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The top documents tagged [good chip]
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good chip
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram
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Vishwani D. Agrawal.
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Priyadharshini Shanmugasundaram
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Vishwani D. Agrawal
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DYNAMIC SCAN CLOCK CONTROL FOR TEST TIME REDUCTION MAINTAINING.
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Time Meeting 2/3/2015 PHENIX Run-15 Status Douglas Fields PHENIX Run-15 Run Coordinator University of New Mexico.
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Assignment Choosing A Computer For Helen Parr
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