Yannick Geerebaert LLR Ecole Polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
March 2008 status
MPPC TEST BENCH @ LLRMPPC TEST BENCH @ LLR
S. CholletA. DebraineY. GeerebaertL. GuevaraF. MoreauJ-C. Vanel
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
MPMPPPC : Multi-Pixel C : Multi-Pixel PhotonPhoton Counter Counter
What do we have to measure ?– Reverse current vs Vop & T° (Vbr+ΔV)– Gain vs Vop & T° – Dark Noise Rate vs Vop & T° – Photo detection efficiency P.D.E.
(relative to PMT)
Where do we find those information with new packaging ?
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
TestTest benchbench Setup Setup
Setup for calibration (orange) and MPPC Parameters measurement (Blue)
20 dB
Attenuator0 to 12 dB
Attenuator
CalibrationPulsegenerator
Voltage
Amplifier
Gain 38.5 dB
BW 1 GHz
C 68.4 pF
LEDPulsegenerator
MPPC
Oscilloscope1 GHz, 10 Gs/s
Trigger(or trigger on signal it-self)
10 KΩ
Vpol
100 nF
BLUE LED
OPTICAL FIBERS
PM TubeHigh Voltage
Dark box
Ambienttemperaturemeasurement
Data from Source Meter : Ireverse=f(Vop)
Data from oscilloscope : GAIN : Histograms of integrated
pulses (in the dark, with few photoelectrons & calibration)
DNR : V=f(t) during 2 ms.(1ns/sample)
PDE relative to PMTTrigger on:
pulse in the darkLED pulse generatorCalibration pulse generatorI=f(V)
GPIB
Source meter
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Automatic reverse current measurement Automatic reverse current measurement I=f(VI=f(Vopop))
Data from Source Meter : Ireverse=f(Vop)
Determine normal/geiger mode limit:
Define a Vop range for next measures
Measure leakage current in normal mode
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
MPPC Gain measurementMPPC Gain measurement
Gain = Qin/1.6 10-19
Correspond to 1 photoelectron peak
Qin = <[email protected].> V.ns / Calibration
V.ns/e-
Measured Gain = 7.67E+05 To be compared with value on
MPPC bag M=7.50E+05
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
MPPC dark noise rate (DNR) measurementMPPC dark noise rate (DNR) measurement
From V=f(t) records, counting the number of pulses above a given threshold
A view of stacked pulses
Threshold (mV)
Cou
nti
ng
rate
(kH
z)
DNR 350 KHz (value on MPPC Bag : 378 kHz)
Optical Crosstalk : 25 kHz(value on MPPC Bag : 25 kHz)
Nu
mb
er o
f Pu
lses in
1 re
cord
(2m
s)
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
LLR MPPC Test bench LLR MPPC Test bench
What have changed since November 2007 ? PDE measurement Measurements @ LAL Validation for different parts of final test bench
Measurements with LAL Readout ASIC FPGA evaluation board Communication with PC for automation Light distribution design
Design of final test bench setup Actual design
What is done To-do list
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Trigger
PDE Measurement (relative to PMT)PDE Measurement (relative to PMT)
Setup for Photo detection efficiency measurement
Voltage
Amplifier
Gain 38.5 dB
BW 1 GHz
LEDPulsegenerator
MPPC
Oscilloscope500 MHz, 5 Gs/s
100 KΩ
Vpol
100 nF
BLUE LED
OPTICAL FIBERS
PM TubeHigh Voltage
Dark box
Ambienttemperaturemeasurement
Data from oscilloscope : PDE : MPPC integrated pulse
divided by PMT integrated pulse
Trigger on:LED pulse generator
I=f(V)
GPIB
Source meter
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Measurements @ LALMeasurements @ LAL
To crosscheck with our data, measurements for 3 MPPC (2x 100pix & 1x 400pix) have been done by LAL instrumentation group (N. Dinu).
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
LLR MPPC Test bench LLR MPPC Test bench
What have changed since November 2007 ? PDE measurement Measurements @ LAL Validation for different parts of final test bench
Measurements with LAL Readout ASIC FPGA evaluation board Communication with PC for automation Light distribution design
Design of final test bench setup Actual design
What is done To-do list
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Setup for MPPC gain measurement
LEDPulsegenerator
MPPC
Oscilloscope1 GHz, 10 Gs/s
Trigger
10 KΩ
Vpol
100 nF
BLUE LED
Dark box
Ambienttemperaturemeasurement
Source meter
LAL
ASIC
100 nF
50 Ω
Test of Sipm readout ASIC from LALTest of Sipm readout ASIC from LAL
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Test of Sipm readout ASIC from LALTest of Sipm readout ASIC from LAL
Evaluation of Sipm readout chip from LAL with a 400 pixels MPPC.
MPPC is inthe dark box
LAL Sipm ASICevaluation board
Power supply
FPGA forASIC control
T° measurement
Oscilloscope
SourceMeter LED pulse generator
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Test of communication between FPGA, PC Test of communication between FPGA, PC and ASICand ASIC
We will use a simple FPGA evaluation board to control ASIC, interface with instruments and communicate with PC.
Slow controlCommunicationwith PC (RS232)
ASIC controlSelect channel, gain, shaper, etc…
Interface with instrumentstrigger, trigger enable, etc…
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Design of light distributionDesign of light distribution
One LED to 36 MPPC with 36 fibers
Same length, same path for each fiber
Same light intensity at the beginning
of each fiber
2 light diffusion layers
Noise events/total number of events
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
MPPC Test benchMPPC Test bench
Fudji PXR4
GP
IB
Lecroy 104MXi
PyMySQLTest BenchApplication
RS
485 Eth
. 1
Eth. 2
RS232Source Meter
Keithley 2700T° M
onitor
Agilent 33250Pulse Generator
GUI Device LOG INGRID DB Web Browser
FPGA Eval. board
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Design of final test benchDesign of final test bench
General view of final test bench
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
Mechanical view of MPPC Test benchMechanical view of MPPC Test bench
Front-end electronic
MPPCs
T° sensors
Fibers
Light diffusion
layers
Blue LEDA. Cauchois
A. Bonnemaison
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
““Support_MPPC” boardSupport_MPPC” board Design of board
“support_MPPC” (6 PCBs are foreseen for 4 April).
2 layers, minimal gap : 150 µm Thickness : 3.2 mm 50 Ω coplanar waveguide
design for MPPC signals
Mechanical accuracy of+/- 0.05 mm all over the
board Will hold 72 HOLTITE socket
Yannick Geerebaert LLR Ecole polytechnique CNRS IN2P3 Palaiseau France INGRID Meeting / March 2008 / France
To-do listTo-do list
Design of SAKE board (Sipm Analyzer for a Kamiokande Experiment)
– Mother board (support MPPC is daughter board)– 2 Sipm ASICs
– 36 relays to switch on/off HV for I reverse measurement
– Interface with FPGA board– foreseen to be at LLR in May
Debug hardware electronic
Writing VHDL code for the automation of the test bench
Finalize the mechanical design, machining all parts of the
test bench
Calibration of entire system
MPPC production test