKING AND CRAZING (CO=, H2...)
• CONTAMINATION (HCI ...)
STRUCTURAL CHANGES• FOLLOWS PRODUCTION OF SMALL MOLECULES AND OTHER REACTIONS
• CHANGE IN COLOR
• LOSS OF CRYSTALLINITY
• MICRO- AND MACROSCOPIC DIMENSIONAL CHANGES
RESPONSE TO RADIATION DEPENDS ON STRUCTURE
VINYL POLYMERS
(CROSSLINK]
C-¢1:.,POLYETHYLENE
_ _7
POLYSTYRENE
_ _7
POLYVINYL CHLORIDE
KYNAR
VINYLIDENE POLYMERS
(RUPTURE]
BUTYL RUBBER
POLYMETHYL STYRENE
SARAN
128
EFFECT OF AROMATICITY ON RADIATION STABILITY
VISCOSITY
in]
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
o• II_C--O CHzCHzO T
__c PEN 'n
i J/ INSOL. AT
,/ / /o _ o lO00Mr
\ PE-HT n-, ' _".... "'_"_ -. 500 Mr O o
c--__yc- OC.,C.,O_-- PET In
I I I I I
200 400 600 800 1000
DOSE IN MEGARADS
REF:V.L.Beii and G.F. Pezdirtz: J. Polym. Sci. Polym. Chem. Ed. 21, 308_3(1983).
EFFECT OF UV RADIATION ON TENSILE STRENGTH
OF MYLAR FILM
PERCENT ORIGINALTENSILE STRENGTH
IOOI i-_ /-ALUMINIZED
BOse_ "-'----_
X(UNPROTECTED
40 _3_ MYLAR . _'t
2O_TO0 BRITTLE
x _'i0 TEST tl I l I J0 17525 50 75 IOO 125 150
HOURS IRRADIATION (BH-6 UV LAMP)
REF: W'S. Slempl NASA Conference Publication: 3035, Part 2, 1988.
129
d
EFFECT OF e" RADIATION ON TENSILE STRENGTHOF PYRRONE FILM
YIELD
STRENGTH,PSI
16,000
12,000
800O
4OOO
r
oN "N
0
0 5,000 10,000 1S,000 20,000 25,000 55,000 60,000
DOSE OF 3 MeV ELECTRONS, MEGARADS
EFFECT OF SPACE EXPOSURE ON Tg OF POLYMER FILMS
PRETEST SLll2 SL-4 SLll3i i I
270260
oO 150140
u_ 130
120110
tu 100o. 90.juJ 80I,-
60
50
0-'10-20
PPQ
POLYCARSONATE
....1/
MYLAR
..._e : , NYLON 6/6
FEP XC'20
I _ _-"_FEP TYPE A
36 73 131
SPACE EXPOSURE, DAYS
REF: CJ.Hurtey and W.L. Lehn: AIAA Paper No. 75-689, AIAA 10th Thermophysics
Conference, Denver,CO, May 1975.
130
MOLECULAR WEIGHT
SINGLE MOST IMPORTANT PARAMETER GOVERNING PROPERTIES OF POLYMERS
SILICONE OIL _ SILLY PUTTY
(VERY LOW Mw) (LOW Mw, LIGHTLY
CROSSLINKED)
SUPER BALL
(HIGH Mw)
r
THE ELEMENTAL ANALYSIS OF ALL THREE MATERIALS IS IDENTICAL.
DISTRIBUTION OF MOLECULAR WEIGHT
IN A TYPICAL POLYMER
AMOUNT
OF POLYMER
!
/
-_ NUMBER AVERAGE. Mn
F VISCOSITY AVERAGE,My
JFWEIGHT AVERAGE, Mw\
_'MiN i
in=
• _"Mi2Ni
Mw" _.MiNi
_v = ZMi(I"a}Ni
Z(MiNI) TM
MOLECULAR WEIGHT
131
MOLECULAR WEIGHT CHARACTERIZATION
LIGHT SCATTERING (LALLS)
POLYMER
INCIDENT BEAM =_
1(180°-_£{e1
Mw=f(scattering)
CHROMATOGRAPHY
[_COLUMN _waste
INJECTOR I_
oono.lf retenlionvolume .... ,
GPC-LALLS , GPC-DV
Ni
DISTRIBUTION
NUMBER
A VERAGE,_n,
VISCOMETRY (DV)- ? / - .
GPCIN
My=f (viscosity]
V=MnRT
.i
132
SELECTED PARAMETERS AS DETERMINED BY SEVERAL TECHNIQUES
ON THE SAME POLY(ARYLENE ETHER KETONE) SAMPLE
Technique M"-n(g/mole) _ (_mole) _lv (_limole) [11](dr./9)
Membrane Osmometry 1 31,700 ± 300 a _ 1.8
Static LALLS 58,000 ± 30002,s I
57,OO0 ± 10003,s
GPC-LALLS4, 9 26,200 ± 100 52,400'± 000 2.0
GPC.DVS, _ 10,600 ± 600 45,000 ± 2000 38,000 ± 2000 0.52 _ 0.02 4.2
GPCS,s 19,100 ± 1000 69,200 ± g00 3.6
Solution Viscosity 7 0.545 ± 0.0028
1Four concentrations in anisole.
2Seven concentrations in chloroform; dnJdc = 0.221 __0.001.
3Five concentrations in chloroform; dn/dc =0.221 ± 0.001.
4Two analyses, two concentrations.
SThres analyses, two concentrations.
6Three analyses, two concentrations; relative to polystyrene.
7Five concentrations in chloroform.
8Uncertainty in y-axis intercept at zero concentration.
9Chloroform mobile phase.
c c c
PAEK
133
EFFECT OF "PROCESSING ON VARIOUS MOLECULAR WEIGHT
PARAMETERS FOR A POLYSULFONE
m _ o m
SAMPLE Mw Mn Mv Mw/Mn [TI]
NEAT RESIN 1 : 52,300
FRACTURED RESIN2 50,600SOLVENT CAST FILM2 50,200SOLVENT COATED PREPREG 3 54,900HOT MELT PREPREG3 53,200COMPOSITE 3 53,200NEAT RESIN MOLDING3 54,600
15,800 45,700 3.31 0.42415,400 44,000 3_9 0.42814,900 43,600 3.38 0.42715,900 46,800 3.44 0.43016,300 45,500 3.27 .0.40915,900 45,700 3.34 0.422!6,700 47,500 3_7 0.402
1AVERAGE OF 5 ANALYSES2AVERAGE OF 2 ANALYSES3SINGLE ANALYSIS
• I : CH= "' -'_ 0 : ,,
\_ c'.,_=- '_J _ '_-_ /n
POLYSULFONE
MOLECULAR WEIGHT DISTRIBUTION
FOR POLYSULFONE RESIN
CONCENTRATION
(Xl0 -1)
12.0
8.0
4.0
f
I
2.0
/,
!\3.0 4.0 5.0 6.0
Log M
134
MOLECULAR WEIGHT DISTRIBUTIONS
FOR EIGHT POLY(ARYLENE ETHER KEYTONES)
DIFFERENTIAL
WEIGHT
FRACTION
jJ
\_\1
n
0 i 0
2.0 3.0 4.0 5.0 6.0 2.0
Log M
4
7
3.0 4.0
I
5.0 6.0
Log M
SOLUBILITY OF POLYVINYLIDINE FLUORIDE IN DMAcAS A FUNCTION OF DOSE
100
8O
60PERCENT
SOLUBILITY40
REF: G.D. Sands and
0
0 200 400 600 800
DOSE, MEGARADS
G.F. Pezdirtz: Polymer Prints (ACS), 6(2), 987(1965).
135
ANALYTICAL CHROMATOGRAM OF AP-22
CM3
c_N_"2N
INJECT
i
H2N'_X_2
CHROMATOGRAPH:ALC20?.JR401
COLUMN: pPORASIL"
SOLVENT:0.5_ MeOH/CH2CI2RATE: 1.5 ml/min
SIZE: lpl [Spg/l_l]DETECTOR:W (254 nm)
_JI i I 1
o _ i_ 15 2o 5 30 3sRETENTIONTLME,rain
RADIATION EFFECTS IN T300/934 COMPOSITE
THERMOMECHANICAL ANALYSIS THERMAL VACUUM WEIGHT LOSS
c-Om
Z<C
XI11
I
I
!
irradiated (10_° rads)
5"C,'mtn30 gm load
WEIGHT
LOSS
(%)
//
/
!
' Irradiate¢ /
(lo'Ora:s;--,,%lI
I
I
I
F
Z Base(ine _ ;
,_ ,I..... 2 t
1
Z _, " JIJJ 0 ....
5o _oo _so zoo 50 100 150 200 250
TEMPERATURE, °C TEMPERATURE, °C
!
300
REF: G.F. Sykes, S.M. Milkovich, and C.T. Herakovich: Polym. Matls. Sci. Engn.,
ACS, 52, 598(1985).
136
DIFFUSE REFLECTANCE SPECTROSCOPY
ELLIPSOIDAL
MIRRORS _-SAMPLE
I J / suo,.oINCIDENT DIFFUSE _ /---SAMPLE
_OMPONENT _/ MOUNT
W0Z
m
DR-FTIR SPECTRAOF GRAPHITE/POLYSULFONECOMPOSITE
BEFOREAND AFTER RADIATIONEXPOSURE
SAMPLE:Celion 80001P-1700
I _'1 I w _'J II /
2000 1800 1800 1400 1200 1000
WAVENUMBERS, cm-1
137
i
DR-FT1RSPECTRA OF 2-PLY T3001_,01_COMPOSrrEEXPOSED TO SPACE ENVIRONMENT
4
ABSORBANCE
-[WAVENUMBERS, cm
DR-F'i'iRSPECTRA:-OF GI_APHITE/EPOXY COMPOSITE
BEFORE AND AFTER THERMAL AGING
LUOZ
Ot.,O
O
so,ooohrsj_.._/ /
25,000 hrsl
250=F "_
UNAGED
© o
2000| I
1800
I I I I I t
1600 1400 1200
WAVENUMBERS, cm -1
SAMPLE: AS13501-5
%0 o-_
.43-°_.',/" %
H/N "_-J 0 ",_/ N_.H
1000
138
UJ0Z<mO:0
m,<
illoz
i,..w
z,<
"CONTROL
EXPOSED
oo H
/, i"_i'_c- o c.,c.,o-.._--
SPECTRA OF MODIFIED POLYESTER
BEFORE AND AFTER SPACE EXPOSURE
I I I JI, ! I I ,t I t L J I
4000 3600 3200 2800 2400 2000 1800 1600 1400 120G 1000 8:00 _OO 400
WAVENUMBERS, am -1
DR-FTIR SPECTRA OF CELION 6000/LARC-160 COMPOSITE
BEFORE AND AFTER THERMAL AGINGJ
POLYMER SEGMENT
,q,, II I ..CC _..
15,000 hr/ _ r,. ,- i _ - Jn-0.l. g /._^ o,. II © _0 t 2"".our t/_ _ IAG'NG
== IB
,.. o o Yr. oI_ t "- / C C,_ II .C
'_I " N C CH N
I I I I I I i I I I I I 1 i
2000 1800 1600 1400 1200 1000 800 600
WAVENUMBERS, cm-1
139
,.J
DR-FTIR SPECTRA OF THERMALLY cYCLED PMR-15 COMPOSITE
I.-
VI!t °in o_ o
i j ! a ; I o "
4000 3600 3200 2800 2400 2000 1600 1200 800 " 400
WAVENUMBER, cm- 1
. DR-FI"IR SPECTRA OF BIS-NADIMIDE MODEL COMPOUND
Z I;
ivl0, i i '; ,' i ' ; i ¢ 1 i i ' i
2000 1800 1600 1400 1200 1000 800 8()0
WAVENUMBER, cm -1
140
EFFECT OF THERMAL AGING ON NADIMIDE MODEL COMPOUND
121
L)Z
I.-
(nZ
E
l o
I
I I I I 0 I I | I I I I | I •
2000 1800 16 0 1400 1200 1000 800 600
UNHEATED
f/_HEATED
480eF/4hr
WAVENUMBER, cm-1
ISOTHERMAL WEIGHT LOSS AT 500=F
WEIGHT
LOSS, 5.0
PERCENT
10.0
0 0| n
0 o
I
0I
5.0
TIME, HOURS
I
10.0
i
15.0
141
MOLECULAR LEVEL EFFECTS
O OII/_ l|
ATO__U
cQ-- .®
C®--N®
X
-CI%-
_C=O
DIMENSIONS
x
_C-----O
--CH_
"_¢----O
GEOMETRY
8OND ANGLE
109.54 °
120.21"
DISTANCE
17.95
16.65
17.46
TORSIONAL ANGLE
-43.3° -3s.s=
-3o.s° -24.4"
RECOMMENDED CHEMICAL CHARACTERIZATION
SOLUTION PROPERTIES
HPLC
GPCLALLS/OSMOMETRYI
VlSCOMETRY
SPECTROSCOPY
MASS
UV-VIS-NIR
IR
MAGNETIC
-. RESONANCE
- SEPARATES MOLECULAR MIXTURES INTO INDIVIDUAL
COMPONENTS
- SEPARATES LARGE MOLECULES ACCORDING TO SIZEMOLECULAR WEIGHT AND MOLECULAR WEIGHT
DISTRIBUTION DETERMINATION
c
IDENTIFICATION OF MOLECULAR SPECIES
ELECTRONIC SPECTRA, CHROMOPHORE COMPOSITION,
TRANSPARENCY, EXCITED STATE BEHAVIOR.
. VIBRATIONAL SPECTRA, CHEMICAL STRUCTURE,CONFORMATIONAL, CHEMICAL MODIFICATION.
1H & 13C NMR: CHEMICAL STRUCTURE, TACTIClTY,
CONFORMATION, CHEMICAL MODIFICATION.
ESR: RADICALS, TRIPLET STATE STRUCTURE AND
• BEHAVIOR.
DETECTS CHANGES AT THE MOLECULAR LEVEL
m_
142
RECOMMENDED PHYSICAL CHARACTERIZATION
• THERMALJ'rHERMOMECHANICAL
DSC - Tg, Tm, HDT, CRYSTALLINITY
TBA - Tg, Tin, MECHANICAL SPECTRUM
TMA - CTE, HDT, Tg, Tm
DMA - RELAXATIONS, DAMPING COEFFICIENTS, MECHANICAL
SPECTRUM
TGA - VOLATILE PRODUCTS
DETECTS CHANGES IN POLYMER MACROSTRUCTURE.]
CHARACTERIZATION PLAN - CONTINUED
ANALYTICAL RESULTS WILL DICTATE DIRECTION OF ADDITIONAL RESEARCH:
MF._,_ZEEMEB_
SURFACE CHEMISTRY
SURFACE MORPHOLOGY
METAL ION MIGRATION
SURFACE MOLECULAR AND ATOMIC
RESOLUTION
THERMOSET SOLUBLE FRACTION• . _/P
ESCA, _sl_, EDAX, AUGER
SEM, STEM
ATOMIC ABSORPTION, ICP
SCANNING TUNNELING MICROSCOPY
HPLC
MASS SPEC/PYROLYSIS
GC/PYROLYSIS
OBJECTIVE: MOLECULAR LEVEL RESPONSE TO ENVIRONMENTAL EXPOSURE. [
, >,i._
143_-
CHARACTERIZATION PLAN- THERMOSETS
SAMPLE
FILMS
COMPOSITES/
SOLIDS
ALL
MEASUREMENT
TRANSPARENCY, ELECTRONIC STRUCTUREMOLECULAR STRUCTURE
MOLECULAR STRUCTURE
DEGRADATION/VOLATILE PRODUCTS
Tg, CTE, HDT, DEGREE OF CURE ...ELEMENTAL COMPOSITION
CRYSTALLINITY
SURFACE CONTAMINATION
TECHNIQUE
UV-VIS-NIR %T
%T FTIR, 1H % 13C-NMR
DIFFUSE REFLECTANCE-
SOLID STATE NMR
SOLVENT
EXTRACTION/TGA
DSC/I"MA
CHNO
X-RAY DIFFRACTION
MASS SPEC/BAKEOUT
CHARACTERIZATION PLAN - THERMOPLASTICS
IN ADDITION TO STANDARD THERMOSET ANALYSES:
[VlEASUREMENT TECHNIQUE
CROSSLINK DENSITY
MOLECULAR WEIGHT: Mn
Mw
My
[,1]
MOLECULAR WEIGHT DISTRIBUTION
GEL FRACTION
MEMBRANE OSMOMETRY
LOW ANGLE LASER LIGHT SCATTERING (LALLS)
DIFFEI_ENTIAL vIsCOMETRY (DV)
VISCOMETRY
GPC/LALLS, GPC/DV
144
KAPTON
Film
Insulation
Aluminized
TapeWashers
ROW: 9(RAM) 3(TRAIL) 6/12(±90 °)
A0134
A0076
A0076
S0010
M0002
M0003
S0069
$1002 $1001
(also space end, A0133)M0002 $1001
M0003 $1003
M0002
(also row 10 S0115 at A0178 at 16 locations)$1001
A0180
TEFLON
Teflon, PTFE
Teflon
AluminizedSilveredSSMKel FFEP AIFEP
Viton
TedlarPVF
PVF2
ROW: 9(RAM) 3(TRAIL) 6/12(90 °)
A0076 A0187 A0180A0201 A0201 $1001
S0014 $1002 A0201
(also row 8, A0147 and row 2, A0172)M0003 M0003 M0002S0014 A0138 $1001
A0038
(also space end, A0038)(Row 4 and 10, A0054)A0076 (also A0178 at 16 locations)S001OS0114
M0003
A0134 M0003M0002 M0002A0134 A0138
(also earth end, A0139-A)M0003 M0003
A0134 $1002
$1003
$1003
A0180
$1001
r
145
THERMOSETS
PMR-15
LARC-160
Kapton
VespelGr/5208
Gr/3501-6
Gr/934
Pyrrone
A0175
A0175
already noted$1002
A0019
M0003
A0180
A0175
A0134
M0003
M0003
S0014
A0134
A0171
A0014
M0003
A0180
A0134
M0003
A0147
THERMOPLASTICS
Mylar, filmvelcro
Polysulfone, film
composite
Polycarbonate
Teflon
A0139A P0003
P0004 M0002
A0178 at 16 locations
A0171 M0003
(C3000/P1700)(C6000/P1700)
(722JP1700)(T300/P1700)
(Gr/P1700)
('l'300/Polyethersulfo ne)
M0001 M0002A0178 at 16 locations
already noted
A0023
A0138
A0134
A0134
A0134
M0003M0003
M0003M0003
A0015
A0187
A0076
M0003
A0134
$1001
146
DESIRABLE SAMPLES FROM MATERIALS EXPERIMENTS
2.
3,
4,
5o
6°
EXPERIMENTALLOCATION
A001 gD12
A0175AI&A7
A018012
MATERI/U, Pl OBJECTIVE REQUEST
5208,3"300
LARC-160PMR-15934F178
Epoxy, KevlarKapton
Primarily, mechanical
properties
$1006 Nylons, PE Space exposure ofE6 Mylar, Kevlar balloon materials
$1003 FEP, Kapton as/£ (no chemistry)E6
$1001 Kapton, AcrylicsF12/H1 Urethanes, Silicones
Epoxy, PolycarbonatePVF, Teflon
Heat pipe, PlUs filmsadded for A0 exposure
Broken samples
Redundant films
Buttons after
testing
Any redundant films
OTHER GENERAL REQUESTS
Q POLYETHYLENE
• POLY(ETHYLENE TEREPHTHALATE)
• POLYSTYRENE
• A0178- DUPLICATE 16 TIMES ON VEHICLE
147
PAINTS
OTHER; BLACK PRICERS
9924 (PRIMER)
A-276 (WHITE)
Z-306 (BLACK)
Z-93 (WHITE)
Z-202 (WHITE)
Z-302 (WHITE)
II-AS71 (RED)
9951 (THINNER)
S-13G
S-13G LO
SPEREX AP-101
DC 92-007
YB-71
Zn O-TITINATE
MS-74
PV 100 ML 101
3M NEXTEL
CATALAC
ECCOSORB
ilTRI D-111
3M 101-C10
3M CR-110
3M 401 -C10
ASTRAL
ASTRAL P123
DuPONT 46971
DC 1200
Zn CHROMATE
ADHESIVES
EPOXY
El=ON828 (SHELL)
934 (HYSOL)
EPI BOND (FURANE)
ARALDITE (CIBA-GEIGY)
TORRSEAL (VARIAN)EPO.TEC 331
ETCA E10-214
STYCAST 2850
3M #401 C10
Ti-1300B
WASATCH UH-3119
SILICONE
DC 6-1104
DC 93500
DC 43117
SYLGARD 182
SYLGARD 105
SLYGARD 186
RTV 602/566/
655/5000
URETHANE
HYSOL EMS-1107
SOLITHANE 152/
112J113/TC-700
FM 9600
SCOTCH TAPE 5/
465/415
SCOTCH WELD 2216
MYSTIC TAPE
STYCAST 1090
NARMCO 328
C.34
AF-143
SR 585
REDUZ BSL 312/319
K-14
148
SUMMARY
• UNIQUE CHARACTERIZATION OPPORTUNITY
• MOLECULAR LEVEL INFORMATION ON POLYMERIC BEHAVIOR
• SAMPLE ARCHIVAl/DOCUMENTATION IS CRITICAL
• VOLUNTARY PARTICIPATION/CONTRIBUTION IS ENCOURAGED
149
NASALONG DURATION EXPOSURE FACILITY
SURFACE CHEMISTRY
JAMES WIGHTMAN
VIRGINIA TECHMEMBER, LDEF ADVISORY COMMITTEE
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
PRECEDING PAGE BLANK NOT FJL,MED
p_ [ j___.._l NTENTIONIMJ,ll
151
SURFACE ANALYSIS USING X-RAYPHOTOELECTRON SPECTROSCOPY
(XPS OR ESCA)
J. P. WIGHTMANCHEMISTRY DEPARTMENT
VIRGINIA TECHBLACKSBURG, VA 24061
PHONEFAX
703-231-5854703-231-3971
LDEF WORKSHOPNASA- KSCFEBRUARY 14, 1990
152
ACKNOWLEDGEMENTS
Alcoa Boeing
Elf Aquitaine " Johnson Wax
NASA-LaRC (6) -NSF
ONR Tioxide Intl
Virginia
Mr, P, Commer_:on
Dr, T, A, DeVilbiss
Dr, D, Dwight
Dr, J, Oo Glanville
Dr, Y, Kang
Mr, T, Lin
Ms, K, PhillipsDr, R. Seals
DI:. J. A. Skiles
Dr. M, E, Counts
Dr, J, G, Dillard
Dr, J, Filbey-ArneyDr, J, S, Jen
Dr, C, U, Ko
Dr, D, J, Moyer
Ms, K, A, Sanderson
Dr, E, J. Siochi
Mr, H. F, Webster
OUTLINE
INTRODUCTION
=
=
_EM
EXAMPLES
Xps or ESCA
PRINCIPLESEXPERIMENTALA APPLICATIONS
MetalsParticles/Fibers
Polymers/Composites
EXPERIMENTAL
APPLICATIONS
...... Polymers/Composites .....
.SUMMARY
#
153
Key to acronyms and entries
:154
PARTIAL HSTING OF SURFACE ANALYSIS TECHNIQUES--C. J. POWELL.
ORIGlr',i_L PAGE IS
OF POOR QUALITY
OxygenPlasma 1 rain 11}0,000× 0 xyge n Pla :m_a5 mir_II]0,I}0llX
156
SEM PHOTOMICROGRAPHS OF CARBON FIBER/POLYIMIDE MATRIXCOMPOSITES--MOYER & WlGHTMAN.
h," ""
Unexposed Exposed
SEM PHOTOMICROGRAPHS OF KAPTON BEFORE AND AFTER EXPOSURETO ATOMIC OXYGEN-STS 8-McGRATH.
• _E£'_---__ ......... C
Unexposed Exposed
SEM PHOTOMICROGRAPHS OF POLYIMIDE--SILOXANE BEFORE AND AFTEREXPOSURE TO ATOMIC OXYGEN--STS 8--McGRATH.
OR|GINAL pAGE IS
OF poOR QUALITY157
SCHEMATIC DIAGRAMS OF THE FOUR WORKHORSE SURFACE ANALYTICALTECHNIQUES--D. M. HERCULES/J. S. JEN.
.#
158
ENERGY LEVEL DIAGRAM FOR X-RAY PHOTOELECTRON SPECTROSCOPY(XPS)--D. M. HERCULES.
ORIGINAL PAGE ISOF POOR QUALITY
SCHEMATIC DIAGRAM FOR XPS TECHNIQUE--DuPONT.
-.._ ,,,_ _ ,
SCHEMATIC DIAGRAM OF XPS SPECTROMETER--DuPONT.
ORIGINAL PAGE ISOF POOR QUALITY
159
WIDE SCAN XPS SPECTRUM OF CESIUM DOPED TUNGSTENFILAMENT--JEN & WIGHTMAN.
OR,_GII_,_ALpAGE IS
OF poOR QUALITY,
160
Narrow scan ESCA spectrum of W in Sample #1001.
NARROW SCAN XPS SPECTRUM OF _FHE TUNGSTEN 4FREGION--JEN & WlGHTMAN.
ORfG_r_P,LPACE mSOF POOR QOALITY
161
XPS ANALYSIS OF CHROMIC ACID ANODIZED TITANIUM 6-4 (Ti 6-4)ALLOY--FILBEY & WIGHTMAN.
r
ORrGr_L P,_.GE' !S
OF POOR QUALI'_,'_r,
AUGER ELECTRON SPECTROSCOPY (AES) SURVEY SCAN OF PRETREATED Ti 6-4ADHERENDS-DITCHEK et al.
162
I
AES DEPTH PROFILE ANALYSIS OF CHROMIC ACID ANODIZED Ti 6-4ALLOY--FILBEY & WlGHTMAN.
ORIGINAL PAGE ISOF POOR QUALIT_K
---_;:._- PAGE ISOF POOR QUALITY
163
AES DEPTH PROFILE ANALYSIS OF ACID ETCHED Ti 6-4AI' LOY--FILBEY & WIGHTMAN.
ORIGINAL PAGE IS
OF POOR QUALITY,
164
Illillll
XPS ANALYSIS OF UNBONDED (#1) AND FAILED T-PEEL SAMPLE (#2 & #3) OFTi 6-4 ALLOY BONDED WITH EPOXY--MARCEAU, SKILES & WlGHTMAN.
ORIGINAL PAGE ISOF POOR QUALITY
165
ESCA A527 METAL SIDE E,SCA A527 ADHESIVE SIDE
Zn CA FN St AI
XPS ANALYSIS OF DEGREASED AND FAILED LAP SHEAR SAMPLE (METALAND ADHESIVE SIDES) OF GALVANIZED STEEL BONDED WITH
EPOXY--COMMERCON & WlGHTMAN.
166
iilI
_ ,P!k.,J
,F_.c
8
I
i{X d'<W
n Jr
'-i "" "X ., / t/d,, , ,- /
• __..,._ ',:Tv" '-/" 7 [- /L- f',--_ ,,, A
,,-m / t i
• ,, iltl ,i,,, lii i,. Oil ill. ll_ lill. _i_ lul. I_li lly. llo ill. Ilii aw.._ ,e4_ oio ,,i,L 0_,
B_%-,TTEI% *rIME (MIN. }
AES SURVEY (TOP) AND DEPTH PROFILE ANALYSIS OF GALVANIZED STEEL
" SUBSTRATE PRIOR TO BONDING--COMMER(_ON & WlGHTMAN.
• O_G_NAL,PAGE;_OF POOR QUaLI_Ty
167
168
d'
E
'[Zn C
i
•_E'S PRDF I L.E XR',, C. YR-- . D
Cr.,_,T,.-- '%(_0 _. CKV. , E'L3OM_.
_. O0_-',V. . I O0_J, =,
• mt •
} ,,, ^ !
8C3P
_c /_'_=_I 1 / _ _ '
= :---_'b_ "--_-_I_.-_,-"- =_'_---m_--.--'_:_T_==¢-,--ll_ ., _ /
AES SURVEY (TOP) AND DEPTH PROFILE ANALYSIS OF ADHESIVE SIDEOF (3ALVANIZED STEEL BONDED WITH-EPO_KYFO[I_OWiNGLAP SHEAR
..............FAILURE-COMMER_ON & WIGHTMAN.
ORIGINAL PAGE IS
OF POOR QUALITY
S
'° °I I;_o mo_,o_ _,,_o_ ,mo. oo mo,_o_ _,-,,-,oo .L_nOL,,,', _,_.oo *" "
• ,_ ._
8al
8_nlr,<
&
I'm
8
AES SURVEY (TOP) AND DEPTH PROFILE ANALYSIS OF METAL SIDEOF GALVANIZED STEEL BONDED WITH EPOXY FOLLOWING LAP SHEAR
FAILURE--COMMER_ON & WIGHTMAN. _ :
ORIGINAL PAGE IS
OF POOR QUALITY169
/Failure in the Metal
Cohesive Failure
/
Adhesive Failure
DIAGRAMS SHOWING LOCUS OF FAILURE FOR THREE GALVANIZED STEEL
(GH, MS, A527) BONDED WiTH EPOXY-COMMER_ON & WlGHTMAN.
17O
SEM PHOTOMICROGRAPH OF SHUTTLE EXHAUST PARTICLES COLLECTED BYAIRCRAFT ON A NUCLEOPORE FILTER--COFER & WlGHTMAN.
ORIGINAL PAGE ISOF POOR QUALITY
AI 2p Photopeak--NASA 75-A-20--Raw Data and Deconvoluted Components
AI 2p Photopeak--NASA 75-A-47--Raw Data
AI 2p Photopeak--NASA 75-A-47--Raw Data and Deconvoluted Components
XPS CURVE-FI'I'TED ALUMINUM 2P PHOTOPEAKS OF SHUTTLE EXHAUSTPARTICLES--COFER & WlGHTMAN.
ORIGINAL PAGE IS
OF POOR QUALITY
171
XPS (ESCA) ANALYSIS OF MSH ASH--KANG & WIGHTMAN. + _ ;
' L
WETTING OF COAL--GLANVILLE & WIGHTMAN.+,
173
XPS CURVE FITTED CARBON 1S PHOTOPEAKS OF COAL HEATED TO• DIFFERENT TEMPERATURES IN AIR--PHILLIPS & WlGHTMAN.
OXYGEN/CARBON RATIO OF COAL DETERMINED BY XPS (ESCA) AS A FUNCTIONOF PRETREATMENT TEMPERATURE--PHILLIPS & WlGHTMAN.
174
ORIGINALPAGEISOF POORQUALn-Y
XPS ANALYSIS OF COMMERCIALLY AVAILABLE CARBONFIBERS-DeVILBISS & WIGHTMAN.
XPS WIDE SCAN SPECTRUM OF NITROCELLULOSELACQUER--WEBSTER & WlGHTMAN.
175
XPS CURVE FITTED CARBON 1S PHOTOPEAKS OFPOLYETHYLENETEREPHTHALATE-DWlGHT, McGRATH & WlGHTMAN.
176
XPS CURVE FI3-FED CARBON lS AND OXYGEN 1S PHOTOPEAKS FORPOLYMETHYLMETHACRYLATE--WEBSTER & WlGHTMAN.
ORIG!NAL PAGE ISOF POOR QUALrrY
XPS SPECTRA OF METALLIZED KATPONTOP--CHROMIUM AND ALUMINUM PHOTOPEAKS ON CHROMIUM SIDE
BOTTOM--CHROMIUM AND ALUMINUM PHOTOPEAKS ON ALUMINUM SIDE--WlGHTMAN.
t rl:
" O_/_/NAL PAGE /So1:POoRQuAU_
I ,
177
p_'- ,/
• 178
CARBON 1S AND SULFUR 2P XPS PHOTOPEAKS FOR POLYSULFONE (PSI=)FILM (TOP SPECTRA) AND PSF FILM SPUTTERED WITH ARGON
(NEXT SPECTRA)--KO & WlGHTMAN.
ORIG!NAL PAGE ISOF POOR QUALITY
SCHEMATIC DIAGRAM FOR ANGLE DEPENDENT XPS STUDIES--WEBSTER.
XPS (ESCA) ANALYSIS OF POLYOLEFiN FILMS BEFORE AND AFTEREXPOSURE TO OXYGEN PLASMA-WIGHTMAN."
ORIGINAL PAGE IS
OF POOR QUALITY179
SILICON 2P AND SULFUR 2P XPS PHOTOPEAKS IN SILOXANE CONTAININGPOLYMER--LIN, McGRATH & WIGHTMAN.
XPS RATIOS BEFORE [POLYMER NAME ONLY] AND AFTER [NUMBERDESIGNATION] ROAD EXPOSURE OF COATED PLATES MOUNTED
ON AUTO--SIOCHI & WIGHTMAN.
180
T
SILICONE/FLUORINE RATIO AS DETERMINED BY XPS FOR SILICONE OILMIGRATION ACROSS POLYMER SUBSTRATE--WEBSTER .&,WlGHTMAN.
181
1"82
XPS (ESCA) RESULTS OF OXYGEN PLASMA TREATEDCOMPOSITES--MOYER & WIGHTMAN.
01_tGINAL PAGE IS
04: pOOR QUALITY
XPS (ESCA) SPECTRA OF CARBON 1S PHOTOPEAKS OF OXYGENPLASMA TREATED COMPOSITES--MOYER & WlGHTMAN.
ORIGINAL PAGE IS
OF POOR QUALITY
183
f ,: •
(a) ATR - IRE
P
.,...Igm_ q,LW.,_m
lumP.hum
S4mple
(b) specular -multtple reflections
(c) specular - single reflectt0n (d) specular - grazing angle
i •
ELLIPSOIDAL MIRRORS SAMPLE
• • / _ovAm.(
" TO
FROJ_ DETECTOR
IMTEIUFEilOPIET£11 _ _._]tT +-- MJIIJiO,R Z
- l+ ._+(e) diffuse reflectance
0m
F-U)
00<0I-0
O.
SRS attachments.
184 -
DIAGRAMS OF VARIOUS REFLECTANCE INFRARED ACCESSORIES-HONEYCUTT, WEBSTER, YOUNG AND WlGHTMAN.
REFLECTANCE IR SPECTRUM OF FAILED TITANIUM LAP SHEAR SAMPLEBONDED WITH POLYIMIDE ADHESIVE--COUNTS & WlGHTMAN.
OtR|GINA L PAGE tS
OF pOOR QUALII'3t
185
REFLECTANCE IR SPECTRA OF UNEXPOSED (TOP) AND ROAD EXPOSED(BO'i-I'OM) FLUOROPOLYMER COATED PLATES--SIOCHI & WlGHTMAN.
186ORIGINAL PAGE ISOF POOR QUALITY
p
REFLECTANCE IR SPECTRA OF TWO THICKNESSES OFPOLYMETHYLMETHACRYLATE ON CHROME STEEL--WEBSTER & WIGHTMAN.
ORIGINAL PAGE.OF POOR _,,_ IS
VUALITy
187
SUMMARY
XPS (ESCA) IS A SENSITIVE SURFACEANALYTICAL TECHNIQUE PAR EXCELLENCE
GIVING ATOMIC COMPOSITION. THE
TECHNIQUE
A IS MODERATELY FAST
& IS SAMPLE FORGIVING
A HAS GOOD SENSITIVITY FOR ALLELEMENTS
DOES DISCRIMINATE _BETWEENVALENCE STATES
_. DOES MINIMAL SAMPLE DAMAGE
AUGER ELECTRON SPECTROSCDPY IS A
USEFUL ANCILLARY TECHNIQUE FOR NON-
POLYMERIC SUBSTRATES GIVING DEPTH
PROFILES
INFRARED SPECTROSCOPY IS ANOTHER
COMPLEMENTARY TECHNIQUE FOR POLYMER
SUBSTRATES GIVING GROUP IDENTIFICATION
189
LONGNASA
DURATION EXPOSURE FACILITY
ATOMIC OXYGEN
NASA.
BRUCE A. BANKS
LEWIS RESEARCH CENTERMEMBER, MSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA- KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
"_' Is _ * _!
PRECEDING PAGE BLANK NOT FILMED
e__INTF, NTIONALI._BLANI[
191
ATOMIC ,OXYGEN INTEIh%CTION'WITH MATERIALS ON LDEF
Bruce A. Banks
NASA Lewis Research Center
(216) 433-2308 FTS 297-2308• .i "" , , " ,
LOW EARTH ORBITAL ENVIRONMENT
,_ Ed
700i _ \\ I I _ i I iI ,"k o -
6oo-: _\ N,, \ \ 2---- - 3oo
500-4.',, \ 02................i_ \ _ Ar--.-- E=
400_:...,,.... "__i, _, " He ----- - 200 _"
_300_ 4 _:,"i"i':'"-:_,___--SHUTiLE I
2oo _""_.k ................"_-_,_.. tI- .,,_ ........... . , --4100
IOOL 1 l t 7-- 1 -l--" J105 106 107 108 109 1010 1011 1012
NUMBERDENSITY,cm-3
192
LDEF (Long Duration Exposure Facility) Atomic Oxygen Fluence
on Forward-Facing Surfaces100 250
Od
Eto
EO
o
x
toc(9
LL
r..: (9
O)
x0
to.m
E0
<
50
10
5
Space Station AO Fluence:1.5 x 10"al0ms/cm =
(Constant Density Flight Profile)
_ Fluence"-" "-- Altitude
Space Station AO Fluence: _ J3.6 x lO"atoms/om z _
(Constant Altitude Flight Profile) '_J
EOIM-2 AO Ruence: //'_ k
. 3.5 x lO=atoms/cm" _
(Forty Hours Ex_" . '_
• I J J ,I I ,
0 1 2 3 4 5 6
LDEF Mission Days (xlO 2) from 7/15/88
240
230
220
210
2OO
190
180
170
Ed
"O.=
;Z
Atomic Oxygen Flux at 8kmsec -I (cm -2 sec -1)
109 101o 10 I1 1012 101= 1014 10 is 10161000/ I _ = J % I I _ I
ool- ' \,, •aool- ',,,
•_-=4ooJ- .... -ax; um •:< " ' Standard _,
300 _;..I- . S;anod_rhdere . ,,- _'"__._, .
200 !- 'Solar10 0 I"- . Minimum
0[l J [ I I I J I10 _ 104 10 s 106 10 _ 108 10 g 1010
Atomic Oxygen Density, cm -=Atmospheric atomic oxygen density and flux in low Earth orbit,
193
F10.7 SOLAR FLUX
250.0
ZO@. 8
_,50.0
tOO.O
' 50.0
0.0
\
t4.0 85. @ 86 0
HO&&
solar data/
87.0 no. 0
TIME YEAR-1900
/_FC
zo|ar data
89.0 90.0 91.0
LDEF FLUX
:: i94
14
7= _O l
tI
.iI
,1I
:'LuX, irO_5,_(; 1
ii
3_
't1
'i
°!l '_t-O
I
/
a 07 m M,EAR
&
i '
ORIGINAL PAGE IS
OF POOR QUALITY
LDEF EXPERIMENT INTEGRATION MODEL.
__f ,,, I B¢J RO_,,
1 t A0175 _ S0001
2 'l A0178 S0001
3 '_ A0187 A0138
4 A0178 A00S4
5
6
7
8
9
10
11
12
S0001 A0178
c] °!'!Grapple A0178 I S000l
_-_-_1 A0'I_S000111 A01788 _ _1 A0189'
I Mooo A0178 _!
F
S0001
e0004
l-_,o6S0001
A0178
A0044Ao178)S0050A--_.3SS000_
_[g sloo3 ^_3_
S0001 S0001
S0001 S0001
A0175 A0178 50001
A0171 S0001 _k00,S6A0147 A0178" _ " ,r__'_" _A0034 _,
S0069 S0010 ! _ _A0114_
A0178 S100S Grapple
A0187 S0001 A0178
S0001 A0201 S0109
_)sooo!._
A0178
M0003 A0187
M0003,___ 50014M00021
A00S4 A0178
A0178 50001
A_J_!_9:' _ A0038A0180
1 I
/vl0004
A0076
S0001
S0001
S1001
12
i I/1 A00S6 jA0172
10/I A02011 ! IA001S _2
_-_'_O0"02 ! A0147- I
S0001 :A01,39-A S0001 //4
= .,<
Earth end (G)
12
J
_//] I A0201S1001 M,O001 A0023
---.--, M0001 _ A0038
/1\
;ooo1^oo,.
_/_ Space end (H)
10
9
195
LOW EARTH ORBITAL
ATOMIC OXYGEN ENERGY DISTRIBUTION
Number of
Oxygen Atoms
of Energy E
o 400 km otbl!
0 28.5 _ inct_alion
96K
, v i , ' i " v i
2 3 4 5 6 7 8 9
Energy E, eV
ATOMIC OXYGEN RAM ENERGY
Altitude,km
500
400
300
2003
Energy, eV
196
ATOMIC OXYGEN IMPACT VELOCITY RELATIVE TO SPACECRAFT SURFACES
(AT 333 km - 180 nmi)
O orbital Ram Velocity, _o
Magnitude
km/sec
7.9
o Atmospheric Rotation Vsloclty, _&- Magnitude and direction varies around orbit due
to inclination, latitude and altitude
- Reduces ram energy by 11%
- Reduces normal incident ram flusnce by 5.6%- Fluence effects cancel to first order on surfaces
90 ° to ram
0.49
o Random Maxwellian Thermal Velocity, _.
- Maxwellian tail allows atomic oxygen impacton surfaces >90 • to ram
0.41 (avg)
o TotalI_pactV.locity,_, - ; + v_*- Evidence of atomic oxygen a_tack on L_EF at 105"
to ram
ATOMIC OXYGEN FLUENCE DEPENDENCE ON ARRIVAL ANGLE
0.1
Relative0.01
Fluence
0.001
0.0001
8
0 30 60 90 120
Angle from ram, 8, degrees
197
CALCULATED ATOMIC OXYGEN FLUENCE BYSPACECRAFT ROW.
"'O
t-o_
"G
.,..I
BaYll A
A0178
L._ A0187
, . .A0178
S
6
7
S0001
S0001
A0175
8 A0171
9 S0069
10 A0178
11 A0187
12 S0001
B C
50001
S0001
A0138
A0054
A0178
S0001
A0178 S0001
Grapple
u')-7 h,.-l_'l
O I v"/O/
< <S0001
A0178
A0178
S0001 A.___56A0147 A01781
SlOOS Grapple
S0001 A0178
A0201 S0109
A_om|c OxygenD E F f|uence, ItOeS/cm _
A0178 S0001 S0001 o
6.5 x 10 t7A01721S0001
MOO03__M0002
M0003
A0178
A0178
M0003
M0003r------
M0002
A0054
A0178
^oo 9
A0178
A0187 i
S0001
A0044sooso 3s
P0004
50001
A0178
5.7 x 10 tT
S0001 o
A0038 S.o x 1o/t
S0001 S0001 4.0 x Io_'
A0187 MOO04 8.3 x t.o=/
S0014 A0076 1.o x 1o==
A0178 S0001 _.7 = lo=_
S0001 S0001 6.4 x I0 =/
A0038 S1001 1.4 x 10_t
10
"Ro.m _ 9
12
A00S6 iA017) \'1
A02011, '. ! A0015 \M0002 _A0147
,,/ K/
S0001 A0139-A S0001 7
i7 i
6Earth end (G)
12I
11
SI001
M0001
! A0201M0001
_A0023
_ A0038
S0001 A0038 A0133
s i6
Space end (H)
10
198
ATOMIC OXYGEN SURFACE INTERACTION PROCESSES
O
deexcitatlon NO 2
"glow" hv
\ i )oio/i H20
- OH
ATOMIC OXYGEN REACTION MECHANISMS
ALKANES RCH2CH 3
RCH2CH 2. + OH, _ 2 RCH|2CH 2" "_ HOHT
RCH2CH 3 + O repacement.._ r R'O" + R'CH2CH 3. _._ recombination/further -_._-),--volatiles(CO,
reaction/fragmentation H200 HCO.
L:.'"..Ir'_CH2CH2OHI* _ fragmentation (volatiles) CH 3, etc.)
ALKENES
q
R... H
H" "_'H
recombination/further -,-..__1,, t;1=,=
-p-- reaction/fragmentation
R H CHRCH 2 R_ H.,_,°':_lf "C=C" + OH' _'_ 2 "C=C- + HOH
,,C._."J" H / " -- H / •
_'_ion __ C R/_C__ .Hl"- fragmentati0n (volatile,) "o
F R H 7 _,o,_"°_._ R_CH2" "1' H" (volatile,)
/ ± " • epoxideformation.=_ /R HIL u .j -'- I .'_--c" I _ fragmentation (volatiles)
• _t.=p,,t-_i. ,., I H" "n" _H[g"_interconverslonl L .I
199r
), ' I
ATOMIC OXYGEN EROSION YIELDS OF VARIOUS MATERIALS
MATERIAL EROSION YIELD, lO"24 CM3/ATOM
Kapton H polyimioe 3.0
Mylar polyester 2.7 - 3.9
Polyethylene 3.3 - 3.7
Epoxy 1.7
Polycarbonate 2.9 - 6.0
Polystyrene 1.7
Polysulfone 2.4
Urethane (black, conductive) 0.3Silver I0.5
Carbon 0.9 - 1.7
Chemglaze Z306 (flat, black) 0.35FEP Teflon 0.037
Aluminum 0.0
Copper 0.0Gold 0.0
Platinum 0.0
SiO 2 0.0
MATERIAL T_IOKNESS LOSS
FROM OXIDATION BY ATOUIO OXYGEN
j_m / mils{
Fluence, atoms/cm 2
MATERIAL
Polyethylene
Kapton polylmide
Epoxy
Graphite
FEP Teflon
1.05 x 1022
i.
347 / 13.6
315 / 12.4
179 / 7.0
126 / s.o
3.9/ o.15I
8&lO
9.08 x 1021
30o / n.8
272 / 10.7
154 / 6.1
109 / 4.3
3.4 / 0.13
ROW
7411
5.25 x 1021
1;,3 / s.s
1s8 / s.2
89 / 3.5
63 / 2.5
1.9 / 0.08
6 & 12
4.1 x 1020
13.6 / 0.54
12.4 / 0.49
7.0 / 0.26
4.9 / 0.19
0.15 / 0.01
EROSION YIELD
cm3/ato=
3.3 x 10 -24
3.0 x 10 -24
1.7 x 10 -24
1.2 x 10 -24
3.7 x 10 -26
200
dq==l¥_ • *_
,1(
EROSION YIELDS OF VARIOUS MATERIALS EXPOSED TO
ATOMIC OXYGEN IN LOW EARTH ORBIT
EROSX_N YIELD,MATERIAL x lO "_q CmJ/ATOM REFERENCE
Alumil_uul (150 X) 0.O l
Alumil_um-coated Kapton 0.01 2
Alu,dnum-coated KapLon 0.l Z
Al203 < O.OZ5 3
AI203 (700 A) on <0.02 4Kapton F{
Aplezon grease 2/_,n >0.625 5
Aquadag E (graphite in an ].23 5
aqueous binder)
CarboL_ 1.2 7, l, 8, g
Carbon (various forllts) 0.9 - 1.7 IO
Carbon/Ka_ton IOOXAC37 l.S 11
40}-ClO (flat black) 0.30 12
ChromiuJ_= (123 A) partially eroded 14
Chr_nium (125 _) on 0.006 15, 16Kapton H
Copper (bulk) O.O ll
Copper {l,O00 A) on 0.007 15, 16
sapphire
EROSION YIELD,
MATERIAL x 10 -24 Cm3/ATOM RFFERFNCE
Copper (l,000 A) O.O064 14
DiaJ_=ond 0.O21 17
Electrodag 402 (silver in 0.057 6
a silicone binder)
£1ectrodag IO6 (graphite 1.17 6
in an epoxy binder}
Epoxy 1.7 I0, IG
Fluoropol_ners:
FEP Kapton 0.03 18
Kapton F <0.05 6
Teflon, FEP 0.037 5
Teflon, FEP <0.05 lO
Teflon, TFE <0.05 IO, 6
Teflon, FEP and TFE 0.0 and 0.2 15, 19
Teflon, FEP and TFE O.l 15
Teflon 0.I09 ]9
Teflon 0.5 15
Teflon 0.03 15
Teflon < 0.03 9
201
EROSION YIELD,
MATERIAL x I0"Z4 cm3/ATOM REFERENCE
Gold (bulk)
Gold
GraphiLe Epoxy:
1034 C 2.1
5ZO8/T300 2.6
GSFC Green C.O
I10S-87S (bare and preox) 0.0
Indium Tin Oxide 0.002
Indium Tin OxJde/Kapton 0.0!(aluminized)
Iridtual Film 0.0U07
Lead 0.0
Magnes I um 0.0
Magnesiunl Fluoride on glass 0.007
Mol_/bdenum (I,000 A) 0.0056
Molybdenum ( 1,000 _,) 0.006
Molybdenum 0.0
Mylar 3,4
Mylar 2.3
0.0
appears resist_L
17
20
t0
10
1
1, Z6
15, 16
Z
17
1, Z6
l, Z6
15_ 16
4
15, 16
1, Z6
lO
IS, Ig
EROSIVN Y_ELO,
MATERIAL x I0 -Lq cmJ/ATOM REFERENCE
Mylar 3.9 15, 19, g
Mylar 1.5 - 3.9 15
Mylar A 3.7 18
Mylar A 3.4 21, 6
Mylar A 3.6 6
Mylar O 3.0 6
Mylar D Z.g 21
Mylar with Antiox l_avily attacked 2Z
Nichrome (100 _) 0.0 1
Nickel film 0.0 17
Nickel 0.0 8, 26
Niobium Film 0.0 ll, 1
Osmium O.OZ6 10
Osmium heavily attacked 20
Osmium (bulk) 0.314 17
Parylene, 2_5 _m i eroded away 2Z
Platinum 0.0 I, Z6
Platinum appears resistant 20
202
EROSION YIELD,MATERIAL x 10 .24 cm31ATOM REFERENCE
PlaLinum film
Polybenzimidazule
Pulycarbonate
Polycarbonate resin
Polyester - 7% Poly-silane/93% Po131,nide
PolyesLer
Po1¥esLer with Antiox
PolyesLer (Pen-2,G)
Polyethylene
Polyethy)ene
Polyimides:
8JPIPSX-9
BJPIPSX-g
BJPIPSX-II
DJPIPSX-11
BTDA-Benzldene
BTDA-DAF
BTDA-DAF
0.0
1.5
6.0
2.9
0.6
heavily aLtacked
heavily aLtacked
?.g
3.7
3.3
0.28
0.071
O.56
0.15
3.08
2.82
O.8
17
IO, 7
0
17
lO
10, 22
10, 22
Z3
10, 21, 16, 15
1O, 6
23
24
?3
24
23
23
24
MATERIALEROSION YIELD,
x 10 -24 cm3/ATOM REFERENCE
BTDA-[m]- D0502
BTDA-,mI_-MDA
BTDA-pp-DABP
U [DA-pp-ODA
I-DAB
Kap Lu,i (black)
Kapton (TV blankeL}
Kapton (TV blarJI,eL)
Kapton (OSS - 1 blanket}
KapLon (OSS - I blanket)
Kapton H
Kapton H
Kapton H
Kapton H
Kapton H
Kapton II
Kapton (uncoated)
ODPA-_JII_-DAUP
2.29
3.12.
2.91
3.g7
1.80
1.4 - 2.2
2.0
2.04
2.55
2.5
3.0
Z.4
2.7
1.5 - 2.8
2.0.
3.1
0.I, O.OG
3.53
,i
23
23
23
23
23
15, 12
15
lg
15
15
10, 15, lg,4, 6, 9
15, lg
15, IO
15
18
18
2
23
-I ;
203
EROSION YIFLO,MATEI_,[AL x 10 -24 cm3/ATOR REFERENCE
PEN-2.6 2.90
PMDA- pp -DA/3P 3 •B2
PMOA- pp- MDA 3.17
PMDA- pp- ODA 4.66
Po|._,ethylmet hacryI at e 3. ]
7_( Po]ysi lane/93g 0.6
Polyimide
25% Polysiloxane, 75% 0.3
Polylmide
25% Polysiloxane-Poly JmJde 0.3
polystyrene 1.7
Polysulfone 2.4
Polyvinyl idene Fluorlde 0.6
Pyrone :
PMDA-DAB 2 oS
S-13-GLO, white D.O
SiO 2 (650 _) on Kaptoa H <0.0OO8
SiO 2 (650 _) wiLh__ 4% PTFE <O.OOOB
Si0x/Kapton {aluminized) 0.Of
23
23
23, 24
23
16
i0
10
g
I0, 16, 9
I0, 16
g
23
12
4
4
Z
EROSION Y|ELD,MATERIAL x lO "24 c,13/ArOM I_EFERENCE
Silfcottes:
DC1-257/
DCI-2755-coated Kapton
DCl-2775-coaLed Kapto_
UCG-II04
Grease 60 _m
I(TV-5GO
((TV-GI$ (black.co,ductive}
RTV-615 {clear)
RTV-670
RTV-SG95
RTV-3145
T-6SO-coated Kapton
SiloxanePolyimide (25% Sx)
$iloxane Poiyimide (l_ Sx)
Silver . i .
Tantalum
Tedlar
0,055 Zl
O.OS 15
<0.5 15
0.0515 ?0
intact but oxidized 25
0.443 21
0.0 20
0.0625 5
0.0 1
1.48 II
0.128 1
<0.5 15
0.3 7
O.G 7
10.5" " :_ " " i I 5
appears resistant 20
3.2 10
204
tr, ¸-
MATE RIALEROSION YIELD,
x 10-24 c,,3/ATOM REFERENCE
Tedlar (clear)
Tedlar (clear)
Tedlar (white)
Tedlar (white)
O
Ti02, (I,000 A)
Trophet 30 (bare and preox)
TungsLen
Tungsten Carbide
YB-71 (ZOT)
Z302 (glossy black)
1.3 and 3.2
3.2
0.4 and 0.6
O.OS
0.0067
O.0
0.O
0.0
'O.0
3.9
15
18, 6
15
15
5
l, 26
8, 26
8
7
26
205
EROSION YIELD TABLEREFERENCES
l •
2.
.
.
.
.
.
8.
g.
lO.
II.
12.
13.
14.
15.
Marshall Space Flight Center
Smith, K. A. Evaluation of oxygen interaction with materials (EOIM) -STS-8 atomic oxygen effects. AIAA-85-7021. November, 1985.
Durcanin, J. T., and Chalmers, D. R. The definition of low earth orbitalenvironment and its effect on thermal control materials. AIAA-87-159g.
June, 1987.
Banks, B. A., Mirtich, M. J., Rutledge, S. K., and Nahra, H. K.Protection of solar array blankets from attack by low earth orbital
atomic oxygen. 18th IEEE Photovoltaic Specialists Conference. October,1985.
Purvis, C. K., Ferguson, D. C., Snyder, D. B., Grier, N. T., Staskus, J.
V., and Roche, J. C. Environmental interactions considerations for spacestation and solar array design. Preliminary - December, 1986.
Visentine, J. T., Leger, L. G., Kuminecz, J. F., and Spiker, I. K. NASA
JSC STS-8 atomic oxygen effects experiment. AIAA 23rd Aerospace SciencesMeeting. January, 1985.
Langley Research Center
University of Alabama at Huntsville
Coutler, D. R., Liang, R. H., Chung, S. H., Smith, K. 0., and Gupta, A.
O-atom degradation mechanisms of materials. Taken from Proceedings ofNASA Workshop on Atomic Oxygen Effects. June l, 1987, p. 42.
Leger, L. G., Santos-Mason, B., Visentine, J. T., and Kuminecz, J. F.Review of LEO flight experiments. Proceedings on the NASA Workshop onAtomic Oxygen Effects. November, 1986, p. 6.
British Aerospace
Whitaker, A. F. LEO atomi_ oxygen effects on spacecraft materials.
Martin Marietta
Lewis Research Center
Leger, L. J., Spiker, I. K., Kuminecz, J. F., Ballentine, T. J., and
Visentine, J. T. STS Flight 5 LEO effects experiment - Background
description and thin film results. AIAA-83-2631-CP. October, 1983.
Jet Propulsion Laboratory
Gregory, J. C. Interaction of hyperthermai atoms on surfaces in orbit:
The University of Alabama Experiment. Proceedings of the NASA Workshop
on Atomic Oxygen Effects. November, 1986, p. 31.
206
References
IB.
Ig.
20.
21.
22.
23.
24.
25.
26.
Leger, L. J., Visentine, J. T., and Kuminecz, J. F. Low earth orbit.
Leger, L. J. Oxygen atom reaction with shuttle materials at orbitalaltitudes - Data and experiment status. AIAA-83-O073. January, 1983.
Goddard Space Flight Center
Johnson Space Center
Washington University
Slemp, W. S., Santos-Mason, B., Sykes, G. F., Jr. and Witte, W. S., Jr.Effects of STS-8 atomic oxygen exposure on composites, polymeric films
and coatings. AIAA-85-0421. January, 1985.
Santos, B. The dependence of atomic oxygen resistance on polyimide
structures. (Preliminary results of STS-8). NASA Headquarters. January
23-24, 1984.
Aerospace Corporation
Whitaker, A. F., Little, S. A., Harwell, R. J., Griner, D. B., andDeHaye, R. F. NASA Marshall Space Flight Center - "Orbital Atomic OxygenEffects on Thermal Control and Optical Materials: STS-8 Results." AIAA
23rd Aerospace Sciences Meeting, January 14-17, 1985.
[FFECT OF LEO ATOMIC OXYG[N DNOPTICAL PROPERTIES OF MJ%T{ItlALS
rl Optical Properties due to A/O
Material Absorptance E_d trance Reflectance Reference
A_/FEP O.OOO 0.0 I
AI/AI203 -0.006 0.0 I
AIMgF 2 0.0 O
Al203 0.0 0.0 E
AIzO3/AI(IIe ) -0.005 0.0 I
AlzO3/AI(Le ) -0.006 0.0 I
Aluminized FEP Teflor_. second 0.05 -0.19 0
surface mirror (0.025 rTlnthick)
AI Kapton 0.048 0.018 " K
Al Kapton -0.062 -0.00/ K
Aluminized Kapton. second -0.23 -0.59 0
surface mirror, uncoated
(0.052 ,vn Lhick)
Aluminum (150 _) i & 0.0 0.0 0.0 B
Aluminum (chr_.ic acid oxidized) 0.0 0.0 0.0 F
Olack, carbon-filled PTFE -0.16 -0.05 0
impregnated fiberglass(0.127 _in thick)
207
C-
Cha,_]e in Optical Proper.tie.s due tO A/OSolar
Material Absorpt ance Emittance Reflectance Reference
Black Cr on Cr on Mo 0.20* H
Black Ir on Mo -0.75 N
Black Rh on Mo (matte) _ - -0.25 N
Black Rh on Mo (specular) -0.50 H
Bostic 463-14 0.01 0.0 J
ChemgTaze A276 (w/modifiers) -0.006 to 0.0_ - A0.016
Chemglaze A276 (_hite} -0.005 0.03 -O.03g B, C
Chemgl aze ZOO4 0.01 0.0 - J
Chemglaze Z302 (glossy, black) 0.011 -0.01 0
Chr_nlum (123 _) 0.0 0.0 0.0 E
FEP Teflon with silver undercoat 0.006 0.0 -
GE-PO-224 0.0 0.0 - ,1
GSFC (green) -0.0O2 - L
Indium Tin Oxide coated Kapton Hwith aluminized backing 0.006 0.004 - i(
LFTO ring 0.006 0.004 K
ITO iS) Sheldahl, black/Kapton O.Ol 0.0 - J
{sputtered)
Material
ITO (VD} Sheldahl, black/Kapton
(vacuum deposited)
Ir foil on Al
KAT glass
KapLon with al_ninlzed backing
Kapton H (aluminized)
Mo (polished)
Nickel
Ni/SiO 2
Polyurethane A-276
Polyurethane A276 glossy while
Polyurethane A276 with 0.5-I milO! 650 overcoat
Rh foil on AI
S13 - GLO
SiO 2 (650 A on Kapton li)
SiO x ring
Silicate MS-74
Change in Optical Preperties due to A/OSolar
Absorptallce EmiLLance Reflectance
0.0
0.048
0.041
0.005
-0.004
0,023
-0.002
0.002
-0.0O5
0.0
0.039
0.01
0.0
O.OIB
0.0
0.0
0.0
0.0
-0.002
0.0
0,0
-0.05 to0.1"*
-0.051
0.0
0.01
0.2
-0.3
0.0
0.0
References
N
l
I
I
L
L
N
I
E
K
H, A
208
Change i_ Optlca% Properties due to A/OSolar
MaLerlal Absorptance Emittance Reflectance Reference
Silicone (black, conductive) 0.0 -0.005 A
Silicone RTV-602/Z302 -0.004
Silicone RTV-6SO+TiO 2 0.001 -0.01 A
Silicone RTV-670 -0.004 0.001 B
Silicone S1023 -0.022 -0.02 G
Siloxane coaling, RTV 602/ 0 on 0.0 0.0 0aluminized Kapton, second sur-face mirror substrate (0.008 .Inthick coating) (0.052 mn thickKapton)
Ti/"tiodtzed" alloy -0.25"** N
Ti/%iodized" CP -0.40"*** N
UreLhane {black, conductive) 0.042 0.55 A
Urethane Inhib A-276 0.O 0.O1 A
YB-71 0.004 0.0 1
Z302 glossy black 0.043 -4.3 L
Z302 with MN41-1104-O overcoat -O.DO2 M
Z302 with OI 651 overcoat 0.0 M
Z302 with OI 650 overcoat -0.001 - O.l L
Z302 with RTV-602 overcoat -0.004 L
Cllangein Optical Properties due to A/O• Solar
Material Absorptance Emittance Reflectance
Z302 with RTV-670 overcoat -0.004 - 0,4
Z306 0.022 0.0 -
Z306 (flat black) 0.028 - -
Z853, glossy yellow WithMN41-1104-O overcoat 'O.Oll - -
Z853, yellow -0.034 - -
401 - C10 flat black 0.005 - -
Reference
NOTE:
* More reflective as a result of the exposed Mo substrate.** Low absolute reflectance (-0.5 to 1%)
*** Contrast in different spectra between STS-8 and control. Possible agingeffects on controls.
**** Aging effects similar illSTS-8 and control. No exposure effect.
: 209z
EFFECT OF LEO ATOMIC OXYGEN ON
OPTICAL PROPERTIES OF MATERIALS
REFERENCES
A.
B.
C.
D.
E.
F.
G.
H.
I Q
NASA Goddard Space Flight Center
NASA Marshall Space Flight Center
NASA Langley Research Center
Whitaker, Ann F. LEO Atomic Oxygen Effects on Spacecraft Materials.
NASA Lewis Research Center
NASA Langley Research Center
Martin Marietta
Park, J. J., Gull, T. R., Herzig, H., and Toft, A. R. Effects of Atomic
Oxygen on Paint and Optical Coatings.
Slemp, W. S., Santos-Mason, B., Sykes, G. F., Jr., and Witte, W. G., Jr.
Effects of STS-8 Atomic Oxygen Exposure on Composites, Polymeric
Films, and Coatings. AIAA-85-0421. January, 1985.
JD Zimcik, D. G., and Maag, C. R. Results of Apparent Atomic OxygenReactions with Spacecraft Materials During Shuttle Flight STS-41-G.
AIAA-85-7020. November, 1985.
K.
L.
Mo
Smith, K. A. Evaluation of Oxygen Interaction with Materials (EOIM) -
STS-8 Atomic Oxygen Effects. AIM-85-7021. November, 1985.
Whitaker, A. F., Little, S. A., Harwell, D. B., Griner, R. F., Fromhold,
A. T., and DeHaye, R. F. Orbital Atomic Oxygen Effects on Thermal
Control and Optical Materials: STS-8 Results.
Whitaker, A. F., Burka, J. A., Cost.n, J. E., Dalins, Z., and Little S, A.
Protective Coatings for Atomic Oxygen Susceptible Spacecraft Materials
- STS-41G Results.
No
O.
Meshishnek, M. J., Stuckey, W. K., Evangelides, J. S., Feldman, L. A.,
Peters,n, R. V., Arnold, C. S., and Peplinski, D. R. Effects onAdvanced Materials: Results of the STS-8 EOIM Experiment. Aerospace
Contractor Report SD-TR-87-34, July 20, 1987.
: L .... :'and McCargo, M. CorrelationKnopf , P. W., Martin, R; J., ,amman, R. E.,
of Laboratory and Flight Data for the Effects of Atomic Oxygen on
Polymeric Materials. AIAA-S5-1066. Williamsburg, VA, June, 1985.
210
ATOMIC OXYGEN TEXTURED FEP TEFLON BY DIRECTEDBEAM EXPOSURE AT UNIVERSITY OF TORONTO.
ORfGh'_IAL PAGE IS
OF POOR QUALITy
211
O0 0
Protective _n_tinn_" "-\\\\\\_"'_.--,,_ _..._"_"_"_\\\_\\\\\\\\_v_-._ %%%%%%%%%% %%%%%%%%%%%%%%%%%%%
x\N%X\\\\\\\\_\_\\\\_\\\N\\\N%\%\%\\\\,_XNNNN\\N\\\%\\\%\\\\\\%\\%\\\\\\\\\\\%\\\_
,\\\\\\\\\\\\\\\\\\%\\\\\\\\\\\\%\%%\%\\%%\__\\\\\\\\\\\\\\\\x\\XNN\N\\\\N\%%\\\%\\\\\\"
Organic Substrate _ \\\\\\\\\xxxxxxxxxxx_xxxxxxxxxxxxxxxxxxxx\,_\\\\ _\\\\\NX\\\\\\\\\\\\\\\\\\\\\_\\\\\\\\
ATOMIC OXYGEN IN PLASMA ASHERS.
O
_\%\\\\\%\\_\\\_' _'_\\\KN\\N\NN%N\N\N\Nx%%\\
\%\\\\\%%\\\x\\\\_ J%\\\\\\%\\\\\\\\\\\\\\\%_\\%%%\\\\\\\\\\\\_ j\%\\\\\%\%\%%\\%\%\\\\\%\%\X\\\NNxN\%\\\\\_ _\X\\N\NNNxx\\%\x\x\%%\%\__%\\\\%\\N\\X\\\\_ _\\\\\\\\\\\%\\x\\\\\\\\%%
_%\\\\\\\\\%\\\\\\\_,.._\\\%\\\\%\\\%%\\\\\\%\\%_\\\\\\\\\\x\\\\%\\\\\\\\\\\'_\\\\%%\\\\\\\\\\\"_%\\\N\N\\N\N\NNN\x%\\\\\\\%%\%\\%\\\\\\\\\\\\\%\\\\\\%\\\\\\\\\\\%\\\\\%\\\\\%\\\\%\\\\%\_
ATOMIC OXYGEN EXPOSURE BY DIRECTED BEAMS.
212
,009
• --.-- UNPROTECTED I(APTON
.008 _' .... UNPROTECTED LONGERON A
, • UNPROTECTED LONGERON B
'_ .oo7 i = ._=--'_ __ ,008
.oo5 i ._ o-e
00 - .
'001 _"- , • I I
05.0 x 1021 1.0 x 1022
EQUIVALENT FLUENCE (atoms/cm 2)
MASS LOSS OF FIBERGLASS EPOXY COMPOSITES AND KAPTON AS A
FUNCTION OF EFFECTIVE ATOMIC OXYGEN FLUENCE (KAPTON BASED).
213
ANTICIPATED SURFACE PROFILE FORTHICK ORGANIC LDEF SAMPLES.
A;OI=0
.__\
Organic
I >> g A,/O
THIN POLYMER FILMS (<5 mils)
A/O
AiO
214
THIN POLYMER FILMS (<5 mils)
WITH ATOMIC OXYGEN PROTECTIVE COATINGS
A/O
AJ_ _
A/O
THIN POLYMER FILMS (<5 MILS)
WITH ATOMIC OXYGEN PROTECTIVE COATINGS
A/O
....A/O
215
NASALONG DURATION EXPOSURE FACILITY
MATERIALS _ SPECIAL
INVESTIGATIOAN N GRO_sPMATERIALS ALYS
GARY PIPPIN
BOEING AEROSPACE AND.ELECTRONICS CO.MSIG SUPPORT
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA-KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
217
MSIG KSC WORKSHOP - FEB 1990
LONG DURATION EXPOSUREFACILITY
MATERIALS DATA ANALYSIS
MSIG KSC WORKSHOP - FEB 1990
NAS 18224
Task 12, Materials
Task 15, Systems
• Boeing contract with tasks in support of MSIG and SSIG
activities Through NASA LaRC
BOEING MATERIALS TEAM AT KSC DURINGDEINTEGRATION PROCESS
Dr. Gary Pippin-Environmental Effects on Materials
Syl Hill-Adhesives, Composites
Roger Bourassa-TCC, Composites, Lubricants,Environmental Effects Modeling
Dr. Johnny Golden-TCC, Paints, Ai Anodizing
Russ Crutcher-Particular and Moiecular Analysis,Contamination Control
Harry Dursch-Tech Leader Boeing Tasks for SSIG
Bob Roper-Composites, Adhesives,Program Support
218
GOALS:
TOBE ABLETOPREDICTTHEPERIODOFTIMEA GIVENMATERIALWILL SURVIVEIN LEO
TOBE ABLETOESTIMATETHEENGINEERINGPERFORMANCELIFETIMEIN LEOOFSPECIFICMATERIALS
TO UNDERSTANDTHE DEGRADATIONMECHANISMSIN ORDERTO PRODUCEMATERIALSMOREINHERENTLYRESISTANTTO THE LEOENVIRONMENT
MSIG KSC WORKSHOP - FEB 1990
Tasks:
• Make Quantitative measurements of the effects of the
low earth orbit environment on materials.
• Report results for inclusion into LDEF materials data
base
219
SPECIMEN/SYSTEM ENVIRONMENTALEXPOSURE
SPECIMEN EXPOSURE DEPENDENT ON LOCATION
12 Sides + 2 ends
Modules with/without lids
"Shadow" effectsDepth of trayOscillation of spacecraft
"Edge" effectsSide, front of specimens
Secondary scattering
MSIG KSC WORKSHOP- FEB 1990
Unique Specimens
• One time opportunity
Procedures selected to maximize information value
220
Careful documentation of each step
HARDWARE CONDITION WILLINVESTIGATION
DRIVE
COMPARISON- OPTICAL IMAGESUBTRACTION
QUALITATIVE-TRENDS
QUANTITATIVE-NUMERICAL VALUE
SPECIFIC ITEMS
SILVER BACKED TEFLON BLANKETSALUMINUM PLATES WiTH A-276 & Z-306COPPER GROUNDING STRIPSCOMPOSITES
KAPTON IDES),,TE FLO N(sP,,OLYIMMAN VARIETIESPIECES OF OTHER THERMAL
CONTROL BLANKETSLEXAN, PAINTS, ADHESIVES
221
FLUORINATED MATERIALS
PAINTSA276Z306$13
YELLOW PAINT ON TRUNNIONS
ALUMINUM, STEEL
KAPTONPOLYCARBONATE(LEXAN)
COMPOSITES
COMPLETE SET ALUMINUM PLATES, TCC DISKS,BOLTS, WASHERS
AT LEAST ONE FROM EACH TRAY LOCATION(TWO PREFERRED)
PHOTODOCUMENT ORIENTATION BEFORE REMOVAL
VARIETY OF MATERIALS WITH COMMONLOCATION DISTRIBUTION
DETAILED OPTICAL AND SURFACE CHARACTERIZATION
222
SURVEY CONDITION OF TEFLONMATERIALS ON LDEF
DIMENSIONAL CHANGES WHEREPOSSIBLE
SURFACE TEXTURECOLOR-OPTICALS
OUTGASSING,
IR SPECTRA
CHEMICAL IDENTITY
COPPER GROUNDING STRIPS
INTACT
WITH PIECE OF THERMAL CONTROLBLANKET ADHESIVELY, ATTACHED
223
COPPER GROUNDINGSTRUCTURE TO AO178
STRIPSTRAY
EXPERIMENTAL MEASURE OF ATOMICOXYGEN FLUX TO EACH ORIENTATION
CONTOUR OF EACH STRIP SHOWSVARIATION
MEASURE THICKNESS, DENSITY, OXIDESPECIES, OPTICALS
PRESERVE ORIENTATION OF EACH STRIP
OPTICAL PROPERTIES
SURFACE CHEMISTRYFUNCTIONAL GROUPSELEMENTAL A .NALYSIS-
OXIDATION STATEMICROCRACKINGTEXTURERECESSION THICKNESS
BULK PROPERTIESMECHANICALTHERMAL
OUTGASSING
224
(/)
E _ o_•- _ ._- o_1.° > ® _ =_3 _._ ._.=_-_ _o
.-_ O" .Q
"_ _.= .- mlO _l:,,.c=.-_ _,® ..,=.._= = L=._=_ _,=_
..._ ,=,. =._ _ __=o
=1 .-, _ vt (/)
E0
m
_= _== =-..o
":"0 .ill
•-, o£:
E
}<UJ
I
oZ
I
I,..
N 0_.,-, •__ _N!
ffl
°_ .E_ •_°
,-'_ _ _.1 ,-'_
E0
i.m
m
.J
0
225
LDEF Thermal Control Coatings
II I IIII I1|
Engineering Properties
Thermal Vacuum Stability
• Optical Characteristics
• Adhesion
Abrasion Resistance
Basic Properties
• Chemical Changes
• Molecular Weight
Dehydration
• Oxidation State
• Morphological Changes
• Crystallinity or Phase Changes
Defects
THERMAL EMITTANCECORRECT TO HEMISPHERICAL
SOLAR ABSORPTANCE
SURFACE TEXTURE-SEM
SURFACE CHEMISTRYAUGERREFLECTANCE, IRESCA
226
Physical/Chemical Changes
• Outgassing
Average molecular weight distributions
Pyrolysis GC
T -
Examine Surface of Metals For Oxidation
Aluminum
Depth- XPS
• Chrome- Plating on trunnions
• Steel- bolts
227
Insulation Materials
Optical .... Surface properties
Thermal conductivity
Specific heat
Compressibility/resiliency
Wettability/contact ..... surface roughness, actual area
If PI requests and NASA approves, Boeing will conduct
measurements on PI hardware/specimens
Test equipment not available/planned for by PI
Lab to Lab comparison
Results_back to PI to publish; also included in
LDEF data base
228
Request to Pl's
• Schedule of availability of hardware/specimens
Commitment from each PI regarding whichspecimens/hardware will be made available for MSIGanalysis
This list is an expression of the interests of tile LDEF Special Investigation Groups (SIGs).
These groups were established by NASA to maximize the scientific return from the LDEF
experiments, in view of LDEF's extended space exposure. At ttiis time, the materials
noted above have merely been identified for consideration by the Project. The Principal
lnvestigators'(Pls) cooperation will be solicited in this extended research. Either the PIs
could provide samples for analysis to the SIGs, or the Pls could perform the additional
research with guidance provided by the SIGs,
229
MSIG CONTACT:
EXPERIMENT: STRUCTURE
MA IERIALS OF INI EHE51 I U MblG
DR. H. GARY PIPPIN
NASA
MATERIAL. DESCRIPTION
$13/LO, Disk Coatings
AI & SS, Disk plates and fastenersCr-Plated Steel, Trunion Pins
Z306, Thermal Control Paint
Cr-Plated Steel, Keel Pin
_ESTIONS
(206)393-3584
No_s
DATA BASE
By Experiment
By System
Quantitative Data From Measurements
"Lessons Learned" Text Summaries
Recommended Practices
Undesirable/Forbidden Practices
Relate To Space Environment
230
NASALONG DURATION EXPOSURE FACILITY
MSIG/MAPTIS DATA BASE
JOHN M. DAVIS
NASA - MARSHALL SPACE FLIGHT CENTERMEMBER, MSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTER
FEBRUARY 13 & 14, 1990
231
MATERIALS & PROCESSES TECHNICAL
INFORMATION SYSTEM
• MATERIALS AND PROCESSES TECHNICAL INFORMATION SYSTEM (MAPTIS)
i. General Information
2. Materials Properties Databasea. Metals Properties
b. Nonmetals Properties
3. Material Selection Handbook Database
a, Metals Selectionb. Nonmetals Selection
c. Many Other Selection Categories
4. Other Special Materials Databasesa. Standardsb. Foreign Alloy Cross Referencec. Materials Usage Agreements (MUA's)d, 'Where Used'
1. ,MSFC Shuttle Elements2. Spacelab
3. Hubble Space Telescope4. Space Station Freedom (future)
e. Manufacturer Codes (H4 ID's)f. Other Selected Databases
i. Atomic Oxygen2. Materials Test Data3. Materials Temperature usage
4. Long Duration Exposure Facility (LDEF)S. Many Others
MATERIALS&- PROCESSES TECHNICAL
INFORMATION SYSTEM
MAPTIS GENERAL INFORMATION
1. MAPTIS is a collection of databases giving informationabout materials and processes,
2. Databases are relational Qatabases written with theORACLE Database Management System.
3. MAPTIS is accessible from anywhere by user with an account•
4. MAPTIS is constantly changing - with updates and improvementsEx. New Graphics Package will be 'added within one'year.
5, New material information is added every day.
232
MATERIALS & PROCESSES TECHNICAL
INFORMATION SYSTEM
METALS PROPERTIES DATABASE
• Alloy Information- Density- Poisson Ratio
- Melting Range- Alternate Designation- UNS Designation
- Category
Composition Information- Elements- Average Percentage- Minimum/Maximum Composition
Specification Data- Alloy- Condition- Form- Material Code (MSFC
- Specification Number
Assigned Easy Reference)
Mechanical Properties
- Elongation- Tensile Strength- Bearing Strength- Bearing Yield- Compressive Strength
- Bend Radius
- Fatigue Strength- Hardness
- Hydrogen Embrittlement
General Comments on Properties- Corrosion Resistance
- Formability- Heat Treatment & Stress
- Machineability- Surface Treatment- Weldability
Relief by Plastic Stretching
Much More ..................... ' ......................
233
MATERIALS & PROCESSES TECHNICAL
INFORMATION SYSTEM
NONMETALS
Ident if icat ion
- Designation- Manufacturer- Color
- Description
Information
Chemical Classification- Composition- Category- Compound- Generic ID- Material Code- Process Method- Specifications (MIL Spec,
Component Parts- Designation- Description- Generic Type- Form
Mix Ratio
Information
PROPERTIES
.etc)
DATABASE
Cure Information- Cure Cycle- Temperature- Time
Material Properties- Use Temperature Range- Shelf Life- Compressive Strength- Shear Strength ,_- Viscosity
ETC .......................................
234
., •
MATERIALS & PROCESSES TECHNICAL
INFORMATION SYSTEM
MATERIAL SELECTION HANDBOOK DATABASE
Material Information- Material Code
- Designation- Composition- Cure
- Use Type- Specifications- Manufacturer
Test Results and Data- Corrosions
- Liquid Oxygen- Hydrazine- High Pressure Hydrogen- Low Pressure Hydrogen- Gasseous Oxygen- Nitrogen Tetraoxide- Flammability- Toxicity- TVS
ETC ..........................
MATERIALS & PROCESSES TECHNICAL INFOKMATION SYSTEM
MAPTIS MAIN MENU
i. Properties
2. Materials Selection
3. Standards
4. Foreign Alloy
5. Material Usage
6. Where Used
7. valve and Component
8. Manufacturer Codes
9. Resource Database
Handbook
Cross Reference
Agreement (MUA)
Enter choice:
235
r_o
H
0
H
_q
U _4
r,4
H
M UE_
O
O ""
•_ ,C ,-4
,4
o ; .311 I-tM _
U ,.1
,.1 _, H
_ _0_H _ U
(J
0
0 U
U
H 0
U_4
UI _,
H 14
b,
O
ou
M
_ ] H H Pt H
g _g
_U_lo o
_ _ ....
O_
i°,,° _
_ag
-|
I
I
I
I
oooI 000
236
mX
U[.t<m
.4
i4
m
i_u umH e"
O
4
I414
U_
EM_I4
Hi_
0 l_
oo M
0
I_ I_ Uo o
oo 14 i_
oo M
O
4E4
oF.
0
H0
01.)
O_
0O0
0
oo_o_• , , 0
oooo
oooooooooooo
_oo O0
_o
0000
oooo
oooo _
oooo 0oooooooo i__ IE
u _
;;;; o .
U
u
_ o°ooH • • M0
4
U _
rl
r4
u_
u_
r_0
r4I I.)
237
I
J
w
w
w
• M
• M
_ 0
H W
_ .
tJ
U M
_ ..0_
0_0 ._U_H
H_U_MUO
_0• _ _UL_ U
0
H
0 oU u
U
I.ILJ
H
_0
0
u
M
0H
,4
0H
P.
U
F,
0 _
TI
0 0
"_ _ _I _ _ _ "
I _ l..l
._ _ Ho _, _I _ "" _
ILl I,.I ILl
14
O
U_4G*O
U_
C_t_
_v
H
F,
_UOOU
_a
O
14
B
B H
_n
o
!II
I!
I-I
0u
u
BI,IH
o
_H
a_
F_
0
tv
U
I,i
0
0_4
u
238ORIGINAL PAGE ISOF POOR QUALITY
o
t-o
uH
_ I _
H
WU_
H
=
oooo
o_o
?,
el
H
z o H _
ORIG|NAL PAGE IS
OF pOOR QUALITY
!
,<
I
r_
i,w
Z
! U
; o
_ Oi
I.I M
r_ I/I H .4
0
_ oO HU
.1.4
H
_ U
U 0
_ n
. _.P,_ .
oU
1-4U
H
g
(J
o_
_; I¢1
• ,¢ ,¢
_e I
U
I_ _ _ _ _I__._
239
, i
_ENERAL DATA FO_ FE 304L
DENSITY _OZ$$O_ MZLTING RANGE
ALLOY ALLO_ T_ D£NSZT¥ UNIT RATIO DEG-T
ALT-DESZ_NAT_ON U_S-D_SIG_ATZO_ CATEGOR_
LOW _RBQN 18_8S $T_NL_$_ $_S _ _
_.OMPOSZTIO_ DATA FOR ALLOY: FE 304L
ELEMENT NOMPCT MAXPCT MINP=T COH_
C .05 10
C£ 19 21 18 10
CU .5 10
P_ 2 1 10
MC .5 10
N: Z0 11 8 i0
P .04 10
S .03 I0
S! 1.5 .75 i0
C .03 8D
CR 19 21 18 80
M_ 1.5 80
N_ 10 11 8 80
? .04 80
$ .04 80
Sl 2 80
C .08 81
CR 19 21 18 81
MN 1.5 81
NZ I0 11 8 8L
P .04 81
S .04 81
SZ 2 81
COMPOSITION PROPERTY COPLME_TS FOR: FE 304_.. CONDITIOn,: FORM:
COPt_ENTNU._BER COMMENTS
10 AN5 5370 SPECIFIED 1.0 PERCENT HA.YIMUF. ONLI" FO]_ SI. AMS 5371 GIVES 0.0_ PERCEh'T FOR S.
B0 CASTI}_G CONPOSIT_ON TYPE CF3.
81 CASTING CONPOSITION TYPE CFB.
240
FE 304L A BARFE 304L A NOT SPECIFIED
rE 304L A PLATE
FI 304L A PLATE
FE 304L A SHEET
FE 304L A SHEET
PI 304L A STRIP
FE 304L A STRIP
FE 304L AI SHEET
FE 304L AI SHEET
FE 304L A2 SHEET
FE 304L A2 SHEET
FE 304L A3 SHEET
rE 304L A3 SHEET
PE 304L A4 SHEET
FE 304L A4 SHEET
PE 304L CR SHEET
PE 304L NULL FOHGZNG
PE 304L _LL FORGING
FE 304L NULL NOT SPECIFIED
FE 304L _ULL TUBE
FE 304L NULL TUBE
SPECIFICATION NUMBER
......................... . .....................
_S 5_4_
QQ-S-763
AM$ SSIIA
MIL-S-404_
AMS 5511A
NIL-S-4043
AM$ SSIIA
NIL-S-4043
JU4S 5511A
HZL-S-4043
AJ4S 5511A
MIL-S-4043
AJ4S 5511A
MZ_-S-404]
AMS 5511A
M_L-S-4043
_s 564_
QQ-S-_63
A.XS 5647
QQ-S-763
"*** PROPERTY VALUES FOR ALL THE FORMS AND CONDITIONS WERE ONLY THOSE THAT WERE AVAILABLE
IN THE RECOMMENDED REFERENCES.
"* THE CONDITION CODES FOR 5TEELS. W_EN NOT AVAILABLE, WERE CHEATED SOLELY FOB USE IN THIS DATABASE.
ABBREVIATIONS THAT MAY BE USED IN THE FOLLOWING TABLES
o
AVG
AX
CRF
DRW_
E/D
FIO
GMS
GPS
HLA, HLB ,
HV
HYDRL
IACS
KSQTI
LV
MAX
Hit;
MPCH
MPY
NDA
NON
SEAMLSS
SMLSS
STO
TOLER
TYP
etc. . .
AVERAGE
AZIAL
CIRCUMFEREr_TIAL
DRAWN
RATIO OF EDGE DISTAr;CE TO IICLE DIAMETEF
FOr INFORMATION ONLY
GRAMS
GRAMS PEP SOUARE INCH
FOP EACH ALLOY. CONDITIOn: A}ID FOR}_, THE VALUE GIVET" IS
AN AVERAGE OF AT LEAST TWO TESTS OF: A UNIQUE REAl ANT'
LOG. DESIGNATIONS ARC ARBITRARILY ASSIGNED BY TIIIS
DATABASE SOLELY FOR COMPARISOr: PURPOSES
DENOTES TIlE HIGHEST VALUE FOP, TIIE CROSY SECTIOI: _P
THTCKr_ESS TIIAT GIVE.', TIIE CORRESPOI]DINJ FPOF_P.T'_" ".'AI._+E.
HYDRAULIC
INTERr:ATIOI:AL A_I_CALED COPtrEF STAr:DARt'
KSI SQUARE ROOT OF INCH
DENOTES THE LOWEST VALUE FOP TIIE eROS- _ SECTIOI: '_P
THICK_ESS TIIAT GIVE_ THE CORRESPOrZDING PPOI'E_TT VALUE.
MAXIMUH
MINIMUM
MILLIGRAMS/SQ.CM/HOU_
MILS PEP YEAR
NO DATA AVAILABLE
T;oMIr_AL
SEAMLESS
SEAMLESS
SINGLE TEST THICKNESS ONLY"
TOLERANCE
AVERAGE FOP ALL SIZES, TIIICKTIESSES. FORMS AN[ MET}lOt
OF MANUFACTURE.
4b
ORIGINAL PAGE IS
OF POOR QUALITy
241
AT LEAST 99 PERCENT OF THE POPULATION O? VALUES I_ EXPECTED TO EQUAL O_ EXCEED THE "A" BASIS
MECHANICAL PROPERTY ALLOWABLE, W!TR A CONFIDENCE O? 95 PERCENT.
AT LEAST 9C PERCENT OF THE POPULATION OF VALUES IS EXPECTED TO EQUAL OR EXCEED THE "B" BASIS
MECHANICAL PROPERTY ALLOWABLE, WITH A CONFIDENCE OF 95 PERCENT.
THIS TYPICAL PROPERTY VALUE IS AN AVERAGE VALUE, NO STATISTICAL ASSURANCE BEING ASSOCIATED WITR IT.
HOWEVER, THESE TYPICAL PROPERTIES HAVE BEEN BASED ON CONSISTENT RESULTS OF TESTS O_ THREE OR MORE
LOTS OF MATERIAL AND ARE USEFUL IN
DESIGN, SINCE THERE ARE WELL KNOW_ METHODS FO_ REDUCING THEN TO MINIMUM VALUES. THE MANNER IN WHICB
THESE PROPERTY VALUES ARE TO BE USED WIL_ BE SPECIFIED II_ THE
DETAILED STRUCTURAL REQUIREMENTS OY THE PROCURING OR CERTIFICATION AGENCY AND ARE THUS BEYOND THE
SCOPE OF THIS DATABASE.
THIS TYPICAL PROPERTY VALUE IS AN AVERAGE VALUE, NC STATISTICAL ASSURANCE BEING ASSOCIATED WITH IT.
HOWEVER, THESE TYPICAL PROPERTIES HAVE BEEN BASED ON CONSISTENT RESULTS OF TESTS ON THREE OR MORE
LOTS OF MATERIAL AND ARE USEFUL IN DESIGN.
FOR INFORMATION ONLY.
THE S BASIS MECHANICAL PROPERTY ALLOWABLE IS THE MINIMUM VALUE SPECIFIED BY THE APPROPRIATE FEDERAL,
MILITARY, SAN AEROSPACE OR ASTK SPECIFICATION FOR THE MATERIAL. THE STATISTICAL ASSURANCE
ASSOCIATED WITH THIS VALUE I$ NOT KNOWN.
REFERENCES THAT MAY BE USED IN THE FOLLOWING TABLES
"REF BOOK
I AEROSPACE STRUCTURAL METALS HANDBOOK
2 MIL HANDBOOK 5
3 AMERICAN SOCIETY FOR METALS, METALS HDBK, 9T_ EDT. VOL.
5 AMERICAN SOCIETY FOR METALS, METAL_ HDBK, 9TH EDT. VOL.
6 STRUCTURAL ALLOY5 HANDBOOK
I
3
242
0 0 0000 0
o
r,{
,¢ ._;
• ¢ ,¢
0 0
o o
oo
o 0
HHHH
O O
o _ o o oooo
H H 0
_ I' _ _ = _-_, --_ _' ,,
0 0 0 0 0
• 4 .4 ,_
CI
G [_
o
oo o o o o
, o • • °
_ o _
243
244
p;)>
u
U
14
_4
HHU
_ H
Ml" U _I_1 N (l
_ i" H
WHO_0 U_UlH
H U_CJ
Ou
MHO
O'_
O
OH• q _ N
,¢
¢< O:-114 I_ ,¢
0
,:I
PlII
0 0 ou _
U_
°¢ 4
m _
oo
• g
o
o
¢q
Ou
¢¢
uHF_
O
o
0LJ
Ip;
H _,',') U
,I
|,| -
!4 [-_ M
0
I,|
0
NIHO
Mid
4_1t_
UH ;._ (J
tJH _lJ
0 ¢r_ H (J
, 04H
o I_, ,J
C_ OH
0H "_
O O,-]u P_ ,(
M
O _H _
O
r!
0
):
u 0H _1_
_m
,--Io
U
_4
,¢p_
0H
O
,3,po
04O
0
r_
0U
Ih
1.1
i-4
_4
-mo
O
_u
0
Ou
°I
tJI-4
O
.(
o
Ob.
0
OUhi
uH
t_
O
o
O O
U
!p__p4
H_U
E4
_I I./I --f_ H
O I
!
t_> E_tJ
WE_==
O
NM
N "'_O _
U
_ H
M
U _H _ El
o _HU O
I-4
O la, ,_1
r, OH U
0H :_m
O O_ r'-
\ !
H _ H
0 14 O
O ! OU _ u
,4
;iO
D0
OU
ul
,-1
H
O
o
0
oL_
0U
*¢(J
U
o
.I
0
r_o
P_O
ul
u
O
0u
H_ U
,1H
U_:I
GI tr_
61H¢,1 P_U_
0
0P_
_w
_H014 _ "rt-
O P,,
H J34 _
u _:_o_l_t4
u
_4
0 (/) H |J
r_l _ 12_ lI_ I-, H
• . _
_ O41
0 H
0
O _
O
\
O I.-H _-_
O M
o _
rl
_4
0:4
uOH_
u_m
o
o
U
0H
0m_
ou
f_
o
0
r_
0Is.
OU
i,1,-.1
O
_4
O
o
0U
,qU
,4
U
O
.I
14
0
L_
:D0
Ou
u
O
245
246
H
_ tJH
,<
0H
0U
0
0
0
0tJ
Pl
E,
' b-I
{4
ul
rl
0
0I)
(-1 _,p_ tJ
_J
o 0oo o 00o
.( .( ._ ,¢ ,¢ ,_ ,¢ .¢
_ _ _._.(,_
o ooo o ooo
o ooo o ooo
u u u tp [) t_ t_ u
•( ,( ,( o( ,(; .( ._ ,¢
o_r_ r- o_rl
_'_ .A ,_._
,¢ <.¢< .( ,(,(_
o ooo o ooo
, o _:_Ul _ I_I HU)_
E_
u_
,]
o_
o
o
re0
H
t_
NASALONG DURATION EXPOSURE FACILITY
MATERIALS SPECIMENPRESERVATION AND
CONTAMINATION AVOIDANCE
RUSSELL CRUTCHER
BOEING AEROSPACE AND ELECTRONICS CO.MSIG SUPPORT
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
i [ I _
249
CONTAMINATION ANALYSIS
CONTAMINATION CONTROL, AND
MATERIALS SPECIMEN HANDLING
WHY
- Ground contamination control effects Orbital performance
- Orbit generated cross contamination effects Orbital performance
250t
QUESTIONS ANSWERED: WHAT ARE-
Effects of Ground Co_t_aminants
Effectiveness of Ground Cleaning Activities
Molecular Effects of Non-Approved Materials
Contaminating Effects of Atomic Oxygen
Cleaning Effects of Atomic Oxygen
Contaminating Effects of Micrometeorites and Debris
ENVIRONMENTS
Prelaunch and Launch
Orbital
Re-entry and Edwards Operations
Ferry Flight Operations
Orbital Processing Facility
O&C Operations ,.
SAEF-II
P.I. Laboratory Clean Room
251
OTHER QUESTIONS: WHERE ARE-
o
Effects of Reentry on Payload
Effects of Ferry Flight on Payload
Effects of Terrestrial Environment upon Orbit
Activated Materials
EXOLUTION
Recovering prelaunch through Orbital data
Identifying recovery generated debris
Identifying recovery generated artifacts
Identifying recent terrestrial debris
252
TOOLS
Tapelift
Witness plates
Airborne particle counts
Volumetric air samples
Temperature and relative humidity data
Swabs (NVR)
Direct surface IR for NVR analysis
Optical Values
Photographic Documentation
MATERIALS CONTAMINATION CONTROL
SOURCE APPORTIONMENT
Reference samples
Analytical characterization
Assemblage analysis
253
CONTAMINANT ANALYSIS
REFERENCE SAMPLES
Photographs of trays
Fines from known environments
u
m
Edwards
Debris from Shuttle Bay
Kennedy Space Center
Tapelifts from known environments
Plasticizers from tray materials
Films from known sources
Identification tables for knowns
254
TAPE LIFT SAMPLES- AI,L SLIDES IN KIT 01
KIT-01 SLIDE-01
KIT-01 SLIDE-02
KIT-01 SLIDE-03
KIT-01 SLIDE-04
KIT-01 SLIDE-05
KIT-01 SLIDE-06
KIT-01 SLIDE-07
KIT-01 SLIDE-08
KIT-02 SLIDE-09
KIT-02 SLIDE-01
KIT-02 SLIDE-08
KIT-02 SLIDE-02
BLANKET ABOVE PURGE DUCT INITIAL SAMPLING
STARBOARD.
BLANKET ABOVE PURGE DUCT INITIAL S_-IPLING
PORT.
BLANKET BELOW PURGE DUCT INITIAL SAMPLING
PORT _
SLIDE-OI RESAMPLING AFTER DRYDEN PLB OPERATIONS
SLIDE-02 RESAMPLING AFTER DRYDEN PLB OPERATIONS
SLIDE-03 RESAMPLING AFTER DRYDEN PLB OPERATIONS
BLANKET STARBOARD SIDE NEAR ADAPTER PLATE
INITIAL SAMPLING PRE-FERRY FLIGHT _'^
STARBOARD BLANKET CENTRAL SQUARE 0_E AWAY FRO_
PSA LOC_R _NITIAL _AMPL_N_ PR_-F_Y FLIGHT
PORT SIDE BLANKET NEAR OPTICAL TARGET INITIAL
SAMPLING PRE-FERRY FLIGHT
SLIDE-08 RESAMPLE AFTER LIFTING OPS AT OPF
SLIDE-09 RESAMPLE AFTER LIFTING OPS AT OPF
SAHPLE NEAR AFT PSA BLANKET AFTER LIFTING OPS AT
OPF ^_^
*SAMPLE INVALID- TOUCHED PURGE DUCT ON WAY UP.
^^'NOT RESAMPLED
ALL DRYDEN OPERATION SAMPLES ARE ON XO 576 BULKHEAD
ALL PRE AND POST FERRY OPERATIONS WERE PERFORMED ON BAY ONE
SURFACES.
255
tDEF
TAPELIFT KIT #9
2-1-90
Tapelifts taken prior to LDEF arrival in SAEF II
SLIDE # AREA SAMPLE
8
9
10
11
12
13
14
15
16
17
18
19
2O
21
Laminar flow bence work surface
Tile floor, middle area
Concrete floor, middle area
Floor of 8' platform
IEquipment locker, W wall, S. room
Tray hoist
Stairs of 12' slamd
Tone alarm "push to-talk" mike boxes, E wall
Krypton vent pipe, S. walt
LN2 tanks for GeL i detectors
Floor tile in front of observation window, E. wall
Video camera and stand near air shower
Forklift, battery operated
Floor in front of airlock door, N. wall
Top of blue box, W watt, 12" X 18" X 36" approx
Top of ladder platform, W. wall
Top of check-o_Jl unit, W. wall
Floor in front of radiation delectors (CeLl)
Floor, 10' in front of observation window
Floor, W. side, LDEF outline
Sole of clean room shoe aller SAEF II tapelifts
SLIDE #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
LDEF
TAPELIFT KIT #10
2-9-90
Tapelifts taken in SAEF II DURING IMAX FILMING
AREA SAMPLE
Floor, just inside airlock door, W. wall
Floor, E. wall near observation window
Floor, W. area near air return
LATS, between LDEF rows D & E, E. side
LATS, LDEF row D, W. side
Floor, edge of LATS, W. side
Laminar flow bench work surface (bench has been turned off)
M&D work station, table top, at door, w. wall
Concrete floor, E. wall, near phone
Sole of Tom See's clean room shoe, during SAEF II work
Work table top, W. wall, near emergency exit
Work table, IMAX camera stuff, NW. cornerVideo camera and stand near air shower
Fiber on LDEF equipment box #175B, near air shower
Floor of 8' platform by LDEF boxes, NW. corner
256
CONTAMINANT ANALYSIS
ANALYSIS
• Begins with sample selection
Synergism - Key to cost effectiveness
Samples are cheaper than analysis
MATERIALS CONTAMINATION CONTROL
ANALYTICAL CHARACTERIZATION
Optical crystallographic data
ColorCrystal typeRefractive indices (real and estimated imaginary)"Texture"
Morphological data
- Shape type- Size
• Elemental datai "
257
CONTAMINANT ANALYSIS (Proposed)
IR image mapping of LDEF
Selected "Swab" samples -IR and other
Selected interface film thickness measurements
• Direct surface IR - ATR
• Selected control areas
CONTAMINANT ANALYSIS
• LDEF Preflight Photos
• Astronauts Flight Photos
KSC Team
- Macro Documentary- Surface Texture Study- Debris Distribution Study- "Shadow" Study- Discoloration Study
• JSC Team
- MicrovideoMacrovideo
• SDIO Optical Surfaces and Contaminants Study
• IMAX Documentary
• Thermal (IR) Video
258
IP
CONTAMINATE SOURCEAPPORTIONMENT
APPROACH
Witness Samples v
Tape Lifts ._
Source Samples
CENTRAL
FILE
AND
CONTAMINANT
BANK
.,_---_Light Microscopy
"--==_Electron Microscopy
"----_IR Analysis
.,_--_Other
CONTAMINATE SOURCE APPORTIONMENT
Concept
Terrestrial with Orbital Artifacts
Terrestrial without Artifacts
Extraterrestrial Impact and Surface Collection
259
_t ' ' "
CONTAMINATION CONTROL
Minimize Dilution
Minimize Cost
Minimize Loss of Data
MATERIALS CONTAMINATION CONTROL
ISSUES
Avoidance
Monitoring
Source apportionment
Criteria for relief
! • ! • =
260
MATERIALS CONTAMINATION CONTROL
AVOIDANCE
• Collection protocol
• Specimen isolation
• Specimen contamination monitoring
• Specimen inventory control
• People Control
MATERIALS CONTAMINATION CONTROL
MONITORING
Environments
• Surfaces
• Kits to PIs
261
CONTAMINATION CONTROL
At Kennedy Space Center
1. Witness Plates
2. Selected Area Tape Lifts
3. Environmental Monitoring
4. Limited Exposure (Cover)
5. Packaging to Ship
6. Electrostatics
CONTAMINATION CONTROL
At Boeing
1. Clean Room Preparation of SamplesClass 100,000 to Class 10 available
2. Clear View or Close-up Video to Outside
3. Intercom between Clean Room and Outside
4. Sample Collection and Preliminary Analysis Station
262
CONTAMINATION CONTROL
At P.I. Laboratories
1. Witness Plates
2. Selected Area Tape Lifts
MATERIALS CONTAMINATION CONTROL
Environments
Controlled
- Records available for facility
- Exposure log for hardware (time out of container)
- Surface samples (tapelifts)
Uncontrolled
- Exposure log for hardware (time out of container)
- Surface samples (tapelifts)
263
CONTAMINATION CONTROL
SURFACES
Tapelifts
- Samples collected regularly
- Samples processed as required
-, Samples archived with hardware until processed
NVR Witness Plate or Surface
- Flushed or wiped at weekly intervals or longer
MATERIALS CONTAMINATION CONTROL
KITS TO PIs
• Low cost
. Glass slides- 3 M magic tape- Acetone. Beaker- Mountant- Storage box
• Small storage volume
7" x 10" x 1.1/4" per 100 samples
• Simple procedure
Apply tape and liftSoak in acetoneMount in medium
• Available for detailed analysis of single particles
264
CONTAMINATION CONTROL
• Surface Analysis Complete
• Remaining Tests for Bulk Properties
ISSUES
• Tray handling and specimen isolation
• Documentation of precise origin
• Packaging
• Sample control
• Short term storage
• Archival preservation of samples
265
=MATERIALS SPECIMEN CONTROL
TRAY HANDLING
• Speclad cart for tray
• Holding fixtures for cover, etc.
• Always two persons
• Removed from container in clean room
SPECIMEN ISOLATION
• Class 10,000 clean room orbetter
• Two persons, one for documentation
• Specimens labelled and packaged inclean room
MATERIALS SPECIMEN CONTROL
DOCUMENTATION OF ORIGIN
Tray Identifier
Bay A-F
Row J-12
End G-H by nearest vertical row, horizontal row
Specimen Identifier
Level I, II, III, IV, V, etc.
Position 12-36 (short axis from bottom) - (long axis from left) (in inches)
266
MATERIALS SPECIMEN CONTROL
PACKAGING
• Container selection
• Prelabelled containers
- At KSC
- To PIs
• Contingency containers
• Tapelifts
• Vacuum collection
MATERIALS SPECIMEN CONTROL
CONTAINER SELECTION
• Bags (least expensive)
• Boxes (large or heavy object support)
• Vials (small delicate object support)
ACCESSORIES
Styrofoam cushions
Dry nitrogen purge
Exterior supports
267
MATERIALS SPECIMEN CONTROL
SAMPLE CONTROL
Single storage facility (temperature controlled)
Single custodian
Log-in, log-out procedure
Indexed file for all samples - hard copy and computer history
268
TRAY |, _:
LDEF _pECIMEN BOEING ENTRY LOG
EXPERIMENT: REFERENCES: PROCE_mE #:
ITS# SAMpI_ ID. OR DESCR!PrlCN P_X_o _C°
BY:
_Name Organization Laboratory Phone |
_a%TE: TIME_ DURATIC_ OF _ EXPOSURE: SIGNATURE:
RECEIVe) BY:
Name Signature Date Time
269
L F_)EI---- ._C]l--_Ei(]] ]. I-'IE[I",,I l-"_E|[_l.,J|:_,c3+l |": (1)F_ I+1
TflnY t: .......... HODt.fl.£:........... [IPERIHEHI: .......... RfFERENC£G:............. PROCEDUREl: ............
OnTEANOTIHE NE£OED!........................................................
IIEH l: GAHPLE10. OR OEGCRIPTION
................................................................................................................................................ +-
Requestor UPOn, HIS Phone I Date lime
Project Approval IPrint) Signature Oate Time
Released By (Priori Signature Date Time
Received Dy (Print} Signature Date rise
E_ENTl
......................
..........................
I
DATE DESCRIPTIONOIr ACTIVITY--TIRE OF EIPOSLIflE IHiTlnL5
......................................................... +.....................................................................
:_eturneJ By (Print) Gignature Date Time
Received Dy tFrint) G(q_ature Date lime
ONECOPYUITH SPECIHEHS OH£COPYIN TRAYFILE ONECOPYIN 'OUT FIL['
270
L. It)F-F- ,-c_F'E!ir_:; ill I_'1_'_'iiI'.,I IS) ]E _1-:'(i_)_ .El 1 [ (_)1",1 I":Ci)r_'l'_l
TRAY|: .......... NODULE:........... EXPERlflENT:.......... REFERENCES: PROCEDUREI'.........................
Requestor Organizationlngency PhoneI
DELIVERYADDRESS:
|ISPOSITION:
....................... .--. .... 6 ..................................................................................
DA|EANDTIMENEEDED:........................................................
llEM II SAMPLEII). ORDES£RIPI'ION
................... | .................................................................................................................................................................................................
................... c ............................................................................................................................................................. ...........................................................
............. | ......................................................................................................................................................................................................................
.................... | ........................................................................................................................................................................................................................
............... | ................................................................................................................................................................................................
Project Approval (Print) Signature Date Time
Released By (Printl Signature Date l,ine
271
MATERIALS SPECIMEN CONTROL
SHORT TERM STORAGE
• Samples bagged to preserve condition
• Stored in single dedicated room or locker
• Stored in controlled environment 72 ° _+7 °
• Single custodial responsibility
CONTAMINANT ANALYSIS
DATA TO BE PROVIDED
Recovery to deintegration background
Update reports
Final report: Prelaunch to Deintegration
CONTAMINANT ANALYSIS
CURRENTLY NOT FUNDED
•"- Detailed NVR _analysis
272
NASALONG DURATION EXPOSURE FACILITY
STORAGE AND ARCHIVAL OFEXTRATERRESTRIAL MATERIAL
MICHAEL E. ZOLENSKY
NASA - JOHNSON SPACE CENTERMEMBER, M&DSIG
LDEFMATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERFEBRUARY 13 & 14, 1990
273
PLANETARY MATERIALS CURATION
RESPONSIBILITY: THREE COLLECTIONS PLUS
LUNAR - APOLLO & LUNA
ANTARCTIC METEORITES
COSMIC DUST PARTICLES
RETURNED SPACECRAFT PARTS
PURPOSE:
PRESERVE & PROTECT SAMPLES
CHARACTERIZE SAMPLES - CLASSIFY, DOCUMENT, PUBLICIZE
PROVIDE APPROPRIATE SAMPLES FOR SCIENTIFIC RESEARCH
PROVIDE SUPPORT FOR COMPLEX SAMPLING & CONSORTIA STUDIES
PROVIDE MATERIAL & INFORMATION FOR PUBLIC DISPLAY & EDUCATION
SCOPE: LUNAR79,200SAMPLES& SUBSAMPLES11,000PETROGRAPHICTHIN SECTIONSCURRENTLYSTUDIEDIN 48 USAND 20 FOREIGNLABORATORIESABOUT70 REQUESTS& 800SAMPLEALLOCATIONSPERYEARRESPONSIBILITYFOR SAMPLESRETURNEDAFTERSTUDYLUNARSAMPLENEWSLETTERMAILEDTO 1100RECIPIENTS
SCOPE: METEORITES
NEW METEORITES RECEIVED & CHARACTERIZED YEARLY (670 IN 89)21,800 SAMPLES & SUBSAMPLES
4,060 PETROGRAPHIC THIN SECTIONSSTUDIED IN 133 US AND 66 FOREIGN LABORATORIESABOUT 80 REQUESTS AND 700 SAMPLE ALLOCATIONS PER YEARANTARCTIC METEORITE NEWSLETTER MAILED TO 500 RECIPIENTS
SCOPE: COSMIC DUST
t37 COLLECTION SURFACES; 1350 CHARACTERIZED PARTICLESCURRENTLY STUDIED IN 11 US & 9 FOREIGN LABORATORIES
76 REQUESTS SINCE 1982LARGE AREA COLLECTORS NOW IN USEPERFORM SOLAR MAX & LDEF PARTICLE CHARACTERIZATION
COSMIC DUST CATALOGS & NEWSLETTERS MAILED TO 300 RECIPIENTS
SCOPE: RETURNED SPACECRAFT PARTS
SOLAR MAX PARTS (DUST ON THERMAL BLANKETS & LOUVERS)SOLAR MAX DUST SAMPLES DISTRIBUTED TO 6 INVESTIGATORS
LDEF EXPERIMENTS (PROCESSING LABORATORY IS READY)
274
SECTION V*
PROCEDURES FOR MEASURING IMPACT FEATURES
This section outlines the types of information and measurements, and the procedures fi_r their acquisition for
features of interest to the M&D SIG. Information acquired following the procedures outlined below will
permit such data to be of significan! use and compatible with similar data generated by the M&D SIG
laboratories.
1.0 OPTICAL CHARACTERIZATION
1.1 Minimum Characterization -- Minimum characterization consists of acquiring a good quality color
photograph of the feature(s) of interest at the earliest possible time.
1.2 Detailed Characterization -. Detailed
characterization consists Of acquiring
various measurement on the FIGURE 4
feature(s) of interest, in addition to
the color photography outlined in
Paragraph 1.1. Feature measurement
standards are available from the
M&D SIG. Contact Micha.el E.
Zoleusky [(713) 483-5128] or Thomas
H. See [(713) 483-5027] to request
temporary loan of impact-feature
standards.
1.2.1 Diameter -. Acquire the diameter
measurement at the original
target/material surface (see
Figure 4). Measure and report
the major and minor axes of
elliptical features.
1.2.2 Depth .- Make the depth measurement from the original target/material surface (see Figure 4) to
the bottom (lowest point) of the feature. When measuring the depth of an elliptical feature
report the location of the deepest point w/thin the feature; such data could then be utilized to
provide directionality of the impactor. If a rim is present, provide a measurement of its height (if
possible) from the original targetfmaterial surface (see Figure 4).
1.2.3 Halos -- Characterize halos by utilizing oblique lighting. Note halo type (e.g., dark, bright, spailed,
etc.) and width. If the feature is non-circular, characterize its variability. A color photograph of
such features should be made when ever possible.
1.2.4 Impactor Residue -- Describe impactor residues in detail. Include color, location (e.g., whether
residue is w/thin or around the impact feature, or both), size of individual grains or particles, as
well as any unusual features of the material (e.g., dendritic pattern, vesicularity, etc.).
A0
"",...
WIDTH
*From the "Meteroid & Debris Special Investigation Group Operations Handbook," 1990.
275
2.0 CHEMICAL CHARACTERIZATION
The material of interest for chemical charactcriTation is the impactor or impactor residues. Such materials
will generally be molten in appearance and found adhering to the target/substrate. Contamination particles,
on the other hand, generally should appear as discrete, loosely adhering particles or grains predominantly
located outside an impact feature, although they may be found inside aswell.
An issue of extreme importance to the M&D SIG is the amount, type, and composition of any post-recovery
contaminants that may have come into contact with, or may now reside on the LDEF spacecraft and/or
experiment trays due to recovery, ferrying operations associated with the flight of STS-32, and/or processing of
the orbiter or LDEF spacecraft. Thus, the witness plates that fly on the STS-32 mission, those placed in the
payload bay during the ferrying operation from Edwards AFB to KSC, those exposed in the Vertical
Processing Facility (VPF) and the LDEF Assembly & Transportation System (LATS), as well as any other
witness plates that may be utilized during the LDEF processing and deintegration activities will contain vital
information to which the M&D SIG must hove access. Ideally, the M&D SIG would like to analyze all or a
portion ofeach witness plate. At an absolute minimum, the M&D SIG must obtain the results of the analyses
performed on the various witness plates.
2.1 Minimum Characterization .- A minimum chemical characterization consists of qualitative analysis of
the impactor residue and/or grains. Report the actual chemical constituents rather than simply
referring to the materials as either "meteoritic" or "man-made debris'.
2.2 Detailed Characterization -- Detailedchemical characterization consists of quantitative analysis of the
impactor residue and/or grains. Extremely long counts may be necessary for small particles (e.g.,
several thousand seconds at 20 kV) in order to minimize interference from the target/substrate
materials. If possible, obtain a set of analytical standards from the M&D SIG by contacting Michael
E. Zolensky [(713) 483-5128] or Thomas H. See [(713) 483-5027] to request temporary acquisition of
these analytical standards.
2.2.1 Procedures -- Provide a detailed description of the analytical procedures employed in obtaining the
analyses (e.g., analytical instrument, count times, accelerating voltage, beam size, standards used
with an analysis of each, detector crystals, etc.).
2.2.2 Composition -- Report the weighted average of the composition of the impactor residue(s).
2.2.3 Contamination -- If recognizable particles of contamination are present, report their composition.
Should a PI or institution decide to loan or donate any materials to the M&D SIG, or should questions arise
as to techniques and/or procedures listed in this document, please contact the appropriate personnel at the
Johnson Space Center in Houston, Texas, or the LDEF Project Office in Hampton, Virginia. A list of M&D
SIG contacts can be found in Section IX.
276
SECTION VII*
LDEF DATABASE
1.0 SAMPLE NUMBERING
The examination of the LDEF spacecraft for features of interest to the M&D SIG will consist of two phases.
First, a preliminary examination will take place at KSC while the spacecraft is still intact and during the
deintegration activities where features of about I mm in size or larger will be identified and documented.
During the second phase, individual pieces will be transferred to JSC for microscopic examination in the
Facility for the Optical Inspection of Large Surfaces (FOILS). During the secondary examination phase,
features of much smaller size may be identified. For some features, the preliminary examination may be the
only one possible.
In etther ease, the locations of the features on LDEF must be documented carefully so that their frequency,
size, and distribution may be correlated with the orientation of the spacecraft, its direction of travel, and the
type of surface on which the feature occurs.
The LDEF spacecraft is a 14-
faced (12 sides and two
ends), open-grid structure on
which a series of rectangular
trays used for mounting
experiment hardware are
attached. All parts of the
spacecraft, including
experiment trays, framework,
and hardware will be
examined for the presence of
features of interest. A
numbering scheme for the
satellite grid has been
established, in which
components are identified
using "Bay" and "Row"
numbers (Figure 6). The
geometry of the two end
pieces is more complex than
FIGURE 6
BAYS
A-H
ROWS
01 - 25
BIXIll
I.P.ADING
A__A_S_B_C v s T
g_in
!N
u
N
ol
{is
u
•,Xsl 'NA,, '1zJ/,,
i_Y O aA¥ R
that of the 1'2 sides, and the existing numbering scheme provfites for identifying only the grids to which
experiment trays are affixed. The current scheme may be expanded to include the end grids by assigning row
numbers in a clockwise (Earth-facing end) or counter-clockwise (space-facing end) direction.
*From the "Meteroid & Debris Special Investigation Group Operations Handbook," 1990.
277
FIGURE 7
HXPHRIMHNT-TRAY
LOCATION
BAY C, ROW 04
PRIMARY SURFACES
C04E00
FEATURE_• C04E00,1 - C04E00,8
CORES
LD-1
A
01
O2
O3
04
i07
10
B C D B F
The examination and disassemblyof LDEF will yield three different types of objects which need to be tracked
and described.
I.l Primary Surfaces Primary surfaces consist of all space-exposed hardware from the LDEF spacecraft.
They may represent an entire experiment tray, a piece of hardware (e.g., screw, clamp, etc.), or a piece
of the spacecraft's structure (e.g., frame, support beam, etc.).
The primary-surface ID will consist of four parts. The first two parts indicate the Bay (A-H) and Row
(01-25) of the LDEF grid from which the primary surface was removed (see Figures 6 and 7), while
the third part represents the spacecraft component. The following codes are proposed for the
different components from the LDEF spacecraft:
E Experiment Tray
B Support Beam
F - Frame
C Clamp
S - Screw
J Joint
278
G - Grapple Pin
T - TrunionPin
The fourth part of the primary-surface number represents the individual component number and may
be a sequentially assigned number, or it may delineate a specific orientation, as will be the case for the
experiment-tray clamps (see below).
In the case that an entire experiment tray is designated to be a primary surface, the component
number "00"will be assigned to it (e.g., CD4E00). Any pieces of hardware constituting the framework
of the spacecraft will be assigned the bay and row numbers of the tray adjacent to them (e.g., C04F00).
If two trays share the same pieces of framework, as will be the case in most instances, the hardware to
the left and bottom of the tray will be assigned the corresponding bay and row numbers.
All experiment trays are mounted to the LDEF spacecraft by clamps. A series of eight clamps affix
the experiment trays on the 12 sides of LDEF, while experiments occupying the two ends are held in
place by 12 clamps (Figure 8). In order to document an individual clamp's location around an
experiment tray, the numbering scheme illustrated in Figure 8 will be utilized. Thus, if the M&D SIG
were to obtain the clamp that occupies position 6 (Figure 8) on the experiment tray from C04 (Figure
7), that clamp would receive primary-surface number C04C06. Should clamps be acquired from
configurations other than those depicted in Figure 8, a drawing will be made of the clamp
configuration in order to illustrate the clamp's relationship with the experiment tray.
1.2 Features -- A feature is a hole, crater, or
other type of impact structure which FIGURE 8is identified on a primary surface. As
EXPERIMENT-TRAYfeatures are identified, they are
NUMBERING SCHEMEassigned a specific number. The
numbering sequence for features _BTRAYS _TRAYS
begins with 1 for each primary am..........m .......... t 2 3
surface. The primary-surface number i
plus the specific number constitute |L 24 tt_the feature number (e.g., C04E00,8; .........am .......... 10 ..u--u. aw-,
Figure7). "/ t s 9 | "/A01 - F12 G01 - H25
1.3 Cores -- A core is a piece which has been Bxy_ow LdkY/_OW
removed from a primary surface on
which one or more features have been
identified and numbered (/.e., pieces
removed from a primary surface
which have no features identified are assigned component numbers, see Primary Surfaces, above).
Core numbers are assigned sequentially as they are generated, regardless of the primary surface from
which the core was removed. The core number consists of two parts: the "LD" prefix, which is the
spacecraft identifier, and a sequential number beginning with 1 (e.g., LD-I; Figure 7).
279
In summary, two distinct numbering systemsare proposed for these objects in order to avoid ambiguity in
their curation and among scientists. One system is for theprimary surfaces and features, with features being a
subsetof the primary surfaces; the other is for the cores, or pieces which have been removed from primarysurfaces.
Primary surfaces are the objects on which features are identified and from which cores are removed. Features
are the objects which will be examined and described by the scientific community and in the FOILS
laboratory; cores are the means by which they will be divided and transported. Once features have been
identified on a sqrface, any piece re.moved, regardless of its size, will be assigned a core number. This
procedure ensures that correlation between the primary.surface and feature number is maintained. Since the
features will be the basic units of scientific interest, it is proposed that the LDEF grid number and component
type be included in their identity so that the number will impart some information about a feature's location
on LDEE Cores will be numbered sequentially as they are produced, regardless of the primary surface from
which they are removed.
2.0 DATA FILES
2.1 Prtmary-$urfnces File -- The _rimary-surfaces file will contain one record for each primary surface
generated. For example, a primary-surface number will be assigned to each experiment tray, screw,
clamp, or other spacecraft component which is removable as a separate unit; the shape of the
component may be square, rectangular, round, oval, trapezoidal, or irregular. The orientation of the
component, relative to the other components removed from the spacecraft, is recorded (the specific
nomenclature for the orientation must be determined), as are the longest and shortest dimensions.
The subs_rate is determined by the material of which the surface is made, or the material on the
surface of the tray (e.g., gold, aluminum, type of plastic). The location in this column refers to one of
the various NASA centers (e.g., LaRC, JSC, etc.). Fields for the original and current masses of the
surface (grams) are included for accountability of the gold surfaces (Table 1).
2.2 Features File -- The features _le will contain one record for each feature identified. If a feature is
removed from the primary surface, the number of the core which contains the feature is recorded.
The X,Y-coordinates of the feature, as determined by the scanning process are recorded as fixed units
from the (0,0) reference point. Optical observations for each feature are recorded to the extent
possible; not all features will be cored, and detailed descriptions regarding sizes, impact types,
quantity of material, rims, and halos may not be feasible for all features.
2.3 Cores File -- The cores jTle will contain one record for each piece or core removed from a primary
surface. The principal functipn of this file is to track the cores with regard to location and container.
A field for the mass (grams) of the core is included for accountability of the gold surfaces (Table l).
2.4 Allocation File -- The allocation jTle will contain one record for each distribution of a primary surface or
core to a Pt. The number of the material (primary surface or core), the name of the PI, and the datethe material was allocated are recorded. ' '
2.5 Images File -- The images j_le will contain one record for each image recorded during the preliminary
examination of the LDEF spacecraft at KSC, as well as during subsequent processing at JSC. The
image type may be a photograph, a digital image, or a video tape. The number will be the NASA
photo number, or an assigned unique number or file name which identifies a video tape or digital-
280
image file. Fields for feature number and core number are included (Table 1) so that cross-
referencing with the other LDEF database files may be implemented; however, data will not be
recorded in these fields unless such information applies directly to the photograph, image file, or
video tape. A field for a more detailed description is also included.
2.6 Notes File -- The notes file will be used for recording comments about trays, primary surfaces, features,
and cores. Separate fields for feature and core number are included (Table 1) for cross-referencing.
Only those fields relevant tq particular parts need be completed (for example, if a note is about a
primary surface, only the bay, row, and component fields would be completed). Fields for the name
of the person entering the note and the date are included.
2.7 Chemistry File -- The chemist_ file will be used to record, for individual features, the elemental
composition of projectile residues, surface materials, and possible contaminants. Fields for the
feature number, element, the part analyzed, the analyst, and the date of the analysis are included
(Table 1). Two separate fields are included for recording the amount of element present. One is for
expressing the amount as the weight percent of the element, while the other is for expressing the
amount in parts per million. Data in the field for the part analyzed is restricted to specific keywords,
such as *IMPACTOR*, "SURFACE*, or "CONTAMINATION', so that records pertaining to each of
these materials may be collected and sorted by element for calculation of elemental composition.
The file may contain many records for some elements for a feature and none for others.
Table 1. LDEF Database File Interaction
PRIMARY
SURFACE
Surface ID
BayRow
Component
Comport. #
ShapeOrientation
Long AxisShort A_
Substrate
Location
Original MatsCurrent Mm
Origm
FEATURES
Feature dP
Surf_ ID
BayRow
ComponentComport. #
Specific #Core #
Coordinates
X
Y
Dimensions
Long AxisShort Axis
Crater DepthImpact TypeRim
TypeRelief
Shape
Material Qty.
Halo TTpa
CORES
Core #
Location
ContainerMass
ALLOCATION
Surface ID
BayRow
ComponentComport. #
Core
Location (PI)Date Allocated
IMAGES
[map ID
TypeNumber
Fealure #
Surface ID
BayRow
Component
Comport. #
Specllic #Cone
DescriptionDate
NOTES
Feature #
Surface [D
BayRow
Component
Comport. #
Specific#Core #
Entry ByDale
Note (maycontain
counting
statistics)
CIIEMISTRY
Feature #
Surface ID
BayRow
Component
Comport. #
Specific #
ElementElement %
Element ppmPart ,Analyzed
,AnalystDate
281
3.0 SOFTWARE REQUIREMENTS
The following are the requirements which should be considered in order to implement the proposed database
system:
$.1 Multi-User Access -. ,Although the number of persons accessing the database will be limited initially,
more than one person should be able to access the database at one time for both updating and
reporting purposes. Record-locking should be used in the event that several people attempt to access
the ume record for writing at the same time.
.3.1 Menus -- Access to the database should be configured so that updating the files and generating reports is
accomplished through menus, which permit the user to have little to no knowledge of how the
database software actually operates.
3.3 Multi.File Acces= -- The proposed design divides the data into a number of different files, with
redundancy only in the identifiers for the different types of objects. The database software must have
the capability of synthesizing information from one or more of these files into a single report (for
example, one requirement might be to list all the features in the custody of a PI, even though
locations of samples are recorded for core numbers only).
3.4 Graphics -- The data must be able to be selected and sorted to produce a variety of plots for data
recording, analysis, and presentation. For example, a plot of the features on a prin_ary surface based
ol the X,Y-coordinates recorded by the FOILS scanner provides a means for correlating core and
feature numbers. Plots of size distribution versus frequency of Impact were requirements resulting
from studies of the Solar Maximum spacecraft; similar plots will be necessary for LDEF.
3..¢ Weight Ualanclng -. If weight accountability for gold surfaces is a requirement, the software must be
capable of prohibiting entry of updates for these surfaces until masses of ti;e primary surface and
cores removed from that surface total the same before and after the transaction.
3.6 Exl_ndabilit 7 -- In order to meet new requirements as they are identified, the database must be capable
of being expanded or adapted, either by means of additional data files or by reformatting of existing
o!!¢_.
;$.7 Commonallbl -- The data must I?e usable by different types of computers and applications (e.g., main-
frames,PC's,MAC's).
3.g Aecesa -- The database will be accessible via SPAN. Details on the procedures for gaining access to the
LDEF M&D gig database can be obtained by contacting C.B. Dardano, T.H. See, or M.F_.. Zoleasky,
JSC.
Should a Pl or institution decide to loan or donate any matcriats to the M&D SIG, or should questions arise
as to techniques and/or procedures listed in this document, please contact the appropriate personnel at the
Johnson Space Center in Houston, Texas, or the LDEF Project Office in Hampton, Virginia. A list of M&D
SlO contacts can be found in Section IX.
282
| ,
WORKSHOP AGENDA
-- -_1 LDEF
-----I
\J
MATERIALS DATA ANALYSIS
WORKSHOP
NASA - KENNEDY SPACE CENTERBUILDING M7-351, TRAINING AUDITORIUM
FEBRUARY 13 & 14, 1990
283
LDEFMATERIALS DATA ANALYSIS WORKSHOP
NASA - KENNEDY SPACE CENTERBUILDING M7-351, AUDITORIUM
FEBRUARY 13 & 14, 1990
CO-CHAIRMAN: MR. BLAND A STEIN, CHAIRMAN LDEF MSIG,NASA-LARC
CO-CHAIRMAN: DR. PHILIP R. YOUNG, NASA-LARC
AGENDA
FEBRUARY 13, 1990
8:00 A.M. Registration
Session 1 -LDEF Data Analysis Responsibilities and Plans
8:30 A.M.
8:45 A.M.
8:55 AM.
9:15 A.M.
9:30 A.M.
Workshop Introduction
NASA HeadquartersPerspective
LDEF Data AnalysisProject Office Overview
LDEF Project Operations
Supporting Data Group Plans:- Environments- Orbit and Orientation
B. Stein, WorkshopCo-Chairman
R. Hayduk, LDEF Coordinator,NASA Headquarters
D. Tenney, Chief, MaterialsDivision, NASA-LaRC
B. Lightner, LDEF Manager
W. Kinard, LDEF Chief ScientistW. Kinard, LDEF Chief Scientist
" "1 _'_
! :
284
February 13, 1990
Session 1 -LDEF Data Analysis Responsibilities and Plans(continued)
10:00 A.M. Special Investigation Group Plans:- Meteoroid and Debris SIG W. Kinard, Chairman, M&DSIG
10:50 A.M. Storage and Archival ofExtraterrestrial Material
M. Zolensky, NASA-JSC
11:00 A.M. Supporting Data Group Plans (Continued):- Spacecraft Thermal W. Berrios, NASA-LaRC
11:45 A.M. Lunch
1:00 P.M. Special Investigation Group Plans (continued):- Systems SIG J. Mason, Chairman, SSIG- Materials SIG B. Stein, Chairman, MSIG- Induced Radiation SIG T. Parnell, Chairman, IRSIG
4:00 P.M. Overview of PrincipalInvestigator Plans
J. Jones, LDEF ScienceManager
4:40 P.M. SDIO Overview W. Ward, WRDC/MLBT
February 14, 1990
Session 2 - Materials
8:30 A.M. Overview
8:45 A.M.
Data Analysis Methodology Discussions
B. Stein, NASA-LaRC
Discussion Topics and Leaders:- Polymeric Materials
Characterization- Surface Chemistry- Atomic Oxygen
P. Young, NASA-LaRC
J. Wightman, Virginia TechB. Banks, NASA-LeRC
11:45 A.M. Lunch
285
February 14, 1990
-Materials Analysis, Data Base, and SpecimenPreservation
1:00 P.M.
1:40 P.M.
2:20 P.M.
3:20 P.M.
MSIG Materials Analysis
MSIG/MAPTIS Data Base
Materials SpecimenPreservation andContamination Avoidance
General Discussion
G. Pippin, Boeing Aerospace
J. Davis, NASA-MSFC
R. Crutcher, Boeing Aerospace
All participants
4:00 P.M. Adjourn
286
Report Documentation Pager;,e, ,:. i, Av, ._ liar,, ,,,,t
1. Report No.
NASA CP-10046 2. Government Accession No.
4. Title and Subtitle
LDEF Materials Data Analysis Workshop
7. Author(s)
Bland A. Stein and Philip R. Young, Compilers
9. Performing Organization Name and Address
NASA Langley Research CenterHampton, VA 23665-5225
12. Sponsoring Agency Name and Address
National Aeronautics and Space AdministrationWashington, DC 20546-0001
3. Recipient's Catalog No.
5. Report Date
July 1990
6. Performing Organization Code
8. Performing Organization Report No.
10. Work Unit No.
506-48-71-01
11. Contract or Grant No.
13. Type of Report and Pexiod Covered
Conference Publication
14. Sponsoring Agency Code
15. Supplementary Notes
16. Abstract
The 5-year, 10-month flight of the Long Duration Exposure Facility (LDEF) greatly en-hanced the potential value of most LDEF materials, compared to the original 1-year flightplan. NASA recognized this potential by forming the LDEF Space Environmental Effects onMaterials Special Investigation Group in early 1989 to address the expanded opportunitiesavailable In the LDEF structure and on experimental trays, so that the value of all LDEFmaterials to current and future space missions would be assessed and documented. TheLDEF Materials Data Analysis Workshop served as one step toward the realization of thatresponsibility and ran concurrently with activities surrounding the successful return of thespacecraft to the NASA Kennedy Space Center. This document i_ a compilation of visualaids utilized by speakers at the workshop.'- _ - -_ - --
Session 1 summarized current information on analysis responsibilities and plans andwas aimed at updating the workshop attendees: the LDEF Advisory Committee, PrincipleInvestigators, Special Investigation Group Members, and others involved in LDEF analysesor management. Sessions 2 and 3 addressed materials data analys|s-methodology,specimen preparation, shipment and archival, and initial plans for the-LDEF Materials DataBase. A complementary objective of the workshop was to stimulate interest and awareness
of opportunities to vastly expand the overall data base by considering the entire spacecraftas a materials experiment.
17. Key Words (Sug$;estedby Authors(s))
Long Duration Exposure Facility, (LDEF)Space environmental effects/exposureEnviromental effects on materials'
19. Security Classlf.(of this report) [20. Security Cla_sslf.(of thispage)
Unclassified J UnclassifiedNASA FORM 1626 OCT_
18, Distribution Statement
Unclassified--O nlimited
Subject Category 23
21. No. of Pages l 22. Price295 A13
N3 SA-Langley, 1990
For sale by the National Te_imical Informathm Servk-e, Springfield, Virginia 22161-2171