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The top documents tagged [mohd fairuz]
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mohd fairuz
CONVR 2009 Proceedings
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Robust Low Power VLSI ECE 7502 S2015 Burn-in/Stress Test for Reliability: Reducing burn-in time through high-voltage stress test and Weibull statistical.
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Signals and Spectra CHAPTER 1 School of Computer and Communication Engineering, Amir Razif Arief b. Jamil Abdullah EKT 431: Digital Communications.
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