Striving for Zero DPPMMichael Schuldenfrei, CTO
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Optimal+ is the Leader in Semiconductor Big Data Analytics
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Over 90%Foundry &
OSAT coverage
YieldUp to 2%
Quality50% less escapes
Efficiency
Up to 20%
35B+Chips (in 2015)
TTRUp to 30%
And others ….
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Going Beyond Semiconductors…
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TestReworkGenealogy
IC & Multi Chip
…
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N
3
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Boards Systems In Use ReturnsRework
Test & Process data
Usage Data
Performance data
Reliability Data
Automotive
Game Consoles
Super
Computing
Graphic Cards
Lead design partner
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Much More than “Just” MES Data
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Across the value chainBoards & Systems
Deep Parametric Test DataGenealogy
Repair/ReworkMES (=Process) Data
RMAs
Collection
Big Data AnalyticsAdvanced Algorithms
Machine LearningAutomated Rule Engine
Detection
AutomaticDistributedControlled
Fully integrated into existing systems
Action
Optimal+ looks at the combination of PROCESS and PRODUCT dataDeep Parametric data (unavailable in MES) is a KEY ingredient when striving for zero DPPM
Clean Augmented Data = Common Language across the Organization
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From Analytics to Action
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Source: Gartner
Optimal+ provides the entire spectrum from Data to Action through Prescriptive Analytics
O+
O+
O+
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“The New World” Driving New Needs
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Connected & Autonomous
Cars
Smart Wearables
Internet of
Things
HWSecurity
SiP & 3D ICs
Industry 4.0Stretching the Performance Envelope
System complexity, Performance margins
Superior Quality No-Fail, DPPB, Mission-critical
In-use ConfigurabilityFunctionality-on-demand, OTA..
Brand ProtectionDevice DNA, in-use Authentication
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Focus on Quality
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Systems are becoming Mission Critical Shifting from “Defects per Million” to “Defects per Billion”
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RMA & Failure Analysis
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No Problem Found32%
Fab Process28%
Test Program10%
Test Operation4%
Test Equipment26%
No Problem Found Fab Process Test Program Test Operation Test Equipment
Source: One of the top-five fabless semiconductor manufacturers
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The Quality Question…
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IS “GOOD” REALLY GOOD?
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It All Starts with the Data
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The “3 C’s” for data collection
Complete
Clean
Consistent
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Making it Actionable
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To be Actionable, data must:Be available quicklyBe processed immediately and automaticallyBe connected to business processes
Looking at each Manufacturing Step
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Examples…
Escape Prevention – Freeze A freeze occurs when a tester instrument becomes “stuck” and repeatedly returns the same or similar result for a sequence of parts
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Escape Prevention – Test Process
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A so-called “good” part was subjected to just 363 tests while the rest of the good parts had over 2460 tests
The number of tests executed on good devices should be relatively stable
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Escape Prevention – Test Program
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~95 Sigma
~95 Sigma
Extremely loose test limits may mask real test performance problems
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Station Health
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Aggregated performance across the actual station locations is shown belowIt is clear that a Temperature Test parameter is significantly impacted by the actual station location
TemperatureSpeed
Power
This is a quality issue because the boards were not tested at the right temperature!
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Outlier Detection
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Measurements that are within spec. limits but are well outside the typical range for similar devices are suspectThese devices must be detected and prevented from shipping
Combining Data from Multiple Steps
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Cross Operation Analysis and Correlation
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Connect data from across multiple operations to find hidden relationships:• Root cause analysis and RMA
investigation• Bi-variate and multi-variate outlier
detection• Explanation of “No Problem Found”
Paste ICT AOI AXI FCT1 FCT2 FCT3 … ShipDB RMA
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Data Feed Forward – Make it Actionable
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Paste ICT AOI AXI FCT1 FCT2 FCT3 … ShipDB RMA
ImplementationsWithin a single factory (OSAT, CM, etc.)Between multiple factoriesReal-time (test program integration)
Example scenariosOutlier Detection – drift analysisPairing – cherry-picking for power & speed combinationsTest program tuningTest step reduction
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Data Feed Forward (DFF) for Drift
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Paste ICT AOI AXI FCT1 FCT2 FCT3 … ShipDB RMA
Collect detailed product, test and process data from the assembly line
Apply advanced analytics as data is collected
Provide the resulting data to subsequent steps in real-time (“Data Feed Forward”)
FCT Tester
1. Board ID
2. Previous Measurements
Test Program runningFunctional test
Real-time data!No test time impact!
O+ DB at EMS
Example of parametric drift detection between operations
Looking Across the Supply Chain
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“No Trouble Found”
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IC3
IC2
PCB
IC1
Combinations of chips causing issues:
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DFF/DFB between Industries
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Distributed Supply Chain
Electronics OEM
Supplier 1
Supplier 2
Supplier 3
Is this possible???
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What Data Sharing can Achieve
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Lower RMA CostsBoard-to-Chip correlationsFast Root Cause analysisOn-line RMA Prevention RulesReduced NTF rates
Improved Quality and Time-to-QualityReduced time to reach board level DPPM goalsOn-line Quality link between chips and boardsEscape Prevention and Outlier Detection RulesEnhanced Functional Safety (ISO 26262)
More Efficient Test Processes – Adaptive Test
Test “suspect” parts moreTest “perfect” parts less
Better System PerformanceAvoid in-Spec Chips with marginal performance at boardSmart Pairing – Select the right chips for the right system board
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DFF/DFB between Industries
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Distributed Supply Chain
Other Supplier
Automotive
Game
Consoles
Super
Computing
Graphic Cards
The simple case – the OEM also manufactures chips
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DFF/DFB between Industries
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Distributed Supply Chain
Electronics OEM
Supplier 1
Supplier 2
Supplier 3 But what about between an electronics OEM and its
suppliers?
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Cisco & Optimal+
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Source: Cisco, Southwest DFT Conference, Austin 2016
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DFF/DFB between Industries
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Distributed Supply Chain
Electronics OEM
Supplier 1
Supplier 2
Supplier 3 By enabling just board level data to chip suppliers, quality levels can
be dramatically enhanced
Board data
Board data
Board da
ta
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Summary
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Achieving quality starts with high quality dataAdvanced statistical processing can detect anomalies in manufacturing and prevent bad products reaching customersBreaking down test silos has tremendous benefits for• Quality, Efficiency, Yield
Data Feed Forward, Quality Index already a reality for major chip manufacturers within their supply chainData Feed Backwards from electronics to semi is coming soon…What are YOU doing to achieve zero DPPM?
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Thank You!